DE112019004919T5 - Opferklemme zur vorbereitung einer dünnen probe für die infrarotmikroskopie - Google Patents
Opferklemme zur vorbereitung einer dünnen probe für die infrarotmikroskopie Download PDFInfo
- Publication number
- DE112019004919T5 DE112019004919T5 DE112019004919.4T DE112019004919T DE112019004919T5 DE 112019004919 T5 DE112019004919 T5 DE 112019004919T5 DE 112019004919 T DE112019004919 T DE 112019004919T DE 112019004919 T5 DE112019004919 T5 DE 112019004919T5
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- 238000004971 IR microspectroscopy Methods 0.000 title 1
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- 238000005520 cutting process Methods 0.000 claims abstract description 7
- 230000007246 mechanism Effects 0.000 claims description 9
- 239000004698 Polyethylene Substances 0.000 claims description 5
- 239000012876 carrier material Substances 0.000 claims description 5
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- 229920000573 polyethylene Polymers 0.000 claims description 5
- 238000003825 pressing Methods 0.000 claims description 4
- 230000000284 resting effect Effects 0.000 abstract description 2
- 238000005102 attenuated total reflection Methods 0.000 description 31
- 239000013078 crystal Substances 0.000 description 14
- 238000010521 absorption reaction Methods 0.000 description 8
- 238000005259 measurement Methods 0.000 description 5
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- 238000001210 attenuated total reflectance infrared spectroscopy Methods 0.000 description 2
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- 238000003384 imaging method Methods 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- BUHVIAUBTBOHAG-FOYDDCNASA-N (2r,3r,4s,5r)-2-[6-[[2-(3,5-dimethoxyphenyl)-2-(2-methylphenyl)ethyl]amino]purin-9-yl]-5-(hydroxymethyl)oxolane-3,4-diol Chemical compound COC1=CC(OC)=CC(C(CNC=2C=3N=CN(C=3N=CN=2)[C@H]2[C@@H]([C@H](O)[C@@H](CO)O2)O)C=2C(=CC=CC=2)C)=C1 BUHVIAUBTBOHAG-FOYDDCNASA-N 0.000 description 1
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201862739299P | 2018-09-30 | 2018-09-30 | |
| US62/739,299 | 2018-09-30 | ||
| PCT/US2019/043484 WO2020068259A1 (en) | 2018-09-30 | 2019-07-25 | Sacrificial clamp for preparation of thin specimens for infrared microscopy |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE112019004919T5 true DE112019004919T5 (de) | 2021-07-08 |
Family
ID=67551716
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE112019004919.4T Pending DE112019004919T5 (de) | 2018-09-30 | 2019-07-25 | Opferklemme zur vorbereitung einer dünnen probe für die infrarotmikroskopie |
Country Status (3)
| Country | Link |
|---|---|
| CN (1) | CN112771370A (zh) |
| DE (1) | DE112019004919T5 (zh) |
| WO (1) | WO2020068259A1 (zh) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9863877B2 (en) | 2015-09-23 | 2018-01-09 | Agilent Technologies, Inc. | Infrared spectrometer and scanner utilizing attenuated total reflection |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB0608258D0 (en) * | 2006-04-26 | 2006-06-07 | Perkinelmer Singapore Pte Ltd | Spectroscopy using attenuated total internal reflectance (ATR) |
| JP2009122017A (ja) * | 2007-11-16 | 2009-06-04 | Toppan Printing Co Ltd | ラマン分光分析用冶具 |
| JP5115584B2 (ja) * | 2010-05-20 | 2013-01-09 | 住友電気工業株式会社 | 試料の断面形成方法、固定用治具および測定方法 |
| US11300773B2 (en) * | 2014-09-29 | 2022-04-12 | Agilent Technologies, Inc. | Mid-infrared scanning system |
-
2019
- 2019-07-25 WO PCT/US2019/043484 patent/WO2020068259A1/en active Application Filing
- 2019-07-25 CN CN201980063699.7A patent/CN112771370A/zh active Pending
- 2019-07-25 DE DE112019004919.4T patent/DE112019004919T5/de active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9863877B2 (en) | 2015-09-23 | 2018-01-09 | Agilent Technologies, Inc. | Infrared spectrometer and scanner utilizing attenuated total reflection |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2020068259A1 (en) | 2020-04-02 |
| CN112771370A (zh) | 2021-05-07 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed |