CN2706771Y - Automatic tester for circuitboard - Google Patents
Automatic tester for circuitboard Download PDFInfo
- Publication number
- CN2706771Y CN2706771Y CN 200320132089 CN200320132089U CN2706771Y CN 2706771 Y CN2706771 Y CN 2706771Y CN 200320132089 CN200320132089 CN 200320132089 CN 200320132089 U CN200320132089 U CN 200320132089U CN 2706771 Y CN2706771 Y CN 2706771Y
- Authority
- CN
- China
- Prior art keywords
- circuit board
- board
- channel
- test
- card
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004891 communication Methods 0.000 claims abstract description 18
- 238000004458 analytical method Methods 0.000 claims abstract description 10
- 238000012360 testing method Methods 0.000 claims description 102
- 230000006870 function Effects 0.000 claims description 19
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 230000003467 diminishing effect Effects 0.000 abstract 1
- 230000002349 favourable effect Effects 0.000 abstract 1
- 238000005259 measurement Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 4
- 230000006698 induction Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 230000036962 time dependent Effects 0.000 description 2
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000013101 initial test Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000012956 testing procedure Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
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- Tests Of Electronic Circuits (AREA)
Abstract
Description
Step | The T component type | The Device component Name | The Ideal ideal value | The CH+ noble potential | The CH-electronegative potential | G1 isolating points 1 | G2 isolating points 2 | The Gon isolation | The LC orientation | The STD standard value | The T+ positive error | The T_ negative error | Measured value | % |
1 | R | R1 | 1K | 1 | 2 | 19 | Y (being) | A1 | 1.02 | 10 | 10 |
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 200320132089 CN2706771Y (en) | 2003-12-31 | 2003-12-31 | Automatic tester for circuitboard |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 200320132089 CN2706771Y (en) | 2003-12-31 | 2003-12-31 | Automatic tester for circuitboard |
Publications (1)
Publication Number | Publication Date |
---|---|
CN2706771Y true CN2706771Y (en) | 2005-06-29 |
Family
ID=34845491
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN 200320132089 Expired - Fee Related CN2706771Y (en) | 2003-12-31 | 2003-12-31 | Automatic tester for circuitboard |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN2706771Y (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101221210B (en) * | 2007-11-30 | 2010-05-19 | 华南理工大学 | Automatic testing and emendation system and method for finished circuit board |
CN101561471B (en) * | 2009-05-27 | 2011-02-16 | 陈建海 | Vehicle instrument circuit board combined detection table and detection method thereof |
CN101226222B (en) * | 2008-02-02 | 2013-03-20 | 上海盈龙电子科技有限公司 | PCB multifunctional test system and implementing method |
CN104698359A (en) * | 2013-12-10 | 2015-06-10 | 全智科技股份有限公司 | High-performance test platform equipment |
CN105445652A (en) * | 2015-12-24 | 2016-03-30 | 北京航天测控技术有限公司 | Lissajous figure-based circuit board off-line comparison test device and method |
CN110687436A (en) * | 2019-11-08 | 2020-01-14 | 深圳市诺威达电汽有限公司 | Automatic circuit board function testing device and method |
-
2003
- 2003-12-31 CN CN 200320132089 patent/CN2706771Y/en not_active Expired - Fee Related
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101221210B (en) * | 2007-11-30 | 2010-05-19 | 华南理工大学 | Automatic testing and emendation system and method for finished circuit board |
CN101226222B (en) * | 2008-02-02 | 2013-03-20 | 上海盈龙电子科技有限公司 | PCB multifunctional test system and implementing method |
CN101561471B (en) * | 2009-05-27 | 2011-02-16 | 陈建海 | Vehicle instrument circuit board combined detection table and detection method thereof |
CN104698359A (en) * | 2013-12-10 | 2015-06-10 | 全智科技股份有限公司 | High-performance test platform equipment |
CN105445652A (en) * | 2015-12-24 | 2016-03-30 | 北京航天测控技术有限公司 | Lissajous figure-based circuit board off-line comparison test device and method |
CN105445652B (en) * | 2015-12-24 | 2018-05-04 | 北京航天测控技术有限公司 | A kind of offline contrast test device and method of circuit board based on lissajouf figure |
CN110687436A (en) * | 2019-11-08 | 2020-01-14 | 深圳市诺威达电汽有限公司 | Automatic circuit board function testing device and method |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SHENZHEN ZHENHUA TEST EQUIPMENT CO., LTD. Free format text: FORMER OWNER: LI RISHENG Effective date: 20081121 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20081121 Address after: Shenzhen, Guangdong Province, Baoan District, Shenzhen road, fly wing, building on the west side of the 3 floor, zip code: 518000 Patentee after: SHENZHEN CITY ZHENHUA TEST EQUIPMENT CO., LTD. Address before: Room 1110, Wantong building, Sungang East Road, Luohu District, Guangdong, Shenzhen province 518023 Patentee before: Li Risheng |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20050629 Termination date: 20121231 |