DE102010038133A1 - Elementezusammensetzungs-Detektionssystem und Verfahren - Google Patents
Elementezusammensetzungs-Detektionssystem und Verfahren Download PDFInfo
- Publication number
- DE102010038133A1 DE102010038133A1 DE102010038133A DE102010038133A DE102010038133A1 DE 102010038133 A1 DE102010038133 A1 DE 102010038133A1 DE 102010038133 A DE102010038133 A DE 102010038133A DE 102010038133 A DE102010038133 A DE 102010038133A DE 102010038133 A1 DE102010038133 A1 DE 102010038133A1
- Authority
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- Germany
- Prior art keywords
- fuel
- photon
- sample
- gas turbine
- detectors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000001514 detection method Methods 0.000 title claims description 30
- 238000000034 method Methods 0.000 title description 8
- 239000000203 mixture Substances 0.000 title description 6
- 239000013078 crystal Substances 0.000 claims abstract description 62
- 239000000446 fuel Substances 0.000 claims description 90
- 229910052720 vanadium Inorganic materials 0.000 claims description 14
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 claims description 14
- 238000005070 sampling Methods 0.000 claims description 13
- 238000012544 monitoring process Methods 0.000 claims description 12
- 230000007797 corrosion Effects 0.000 claims description 9
- 238000005260 corrosion Methods 0.000 claims description 9
- 239000003112 inhibitor Substances 0.000 claims description 6
- 230000003287 optical effect Effects 0.000 claims description 6
- 238000012423 maintenance Methods 0.000 claims description 5
- 238000010248 power generation Methods 0.000 claims description 4
- 238000003491 array Methods 0.000 claims description 2
- 230000002401 inhibitory effect Effects 0.000 claims 1
- 239000007789 gas Substances 0.000 description 40
- 239000000356 contaminant Substances 0.000 description 12
- 239000000470 constituent Substances 0.000 description 7
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 5
- 239000011734 sodium Substances 0.000 description 5
- 229910052708 sodium Inorganic materials 0.000 description 5
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 4
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 4
- 239000000956 alloy Substances 0.000 description 4
- 229910045601 alloy Inorganic materials 0.000 description 4
- 238000011088 calibration curve Methods 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- 239000011591 potassium Substances 0.000 description 4
- 229910052700 potassium Inorganic materials 0.000 description 4
- 229910052717 sulfur Inorganic materials 0.000 description 4
- 239000011593 sulfur Substances 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 238000011109 contamination Methods 0.000 description 3
- 238000012937 correction Methods 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- -1 but not limited to Substances 0.000 description 2
- 239000011575 calcium Substances 0.000 description 2
- 229910052791 calcium Inorganic materials 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000002485 combustion reaction Methods 0.000 description 2
- 239000010779 crude oil Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 229930195733 hydrocarbon Natural products 0.000 description 2
- 150000002430 hydrocarbons Chemical class 0.000 description 2
- 239000011133 lead Substances 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 150000003467 sulfuric acid derivatives Chemical class 0.000 description 2
- LSGOVYNHVSXFFJ-UHFFFAOYSA-N vanadate(3-) Chemical class [O-][V]([O-])([O-])=O LSGOVYNHVSXFFJ-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 101100518972 Caenorhabditis elegans pat-6 gene Proteins 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- 101001094044 Mus musculus Solute carrier family 26 member 6 Proteins 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000006184 cosolvent Substances 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 239000010763 heavy fuel oil Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 239000003350 kerosene Substances 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000003345 natural gas Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000003449 preventive effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000011833 salt mixture Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/22—Fuels; Explosives
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/637—Specific applications or type of materials liquid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/12—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon absorption of a fluid; of a solid body in dependence upon reaction with a fluid, for detecting components in the fluid
- G01N27/125—Composition of the body, e.g. the composition of its sensitive layer
- G01N27/127—Composition of the body, e.g. the composition of its sensitive layer comprising nanoparticles
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/605,391 US8058621B2 (en) | 2009-10-26 | 2009-10-26 | Elemental composition detection system and method |
| US12/605,391 | 2009-10-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102010038133A1 true DE102010038133A1 (de) | 2011-04-28 |
Family
ID=43796945
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102010038133A Withdrawn DE102010038133A1 (de) | 2009-10-26 | 2010-10-12 | Elementezusammensetzungs-Detektionssystem und Verfahren |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8058621B2 (https=) |
| JP (1) | JP2011089989A (https=) |
| CN (2) | CN102053095A (https=) |
| CH (1) | CH702055A2 (https=) |
| DE (1) | DE102010038133A1 (https=) |
Families Citing this family (52)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US8589087B2 (en) * | 2010-07-28 | 2013-11-19 | General Electric Company | Systems, methods, and apparatus for monitoring corrosion or corrosive contaminants associated with liquid fuel |
| WO2012177472A2 (en) * | 2011-06-20 | 2012-12-27 | X-Ray Optical Systems, Inc. | Online monitoring of contaminants in crude and heavy fuels, and refinery applications thereof |
| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| JP5990734B2 (ja) * | 2011-11-30 | 2016-09-14 | 株式会社リガク | 蛍光ｘ線分析装置 |
| US9897582B2 (en) | 2012-10-26 | 2018-02-20 | Pratt & Whitney Canada Corp. | Method and system for failure prediction using lubricating fluid analysis |
| US10297359B2 (en) * | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
| US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
| JP6069609B2 (ja) * | 2015-03-26 | 2017-02-01 | 株式会社リガク | 二重湾曲ｘ線集光素子およびその構成体、二重湾曲ｘ線分光素子およびその構成体の製造方法 |
| US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
| US10330664B2 (en) | 2015-06-18 | 2019-06-25 | Pratt & Whitney Canada Corp. | Evaluation of component condition through analysis of material interaction |
| US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
| US10519800B2 (en) | 2015-12-08 | 2019-12-31 | Pratt & Whitney Canada Corp. | Method and system for diagnosing a condition of an engine using lubricating fluid analysis |
| US10151739B2 (en) | 2016-04-25 | 2018-12-11 | Pratt & Whitney Canada Corp. | Method and system for evaluation of engine condition |
| US10677744B1 (en) * | 2016-06-03 | 2020-06-09 | U.S. Department Of Energy | Multi-cone x-ray imaging Bragg crystal spectrometer |
| US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
| WO2018175570A1 (en) | 2017-03-22 | 2018-09-27 | Sigray, Inc. | Method of performing x-ray spectroscopy and x-ray absorption spectrometer system |
| KR102026983B1 (ko) * | 2018-03-29 | 2019-09-30 | 두산중공업 주식회사 | 가스터빈 내 파이프를 통과하는 유체의 오염물을 모니터링 하는 시스템 및 그 방법 |
| US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
| EP4477315A3 (en) * | 2018-05-31 | 2025-03-05 | Donaldson Company, Inc. | Droplet sensors for fuel systems |
| JP2019211252A (ja) * | 2018-05-31 | 2019-12-12 | キヤノン株式会社 | 識別装置 |
| US10845491B2 (en) | 2018-06-04 | 2020-11-24 | Sigray, Inc. | Energy-resolving x-ray detection system |
| GB2591630B (en) | 2018-07-26 | 2023-05-24 | Sigray Inc | High brightness x-ray reflection source |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| US10962491B2 (en) | 2018-09-04 | 2021-03-30 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
| EP3847447A4 (en) * | 2018-09-07 | 2022-04-06 | Shenzhen Xpectvision Technology Co., Ltd. | PLATING CONTROL SYSTEMS AND METHODS |
| DE112019004478T5 (de) | 2018-09-07 | 2021-07-08 | Sigray, Inc. | System und verfahren zur röntgenanalyse mit wählbarer tiefe |
| US11143605B2 (en) | 2019-09-03 | 2021-10-12 | Sigray, Inc. | System and method for computed laminography x-ray fluorescence imaging |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| CN115667896B (zh) | 2020-05-18 | 2024-06-21 | 斯格瑞公司 | 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法 |
| CN111678600B (zh) * | 2020-08-10 | 2020-10-30 | 中国工程物理研究院激光聚变研究中心 | 一种平响应的霍尔晶体 |
| JP7640682B2 (ja) | 2020-09-17 | 2025-03-05 | シグレイ、インコーポレイテッド | Ｘ線を用いた深さ分解計測および分析のためのシステムおよび方法 |
| WO2022117112A1 (zh) * | 2020-12-04 | 2022-06-09 | 北京霍里思特科技有限公司 | 检测机构及带检测机构的矿产分选机 |
| KR102927910B1 (ko) | 2020-12-07 | 2026-02-19 | 시그레이, 아이엔씨. | 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템 |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| US11874239B2 (en) * | 2022-03-11 | 2024-01-16 | Uchicago Argonne, Llc | Advanced X-ray emission spectrometers |
| DE112023001408T5 (de) | 2022-03-15 | 2025-02-13 | Sigray, Inc. | System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung |
| DE112023002079T5 (de) | 2022-05-02 | 2025-02-27 | Sigray, Inc. | Sequenzielles wellenlängendispersives röntgenspektrometer |
| CN115326854B (zh) * | 2022-09-16 | 2024-12-17 | 中国科学院上海高等研究院 | 一种用于同步辐射光束线光子能量标定的系统及方法 |
| CN115825131B (zh) * | 2022-10-11 | 2025-05-16 | 中国核电工程有限公司 | 一种用于微量放射性元素同时测量的x射线荧光分析系统 |
| CN116106339A (zh) * | 2022-12-30 | 2023-05-12 | 安徽创谱仪器科技有限公司 | 一种x射线吸收谱仪 |
| WO2024173256A1 (en) | 2023-02-16 | 2024-08-22 | Sigray, Inc. | X-ray detector system with at least two stacked flat bragg diffractors |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| WO2025101530A1 (en) | 2023-11-07 | 2025-05-15 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| WO2025151383A1 (en) | 2024-01-08 | 2025-07-17 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
| WO2025155719A1 (en) | 2024-01-18 | 2025-07-24 | Sigray, Inc. | Sequential array of x-ray imaging detectors |
| CN118169158B (zh) * | 2024-02-07 | 2025-01-28 | 中国铁道科学研究院集团有限公司铁道建筑研究所 | 铁路路基填料含硫量检测装置及方法 |
| WO2025174966A1 (en) | 2024-02-15 | 2025-08-21 | Sigray, Inc. | System and method for generating a focused x‑ray beam |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2848751B2 (ja) * | 1992-12-04 | 1999-01-20 | 株式会社東芝 | 元素分析方法 |
| US5537336A (en) * | 1994-03-30 | 1996-07-16 | On-Site Analysis, Inc. | On-site oil analyzer |
| GB2297835A (en) * | 1995-02-08 | 1996-08-14 | Secr Defence | Three dimensional detection of contraband using x rays |
| JP3853522B2 (ja) * | 1998-08-07 | 2006-12-06 | 三菱原子燃料株式会社 | 蛍光ｘ線検査装置 |
| US6121628A (en) * | 1999-03-31 | 2000-09-19 | Siemens Westinghouse Power Corporation | Method, gas turbine, and combustor apparatus for sensing fuel quality |
| JP2003534528A (ja) * | 1999-11-19 | 2003-11-18 | バッテル・メモリアル・インスティチュート | 機械用流体分析装置 |
| CN2426981Y (zh) * | 2000-02-22 | 2001-04-18 | 中国科学院物理研究所 | 一种宽波段谱晶体谱仪 |
| US6463796B1 (en) * | 2000-10-12 | 2002-10-15 | The Lubrizol Corporation | Continuous on-board diagnostic lubricant monitoring system and method |
| RU2339974C2 (ru) * | 2001-06-19 | 2008-11-27 | Икс-Рэй Оптикал Системз, Инк. | Волновая дисперсивная рентгенофлуоресцентная система с использованием фокусирующей оптики для возбуждения и фокусирующий монохроматор для собирания |
| AU2003256831A1 (en) * | 2002-08-02 | 2004-02-23 | X-Ray Optical Systems, Inc. | An optical device for directing x-rays having a plurality of optical crystals |
| US7092843B2 (en) * | 2003-10-21 | 2006-08-15 | X-Ray Optical Systems, Inc. | Apparatus and method for suppressing insignificant variations in measured sample composition data, including data measured from dynamically changing samples using x-ray analysis techniques |
| EP1744049A3 (en) * | 2005-07-14 | 2012-08-15 | Korea Petroleum Quality Inspection Institute | Vehicle mounted type fuel testing apparatus |
| US7519153B1 (en) * | 2006-03-24 | 2009-04-14 | Kla-Tencor Technologies Corporation | X-ray metrology with diffractors |
| US20080075229A1 (en) * | 2006-09-27 | 2008-03-27 | Nanometrics Incorporated | Generation of Monochromatic and Collimated X-Ray Beams |
| US7440541B2 (en) * | 2006-12-27 | 2008-10-21 | Innov-X-Systems, Inc. | Dual source XRF system |
| EP1967568A1 (de) * | 2007-02-28 | 2008-09-10 | Basf Se | Polyisobutylbernsteinsäureanhydridderivate als Korrosionsinhibitoren in Kraftstoffen |
| DE102008021899A1 (de) * | 2007-09-19 | 2009-04-09 | Siemens Aktiengesellschaft | Kraftstoffsystem für eine schwimmende Einrichtung und Verfahren zu deren Betreiben |
| US7738630B2 (en) * | 2008-03-05 | 2010-06-15 | X-Ray Optical Systems, Inc. | Highly aligned x-ray optic and source assembly for precision x-ray analysis applications |
-
2009
- 2009-10-26 US US12/605,391 patent/US8058621B2/en not_active Expired - Fee Related
-
2010
- 2010-10-12 DE DE102010038133A patent/DE102010038133A1/de not_active Withdrawn
- 2010-10-21 JP JP2010236056A patent/JP2011089989A/ja not_active Withdrawn
- 2010-10-25 CH CH01761/10A patent/CH702055A2/de not_active Application Discontinuation
- 2010-10-26 CN CN2010105364307A patent/CN102053095A/zh active Pending
- 2010-10-26 CN CN201510597883.3A patent/CN105203573A/zh active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| CN105203573A (zh) | 2015-12-30 |
| JP2011089989A (ja) | 2011-05-06 |
| US8058621B2 (en) | 2011-11-15 |
| US20110095190A1 (en) | 2011-04-28 |
| CH702055A2 (de) | 2011-04-29 |
| CN102053095A (zh) | 2011-05-11 |
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