DE1901666A1 - Verfahren fuer Kristalltopographie und Vorrichtung zur Durchfuehrung dieses Verfahrens - Google Patents

Verfahren fuer Kristalltopographie und Vorrichtung zur Durchfuehrung dieses Verfahrens

Info

Publication number
DE1901666A1
DE1901666A1 DE19691901666 DE1901666A DE1901666A1 DE 1901666 A1 DE1901666 A1 DE 1901666A1 DE 19691901666 DE19691901666 DE 19691901666 DE 1901666 A DE1901666 A DE 1901666A DE 1901666 A1 DE1901666 A1 DE 1901666A1
Authority
DE
Germany
Prior art keywords
crystal
crystal piece
piece
ray tube
rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19691901666
Other languages
German (de)
English (en)
Inventor
Georges Blet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
COMPANIE FRANCAISE THOMSON
Original Assignee
COMPANIE FRANCAISE THOMSON
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by COMPANIE FRANCAISE THOMSON filed Critical COMPANIE FRANCAISE THOMSON
Publication of DE1901666A1 publication Critical patent/DE1901666A1/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE19691901666 1968-01-19 1969-01-14 Verfahren fuer Kristalltopographie und Vorrichtung zur Durchfuehrung dieses Verfahrens Pending DE1901666A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR136735 1968-01-19

Publications (1)

Publication Number Publication Date
DE1901666A1 true DE1901666A1 (de) 1969-09-04

Family

ID=8644824

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19691901666 Pending DE1901666A1 (de) 1968-01-19 1969-01-14 Verfahren fuer Kristalltopographie und Vorrichtung zur Durchfuehrung dieses Verfahrens

Country Status (6)

Country Link
BE (1) BE726954A (ja)
CH (1) CH488180A (ja)
DE (1) DE1901666A1 (ja)
FR (1) FR1564558A (ja)
GB (1) GB1246410A (ja)
NL (1) NL6900671A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0021253A1 (de) * 1979-06-25 1981-01-07 Siemens Aktiengesellschaft Einrichtung für die Röntgenfluoreszenzanalyse

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2748501C3 (de) * 1977-10-28 1985-05-30 Born, Eberhard, Dr. Verfahren und Vorrichtung zur Erstellung von Texturtopogrammen
FR2668262B1 (fr) * 1990-10-23 1994-04-01 Centre Nal Recherc Scientifique Procede d'analyse aux rayons x de pieces monocristallines.
CN103983650B (zh) * 2014-05-15 2016-04-06 重庆大学 多自由度、多角度旋转装置
CN105758880B (zh) * 2016-04-11 2019-02-05 西北核技术研究所 基于闪光x光机的超快x射线衍射成像方法及系统
CN112670200A (zh) * 2020-12-29 2021-04-16 杭州中欣晶圆半导体股份有限公司 检测氧化堆垛层错的方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0021253A1 (de) * 1979-06-25 1981-01-07 Siemens Aktiengesellschaft Einrichtung für die Röntgenfluoreszenzanalyse

Also Published As

Publication number Publication date
CH488180A (fr) 1970-03-31
NL6900671A (ja) 1969-07-22
BE726954A (ja) 1969-07-16
GB1246410A (en) 1971-09-15
FR1564558A (ja) 1969-04-25

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