DE2415403A1 - Vorrichtung zum messen von mechanischen spannungen auf der oberflaeche eines koerpers aus polykristallinem material - Google Patents

Vorrichtung zum messen von mechanischen spannungen auf der oberflaeche eines koerpers aus polykristallinem material

Info

Publication number
DE2415403A1
DE2415403A1 DE2415403A DE2415403A DE2415403A1 DE 2415403 A1 DE2415403 A1 DE 2415403A1 DE 2415403 A DE2415403 A DE 2415403A DE 2415403 A DE2415403 A DE 2415403A DE 2415403 A1 DE2415403 A1 DE 2415403A1
Authority
DE
Germany
Prior art keywords
detectors
point
source
radiation
lattice planes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE2415403A
Other languages
German (de)
English (en)
Inventor
Jean Bens
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Compagnie Generale de Radiologie SA
Original Assignee
Compagnie Generale de Radiologie SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Compagnie Generale de Radiologie SA filed Critical Compagnie Generale de Radiologie SA
Publication of DE2415403A1 publication Critical patent/DE2415403A1/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/25—Measuring force or stress, in general using wave or particle radiation, e.g. X-rays, microwaves, neutrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/06—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring the deformation in a solid

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE2415403A 1973-03-30 1974-03-29 Vorrichtung zum messen von mechanischen spannungen auf der oberflaeche eines koerpers aus polykristallinem material Pending DE2415403A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7311617A FR2223684B1 (enExample) 1973-03-30 1973-03-30

Publications (1)

Publication Number Publication Date
DE2415403A1 true DE2415403A1 (de) 1974-10-10

Family

ID=9117183

Family Applications (2)

Application Number Title Priority Date Filing Date
DE2415403A Pending DE2415403A1 (de) 1973-03-30 1974-03-29 Vorrichtung zum messen von mechanischen spannungen auf der oberflaeche eines koerpers aus polykristallinem material
DE2415429A Pending DE2415429A1 (de) 1973-03-30 1974-03-29 Einrichtung zur messung von belastungen eines kristalls

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE2415429A Pending DE2415429A1 (de) 1973-03-30 1974-03-29 Einrichtung zur messung von belastungen eines kristalls

Country Status (4)

Country Link
US (1) US3934138A (enExample)
DE (2) DE2415403A1 (enExample)
FR (1) FR2223684B1 (enExample)
GB (1) GB1460859A (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4053748A (en) * 1975-12-01 1977-10-11 Horst William Kueppers Techniques for determining the peak angle of response of piezoelectric crystals and other radiation-sensitive resonant devices
US4095103A (en) * 1976-03-12 1978-06-13 Northwestern University Apparatus and method for determination of residual stress in crystalline substances
US4042825A (en) * 1976-07-09 1977-08-16 Colorado Seminary Stressed-unstressed standard for X-ray stress analysis and method of making same
JPS5332789A (en) * 1976-09-08 1978-03-28 Hitachi Ltd Method and apparatus for measuring of stress of white color x-ray
JPS5687849A (en) * 1979-12-19 1981-07-16 Hitachi Ltd Foreknowing method for remaining life by x-rays
US4489425A (en) * 1983-01-14 1984-12-18 Science Applications, Inc. Means and method for determining residual stress on a polycrystalline sample by X-ray diffraction
NL8300419A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen analyse apparaat.
US4561062A (en) * 1983-02-18 1985-12-24 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources Stress measurement by X-ray diffractometry
US4715053A (en) * 1985-01-25 1987-12-22 Westinghouse Electric Corp. Method for monitoring the crystallographic texture of metallic tubes by use of X-ray diffraction
DD268059B5 (de) * 1987-12-14 1993-08-05 Ifw Inst Fuer Festkoerper Und Vorrichtung zur roentgenografischen abbildung und messung lokaler spannungsverteilungen
US4918711A (en) * 1988-04-26 1990-04-17 The United States Of America As Represented By The United States Department Of Energy Method for improve x-ray diffraction determinations of residual stress in nickel-base alloys
US4959548A (en) * 1989-05-02 1990-09-25 The United States Of America As Represented By The United States Department Of Energy Neutron apparatus for measuring strain in composites
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
US5848122A (en) * 1997-03-25 1998-12-08 Advanced Technology Materials, Inc. Apparatus for rapid in-situ X-ray stress measurement during thermal cycling of semiconductor wafers
CN101210897B (zh) * 2006-12-30 2011-10-05 同方威视技术股份有限公司 一种用于大型集装箱的χ、γ射线束流检测装置
RU2349907C1 (ru) * 2007-06-14 2009-03-20 Эдуард Авакович Кочаров Рентгеновский способ прямого измерения упругих макронапряжений в поверхностном слое поликристаллических материалов и измерительный образец для его реализации
RU2387980C1 (ru) * 2008-09-11 2010-04-27 Эрнст Алексеевич Калмыков Способ экспресс-анализа механических поверхностных напряжений поликристаллических материалов и параметров их кристаллической решетки и устройство для его осуществления
RU2383006C1 (ru) * 2008-12-11 2010-02-27 Министерство промышленности и торговли Российской Федерации (Минпромторг России) Способ определения критерия сопротивления металлов и сплавов хрупкому разрушению
RU2427826C1 (ru) * 2010-05-11 2011-08-27 Федеральное государственное унитарное предприятие "Всероссийский научно-исследовательский институт авиационных материалов" (ФГУП "ВИАМ") Способ определения остаточных напряжений в изделиях из монокристаллических материалов рентгеновским методом
RU2663415C1 (ru) * 2017-08-08 2018-08-06 Владимир Иванович Пудов Способ определения остаточных неоднородных напряжений в анизотропных электротехнических материалах рентгеновским методом
CN111474192A (zh) * 2020-03-24 2020-07-31 上海交通大学 追踪特定取向二阶应力分布的中子衍射测量方法及系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL235425A (enExample) * 1958-01-25
US3011060A (en) * 1958-01-31 1961-11-28 Philips Electronics Inc X-ray spectrograph
US3402291A (en) * 1966-04-06 1968-09-17 Gen Motors Corp Method and apparatus of measuring residual stress in metals and the amount of a known constituent
US3617705A (en) * 1968-03-27 1971-11-02 Tokyo Shibaura Electric Co Method of measuring stress with x-rays
US3517194A (en) * 1968-10-24 1970-06-23 Atomic Energy Commission Position-sensitive radiation detector
JPS4919239B1 (enExample) * 1969-03-07 1974-05-16

Also Published As

Publication number Publication date
US3934138A (en) 1976-01-20
DE2415429A1 (de) 1974-10-03
GB1460859A (en) 1977-01-06
FR2223684B1 (enExample) 1975-08-22
FR2223684A1 (enExample) 1974-10-25

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Legal Events

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OGA New person/name/address of the applicant
OHJ Non-payment of the annual fee