DE10391780D2 - Röntgenstrahlquelle mit einer kleinen Brennfleckgrösse - Google Patents

Röntgenstrahlquelle mit einer kleinen Brennfleckgrösse

Info

Publication number
DE10391780D2
DE10391780D2 DE10391780T DE10391780T DE10391780D2 DE 10391780 D2 DE10391780 D2 DE 10391780D2 DE 10391780 T DE10391780 T DE 10391780T DE 10391780 T DE10391780 T DE 10391780T DE 10391780 D2 DE10391780 D2 DE 10391780D2
Authority
DE
Germany
Prior art keywords
ray source
spot size
focal spot
small focal
small
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn - After Issue
Application number
DE10391780T
Other languages
German (de)
English (en)
Inventor
Lothar Frey
Christoph Lehrer
Randolf Hanke
Peter Schmitt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Original Assignee
Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV filed Critical Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Priority to DE10391780T priority Critical patent/DE10391780D2/de
Application granted granted Critical
Publication of DE10391780D2 publication Critical patent/DE10391780D2/de
Anticipated expiration legal-status Critical
Withdrawn - After Issue legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/08—Targets (anodes) and X-ray converters
    • H01J2235/081—Target material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H01J35/116—Transmissive anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters
DE10391780T 2002-03-26 2003-03-26 Röntgenstrahlquelle mit einer kleinen Brennfleckgrösse Withdrawn - After Issue DE10391780D2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE10391780T DE10391780D2 (de) 2002-03-26 2003-03-26 Röntgenstrahlquelle mit einer kleinen Brennfleckgrösse

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10213496 2002-03-26
DE10391780T DE10391780D2 (de) 2002-03-26 2003-03-26 Röntgenstrahlquelle mit einer kleinen Brennfleckgrösse
PCT/DE2003/001004 WO2003081631A1 (fr) 2002-03-26 2003-03-26 Source de rayons x ayant un foyer de petite taille

Publications (1)

Publication Number Publication Date
DE10391780D2 true DE10391780D2 (de) 2005-02-17

Family

ID=28050861

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10391780T Withdrawn - After Issue DE10391780D2 (de) 2002-03-26 2003-03-26 Röntgenstrahlquelle mit einer kleinen Brennfleckgrösse

Country Status (2)

Country Link
DE (1) DE10391780D2 (fr)
WO (1) WO2003081631A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111902903A (zh) * 2018-01-26 2020-11-06 卡尔蔡司工业测量技术有限公司 用于辐射源的靶、用于生成侵入性电磁辐射的辐射源、辐射源的用途、以及产生用于辐射源的靶的方法

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DE102005053386A1 (de) * 2005-11-07 2007-05-16 Comet Gmbh Nanofocus-Röntgenröhre
DE102005053324B4 (de) * 2005-11-07 2012-08-02 Diamond Materials Gmbh Target für eine Mikrofocus- oder Nanofocus-Röntgenröhre
DE102010009276A1 (de) 2010-02-25 2011-08-25 Dürr Dental AG, 74321 Röntgenröhre sowie System zur Herstellung von Röntgenbildern für die zahnmedizinische oder kieferorthopädische Diagnostik
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
JP6253233B2 (ja) * 2013-01-18 2017-12-27 キヤノン株式会社 透過型ｘ線ターゲットおよび、該透過型ｘ線ターゲットを備えた放射線発生管、並びに、該放射線発生管を備えた放射線発生装置、並びに、該放射線発生装置を備えた放射線撮影装置
US20150092924A1 (en) * 2013-09-04 2015-04-02 Wenbing Yun Structured targets for x-ray generation
US9448190B2 (en) 2014-06-06 2016-09-20 Sigray, Inc. High brightness X-ray absorption spectroscopy system
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US9390881B2 (en) 2013-09-19 2016-07-12 Sigray, Inc. X-ray sources using linear accumulation
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US9449781B2 (en) 2013-12-05 2016-09-20 Sigray, Inc. X-ray illuminators with high flux and high flux density
US9570265B1 (en) 2013-12-05 2017-02-14 Sigray, Inc. X-ray fluorescence system with high flux and high flux density
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
US9823203B2 (en) 2014-02-28 2017-11-21 Sigray, Inc. X-ray surface analysis and measurement apparatus
US9594036B2 (en) 2014-02-28 2017-03-14 Sigray, Inc. X-ray surface analysis and measurement apparatus
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
WO2018175570A1 (fr) 2017-03-22 2018-09-27 Sigray, Inc. Procédé de réalisation d'une spectroscopie des rayons x et système de spectromètre d'absorption de rayons x
EP3399304A1 (fr) * 2017-05-02 2018-11-07 FEI Company Source de rayons x innovante destinée à être utilisée dans l'imagerie tomographique
US10520454B2 (en) 2017-05-02 2019-12-31 Fei Company Innovative X-ray source for use in tomographic imaging
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
WO2019236384A1 (fr) 2018-06-04 2019-12-12 Sigray, Inc. Spectromètre à rayons x à dispersion de longueur d'onde
US10658145B2 (en) 2018-07-26 2020-05-19 Sigray, Inc. High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
US10962491B2 (en) 2018-09-04 2021-03-30 Sigray, Inc. System and method for x-ray fluorescence with filtering
US11056308B2 (en) 2018-09-07 2021-07-06 Sigray, Inc. System and method for depth-selectable x-ray analysis
US11152183B2 (en) 2019-07-15 2021-10-19 Sigray, Inc. X-ray source with rotating anode at atmospheric pressure

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR984432A (fr) * 1943-09-23 1951-07-05 Tubix Sa Tube pour rayons x de grande longueur d'onde
GB1249341A (en) * 1968-10-08 1971-10-13 Rigaku Denki Company Ltd Improvements in or relating to x-ray tubes
US5148462A (en) * 1991-04-08 1992-09-15 Moltech Corporation High efficiency X-ray anode sources
DE19509516C1 (de) * 1995-03-20 1996-09-26 Medixtec Gmbh Medizinische Ger Mikrofokus-Röntgeneinrichtung
JP2001035428A (ja) * 1999-07-22 2001-02-09 Shimadzu Corp Ｘ線発生装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111902903A (zh) * 2018-01-26 2020-11-06 卡尔蔡司工业测量技术有限公司 用于辐射源的靶、用于生成侵入性电磁辐射的辐射源、辐射源的用途、以及产生用于辐射源的靶的方法
CN111902903B (zh) * 2018-01-26 2024-04-26 卡尔蔡司工业测量技术有限公司 用于辐射源的靶及其产生方法和辐射源及其用途

Also Published As

Publication number Publication date
WO2003081631A1 (fr) 2003-10-02

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