DE2225281A1 - Interface- oder Anschlußeinrichtung - Google Patents

Interface- oder Anschlußeinrichtung

Info

Publication number
DE2225281A1
DE2225281A1 DE19722225281 DE2225281A DE2225281A1 DE 2225281 A1 DE2225281 A1 DE 2225281A1 DE 19722225281 DE19722225281 DE 19722225281 DE 2225281 A DE2225281 A DE 2225281A DE 2225281 A1 DE2225281 A1 DE 2225281A1
Authority
DE
Germany
Prior art keywords
devices
signals
output
interface device
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19722225281
Other languages
German (de)
English (en)
Inventor
William Meredith Largo; Davis jun. David Cemer Clearwater; Fla. Burdette jun. (V.StA.). GOIr 33-00
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Unisys Corp
Original Assignee
Sperry Rand Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sperry Rand Corp filed Critical Sperry Rand Corp
Publication of DE2225281A1 publication Critical patent/DE2225281A1/de
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31917Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919Storing and outputting test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE19722225281 1971-05-24 1972-05-24 Interface- oder Anschlußeinrichtung Pending DE2225281A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US14626371A 1971-05-24 1971-05-24

Publications (1)

Publication Number Publication Date
DE2225281A1 true DE2225281A1 (de) 1972-12-07

Family

ID=22516569

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19722225281 Pending DE2225281A1 (de) 1971-05-24 1972-05-24 Interface- oder Anschlußeinrichtung

Country Status (6)

Country Link
US (1) US3739349A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CH (1) CH564199A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE2225281A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
FR (1) FR2138878B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB1373578A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
IT (1) IT958003B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3849726A (en) * 1974-01-28 1974-11-19 Sperry Rand Corp Universal programmable digital testing interface line
FR2270642B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1974-05-08 1977-10-21 Honeywell Bull Soc Ind
US4057847A (en) * 1976-06-14 1977-11-08 Sperry Rand Corporation Remote controlled test interface unit
MX4130E (es) * 1977-05-20 1982-01-04 Amdahl Corp Mejoras en sistema de procesamiento de datos y escrutinio de informacion utilizando sumas de comprobacion
US4156132A (en) * 1977-11-01 1979-05-22 Burroughs Corporation Automatic fault injection apparatus and method
US4168796A (en) * 1978-04-13 1979-09-25 Ncr Corporation Tester with driver/sensor circuit having programmable termination devices
US4196386A (en) * 1978-04-13 1980-04-01 Ncr Corporation Method and portable apparatus for testing digital printed circuit boards
US4174805A (en) * 1978-04-13 1979-11-20 Ncr Corporation Method and apparatus for transmitting data to a predefined destination bus
US4245352A (en) * 1979-03-07 1981-01-13 International Jensen Incorporated Automated system for testing radio receivers
US4451918A (en) * 1981-10-09 1984-05-29 Teradyne, Inc. Test signal reloader
US4450560A (en) * 1981-10-09 1984-05-22 Teradyne, Inc. Tester for LSI devices and memory devices
US4937827A (en) * 1985-03-01 1990-06-26 Mentor Graphics Corporation Circuit verification accessory
US4744084A (en) * 1986-02-27 1988-05-10 Mentor Graphics Corporation Hardware modeling system and method for simulating portions of electrical circuits
US4972413A (en) * 1989-03-23 1990-11-20 Motorola, Inc. Method and apparatus for high speed integrated circuit testing
US6936954B2 (en) 2001-08-29 2005-08-30 Honeywell International Inc. Bulk resonator

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3311890A (en) * 1963-08-20 1967-03-28 Bell Telephone Labor Inc Apparatus for testing a storage system
US3490041A (en) * 1964-08-28 1970-01-13 Commerce Usa Electronic fault finding system using acceptable limits testing
US3478286A (en) * 1965-07-01 1969-11-11 Ibm System for automatically testing computer memories
US3549996A (en) * 1967-04-04 1970-12-22 Bendix Corp Universal tester for dynamic and static tests on the operating efficiency of electrical apparatus
US3505598A (en) * 1967-08-28 1970-04-07 Ibm Pulse measuring system
US3576541A (en) * 1968-01-02 1971-04-27 Burroughs Corp Method and apparatus for detecting and diagnosing computer error conditions
US3602809A (en) * 1968-06-12 1971-08-31 Kogyo Gijutsuin High speed function tester for integrated circuits
US3585599A (en) * 1968-07-09 1971-06-15 Ibm Universal system service adapter

Also Published As

Publication number Publication date
IT958003B (it) 1973-10-20
US3739349A (en) 1973-06-12
GB1373578A (en) 1974-11-13
FR2138878A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1973-01-05
CH564199A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1975-07-15
FR2138878B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1979-06-15

Similar Documents

Publication Publication Date Title
DE2225281A1 (de) Interface- oder Anschlußeinrichtung
DE3130714C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE2918053C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE3009945C2 (de) Funktionsprüfbarer, integrierter Schaltkreis
DE2646162C3 (de) Schaltungsanordnung zum Ersetzen fehlerhafter Informationen in Speicherplätzen eines nicht veränderbaren Speichers
DE69502827T2 (de) Elektronischer Schaltungs- oder Kartenprüfer und Verfahren zur Prüfung einer elektronischen Vorrichtung
DE2846117A1 (de) Informationsverarbeitungsvorrichtung
DE3237224A1 (de) Vorrichtung zum erzeugen einer folge von pruefdaten fuer lsi-schaltungen
DE3807997A1 (de) Ic-karte mit interner fehlerpruefung
DE2730328A1 (de) Adressierbarer assoziativ-speicher
DE3832440A1 (de) Testschaltungseinrichtung
DE3917945A1 (de) Programmierbare folgecodeerkennungsschaltung
DE10210264B4 (de) Ein Testvektorkomprimierungsverfahren
DE3587620T2 (de) Logikanalysator.
DE2351890A1 (de) Multiplexereinrichtung
EP0201634B1 (de) Digitaler Wortgenerator zur automatischen Erzeugung periodischer Dauerzeichen aus n-bit-Wörtern aller Wortgewichte und deren Permutationen
WO2005015249A2 (de) Elektronisches element mit einem zu testenden elektronischen schaltkreis und testsystem-anordnung zum testen des elektronischen elements
DE2704141C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE3317593A1 (de) Pruefspeicherarchitektur
DE2517525C3 (de) Verfahren und Signalisierungsidentifizierer zum Erkennen von Fernmelde-Signalisierungskriterien
DE19781563C2 (de) Mustergenerator
DE69027545T2 (de) Vorrichtung und Verfahren zum Frequenzwechsel
DE69330539T2 (de) Steuerungseinrichtung zur Schnittstellensteuerung zwischen einer Testmaschine und einer elektronischen Mehrkanalschaltung, insbesondere nach dem "Boundary Test Standard"
DE19731008A1 (de) Lesespannung-Steuereinrichtung für Halbleiter-Speichereinrichtung
DE2146108A1 (de) Synchrone Pufferanordnung