DE10196856T1 - System zum Kommunizieren mit einer synchronen Vorrichtung - Google Patents
System zum Kommunizieren mit einer synchronen VorrichtungInfo
- Publication number
- DE10196856T1 DE10196856T1 DE10196856T DE10196856T DE10196856T1 DE 10196856 T1 DE10196856 T1 DE 10196856T1 DE 10196856 T DE10196856 T DE 10196856T DE 10196856 T DE10196856 T DE 10196856T DE 10196856 T1 DE10196856 T1 DE 10196856T1
- Authority
- DE
- Germany
- Prior art keywords
- communicating
- synchronous device
- synchronous
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB0026849.0A GB0026849D0 (en) | 2000-11-03 | 2000-11-03 | DDR SDRAM memory test system with fault strobe synchronization |
| PCT/RU2001/000486 WO2002039459A2 (en) | 2000-11-03 | 2001-11-05 | System for communicating with synchronous device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE10196856T1 true DE10196856T1 (de) | 2003-12-11 |
Family
ID=9902466
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE10196856T Withdrawn DE10196856T1 (de) | 2000-11-03 | 2001-11-05 | System zum Kommunizieren mit einer synchronen Vorrichtung |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20030191995A1 (de) |
| AU (1) | AU2002222834A1 (de) |
| DE (1) | DE10196856T1 (de) |
| GB (1) | GB0026849D0 (de) |
| WO (1) | WO2002039459A2 (de) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10034852A1 (de) * | 2000-07-18 | 2002-02-07 | Infineon Technologies Ag | Verfahren und Vorrichtung zum Einlesen und zur Überprüfung der zeitlichen Lage von aus einem zu testenden Speicherbaustein ausgelesenen Datenantwortsignalen |
| DE10140986A1 (de) | 2001-08-21 | 2003-03-20 | Infineon Technologies Ag | Verfahren und Vorrichtung zum Prüfen von Halbleiterspeichereinrichtungen |
| US8250295B2 (en) | 2004-01-05 | 2012-08-21 | Smart Modular Technologies, Inc. | Multi-rank memory module that emulates a memory module having a different number of ranks |
| US7286436B2 (en) * | 2004-03-05 | 2007-10-23 | Netlist, Inc. | High-density memory module utilizing low-density memory components |
| US7289386B2 (en) | 2004-03-05 | 2007-10-30 | Netlist, Inc. | Memory module decoder |
| US7916574B1 (en) | 2004-03-05 | 2011-03-29 | Netlist, Inc. | Circuit providing load isolation and memory domain translation for memory module |
| US7532537B2 (en) * | 2004-03-05 | 2009-05-12 | Netlist, Inc. | Memory module with a circuit providing load isolation and memory domain translation |
| US7509223B2 (en) * | 2006-04-21 | 2009-03-24 | Altera Corporation | Read-side calibration for data interface |
| JP4957092B2 (ja) * | 2006-06-26 | 2012-06-20 | 横河電機株式会社 | 半導体メモリテスタ |
| KR100736675B1 (ko) * | 2006-08-01 | 2007-07-06 | 주식회사 유니테스트 | 반도체 소자 테스트 장치 |
| KR100850204B1 (ko) * | 2006-11-04 | 2008-08-04 | 삼성전자주식회사 | 고속 반도체 메모리 장치를 테스트하기 위한 고주파 커맨드 신호 및 어드레스 신호 생성 방법 및 장치 |
| US8559571B2 (en) * | 2007-08-17 | 2013-10-15 | Ralink Technology Corporation | Method and apparatus for beamforming of multi-input-multi-output (MIMO) orthogonal frequency division multiplexing (OFDM) transceivers |
| US8516185B2 (en) | 2009-07-16 | 2013-08-20 | Netlist, Inc. | System and method utilizing distributed byte-wise buffers on a memory module |
| US8417870B2 (en) | 2009-07-16 | 2013-04-09 | Netlist, Inc. | System and method of increasing addressable memory space on a memory board |
| AR073129A1 (es) * | 2008-08-26 | 2010-10-13 | Spx Corp | Modulo de osciloscopio digital con deteccion de fallas en la recepcion de la senal. |
| AR073128A1 (es) * | 2008-08-26 | 2010-10-13 | Spx Corp | Modulo de osciloscopio digital |
| DE102009010886B4 (de) * | 2009-02-27 | 2013-06-20 | Advanced Micro Devices, Inc. | Erkennung der Verzögerungszeit in einem eingebauten Speicherselbsttest unter Anwendung eines Ping-Signals |
| US8310885B2 (en) * | 2010-04-28 | 2012-11-13 | International Business Machines Corporation | Measuring SDRAM control signal timing |
| KR101530587B1 (ko) * | 2013-07-31 | 2015-06-23 | 주식회사 유니테스트 | 고속 Ｆａｉｌ Ｍｅｍｏｒｙ 데이터 취득 장치 및 그 방법 |
| US20170125125A1 (en) * | 2015-10-30 | 2017-05-04 | Texas Instruments Incorporated | Area-efficient parallel test data path for embedded memories |
| CN108597556A (zh) * | 2018-04-20 | 2018-09-28 | 青岛海信电器股份有限公司 | 双倍速率同步动态随机存储器稳定性测试方法及系统 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3843893A (en) * | 1973-07-20 | 1974-10-22 | Hewlett Packard Co | Logical synchronization of test instruments |
| JP3636506B2 (ja) * | 1995-06-19 | 2005-04-06 | 株式会社アドバンテスト | 半導体試験装置 |
| US5794175A (en) * | 1997-09-09 | 1998-08-11 | Teradyne, Inc. | Low cost, highly parallel memory tester |
| US6137734A (en) * | 1999-03-30 | 2000-10-24 | Lsi Logic Corporation | Computer memory interface having a memory controller that automatically adjusts the timing of memory interface signals |
| US6789224B2 (en) * | 2000-01-18 | 2004-09-07 | Advantest Corporation | Method and apparatus for testing semiconductor devices |
| US6466007B1 (en) * | 2000-08-14 | 2002-10-15 | Teradyne, Inc. | Test system for smart card and indentification devices and the like |
-
2000
- 2000-11-03 GB GBGB0026849.0A patent/GB0026849D0/en not_active Ceased
-
2001
- 2001-11-05 DE DE10196856T patent/DE10196856T1/de not_active Withdrawn
- 2001-11-05 AU AU2002222834A patent/AU2002222834A1/en not_active Abandoned
- 2001-11-05 WO PCT/RU2001/000486 patent/WO2002039459A2/en not_active Application Discontinuation
-
2003
- 2003-04-30 US US10/425,629 patent/US20030191995A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| AU2002222834A1 (en) | 2002-05-21 |
| WO2002039459A3 (en) | 2003-03-13 |
| WO2002039459A2 (en) | 2002-05-16 |
| GB0026849D0 (en) | 2000-12-20 |
| US20030191995A1 (en) | 2003-10-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8181 | Inventor (new situation) |
Inventor name: DEAS, ALEXANDER ROGER, EDINGBURGH, GB Inventor name: ABROSIMOV, IGOR ANATOL EVIC, ST.PETERSBURG, RU |
|
| 8181 | Inventor (new situation) |
Inventor name: ABROSIMOV, IGOR ANATOLIEVIC, ST.PETERSBURG, RU Inventor name: DEAS, ALEXANDER ROGER, EDINGBURGH, GB |
|
| 8181 | Inventor (new situation) |
Inventor name: ABROSIMOV, IGOR ANATOLIEVICH, ST.PETERSBURG, RU Inventor name: DEAS, ALEXANDER ROGER, EDINGBURGH, GB |
|
| 8139 | Disposal/non-payment of the annual fee |