US3490041A - Electronic fault finding system using acceptable limits testing - Google Patents

Electronic fault finding system using acceptable limits testing Download PDF

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Publication number
US3490041A
US3490041A US392979A US3490041DA US3490041A US 3490041 A US3490041 A US 3490041A US 392979 A US392979 A US 392979A US 3490041D A US3490041D A US 3490041DA US 3490041 A US3490041 A US 3490041A
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United States
Prior art keywords
acceptable limits
finding system
fault finding
limits testing
jan
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Expired - Lifetime
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US392979A
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Gustave Shapiro
George J Rogers
Owen B Laug
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COMMERCE USA
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COMMERCE USA
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/3193Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response

Description

UH'USb] arv- Q PW Jan. 13, 1970 G SHAPIRO ET AL 3,490,041
ELECTRONIC FAULT FINDING SYSTEM USINGv ACCEPTABLE LIMITS TESTING Filed Aug. 28, 1964 24 Sheets-Sheet 1 BEING P0; our TESTED REFERENCE SOURCE TRANSFORM/4 T/0N NETWORK COMPARATOR F" r I MODULE UNDER TEST I 28 I I TRANSFORMATION I NETWORK I l l PIP/ME 50 I l EQU/PMENT SOCKET I J 29 /1 PLUG 55 53 PROBE a INSTRUMENT INVENTORS Gus fave Shapiro Georye Rogers Owen .5. Law/y BY JMQQ 4 ATTORNEY Jan. 13, 1970 s pmo ET AL 3,490,041
ELECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING 24 Sheets-Sheet 5 Filed Aug. 28, .1964
N3 ww W 5 wm N? 35 3 Q28: 5 ME 353 Q N I I N wEbEwi me @EQQQYSEN 9% RN x/ nw has 3 9v 9v 9w\+ NM EwSbEwE ME 5528 g mfivwqqzow RE m n :v Q? A :v Q an Q @m 1 mm \1 W W! on W W N on I mm vw n m wm mm om 56km? m kQQRhWZ EQQQSQQKWEQWR ERQEEWZQE J A mm mm WQDQOE mJbQQQ 7 0 \Y 3s NEIIQSQ #366 So WEI Shiv diwa, dig diva N a m 9% a Jan. 13, 1970 G. SHAPIRQ ET AL ELECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING 24 Sheets-Sheet 4 Filed Aug. 28, 1964 MODULE TESTED BEING TRAN SFOEM/I T/ON NE TWORK 112 DA m m P m C 1 4 T WW w mm m a m u Z A Q s E s R 5a F llllll IIL WIDTH TRANSFORMATION NETWORK 185 MODUL E BEING TESTED z 40 COMPARATOR 4 5 Jan. 13, 1970 G. SHAPIRO ET AL LECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING m 20R QSQEQZ WW;
A 95mm w MQQQQS QEQQQHEB W7 WE E Y mm wk mm. aw wowbow QEQQQQESN wuzwwmmwm 9% I MQDQOE VI BS Jan. 13, 1970 Filed Aug. 28, 1964 G. SHAPIRO ET L ELECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING 24 Sheets-Sheet 6 WOVE/QSHOOT 752 A MODULE BEl/VG TESTED TRANSFORMflT/ON 55 NETWORK o g/ WCOMPARATOR i i A Max 001 MODULE T p177 BEING TESTED j TRANSFORMATION NETWORK 175 3 41 COMPARATOR Jan. 13, 1970 G. SHAPIRO ET AL 3,490,041
ELECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING Filed Aug. 28, 1964 24 Sheets-Sheet 7 RISE TIME MODULE L Z00 BEING TESTED NE TWORK 204 59 g 211 I [98 4 208 I 55 COMPAR/l T018 f L 40 j i 212 BEING TESTED I TRANSFORMATION 2i 219 NETWORK 2/7 205 fi g 2 (35 COM PA [2 ATOQ Jan. 13, 1970 ELECTRONIC Filed Aug. 28. 1964 3. H P o ET AL 3,490,041
24 Sheets-Sheet 8 A t 226 MODULE BEING 7. 5s TED l TRA NSFORMA TIO N NETWORK Z26 59 41 A-C Z REFERENCE coM ARmoR E VOLT/JG 35 LINEAR/TY SWEEP 250 f l GENERATOR BEING ,1, l TESTED TRANSFORMATION 245 Z46 NETWORK 241 f 244 39 41 40 253 L COMPARA TOR 55 55 j 25/ 49 Jan. 13, 1970 G. SHAPIRO ET AL 3,490,041
ELECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING Filed Aug. 28. 1964 24 Sheets-Sheet 9 MODULE ,c 1 A ,c BEING o W TESTED TRANSFOQMA T/ON 277/ NETWORK 27 2 75 55 (044m 124 TOR Fzyt Z9 41 40 I m +A1 2 f F249 134 Fly. 18A
MODULE f i Af BEING 755750 TRANSFOQM/J T/ON NETWORK 261 263 FILTER 39 2622 41 2 40 FILTER COMPARATOR Fay 1a Jan. 13, 1970 s. SHAPIRO ET AL 3,490,041
ELECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING Filed Aug. 28, 1964 24 Sheets-Sheet 1O MODULE 7% :M BEING *0 TESTED TRANSFORMATION NETWORK Z82 l 2&
E ECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING Filed Aug. 28, 1964 24 Sheets-Sheet 11 29/ V0 [9 MODUL E BEING TESTED TRANSFORMATION NETWORK Z90 55 a; 40 35 COMPARATOR l] I sin 6 292 i Iain (e 5 2 2 7%,,
I sum O I I I 90 180 270 560 PHASE DIFFERENCE DEGREES Jan. 13, 1970 G.'SHAPIRO ET L 3,490,041
ECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING Filed Aug. 28, 1964 24 Sheets-Sheet 12 L MODULE W S BEING TEE TED TRANSFORMATION NETWORK 297 59 55 55 COMPARA T02? K 41 49 40 2 9 6 ERROR PHASE DIFFERENCE (DEGREES) O l Jan. 13, 1970 s. SHAPIRO E L E ECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING 24 Sheets-Sheet 14 Filed Aug. 28, 1964 Rm @R wa w WUWSQW RZWQQQU WORD mhwQ L QE 33:8
mm as E A u 1% QQBUMRMQ QEQQWMYQWGN MUWSQW mwkmwmimQ U q mmmkomw SIw 0.0? M. E m 3.8 Q2 Q5 3 wzawamwmmw 8% ME 328 6 A an QmilQIw HZDIW Jan. 13; 1970 s P ETAL 3,490,041
ELECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING Filed Aug. 28, 1964 24 Sheets-Sheet 15 nww ww fi F WM. A win J IAN my mum I5 wwn own M bwow M 7 a 21mm an &m wmm q 1% M522 L m '1 www mmwfimwwial Z n E 41 q 33w 6 AJ @0555 Al W E mafia A1 womqmumfi Al mnw Qv A n n an now *3 M F QQ/AV iom 0 35 w P m n N won wzoiuwzzou mom w Q wzis mwomm can 0mm Q 24% mo. jwG NB um wt E 6i 3 mmwmw nwl H6 9853 @v NGEZQST WT @EIIQSQ zwmmbu mzwmm x k qwtzwmmmmfi E Jan. 13, 1970 s p o ET AL 3,490,041
LECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING Filed Aug. 28, 1964 24 Sheets-Sheet 17 l\ g 3 g @x E R in 9 g k f Jan. 13, 1970 e. SHAPIRO ETAI- 3,490,041
ECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING Filed Aug. 28, 1964 24 Sheets-Sheet 18 PAPER!) LL E L TRIGGERED BLOCK/N6 05C IL L A TOR TR A NSFORMA Tl 0N NETWORKS X y g 1 4 15 1e 10 9 12 24 25 T0 TERMINALS 0N SOC/(ET 54 T0 CELL 4 7'0 CELL C Jan. 13, 1970 G. SHAPIRO T AL Filed Aug. 28, 1964 24 Sheets-Sheet 19 VOLTAGE PLUG 51 0 '4 TIME- SAMPLING I I SWITCH 226 I I I I f0 t, TIME I ISAMPLING -INPUT c0MPAIe/s0NINPuT LEVEL LEVEL 1 LEVEL OF I DETECTORS 46,47 IN cELLs A To D I to L, 1'2; TIME I I I I I I l RELAYS 408 Z: 411 i {a 2 t 6 TIME I I I I INDICAT/NG AcTuA T/NG REL/W600 I to I {4 TIME I I INDICATOR LAMP 625 W629 I I t l 2 t3 t4 Fly? 284 Jan; 13, 1970 G. SHAPIRO ET L ELECTRONIC FAULT FINDING SYSTEM USING ACCEPTABLE LIMITS TESTING 24 Sheets-Sheet 2 0 Filed Aug. 28. 1964 Q WQQQQU Imp? QQQ
US392979A 1964-08-28 1964-08-28 Electronic fault finding system using acceptable limits testing Expired - Lifetime US3490041A (en)

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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3739349A (en) * 1971-05-24 1973-06-12 Sperry Rand Corp Digital equipment interface unit
USB394712I5 (en) * 1973-09-06 1975-01-28
US4720671A (en) * 1984-08-06 1988-01-19 Mitsubishi Denki Kabushiki Kaisha Semiconductor device testing device
US5153524A (en) * 1989-03-29 1992-10-06 The United States Of America As Represented By The Secretary Of The Army Testing electromagnetic shielding effectiveness of shielded enclosures
US5860687A (en) * 1997-12-19 1999-01-19 Chrysler Corporation Vehicle spare tire storage system having stiffening plate
US6628135B2 (en) * 2001-09-18 2003-09-30 Sun Microsystems, Inc. Analog-based on-chip voltage sensor
AU2009201607B2 (en) * 2008-04-23 2011-10-06 Woongjin Coway Co., Ltd. Device and method for detecting zero crossing and voltage amplitude from single pulse signal
US9046564B1 (en) 2012-08-07 2015-06-02 Joseph Alan Griffin Circuit testing device

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2722659A (en) * 1954-08-31 1955-11-01 Gen Electric Testing device
US2785377A (en) * 1953-08-27 1957-03-12 Gen Electric Deviation factor meter
US2929990A (en) * 1957-10-28 1960-03-22 Martin S Maurer Voltage ratio and phase angle tester
US2940071A (en) * 1956-01-16 1960-06-07 Phillips Petroleum Co Analog to digital converter
US2970260A (en) * 1956-05-04 1961-01-31 Gen Electric Co Ltd Apparatus for testing a group of electric signals
US3163849A (en) * 1958-04-21 1964-12-29 Honeywell Inc Alarm sensing
US3286232A (en) * 1961-11-03 1966-11-15 Gen Electric Digital comparator classifying device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2785377A (en) * 1953-08-27 1957-03-12 Gen Electric Deviation factor meter
US2722659A (en) * 1954-08-31 1955-11-01 Gen Electric Testing device
US2940071A (en) * 1956-01-16 1960-06-07 Phillips Petroleum Co Analog to digital converter
US2970260A (en) * 1956-05-04 1961-01-31 Gen Electric Co Ltd Apparatus for testing a group of electric signals
US2929990A (en) * 1957-10-28 1960-03-22 Martin S Maurer Voltage ratio and phase angle tester
US3163849A (en) * 1958-04-21 1964-12-29 Honeywell Inc Alarm sensing
US3286232A (en) * 1961-11-03 1966-11-15 Gen Electric Digital comparator classifying device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3739349A (en) * 1971-05-24 1973-06-12 Sperry Rand Corp Digital equipment interface unit
USB394712I5 (en) * 1973-09-06 1975-01-28
US3916306A (en) * 1973-09-06 1975-10-28 Ibm Method and apparatus for testing high circuit density devices
US4720671A (en) * 1984-08-06 1988-01-19 Mitsubishi Denki Kabushiki Kaisha Semiconductor device testing device
US5153524A (en) * 1989-03-29 1992-10-06 The United States Of America As Represented By The Secretary Of The Army Testing electromagnetic shielding effectiveness of shielded enclosures
US5860687A (en) * 1997-12-19 1999-01-19 Chrysler Corporation Vehicle spare tire storage system having stiffening plate
US6628135B2 (en) * 2001-09-18 2003-09-30 Sun Microsystems, Inc. Analog-based on-chip voltage sensor
AU2009201607B2 (en) * 2008-04-23 2011-10-06 Woongjin Coway Co., Ltd. Device and method for detecting zero crossing and voltage amplitude from single pulse signal
US9046564B1 (en) 2012-08-07 2015-06-02 Joseph Alan Griffin Circuit testing device

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