DE2250095A1 - Vorrichtung zum messen der verlagerung eines messpunktes in mindestens zwei koordinatenrichtungen - Google Patents

Vorrichtung zum messen der verlagerung eines messpunktes in mindestens zwei koordinatenrichtungen

Info

Publication number
DE2250095A1
DE2250095A1 DE2250095A DE2250095A DE2250095A1 DE 2250095 A1 DE2250095 A1 DE 2250095A1 DE 2250095 A DE2250095 A DE 2250095A DE 2250095 A DE2250095 A DE 2250095A DE 2250095 A1 DE2250095 A1 DE 2250095A1
Authority
DE
Germany
Prior art keywords
measuring
interferometer
prism
center point
point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE2250095A
Other languages
German (de)
English (en)
Inventor
Nisl Abramson
Bertil Colding
Unto Dipl Ing Sandstroem
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LASERGRUPPEN KONSULT AB
Original Assignee
LASERGRUPPEN KONSULT AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LASERGRUPPEN KONSULT AB filed Critical LASERGRUPPEN KONSULT AB
Publication of DE2250095A1 publication Critical patent/DE2250095A1/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02021—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different faces of object, e.g. opposite faces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Transform (AREA)
DE2250095A 1971-10-13 1972-10-12 Vorrichtung zum messen der verlagerung eines messpunktes in mindestens zwei koordinatenrichtungen Pending DE2250095A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE12966/71A SE354115B (enrdf_load_stackoverflow) 1971-10-13 1971-10-13

Publications (1)

Publication Number Publication Date
DE2250095A1 true DE2250095A1 (de) 1973-04-19

Family

ID=20296602

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2250095A Pending DE2250095A1 (de) 1971-10-13 1972-10-12 Vorrichtung zum messen der verlagerung eines messpunktes in mindestens zwei koordinatenrichtungen

Country Status (6)

Country Link
US (1) US3815996A (enrdf_load_stackoverflow)
JP (1) JPS4862455A (enrdf_load_stackoverflow)
DE (1) DE2250095A1 (enrdf_load_stackoverflow)
FR (1) FR2162852A5 (enrdf_load_stackoverflow)
GB (1) GB1408414A (enrdf_load_stackoverflow)
SE (1) SE354115B (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3827459A1 (de) * 1988-08-12 1990-02-15 Michael H Dipl Ing Korte Verfahren und einrichtung zum einrichten und erzeugen eines raeumlichen orthogonalen messnetzes, insbesondere zur aufmasserstellung im rahmen von bauaufnahmen

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4311390A (en) * 1979-02-27 1982-01-19 Optimetrix Corporation Interferometrically controlled stage with precisely orthogonal axes of motion
US4261107A (en) * 1980-03-06 1981-04-14 Caterpillar Tractor Co. Coordinate locating device
EP0058673A4 (en) * 1980-08-11 1985-04-03 Colt Ind Operating Corp LASER MEASURING SYSTEM AND METHOD FOR A LATHE.
DE3334460A1 (de) * 1983-09-23 1985-04-11 Fa. Carl Zeiss, 7920 Heidenheim Mehrkoordinaten-messmaschine
US5164602A (en) * 1991-08-23 1992-11-17 Westinghouse Electric Corp. Machine guidance system utilizing fiber optics
US5446546A (en) * 1993-07-02 1995-08-29 The Boeing Company Laser interferometric single piece force transducer
US7362447B2 (en) * 2004-02-20 2008-04-22 Agilent Technologies, Inc. Low walk-off interferometer

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3622244A (en) * 1970-01-29 1971-11-23 Optomechanisms Inc Dual axes interferometer
FR2088675A5 (enrdf_load_stackoverflow) * 1970-04-21 1972-01-07 Thomson Csf

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3827459A1 (de) * 1988-08-12 1990-02-15 Michael H Dipl Ing Korte Verfahren und einrichtung zum einrichten und erzeugen eines raeumlichen orthogonalen messnetzes, insbesondere zur aufmasserstellung im rahmen von bauaufnahmen

Also Published As

Publication number Publication date
SE354115B (enrdf_load_stackoverflow) 1973-02-26
GB1408414A (en) 1975-10-01
US3815996A (en) 1974-06-11
JPS4862455A (enrdf_load_stackoverflow) 1973-08-31
FR2162852A5 (enrdf_load_stackoverflow) 1973-07-20

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Legal Events

Date Code Title Description
OHA Expiration of time for request for examination