CN113701811B - Design automatic test method, platform, storage medium and electronic equipment - Google Patents
Design automatic test method, platform, storage medium and electronic equipment Download PDFInfo
- Publication number
- CN113701811B CN113701811B CN202110969878.6A CN202110969878A CN113701811B CN 113701811 B CN113701811 B CN 113701811B CN 202110969878 A CN202110969878 A CN 202110969878A CN 113701811 B CN113701811 B CN 113701811B
- Authority
- CN
- China
- Prior art keywords
- test
- detected
- component
- test parameters
- parameters
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000013461 design Methods 0.000 title claims abstract description 73
- 238000003860 storage Methods 0.000 title claims abstract description 21
- 238000010998 test method Methods 0.000 title abstract description 13
- 238000012360 testing method Methods 0.000 claims abstract description 358
- 230000002159 abnormal effect Effects 0.000 claims description 68
- 238000000034 method Methods 0.000 claims description 34
- 238000004590 computer program Methods 0.000 claims description 15
- 230000005856 abnormality Effects 0.000 claims description 7
- 230000000007 visual effect Effects 0.000 claims description 7
- 238000012795 verification Methods 0.000 abstract description 8
- 238000012942 design verification Methods 0.000 abstract description 6
- 238000011056 performance test Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 12
- 230000003287 optical effect Effects 0.000 description 10
- 230000008569 process Effects 0.000 description 7
- 238000012545 processing Methods 0.000 description 6
- 230000006870 function Effects 0.000 description 5
- 238000004891 communication Methods 0.000 description 4
- 238000013016 damping Methods 0.000 description 4
- 230000007613 environmental effect Effects 0.000 description 4
- 238000002360 preparation method Methods 0.000 description 4
- 230000009467 reduction Effects 0.000 description 3
- 230000001133 acceleration Effects 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 230000000644 propagated effect Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 230000005236 sound signal Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000013100 final test Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003238 somatosensory effect Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
- G01D21/02—Measuring two or more variables by means not covered by a single other subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P21/00—Testing or calibrating of apparatus or devices covered by the preceding groups
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Emergency Protection Circuit Devices (AREA)
Abstract
The invention discloses a design automatic test method, a platform, a storage medium and electronic equipment, which are used for receiving test condition data and test instructions of a component to be tested, testing various performances of the component to be tested according to the test instructions, generating a test data report comprising various performance test parameters, obtaining the detected components with similar designs stored in a database according to the test condition data of the component to be tested in a polling mode, and comparing and inquiring to determine reasons of the test parameters which do not meet the design requirements. The automatic design test method ensures that the design verification of the product is reasonable and standardized, reduces the unreasonable verification test flow and the occurrence of misleading test data to the greatest extent, and improves the accuracy and the reliability of the design verification.
Description
Technical Field
The invention relates to the technical field of testing, in particular to a design automatic testing method, a platform, a storage medium and electronic equipment.
Background
After the product design is finished, a relatively tight verification test is needed, and the test result is used as a direct basis of the product design, so that the validity and reliability of the product design can be directly judged. That is, design verification must be able to provide extremely accurate test data and provide a basis for the data nature of the product design and direction of design improvement. The existing verification test process is complex, each performance of the product is often required to be verified one by one manually, time and labor are consumed, and meanwhile, the test on a certain performance is easy to be omitted. During the test, the test environment factors, the differences in the test methods, the differences in the hardware and software used for the test, the differences in the manual operation, etc. may all cause great differences in the test results.
Disclosure of Invention
In view of the above, the invention provides a design automatic test method, a platform, a storage medium and an electronic device, which enable design verification to be reasonable and standardized, and improve test efficiency and accuracy and reliability of test verification.
In a first aspect, an embodiment of the present invention provides a method for automatically testing a design, the method including:
receiving test condition data and a test instruction of a component to be detected;
testing various performances of the to-be-detected component according to the test instruction and generating a test data report, wherein the test data report comprises test parameters of the various performances of the to-be-detected component;
and responding to the test parameters not meeting the design requirements, obtaining the detected parts with similar designs according to the test condition data of the parts to be detected in a polling mode, wherein the similar designs are determined according to the similarity between the parts to be detected and the detected parts, and the detected parts are stored in a database.
Further, the method further comprises:
and displaying the test parameters of each performance of the to-be-detected component and the test parameters of each performance of the detected component so as to enable a tester to screen the abnormal test parameters.
Further, the test parameters exhibiting the properties of the part to be inspected and the test parameters of the properties of the inspected part include:
and automatically drawing and forming a visual graph corresponding to each performance according to the test parameters of each performance reported by the test data for display.
Further, the method further comprises:
and displaying all problem factors corresponding to the abnormal test parameters according to the abnormal test parameters so as to enable a tester to determine the accurate reasons of the abnormal test parameters.
Further, the displaying all the problem factors corresponding to the abnormal test parameters according to the abnormal test parameters includes:
displaying all the testing environment factors of the to-be-detected parts so as to enable a tester to check and eliminate testing environment problems;
displaying the test parameters of each performance of the component to be detected and each test parameter of a corresponding manufacturer specification, wherein each test parameter of the manufacturer specification is stored in a database in advance;
and displaying the test parameters of each performance of the component to be detected and the corresponding target test parameters of each performance, wherein the target test parameters are stored in a database.
Further, the method further comprises:
and displaying all test condition data of the to-be-detected component and all test condition data of the detected component, wherein the test condition data comprises software script codes.
Further, the method further comprises:
and storing a test data report of the component to be detected and an accurate reason of the abnormal test parameter.
Further, the method further comprises:
and displaying the related knowledge of the part to be detected for a tester to determine the reason of the abnormal test parameter, wherein the related knowledge is stored in a database in advance.
Further, the part to be tested comprises a name and an identification, and the test condition data comprises design requirements, limiting conditions, a test environment, hardware equipment and software used for testing.
In a second aspect, an embodiment of the present invention further provides a design automation test platform, the platform including:
a receiving data unit configured to receive test condition data and a test instruction of a component to be detected;
a test unit configured to test each performance of a component to be tested according to the test instruction and generate a test data report, the test data report including test parameters of each performance of the component to be tested;
and the data comparison unit is configured to respond to the fact that the test parameters do not meet the design requirements, obtain the detected parts with similar designs according to the test condition data of the parts to be detected in a polling mode, wherein the similar designs are determined according to the similarity between the parts to be detected and the detected parts, and the detected parts are stored in a database.
Further, the platform further comprises:
and the display unit is configured to display the test parameters of the various performances of the to-be-detected component and the test parameters of the various performances of the detected component so as to enable a tester to screen the abnormal test parameters.
Further, the display unit includes:
and the graphic display module is configured to automatically draw and form a visual graphic corresponding to each performance according to the test parameters of each performance reported by the test data for display.
Further, the platform further comprises:
and the abnormal parameter determining unit is configured to display all problem factors corresponding to the abnormal test parameters according to the abnormal test parameters so as to enable a tester to determine the accurate reasons of the abnormal test parameters.
Further, the abnormality parameter determination unit includes:
the environment factor display module is configured to display all the testing environment factors of the to-be-detected parts so as to enable a tester to check and eliminate testing environment problems;
the manufacturer specification test parameter comparison display module is configured to display the test parameters of each performance of the component to be detected and each test parameter of a corresponding manufacturer specification, and each test parameter of the manufacturer specification is stored in a database in advance;
the target test parameter comparison display module is configured to display the test parameters of each performance of the component to be detected and the corresponding target test parameters of each performance, and the target test parameters are stored in the database.
Further, the platform further comprises:
and a test condition data display unit configured to display all test condition data of the component to be tested and all test condition data of the tested component, the test condition data including software script code.
Further, the platform further comprises:
and the storage unit is configured to store a test data report of the component to be detected and an accurate reason of the abnormal test parameter.
Further, the platform further comprises:
and the knowledge expansion unit is configured to display the related knowledge of the part to be detected so as to enable a tester to determine the reason of the abnormal test parameter, wherein the related knowledge is stored in a database in advance.
Further, the part to be tested comprises a name and an identification, and the test condition data comprises design requirements, limiting conditions, a test environment, hardware equipment and software used for testing.
In a third aspect, embodiments of the present invention also provide a computer readable storage medium having stored thereon computer program instructions which, when executed by a processor, implement the method according to the first aspect.
In a fourth aspect, embodiments of the present invention also provide an electronic device comprising a memory and a processor, the memory storing one or more computer program instructions, wherein the one or more computer program instructions are executed by the processor to implement the method as described in the first aspect
The embodiment of the invention provides a design automatic test method, a platform, a storage medium and electronic equipment, which are used for receiving test condition data and test instructions of a component to be tested, testing various performances of the component to be tested according to the test instructions, generating a test data report comprising various performance test parameters, obtaining the detected components with similar designs stored in a database according to the test condition data of the component to be tested in a polling mode for comparing and inquiring to determine reasons of the test parameters which do not meet the design requirements, wherein the test parameters do not meet the design requirements. The automatic design test method ensures that the design verification of the product is reasonable and standardized, reduces the unreasonable verification test flow and the occurrence of misleading test data to the greatest extent, and improves the accuracy and the reliability of the design verification.
Drawings
The above and other objects, features and advantages of the present invention will become more apparent from the following description of embodiments of the present invention with reference to the accompanying drawings, in which:
FIG. 1 is a flow chart of a design automatic test method according to an embodiment of the present invention;
FIG. 2 is a flow chart of a design automatic test method according to an embodiment of the present invention;
FIG. 3 is a flowchart showing all problem factors corresponding to abnormal test parameters according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of an automated test platform according to another embodiment of the present invention;
FIG. 5 is a schematic diagram of an abnormality parameter determination unit according to another embodiment of the present invention;
fig. 6 is a schematic structural diagram of an electronic device according to another embodiment of the present invention.
Detailed Description
The present invention is described below based on examples, but the present invention is not limited to only these examples. In the following detailed description of the present invention, certain specific details are set forth in detail. The present invention will be fully understood by those skilled in the art without the details described herein. Well-known methods, procedures, flows, components and circuits have not been described in detail so as not to obscure the nature of the invention.
Moreover, those of ordinary skill in the art will appreciate that the drawings are provided herein for illustrative purposes and that the drawings are not necessarily drawn to scale.
Unless the context clearly requires otherwise, the words "comprise," "comprising," and the like in the description are to be construed in an inclusive sense as opposed to an exclusive or exhaustive sense; that is, it is the meaning of "including but not limited to".
In the description of the present invention, it should be understood that the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. Furthermore, in the description of the present invention, unless otherwise indicated, the meaning of "a plurality" is two or more.
Unless specifically stated or limited otherwise, the terms "mounted," "connected," "secured" and the like should be construed broadly, as they may be fixed, removable, or integral, for example; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
Fig. 1 is a flowchart of a design automatic test method according to the present embodiment. As shown in fig. 1, the design automatic test method for the part to be tested includes the following steps:
step S100, test condition data and test instructions of the to-be-detected component are received.
Before the platform tests the component to be tested, the platform needs to receive and store test condition data of the component to be tested so as to build early preparation works such as corresponding environment conditions, limiting conditions, hardware preparation works, software script code preparation works and the like for test verification. The test condition data comprises design requirements for designing the part to be tested, limiting conditions, a test environment, hardware equipment and software used for testing. The hardware devices used for testing include electronic devices, test devices, device wiring, and the like. Software refers to the requirements of the software version used in the test as well as the requirements of the software script code.
Taking the following three examples as examples, the tester is facilitated to understand the test condition data.
Example 1 a battery protection system was tested. The design requirements of the battery protection system comprise overvoltage protection, undervoltage protection, overcurrent protection, low-temperature protection, high-temperature protection and the like of the battery. The constraints include that the peripheral oscilloscope or communication data lines, etc., are inaccessible to the circuitry, which would otherwise alter the operating characteristics of the circuitry. The hardware devices used for testing comprise batteries, uninterruptible power supplies, electronic loads, temperature boxes, digital multimeters (DMM), thermocouples and the like of different manufacturers. The software used for the test can be python, C language, terminal and the like, and can be specifically selected for use according to actual conditions.
Example 2, collection of performance data for each of the accelerometers. Each item of performance data comprises acceleration average values, maximum values, minimum values and discrete deviation values in different directions of x/y/z. Design requirements include collecting acceleration data in different directions to confirm proper functioning of the accelerometer, and functional stability of the accelerometer and gyroscope, independent of external operating conditions. The limiting conditions include testing under different load currents, the absolute stability of the part to be detected needs to be maintained, and external vibration interference cannot be caused. The hardware equipment used for the test comprises a damping platform, a noise reduction room, a power supply, an electronic load and a UART protocol communication data line. The software used for the test can be python, C language, terminal and the like, and can be specifically selected for use according to actual conditions. Suggested test environment: under constant temperature and humidity conditions, signals pass through coaxial lines and the like.
Example 3, optical sensor and audio signal coupling verification. Design requirements: detecting whether the data of the optical sensor has abnormal interference from the outside, especially the high-frequency signal radiation such as audio on the same product. The limitation condition is that the optical sensor needs to avoid optical interference such as external infrared rays in a dark light environment, and the test needs to be verified under the condition that the audio modules work simultaneously. The hardware equipment used for testing comprises a communication data module, an optical sensor, an audio module and a computer. The software used for the test can be python, C language, terminal and the like, and can be specifically selected for use according to actual conditions. Suggested test environment: a dim light environment, a constant temperature and humidity environment, and an audio working environment (different audio playing frequency settings).
After the early-stage preparation work for completing the test is built, the platform receives a test instruction which is input by a user and starts the test, and the platform tests various performances of the component to be tested according to the test instruction.
And step 200, testing various performances of the component to be tested according to the test instruction and generating a test data report. The test data report includes test parameters for various properties of the component to be tested.
And when the platform receives the test instruction, starting to test various performances of the component to be detected. In the testing process, the final testing parameters of all the testing items are generated into a testing data report for a tester to judge whether the testing parameters of all the performances of the to-be-tested component meet the design requirements.
And step S300, responding to the test parameters not meeting the design requirements, and obtaining the detected components with similar designs according to the test condition data of the components to be detected in a polling mode.
After the platform is tested to generate a test data report, a tester determines whether all test parameters of the to-be-tested component meet the design requirements according to the test data report of the to-be-tested component and the design requirements, and the tester inputs the judging result into the platform. When one or more test parameters of the to-be-detected component do not meet the design requirements, the platform can query and acquire the detected component with similar design with the to-be-detected component in the database according to the test condition data of the to-be-detected component. Wherein the similarity design is determined according to the similarity of the part to be detected and the detected part, and the detected part is stored in a database. The similarity refers to the similarity of keywords such as design purposes, names and the like.
The similar design refers to the same or similar design purpose and name of the detected component and the design purpose and name of the component to be detected. In addition, before the test, the components to be detected can also store corresponding keywords, and the detected components in the database store the corresponding keywords. The keywords are used for representing the structure, the function and the like of the part to be detected. When the detected parts with similar designs are obtained, the detected parts with similar designs can also be obtained by comparing the keywords stored in the detected parts. Meanwhile, the platform can sequentially compare the part to be detected with the detected parts in the database according to a polling mode to obtain the detected parts with similar designs.
Step 400, displaying the test parameters of each performance of the component to be detected and the test parameters of each performance of the detected component, so that a tester can screen the abnormal test parameters.
After the detected components with similar designs are obtained, the platform displays the test parameters of each performance of the component to be detected and the test parameters of each performance of the detected component in a comparison mode, so that a tester can conveniently screen out abnormal test parameters in the component to be detected. Specifically, the display of the test parameters can be performed by automatically drawing and forming a visual graph corresponding to each performance according to the test parameters of each performance reported by the test data. The individual abnormal test parameters can be rapidly screened and processed through the visual graphic display.
And step 500, displaying all problem factors corresponding to the abnormal test parameters according to the abnormal test parameters so as to enable a tester to determine the accurate reasons of the abnormal test parameters.
After determining the abnormal test parameters in step S400, all possible problem factors that cause the abnormality of the test parameters are displayed, so that a tester can determine each problem factor, thereby determining the exact cause of the abnormality test parameters. When the accurate reason is found, the tester can be convenient to optimize and improve the part to be detected.
Wherein, when all problem factors of the abnormal test parameters are displayed, the following three aspects can be displayed in turn. As shown in fig. 3, the displaying, according to the abnormal test parameter, all the problem factors corresponding to the abnormal test parameter includes:
step S501, displaying all the testing environment factors of the to-be-tested components for the tester to check and eliminate the testing environment problems.
Subtle differences in test environment may cause differences in test parameters. Therefore, when judging the possible problems of the abnormal test parameters, all the test environment factors of the to-be-detected component can be displayed and compared with the test environment factors of the detected component with similar design, so that a tester can check and eliminate the test environment problems conveniently. The test environment factors are different for different kinds of components to be tested. The test environment factors of different components to be tested are presented by the following two examples.
Example 1 a battery protection system was tested. Test environment factors include, but are not limited to: the incubator sets a temperature profile and the battery and application module cannot be grounded together, the maximum current of the power supply being limited.
Example 2, collection of performance data for each of the accelerometers. Test environment factors include, but are not limited to: whether the damping performance of the damping table is qualified or not; whether the screw configuration of the damping table is qualified or not; whether the noise reduction effect of the noise reduction chamber is qualified or not; whether the electronic load is checked; whether coaxial wires and twisted pair wires are used between the electronic load and the signal to be tested or not is used for reducing noise radiation; whether the ground loop of the static wire is normal.
Example 3, optical sensor and audio signal coupling verification. Test environment factors include, but are not limited to: testing whether the environment has interference of external light sources; whether the audio is operating at the desired frequency; whether the optical sensor is shielded by a real object; whether or not to be in a constant temperature and humidity environment.
Step S502, displaying the test parameters of each performance of the component to be detected and each test parameter of a corresponding manufacturer specification, wherein each test parameter of the manufacturer specification is stored in a database in advance.
When each part to be detected is produced and sold, the corresponding manufacturer specification is standardized and placed into the package of the part to be sold for reference by a purchaser. The manufacturer specifications include technical parameters of the various properties of the component, etc. After the production of each part to be detected is finished, storing the corresponding manufacturer specification into a database of the platform. The identity of the part to be tested is stored in each vendor specification. Before the component to be detected is detected, the identification of the component to be detected is included in the test condition data of the component to be detected, which is received by the platform. When the test parameters of the to-be-detected component are abnormal, the manufacturer specification corresponding to the to-be-detected component can be found through identification, and the test parameters of the currently detected performances of the to-be-detected component are displayed and compared with the test parameters of the performances in the manufacturer specification, so that a tester can conveniently inquire the difference between the test parameters of the currently detected performances of the to-be-detected component and the test parameters of the performances in the manufacturer specification, and whether the performances are abnormal or not can be determined.
Example 1, platform display alignment of vendor Specification for Battery protection System
The manufacturer specification has reference value ranges corresponding to different performances, taking the under-voltage protection value of the battery protection system as an example. The platform displays the voltage parameter of the part to be detected in the protection state and the under-voltage protection value corresponding to the battery in the manufacturer specification, and is used for the tester to compare the voltage in actual use so as to adjust the under-voltage protection value in the manufacturer specification. For example, manufacturer specifications show that the voltage of the battery is lower than 2.7V, the battery protection system enters a protection state, the voltage of the battery is over-voltage by 4.2V, the battery protection system enters a protection state, and the battery protection system enters a protection state below 0 ℃ or above 65 ℃.
Example 2 platform display alignment of vendor Specification for accelerometers
The platform displays the upper limit and the lower limit of the data on the three axes of the X/Y/Z of the part to be detected, and simultaneously displays the upper limit and the lower limit of the data on the three axes of the X/Y/Z corresponding to the specification of a factory in a comparison mode, so that a tester can conveniently and quickly judge whether the upper limit and the lower limit of the data on the three direction axes of the part to be detected meet the regulations.
Step S503, displaying the test parameters of each performance of the component to be detected and the corresponding target test parameters of each performance, where the target test parameters are stored in a database.
Only a few parameters of a specific performance of the component to be tested are generally specified in the manufacturer's specification for reference by the user, and do not include parameters of all the performances of the component to be tested. These performance parameters, which are not represented in the manufacturer specifications, need to be stored in a database, i.e. target test parameters, prior to testing the component to be tested. When the test parameters of the to-be-detected component are abnormal, the target test parameters corresponding to the to-be-detected component can be found and displayed through identification, so that a tester can further inquire the difference between the test parameters of various performances actually detected by the current to-be-detected component and the target test parameters, and further determine how to improve the to-be-detected component.
Step S600, all test condition data of the to-be-detected parts and all test condition data of the detected parts are displayed, wherein the test condition data comprise software script codes.
In the process of determining the accurate cause of the occurrence of the abnormal test parameters, the embodiment may display all the test condition data of the component to be tested and all the test condition data of the tested component of similar design, so as to determine whether there is a difference between the test condition data of the component to be tested and the test condition data of the tested component of similar design, and whether the difference is the cause of the occurrence of the abnormal test parameters. The tester can test the component to be tested again after adjusting the test condition data with the difference so as to determine whether the difference is the accurate cause of the abnormal test parameters. Wherein the test condition data includes software script code. Differences in software script code are prone to the generation of abnormal test parameters. Therefore, in determining the cause, it is necessary to expose the software script code of the component to be detected, thereby determining whether the software script code is the cause of the abnormal test parameter. In some embodiments, the platform recommends the existing similar software script code for the tester to use as a reference according to the part to be detected, and is used for judging whether the software script code of the part to be detected has a difference. Similar software script code may be various types of software script code that are already in the vendor specification.
And step S700, storing a test data report of the component to be detected and an accurate reason of the abnormal test parameter.
After the to-be-detected component is tested, when no abnormality occurs in the test parameters of each performance in the test data report, the platform can directly package and store the test data report into a database, and update the database. The part to be detected without abnormal test parameters can be used as a successful case for providing an improved method for the subsequent detection of abnormal parts.
When abnormal parameters appear in the test parameters of each performance in the test data report, the platform analyzes the steps to obtain the reasons for the abnormal test and solves the reasons. The platform may then store and update the part to be tested as a failure case. In the storage process, the specific problem reasons and the solving methods of the abnormal test parameters can be stored in the database in a packaged mode for updating, so that the improved methods can be recommended to subsequent testers.
Step S800, displaying the related knowledge of the part to be detected, so that a tester can determine the reason of the abnormal test parameter, and the related knowledge is stored in a database in advance.
Relevant knowledge of the part to be detected is prestored in a database of the platform, and the relevant knowledge comprises principles, structures, roles, relevant success cases, failure cases and the like. After the test of the part to be detected is completed, the platform can also display the relevant expertise of the part to be detected, including principles, structures, actions, success cases, failure cases and the like. The testers can learn and consolidate through the displayed related knowledge, and can also be used for giving optimized design comments or reference cases to the to-be-detected components with abnormal test parameters.
FIG. 4 is a schematic diagram of an automated test platform according to another embodiment. The automatic design test platform of the present embodiment corresponds to the automatic design test method of the above embodiment one by one. As shown in fig. 4, the design automation test platform includes a reception data unit 10, a test unit 20, a data comparison unit 30, a display unit 40, an abnormal parameter determination module 50, a test condition data display unit 60, a storage unit 70, and a knowledge expansion unit 80.
Wherein the reception data unit 10 is configured to receive test condition data and test instructions of the component to be tested. The test unit 20 is configured to test the properties of the component to be tested according to the test instructions and to generate a test data report comprising test parameters of the properties of the component to be tested. The data comparison unit 30 is configured to obtain, in response to the test parameter not meeting a design requirement, a detected component of a similar design according to the test condition data of the component to be detected in a polling manner, where the similar design is determined according to the similarity between the component to be detected and the detected component, and the detected component is stored in a database. The display unit 40 is configured to display the test parameters of the performances of the component to be detected and the test parameters of the performances of the detected component for a tester to screen the abnormal test parameters. The abnormal parameter determination module 50 is configured to display all problem factors corresponding to the abnormal test parameters according to the abnormal test parameters, so that a tester can determine the accurate reasons of the abnormal test parameters. The test condition data presentation unit 60 is configured to present all test condition data of the component to be tested and all test condition data of the tested component, the test condition data comprising software script code. The storage unit 70 is configured to store a report of test data of the component to be tested and an accurate cause of the abnormal test parameter. The knowledge expansion unit 80 is configured to display relevant knowledge of the component to be detected for a tester to determine the cause of the abnormal test parameter, the relevant knowledge being pre-stored in a database.
The display unit 40 includes a graphic display module 41, where the graphic display module 41 is configured to automatically draw and form a visual graphic corresponding to each performance according to the test parameters of each performance reported by the test data for display. Fig. 5 is a schematic diagram of the abnormality parameter determination unit. As shown in fig. 5, the abnormal parameter determining unit 50 includes an environmental factor display module 51, a vendor specification test parameter comparison display module 52, and a target test parameter comparison display module 53. The environmental factor display module 51 is configured to display all the testing environmental factors of the to-be-tested components for the tester to check and eliminate the testing environmental problems. The vendor specification test parameter comparison display module 52 is configured to display the test parameters of the performances of the component to be detected and the corresponding test parameters of a vendor specification, which are pre-stored in a database. The target test parameter comparison display module 53 is configured to display the test parameters of each performance of the component to be detected and the corresponding target test parameters of each performance, where the target test parameters are stored in a database. The to-be-detected component comprises a name and an identification, and the test condition data comprises design requirements, limiting conditions, a test environment, hardware equipment and software used for testing.
Fig. 6 is a schematic diagram of an electronic device according to a further embodiment of the invention. The electronic device shown in fig. 6 is a general-purpose data processing apparatus comprising a general-purpose computer hardware structure including at least a processor 71 and a memory 72. The processor 71 and the memory 72 are connected by a bus 73. The memory 72 is adapted to store instructions or programs executable by the processor 71. The processor 71 may be a separate microprocessor or a collection of one or more microprocessors. Thus, the processor 71 performs the process flow of the embodiment of the present invention described above to realize the processing of data and the control of other devices by executing the instructions stored in the memory 72. Bus 73 connects the above components together, as well as to display controller 74 and display devices and input/output (I/O) devices 75. Input/output (I/O) devices 75 may be a mouse, keyboard, modem, network interface, touch input device, somatosensory input device, printer, and other devices known in the art. Typically, an input/output device 75 is connected to the system through an input/output (I/O) controller 76. Preferably, the electronic device of the present embodiment is a server.
Meanwhile, as will be appreciated by those skilled in the art, aspects of embodiments of the present invention may be implemented as a system, method, or computer program product. Accordingly, aspects of embodiments of the invention may take the form of: an entirely hardware embodiment, an entirely software embodiment (including firmware, resident software, micro-code, etc.) or an embodiment combining software and hardware aspects that may all generally be referred to herein as a "circuit," module "or" system. Furthermore, aspects of the invention may take the form: a computer program product embodied in one or more computer-readable media having computer-readable program code embodied thereon.
Any combination of one or more computer readable media may be utilized. The computer readable medium may be a computer readable signal medium or a computer readable storage medium. The computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of the computer-readable storage medium would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the context of embodiments of the present invention, a computer-readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
The computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, such as in baseband or as part of a carrier wave. Such a propagated signal may take any of a variety of forms, including, but not limited to: electromagnetic, optical, or any suitable combination thereof. The computer readable signal medium may be any of the following: a computer-readable storage medium is not a computer-readable storage medium and can communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device.
Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.
Computer program code for carrying out operations for aspects of the present invention may be written in any combination of one or more programming languages, including: object oriented programming languages such as Java, smalltalk, C ++, etc.; and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package; executing partly on the user computer and partly on the remote computer; or entirely on a remote computer or server. In the latter scenario, the remote computer may be linked to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider).
The above-described flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the invention describe various aspects of the invention. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions/acts specified in the flowchart and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable medium that can direct a computer, other programmable data processing apparatus, or other devices to function in a particular manner, such that the instructions stored in the computer-readable medium produce an article of manufacture including instructions which implement the function/act specified in the flowchart and/or block diagram block or blocks.
The computer program instructions may also be loaded onto a computer, other programmable data processing apparatus, or other devices to cause a series of operational steps to be performed on the computer, other programmable apparatus or other devices to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide processes for implementing the functions/acts specified in the flowchart and/or block diagram block or blocks.
The above description is only of the preferred embodiments of the present invention and is not intended to limit the present invention, and various modifications and variations may be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (14)
1. A method of automatic testing of a design, the method comprising:
receiving test condition data and a test instruction of a component to be detected;
testing various performances of the to-be-detected component according to the test instruction and generating a test data report, wherein the test data report comprises test parameters of the various performances of the to-be-detected component;
responding to the test parameters not meeting the design requirements, obtaining a detected part with similar design according to the test condition data of the part to be detected in a polling mode, wherein the similar design is determined according to the similarity between the part to be detected and the detected part, and the detected part is stored in a database;
displaying the test parameters of each performance of the to-be-detected component and the test parameters of each performance of the detected component so as to enable a tester to screen abnormal test parameters;
displaying all test condition data of the to-be-detected component and all test condition data of the detected component, wherein the test condition data comprises software script codes;
and displaying the related knowledge of the part to be detected for a tester to determine the reason of the abnormal test parameter, wherein the related knowledge is stored in a database in advance.
2. The method of claim 1, wherein the presenting test parameters of the properties of the part to be inspected and test parameters of the properties of the inspected part comprises:
and automatically drawing and forming a visual graph corresponding to each performance according to the test parameters of each performance reported by the test data for display.
3. The method according to claim 1, wherein the method further comprises:
and displaying all problem factors corresponding to the abnormal test parameters according to the abnormal test parameters so as to enable a tester to determine the accurate reasons of the abnormal test parameters.
4. A method according to claim 3, wherein said displaying all problem factors corresponding to said abnormal test parameters according to said abnormal test parameters comprises:
displaying all the testing environment factors of the to-be-detected parts so as to enable a tester to check and eliminate testing environment problems;
displaying the test parameters of each performance of the component to be detected and each test parameter of a corresponding manufacturer specification, wherein each test parameter of the manufacturer specification is stored in a database in advance;
and displaying the test parameters of each performance of the component to be detected and the corresponding target test parameters of each performance, wherein the target test parameters are stored in a database.
5. A method according to claim 3, characterized in that the method further comprises:
and storing a test data report of the component to be detected and an accurate reason of the abnormal test parameter.
6. The method of claim 1, wherein the part to be tested includes a name and an identification, and the test condition data includes design requirements, constraints, test environments, hardware devices used for testing, and software.
7. A design automation test platform, the platform comprising:
a receiving data unit configured to receive test condition data and a test instruction of a component to be detected;
a test unit configured to test each performance of a component to be tested according to the test instruction and generate a test data report, the test data report including test parameters of each performance of the component to be tested;
the data comparison unit is configured to respond to the fact that the test parameters do not meet the design requirements, obtain a detected part with similar design according to the test condition data of the part to be detected in a polling mode, wherein the similar design is determined according to the similarity between the part to be detected and the detected part, and the detected part is stored in a database;
the display unit is configured to display the test parameters of each performance of the to-be-detected component and the test parameters of each performance of the detected component so as to enable a tester to screen out abnormal test parameters;
a test condition data display unit configured to display all test condition data of the component to be detected and all test condition data of the detected component, the test condition data including software script code;
and the knowledge expansion unit is configured to display the related knowledge of the part to be detected so as to enable a tester to determine the reason of the abnormal test parameter, wherein the related knowledge is stored in a database in advance.
8. The platform of claim 7, wherein the display unit comprises:
and the graphic display module is configured to automatically draw and form a visual graphic corresponding to each performance according to the test parameters of each performance reported by the test data for display.
9. The platform of claim 7, further comprising:
and the abnormal parameter determining unit is configured to display all problem factors corresponding to the abnormal test parameters according to the abnormal test parameters so as to enable a tester to determine the accurate reasons of the abnormal test parameters.
10. The platform according to claim 9, wherein the abnormality parameter determination unit includes:
the environment factor display module is configured to display all the testing environment factors of the to-be-detected parts so as to enable a tester to check and eliminate testing environment problems;
the manufacturer specification test parameter comparison display module is configured to display the test parameters of each performance of the component to be detected and each test parameter of a corresponding manufacturer specification, and each test parameter of the manufacturer specification is stored in a database in advance;
the target test parameter comparison display module is configured to display the test parameters of each performance of the component to be detected and the corresponding target test parameters of each performance, and the target test parameters are stored in the database.
11. The platform of claim 9, further comprising:
and the storage unit is configured to store a test data report of the component to be detected and an accurate reason of the abnormal test parameter.
12. The platform of claim 7, wherein the part to be tested includes a name and an identification, and the test condition data includes design requirements, constraints, test environments, hardware devices used for testing, and software.
13. A computer readable storage medium, on which computer program instructions are stored, which computer program instructions, when executed by a processor, implement the method of any of claims 1-6.
14. An electronic device comprising a memory and a processor, wherein the memory is configured to store one or more computer program instructions, wherein the one or more computer program instructions are executed by the processor to implement the method of any of claims 1-6.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110969878.6A CN113701811B (en) | 2021-08-23 | 2021-08-23 | Design automatic test method, platform, storage medium and electronic equipment |
| TW110139497A TWI797795B (en) | 2021-08-23 | 2021-10-25 | A design automatic test method, platform, storage medium and electronic equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110969878.6A CN113701811B (en) | 2021-08-23 | 2021-08-23 | Design automatic test method, platform, storage medium and electronic equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113701811A CN113701811A (en) | 2021-11-26 |
| CN113701811B true CN113701811B (en) | 2024-03-15 |
Family
ID=78654200
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110969878.6A Active CN113701811B (en) | 2021-08-23 | 2021-08-23 | Design automatic test method, platform, storage medium and electronic equipment |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN113701811B (en) |
| TW (1) | TWI797795B (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103135014A (en) * | 2012-12-14 | 2013-06-05 | 西安电子科技大学 | Transformer fault diagnosis method based on case-based reasoning |
| WO2016095554A1 (en) * | 2014-12-19 | 2016-06-23 | 广州博冠信息科技有限公司 | Test method, device and system for application |
| CN108333547A (en) * | 2017-01-18 | 2018-07-27 | 中国电力科学研究院 | A kind of distribution line failure indicator automatic checkout system and method |
| CN112612666A (en) * | 2020-12-29 | 2021-04-06 | 上海法雷奥汽车电器系统有限公司 | Test control method and device, computer equipment and readable storage medium |
| WO2021082484A1 (en) * | 2019-11-01 | 2021-05-06 | 平安科技（深圳）有限公司 | Awr report automatic acquisition method and apparatus, electronic device, and storage medium |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6381409B2 (en) * | 2014-10-30 | 2018-08-29 | ルネサスエレクトロニクス株式会社 | Failure diagnosis system, failure diagnosis method and failure diagnosis program |
| US10101388B2 (en) * | 2015-12-15 | 2018-10-16 | International Business Machines Corporation | Method for enhanced semiconductor product diagnostic fail signature detection |
-
2021
- 2021-08-23 CN CN202110969878.6A patent/CN113701811B/en active Active
- 2021-10-25 TW TW110139497A patent/TWI797795B/en active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103135014A (en) * | 2012-12-14 | 2013-06-05 | 西安电子科技大学 | Transformer fault diagnosis method based on case-based reasoning |
| WO2016095554A1 (en) * | 2014-12-19 | 2016-06-23 | 广州博冠信息科技有限公司 | Test method, device and system for application |
| CN108333547A (en) * | 2017-01-18 | 2018-07-27 | 中国电力科学研究院 | A kind of distribution line failure indicator automatic checkout system and method |
| WO2021082484A1 (en) * | 2019-11-01 | 2021-05-06 | 平安科技（深圳）有限公司 | Awr report automatic acquisition method and apparatus, electronic device, and storage medium |
| CN112612666A (en) * | 2020-12-29 | 2021-04-06 | 上海法雷奥汽车电器系统有限公司 | Test control method and device, computer equipment and readable storage medium |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113701811A (en) | 2021-11-26 |
| TWI797795B (en) | 2023-04-01 |
| TW202208866A (en) | 2022-03-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100429116B1 (en) | System and method for automatically analyzing and managing loss factors in test process of semiconductor Integrated Circuit devices | |
| CN107462821B (en) | Remote monitoring method and system for wafer test machine | |
| CN220729314U (en) | Detection system of batch detection sensor for automatically identifying equipment information | |
| CN108414860B (en) | Performance detection method and device of high-frequency cable and readable storage medium | |
| US8005638B1 (en) | Distributed test system and method | |
| CN108319516B (en) | Test system and test method | |
| CN113701811B (en) | Design automatic test method, platform, storage medium and electronic equipment | |
| EP3767888A1 (en) | A method, a diagnosing system and a computer program product for diagnosing a fieldbus type network | |
| CN113656392A (en) | Tightening data management method and device and computer-readable storage medium | |
| CN218788073U (en) | Circuit equipment testing device | |
| CN112129337A (en) | Detection system for detecting sensors in batches based on Internet of things | |
| CN117007175A (en) | Sensor automatic test method and test device thereof | |
| CN115792583A (en) | Test method, device, equipment and medium for vehicle gauge chip | |
| CN109960238B (en) | Automatic test system and method for vehicle diagnostic instrument | |
| KR100682183B1 (en) | Testing device and wave form display device | |
| CN108760285A (en) | A kind of solenoid valve on-line detecting system and method | |
| KR102288798B1 (en) | testing simulator for charging apparatus of electric vehicle | |
| KR100636404B1 (en) | Method and System for Testing by Using Automatic Control Program | |
| CN113671348A (en) | Circuit board testing method, device, equipment, system and storage medium | |
| CN110967615B (en) | Circuit board fault diagnosis device and method | |
| KR102534971B1 (en) | System and method for testing flow computer | |
| CN113640026B (en) | Industrial equipment testing method, device and system | |
| CN114826985B (en) | Communication protocol testing method, device, upper computer and testing system | |
| CN112214403B (en) | Automatic test method, device and system based on protection device model file | |
| US20240242163A1 (en) | Information processing method, information processing apparatus, and non-transitory computer readable recording medium |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |