DE102013021482A1 - Verfahren zur Scanning-Mikroskopie und Scanning-Mikroskop - Google Patents
Verfahren zur Scanning-Mikroskopie und Scanning-Mikroskop Download PDFInfo
- Publication number
- DE102013021482A1 DE102013021482A1 DE102013021482.3A DE102013021482A DE102013021482A1 DE 102013021482 A1 DE102013021482 A1 DE 102013021482A1 DE 102013021482 A DE102013021482 A DE 102013021482A DE 102013021482 A1 DE102013021482 A1 DE 102013021482A1
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- Germany
- Prior art keywords
- sample
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- scanning
- spots
- spot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 41
- 238000004621 scanning probe microscopy Methods 0.000 title claims abstract description 11
- 238000005286 illumination Methods 0.000 claims abstract description 104
- 230000005284 excitation Effects 0.000 claims abstract description 30
- 230000003287 optical effect Effects 0.000 claims description 11
- 238000000926 separation method Methods 0.000 claims description 4
- 239000000523 sample Substances 0.000 description 70
- 238000000386 microscopy Methods 0.000 description 21
- 238000011156 evaluation Methods 0.000 description 7
- 238000005259 measurement Methods 0.000 description 7
- 230000004044 response Effects 0.000 description 5
- 230000008901 benefit Effects 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 230000002123 temporal effect Effects 0.000 description 4
- 238000004061 bleaching Methods 0.000 description 3
- 238000000799 fluorescence microscopy Methods 0.000 description 3
- 239000012472 biological sample Substances 0.000 description 2
- 239000000975 dye Substances 0.000 description 2
- 230000005670 electromagnetic radiation Effects 0.000 description 2
- BUHVIAUBTBOHAG-FOYDDCNASA-N (2r,3r,4s,5r)-2-[6-[[2-(3,5-dimethoxyphenyl)-2-(2-methylphenyl)ethyl]amino]purin-9-yl]-5-(hydroxymethyl)oxolane-3,4-diol Chemical compound COC1=CC(OC)=CC(C(CNC=2C=3N=CN(C=3N=CN=2)[C@H]2[C@@H]([C@H](O)[C@@H](CO)O2)O)C=2C(=CC=CC=2)C)=C1 BUHVIAUBTBOHAG-FOYDDCNASA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000004624 confocal microscopy Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005562 fading Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 230000008832 photodamage Effects 0.000 description 1
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- 230000009467 reduction Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
- G02B21/004—Scanning details, e.g. scanning stages fixed arrays, e.g. switchable aperture arrays
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
- G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- General Engineering & Computer Science (AREA)
- Microscoopes, Condenser (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102013021482.3A DE102013021482A1 (de) | 2013-12-17 | 2013-12-17 | Verfahren zur Scanning-Mikroskopie und Scanning-Mikroskop |
| JP2016540646A JP6556725B2 (ja) | 2013-12-17 | 2014-12-17 | 走査型顕微鏡検査方法および走査型顕微鏡 |
| EP14821590.8A EP3084500B1 (de) | 2013-12-17 | 2014-12-17 | Verfahren zur scanning-mikroskopie und scanning-mikroskop |
| PCT/EP2014/078202 WO2015091634A1 (de) | 2013-12-17 | 2014-12-17 | Verfahren zur scanning-mikroskopie und scanning-mikroskop |
| US15/186,236 US10884226B2 (en) | 2013-12-17 | 2016-06-17 | Method for scanning microscopy and scanning microscope |
| US17/133,132 US11487093B2 (en) | 2013-12-17 | 2020-12-23 | Method for scanning microscopy and scanning microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102013021482.3A DE102013021482A1 (de) | 2013-12-17 | 2013-12-17 | Verfahren zur Scanning-Mikroskopie und Scanning-Mikroskop |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102013021482A1 true DE102013021482A1 (de) | 2015-06-18 |
Family
ID=52278608
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102013021482.3A Pending DE102013021482A1 (de) | 2013-12-17 | 2013-12-17 | Verfahren zur Scanning-Mikroskopie und Scanning-Mikroskop |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US10884226B2 (https=) |
| EP (1) | EP3084500B1 (https=) |
| JP (1) | JP6556725B2 (https=) |
| DE (1) | DE102013021482A1 (https=) |
| WO (1) | WO2015091634A1 (https=) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102023101782B3 (de) | 2023-01-25 | 2024-06-13 | Leica Microsystems Cms Gmbh | Vorrichtung und Verfahren zum Erzeugen eines zusammengesetzten Bildes einer Probe |
| DE102023210980A1 (de) * | 2023-11-07 | 2025-05-08 | Carl Zeiss Microscopy Gmbh | Verfahren und Vorrichtung zur Korrektur von Bilddaten |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102016215177B4 (de) * | 2016-08-15 | 2024-07-04 | Carl Zeiss Microscopy Gmbh | Verfahren und Anordnung zur Erfassung von Bilddaten |
| EP3538941B1 (en) | 2016-11-10 | 2025-04-23 | The Trustees of Columbia University in the City of New York | Rapid high-resolution imaging methods for large samples |
| US10823952B2 (en) * | 2017-06-22 | 2020-11-03 | Huron Technologies International Inc. | MSIA scanning instrument with increased dynamic range |
| CN108827920B (zh) * | 2018-03-21 | 2022-05-27 | 苏州国科医工科技发展(集团)有限公司 | 一种低荧光漂白共聚焦成像方法及系统 |
| DE102018123381A1 (de) | 2018-09-24 | 2020-03-26 | Leica Microsystems Cms Gmbh | Verfahren und Vorrichtung zum Abrastern einer Probe |
| WO2020064290A1 (en) | 2018-09-27 | 2020-04-02 | Asml Netherlands B.V. | Apparatus and method for measuring a position of a mark |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6028306A (en) | 1997-05-14 | 2000-02-22 | Olympus Optical Co., Ltd. | Scanning microscope |
| WO2004102249A1 (en) | 2003-05-16 | 2004-11-25 | Universiteit Van Amsterdam | Method and apparatus for shaping an image of an object |
| DE10344060A1 (de) * | 2003-09-23 | 2005-05-04 | Zeiss Carl Jena Gmbh | Konfokales Laser-Scanning-Mikroskop |
| DE102008034137A1 (de) | 2007-09-28 | 2009-04-02 | Carl Zeiss Microlmaging Gmbh | Mikroskop und Verfahren zum Betreiben eines Mikroskops |
| DE102012019121A1 (de) * | 2011-09-29 | 2013-04-04 | Carl Zeiss Microscopy Gmbh | Verfahren zur Variation des Scanfeldes eines Laser-Scanning-Mikroskops |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7253950B2 (en) * | 2003-07-17 | 2007-08-07 | Olympus Corporation | Scanning laser microscope |
| JP5259154B2 (ja) * | 2007-10-24 | 2013-08-07 | オリンパス株式会社 | 走査型レーザ顕微鏡 |
| JP2010262104A (ja) * | 2009-05-01 | 2010-11-18 | Nikon Corp | 走査型共焦点顕微鏡 |
| DE102009043746A1 (de) * | 2009-09-30 | 2011-03-31 | Carl Zeiss Microimaging Gmbh | Verfahren zum Erzeugen von Bildern mit erweitertem Dynamikumfang und optisches Gerät zur Durchführung eines solchen Verfahrens, insbesondere Laser-Scanning-Mikroskop |
| WO2011143507A2 (en) * | 2010-05-12 | 2011-11-17 | Li-Cor, Inc. | High dynamic range scanning with reduced channel cross-talk |
| US9103721B2 (en) * | 2011-04-07 | 2015-08-11 | Uwm Research Foundation, Inc. | High speed microscope with spectral resolution |
| CA2865922A1 (en) | 2012-03-02 | 2013-09-06 | Huron Technologies International Inc. | Scanner with increased dynamic range |
-
2013
- 2013-12-17 DE DE102013021482.3A patent/DE102013021482A1/de active Pending
-
2014
- 2014-12-17 WO PCT/EP2014/078202 patent/WO2015091634A1/de not_active Ceased
- 2014-12-17 JP JP2016540646A patent/JP6556725B2/ja active Active
- 2014-12-17 EP EP14821590.8A patent/EP3084500B1/de active Active
-
2016
- 2016-06-17 US US15/186,236 patent/US10884226B2/en active Active
-
2020
- 2020-12-23 US US17/133,132 patent/US11487093B2/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6028306A (en) | 1997-05-14 | 2000-02-22 | Olympus Optical Co., Ltd. | Scanning microscope |
| WO2004102249A1 (en) | 2003-05-16 | 2004-11-25 | Universiteit Van Amsterdam | Method and apparatus for shaping an image of an object |
| DE10344060A1 (de) * | 2003-09-23 | 2005-05-04 | Zeiss Carl Jena Gmbh | Konfokales Laser-Scanning-Mikroskop |
| DE102008034137A1 (de) | 2007-09-28 | 2009-04-02 | Carl Zeiss Microlmaging Gmbh | Mikroskop und Verfahren zum Betreiben eines Mikroskops |
| DE102012019121A1 (de) * | 2011-09-29 | 2013-04-04 | Carl Zeiss Microscopy Gmbh | Verfahren zur Variation des Scanfeldes eines Laser-Scanning-Mikroskops |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102023101782B3 (de) | 2023-01-25 | 2024-06-13 | Leica Microsystems Cms Gmbh | Vorrichtung und Verfahren zum Erzeugen eines zusammengesetzten Bildes einer Probe |
| US12513386B2 (en) | 2023-01-25 | 2025-12-30 | Leica Microsystems Cms Gmbh | Method and device for generating a composite image of a sample |
| DE102023210980A1 (de) * | 2023-11-07 | 2025-05-08 | Carl Zeiss Microscopy Gmbh | Verfahren und Vorrichtung zur Korrektur von Bilddaten |
Also Published As
| Publication number | Publication date |
|---|---|
| US20210116691A1 (en) | 2021-04-22 |
| US10884226B2 (en) | 2021-01-05 |
| WO2015091634A1 (de) | 2015-06-25 |
| US20160299326A1 (en) | 2016-10-13 |
| JP6556725B2 (ja) | 2019-08-07 |
| JP2017502341A (ja) | 2017-01-19 |
| EP3084500B1 (de) | 2019-10-30 |
| US11487093B2 (en) | 2022-11-01 |
| EP3084500A1 (de) | 2016-10-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R163 | Identified publications notified | ||
| R082 | Change of representative |
Representative=s name: SCHIFFER, AXEL, DIPL.-PHYS.UNIV. DR.RER.NAT., DE |
|
| R012 | Request for examination validly filed | ||
| R016 | Response to examination communication |