DE112013002194B4 - Electronenstossionenquelle mit kurzer Ansprechzeit - Google Patents

Electronenstossionenquelle mit kurzer Ansprechzeit Download PDF

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Publication number
DE112013002194B4
DE112013002194B4 DE112013002194.3T DE112013002194T DE112013002194B4 DE 112013002194 B4 DE112013002194 B4 DE 112013002194B4 DE 112013002194 T DE112013002194 T DE 112013002194T DE 112013002194 B4 DE112013002194 B4 DE 112013002194B4
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DE
Germany
Prior art keywords
ion source
electron impact
source
impact ion
closed
Prior art date
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Active
Application number
DE112013002194.3T
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German (de)
English (en)
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DE112013002194T5 (de
Inventor
Anatoly N. Verenchikov
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Leco Corp
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Leco Corp
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Publication of DE112013002194T5 publication Critical patent/DE112013002194T5/de
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE112013002194.3T 2012-04-26 2013-04-26 Electronenstossionenquelle mit kurzer Ansprechzeit Active DE112013002194B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261638722P 2012-04-26 2012-04-26
US61/638,722 2012-04-26
PCT/US2013/038388 WO2013163530A2 (en) 2012-04-26 2013-04-26 Electron impact ion source with fast response

Publications (2)

Publication Number Publication Date
DE112013002194T5 DE112013002194T5 (de) 2015-01-08
DE112013002194B4 true DE112013002194B4 (de) 2020-12-24

Family

ID=48576502

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112013002194.3T Active DE112013002194B4 (de) 2012-04-26 2013-04-26 Electronenstossionenquelle mit kurzer Ansprechzeit

Country Status (5)

Country Link
US (1) US9123521B2 (https=)
JP (2) JP2015515733A (https=)
CN (1) CN104254903B (https=)
DE (1) DE112013002194B4 (https=)
WO (1) WO2013163530A2 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2546355A (en) 2014-03-31 2017-07-19 Leco Corp GC-TOF MS With improved detection limit
CN104103488B (zh) * 2014-05-28 2016-06-15 北京大学 用于飞行时间质谱计的场发射电离源
JP6323362B2 (ja) * 2015-02-23 2018-05-16 株式会社島津製作所 イオン化装置
US10408951B2 (en) 2016-01-29 2019-09-10 Board Of Trustees Of Michigan State University Radiation detector
DE102016110495B4 (de) * 2016-06-07 2018-03-29 Vacom Vakuum Komponenten & Messtechnik Gmbh Vorrichtung und Verfahren zum Erzeugen, Speichern und Freisetzen von Ionen aus einer umgebenden Restgasatmosphäre
US10541122B2 (en) 2017-06-13 2020-01-21 Mks Instruments, Inc. Robust ion source
EP3662501A1 (en) 2017-08-06 2020-06-10 Micromass UK Limited Ion mirror for multi-reflecting mass spectrometers
US11817303B2 (en) 2017-08-06 2023-11-14 Micromass Uk Limited Accelerator for multi-pass mass spectrometers
GB201806507D0 (en) * 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
US11328919B2 (en) 2018-05-11 2022-05-10 Leco Corporation Two-stage ion source comprising closed and open ion volumes
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
US11056330B2 (en) 2018-12-21 2021-07-06 Thermo Finnigan Llc Apparatus and system for active heat transfer management in ESI ion sources
GB201903779D0 (en) 2019-03-20 2019-05-01 Micromass Ltd Multiplexed time of flight mass spectrometer
CN112599397B (zh) * 2020-12-14 2023-06-06 兰州空间技术物理研究所 一种储存式离子源
US11768176B2 (en) 2022-01-06 2023-09-26 Mks Instruments, Inc. Ion source with gas delivery for high-fidelity analysis
KR102587356B1 (ko) * 2022-12-12 2023-10-12 주식회사 아스타 차동 진공 이온화 원

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090090862A1 (en) * 2006-03-09 2009-04-09 Shuichi Kawana Mass spectrometer
WO2011107836A1 (en) * 2010-03-02 2011-09-09 Anatoly Verenchikov Open trap mass spectrometer
WO2012024468A2 (en) * 2010-08-19 2012-02-23 Leco Corporation Time-of-flight mass spectrometer with accumulating electron impact ion source

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DE2361955A1 (de) * 1973-12-13 1975-06-19 Uranit Gmbh Quadrupol-massenspektrometer
JPH03201355A (ja) * 1989-12-27 1991-09-03 Jeol Ltd 大気圧イオン化質量分析装置
US5055678A (en) * 1990-03-02 1991-10-08 Finnigan Corporation Metal surfaces for sample analyzing and ionizing apparatus
JP2777327B2 (ja) * 1994-02-02 1998-07-16 株式会社東京カソード研究所 質量分析用ガス導入バルブ
JPH08254504A (ja) * 1994-11-29 1996-10-01 Zellweger Luwa Ag 伸長された物体の特性を記録するための方法と装置
US5847385A (en) * 1996-08-09 1998-12-08 Analytica Of Branford, Inc. Mass resolution by angular alignment of the ion detector conversion surface in time-of-flight mass spectrometers with electrostatic steering deflectors
US6534764B1 (en) * 1999-06-11 2003-03-18 Perseptive Biosystems Tandem time-of-flight mass spectrometer with damping in collision cell and method for use
JP2004247162A (ja) * 2003-02-13 2004-09-02 Toyota Motor Corp 高真空分析装置
JP4232662B2 (ja) * 2004-03-11 2009-03-04 株式会社島津製作所 イオン化装置
US7326925B2 (en) * 2005-03-22 2008-02-05 Leco Corporation Multi-reflecting time-of-flight mass spectrometer with isochronous curved ion interface
EP1855306B1 (en) * 2006-05-11 2019-11-13 ISB - Ion Source & Biotechnologies S.R.L. Ionization source and method for mass spectrometry
US7709789B2 (en) * 2008-05-29 2010-05-04 Virgin Instruments Corporation TOF mass spectrometry with correction for trajectory error
CN102150219B (zh) * 2008-07-28 2015-01-28 莱克公司 在射频场中使用网的离子操纵的方法和设备
JP2010244903A (ja) * 2009-04-07 2010-10-28 Shimadzu Corp 質量分析装置
US20100301202A1 (en) * 2009-05-29 2010-12-02 Virgin Instruments Corporation Tandem TOF Mass Spectrometer With High Resolution Precursor Selection And Multiplexed MS-MS
US20120217391A1 (en) * 2009-11-06 2012-08-30 Hiroyasu Shichi Charged particle microscope
US8299421B2 (en) * 2010-04-05 2012-10-30 Agilent Technologies, Inc. Low-pressure electron ionization and chemical ionization for mass spectrometry
WO2011127091A1 (en) * 2010-04-05 2011-10-13 Indiana University Research And Technology Corporation Method for enhancement of mass resolution over a limited mass range for time-of-flight spectrometry
GB201007210D0 (en) * 2010-04-30 2010-06-16 Verenchikov Anatoly Time-of-flight mass spectrometer with improved duty cycle
GB201022050D0 (en) * 2010-12-29 2011-02-02 Verenchikov Anatoly Electrostatic trap mass spectrometer with improved ion injection

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090090862A1 (en) * 2006-03-09 2009-04-09 Shuichi Kawana Mass spectrometer
WO2011107836A1 (en) * 2010-03-02 2011-09-09 Anatoly Verenchikov Open trap mass spectrometer
WO2012024468A2 (en) * 2010-08-19 2012-02-23 Leco Corporation Time-of-flight mass spectrometer with accumulating electron impact ion source

Also Published As

Publication number Publication date
JP6383023B2 (ja) 2018-08-29
WO2013163530A2 (en) 2013-10-31
JP2017098267A (ja) 2017-06-01
US20150144779A1 (en) 2015-05-28
CN104254903A (zh) 2014-12-31
JP2015515733A (ja) 2015-05-28
DE112013002194T5 (de) 2015-01-08
CN104254903B (zh) 2017-05-24
WO2013163530A3 (en) 2014-08-14
US9123521B2 (en) 2015-09-01

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