CN1556416A - Circuit automatic testing device possessing appliance capable of displaying appropriate time aelay and its method - Google Patents
Circuit automatic testing device possessing appliance capable of displaying appropriate time aelay and its method Download PDFInfo
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- CN1556416A CN1556416A CNA2003101097665A CN200310109766A CN1556416A CN 1556416 A CN1556416 A CN 1556416A CN A2003101097665 A CNA2003101097665 A CN A2003101097665A CN 200310109766 A CN200310109766 A CN 200310109766A CN 1556416 A CN1556416 A CN 1556416A
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Abstract
The system includes automatic test equipment for circuit board, external device of automatic test instrument for circuit board and computer. The automatic test equipment for circuit board includes main control board, channel board and function generator board as well as wave analysis set. Based on tested value, the wave analysis set displays curve between changed value and time. In the invention, automatic test equipment measures electric part in circuit board quickly and accurately, and the wave analysis set displays the said curve visually. Thus, time delay suitable to the measured part can be found out from the said curve so as to take advantages to measure instable part, reduce error judgment and raise production efficiency.
Description
Technical field
The present invention relates to a kind of circuit board automatic testing equipment and method thereof, relate in particular to a kind of Waveform display apparatus that has, thereby can show the circuit board automatic testing equipment and the method thereof of suitable time-delay.
Background technology
Circuit board is finished after the welding at the assembling electronic component, must test it.To the test mode of circuit board, be use device or signal generator in the prior art, export the test point of predefined signal source, test again and again by the site operation personnel to circuit board, and the different test point of conversion successively.Carry out every test job so again and again, not only need to expend great amount of manpower and test duration, simultaneously numerous and diverse content measurement, operation by personnel is easy to occur various operational mistakes, not only be difficult to reach the requirement of test job, but also can cause the delay of test job inevitably.
In addition, this must have the measured value of enough time-delay assemblies to stablize in some assembly itself or unstable because of the influence that is subjected to circuit.Its required time-delay is attached thereto the capacitance and the induction coefficient that connect by survey assembly or other and decides.In the test process of automatic testing equipment, test the assembly one by one in the circuit board, the time, The faster the better, and therefore, time-delay is corresponding for the test duration of entire circuit plate.Then can cause the production time to prolong if exceed Time delay measurement, reduce production efficiency, if delay time is not enough, measured value instability then.In order to find suitable time-delay, test repeatedly with different time-delays with regard to needing operating personnel, till finding stable reading, but this method also can increase the test duration, and increases the weight of operating personnel's work load.
Summary of the invention
One of them purpose of the present invention just provides a kind of circuit board Auto-Test System; this Auto-Test System is used for the components values of metering circuit plate; the test operation personnel the test before according to the MUT module under test setup parameter; and utilize preset program to test; such as the assembly resistance in the circuit board of reading the wiring board that assembles; capacitance; inductance; and transistor; diode; Zener diode; FET; induction tube is imitated in the field; the value of the protection diode of photocoupler and IC; so that compare with the ideal value of the assembly that configures, determine its whether within range of allowable error to determine the quality of MUT module under test.
Further aim of the present invention provides a kind of circuit board automatic testing equipment with wave form analysis device, so that allow the operating personnel be corresponding appropriate time-delay with it that specific components finds.Utilize this waveform testing device that unsettled assembly is further detected, so that find exactly and the corresponding only time-delay of described survey assembly.
Purpose of the present invention is realized by following technical scheme:
The invention provides a kind of circuit board Auto-Test System, this system comprises circuit board automatic testing equipment, circuit board auto testing instrument external device and computing machine.
The circuit board automatic testing equipment comprises master control board, channel board and function generator plate, wherein, the running of master control board control function generator plate and channel board, function generator plate is mainly controlled measured channel, and the channel that channel board mainly provides various test functions switches connection.Circuit board auto testing instrument external device is connected to described circuit board automatic testing equipment, comprises power supply, option board, needle-bar, pressure head control panel, serial communication apparatus, computing machine and input-output apparatus thereof, external instrument.Wherein power supply provides necessary operating voltage or electric current for tested circuit board; Option board provides and select a function of testing from a plurality of tested circuit board; Needle-bar is used for fixing tested circuit board and tested circuit board is connected with relevant apparatus; The knee-action of pressure head control panel control pressure head finger plate (not shown) also detects the beginning test signal; Serial communication apparatus provides the level match conversion and can communicate with external unit, option board between computing machine and tested circuit board.Computing machine comprises the PCI numeral I/O card that is used for option board is provided with, the serial communication interface that communicates with serial communication apparatus, the PCI GPIB card that is connected with external instrument, and the ISA communication card that communicates of pressure head control panel.
Further, the circuit board automatic testing equipment can also comprise that a wave form analysis device is connected with channel board, and is connected with the display device of computing machine, is used for unsettled assembly is further analyzed, and shows.
The present invention also provides a kind of and has carried out wave form analysis at unsettled assembly, so that operating personnel can obtain the method for appropriate time-delay rapidly according to the result of wave form analysis.This method comprises the input step of the test parameter of importing MUT module under test, the preliminary testing procedure that makes a preliminary test of parameter according to input, judge the determining step that MUT module under test is whether stable according to The tested results, and analysis step display, when MUT module under test is unsettled, it is analyzed, and analysis result is shown to operating personnel.
Plate automatic testing equipment and wave analyzing device in a circuit according to the invention, can be rapidly and accurately in time to the measurement of electric appliance component in the circuit board, and, utilize the wave form analysis device can show measured value curve over time intuitively, operating personnel are that MUT module under test finds suitable time-delay according to this curve, thereby help accurately measuring unsettled MUT module under test, and enhance productivity.
Description of drawings
Fig. 1 is the structure calcspar of circuit board auto testing instrument of the present invention with its foreign nationality's device;
Fig. 2 is the test cell fundamental diagram of circuit board auto testing instrument of the present invention;
Fig. 3 is the flow chart that the present invention tests the required time-delay of MUT module under test
Fig. 4 is the result according to waveform analyzer of the present invention, is presented at the time dependent curve of electric capacity both end voltage on the display;
Fig. 5 is the circuit diagram that the method according to this invention is tested big electric capacity;
Voltage curve over time when Fig. 6 is shown in Figure 5 big electric capacity charging.
Embodiment
Fig. 1 is the structure calcspar of circuit board auto testing instrument of the present invention and external device thereof.As shown in Figure 1, circuit board auto testing instrument of the present invention comprises: master control board (main board), channel board (scanner board) and function generator plate (functional board).
Wherein digital waveform is directly synthesized in master control board, as producing the sine wave that can compile frequency 1-64KHz or 1-500KHz; The running of control function generator plate and channel board; Digital and analogue signals conversion is provided, is used for testing capacitor, electric capacity parallel resistance, inductance etc.
Function generator plate is mainly controlled measured channel, and comprises direct supply output, and directly power supply is used for powering up the function of dynamic test Board Under Test to the measured piece on the needle bed fixture, and its frequency test scope can be by DC-13MH.Provide in addition such as measured values such as the counting of electric current, frequency and timing, time, pulsewidths, and functions such as temperature sensor, buzzer siren, LED alarm are provided.
The channel that channel board mainly provides various test functions switches connection.
When automatic measure of learning capacitance, ICT (on-line testing instrument) can utilize ideal frequency of directly synthetic digital waveform generator generation, learns and tests, and also can manually adapt frequency.
This circuit board auto testing instrument external device has power supply (Power Souce), option board (matrixboard), test needle-bar (Fixture), pressure head control panel (Press Controller Board), serial communication apparatus (RS232 Comm.Bd), computing machine (PC) and input-output apparatus (I/O Devices) thereof, external instrument (External Instrument).Wherein power supply provides necessary operating voltage or electric current for tested circuit board; Option board provides and select a function of testing from a plurality of tested circuit board; Needle-bar is used for fixing tested circuit board and tested circuit board is connected with relevant apparatus; The knee-action of pressure head control panel control pressure head finger plate (not shown) also detects the beginning test signal; Serial communication apparatus provides the level match conversion and can communicate with external unit, option board between computing machine and tested circuit board; Computing machine comprises the PCI numeral I/O card that is used for option board is provided with, the serial communication interface that communicates with serial communication apparatus, the PCI GPIB card that is connected with external instrument, and the ISA communication card that communicates of pressure head control panel; The external input-output apparatus of computing machine comprises keyboard, mouse, display, printer etc.; The external instrument of circuit board auto testing instrument of the present invention mainly contains necessary direct supply, AC power, oscillograph, audio analyzer, electronic load, noise ripple table etc.
Fig. 2 is the test cell fundamental diagram of circuit board auto testing instrument of the present invention.The electric signal that interface bus sends master control board sends to measuring unit by interface, wherein measuring unit comprises amplifier and D/A converter, the electric signal that sends from master control board transfers to the test needle-bar through D/A converter and channel board, the test needle-bar links to each other with special test circuit, the special test circuit of MUT module under test on the described electric signal control test needle-bar, progressively the special test circuit energising of each MUT module under test is measured according to predefined testing procedure, the measured value of MUT module under test is after processing and amplifying, through D/A converter, interface circuit and interface bus are sent in the computing machine, by display measurement result are shown then.
Below with reference to Fig. 3 the present invention is elaborated to the method for testing of assembly.The first step, the input parameter step, test parameter by input equipment input MUT module under test, these parameters comprise type, method of testing, range of allowable error of MUT module under test etc., in second step, the initial testing step determines according to above-mentioned parameter whether measurement result is stable, if measurement result is stable, then finish test program; If measurement result instability, determine whether to utilize wave form analysis step debug test program, if use, execution analysis step display then, promptly read the electric current and voltage value of flowing through component at a certain time interval in real time, be presented on the display, offer operating personnel according to the measured value time history plot of these readings with MUT module under test, if not, then estimate a time delay by operating personnel.In an embodiment of the present invention, as shown in Figure 4, transverse axis is a time shaft, the longitudinal axis is represented the measurement result of certain time point magnitude of voltage, each time on the time shaft and correspondent voltage curve map thereof all are shown to operating personnel in real time, and operating personnel can directly read necessary time delay according to squiggle.
Fig. 4 has carried out after the method flow diagram shown in Figure 3, offer operating personnel's the time dependent curve of electric capacity both end voltage via the waveform analyzer test, those of ordinary skill in the art is easy to obtain appropriate time-delay according to this display result, in an embodiment of the present invention, as shown in Figure 4, this appropriate delay time is t.
Those of ordinary skill in the art should understand, not all MUT module under test all will utilize waveform analyzer, because this can prolong the test program time, as mentioned above, the MUT module under test that only those meetings that can't isolate is subjected to labile factor influence such as environmental capacitance inductance carries out wave form analysis, thereby saves the test duration.
Fig. 5 and Fig. 6 show circuit diagram that big electric capacity is tested respectively and voltage curve over time when should big electric capacity charging.
Though be illustrated with reference to embodiment, but obviously in design scope of the present invention, can also make multiple improvement to those skilled in the art, though with reference to various smart cards embodiment is illustrated, the present invention is not limited to this card.Should be appreciated that various modifications, replacement in not breaking away from instructions of the present invention scope of disclosure all are included in claims.
Claims (3)
1, a kind of circuit board Auto-Test System, this system comprises the circuit board automatic testing equipment, and coupled circuit board auto testing instrument external device and computing machine, it is characterized in that:
The circuit board automatic testing equipment comprises master control board, channel board and function generator plate, wherein, the running of master control board control function generator plate and channel board, function generator plate is mainly controlled measured channel, and the channel that channel board mainly provides various test functions switches connection;
Circuit board auto testing instrument external device is connected to described circuit board automatic testing equipment, comprise power supply, option board, needle-bar, pressure head control panel, serial communication apparatus, computing machine and input-output apparatus thereof, external instrument, wherein power supply provides necessary operating voltage or electric current for tested circuit board; Option board provides selects a function of testing from a plurality of tested circuit boards, needle-bar is used for fixing tested circuit board and tested circuit board is connected with relevant apparatus; The knee-action of pressure head control panel control pressure head finger plate also detects the beginning test signal, and serial communication apparatus provides the level match conversion and can communicate with external unit, option board between computing machine and tested circuit board;
Computing machine comprises the PCI numeral I/O card that is used for option board is provided with, the serial communication interface that communicates with serial communication apparatus, the PCI GPIB card that is connected with external instrument, and the ISA communication card that communicates of pressure head control panel.
2, a kind of circuit board Auto-Test System as claimed in claim 1, circuit board automatic testing equipment wherein also comprises a wave form analysis device, this wave form analysis device links to each other with computer display apparatus with channel board, read some measured values of MUT module under test as required in real time by channel board, and show the measured value time history plot according to these measured values.
3, a kind of circuit board automatic test approach is used in the circuit board Auto-Test System unsettled assembly being carried out wave form analysis, it is characterized in that:
The first step, the input parameter step, by the test parameter of input equipment input MUT module under test, these parameters comprise the type, method of testing, range of allowable error of MUT module under test etc.;
In second step, the initial testing step determines that according to above-mentioned parameter whether measurement result is stable, if measurement result is stable, then finishes test program; If measurement result instability, determine whether to utilize wave form analysis step debug test program, if use, execution analysis step display then, promptly read the electric current and voltage value of flowing through component at a certain time interval in real time, be presented on the display, offer operating personnel according to the measured value time history plot of these readings with MUT module under test, if not, then estimate a time delay by operating personnel.
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CNA2003101097665A CN1556416A (en) | 2003-12-31 | 2003-12-31 | Circuit automatic testing device possessing appliance capable of displaying appropriate time aelay and its method |
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CNA2003101097665A CN1556416A (en) | 2003-12-31 | 2003-12-31 | Circuit automatic testing device possessing appliance capable of displaying appropriate time aelay and its method |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100516902C (en) * | 2005-10-20 | 2009-07-22 | 鸿富锦精密工业(深圳)有限公司 | Efficiency measuring system and method of voltage control circuit |
CN101968652A (en) * | 2010-07-21 | 2011-02-09 | 中国航天科技集团公司第九研究院第七七一研究所 | Detection device and method for microcontroller system device |
CN101561471B (en) * | 2009-05-27 | 2011-02-16 | 陈建海 | Vehicle instrument circuit board combined detection table and detection method thereof |
CN101320067B (en) * | 2008-07-18 | 2012-05-16 | 福建先创电子有限公司 | Automatic testing equipment and method of multi-channel selector |
CN101226222B (en) * | 2008-02-02 | 2013-03-20 | 上海盈龙电子科技有限公司 | PCB multifunctional test system and implementing method |
-
2003
- 2003-12-31 CN CNA2003101097665A patent/CN1556416A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100516902C (en) * | 2005-10-20 | 2009-07-22 | 鸿富锦精密工业(深圳)有限公司 | Efficiency measuring system and method of voltage control circuit |
CN101226222B (en) * | 2008-02-02 | 2013-03-20 | 上海盈龙电子科技有限公司 | PCB multifunctional test system and implementing method |
CN101320067B (en) * | 2008-07-18 | 2012-05-16 | 福建先创电子有限公司 | Automatic testing equipment and method of multi-channel selector |
CN101561471B (en) * | 2009-05-27 | 2011-02-16 | 陈建海 | Vehicle instrument circuit board combined detection table and detection method thereof |
CN101968652A (en) * | 2010-07-21 | 2011-02-09 | 中国航天科技集团公司第九研究院第七七一研究所 | Detection device and method for microcontroller system device |
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