CN112964952A - Server test system - Google Patents
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- CN112964952A CN112964952A CN202110189444.4A CN202110189444A CN112964952A CN 112964952 A CN112964952 A CN 112964952A CN 202110189444 A CN202110189444 A CN 202110189444A CN 112964952 A CN112964952 A CN 112964952A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
Abstract
The application discloses a server testing system which comprises an upper computer, an electronic load and an oscilloscope, wherein the electronic load and the oscilloscope are connected with the upper computer; when the upper computer detects that the object to be tested is the single board to be tested, the server testing system is judged to enter an OCP testing mode, and the electronic load is driven to carry out load pulling on the single board to be tested; the oscilloscope receives the load current of the electronic load and uploads oscilloscope data to an upper computer for analysis; when the upper computer detects that the object to be tested is the complete machine to be tested, the server testing system is judged to enter a current sharing testing mode, and the complete machine to be tested is driven to load the simulation pressurizing script; the oscilloscope receives the input current of the complete machine to be tested and uploads the data of the oscilloscope to the upper computer for analysis. This application does not need artifical manual going on, can carry out the analysis to the oscilloscope data of arbitrary time point simultaneously, can comparatively high-efficiently accomplish the test and the analysis of server fast, has reduced the cost of labor, has saved test time.
Description
Technical Field
The invention relates to the field of server testing, in particular to a server testing system.
Background
At present, in order to guarantee the stability and reliability of the server, the power integrity test is indispensable, the items of the power integrity test include an OCP (Over Current Protection) test, a Current sharing test and the like, and whether the power meets the design requirements is one of important bases for judging the system stability.
However, the current OCP test and the current sharing test can only be manually performed, and the test environment of the server to be tested must be manually set first, and after the test result is obtained, the test result is manually analyzed, so that the efficiency is extremely low, and since the test result is usually embodied by an oscilloscope, only parameter calculation within a period of time can be performed, data analysis at a specific time point cannot be performed, and the problems of low test efficiency and incomplete analysis exist.
Therefore, how to provide a solution to the above technical problems is a problem to be solved by those skilled in the art.
Disclosure of Invention
In view of the above, the present invention provides a server testing system to achieve efficient and accurate testing. The specific scheme is as follows:
a server test system comprises an upper computer, an electronic load and an oscilloscope, wherein the electronic load and the oscilloscope are connected with the upper computer;
when the upper computer detects that the object to be tested is the single board to be tested, the server testing system is judged to enter an OCP testing mode, and the electronic load is driven to carry out load pulling on the single board to be tested; the oscilloscope receives the load current of the electronic load and uploads oscilloscope data to the upper computer for analysis;
when the upper computer detects that the object to be tested is a complete machine to be tested, judging that the server test system enters a current sharing test mode, and driving the complete machine to be tested to load an analog pressurization script; and the oscilloscope receives the input current of the complete machine to be tested and uploads oscilloscope data to the upper computer for analysis.
Preferably, in the OCP test mode, the oscilloscope is connected to the electronic load through a plurality of current probes;
in the current sharing test mode, the oscilloscope is connected with the electronic load through the plurality of current probes.
Preferably, the oscilloscope is further configured to:
and calculating the data of the data channels corresponding to the plurality of current probes.
Preferably, the oscilloscope is specifically configured to:
and summing or differencing the data of the data channels corresponding to the plurality of current probes.
Preferably, the electronic load includes:
and any one of the load modules receives a driving instruction of the upper computer and drives all the load modules to output corresponding load current.
Preferably, the process of analyzing the oscilloscope data by the upper computer comprises:
and calculating the uneven fluidity according to oscilloscope data corresponding to the whole machine to be tested, and generating a waveform diagram taking time as a horizontal axis and the uneven fluidity as a vertical axis.
Preferably, the process of analyzing the oscilloscope data by the upper computer further comprises:
and determining the current value of the OCP protection trigger point according to the oscilloscope data corresponding to the single board to be tested, and judging whether the current value meets the design requirement according to the design parameter of the single board to be tested.
Preferably, when the object to be tested is the single board to be tested, the upper computer is connected with the single board to be tested through a JTAG-USB line;
and when the object to be tested is the complete machine to be tested, the upper computer is connected with the complete machine to be tested through a twisted pair.
Preferably, the upper computer is connected with the electronic load through a GPIB (general purpose interface bus) line;
and the upper computer is connected with the oscilloscope through a GPIB (general purpose interface bus) line.
Preferably, the electronic load is connected to the board to be tested through a load line.
The application discloses a server testing system which comprises an upper computer, an electronic load and an oscilloscope, wherein the electronic load and the oscilloscope are connected with the upper computer; when the upper computer detects that the object to be tested is the single board to be tested, the server testing system is judged to enter an OCP testing mode, and the electronic load is driven to carry out load pulling on the single board to be tested; the oscilloscope receives the load current of the electronic load and uploads oscilloscope data to the upper computer for analysis; when the upper computer detects that the object to be tested is a complete machine to be tested, judging that the server test system enters a current sharing test mode, and driving the complete machine to be tested to load an analog pressurization script; and the oscilloscope receives the input current of the complete machine to be tested and uploads oscilloscope data to the upper computer for analysis. This application utilizes the host computer to set up the test environment of the complete machine that awaits measuring, and receive oscilloscope data and carry out the analysis in the test procedure, and whole process is replaced by the machine, does not need artifical manual to go on, can carry out the analysis to the oscilloscope data of arbitrary time point simultaneously, can comparatively high-efficiently accomplish the test and the analysis of server fast, has reduced the cost of labor, has saved test time.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a block diagram of a server test system according to an embodiment of the present invention;
fig. 2 is a schematic interface diagram of an oscilloscope of a server test system according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The current OCP test and the current sharing test can only be manually carried out by workers, the test environment of a server to be tested must be manually set firstly, after a test result is obtained, manual analysis is carried out on the test result, data analysis on a specific time point cannot be carried out, and the problems of low test efficiency and incomplete analysis exist. Whole process is replaced by the machine in this application, does not need artifical manual going on, can carry out the analysis to the oscilloscope data of arbitrary time point simultaneously, can accomplish the test and the analysis of server comparatively high-efficiently fast, has reduced the cost of labor, has saved test time.
The embodiment of the invention discloses a server testing system, which comprises an upper computer 1, an electronic load 2 and an oscilloscope 3, wherein the electronic load 2 and the oscilloscope 3 are connected with the upper computer 1;
when the upper computer 1 detects that the object to be tested is the single board 4 to be tested, the server testing system is judged to enter an OCP testing mode, and the electronic load 2 is driven to carry out load pulling on the single board 4 to be tested; the oscilloscope 3 receives the load current of the electronic load 2 and uploads oscilloscope data to the upper computer 1 for analysis;
when the upper computer 1 detects that the object to be tested is the complete machine 5 to be tested, the server testing system is judged to enter a current sharing testing mode, and the complete machine 5 to be tested is driven to load the simulation pressurizing script; the oscilloscope 3 receives the input current of the complete machine 5 to be tested and uploads the oscilloscope data to the upper computer 1 for analysis.
It can be understood that, the objects to be tested in the OCP test mode and the current sharing test mode are different, and the test environment has a partial difference, for example, in the OCP test mode, the upper computer 1 in the server test system monitors the board 4 to be tested, drives the electronic load to pull the board 4 to be tested, the oscilloscope 3 receives the pull-load current of the electronic load 2, and uploads the oscilloscope data to the upper computer 1, in order to achieve the above purpose, the upper computer 1 is connected to the board 4 to be tested, the electronic load 2, and the oscilloscope 3, the board 4 to be tested and the oscilloscope 3 are connected to the electronic load 2, and the specific wiring type is set according to different connection objects and communication types. Similarly, in the current-sharing test mode, the upper computer 1 detects the complete machine 5 to be tested, drives the complete machine 5 to be tested to load the analog pressurization script in the complete machine 5 to be tested, and the oscilloscope 3 receives the input and output currents of the complete machine 5 to be tested and uploads oscilloscope data to the upper computer 1.
Specifically, when the technical effect of the server test system is achieved, the link relationship between different modules may be set according to the following scheme: the upper computer 1 is connected with the electronic load 2 through a GPIB (General-Purpose Interface Bus); the upper computer 1 is connected with the oscilloscope 3 through a GPIB wire; when the object to be tested is the single board 4 to be tested, the upper computer 1 is connected with the single board 4 to be tested through a JTAG-USB line, the electronic load 2 is connected with the single board 4 to be tested through a load line, and the electronic load 2 is connected with the oscilloscope 3 through a current probe rod; when the object to be tested is the complete machine 5 to be tested, the upper computer 1 is connected with the complete machine 5 to be tested through the twisted pair CAT, and the complete machine 5 to be tested is connected with the oscilloscope 3 through the current probe.
It can be understood that, in this arrangement, the single board 4 to be tested and the complete machine 5 to be tested are respectively connected with the upper computer 1 through different terminals and wiring protocols, so that the upper computer 1 can easily distinguish whether the object to be tested is the single board 4 to be tested or the complete machine 5 to be tested according to the communication signal.
Further, a module for data analysis in the upper computer 1 may be separated from the upper computer 1, and exists separately in the form of a data processing module, and the data processing module stores therein an algorithm specially used for processing oscilloscope data, and is connected to the upper computer 1 through a USB (Universal Serial Bus) protocol or other protocols, receives oscilloscope data sent by the upper computer 1, and sends a data analysis result to the upper computer 1.
Furthermore, considering that the current probe has range limitation, in the OCP test mode, if the current probe with a small range is selected, the current probe may exceed the range of the current probe due to too large measured current, and if the current probe with a large range is selected, the current probe cannot accurately measure the measured current with a small range, and the whole test is difficult to accurately measure the measured current at each stage, so that the oscilloscope 3 which can be accessed to multiple channels is selected, the oscilloscope 3 is connected with the electronic load 2 through the multiple current probes, each current probe corresponds to one data channel of the oscilloscope 3, and the problems that the large current easily exceeds the range and the small current is inaccurate to measure are solved. Further, the oscilloscope 3 with the channel operation function can be selected, and the received current values of the multiple data channels are subjected to summation preprocessing in advance before sending oscilloscope data to the upper computer 1 and are uploaded to the upper computer 1 as final load current. As shown in FIG. 2, the channels P12V _ Vin _ left and P12V _ Vin _ right are data channels corresponding to the current probes, and the channel SUM is a data channel corresponding to the summation data. Of course, the oscilloscope 3 may directly upload the data of each data channel to the upper computer 1 without summing, and the upper computer 1 performs analysis processing.
Further, when a parallel mode is integrated in the electronic load 2, the electronic load 2 includes a plurality of load modules in the parallel mode, and in order to ensure the accuracy of the pull-load current, a master-slave structure may be provided in the electronic load 2, wherein any one of the load modules receives a driving instruction of the upper computer 1 and drives all the load modules to output corresponding pull-load currents.
Specifically, the process that host computer 1 carries out the analysis to oscilloscope data still includes:
and determining the current value of the OCP protection trigger point according to oscilloscope data corresponding to the single board 4 to be tested, and judging whether the current value meets the design requirement according to the design parameters of the single board 4 to be tested.
Specifically, the upper computer 1 is used as an execution main body, and the measurement process of the OCP test mode comprises the following steps:
obtaining a schematic diagram and a BOM file of the single board 4 to be tested, and determining the OCP design value I of the single board 4 to be testedOset1And the saturation current I of the output inductor of the single board 4 to be testedL；
Starting a test, when detecting a transmission signal sent by a CPLD (Complex Programmable Logic Device) of the board 4 to be tested, entering an OCP test mode, and returning a start signal to the CPLD of the board 4 to be tested, so as to power on all modules of the board 4 to be tested;
driving the electronic load 2 to carry out load-pulling on the tested single board 4, gradually increasing load-pulling current until the load-pulling current suddenly jumps down, and judging that the jump-down moment triggers the OCP protection of the tested single board 4, wherein the load-pulling current at the moment is the actually measured current I of the OCP pointOm；
The upper computer 1 receives oscilloscope data corresponding to the actually measured pull-load current sent by the oscilloscope 3, wherein the oscilloscope data can be current data corresponding to a plurality of current carbon rods, the sum of the oscilloscope data is the pull-load current, and the pull-load current can also be obtained after summation operation is carried out inside the oscilloscope 3;
processing and analyzing waveform of oscilloscope data, determining OCP point according to variation trend of load current, and analyzing actual measurement current I of OCP pointOmWhether the design requirements of the single board are met or not, the conventional design requirements of the single board comprise: 0.9IOset1≤IOm≤1.1IOset1And IOm<ILAnd finally, sorting the oscillogram and the analysis result to generate a final analysis report.
Similarly, in the current sharing test mode, the oscilloscope 3 can be connected with the whole device 5 to be tested through a plurality of current probes. The oscilloscope 3 can also be used for operating the data of the data channels corresponding to the plurality of current probes. The dizzy feeling specifically comprises: and summing or differencing the data of the data channels corresponding to the plurality of current probes.
Further, the process of analyzing the oscilloscope data by the upper computer 1 includes:
and calculating the non-uniform fluidity according to oscilloscope data corresponding to the complete machine 5 to be tested, and generating a waveform diagram taking time as a horizontal axis and the non-uniform fluidity as a vertical axis.
Specifically, the upper computer 1 is used as an execution main body, and the test process of the current sharing test mode mainly comprises the following steps:
obtaining a schematic diagram and a BOM (Bill Of Material) file Of a main board and/or a power board in the complete machine 5 to be tested, and reading an OCP (optical control program) design value I Of E-FUSE in the complete machine to be tested from the schematic diagram and the BOM fileOset2；
Starting a test, judging to enter a current sharing test mode if a transmission signal of the OCP test mode is not received in a preset time period, and correspondingly setting the oscilloscope 3: if two current probes are clamped on two power supply wires for inputting current respectively, then channels (such as ch1 and ch2) where the current probes are located are subjected to superposition summation, the result is displayed in a new channel M1, the channels where the current probes are located are subjected to difference calculation, the result is displayed in a new channel M2, and measures are set for the maximum value max and the average value mean of the new channels M1 and M2;
after the upper computer 1 displays that the mode is judged and set, the whole machine 5 to be tested is started;
the upper computer 1 and the BMC of the complete machine 5 to be tested carry out information interaction, the complete machine 5 to be tested is driven to load a simulation pressurization script, the complete machine 5 to be tested enters a simulation pressurization environment, and the complete machine 5 to be tested is controlled to be shut down after all pressure tests are completed.
In the pressure testing process, the oscilloscope 3 continuously acquires the test data of the input current and simultaneously performs the preprocessing operation, and the upper computer 1 acquires and subsequently analyzes the oscilloscope data. The analysis includes computation of the differential fluidity and OCP current determination.
Specifically, the calculation of the uneven fluidity includes: b (t) 100% ABS (I)dif(t))/(Isum(t)/2) in which Isum(t) is the current data of the channel M1 at that moment, Idif(t) is the current data of the channel M2 at this time; OCP Current judgment including each phase whether the max values of ch1 and ch2 are both smaller than IOset2If yes, OCP judgment conditions are met;
and finally, generating a final analysis report by the upper computer 1 through a rectified current oscillogram, an uneven fluidity broken line graph and other analysis results. The uneven-fluidity line graph is a waveform graph taking time as a horizontal axis and uneven fluidity as a vertical axis.
The application discloses a server testing system which comprises an upper computer, an electronic load and an oscilloscope, wherein the electronic load and the oscilloscope are connected with the upper computer; when the upper computer detects that the object to be tested is the single board to be tested, the server testing system is judged to enter an OCP testing mode, and the electronic load is driven to carry out load pulling on the single board to be tested; the oscilloscope receives the load current of the electronic load and uploads oscilloscope data to the upper computer for analysis; when the upper computer detects that the object to be tested is a complete machine to be tested, judging that the server test system enters a current sharing test mode, and driving the complete machine to be tested to load an analog pressurization script; and the oscilloscope receives the input current of the complete machine to be tested and uploads oscilloscope data to the upper computer for analysis. This application utilizes the host computer to set up the test environment of the complete machine that awaits measuring, and receive oscilloscope data and carry out the analysis in the test procedure, and whole process is replaced by the machine, does not need artifical manual to go on, can carry out the analysis to the oscilloscope data of arbitrary time point simultaneously, can comparatively high-efficiently accomplish the test and the analysis of server fast, has reduced the cost of labor, has saved test time.
Finally, it should also be noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The server test system provided by the invention is described in detail above, and the principle and the implementation of the invention are explained in the text by applying specific examples, and the description of the above examples is only used for helping understanding the method and the core idea of the invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.
Claims (10)
1. A server test system is characterized by comprising an upper computer, an electronic load and an oscilloscope, wherein the electronic load and the oscilloscope are connected with the upper computer;
when the upper computer detects that the object to be tested is the single board to be tested, the server testing system is judged to enter an OCP testing mode, and the electronic load is driven to carry out load pulling on the single board to be tested; the oscilloscope receives the load current of the electronic load and uploads oscilloscope data to the upper computer for analysis;
when the upper computer detects that the object to be tested is a complete machine to be tested, judging that the server test system enters a current sharing test mode, and driving the complete machine to be tested to load an analog pressurization script; and the oscilloscope receives the input current of the complete machine to be tested and uploads oscilloscope data to the upper computer for analysis.
2. The server test system of claim 1,
in the OCP test mode, the oscilloscope is connected with the electronic load through a plurality of current probes;
in the current sharing test mode, the oscilloscope is connected with the electronic load through the plurality of current probes.
3. The server test system of claim 2, wherein the oscilloscope is further configured to:
and calculating the data of the data channels corresponding to the plurality of current probes.
4. The server test system of claim 3, wherein the oscillograph is specifically configured to:
and summing or differencing the data of the data channels corresponding to the plurality of current probes.
5. The server test system of claim 1, wherein the electronic load comprises:
and any one of the load modules receives a driving instruction of the upper computer and drives all the load modules to output corresponding load current.
6. The server test system according to any one of claims 1 to 5, wherein the process of analyzing the oscilloscope data by the upper computer comprises:
and calculating the uneven fluidity according to oscilloscope data corresponding to the whole machine to be tested, and generating a waveform diagram taking time as a horizontal axis and the uneven fluidity as a vertical axis.
7. The server test system of claim 6, wherein the process of analyzing the oscilloscope data by the upper computer further comprises:
and determining the current value of the OCP protection trigger point according to the oscilloscope data corresponding to the single board to be tested, and judging whether the current value meets the design requirement according to the design parameter of the single board to be tested.
8. The server test system of claim 7,
when the object to be tested is the single board to be tested, the upper computer is connected with the single board to be tested through a JTAG-USB line;
and when the object to be tested is the complete machine to be tested, the upper computer is connected with the complete machine to be tested through a twisted pair.
9. The server test system of claim 8,
the upper computer is connected with the electronic load through a GPIB (general purpose interface bus) line;
and the upper computer is connected with the oscilloscope through a GPIB (general purpose interface bus) line.
10. The server test system according to claim 9, wherein the electronic load is connected to the board under test via a load line.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113589041A (en) * | 2021-06-22 | 2021-11-02 | 苏州浪潮智能科技有限公司 | Interface power supply signal test fixture, integrity test system and integrity test method |
| CN114442019A (en) * | 2021-12-31 | 2022-05-06 | 苏州浪潮智能科技有限公司 | Test correction method and device for test tool and electronic equipment |
| CN114636852A (en) * | 2022-03-17 | 2022-06-17 | 苏州浪潮智能科技有限公司 | Over-current testing method and device for server, server and readable storage medium |
| CN115201611A (en) * | 2022-07-29 | 2022-10-18 | 苏州浪潮智能科技有限公司 | Method for testing VR power supply stability of CPU and related components |
Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100019576A1 (en) * | 2008-07-24 | 2010-01-28 | International Business Machines Corporation | Dynamically Configuring Current Sharing And Fault Monitoring In Redundant Power Supply Modules |
| CN105659937B (en) * | 2011-11-08 | 2014-02-19 | 北京航天飞行控制中心 | Power supply module for communication Intelligent tester |
| EP2866135A2 (en) * | 2013-10-25 | 2015-04-29 | Samsung Electronics Co., Ltd | Server system and storage system |
| CN105137364A (en) * | 2015-07-23 | 2015-12-09 | 浪潮电子信息产业股份有限公司 | Automatic test system of switch power supply |
| CN106546906A (en) * | 2016-11-01 | 2017-03-29 | 郑州云海信息技术有限公司 | A kind of method and device of Power Integrity test |
| CN106772118A (en) * | 2016-12-07 | 2017-05-31 | 郑州云海信息技术有限公司 | A kind of power link method of testing and system |
| CN107202965A (en) * | 2017-07-26 | 2017-09-26 | 深圳市共进电子股份有限公司 | A kind of method and apparatus for testing power supply signal integrality |
| CN107271818A (en) * | 2017-06-29 | 2017-10-20 | 郑州云海信息技术有限公司 | A kind of test server supplied for electronic system voltage range compliance verification method and system |
| CN208141330U (en) * | 2018-05-21 | 2018-11-23 | 郑州云海信息技术有限公司 | A kind of power supplying system of server |
| CN109960620A (en) * | 2019-03-27 | 2019-07-02 | 苏州浪潮智能科技有限公司 | A kind of equal current test method of server power supply |
| CN110518784A (en) * | 2019-07-19 | 2019-11-29 | 杭州洲钜电子科技有限公司 | Power MOSFET parallel current-equalizing circuit in a kind of inverter |
| CN210294436U (en) * | 2019-06-27 | 2020-04-10 | 苏州浪潮智能科技有限公司 | Current-sharing testing device |
| CN111239637A (en) * | 2020-02-16 | 2020-06-05 | 苏州浪潮智能科技有限公司 | Server power supply current sharing detection device and method |
| CN211426702U (en) * | 2019-11-15 | 2020-09-04 | 苏州浪潮智能科技有限公司 | Testing device for server board card power supply overcurrent and short circuit protection |
| CN111707959A (en) * | 2020-05-29 | 2020-09-25 | 苏州浪潮智能科技有限公司 | System and method for testing power integrity of server board card |
| US20200343723A1 (en) * | 2019-04-25 | 2020-10-29 | Commscope Technologies Llc | Current-sharing control circuit, power supply system and current-sharing control method |
-
2021
- 2021-02-19 CN CN202110189444.4A patent/CN112964952B/en active Active
Patent Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100019576A1 (en) * | 2008-07-24 | 2010-01-28 | International Business Machines Corporation | Dynamically Configuring Current Sharing And Fault Monitoring In Redundant Power Supply Modules |
| CN105659937B (en) * | 2011-11-08 | 2014-02-19 | 北京航天飞行控制中心 | Power supply module for communication Intelligent tester |
| EP2866135A2 (en) * | 2013-10-25 | 2015-04-29 | Samsung Electronics Co., Ltd | Server system and storage system |
| CN105137364A (en) * | 2015-07-23 | 2015-12-09 | 浪潮电子信息产业股份有限公司 | Automatic test system of switch power supply |
| CN106546906A (en) * | 2016-11-01 | 2017-03-29 | 郑州云海信息技术有限公司 | A kind of method and device of Power Integrity test |
| CN106772118A (en) * | 2016-12-07 | 2017-05-31 | 郑州云海信息技术有限公司 | A kind of power link method of testing and system |
| CN107271818A (en) * | 2017-06-29 | 2017-10-20 | 郑州云海信息技术有限公司 | A kind of test server supplied for electronic system voltage range compliance verification method and system |
| CN107202965A (en) * | 2017-07-26 | 2017-09-26 | 深圳市共进电子股份有限公司 | A kind of method and apparatus for testing power supply signal integrality |
| CN208141330U (en) * | 2018-05-21 | 2018-11-23 | 郑州云海信息技术有限公司 | A kind of power supplying system of server |
| CN109960620A (en) * | 2019-03-27 | 2019-07-02 | 苏州浪潮智能科技有限公司 | A kind of equal current test method of server power supply |
| US20200343723A1 (en) * | 2019-04-25 | 2020-10-29 | Commscope Technologies Llc | Current-sharing control circuit, power supply system and current-sharing control method |
| CN210294436U (en) * | 2019-06-27 | 2020-04-10 | 苏州浪潮智能科技有限公司 | Current-sharing testing device |
| CN110518784A (en) * | 2019-07-19 | 2019-11-29 | 杭州洲钜电子科技有限公司 | Power MOSFET parallel current-equalizing circuit in a kind of inverter |
| CN211426702U (en) * | 2019-11-15 | 2020-09-04 | 苏州浪潮智能科技有限公司 | Testing device for server board card power supply overcurrent and short circuit protection |
| CN111239637A (en) * | 2020-02-16 | 2020-06-05 | 苏州浪潮智能科技有限公司 | Server power supply current sharing detection device and method |
| CN111707959A (en) * | 2020-05-29 | 2020-09-25 | 苏州浪潮智能科技有限公司 | System and method for testing power integrity of server board card |
Non-Patent Citations (1)
| Title |
|---|
| 刘婷婷等: "电源完整性测试", 《微型机与应用》 * |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113589041A (en) * | 2021-06-22 | 2021-11-02 | 苏州浪潮智能科技有限公司 | Interface power supply signal test fixture, integrity test system and integrity test method |
| CN114442019A (en) * | 2021-12-31 | 2022-05-06 | 苏州浪潮智能科技有限公司 | Test correction method and device for test tool and electronic equipment |
| CN114442019B (en) * | 2021-12-31 | 2023-11-14 | 苏州浪潮智能科技有限公司 | Test correction method and device of test tool and electronic equipment |
| CN114636852A (en) * | 2022-03-17 | 2022-06-17 | 苏州浪潮智能科技有限公司 | Over-current testing method and device for server, server and readable storage medium |
| CN114636852B (en) * | 2022-03-17 | 2024-01-09 | 苏州浪潮智能科技有限公司 | Overcurrent test method and device for server, server and readable storage medium |
| CN115201611A (en) * | 2022-07-29 | 2022-10-18 | 苏州浪潮智能科技有限公司 | Method for testing VR power supply stability of CPU and related components |
| CN115201611B (en) * | 2022-07-29 | 2024-01-19 | 苏州浪潮智能科技有限公司 | Method for testing VR power supply stability of CPU and related components |
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