DE10194690T1 - Jitter-Meßvorrichtung, Jitter-Meßverfahren und Testvorrichtung - Google Patents

Jitter-Meßvorrichtung, Jitter-Meßverfahren und Testvorrichtung

Info

Publication number
DE10194690T1
DE10194690T1 DE10194690T DE10194690T DE10194690T1 DE 10194690 T1 DE10194690 T1 DE 10194690T1 DE 10194690 T DE10194690 T DE 10194690T DE 10194690 T DE10194690 T DE 10194690T DE 10194690 T1 DE10194690 T1 DE 10194690T1
Authority
DE
Germany
Prior art keywords
jitter measuring
test device
measuring method
jitter
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE10194690T
Other languages
English (en)
Other versions
DE10194690B4 (de
Inventor
Masahiro Ishida
Mani Soma
Takahiro Yamaguchi
Toshifumi Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/703,469 external-priority patent/US6775321B1/en
Priority claimed from US09/722,167 external-priority patent/US6525523B1/en
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE10194690T1 publication Critical patent/DE10194690T1/de
Application granted granted Critical
Publication of DE10194690B4 publication Critical patent/DE10194690B4/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Dc Digital Transmission (AREA)
DE10194690T 2000-10-31 2001-10-31 Jitter-Messvorrichtung und Jitter-Messverfahren Expired - Fee Related DE10194690B4 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US09/703,469 US6775321B1 (en) 2000-10-31 2000-10-31 Apparatus for and method of measuring a jitter
US09/703,469 2000-10-31
US09/722,167 US6525523B1 (en) 2000-11-24 2000-11-24 Jitter measurement apparatus and its method
US09/722,167 2000-11-24
PCT/JP2001/009553 WO2002037127A1 (fr) 2000-10-31 2001-10-31 Appareil de mesure de gigue, procede de mesure de gigue et dispositif de test

Publications (2)

Publication Number Publication Date
DE10194690T1 true DE10194690T1 (de) 2003-11-20
DE10194690B4 DE10194690B4 (de) 2007-06-21

Family

ID=27107145

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10194690T Expired - Fee Related DE10194690B4 (de) 2000-10-31 2001-10-31 Jitter-Messvorrichtung und Jitter-Messverfahren

Country Status (3)

Country Link
JP (1) JP3650767B2 (de)
DE (1) DE10194690B4 (de)
WO (1) WO2002037127A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5143341B2 (ja) * 2004-02-18 2013-02-13 株式会社アドバンテスト ジッタ測定装置、ジッタ測定方法およびプログラム
US7317309B2 (en) * 2004-06-07 2008-01-08 Advantest Corporation Wideband signal analyzing apparatus, wideband period jitter analyzing apparatus, and wideband skew analyzing apparatus
US7778785B2 (en) * 2008-02-14 2010-08-17 Advantest Corporation Signal-to-noise ratio measurement for discrete waveform

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW559668B (en) * 1999-02-08 2003-11-01 Advantest Corp Apparatus for and method of measuring a jitter

Also Published As

Publication number Publication date
DE10194690B4 (de) 2007-06-21
JPWO2002037127A1 (ja) 2004-03-11
WO2002037127A1 (fr) 2002-05-10
JP3650767B2 (ja) 2005-05-25

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