DE2337973A1 - Hochempfindlicher halbleiterdehnungsmesstreifen und verfahren zu seiner herstellung - Google Patents

Hochempfindlicher halbleiterdehnungsmesstreifen und verfahren zu seiner herstellung

Info

Publication number
DE2337973A1
DE2337973A1 DE19732337973 DE2337973A DE2337973A1 DE 2337973 A1 DE2337973 A1 DE 2337973A1 DE 19732337973 DE19732337973 DE 19732337973 DE 2337973 A DE2337973 A DE 2337973A DE 2337973 A1 DE2337973 A1 DE 2337973A1
Authority
DE
Germany
Prior art keywords
layer
cadmium sulfide
semiconductor layer
semiconductor
measuring transducer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19732337973
Other languages
German (de)
English (en)
Inventor
Frederick John Jeffers
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bell and Howell Co
Original Assignee
Bell and Howell Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bell and Howell Co filed Critical Bell and Howell Co
Publication of DE2337973A1 publication Critical patent/DE2337973A1/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges
    • G01L1/2293—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges of the semi-conductor type

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Pressure Sensors (AREA)
  • Measuring Fluid Pressure (AREA)
DE19732337973 1972-07-28 1973-07-26 Hochempfindlicher halbleiterdehnungsmesstreifen und verfahren zu seiner herstellung Pending DE2337973A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00276269A US3805601A (en) 1972-07-28 1972-07-28 High sensitivity semiconductor strain gauge

Publications (1)

Publication Number Publication Date
DE2337973A1 true DE2337973A1 (de) 1974-02-07

Family

ID=23055944

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19732337973 Pending DE2337973A1 (de) 1972-07-28 1973-07-26 Hochempfindlicher halbleiterdehnungsmesstreifen und verfahren zu seiner herstellung

Country Status (5)

Country Link
US (1) US3805601A (enExample)
JP (1) JPS4946877A (enExample)
DE (1) DE2337973A1 (enExample)
FR (1) FR2194963B1 (enExample)
GB (1) GB1415445A (enExample)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5314011B2 (enExample) * 1973-10-13 1978-05-15
US4089927A (en) * 1975-09-26 1978-05-16 Minnesota Mining And Manufacturing Company Strain sensor employing bi layer piezoelectric polymer
US4078226A (en) * 1977-03-16 1978-03-07 The United States Of America As Represented By The United States Department Of Energy Input apparatus for dynamic signature verification systems
US4141025A (en) * 1977-03-24 1979-02-20 Gosudarstvenny Nauchno-Issle-Dovatelsky I Proektny Institut Redkometallicheskoi Promyshlennosti "GIREDMET" Semiconductor structure sensitive to pressure
US4131880A (en) * 1977-10-26 1978-12-26 Burroughs Corporation Signature verification pen
FR2496380A1 (fr) * 1980-12-15 1982-06-18 Thomson Csf Dispositif piezoresistif a commande electrique
GB8322273D0 (en) * 1983-08-18 1983-09-21 Bell & Howell Co Applying semiconductor material to substrate
US4683755A (en) * 1985-11-15 1987-08-04 Imo Delaval Inc. Biaxial strain gage systems
US5483088A (en) * 1994-08-12 1996-01-09 S.R.I. International Compounds and infrared devices including In1-x Tlx Q, where Q is As1-y Py and 0≦y≦1
US5410178A (en) * 1994-08-22 1995-04-25 Northwestern University Semiconductor films
DE69605380T2 (de) * 1995-04-30 2000-07-27 Koninklijke Philips Electronics N.V., Eindhoven Batterieladevorrichtung und -verfahren
US6058934A (en) * 1995-11-02 2000-05-09 Chiron Diagnostics Corporation Planar hematocrit sensor incorporating a seven-electrode conductivity measurement cell
US5743985A (en) * 1996-10-31 1998-04-28 Owens-Corning Fiberglas Technology, Inc. Method of making an asphalt and fiber laminated insulation product
US6729187B1 (en) * 1999-04-29 2004-05-04 The Board Of Governors For Higher Education, State Of Rhode Island And Providence Plantations Self-compensated ceramic strain gage for use at high temperatures
US6936837B2 (en) * 2001-05-11 2005-08-30 Ube Industries, Ltd. Film bulk acoustic resonator
US6579735B1 (en) * 2001-12-03 2003-06-17 Xerox Corporation Method for fabricating GaN field emitter arrays
US6781159B2 (en) * 2001-12-03 2004-08-24 Xerox Corporation Field emission display device
US20050115329A1 (en) * 2003-10-23 2005-06-02 Gregory Otto J. High temperature strain gages
US7730790B2 (en) * 2004-08-10 2010-06-08 Nordson Corporation Shear test device
US7185545B2 (en) * 2004-12-29 2007-03-06 General Electric Company Instrumentation and method for monitoring change in electric potential to detect crack growth
US20100237747A1 (en) * 2005-12-19 2010-09-23 Physical Logic Ag Piezoelectric Composite Material
US7905152B2 (en) * 2006-02-17 2011-03-15 Nordson Corporation Shear test apparatus and method
US8841818B2 (en) * 2011-08-12 2014-09-23 Massachusetts Institute Of Technology Piezoelectric electromechanical devices
US9726587B2 (en) * 2015-01-30 2017-08-08 Stmicroelectronics S.R.L. Tensile stress measurement device with attachment plates and related methods
KR102475233B1 (ko) * 2015-06-26 2022-12-09 인텔 코포레이션 Iv족 기판 상의 iii족-n mems 구조체들
US11585204B2 (en) 2020-05-26 2023-02-21 Heath Poulson Crowding avoidance apparatus and method
US20250127457A1 (en) 2021-08-09 2025-04-24 University Of Oregon Wireless measurement of suture tension

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1226647A (enExample) * 1967-04-28 1971-03-31
US3492513A (en) * 1967-07-27 1970-01-27 Lewis E Hollander Jr Mesa t-bar piezoresistor
US3673354A (en) * 1969-05-08 1972-06-27 Matsushita Electric Industrial Co Ltd Semiconductor stress transducer

Also Published As

Publication number Publication date
FR2194963B1 (enExample) 1976-05-07
US3805601A (en) 1974-04-23
GB1415445A (en) 1975-11-26
FR2194963A1 (enExample) 1974-03-01
JPS4946877A (enExample) 1974-05-07

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Legal Events

Date Code Title Description
OHA Expiration of time for request for examination