DE102007029230A1 - Prüfgerät für Leuchtmittel - Google Patents
Prüfgerät für Leuchtmittel Download PDFInfo
- Publication number
- DE102007029230A1 DE102007029230A1 DE102007029230A DE102007029230A DE102007029230A1 DE 102007029230 A1 DE102007029230 A1 DE 102007029230A1 DE 102007029230 A DE102007029230 A DE 102007029230A DE 102007029230 A DE102007029230 A DE 102007029230A DE 102007029230 A1 DE102007029230 A1 DE 102007029230A1
- Authority
- DE
- Germany
- Prior art keywords
- voltage
- tester
- test
- frequency
- test voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/44—Testing lamps
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B47/00—Circuit arrangements for operating light sources in general, i.e. where the type of light source is not relevant
- H05B47/20—Responsive to malfunctions or to light source life; for protection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/24—Testing of discharge tubes
- G01R31/245—Testing of gas discharge tubes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Circuit Arrangement For Electric Light Sources In General (AREA)
- Testing Relating To Insulation (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102007029230A DE102007029230A1 (de) | 2007-06-22 | 2007-06-22 | Prüfgerät für Leuchtmittel |
EP08010896A EP2006695A1 (de) | 2007-06-22 | 2008-06-16 | Prüfgerät für Leuchtmittel |
CN2008101756684A CN101470159B (zh) | 2007-06-22 | 2008-06-20 | 用于照明装置的检测设备 |
US12/213,535 US7859267B2 (en) | 2007-06-22 | 2008-06-20 | Testing device for lighting means |
AU2008202753A AU2008202753B2 (en) | 2007-06-22 | 2008-06-23 | A testing device for lighting means |
JP2008163597A JP2009008679A (ja) | 2007-06-22 | 2008-06-23 | 照明手段用試験器 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102007029230A DE102007029230A1 (de) | 2007-06-22 | 2007-06-22 | Prüfgerät für Leuchtmittel |
Publications (1)
Publication Number | Publication Date |
---|---|
DE102007029230A1 true DE102007029230A1 (de) | 2008-12-24 |
Family
ID=39768849
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102007029230A Withdrawn DE102007029230A1 (de) | 2007-06-22 | 2007-06-22 | Prüfgerät für Leuchtmittel |
Country Status (6)
Country | Link |
---|---|
US (1) | US7859267B2 (ja) |
EP (1) | EP2006695A1 (ja) |
JP (1) | JP2009008679A (ja) |
CN (1) | CN101470159B (ja) |
AU (1) | AU2008202753B2 (ja) |
DE (1) | DE102007029230A1 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102375109B (zh) * | 2010-07-09 | 2015-06-03 | 米沃奇电动工具公司 | 照明测试仪 |
EP2608713A4 (en) | 2010-08-27 | 2014-01-08 | Milwaukee Electric Tool Corp | THERMAL DETECTION SYSTEMS, METHODS AND DEVICES |
CN203705055U (zh) | 2011-03-15 | 2014-07-09 | 米沃奇电动工具公司 | 热像仪 |
US9176167B1 (en) * | 2011-08-21 | 2015-11-03 | Bruker Nano Inc. | Probe and method of manufacture for semiconductor wafer characterization |
US9442133B1 (en) * | 2011-08-21 | 2016-09-13 | Bruker Nano Inc. | Edge electrode for characterization of semiconductor wafers |
KR20130078181A (ko) * | 2011-12-30 | 2013-07-10 | 주식회사 실리콘웍스 | 직류-직류 변환기의 시험회로 |
US10794769B2 (en) | 2012-08-02 | 2020-10-06 | Milwaukee Electric Tool Corporation | Thermal detection systems, methods, and devices |
CN112345962B (zh) * | 2020-09-29 | 2024-06-14 | 漳州立达信灯具有限公司 | 多智能照明设备的组合测试系统 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3688185A (en) | 1970-10-22 | 1972-08-29 | Verdie A Masengil | Instrument for testing operability of fluorescent lamps |
US5047721A (en) | 1990-08-06 | 1991-09-10 | Farley Earl T | Faulty lamp tester |
US5323116A (en) * | 1992-01-24 | 1994-06-21 | Atria Joseph M | Test device for testing compact fluorescent lights and ballasts |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3967191A (en) * | 1975-02-28 | 1976-06-29 | Gte Sylvania Incorporated | Method and apparatus for non-destructively measuring internal film resistance in a fluorescent lamp |
JPH0766864B2 (ja) * | 1989-07-28 | 1995-07-19 | 東芝ライテック株式会社 | 放電灯点灯装置 |
DE3928645A1 (de) * | 1989-08-30 | 1991-03-07 | Hermann Assfalg | Einsteckgeraet fuer beleuchtung und funktionsfeststellung elektrischer anlagen |
DE20116815U1 (de) * | 2001-10-17 | 2002-04-11 | 7Ton Holding Ag Zug | Energiesparlampe |
US6940230B2 (en) * | 2002-05-30 | 2005-09-06 | Hubbell Incorporated | Modular lamp controller |
CN1985548A (zh) * | 2004-07-09 | 2007-06-20 | 皇家飞利浦电子股份有限公司 | 电子镇流器保护 |
-
2007
- 2007-06-22 DE DE102007029230A patent/DE102007029230A1/de not_active Withdrawn
-
2008
- 2008-06-16 EP EP08010896A patent/EP2006695A1/de not_active Withdrawn
- 2008-06-20 US US12/213,535 patent/US7859267B2/en not_active Expired - Fee Related
- 2008-06-20 CN CN2008101756684A patent/CN101470159B/zh not_active Expired - Fee Related
- 2008-06-23 JP JP2008163597A patent/JP2009008679A/ja active Pending
- 2008-06-23 AU AU2008202753A patent/AU2008202753B2/en not_active Ceased
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3688185A (en) | 1970-10-22 | 1972-08-29 | Verdie A Masengil | Instrument for testing operability of fluorescent lamps |
US5047721A (en) | 1990-08-06 | 1991-09-10 | Farley Earl T | Faulty lamp tester |
US5323116A (en) * | 1992-01-24 | 1994-06-21 | Atria Joseph M | Test device for testing compact fluorescent lights and ballasts |
Also Published As
Publication number | Publication date |
---|---|
AU2008202753A1 (en) | 2009-01-15 |
CN101470159A (zh) | 2009-07-01 |
JP2009008679A (ja) | 2009-01-15 |
EP2006695A1 (de) | 2008-12-24 |
CN101470159B (zh) | 2012-07-18 |
US20080315885A1 (en) | 2008-12-25 |
AU2008202753B2 (en) | 2011-06-23 |
US7859267B2 (en) | 2010-12-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
R120 | Application withdrawn or ip right abandoned |
Effective date: 20130417 |