DE102006011366B8 - Verfahren zum Zeit sparenden Testen von Bauteilpositionen auf einem Wafer, Tester und Prober - Google Patents
Verfahren zum Zeit sparenden Testen von Bauteilpositionen auf einem Wafer, Tester und Prober Download PDFInfo
- Publication number
- DE102006011366B8 DE102006011366B8 DE102006011366.7A DE102006011366A DE102006011366B8 DE 102006011366 B8 DE102006011366 B8 DE 102006011366B8 DE 102006011366 A DE102006011366 A DE 102006011366A DE 102006011366 B8 DE102006011366 B8 DE 102006011366B8
- Authority
- DE
- Germany
- Prior art keywords
- prober
- tester
- wafer
- time
- component positions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2894—Aspects of quality control [QC]
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102006011366.7A DE102006011366B8 (de) | 2006-03-09 | 2006-03-09 | Verfahren zum Zeit sparenden Testen von Bauteilpositionen auf einem Wafer, Tester und Prober |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102006011366.7A DE102006011366B8 (de) | 2006-03-09 | 2006-03-09 | Verfahren zum Zeit sparenden Testen von Bauteilpositionen auf einem Wafer, Tester und Prober |
Publications (3)
Publication Number | Publication Date |
---|---|
DE102006011366A1 DE102006011366A1 (de) | 2007-09-13 |
DE102006011366B4 DE102006011366B4 (de) | 2017-06-01 |
DE102006011366B8 true DE102006011366B8 (de) | 2017-09-14 |
Family
ID=38336095
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102006011366.7A Active DE102006011366B8 (de) | 2006-03-09 | 2006-03-09 | Verfahren zum Zeit sparenden Testen von Bauteilpositionen auf einem Wafer, Tester und Prober |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE102006011366B8 (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2018160557A1 (en) * | 2017-03-03 | 2018-09-07 | Aehr Test Systems | Electronics tester |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6505138B1 (en) * | 1999-10-28 | 2003-01-07 | Credence Systems Corporation | Function-based control interface for integrated circuit tester prober and handler devices |
US20040162682A1 (en) * | 2003-01-28 | 2004-08-19 | Texas Instruments Incorporated | Method and apparatus for performing multi-site integrated circuit device testing |
-
2006
- 2006-03-09 DE DE102006011366.7A patent/DE102006011366B8/de active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6505138B1 (en) * | 1999-10-28 | 2003-01-07 | Credence Systems Corporation | Function-based control interface for integrated circuit tester prober and handler devices |
US20040162682A1 (en) * | 2003-01-28 | 2004-08-19 | Texas Instruments Incorporated | Method and apparatus for performing multi-site integrated circuit device testing |
Also Published As
Publication number | Publication date |
---|---|
DE102006011366B4 (de) | 2017-06-01 |
DE102006011366A1 (de) | 2007-09-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
R082 | Change of representative |
Representative=s name: WESTPHAL, MUSSGNUG & PARTNER PATENTANWAELTE MI, DE |
|
R082 | Change of representative | ||
R016 | Response to examination communication | ||
R018 | Grant decision by examination section/examining division | ||
R082 | Change of representative |
Representative=s name: WESTPHAL, MUSSGNUG & PARTNER PATENTANWAELTE MI, DE |
|
R020 | Patent grant now final | ||
R082 | Change of representative |