DE112010003393T8 - Testvorrichtung und Testverfahren für ein moduliertes Signal - Google Patents

Testvorrichtung und Testverfahren für ein moduliertes Signal Download PDF

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Publication number
DE112010003393T8
DE112010003393T8 DE112010003393T DE112010003393T DE112010003393T8 DE 112010003393 T8 DE112010003393 T8 DE 112010003393T8 DE 112010003393 T DE112010003393 T DE 112010003393T DE 112010003393 T DE112010003393 T DE 112010003393T DE 112010003393 T8 DE112010003393 T8 DE 112010003393T8
Authority
DE
Germany
Prior art keywords
test
modulated signal
test method
test device
modulated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE112010003393T
Other languages
English (en)
Other versions
DE112010003393T5 (de
Inventor
Masahiro Ishida
Toshiyuki Okayasu
Daisuke Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE112010003393T5 publication Critical patent/DE112010003393T5/de
Application granted granted Critical
Publication of DE112010003393T8 publication Critical patent/DE112010003393T8/de
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31706—Testing of digital circuits involving differential digital signals, e.g. testing differential signal circuits, using differential signals for testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31932—Comparators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Digital Transmission Methods That Use Modulated Carrier Waves (AREA)
DE112010003393T 2009-08-26 2010-08-09 Testvorrichtung und Testverfahren für ein moduliertes Signal Expired - Fee Related DE112010003393T8 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/548,399 US20110054827A1 (en) 2009-08-26 2009-08-26 Test apparatus and method for modulated signal
US12/548,399 2009-08-26
PCT/JP2010/004995 WO2011024394A1 (ja) 2009-08-26 2010-08-09 変調された被試験信号の試験装置および試験方法

Publications (2)

Publication Number Publication Date
DE112010003393T5 DE112010003393T5 (de) 2012-06-14
DE112010003393T8 true DE112010003393T8 (de) 2012-08-23

Family

ID=43626110

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112010003393T Expired - Fee Related DE112010003393T8 (de) 2009-08-26 2010-08-09 Testvorrichtung und Testverfahren für ein moduliertes Signal

Country Status (6)

Country Link
US (1) US20110054827A1 (de)
JP (1) JPWO2011024394A1 (de)
KR (1) KR101334445B1 (de)
CN (1) CN102483440A (de)
DE (1) DE112010003393T8 (de)
WO (1) WO2011024394A1 (de)

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JP3930037B1 (ja) * 2006-04-27 2007-06-13 株式会社アドバンテスト 試験装置および試験方法
JP5274551B2 (ja) * 2008-05-09 2013-08-28 株式会社アドバンテスト デジタル変調信号の試験装置および試験方法
DE102016119244B4 (de) * 2015-11-27 2020-10-01 Roentdek-Handels Gmbh Zeit-zu-Digital-Konverter
CN110070906A (zh) * 2019-04-10 2019-07-30 晶晨半导体(上海)股份有限公司 一种存储系统的信号调试方法
JP7217204B2 (ja) * 2019-06-28 2023-02-02 株式会社アドバンテスト 信号処理装置および信号処理方法
US10803914B1 (en) * 2019-08-27 2020-10-13 Micron Technology, Inc. Selectively squelching differential strobe input signal in memory-device testing system
US11102596B2 (en) 2019-11-19 2021-08-24 Roku, Inc. In-sync digital waveform comparison to determine pass/fail results of a device under test (DUT)
US10892800B1 (en) 2020-01-06 2021-01-12 Nucurrent, Inc. Systems and methods for wireless power transfer including pulse width encoded data communications
US11303164B2 (en) 2020-07-24 2022-04-12 Nucurrent, Inc. Low cost communications demodulation for wireless power transmission system
US11303165B2 (en) 2020-07-24 2022-04-12 Nucurrent, Inc. Low cost communications demodulation for wireless power receiver system
US11811244B2 (en) 2021-02-01 2023-11-07 Nucurrent, Inc. Automatic gain control for communications demodulation in wireless power transmitters
US11431204B2 (en) 2021-02-01 2022-08-30 Nucurrent, Inc. Automatic gain control for communications demodulation in wireless power transfer systems
US11277031B1 (en) 2021-02-01 2022-03-15 Nucurrent, Inc. Automatic gain control for communications demodulation in wireless power transmitters
US11277034B1 (en) 2021-02-01 2022-03-15 Nucurrent, Inc. Systems and methods for receiver beaconing in wireless power systems
US11569694B2 (en) * 2021-02-01 2023-01-31 Nucurrent, Inc. Automatic gain control for communications demodulation in wireless power receivers
US11277035B1 (en) 2021-02-01 2022-03-15 Nucurrent, Inc. Automatic gain control for communications demodulation in wireless power transmitters
US11431205B2 (en) 2021-02-01 2022-08-30 Nucurrent, Inc. Systems and methods for receiver beaconing in wireless power systems
CN114675236B (zh) * 2022-05-25 2022-08-23 中达天昇(江苏)电子科技有限公司 一种任意频域形状实信号波形调制技术

Family Cites Families (16)

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Publication number Priority date Publication date Assignee Title
JPH0619376B2 (ja) * 1988-06-08 1994-03-16 横河電機株式会社 波形表示装置
EP0471119A1 (de) * 1990-08-14 1992-02-19 Hewlett-Packard Limited Wellenformmessung
JPH06242185A (ja) * 1993-02-15 1994-09-02 Fujitsu Ltd 信号波形測定装置及び信号波形測定方法
US20040183769A1 (en) * 2000-09-08 2004-09-23 Earl Schreyer Graphics digitizer
US6429799B1 (en) * 2001-07-14 2002-08-06 Agilent Technologies, Inc. Method and apparatus for analog to digital conversion using time-varying reference signal
WO2003073280A1 (en) * 2002-02-26 2003-09-04 Advantest Corporation Measuring apparatus and measuring method
US20040123018A1 (en) * 2002-09-30 2004-06-24 Martin Miller Method and apparatus for analyzing serial data streams
US6717540B1 (en) * 2002-10-10 2004-04-06 Agilent Technologies, Inc. Signal preconditioning for analog-to-digital conversion with timestamps
JP4429625B2 (ja) * 2003-04-25 2010-03-10 株式会社アドバンテスト 測定装置、及びプログラム
NO20054234L (no) * 2004-09-14 2006-03-15 Nippon Precision Circuits Frekvenssyntetisator, pulstoggenereringsapparat og pulstoggenereringsfremgangsmate
JP5270173B2 (ja) * 2006-02-01 2013-08-21 富士通株式会社 半導体装置及びノイズ計測方法
US7398169B2 (en) 2006-02-27 2008-07-08 Advantest Corporation Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device
US7681091B2 (en) * 2006-07-14 2010-03-16 Dft Microsystems, Inc. Signal integrity measurement systems and methods using a predominantly digital time-base generator
GB2444953B (en) * 2006-12-19 2009-07-22 Westerngeco Seismic Holdings Method for obtaining an image of a subsurface by regularizing irregularly sampled seismic data
US7756664B2 (en) * 2007-03-21 2010-07-13 Advantest Corporation Test apparatus and measurement circuit
DE112007003570T5 (de) * 2007-06-27 2010-08-26 Advantest Corp. Erfassungsgerät und Prüfgerät

Also Published As

Publication number Publication date
KR101334445B1 (ko) 2013-11-29
DE112010003393T5 (de) 2012-06-14
CN102483440A (zh) 2012-05-30
US20110054827A1 (en) 2011-03-03
WO2011024394A1 (ja) 2011-03-03
JPWO2011024394A1 (ja) 2013-01-24
KR20120070572A (ko) 2012-06-29

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Legal Events

Date Code Title Description
R163 Identified publications notified
R012 Request for examination validly filed
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee

Effective date: 20150303