JPWO2023182237A1 - - Google Patents

Info

Publication number
JPWO2023182237A1
JPWO2023182237A1 JP2024510144A JP2024510144A JPWO2023182237A1 JP WO2023182237 A1 JPWO2023182237 A1 JP WO2023182237A1 JP 2024510144 A JP2024510144 A JP 2024510144A JP 2024510144 A JP2024510144 A JP 2024510144A JP WO2023182237 A1 JPWO2023182237 A1 JP WO2023182237A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2024510144A
Other languages
Japanese (ja)
Other versions
JP7847319B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023182237A1 publication Critical patent/JPWO2023182237A1/ja
Application granted granted Critical
Publication of JP7847319B2 publication Critical patent/JP7847319B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • G01C3/06—Use of electric means to obtain final indication

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Measurement Of Optical Distance (AREA)
JP2024510144A 2022-03-24 2023-03-17 距離測定装置 Active JP7847319B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022048710 2022-03-24
JP2022048710 2022-03-24
PCT/JP2023/010731 WO2023182237A1 (ja) 2022-03-24 2023-03-17 距離測定装置

Publications (2)

Publication Number Publication Date
JPWO2023182237A1 true JPWO2023182237A1 (https=) 2023-09-28
JP7847319B2 JP7847319B2 (ja) 2026-04-17

Family

ID=88100895

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024510144A Active JP7847319B2 (ja) 2022-03-24 2023-03-17 距離測定装置

Country Status (5)

Country Link
US (1) US20250012559A1 (https=)
JP (1) JP7847319B2 (https=)
CN (1) CN118900983A (https=)
DE (1) DE112023001004T5 (https=)
WO (1) WO2023182237A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024111326A1 (ja) * 2022-11-25 2024-05-30 パナソニックＩｐマネジメント株式会社 距離測定装置
JPWO2024111325A1 (https=) * 2022-11-25 2024-05-30

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015222220A (ja) * 2014-05-23 2015-12-10 セイコーエプソン株式会社 制御装置、ロボット、及び制御方法
JP2016142645A (ja) * 2015-02-03 2016-08-08 株式会社リコー 撮像システム
JP2019138817A (ja) * 2018-02-14 2019-08-22 オムロン株式会社 ３次元測定装置、３次元測定方法及び３次元測定プログラム
JP2020193945A (ja) * 2019-05-30 2020-12-03 本田技研工業株式会社 計測装置、把持システム、計測装置の制御方法及びプログラム
CN112991383A (zh) * 2019-12-18 2021-06-18 山东理工大学 基于三种颜色光点图案的立体视觉匹配方法
CN113048907A (zh) * 2021-02-08 2021-06-29 浙江大学 一种基于宏像素分割的单像素多光谱成像方法及装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4577126B2 (ja) * 2005-07-08 2010-11-10 オムロン株式会社 ステレオ対応づけのための投光パターンの生成装置及び生成方法
JP5966467B2 (ja) 2012-03-15 2016-08-10 株式会社リコー 測距装置
JP2014115109A (ja) * 2012-12-06 2014-06-26 Canon Inc 距離計測装置及び方法
JP2018189443A (ja) * 2017-04-28 2018-11-29 キヤノン株式会社 距離測定装置、距離測定方法及び撮像装置
JP7253323B2 (ja) * 2018-02-14 2023-04-06 オムロン株式会社 ３次元計測システム及び３次元計測方法
JP7168077B2 (ja) * 2019-05-22 2022-11-09 オムロン株式会社 ３次元計測システム及び３次元計測方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015222220A (ja) * 2014-05-23 2015-12-10 セイコーエプソン株式会社 制御装置、ロボット、及び制御方法
JP2016142645A (ja) * 2015-02-03 2016-08-08 株式会社リコー 撮像システム
JP2019138817A (ja) * 2018-02-14 2019-08-22 オムロン株式会社 ３次元測定装置、３次元測定方法及び３次元測定プログラム
JP2020193945A (ja) * 2019-05-30 2020-12-03 本田技研工業株式会社 計測装置、把持システム、計測装置の制御方法及びプログラム
CN112991383A (zh) * 2019-12-18 2021-06-18 山东理工大学 基于三种颜色光点图案的立体视觉匹配方法
CN113048907A (zh) * 2021-02-08 2021-06-29 浙江大学 一种基于宏像素分割的单像素多光谱成像方法及装置

Also Published As

Publication number Publication date
WO2023182237A1 (ja) 2023-09-28
CN118900983A (zh) 2024-11-05
DE112023001004T5 (de) 2025-01-02
JP7847319B2 (ja) 2026-04-17
US20250012559A1 (en) 2025-01-09

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