DE102013021482A1 - Verfahren zur Scanning-Mikroskopie und Scanning-Mikroskop - Google Patents

Verfahren zur Scanning-Mikroskopie und Scanning-Mikroskop Download PDF

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Publication number
DE102013021482A1
DE102013021482A1 DE102013021482.3A DE102013021482A DE102013021482A1 DE 102013021482 A1 DE102013021482 A1 DE 102013021482A1 DE 102013021482 A DE102013021482 A DE 102013021482A DE 102013021482 A1 DE102013021482 A1 DE 102013021482A1
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DE
Germany
Prior art keywords
sample
illumination
scanning
spots
spot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE102013021482.3A
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German (de)
English (en)
Inventor
Helge Eggert
Michael Hilbert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Microscopy GmbH
Original Assignee
Carl Zeiss Microscopy GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Microscopy GmbH filed Critical Carl Zeiss Microscopy GmbH
Priority to DE102013021482.3A priority Critical patent/DE102013021482A1/de
Priority to JP2016540646A priority patent/JP6556725B2/ja
Priority to EP14821590.8A priority patent/EP3084500B1/de
Priority to PCT/EP2014/078202 priority patent/WO2015091634A1/de
Publication of DE102013021482A1 publication Critical patent/DE102013021482A1/de
Priority to US15/186,236 priority patent/US10884226B2/en
Priority to US17/133,132 priority patent/US11487093B2/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036Scanning details, e.g. scanning stages
    • G02B21/004Scanning details, e.g. scanning stages fixed arrays, e.g. switchable aperture arrays
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0076Optical details of the image generation arrangements using fluorescence or luminescence
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008Details of detection or image processing, including general computer control
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • G02B21/367Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • General Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE102013021482.3A 2013-12-17 2013-12-17 Verfahren zur Scanning-Mikroskopie und Scanning-Mikroskop Pending DE102013021482A1 (de)

Priority Applications (6)

Application Number Priority Date Filing Date Title
DE102013021482.3A DE102013021482A1 (de) 2013-12-17 2013-12-17 Verfahren zur Scanning-Mikroskopie und Scanning-Mikroskop
JP2016540646A JP6556725B2 (ja) 2013-12-17 2014-12-17 走査型顕微鏡検査方法および走査型顕微鏡
EP14821590.8A EP3084500B1 (de) 2013-12-17 2014-12-17 Verfahren zur scanning-mikroskopie und scanning-mikroskop
PCT/EP2014/078202 WO2015091634A1 (de) 2013-12-17 2014-12-17 Verfahren zur scanning-mikroskopie und scanning-mikroskop
US15/186,236 US10884226B2 (en) 2013-12-17 2016-06-17 Method for scanning microscopy and scanning microscope
US17/133,132 US11487093B2 (en) 2013-12-17 2020-12-23 Method for scanning microscopy and scanning microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102013021482.3A DE102013021482A1 (de) 2013-12-17 2013-12-17 Verfahren zur Scanning-Mikroskopie und Scanning-Mikroskop

Publications (1)

Publication Number Publication Date
DE102013021482A1 true DE102013021482A1 (de) 2015-06-18

Family

ID=52278608

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102013021482.3A Pending DE102013021482A1 (de) 2013-12-17 2013-12-17 Verfahren zur Scanning-Mikroskopie und Scanning-Mikroskop

Country Status (5)

Country Link
US (2) US10884226B2 (https=)
EP (1) EP3084500B1 (https=)
JP (1) JP6556725B2 (https=)
DE (1) DE102013021482A1 (https=)
WO (1) WO2015091634A1 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102023101782B3 (de) 2023-01-25 2024-06-13 Leica Microsystems Cms Gmbh Vorrichtung und Verfahren zum Erzeugen eines zusammengesetzten Bildes einer Probe
DE102023210980A1 (de) * 2023-11-07 2025-05-08 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zur Korrektur von Bilddaten

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102016215177B4 (de) * 2016-08-15 2024-07-04 Carl Zeiss Microscopy Gmbh Verfahren und Anordnung zur Erfassung von Bilddaten
EP3538941B1 (en) 2016-11-10 2025-04-23 The Trustees of Columbia University in the City of New York Rapid high-resolution imaging methods for large samples
US10823952B2 (en) * 2017-06-22 2020-11-03 Huron Technologies International Inc. MSIA scanning instrument with increased dynamic range
CN108827920B (zh) * 2018-03-21 2022-05-27 苏州国科医工科技发展(集团)有限公司 一种低荧光漂白共聚焦成像方法及系统
DE102018123381A1 (de) 2018-09-24 2020-03-26 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zum Abrastern einer Probe
WO2020064290A1 (en) 2018-09-27 2020-04-02 Asml Netherlands B.V. Apparatus and method for measuring a position of a mark

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6028306A (en) 1997-05-14 2000-02-22 Olympus Optical Co., Ltd. Scanning microscope
WO2004102249A1 (en) 2003-05-16 2004-11-25 Universiteit Van Amsterdam Method and apparatus for shaping an image of an object
DE10344060A1 (de) * 2003-09-23 2005-05-04 Zeiss Carl Jena Gmbh Konfokales Laser-Scanning-Mikroskop
DE102008034137A1 (de) 2007-09-28 2009-04-02 Carl Zeiss Microlmaging Gmbh Mikroskop und Verfahren zum Betreiben eines Mikroskops
DE102012019121A1 (de) * 2011-09-29 2013-04-04 Carl Zeiss Microscopy Gmbh Verfahren zur Variation des Scanfeldes eines Laser-Scanning-Mikroskops

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7253950B2 (en) * 2003-07-17 2007-08-07 Olympus Corporation Scanning laser microscope
JP5259154B2 (ja) * 2007-10-24 2013-08-07 オリンパス株式会社 走査型レーザ顕微鏡
JP2010262104A (ja) * 2009-05-01 2010-11-18 Nikon Corp 走査型共焦点顕微鏡
DE102009043746A1 (de) * 2009-09-30 2011-03-31 Carl Zeiss Microimaging Gmbh Verfahren zum Erzeugen von Bildern mit erweitertem Dynamikumfang und optisches Gerät zur Durchführung eines solchen Verfahrens, insbesondere Laser-Scanning-Mikroskop
WO2011143507A2 (en) * 2010-05-12 2011-11-17 Li-Cor, Inc. High dynamic range scanning with reduced channel cross-talk
US9103721B2 (en) * 2011-04-07 2015-08-11 Uwm Research Foundation, Inc. High speed microscope with spectral resolution
CA2865922A1 (en) 2012-03-02 2013-09-06 Huron Technologies International Inc. Scanner with increased dynamic range

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6028306A (en) 1997-05-14 2000-02-22 Olympus Optical Co., Ltd. Scanning microscope
WO2004102249A1 (en) 2003-05-16 2004-11-25 Universiteit Van Amsterdam Method and apparatus for shaping an image of an object
DE10344060A1 (de) * 2003-09-23 2005-05-04 Zeiss Carl Jena Gmbh Konfokales Laser-Scanning-Mikroskop
DE102008034137A1 (de) 2007-09-28 2009-04-02 Carl Zeiss Microlmaging Gmbh Mikroskop und Verfahren zum Betreiben eines Mikroskops
DE102012019121A1 (de) * 2011-09-29 2013-04-04 Carl Zeiss Microscopy Gmbh Verfahren zur Variation des Scanfeldes eines Laser-Scanning-Mikroskops

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102023101782B3 (de) 2023-01-25 2024-06-13 Leica Microsystems Cms Gmbh Vorrichtung und Verfahren zum Erzeugen eines zusammengesetzten Bildes einer Probe
US12513386B2 (en) 2023-01-25 2025-12-30 Leica Microsystems Cms Gmbh Method and device for generating a composite image of a sample
DE102023210980A1 (de) * 2023-11-07 2025-05-08 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zur Korrektur von Bilddaten

Also Published As

Publication number Publication date
US20210116691A1 (en) 2021-04-22
US10884226B2 (en) 2021-01-05
WO2015091634A1 (de) 2015-06-25
US20160299326A1 (en) 2016-10-13
JP6556725B2 (ja) 2019-08-07
JP2017502341A (ja) 2017-01-19
EP3084500B1 (de) 2019-10-30
US11487093B2 (en) 2022-11-01
EP3084500A1 (de) 2016-10-26

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Representative=s name: SCHIFFER, AXEL, DIPL.-PHYS.UNIV. DR.RER.NAT., DE

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