CN218788073U

CN218788073U - Circuit equipment testing device

Info

Publication number: CN218788073U
Application number: CN202222351970.9U
Authority: CN
Inventors: 刘强
Original assignee: iFlytek Co Ltd
Current assignee: iFlytek Co Ltd
Priority date: 2022-09-02
Filing date: 2022-09-02
Publication date: 2023-04-04
Anticipated expiration: 2032-09-02

Abstract

The utility model relates to the technical field of circuit board testing, and provides a circuit equipment testing device, which acquires the testing configuration information input by a user through configuration information acquisition equipment; and determining a target test schedule table and a target test case table by the control equipment based on the test configuration information, executing a stored test program based on the target test schedule table and the target test case table, and controlling the test resource equipment to further obtain a test result. The method does not need the participation of technical personnel in the test process, not only can greatly reduce the demand of the technical personnel and reduce the labor cost, but also can ensure the accuracy and the reliability of the test result and avoid the hidden danger of the test quality caused by human factors. Moreover, automatic testing of the circuit equipment to be tested can be realized, and the testing efficiency of the circuit equipment is improved.

Description

Circuit equipment testing device

Technical Field

The utility model relates to a circuit board test technical field especially relates to a circuit equipment testing arrangement.

Background

The circuit equipment is an indispensable part in the development and production of the electronic system, the quality of the circuit equipment directly influences the quality of the electronic system, and the production and inspection period of the circuit equipment influences the development progress and the delivery time of the whole machine. Thus, testing of circuit devices is an important link in relation to the quality and production cycle of electronic systems.

In the test process of the circuit equipment, different functions of the circuit equipment need to be tested by different technicians, corresponding test environments need to be built for the different functions, the test is carried out under the corresponding test environments, and after the test is completed, manual comparison is carried out on the test results in a manual arrangement mode so as to judge whether the test results reach the standard or not and whether the circuit equipment has defects or not.

Although the method can realize the function test of the circuit equipment, the realization of the method needs a large amount of technicians and increases the labor cost. Moreover, due to the whole participation of technicians, the method cannot be automatically realized, and the accuracy of the test result cannot be ensured due to different abilities of different technicians, so that the test has potential quality hazards.

SUMMERY OF THE UTILITY MODEL

The utility model provides a circuit equipment testing arrangement for solve the defect that exists among the prior art.

The utility model provides a circuit equipment testing arrangement, include: the system comprises control equipment, configuration information acquisition equipment and test resource equipment; the control equipment is in communication connection with the test resource equipment, and the test resource equipment is used for being electrically connected with the circuit equipment to be tested; the configuration information acquisition equipment is connected with the control equipment;

the configuration information acquisition equipment is used for acquiring test configuration information which is input by a user and corresponds to the circuit equipment to be tested;

the control equipment is used for storing a test program, determining a target test schedule table and a target test case table based on the test configuration information, executing the test program based on the target test schedule table and the target test case table, and controlling the test resource equipment to obtain a test result;

the target test schedule table is used for storing target test items corresponding to the circuit devices to be tested, and the target test case table is used for storing test cases corresponding to the target test items.

According to the utility model provides a pair of circuit equipment testing arrangement, test resource equipment specifically be used for with the external interface electricity of awaiting measuring circuit equipment is connected.

According to the utility model provides a circuit equipment testing device, still include mechanical vibration platform, mechanical vibration platform and controlgear communication connection;

the mechanical vibration table is used for bearing the circuit device to be tested and providing vibration for the circuit device to be tested.

According to the utility model provides a circuit equipment testing device, the circuit equipment to be tested includes the circuit board to be tested, the circuit board to be tested includes a plurality of test points;

the test resource device is specifically configured to electrically connect to the circuit board to be tested through the plurality of test points.

According to the utility model provides a circuit equipment testing device, the plurality of test points are connected with an external clamp;

the test resource equipment is specifically used for being electrically connected with the circuit board to be tested through the external clamp.

According to the utility model provides a circuit equipment testing device, still include the incubator, the incubator with the controlgear communication connection;

the incubator is used to provide an external environment having a target temperature and/or a target humidity.

According to the utility model provides a circuit equipment testing device, the test result includes test item test result and test case test result;

storing the test result of the test item into the target test schedule;

and storing the test result of the test case into the target test case table.

According to the utility model provides a circuit equipment testing device, the test resource equipment includes power supply unit and test data acquisition equipment;

the power supply equipment is used for providing an electric signal for the circuit equipment to be tested;

the test data acquisition equipment is used for acquiring test data in a test process, and the test data is used for determining the test result.

According to the utility model provides a circuit equipment testing device, the test data acquisition equipment includes at least one of oscilloscope, power analyzer and universal meter;

the oscilloscope is used for monitoring analog signals and/or digital signals in the test process;

the power analyzer is used for analyzing a power signal in the test process;

the multimeter is used for collecting electrical parameters in the test process.

According to the utility model provides a pair of circuit equipment testing arrangement, configuration information collection equipment includes at least one item in mouse, keyboard and the touch-sensitive screen.

The utility model provides a circuit equipment testing arrangement, include: the system comprises control equipment, configuration information acquisition equipment and test resource equipment, wherein test configuration information input by a user is acquired through the configuration information acquisition equipment; and determining a target test schedule table and a target test case table by the control equipment based on the test configuration information, executing a stored test program based on the target test schedule table and the target test case table, and controlling the test resource equipment to further obtain a test result. The test method does not need the participation of technical personnel in the test process, not only can greatly reduce the demand of the technical personnel and reduce the labor cost, but also can ensure the accuracy and the reliability of the test result and avoid the hidden trouble of the test quality caused by human factors. Moreover, the automatic test of the circuit board to be tested can be realized, and the test efficiency of the circuit board is improved.

Drawings

In order to more clearly illustrate the technical solutions of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that other drawings can be obtained by those skilled in the art without inventive efforts.

Fig. 1 is a schematic structural diagram of a circuit device testing apparatus provided by the present invention;

fig. 2 is a schematic structural diagram of a circuit device testing apparatus for hardware black box test verification provided by the present invention;

fig. 3 is a schematic structural diagram of a circuit device testing apparatus for hardware white box test verification provided by the present invention.

Reference numerals are as follows:

1: a control device; 2: configuring information acquisition equipment; 3: testing the resource equipment; 31: an electronic load; 32: an oscilloscope; 33: a power analyzer; 34: a direct current power supply; 35: a digital multimeter; 36: an alternating current power supply; 4: a circuit device to be tested; 41: a circuit board to be tested; 5: a network cable; 6: a mechanical vibration table; 7: a wire; 8: and (5) an incubator.

Detailed Description

To make the objects, technical solutions and advantages of the present invention clearer, the drawings of the present invention are combined to clearly and completely describe the technical solutions of the present invention, and obviously, the described embodiments are some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts all belong to the protection scope of the present invention.

Generally, the core of the circuit device is a circuit board, and after the circuit board is manufactured by a factory, the circuit board needs to be returned to a technician for development and testing, which is a white box test. Among the prior art, carrying out the in-process of white box test to the circuit board, generally need test respectively through the different technical staff of difference to the different functions of circuit board, to different functions, need set up corresponding test environment moreover to test under the test environment that corresponds, the manual contrast is carried out to artifical arrangement test result after the test is accomplished, with judge whether up to standard of test result, whether there is the defect etc. in the circuit board.

That is, in the case of testing multiple functions of a circuit board, each technician is required to test one function and build a corresponding test environment for each function. This results in a large number of technicians required for functional testing of the circuit board, increasing labor costs. Moreover, the limited number of technicians does not guarantee that sufficient technicians are available to perform the testing task.

Moreover, in the existing white box testing process, after each technician is assigned to a corresponding test task, the same type of test resource may be needed, but because the test resource is limited, the test requirement of each technician cannot be met, and only one technician can wait for the next technician to finish the test task, which greatly wastes human resources.

Due to different abilities of different technicians, the accuracy of a test result may not be ensured when a test task is executed, so that potential quality hazards exist in the test, and the test quality is unreliable. In addition, the method cannot be automated due to the full participation of the technician.

Therefore, the embodiment of the utility model provides a circuit device testing arrangement who can automize and realize white box test and black box test is provided.

Fig. 1 is a schematic structural diagram of a circuit device testing apparatus in an embodiment of the present invention, as shown in fig. 1, the circuit device testing apparatus includes: the system comprises a control device 1, a configuration information acquisition device 2 and a test resource device 3; the control equipment 1 is in communication connection with the test resource equipment 3, and the test resource equipment 2 is used for being electrically connected with the circuit equipment 4 to be tested; the configuration information acquisition equipment 2 is connected with the control equipment 1;

the configuration information acquisition equipment 2 is used for acquiring test configuration information which is input by a user and corresponds to the circuit equipment to be tested;

the control device 1 stores a test program, which may be an execution file suffixed exe. The control equipment 1 is configured to determine a target test schedule table and a target test case table based on the test configuration information, execute a test program based on the target test schedule table and the target test case table, and control the test resource equipment 3 to obtain a test result;

the target test schedule table is used for storing target test items corresponding to the circuit devices 4 to be tested, and the target test case table is used for storing test cases corresponding to the target test items.

Specifically, in the embodiment of the present invention, the control device 1 is used to realize the global control of the circuit device testing apparatus, for example, to control the testing resource device 3, and is further used to store the testing program, the testing schedule table, and the testing case table, etc. The control device 1 may be a computer, a laptop, a tablet computer, a controller, etc., and is not limited in particular.

The control device 1 may be provided with an external interface, which may be an interface in a software form, such as an address for writing data, or an interface in a hardware form, such as a USB (Universal Serial Bus) interface, a UART (Universal Asynchronous Receiver/Transmitter) interface, and the like, which is not limited in this embodiment of the present invention.

The test resource device 3 is a device required for testing the circuit device 4 to be tested, and the number of the test resource devices may be one or more, for example, at least one of a voltage regulator, a power analyzer, an electronic load, an oscilloscope, a multimeter, a converter, an incubator, and a control board card with a relay. The control device 1 is communicatively connected to the test resource device 3, for example, the test resource device 3 may be connected to the control device 1 through an external interface on the control device 1 by a wired connection or a wireless connection, which is not limited herein.

When the circuit device 4 to be tested is tested, the test resource device 3 is electrically connected to the circuit device 4 to be tested, for example, an external probe on the test resource device 3 may be directly connected to the circuit device 4 to be tested through a wire. Here, the test types for testing the circuit device 4 to be tested may include a black box test of the entire machine of the circuit device 4 to be tested and a white box test of the circuit board in the circuit device 4 to be tested.

Different connection modes can be adopted between the test resource device 3 and the circuit device 4 to be tested according to different test types, for example, when the test type is a white box test, the test resource device 3 and a circuit board to be tested in the circuit device 4 to be tested can be electrically connected; when the test type is the black box test, the test resource device 3 can be directly and electrically connected with the circuit device 4 to be tested.

The configuration information acquisition device 2 is used for acquiring input test configuration information corresponding to the circuit device 4 to be tested, and the configuration information acquisition device 2 is connected with the control device 1, so that the acquired test configuration information can be transmitted to the control device 1. Here, the configuration information collecting device 2 may also be connected to the control device 1 through an external interface on the control device 1 by a wired connection or a wireless connection, which is not limited herein.

Here, the test configuration information also differs according to the test type, for example, when the test type is a white box test, the test configuration information may be related information for the circuit board to be tested in the circuit device to be tested 4; when the test type is the black box test, the test configuration information may be related information of the whole device, i.e., the circuit device 4 to be tested, and at this time, related information of structures such as a circuit board to be tested in the circuit device 4 to be tested is not considered.

The control device 1 may store an initial test schedule table and an initial test case table in advance, where the initial test schedule table may include various test items that may be related to the circuit device to be tested, that is, various test items related to the white box test, and various test items related to the black box test. In order to better summarize and unify the test items under different test types and provide a more intuitive initial test schedule for the user, the initial test schedule may include an initial test schedule corresponding to a white box test and an initial test schedule corresponding to a black box test, which is not limited herein.

Each test item in the initial test schedule table may be correspondingly provided with a check box or a label, that is, each test item may be selected or unselected, and if the check box is selected or the label is a target label, the test item is selected, otherwise, the test item is unselected. The target tag may be Y, or may be set as needed, and is not specifically limited herein.

If the test item is selected or the label is the target label, the test item needs to be tested, and if the test item is not selected or the label is not the target label, the test item does not need to be tested.

The initial test case table may include various test cases that may be involved in each test item, that is, may include various test cases involved in white box testing, and may also include various test cases involved in black box testing. In order to better summarize and unify the test cases under different test types and provide a more intuitive initial test case table for the user, the initial test case table may include an initial test case table corresponding to a white box test and an initial test case table corresponding to a black box test, which is not specifically limited herein.

The embodiment of the present invention provides a test case, which can include configurable parameter specifications, such as clock frequency range, clock voltage amplitude range, etc.

Herein, the various test items that may be involved in the circuit device to be tested refer to test categories, and the various test items that may be involved in the white box test may include a circuit board signal test, a circuit board communication test, and a circuit board electromagnetic compatibility test. The Circuit board signal test may further include an input voltage protection range test, a power supply ripple test, a critical chip timing test, an overvoltage/overcurrent protection test, a charging curve test, a power consumption test, a clock test, an Integrated Circuit bus (IIC) test, an Internet Information Service (IIS) Interface test, a Mobile Industry Processor Interface (MIPI) test, a UART Interface test, a Serial Peripheral Interface (SPI) test, a USB Interface test, a General-purpose input/output (GPIO) Interface test, and the like.

The circuit board Communication test may include WiFi, bluetooth, wireless Communication Networks (WCN), 3G (third Generation, fourth Generation, and the like).

The Electromagnetic Compatibility (EMC) test of the circuit board may include two types of an Electromagnetic Interference (EMI) test and an Electromagnetic Susceptibility (EMS) test, and may be, for example, an Electrostatic Discharge (ESD) test, an Electrical Overstress (EOS) test, and the like.

Various test items possibly related to the black box test can comprise equipment complete machine power supply test, equipment complete machine communication test, equipment complete machine temperature test, equipment complete machine running state test, equipment complete machine EMC test, equipment complete machine drop test, equipment complete machine mechanical reliability test and the like.

The power supply test of the whole equipment can comprise a Direct Current (DC) power supply test and an Alternating Current (AC) power supply test.

The communication test of the whole equipment CAN include the communication signal test of the whole equipment and external equipment, and the communication signal CAN include 485 communication signals, IIC signals and Controller Area Network (CAN) signals.

The EMC test of the whole equipment can comprise the EMI tests of ESD, EOS and the like of the whole equipment.

The test configuration information collected by the configuration information collection device 2 may include selection information of a user on test items in the initial test schedule table and configuration information of test cases in the initial test case table, and may also include configuration information of test resource devices, which is not specifically limited herein.

The control device 1 may update the initial test schedule and the initial test case table through the test configuration information to obtain a target test schedule and a target test case table, that is, the control device 1 may update the initial test schedule through the selection information of the user on the test items in the initial test schedule to obtain the target test schedule, where all the target test items that the user needs to test the circuit board to be tested are recorded in the target test schedule. The target test schedule may include a target test schedule corresponding to a white box test and a target test schedule corresponding to a black box test.

The target test items in the target test schedule table corresponding to the white box test may include at least one of a signal test, a communication test and an electromagnetic compatibility test, and the target test items in the target test schedule table corresponding to the black box test may include at least one of an equipment complete machine power supply test, an equipment complete machine communication test, an equipment complete machine temperature test, an equipment complete machine operating state test, an equipment complete machine EMC test, an equipment complete machine drop test and an equipment complete machine mechanical reliability test.

The control device 1 may also update the initial test case table through configuration information of a test case in the initial test case table by a user, so as to obtain a target test case table, where the target test case table records a test case, that is, a relevant parameter specification, required when the user tests each target test item. The target test case table may also include a target test case table corresponding to a white box test and a target test case table corresponding to a black box test.

The control device 1 further stores a test program, and after the target test schedule table and the target test case table are determined, the test program may be executed according to the target test schedule table and the target test case table. In the execution process of the test program, the setting of the test resource device 3 is controlled, so that the test data of each target test item corresponding to the circuit board to be tested is detected, and the test result is obtained by automatically combining the test data. For example, the test data may be automatically compared with a preset condition, if the preset condition is satisfied, the test result is that the test is passed, that is, PASS, and if the preset condition is not satisfied, the test result is that the test is failed, that is, fail. Here, each target test item may correspond to one test result.

After the test program is executed, the comprehensive test result of the circuit board to be tested can be given by combining the test results corresponding to the target test items.

The embodiment of the utility model provides an in provide a circuit device testing arrangement, include: the system comprises control equipment, configuration information acquisition equipment and test resource equipment, wherein test configuration information input by a user is acquired through the configuration information acquisition equipment; and determining a target test schedule table and a target test case table by the control equipment based on the test configuration information, executing a stored test program based on the target test schedule table and the target test case table, and controlling the test resource equipment to further obtain a test result. The method does not need the participation of technical personnel in the test process, not only can greatly reduce the demand of the technical personnel and reduce the labor cost, but also can ensure the accuracy and the reliability of the test result and avoid the hidden danger of the test quality caused by human factors. Moreover, automatic testing of the circuit equipment to be tested can be realized, and the testing efficiency of the circuit equipment is improved.

Moreover, the circuit equipment testing device has the advantages of strong expandability, strong universality, high automation degree, convenient operation and the like. The circuit equipment testing device can be used for testing the circuit equipment, so that testing resource equipment can be saved, and a plurality of testing tasks can be completed by continuously operating the circuit equipment testing device day and night only by determining a proper target testing schedule and a target testing case table. In addition, due to the introduction of the configuration information acquisition equipment, the circuit equipment testing device can have the function of testing different types of circuit equipment to be tested.

On the basis of the above-mentioned embodiment, the embodiment of the utility model provides a circuit device testing arrangement, test resource equipment specifically be used for with the external interface electricity of the circuit device that awaits measuring is connected.

Specifically, the embodiment of the utility model provides an in, the circuit equipment that awaits measuring can dispose external interface, when realizing the black box test to the circuit equipment that awaits measuring through circuit equipment testing arrangement, owing to need not pay close attention to the performance of the inner structure of the circuit equipment that awaits measuring and the inside module that contains, consequently can be directly with the external interface electricity connection of testing resource equipment and the circuit equipment that awaits measuring. Here, the number of the external interfaces may be set as required, and is not specifically limited here, and it is sufficient to ensure that all required test resource devices can be accessed when performing the black box test.

The embodiment of the utility model provides an in, the external interface through the examination circuit equipment that awaits measuring realizes and the electricity between the test resource equipment is connected, and then can realize the black box test to the circuit equipment that awaits measuring automatically.

On the basis of the above embodiment, the circuit device testing device provided in the embodiment of the present invention further includes a mechanical vibration table, and the mechanical vibration table is in communication connection with the control device;

Specifically, in the embodiment of the utility model provides an in, circuit equipment testing arrangement can also include mechanical vibration platform, mechanical vibration platform and controlgear communication connection, can control mechanical vibration platform's vibration frequency and/or vibration amplitude through controlgear. The mechanical vibration table and test resource device may be collectively referred to as a test instrument.

The mechanical vibration table can bear the circuit device to be tested during testing, and provides the circuit device to be tested 4 with vibration with a target vibration frequency and/or a target vibration amplitude, namely, when the circuit device to be tested 4 needs to be subjected to vibration influence testing, the circuit device to be tested 4 is placed on the mechanical vibration table. The target vibration frequency and the target vibration amplitude can be adjusted according to needs, can fluctuate within a certain range, and can also be constant values.

The embodiment of the utility model provides an in, introduce mechanical vibration platform, can increase the functional scope that circuit equipment testing arrangement can test, improve circuit equipment testing arrangement's suitability.

On the basis of the embodiment, the embodiment of the utility model provides a circuit device testing device, the circuit device to be tested includes the circuit board to be tested, the circuit board to be tested includes a plurality of test points;

the test resource device is specifically used for electrically connecting the circuit board to be tested through the plurality of test points.

Specifically, the embodiment of the utility model provides an in, in order to carry out the white box test to the circuit equipment that awaits measuring, can dispose a plurality of test points on the await measuring circuit board that awaits measuring that contains in the circuit equipment that awaits measuring. The number of the test points may be set according to the number of the test resource devices 3 required by all test items that may be involved when testing the circuit board to be tested and the number of the external probes of each test resource device 3, for example, the product of the two may be used, or the number may be set according to the requirement, which is not specifically limited herein.

When the circuit board to be tested is tested, the external probe of the test resource equipment 3 can be directly welded on the corresponding test point on the circuit board to be tested, so that the electric connection with the circuit board to be tested is realized.

In addition, the lead wire can be directly welded on each test point, and then the electrical connection between the test resource equipment 3 and the circuit board to be tested can be realized only by connecting the other end of the welded lead wire with an external probe of the test resource equipment 3.

The embodiment of the utility model provides an in, it has a plurality of test points to reserve on the examination circuit board of awaiting measuring for be connected with test resource equipment electricity when the test, reduced the connection degree of difficulty.

On the basis of the above embodiment, in the circuit device testing device provided in the embodiment of the present invention, the plurality of test points are connected with an external clamp;

Specifically, in the embodiment of the utility model provides an in, for further reducing the await measuring circuit board and the connection degree of difficulty of testing resource equipment 3, all be connected with external anchor clamps on a plurality of test points of the await measuring circuit board.

When the circuit board to be tested is tested, the external probe of the testing resource device 3 can be connected with the external clamp of the circuit board to be tested, so that the testing resource device 3 is electrically connected with the circuit board to be tested.

Here, the circuit board to be tested may be connected to an external fixture at each test point, or may be connected to an external fixture at some test points.

The embodiment of the utility model provides an in, be connected with external anchor clamps on a plurality of test points of examination circuit board for be connected with test resource equipment electricity when the test, compare in direct through the test point connect more portably, have the simple operation nature.

On the basis of the embodiment, the circuit device testing device provided in the embodiment of the present invention further includes an incubator, wherein the incubator is in communication connection with the control device;

Specifically, the embodiment of the utility model provides an in, circuit equipment testing arrangement can also include the incubator, incubator and controlgear communication connection, can control the target temperature and/or the target humidity in the incubator through controlgear. The incubator, mechanical vibration table, and test resource device may be collectively referred to as a test instrument.

The incubator can provide an external environment with target temperature and/or target humidity during testing, namely, when white box testing is carried out, if influence testing of external environments such as temperature and humidity is required to be carried out on a circuit board to be tested, the circuit board to be tested can be placed into the incubator, and the external environment with the target temperature and/or the target humidity is provided for the circuit board to be tested. When the black box test is carried out, if influence of external environments such as temperature and humidity on the circuit equipment to be tested is required to be tested, the circuit equipment to be tested can be placed into the incubator so as to provide the external environment with target temperature and/or target humidity for the circuit equipment to be tested.

Here, both the target temperature and the target humidity may be adjusted as needed, may fluctuate within a certain range, or may be constant values.

The embodiment of the utility model provides an in, introduce the incubator, can increase the functional scope that circuit equipment testing arrangement can test, improve circuit equipment testing arrangement's suitability.

On the basis of the embodiment, the embodiment of the utility model provides a circuit device testing arrangement, the test result includes test item test result and test case test result;

storing the test result of the test item into the target test schedule;

and storing the test result of the test case into the target test case table.

Specifically, the embodiment of the utility model provides an in, the test result can include two types, is test item test result and test case test result respectively, and test item test result indicates the test result that every test item corresponds, and test case test result indicates the test result that every test case corresponds. For example, the test case includes a frequency, a voltage maximum, a voltage minimum, and the like. The parameter specifications are respectively that the standard mode is less than or equal to 100KHz, and the fast mode is less than or equal to 400KHz; 0.7V-V +0.5V; -0.5V-0.3V. The obtained test data are 337.9KHz, 3.32V and-40 mV respectively. The test case test results are PASS respectively.

The test result of each test case and the test data corresponding to each test case can be stored in the target test case table, and specifically can be stored in different columns corresponding to the row of each test case in the target test case table. The target test case table may further store a test chart obtained by screenshot of the control device or the test resource device.

The test result of each test item can be stored in the column corresponding to the row of each test item in the target test schedule. If all test case test results in a certain test project are PASS, the test result of the corresponding test project is PASS; if the test case test result in a certain test item is Fail, the test result of the corresponding test item is Fail. Or if the number of the test cases in a certain test item is that the PASS is more than the preset number, the test result of the corresponding test item is PASS; if the number of the PASS test cases in a certain test item is less than or equal to the preset number, the test result of the corresponding test item is Fail.

The embodiment of the utility model provides an in, through target test schedule and target test with the case table, save test result and test data, can summarize the information that produces in the test procedure, the user of being convenient for looks over. Moreover, the test case test result is included, so that the worker can conveniently and accurately position the test case with the test result of Fail and find the problems of the circuit board to be tested in time, the maintenance is convenient in time, and the serious consequences are avoided.

On the basis of the embodiment, the embodiment of the utility model provides a circuit device testing arrangement, test resource equipment includes power supply unit and test data acquisition equipment;

Specifically, the embodiment of the utility model provides an in, test resource equipment can also include power supply unit and test data acquisition equipment, and power supply unit can be used for providing the signal of telecommunication for the circuit board that awaits measuring. The power supply device may include at least one of a direct current power supply that may provide a direct current signal and an alternating current power supply that may provide an alternating current signal.

When the white box test is carried out, the test data acquisition equipment can be used for acquiring test data output by the circuit board to be tested in the test process, and when the black box test is carried out, the test data acquisition equipment can be used for acquiring test data output by the circuit board to be tested in the test process.

The test data can be transmitted to the control device through the test data acquisition device and then stored to the corresponding position in the target test case table. Corresponding test results can be determined through the test data, namely, the test results of the test cases can be directly obtained through the test data and preset conditions required to be met by the corresponding test cases, and the test results of the test items of the corresponding test items can be determined together through the test data and the test data corresponding to other test cases.

In addition to this, the test resource device may comprise a load circuit for detecting the power supply performance of the circuit device to be tested or of a circuit board to be tested therein. The load circuit can comprise an electronic load and a communication interface circuit, the electronic load can be used for detecting the power performance of the circuit equipment to be tested or a circuit board to be tested in the circuit equipment to be tested, the related parameters of the circuit board to be tested can be dynamically measured by programming and simulating load change, the communication interface circuit is used for outputting level signals meeting the requirements of the circuit equipment to be tested or the circuit board to be tested in the circuit equipment to be tested and is composed of communication modules, and each module has a single function.

On the basis of the embodiment, the embodiment of the utility model provides a circuit equipment testing arrangement, test data acquisition equipment includes at least one of oscilloscope, power analyzer and universal meter;

the power analyzer is used for analyzing a power signal in the test process;

Specifically, in the embodiment of the present invention, the test data acquisition device may further include at least one of an oscilloscope, a power analyzer and a multimeter; the oscilloscope can monitor analog signals and/or digital signals output by the circuit board to be tested in the white box testing process, and can also monitor analog signals and/or digital signals output by the circuit equipment to be tested in the black box testing process. The analog signal and/or the digital signal are the test data. The oscilloscope can also display a waveform diagram, and can capture the waveform diagram and store the captured waveform diagram to a corresponding position in the target test case table under the control of the control equipment.

The power analyzer can be used for analyzing the power signal of the circuit board to be tested in the white box testing process and can also be used for analyzing the power signal of the circuit device to be tested in the black box testing process. Here, the power signal may also serve as test data.

The universal meter can be used for collecting the voltage, resistance, current, capacitance and other electrical parameters of the circuit board to be tested in the white box testing process, and can also be used for collecting the voltage, resistance, current, capacitance and other electrical parameters of the circuit equipment to be tested in the black box testing process.

The embodiment of the utility model provides an in, expand the test data acquisition facility in the test resource equipment, can further increase the functional scope that circuit device testing arrangement can test, improve circuit device testing arrangement's suitability.

On the basis of the above-mentioned embodiment, the embodiment of the utility model provides a circuit device testing arrangement, configuration information collection equipment includes at least one item in mouse, keyboard and the touch-sensitive screen.

Specifically, the embodiment of the utility model provides an in, configuration information collection equipment can be mouse, keyboard and touch-sensitive screen etc. can cooperate the input device who uses with controlgear. When the configuration information acquisition device is a touch screen, the touch screen can be used as a display screen of the control device.

On the basis of the above-mentioned embodiment, the embodiment of the utility model provides a circuit device testing arrangement, controlgear with test resource equipment passes through communication cable communication connection.

Specifically, in the embodiment of the present invention, the communication cable may include a network cable and a data line with a usb interface. The control device may be connected to the test resource device via a network cable or a data cable.

Fig. 2 is a schematic structural diagram of a circuit device testing apparatus for hardware black box test verification provided in an embodiment of the present invention, and this circuit device testing apparatus can be used to perform a black box test on a circuit device 4 to be tested. As shown in fig. 2, the circuit device testing apparatus includes a control device 1, a configuration information acquisition device 2, an electronic load 31, an oscilloscope 32, a power analyzer 33, a direct-current power supply 34, a digital multimeter 35, an alternating-current power supply 36, a circuit device 4 to be tested, a network cable 5, a mechanical vibration table 6 and an incubator 8, wherein the control device 1, the electronic load 31, the oscilloscope 32, the power analyzer 33, the direct-current power supply 34, the digital multimeter 35, the alternating-current power supply 36, the mechanical vibration table 6 and the incubator 8 are in communication connection through the network cable 5, and the electronic load 31, the oscilloscope 32, the power analyzer 33, the direct-current power supply 34, the digital multimeter 35 and the alternating-current power supply 36 are all electrically connected with the circuit device 4 to be tested through a wire 7. It will be appreciated that the configuration information acquisition device 2 may be a keyboard configured on the control device 1.

The working principle of the circuit equipment testing device is as follows:

for the circuit device 4 to be tested, test configuration information needs to be input to the control device 1 by means of the configuration information acquisition device 2 according to the characteristics of the item and the current circuit, and the control device 1 determines a target test item in a target test schedule table and a test case such as a specific type parameter in the target test case table.

After that, external probes of test instruments such as an electronic load 31, an oscilloscope 32, a power analyzer 33, a direct current power supply 34, a digital multimeter 35, an alternating current power supply 36, a mechanical vibration table 6, an incubator 8 and the like required by the test are connected to corresponding external interfaces of the circuit device 4 to be tested, and then the network cables 5 and the control device 1 of each instrument are configured.

After the preparation steps are executed, the test program stored in the control equipment 1 is clicked to start running, and in the running process of the program, the setting of a test instrument in communication connection with the control equipment 1 is controlled according to the target test schedule table and the target test case table, so that the automatic test process is realized.

In the preparation step, only all the devices involved in the test may be connected to the circuit device testing apparatus, or all the devices involved in various testing items that may be involved in the circuit board to be tested may be connected to the circuit device testing apparatus, and then the switches of all the devices involved in the test may be turned on, and the switches of the other devices may be turned off.

Fig. 3 is a schematic structural diagram of a circuit device testing apparatus for hardware white box test verification provided in an embodiment of the present invention, and the circuit device testing apparatus can be used for white box testing of a circuit device 4 to be tested. As shown in fig. 3, the circuit device testing apparatus includes a control device 1, a configuration information acquisition device 2, an electronic load 31, an oscilloscope 32, a power analyzer 33, a direct current power supply 34, a digital multimeter 35, an alternating current power supply 36, a circuit board to be tested 41, a network cable 5 and an incubator 6, where the control device 1, the electronic load 31, the oscilloscope 32, the power analyzer 33, the direct current power supply 34, the digital multimeter 35, the alternating current power supply 36 and the incubator 6 are in communication connection through the network cable 5, and the electronic load 31, the oscilloscope 32, the power analyzer 33, the direct current power supply 34, the digital multimeter 35 and the alternating current power supply 36 are all electrically connected to the circuit board to be tested 41 through a wire 7. It is understood that the configuration information collecting device 2 may be a keyboard configured on the control device 1.

The working principle of the circuit equipment testing device is as follows:

for the circuit board 41 to be tested, test configuration information needs to be input to the control device 1 by means of the configuration information acquisition device 2 according to the characteristics of the project and the current circuit, and the control device determines the target test project in the target test schedule table and the test cases such as specific type parameters in the target test case table.

After that, external probes of instruments such as the electronic load 31, the oscilloscope 32, the power analyzer 33, the direct current power supply 34, the digital multimeter 35, the alternating current power supply 36 and the like required for testing are connected to corresponding test points of the circuit board 41 to be tested, and then the network cable 5 and the control equipment 1 of each instrument are configured.

After the preparation steps are executed, the test program stored in the control device 1 is clicked to start running, and in the program running process, the setting of an instrument in communication connection with the control device 1 is controlled according to the target test schedule table and the target test case table, so that the automatic test process is realized.

It can be understood that, in the above embodiments of the present invention, whether the hardware black box test validation or the hardware white box test validation is performed, the target test schedule adopted by the embodiments is shown in table 1, and the target test schedule includes the table name, the target test item, and the relevant content corresponding to the target test item.

TABLE 1 target test Schedule

The target Test items include a power Test (power Test), which may further include an input overvoltage protection Test (input overvoltage protection Test), an output overvoltage protection Test (output overvoltage protection Test), a Negative Temperature Coefficient Test (Negative Temperature Coefficient Test), an output ripple voltage/noise Test (output ripple voltage & HF noise Test), a sequence Test (sequence) Test, an Overshoot Test (Overshoot Test), an Undershoot Test (undershot Test), a Transient Test (Transient Test), an OTG Test, and a charger Test. The sequence tests may include a CPU Power sequence (CPU _ Power _ sequence) test, a Peripheral Power sequence (Peripheral _ Power _ sequence) test, and a panel Power sequence (panel Power sequence) test. The charger test may include a Power on charging test and a Power off charging test.

The relevant content corresponding to the target test item may include information such as whether the target test item is a stage test item, a test level, test time, progress and result, a test executive party, a main device principal, a test principal, and notes.

The target test case table adopted for hardware black box test verification is shown in table 2, the target test case table includes test cases of each target test item, the test case of each target test item is in a workbook in the target test case table, and each workbook includes related contents of the test case in addition to test exceptions. The current workbook in table 2 records a part of test cases where the target test item is a high-temperature test and a low-temperature test and related contents corresponding to the target test item. Each test case comprises temperature, input conditions, output conditions and a judgment standard, and related contents comprise a project name, testers, test date, report time, a hardware version, a software version, auditors, a comprehensive test result, a test place, a test tool, a test environment, a test standard, a test point, a test method, a judgment standard, test results of each test case and the like.

TABLE 2 target test case Table I

A target test case table adopted for hardware whitebox test verification is shown in table 3, the target test case table includes test cases of each target test item, the test case of each target test item is in a workbook in the target test case table, and each workbook includes related contents of the test case in addition to test exceptions. The current workbook in table 3 records a part of the test cases with the target test item being the I2C signal test and the relevant content corresponding to the target test item. Each test case includes a test item, a test specification (i.e., a decision criterion), test data, a test chart, and a test result. The related content comprises project names, testers, test dates, report time, hardware versions, software versions, auditors, comprehensive test results, test places, test tools, test environments, test points, test methods, judgment standards, test results of all test cases and the like. In addition, the related content may also include description information of the I2C interface performance.

TABLE 3 target test case TABLE II

To sum up, the embodiment of the utility model provides a circuit device testing arrangement has integrateed a plurality of test instruments such as oscilloscope, electronic load, universal meter etc. for test the circuit device that awaits measuring. The device has a customization function, and when the device is used for different circuit devices to be tested or different test types, only a target test schedule and a target test case table need to be determined, so that the device can realize automatic test based on the target test schedule and the target test case table. The control equipment in the device can automatically reserve test data and the like in the test process, reserve the screenshot of the test chart in the target test case table for embodying, and simultaneously can automatically compare the test data with preset conditions and automatically judge whether the test result is PASS or Fail.

The embodiment of the utility model provides an in the circuit equipment testing arrangement that provides, required staff significantly reduces can realize the test automation, and test instrument unification, lightweight, one set of device can satisfy the test demand of a kind of test type that awaits measuring circuit equipment. The device has good consistency of test results, and guarantees the accuracy and reliability of a test method according to a regulating mode set by a program, a specified voltage and current proportioning mode and a test method set by the program.

The target test items of the device can be customized, programs can be modified properly for different circuit devices to be tested, and corresponding target test schedule tables and target test case tables are determined, so that the different circuit devices to be tested can be met, meanwhile, for circuit boards to be tested in the circuit devices to be tested in the white box test, an external probe of the test resource device can be manually welded on a test point of the circuit board to be tested, and the external probe of the test resource device can also be electrically connected with an external clamp matched with the circuit board to be tested.

The test result of the device is output in a table form, so that the test result is visualized, and a worker can directly position a bad signal.

The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.

Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. Based on the understanding, the above technical solutions substantially or otherwise contributing to the prior art may be embodied in the form of a software product, which may be stored in a computer-readable storage medium, such as ROM/RAM, magnetic disk, optical disk, etc., and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the method according to the various embodiments or some parts of the embodiments.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art will understand that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.

Claims

1. A circuit device testing apparatus, comprising: the system comprises a control device, a configuration information acquisition device and a test resource device; the control equipment is in communication connection with the test resource equipment, and the test resource equipment is used for being electrically connected with the circuit equipment to be tested; the configuration information acquisition equipment is connected with the control equipment;

2. The circuit device testing apparatus of claim 1, wherein the test resource device is specifically configured to be electrically connected to an external interface of the circuit device under test.

3. The circuit device testing apparatus of claim 2, further comprising a mechanical vibration table, said mechanical vibration table being communicatively coupled to said control device;

4. The circuit device testing apparatus of claim 1, wherein the circuit device under test comprises a circuit board under test comprising a plurality of test points;

5. The circuit device testing apparatus of claim 4, wherein an external clamp is connected to the plurality of test points;

6. The circuit device testing apparatus of any of claims 1-5, further comprising an incubator communicatively coupled to the control device;

7. The circuit device testing apparatus according to any one of claims 1 to 5, wherein the test results include test item test results and test case test results;

storing the test result of the test item into the target test schedule;

and storing the test result of the test case into the target test case table.

8. The circuit device testing apparatus of any of claims 1-5, wherein the test resource devices comprise power supply devices and test data collection devices;

9. The circuit device testing apparatus of claim 8, wherein the test data acquisition device comprises at least one of an oscilloscope, a power analyzer, and a multimeter;

the power analyzer is used for analyzing a power signal in the test process;

10. The circuit device testing apparatus of any of claims 1-5, wherein the configuration information acquisition device comprises at least one of a mouse, a keyboard, and a touch screen.