DE102020205516A1 - Dreidimensionale koordinatenmessvorrichtung - Google Patents
Dreidimensionale koordinatenmessvorrichtung Download PDFInfo
- Publication number
- DE102020205516A1 DE102020205516A1 DE102020205516.5A DE102020205516A DE102020205516A1 DE 102020205516 A1 DE102020205516 A1 DE 102020205516A1 DE 102020205516 A DE102020205516 A DE 102020205516A DE 102020205516 A1 DE102020205516 A1 DE 102020205516A1
- Authority
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- Germany
- Prior art keywords
- camera
- markers
- motorized
- probe
- calibration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
- G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
- G01B11/007—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
- G01C15/002—Active optical surveying means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019093824A JP7211891B2 (ja) | 2019-05-17 | 2019-05-17 | 三次元座標測定装置 |
| JP2019-093824 | 2019-05-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102020205516A1 true DE102020205516A1 (de) | 2020-11-19 |
Family
ID=73019312
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102020205516.5A Pending DE102020205516A1 (de) | 2019-05-17 | 2020-04-30 | Dreidimensionale koordinatenmessvorrichtung |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US10837757B1 (https=) |
| JP (1) | JP7211891B2 (https=) |
| DE (1) | DE102020205516A1 (https=) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11815454B2 (en) * | 2020-03-27 | 2023-11-14 | Samsung Electronics Co., Ltd. | Method and system for optimizing Monte Carlo simulations for diffuse reflectance spectroscopy |
| JP2022038669A (ja) * | 2020-08-27 | 2022-03-10 | オムロン株式会社 | 植物の寸法測定ツール及び、植物の寸法測定方法 |
| CN112577708B (zh) * | 2020-12-29 | 2023-03-21 | 中国航天空气动力技术研究院 | 一种基于背光成像的高焓激波风洞发动机推阻测量系统方法 |
| CN112923860B (zh) * | 2021-01-28 | 2022-04-08 | 北京科技大学 | 模拟高浓度尾砂料浆地表堆存行为的实验装置及方法 |
| CN112923853B (zh) * | 2021-01-29 | 2022-07-29 | 北京理工大学 | 齿轮回转轴线位姿及齿轮轴系装配误差测量的方法和系统 |
| US12061076B2 (en) | 2021-06-25 | 2024-08-13 | Keyence Corporation | Probe for three-dimensional coordinate measuring device, three-dimensional coordinate measuring device, three-dimensional coordinate measuring system, and three-dimensional coordinate measuring method |
| CN113409406A (zh) * | 2021-08-19 | 2021-09-17 | 武汉中观自动化科技有限公司 | 一种大范围单目跟踪扫描设备 |
| CN114494362B (zh) * | 2022-01-17 | 2024-11-22 | 武汉惟景三维科技有限公司 | 一种基于多相机融合的大范围三维跟踪方法 |
| CN115854866A (zh) * | 2022-11-25 | 2023-03-28 | 中国科学院深圳先进技术研究院 | 一种光学靶标三维测量系统、方法、电子设备及存储介质 |
| JP2024111981A (ja) * | 2023-02-07 | 2024-08-20 | 株式会社キーエンス | 三次元測定装置 |
| JP2024116738A (ja) * | 2023-02-16 | 2024-08-28 | 株式会社ミツトヨ | 三次元形状を測定する測定装置の校正方法、測定システム、及びプログラム |
| CN116182708A (zh) * | 2023-03-07 | 2023-05-30 | 深圳市德传技术有限公司 | 一种储罐三维信息重建与缺陷检测系统、方法及存储介质 |
| CN118189905B (zh) * | 2024-03-13 | 2024-11-15 | 广东精信工程造价咨询有限公司 | 一种基于视觉分析的工程监测系统 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3604944B2 (ja) | 1999-03-17 | 2004-12-22 | キヤノン株式会社 | ３次元形状測定機およびその測定方法 |
| US7423666B2 (en) * | 2001-05-25 | 2008-09-09 | Minolta Co., Ltd. | Image pickup system employing a three-dimensional reference object |
| JP4052382B2 (ja) * | 2002-11-13 | 2008-02-27 | 学校法人東京電機大学 | 非接触画像計測装置 |
| JP2004354256A (ja) * | 2003-05-29 | 2004-12-16 | Olympus Corp | キャリブレーションずれ検出装置及びこの装置を備えたステレオカメラ並びにステレオカメラシステム |
| JP4418841B2 (ja) * | 2008-01-24 | 2010-02-24 | キヤノン株式会社 | 作業装置及びその校正方法 |
| JP2010025759A (ja) * | 2008-07-18 | 2010-02-04 | Fuji Xerox Co Ltd | 位置計測システム |
| JP2010071677A (ja) * | 2008-09-16 | 2010-04-02 | Fuji Xerox Co Ltd | 位置計測システム |
| JP5299231B2 (ja) * | 2009-11-17 | 2013-09-25 | 富士通株式会社 | キャリブレーション装置 |
| ES2817800T3 (es) * | 2010-04-22 | 2021-04-08 | Metronor As | Sistema de medición óptica |
| JP6325871B2 (ja) * | 2014-03-28 | 2018-05-16 | 株式会社キーエンス | 光学式座標測定装置 |
| JP6325896B2 (ja) | 2014-03-28 | 2018-05-16 | 株式会社キーエンス | 光学式座標測定装置 |
| JP6325877B2 (ja) | 2014-04-18 | 2018-05-16 | 株式会社キーエンス | 光学式座標測定装置 |
| JP6316663B2 (ja) * | 2014-05-30 | 2018-04-25 | 株式会社キーエンス | 座標測定装置 |
| JP6722502B2 (ja) | 2016-04-27 | 2020-07-15 | 株式会社キーエンス | 三次元座標測定器 |
| JP6670161B2 (ja) | 2016-04-27 | 2020-03-18 | 株式会社キーエンス | 光学式三次元座標測定器及びその計測方法 |
| JP6209648B1 (ja) * | 2016-06-03 | 2017-10-04 | Ｋｙｂ株式会社 | ステレオカメラの設置パラメータ校正方法 |
| JP7306803B2 (ja) * | 2018-08-01 | 2023-07-11 | 株式会社キーエンス | 三次元座標測定装置 |
| JP7257113B2 (ja) * | 2018-08-01 | 2023-04-13 | 株式会社キーエンス | 三次元座標測定装置 |
-
2019
- 2019-05-17 JP JP2019093824A patent/JP7211891B2/ja active Active
-
2020
- 2020-02-20 US US16/795,613 patent/US10837757B1/en active Active
- 2020-04-30 DE DE102020205516.5A patent/DE102020205516A1/de active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JP7211891B2 (ja) | 2023-01-24 |
| US20200363188A1 (en) | 2020-11-19 |
| US10837757B1 (en) | 2020-11-17 |
| JP2020187097A (ja) | 2020-11-19 |
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