CN104698359A - High-performance test platform equipment - Google Patents
High-performance test platform equipment Download PDFInfo
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- CN104698359A CN104698359A CN201310667075.0A CN201310667075A CN104698359A CN 104698359 A CN104698359 A CN 104698359A CN 201310667075 A CN201310667075 A CN 201310667075A CN 104698359 A CN104698359 A CN 104698359A
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- operating system
- test platform
- automatic test
- ate
- peripheral hardware
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Abstract
The invention relates to high-performance test platform equipment comprising an automatic test set, a peripheral interconnection extender and a transmission module. The automatic test set with a first operating system is in information connection with the peripheral interconnection extender through the transmission module. When the high-performance test platform equipment with the structure is in general use, the automatic test set tests an object to be tested; measured related information is displayed and counted via the first operating system; in a case of testing other items, the first operating system transmits a detection command to the second operating system, the peripheral interconnection extender tests the items to be tested, the measured related information is returned to the first operating system through the transmission module, and thus efficiency is improved and testing is perfected.
Description
Technical field
The present invention for providing a kind of high-effect test platform device, especially a kind of can raising efficiency and improve test high-effect test platform device.
Background technology
Press, semiconductor industry is the foundation stone of high-tech product now, by relevant practitioner's Precision measurement and design, creates the product of various different field on the market.
Wherein detection is a considerable link, and the object of determinand being carried out to coherent detection, except testing the quality of determinand, tests its product performance also quite important.
Industry is current all uses single testing apparatus, by determinand by testing tool, and the information remittance complete record that will record, assess judgement use to be supplied to relevant staff.
In use, there is following point and deficiency waits to improve in right above-mentioned existing testing apparatus:
(1) only use single testing apparatus to detect, the integrity degree in test shows slightly thin, and its fiduciary level is also troubling.
(2) detect as need be carried out other again, then determinand must be moved to other testing apparatus places, moving process effort trouble.
To sum up, how to solve above-mentioned existing issue with not enough, be the present inventor be engaged in the industry relevant manufactures desire most ardently the place, direction studied and improve.
Summary of the invention
Therefore the present inventor, because above-mentioned deficiency, is collect related data, via in many ways assessing and considering, and to engage in the many years of experience of the industry accumulation, via constantly test and amendment, design the high-effect test platform device patent of invention of this kind of raising efficiency and perfect test.
Fundamental purpose of the present invention is: will have the ATE (automatic test equipment) (ATE improving test interface and high degree of integration, Automatic Test Equipment) mode that connected by network with have the interconnected expansion instrument of the peripheral hardware of high flexibility ratio and speed (PXI, Peripheral component interconnectExtensions for Instrumentation) mutual information connection, make detection to provide complete and environment fast, by above-mentioned technology, can be broken through for the not enough and mobile troublesome problem points of the test integrity degree existing for existing testing apparatus, reach raising efficiency and improve the object of testing.
For reaching above-mentioned purpose, the high-effect test platform device of the present invention comprises an ATE (automatic test equipment) (ATE, Automatic Test Equipment), the interconnected expansion instrument of one peripheral hardware (PXI, Peripheral component interconnect Extensions for Instrumentation) and a transport module, this ATE (automatic test equipment) is provided with one first operating system, and the interconnected expansion apparatus installation of this peripheral hardware has one second operating system, and this transport module is connected with ATE (automatic test equipment) and the interconnected expansion device information of peripheral hardware, pass through said structure, relevant information ATE (automatic test equipment) detected shows statistics by the first operating system, during as the detection of sundry item must be carried out, instruction to the second operating system is detected by the first operating system transmission, detected by the interconnected expansion instrument of peripheral hardware again, and by transport module, the relevant information recorded is back to the first operating system for related personnel's reference, by above-mentioned action, realize raising efficiency and improve the object of testing.
Accompanying drawing explanation
Fig. 1 is the structural representation of present pre-ferred embodiments;
Fig. 2 is the using state figure a of present pre-ferred embodiments;
Fig. 3 is the using state figure b of present pre-ferred embodiments;
Fig. 4 is the Organization Chart of present pre-ferred embodiments.
Description of reference numerals: 1-ATE (automatic test equipment); 11-first operating system; The interconnected expansion instrument of 2-peripheral hardware; 21-second operating system; 3-transport module.
Embodiment
For achieving the above object and effect, the technology used in the present invention means and structure, with regard to present pre-ferred embodiments, hereby drawing illustrates that its features and functions is as follows in detail, understand completely in order to do profit.
Be illustrated in figure 1 the block schematic diagram of present pre-ferred embodiments, find out that the present invention's high-effect test platform device system comprises by knowing in figure:
One ATE (automatic test equipment) 1(ATE, Automatic Test Equipment), this ATE (automatic test equipment) 1 is provided with one first operating system 11;
One peripheral hardware interconnected expansion instrument 2(PXI, Peripheral component interconnectExtensions for Instrumentation), the interconnected expansion instrument 2 of this peripheral hardware is provided with the second operating system 21; And
One transport module 3, this transport module 3 is connected with this ATE (automatic test equipment) 1 and peripheral hardware interconnected expansion instrument 2 information.
Wherein this first operating system 11 is LINUX operating system (LINUX OS) or WINDOWS operating system (WINDOWS OS).
Wherein this second operating system 21 is WINDOWS operating system.
Wherein this transport module 3 is a procotol TCP/IP (transmission control protocol/Internet Protocol, Transmission Control Protocol/Internet Protocol).
Pass through said structure, composition design, hereby just use start situation of the present invention is described as follows, Fig. 1, Fig. 2, Fig. 3 and Fig. 4 is respectively the structural representation of present pre-ferred embodiments, using state figure a, using state figure b and Organization Chart, find out by knowing in figure, when relevant operating personnel is detected by ATE (automatic test equipment) 1 pair of determinand (as: digital test), the relevant information recorded is converged whole display by the first operating system 11, be supplied to related personnel with reference to using, now the interconnected expansion instrument 2 of peripheral hardware and the second operating system 21 are holding state, during as other test item need be carried out to determinand (as: radio frequency detection), user assigns a detection instruction to the first operating system 11, this detection instruction is passed to the second operating system 21 by transport module 3, and detected by the interconnected expansion instrument 2 of peripheral hardware, and the related data of detection is back to the first operating system 11 by transport module 3, carry out relevant operation uses, now gain ATE (automatic test equipment) 1 again and the first operating system 11 continues start, flowing mode is made by above-mentioned, user does not need to be moved by determinand to test to other positions again, and the first operating system 11 is connected by transport module 3 information with the second operating system 21, originally the system mutual information do not supported mutually is connected, therefore user can obtain the perfect test environment of ATE (automatic test equipment) 1 and interconnected expansion instrument 2 high speed of peripheral hardware characteristic flexibly simultaneously, make detection to obtain better effect.
Only, the foregoing is only preferred embodiment of the present invention, non-ly therefore namely limit to the scope of the claims of the present invention, therefore the simple and easy modification of such as using instructions of the present invention and graphic content to do and equivalent structure change, in like manner all should be contained in the scope of the claims of the present invention, close and give Chen Ming.
Therefore, refer to shown in whole accompanying drawing, when the present invention uses, compare with prior art, really there is following advantages:
ATE (automatic test equipment) 1 is connected with peripheral hardware interconnected expansion instrument 2 mutual information by transport module 3, makes usefulness in detection better.
By above-mentioned advantage, make ATE (automatic test equipment) after 1 day when expanded function or upgrading, the mode by the interconnected expansion instrument 2 of plug-in peripheral hardware is carried out, and significantly reduces costs.
In sum, when high-effect test platform of the present invention is installed on use, for really reaching its effect and object, therefore the present invention is really a practicality excellence invention, for meeting the application important document of patent of invention, filing an application in whence in accordance with the law, expects that careful committee grants accurate the present invention early, to ensure the arduous invention of inventor, if an ancient unit of weight office examine committee have any check doubtful, please write to us without sparing instruction, settled the doing one's utmost of inventor coordinates, and true feeling moral just.
Claims (4)
1. a high-effect test platform device, is characterized in that, include:
One ATE (automatic test equipment) being provided with the first operating system;
The one interconnected expansion instrument of peripheral hardware being provided with the second operating system; And
One transport module be connected with described ATE (automatic test equipment) and the interconnected expansion device information of described peripheral hardware.
2. high-effect test platform device according to claim 1, is characterized in that, described first operating system is LINUX operating system or WINDOWS operating system.
3. high-effect test platform device according to claim 1, is characterized in that, described second operating system is WINDOWS operating system.
4. high-effect test platform device according to claim 1, is characterized in that, described transport module is a procotol TCP/IP.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310667075.0A CN104698359A (en) | 2013-12-10 | 2013-12-10 | High-performance test platform equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310667075.0A CN104698359A (en) | 2013-12-10 | 2013-12-10 | High-performance test platform equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104698359A true CN104698359A (en) | 2015-06-10 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310667075.0A Pending CN104698359A (en) | 2013-12-10 | 2013-12-10 | High-performance test platform equipment |
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| CN (1) | CN104698359A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW473613B (en) * | 1999-11-17 | 2002-01-21 | Inventec Corp | Testing device and method used between elements of two computers |
| CN2706771Y (en) * | 2003-12-31 | 2005-06-29 | 李日生 | Automatic tester for circuitboard |
| CN1645337A (en) * | 2004-04-16 | 2005-07-27 | 威盛电子股份有限公司 | Method and apparatus for testing host computer board including interconnecting peripheries quickly |
| US20080059108A1 (en) * | 2006-08-31 | 2008-03-06 | Testian, Inc. | Automatic Test Equipment Platform Architecture Using Parallel User Computers |
| CN201637817U (en) * | 2010-03-25 | 2010-11-17 | 华润赛美科微电子(深圳)有限公司 | Test system |
| WO2011149725A2 (en) * | 2010-05-28 | 2011-12-01 | Verigy (Singapore) Pte. Ltd. | Flexible storage interface tester with variable parallelism and firmware upgradeability |
-
2013
- 2013-12-10 CN CN201310667075.0A patent/CN104698359A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW473613B (en) * | 1999-11-17 | 2002-01-21 | Inventec Corp | Testing device and method used between elements of two computers |
| CN2706771Y (en) * | 2003-12-31 | 2005-06-29 | 李日生 | Automatic tester for circuitboard |
| CN1645337A (en) * | 2004-04-16 | 2005-07-27 | 威盛电子股份有限公司 | Method and apparatus for testing host computer board including interconnecting peripheries quickly |
| US20080059108A1 (en) * | 2006-08-31 | 2008-03-06 | Testian, Inc. | Automatic Test Equipment Platform Architecture Using Parallel User Computers |
| CN201637817U (en) * | 2010-03-25 | 2010-11-17 | 华润赛美科微电子(深圳)有限公司 | Test system |
| WO2011149725A2 (en) * | 2010-05-28 | 2011-12-01 | Verigy (Singapore) Pte. Ltd. | Flexible storage interface tester with variable parallelism and firmware upgradeability |
Non-Patent Citations (1)
| Title |
|---|
| NATIONAL INSTRUMENTS: "《61⁄2-Digit Digital Multimeters and 1.8 MS/s Isolated Digitizers》", 31 December 2009 * |
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| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20150610 |
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| WD01 | Invention patent application deemed withdrawn after publication |