DE112023001004T5 - Entfernungsmessvorrichtung - Google Patents

Entfernungsmessvorrichtung Download PDF

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Publication number
DE112023001004T5
DE112023001004T5 DE112023001004.8T DE112023001004T DE112023001004T5 DE 112023001004 T5 DE112023001004 T5 DE 112023001004T5 DE 112023001004 T DE112023001004 T DE 112023001004T DE 112023001004 T5 DE112023001004 T5 DE 112023001004T5
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DE
Germany
Prior art keywords
light
filter
lights
regions
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE112023001004.8T
Other languages
German (de)
English (en)
Inventor
Masaharu Fukakusa
Takahiro Nibu
Mayu TABA
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Intellectual Property Management Co Ltd
Original Assignee
Panasonic Intellectual Property Management Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Intellectual Property Management Co Ltd filed Critical Panasonic Intellectual Property Management Co Ltd
Publication of DE112023001004T5 publication Critical patent/DE112023001004T5/de
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • G01C3/06—Use of electric means to obtain final indication

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Measurement Of Optical Distance (AREA)
DE112023001004.8T 2022-03-24 2023-03-17 Entfernungsmessvorrichtung Pending DE112023001004T5 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022048710 2022-03-24
JP2022-048710 2022-03-24
PCT/JP2023/010731 WO2023182237A1 (ja) 2022-03-24 2023-03-17 距離測定装置

Publications (1)

Publication Number Publication Date
DE112023001004T5 true DE112023001004T5 (de) 2025-01-02

Family

ID=88100895

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112023001004.8T Pending DE112023001004T5 (de) 2022-03-24 2023-03-17 Entfernungsmessvorrichtung

Country Status (5)

Country Link
US (1) US20250012559A1 (https=)
JP (1) JP7847319B2 (https=)
CN (1) CN118900983A (https=)
DE (1) DE112023001004T5 (https=)
WO (1) WO2023182237A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024111326A1 (ja) * 2022-11-25 2024-05-30 パナソニックＩｐマネジメント株式会社 距離測定装置
JPWO2024111325A1 (https=) * 2022-11-25 2024-05-30

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013190394A (ja) 2012-03-15 2013-09-26 Ricoh Co Ltd パターン照明装置、及び測距装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4577126B2 (ja) * 2005-07-08 2010-11-10 オムロン株式会社 ステレオ対応づけのための投光パターンの生成装置及び生成方法
JP2014115109A (ja) * 2012-12-06 2014-06-26 Canon Inc 距離計測装置及び方法
JP6337614B2 (ja) 2014-05-23 2018-06-06 セイコーエプソン株式会社 制御装置、ロボット、及び制御方法
JP6524680B2 (ja) 2015-02-03 2019-06-05 株式会社リコー 撮像システム、距離情報の取得方法及び距離情報の生産方法
JP2018189443A (ja) * 2017-04-28 2018-11-29 キヤノン株式会社 距離測定装置、距離測定方法及び撮像装置
JP7253323B2 (ja) * 2018-02-14 2023-04-06 オムロン株式会社 ３次元計測システム及び３次元計測方法
JP6880512B2 (ja) 2018-02-14 2021-06-02 オムロン株式会社 ３次元測定装置、３次元測定方法及び３次元測定プログラム
JP7168077B2 (ja) * 2019-05-22 2022-11-09 オムロン株式会社 ３次元計測システム及び３次元計測方法
JP2020193945A (ja) 2019-05-30 2020-12-03 本田技研工業株式会社 計測装置、把持システム、計測装置の制御方法及びプログラム
CN112991383B (zh) 2019-12-18 2022-11-08 山东理工大学 基于三种颜色光点图案的立体视觉匹配方法
CN113048907B (zh) 2021-02-08 2022-04-22 浙江大学 一种基于宏像素分割的单像素多光谱成像方法及装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013190394A (ja) 2012-03-15 2013-09-26 Ricoh Co Ltd パターン照明装置、及び測距装置

Also Published As

Publication number Publication date
WO2023182237A1 (ja) 2023-09-28
CN118900983A (zh) 2024-11-05
JP7847319B2 (ja) 2026-04-17
JPWO2023182237A1 (https=) 2023-09-28
US20250012559A1 (en) 2025-01-09

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