DE2434439A1 - Multiplex-interferometer - Google Patents

Multiplex-interferometer

Info

Publication number
DE2434439A1
DE2434439A1 DE2434439A DE2434439A DE2434439A1 DE 2434439 A1 DE2434439 A1 DE 2434439A1 DE 2434439 A DE2434439 A DE 2434439A DE 2434439 A DE2434439 A DE 2434439A DE 2434439 A1 DE2434439 A1 DE 2434439A1
Authority
DE
Germany
Prior art keywords
mirror
interferometer
movable
movable mirror
assembly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE2434439A
Other languages
German (de)
English (en)
Other versions
DE2434439C3 (enExample
DE2434439B2 (enExample
Inventor
Gerald Leo Auth
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CNA Holdings LLC
Original Assignee
Eocom Corp Irvine Calif (vsta)
Eocom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eocom Corp Irvine Calif (vsta), Eocom Corp filed Critical Eocom Corp Irvine Calif (vsta)
Publication of DE2434439A1 publication Critical patent/DE2434439A1/de
Publication of DE2434439B2 publication Critical patent/DE2434439B2/de
Application granted granted Critical
Publication of DE2434439C3 publication Critical patent/DE2434439C3/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4535—Devices with moving mirror

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
DE2434439A 1974-02-13 1974-07-17 Multiplex-interferometer Granted DE2434439A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/442,254 US3936193A (en) 1974-02-13 1974-02-13 Multiplex interferometer

Publications (3)

Publication Number Publication Date
DE2434439A1 true DE2434439A1 (de) 1975-08-14
DE2434439B2 DE2434439B2 (enExample) 1978-04-20
DE2434439C3 DE2434439C3 (enExample) 1978-12-14

Family

ID=23756110

Family Applications (2)

Application Number Title Priority Date Filing Date
DE2434439A Granted DE2434439A1 (de) 1974-02-13 1974-07-17 Multiplex-interferometer
DE19747424410U Expired DE7424410U (de) 1974-02-13 1974-07-17 Interferometer zur spektralmessung von elektromagnetischer strahlung

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE19747424410U Expired DE7424410U (de) 1974-02-13 1974-07-17 Interferometer zur spektralmessung von elektromagnetischer strahlung

Country Status (6)

Country Link
US (1) US3936193A (enExample)
JP (1) JPS5815729B2 (enExample)
CA (1) CA1008267A (enExample)
DE (2) DE2434439A1 (enExample)
FR (1) FR2260789B1 (enExample)
GB (1) GB1458298A (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5819460Y2 (ja) * 1975-08-21 1983-04-21 日本電気株式会社 ハチヨウセンタクキ
US4193693A (en) * 1978-02-24 1980-03-18 Nasa Velocity servo for continuous scan Fourier interference spectrometer
US4310245A (en) * 1980-03-19 1982-01-12 Pritchard James L Interferometer system
US4556316A (en) * 1983-03-01 1985-12-03 Laser Precision Corporation Interferometer spectrometer having simplified scanning motion control
US4537508A (en) * 1983-03-01 1985-08-27 Laser Precision Corporation Interferometer spectrometer having improved scanning reference point
US4544272A (en) * 1983-03-04 1985-10-01 Laser Precision Corporation Alignment apparatus and method for interferometer spectrometers
US4671656A (en) * 1985-03-20 1987-06-09 Midac Corporation Adjustment for reflective surfaces in interferometers
US4693603A (en) * 1985-10-21 1987-09-15 Midac Corporation Ruggedized compact interferometer requiring minimum isolation from mechanical vibrations
USH637H (en) 1986-04-30 1989-06-06 The United States Of America As Represented By The Secretary Of The Air Force Method and apparatus for rapid optical phasing
US4844614A (en) * 1987-09-01 1989-07-04 Nicolet Instrument Corporation Interchangeable beam splitting holder and compartment therefor
US4991961A (en) * 1989-05-26 1991-02-12 Nicolet Instrument Corporation Moving mirror tilt adjust mechanism in an interferometer
US5107366A (en) * 1989-09-28 1992-04-21 Nicolet Instrument Corporation High efficiency electromagnetic coil apparatus and method
US5002394A (en) * 1990-01-30 1991-03-26 Midac Corporation Fabricating interferometers having reduced misalignment problems
CH684212A5 (fr) * 1990-10-16 1994-07-29 Suisse Electronique Microtech Dispositif optique à interférométrie en lumière blanche.
US5406405A (en) * 1991-11-27 1995-04-11 Sullivan; Mark T. Rotating kinematic optic mount
US5896197A (en) * 1992-01-08 1999-04-20 Nicolet Instrument Corporation Interferometer having glass graphite bearing
EP0587284A3 (en) * 1992-09-10 1994-03-30 Nicolet Instrument Corporation Interferometer and beamsplitter holder therefor
JPH07270245A (ja) * 1994-03-31 1995-10-20 Ando Electric Co Ltd 測長器を用いた光波長計
US5883712A (en) * 1997-05-21 1999-03-16 Nicolet Instrument Corporation Interferometer of an infrared spectrometer with dynamic moving mirror alignment
US7626181B2 (en) * 2005-12-09 2009-12-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7697115B2 (en) * 2006-06-23 2010-04-13 Asml Holding N.V. Resonant scanning mirror
US8148689B1 (en) 2008-07-24 2012-04-03 Braunheim Stephen T Detection of distant substances
CN104570265B (zh) * 2014-12-18 2017-05-24 中国科学院西安光学精密机械研究所 轻量化简单化高稳定同轴相机主次镜部件及安装方法
CN107407630B (zh) * 2015-03-13 2020-02-14 株式会社岛津制作所 傅里叶变换型分光光度计
CN117571139B (zh) * 2023-11-16 2024-07-19 安徽砺剑防务科技有限公司 一种摆臂式迈克尔逊干涉仪

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1709809A (en) * 1929-04-16 Assionob to
US2258355A (en) * 1940-02-10 1941-10-07 Union Switch & Signal Co Test and focusing means for light signals
US2580498A (en) * 1948-05-17 1952-01-01 Northrop Aircraft Inc Electrooptical pulse generator
US2948152A (en) * 1956-12-27 1960-08-09 Servomechanisms Inc Accelerometer
US3488123A (en) * 1966-03-28 1970-01-06 Nasa Apparatus for controlling the velocity of an electromechanical drive for interferometers and the like
JPS5139929B2 (enExample) * 1973-07-03 1976-10-30

Also Published As

Publication number Publication date
FR2260789A1 (enExample) 1975-09-05
GB1458298A (en) 1976-12-15
JPS50115841A (enExample) 1975-09-10
DE2434439C3 (enExample) 1978-12-14
US3936193A (en) 1976-02-03
CA1008267A (en) 1977-04-12
JPS5815729B2 (ja) 1983-03-28
DE2434439B2 (enExample) 1978-04-20
FR2260789B1 (enExample) 1978-04-28
DE7424410U (de) 1976-04-22

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Legal Events

Date Code Title Description
C3 Grant after two publication steps (3rd publication)
8327 Change in the person/name/address of the patent owner

Owner name: AMERICAN HOECHST CORP., 08876 SOMERVILLE, N.J., US

8328 Change in the person/name/address of the agent

Free format text: RICHTER, J., DIPL.-ING. WERDERMANN, F., DIPL.-ING., PAT.-ANW., 2000 HAMBURG

8339 Ceased/non-payment of the annual fee