CN87107898A - 缩减光检波器的存储效应的装置和方法 - Google Patents
缩减光检波器的存储效应的装置和方法 Download PDFInfo
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- CN87107898A CN87107898A CN87107898.8A CN87107898A CN87107898A CN 87107898 A CN87107898 A CN 87107898A CN 87107898 A CN87107898 A CN 87107898A CN 87107898 A CN87107898 A CN 87107898A
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- 230000000694 effects Effects 0.000 title claims abstract description 12
- 238000000034 method Methods 0.000 title description 5
- 238000005070 sampling Methods 0.000 claims abstract description 37
- 238000005259 measurement Methods 0.000 claims 4
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
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Abstract
光检波器的存储效应的缩减作用是通过将一光调制器插入于待测光信号和光检波器之间而获得的。通常,该调制器是断开的,而仅仅当采样系统对所述光检波器输出进行采样期间才是导通的。
Description
本发明涉及光检波器,并更具体地涉及缩减高速光学测量系统中的光检波器的存储效应的方法。
各种高速光信号通常是采用将所述光信号连续地加到一光检波器并用一电子采样系统对该检波器的输出信号进行采样的方法来测量的。这样一种电子采样系统被用于特克特朗尼克(Tektronix)公司(在美国俄勒冈州、比弗顿-Beaverton,Oregon)制造的纤维光学时畴反射计系列的OF/50型中。由于采用脉冲输入,所以检波器的输出信号在输入脉冲的后沿处因检波器的存储时间作用而使其呈指数衰减状。从检波器输出信号的(后沿部)衰减期间内的某一定时控制起,被加到该采样系统的一个采样选通脉冲将导致一个与输入脉冲的实际值有显著误差的采样输出信号。为了在输出端产生一更加准确的信号值,我们想望一种用于缩减此种检波器的存储时间效应的方法。
因此,本发明通过使用一个光调制器装置为精选和改进光检波器的性能而提供一种缩减光检波器的存储效应的方法。将光信号输入到在采样时间之前是断开的所述光调制器,以防止光线传到光检波器。然后,刚好在采样选通脉冲开始之前或正好与采样选通脉冲开始的同时使该光调制器导通。因此光信号被阻止传到检波器以免产生存储效应而在采样期间使输出的电信号失真。
只要结合所附权利要求书及附图阅读下文的详细说明就可明瞭本发明的各种目的、优点和其它新颖特性了。
图1A是先有技术的光学测量系统的方框图。
图1B是图1A的先有技术的光学测量系统的定时图。
图2A是按照本发明的高速光学测量系统的方框图。
图2B是图2A的光学测量系统的定时图。
现参考图1A和1B,先有技术的光学测量系统具有一由(A)所示输入光信号的光检波器10。由(B)所示的该光检波器的输出信号输入到采样系统12。该采样系统12被来自定时控制电路14,由(c)表示的采样选通脉冲触发而即刻对光检波器的输出信号进行采样。从取样系统12产生的由(D)所表示的输出信号,表明:与在采样时的光信号实际值相比,该测量值存在着误差。
图2A和2B示出具有一个在光检波器10之前插入的光调制器16的光学测量系统。在此情况下所述光调制器16、由(F)所示的输出信号输入到光检波器10,再由如先有技术中的采样系统14对光检波器10的输出信号进行采样。在从定时控制电路14的采样选通脉冲到来之前,所述光调制器16是断开的。刚好在定时控制电路14产生采样选通脉冲之前或同时,该定时控制电路14就将如由(E)所示的调制器选通脉冲加到光调制器16,以使所述光调制器导通而使光信号(A)的一部分(F)传送到光检波器10上。采样选通脉冲(c)对光检波器的输出信号(B)进行采样,以产生采样输出信号(D),于是采样输出信号(D)即相当于采样时的输入光信号(A)的实际值。
对于许多采样来说,各采样之间的时间间隔,亦即光调制器的各次导通之间的时间间隔,是由使光检波器10的存储效应能衰减所需的时间而确定的。并且使光调制器的导通时间持续得越短越好,亦即使该导通时间只是采样系统12为获得该采样而需要的时间。因此,如果对所述光输入信号的最大值来说存储效应衰减时间是100毫微秒,那么,该光信号的采样速率可为10兆赫。
因此,本发明通过在光检波器的输入端使用一个光调制器来缩减光检波器的存储时间效应,为改进高速光测量系统的性能提供了一种手段,该光调制器仅在采样期间是导通的。
Claims (4)
1、一种具有待测光信号作为输入,而其输出被一采样系统所采样的光检波器的改进型光测量系统,其特征在于:其中,包括用于除了由采样系统对光检波器的输出进行采样期间之外,阻止光信号输入到光检波器的装置。
2、如权利要求1所述的一种改进型光测量系统,特征在于;其中所述阻止信号的装置包括:
-一光调制器,它具有作为输入的光信号,并输出一种调制过的光信号以便输入到光检波器;以及
-用于仅当采样系统对光检波器的输出信号进行采样期间导通所述光调制器的装置。
3、如权利要求2所述的改进型光测量系统,特征在于:其中所述导通装置包含一个定时控制电路,该电路为采样系统产生一种采样选通脉冲以对光检波器的输出信号进行采样;并为使光调制器导通而产生一种调制器选通脉冲;所述调制器选通脉冲大致与采样选通脉冲同时产生,并具有大于或等于采样选通脉冲宽度的脉宽。
4、如权利要求3所述的一种改进型光测量系统,特征在于:其中所述定时控制电路可输出许多采样选通脉冲和调制器选通脉冲,所述脉冲速率取决于为获得不存在存储效应的采样时光检波器的存储效应衰减时间。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US931,491 | 1986-11-17 | ||
US06/931,491 US4769534A (en) | 1986-11-17 | 1986-11-17 | Optical detector with storage effects reduction |
Publications (2)
Publication Number | Publication Date |
---|---|
CN87107898A true CN87107898A (zh) | 1988-07-06 |
CN1008400B CN1008400B (zh) | 1990-06-13 |
Family
ID=25460864
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN87107898A Expired CN1008400B (zh) | 1986-11-17 | 1987-11-16 | 缩减光检测器的存储效应的装置和方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US4769534A (zh) |
EP (1) | EP0268455B1 (zh) |
JP (1) | JPS63138218A (zh) |
CN (1) | CN1008400B (zh) |
AU (1) | AU593407B2 (zh) |
CA (1) | CA1303382C (zh) |
DE (1) | DE3767134D1 (zh) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0770745B2 (ja) * | 1987-10-28 | 1995-07-31 | 株式会社半導体エネルギー研究所 | 光電変換半導体装置駆動方法 |
US4989971A (en) * | 1989-07-14 | 1991-02-05 | Tektronix, Inc. | Automatic mask trigger for an optical time domain reflectometer |
US5043608A (en) * | 1989-08-24 | 1991-08-27 | Tektronix, Inc. | Avalanche photodiode non-linearity cancellation |
US5023445A (en) * | 1990-04-27 | 1991-06-11 | Tektronix, Inc. | Signal acquisition method and automatic masking system for an OTDR |
JPH07113723A (ja) * | 1993-10-13 | 1995-05-02 | Ando Electric Co Ltd | Otdrの光マスキング装置 |
US5566263A (en) * | 1995-03-22 | 1996-10-15 | Minnesota Mining And Manufacturing Company | System for tuning an integrated optical switch element |
WO2013155235A1 (en) * | 2012-04-11 | 2013-10-17 | Ultra Communications, Inc. | Optical time domain reflectometer with high resolution and high sensitivity |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3980880A (en) * | 1974-04-04 | 1976-09-14 | The United States Of America As Represented By The Secretary Of The Army | Automatic exposure control circuit for an image intensifier camera |
JPS5234509A (en) * | 1975-09-11 | 1977-03-16 | Takenaka Komuten Co | Subsoil improving method |
GB1555102A (en) * | 1976-04-21 | 1979-11-07 | Secr Defence Brit | Viewing systems |
DD130959A1 (de) * | 1977-05-05 | 1978-05-17 | Woschni Hans Guenter | Einrichtung zur driftkorrektur bei fotoelektrischen mikroskopen |
EP0004729B1 (en) * | 1978-03-23 | 1983-02-23 | Daniel Joseph Bradley | Apparatus and method for recording high-speed repetitive optical phenomena |
US4504921A (en) * | 1981-06-24 | 1985-03-12 | Westinghouse Electric Corp. | Multi-channel test system using optical waveguide modulators |
JPS5841337A (ja) * | 1981-09-04 | 1983-03-10 | Hamamatsu Tv Kk | 発光現象の測定装置 |
JPS6018926A (ja) * | 1983-07-13 | 1985-01-31 | Hitachi Ltd | ペレツトボンデイング装置 |
US4591253A (en) * | 1983-10-06 | 1986-05-27 | Robotic Vision Systems, Inc. | Adaptive vision system |
JPH067043B2 (ja) * | 1983-12-19 | 1994-01-26 | 株式会社東芝 | 位置検出方法 |
-
1986
- 1986-11-17 US US06/931,491 patent/US4769534A/en not_active Expired - Lifetime
-
1987
- 1987-10-27 CA CA000550366A patent/CA1303382C/en not_active Expired - Fee Related
- 1987-11-16 JP JP62289251A patent/JPS63138218A/ja active Granted
- 1987-11-16 CN CN87107898A patent/CN1008400B/zh not_active Expired
- 1987-11-17 EP EP87310129A patent/EP0268455B1/en not_active Expired - Lifetime
- 1987-11-17 AU AU81284/87A patent/AU593407B2/en not_active Ceased
- 1987-11-17 DE DE8787310129T patent/DE3767134D1/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1008400B (zh) | 1990-06-13 |
AU593407B2 (en) | 1990-02-08 |
JPH0512657B2 (zh) | 1993-02-18 |
EP0268455B1 (en) | 1990-12-27 |
JPS63138218A (ja) | 1988-06-10 |
US4769534A (en) | 1988-09-06 |
EP0268455A1 (en) | 1988-05-25 |
AU8128487A (en) | 1988-05-19 |
CA1303382C (en) | 1992-06-16 |
DE3767134D1 (de) | 1991-02-07 |
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