DE10197038T1 - Berechnungsvorrichtung für die Größe des Zitterns und Prüfvorrichtung - Google Patents

Berechnungsvorrichtung für die Größe des Zitterns und Prüfvorrichtung

Info

Publication number
DE10197038T1
DE10197038T1 DE10197038T DE10197038T DE10197038T1 DE 10197038 T1 DE10197038 T1 DE 10197038T1 DE 10197038 T DE10197038 T DE 10197038T DE 10197038 T DE10197038 T DE 10197038T DE 10197038 T1 DE10197038 T1 DE 10197038T1
Authority
DE
Germany
Prior art keywords
trembling
tester
magnitude calculator
calculator
magnitude
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE10197038T
Other languages
English (en)
Other versions
DE10197038B4 (de
Inventor
Hirokatsu Niijima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE10197038T1 publication Critical patent/DE10197038T1/de
Application granted granted Critical
Publication of DE10197038B4 publication Critical patent/DE10197038B4/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Dc Digital Transmission (AREA)
  • Analogue/Digital Conversion (AREA)
DE10197038T 2000-12-11 2001-12-11 Berechnungsvorrichtung für die Größe des Zitterns und Prüfvorrichtung Expired - Fee Related DE10197038B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2000375874 2000-12-11
JP2000-375874 2000-12-11
PCT/JP2001/010803 WO2002050557A1 (fr) 2000-12-11 2001-12-11 Calculateur de duree de gigue et testeur

Publications (2)

Publication Number Publication Date
DE10197038T1 true DE10197038T1 (de) 2003-11-06
DE10197038B4 DE10197038B4 (de) 2008-01-31

Family

ID=18844814

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10197038T Expired - Fee Related DE10197038B4 (de) 2000-12-11 2001-12-11 Berechnungsvorrichtung für die Größe des Zitterns und Prüfvorrichtung

Country Status (4)

Country Link
US (1) US6768954B2 (de)
JP (1) JP4360802B2 (de)
DE (1) DE10197038B4 (de)
WO (1) WO2002050557A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003073280A1 (en) * 2002-02-26 2003-09-04 Advantest Corporation Measuring apparatus and measuring method
WO2005076021A1 (ja) * 2004-02-05 2005-08-18 Advantest Corporation 測定装置、測定方法、及び試験装置
US20060247906A1 (en) * 2005-04-27 2006-11-02 International Business Machines Corporation Method for estimating clock jitter for static timing measurements of modeled circuits
DE602005007500D1 (de) * 2005-10-28 2008-07-24 Agilent Technologies Inc Bestimmung einer Jittereigenschaft eines Signals
DE102007027070B4 (de) 2007-06-12 2009-10-15 Texas Instruments Deutschland Gmbh Elektronische Vorrichtung und Verfahren zur chipintegrierten Messung von Jitter
TWI346784B (en) * 2007-10-23 2011-08-11 Pegatron Corp Automiatic jitter measurement method

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5315175A (en) * 1976-07-27 1978-02-10 Nippon Telegr & Teleph Corp <Ntt> Jitter measuring instrument
JPS53102784A (en) * 1977-02-21 1978-09-07 Iwatsu Electric Co Ltd Distribution measuring instrument of sampling form
JPS5923504B2 (ja) * 1977-08-31 1984-06-02 富士通株式会社 高速ジツタ測定装置
US4876655A (en) * 1985-12-02 1989-10-24 Tektronix, Inc. Method and apparatus for evaluating jitter
US4777640A (en) * 1986-06-09 1988-10-11 Motorola, Inc. Frequency adaptive phase jitter canceler
US4855683A (en) * 1987-11-18 1989-08-08 Bell Communications Research, Inc. Digital phase locked loop with bounded jitter
US5515108A (en) * 1993-08-18 1996-05-07 Samsung Electronics Corporation Digital automatic frequency control method and circuit therefor
FR2716592B1 (fr) * 1994-02-21 1996-04-26 Audio Visuel Systemes Procédé et dispositif pour mesurer la gigue d'un signal numérique.
JP3351642B2 (ja) * 1994-12-20 2002-12-03 富士通株式会社 位相ジッタ抽出回路及び位相ジッタキャンセル回路
US5903605A (en) * 1995-03-30 1999-05-11 Intel Corporation Jitter detection method and apparatus
US6064706A (en) * 1996-05-01 2000-05-16 Alcatel Usa, Inc. Apparatus and method of desynchronizing synchronously mapped asynchronous data
US5982835A (en) * 1997-02-04 1999-11-09 Samsung Electronics Co., Ltd. Digital processing phase lock loop for synchronous digital micro-wave apparatus
JP2950370B2 (ja) * 1997-03-27 1999-09-20 日本電気株式会社 Ｐｌｌジッタ測定方法及び集積回路
JP3413342B2 (ja) * 1997-04-15 2003-06-03 株式会社アドバンテスト ジッタ測定方法及び半導体試験装置
JP2944607B2 (ja) * 1998-02-12 1999-09-06 日本電気アイシーマイコンシステム株式会社 ディジタルｐｌｌ回路とクロックの生成方法
US6661836B1 (en) * 1998-10-21 2003-12-09 Nptest, Llp Measuring jitter of high-speed data channels
JP2000314767A (ja) * 1999-04-30 2000-11-14 Asahi Kasei Microsystems Kk クロックジッタの測定方法

Also Published As

Publication number Publication date
US6768954B2 (en) 2004-07-27
WO2002050557A1 (fr) 2002-06-27
JPWO2002050557A1 (ja) 2004-04-22
DE10197038B4 (de) 2008-01-31
JP4360802B2 (ja) 2009-11-11
US20030210032A1 (en) 2003-11-13

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8364 No opposition during term of opposition
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee

Effective date: 20110701