CN110749812A - Automatic testing method, system and device for hardware circuit - Google Patents
Automatic testing method, system and device for hardware circuit Download PDFInfo
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- CN110749812A CN110749812A CN201810816332.5A CN201810816332A CN110749812A CN 110749812 A CN110749812 A CN 110749812A CN 201810816332 A CN201810816332 A CN 201810816332A CN 110749812 A CN110749812 A CN 110749812A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
Abstract
The invention discloses an automatic test method, a system and a device of a hardware circuit, wherein the automatic test method comprises the following steps: s1: acquiring all test signals and constructing a test control table; s2: controlling an oscilloscope probe arranged on the mechanical arm to move to a test point according to a test control table so as to enable the oscilloscope probe to be in contact with the test point of the circuit to be tested; s3: based on a test control table, controlling the oscilloscope to test the test signal of the test point to acquire test data; s4: storing the test data, and judging the test data to obtain a judgment result; s5: judging whether an untested test signal exists in the test control table or not based on the test point; if yes, repeating the steps S2 to S5 to test the untested test signal; if not, go to step S6; s6: and generating a total test result table according to the test data and the judgment result of each test signal, and ending the test.
Description
Technical Field
The present invention relates to the field of communications technologies, and in particular, to an automated testing method, system, and apparatus for a hardware circuit.
Background
Currently, the testing of newly developed hardware circuits roughly includes: signal Integrity (SI), Power Integrity (PI), etc. test contents, such as:
the chinese patent application No. CN201610938931.5 discloses a method and an apparatus for testing power integrity, the method includes: presetting a pull-load voltage, and presetting that the output end of a tested circuit does not load a load; controlling the power-on of the tested circuit under the first state that the output end of the tested circuit is not loaded with a load; in a first state, monitoring whether a first output voltage output by an output end of a tested circuit is larger than or equal to the pull-load voltage in real time; if yes, loading a target load at the output end of the tested circuit; and monitoring the first output voltage output by the output end of the tested circuit in real time under the second state that the target load is loaded on the output end of the tested circuit. The object of the present patent is to provide a method for power integrity testing (PI) to reduce the failure rate of the circuit under test.
However, the following problems exist in the processes of performing SI test and PI test on the hardware circuit at present:
1. for the test of the hardware circuit, basically, the tester holds the oscilloscope probe to contact the test point, generally, the newly developed hardware circuit has a plurality of test signals, the test point is smaller, the operation is very inconvenient, and the working hour consumed for completing the test is longer;
2. the testing of most hardware circuits can be completed only by the cooperative operation of at least two testing personnel, namely one person searches the test points and stores the test data, and the other person ensures that the oscilloscope probes are contacted with the test points, so that the labor cost required by the testing is higher;
3. the recorded test data needs to be manually processed, the data processing amount is large, and manpower and material resources are consumed.
Disclosure of Invention
Aiming at the problems, the invention discloses an automatic test method of a hardware circuit, which comprises the following steps:
s1: acquiring all test signals and constructing a test control table;
s2: controlling an oscilloscope probe arranged on the mechanical arm to move to a test point according to the test control table so as to enable the oscilloscope probe to be in contact with the test point of the circuit to be tested;
s3: controlling the oscilloscope to test the test signal of the test point based on the test control table to obtain test data;
s4: storing the test data, and judging the test data to obtain a judgment result;
s5: judging whether the untested test signal exists in the test control table or not based on the test point; if yes, repeating the steps S2 to S5 to test the untested test signal; if not, go to step S6;
s6: and generating a total test result table according to the test data and the judgment result of each test signal, and ending the test.
Further, the step S1 includes:
s11: making a test control table structure containing test signals, test conditions, test indexes and decision rules;
s12: acquiring the test signal, and acquiring the test point coordinate, the test condition, the test index and the judgment rule of the test signal;
s13: and writing the test signal, the test point coordinate, the test condition, the test index and the judgment rule into the test control table to construct the test control table.
Further, the test conditions include trigger conditions, amplitude, frequency, period, duty ratio, setup hold time and ripple noise of the test signal.
Further, the step S3 includes:
s31, sending a control instruction containing the trigger condition and the test index of the test signal to an oscilloscope so that the oscilloscope tests the test signal of the test point according to the control instruction;
s32: and receiving the test data fed back by the oscilloscope.
Based on the automatic test method of the hardware circuit provided by the invention, correspondingly, the invention also provides an automatic test system of the hardware circuit, and the automatic test system comprises:
the acquisition and construction module is used for acquiring all test signals and constructing a test control table;
the first control module is used for controlling the oscilloscope probe arranged on the mechanical arm to move to a test point according to the test control table so as to enable the oscilloscope probe to be in contact with the test point of the circuit to be tested;
the second control module is used for controlling the oscilloscope to test the test signal of the test point according to the test control table so as to acquire test data;
the storage judging module is used for storing the test data and judging the test data to obtain a judging result;
the judging module is used for judging whether the untested test signal exists in the test control table or not aiming at the test point;
the repeated execution module is used for repeatedly executing the first control module, the second control module, the storage judging module and the judging module so as to test the untested test signals;
and the table generating module is used for generating a total test result table according to the test data and the judgment result of each test signal and finishing the test.
Further, the obtaining and constructing module includes:
the structure making module is used for making a test control table structure containing test signals, test conditions, test indexes and judgment rules;
the acquisition module is used for acquiring the test signal, and the test point coordinate, the test condition, the test index and the judgment rule of the test signal;
and the construction module is used for writing the test signal, the test point coordinate, the test condition, the test index and the judgment rule into the test control table to construct and obtain the test control table.
Further, the test conditions include: and testing the trigger condition, amplitude, frequency, period, duty ratio, establishment holding time and ripple noise of the signal.
Further, the second control module includes:
the instruction sending module is used for sending a control instruction containing a trigger condition and a test index of a test signal to the oscilloscope so that the oscilloscope tests the test signal of the test point according to the control instruction;
and the data receiving module is used for receiving the test data fed back by the oscilloscope.
The invention also discloses an automatic testing device of the hardware circuit, which comprises:
the automatic test system comprises an automatic test terminal, an oscilloscope, a microcontroller, a mechanical arm and a fixed table for placing a circuit to be tested, wherein the automatic test terminal is used for automatically testing the hardware circuit; the automatic test terminal is connected with an oscilloscope; the automatic test terminal is connected with the microcontroller; the microcontroller is connected with the mechanical arm; the probe of the oscilloscope is arranged on the mechanical arm.
Furthermore, the fixed table is provided with a guide rail, and a mechanical arm is arranged on the guide rail.
The invention has the beneficial effects that:
the automatic test method, the system and the device for the hardware circuit can automatically control the oscilloscope to test the test signal of the test point of the circuit to be tested, automatically generate the test result table and do not need to manually arrange test data; in addition, the probe of the oscilloscope is arranged on the mechanical arm so as to accurately position the test point by controlling the movement of the mechanical arm, so that the defects of inconvenient manual operation, long test time and the like caused by more test signals and small test points can be overcome, the human capital can be effectively saved, the test efficiency is improved, and the oscilloscope has better practicability.
Drawings
FIG. 1 is a flowchart of a method for automated testing of hardware circuits according to a first embodiment;
FIG. 2 is a flowchart of a method for constructing a test control table according to a first embodiment;
FIG. 3 is a flowchart of a method for obtaining test data according to a first embodiment;
FIG. 4 is a block diagram of an automated test system for hardware circuits according to one embodiment;
FIG. 5 is a block diagram of a module of the acquisition build module according to the first embodiment;
FIG. 6 is a block diagram of a second control module according to the first embodiment;
fig. 7 is a block diagram of an automated testing apparatus for hardware circuits according to an embodiment.
Detailed Description
The embodiments of the present invention are described below with reference to specific embodiments, and other advantages and effects of the present invention will be easily understood by those skilled in the art from the disclosure of the present specification. The invention is capable of other and different embodiments and of being practiced or of being carried out in various ways, and its several details are capable of modification in various respects, all without departing from the spirit and scope of the present invention. It is to be noted that the features in the following embodiments and examples may be combined with each other without conflict.
It should be noted that the drawings provided in the following embodiments are only for illustrating the basic idea of the present invention, and the components related to the present invention are only shown in the drawings rather than drawn according to the number, shape and size of the components in actual implementation, and the type, quantity and proportion of the components in actual implementation may be changed freely, and the layout of the components may be more complicated.
Example one
Referring to fig. one, the present embodiment provides an automated testing method for a hardware circuit, where the automated testing method includes the following steps:
s1: acquiring all test signals and constructing a test control table;
s2: controlling an oscilloscope probe arranged on the mechanical arm to move to a test point according to the test control table so as to enable the oscilloscope probe to be in contact with the test point of the circuit to be tested;
s3: controlling the oscilloscope to test the test signal of the test point based on the test control table to obtain test data;
s4: storing the test data, and judging the test data to obtain a judgment result;
s5: judging whether the untested test signal exists in the test control table or not based on the test point; if yes, repeating the steps S2-S5 to test the untested test signal; if not, go to step S6;
s6: and generating a total test result table according to the test data and the judgment result of each test signal, and ending the test.
It is to be noted that, referring to fig. 2, the construction process for the test control table involved in step S1 includes the following steps:
s11: making a test control table structure containing test signals, test conditions, test indexes and decision rules;
s12: acquiring the test signal, and acquiring the test point coordinate, the test condition, the test index and the judgment rule of the test signal;
s13: and writing the test signal, the test point coordinate, the test condition, the test index and the judgment rule into a test control table to construct the test control table.
It should be noted that the steps S11 to S12 may be detailed as follows:
the automatic test system firstly makes a structure of a test control table according to a test signal to be tested, wherein the structure of the test control table comprises: each test signal to be tested, the test point coordinate of each test signal, the test condition and the test index of the parameter to be concerned, and a judgment rule (SPEC) capable of judging the test data are also set; after the structure of the test control table is formulated, the test signal, the test condition, the test point coordinate, the test index and the judgment rule corresponding to the obtained test signal are obtained and written into the formulated test control table, and then the complete test control table can be obtained.
It should be noted that the test conditions in the test control table should include: trigger conditions, amplitude, frequency, period, duty cycle, setup hold time, ripple noise, etc. of the test signal; in addition, as for the decision rule referred to in the test control table, the purpose is to make a decision on the test data obtained by the test to decide whether the test data thereof is valid (pass) or invalid (fall).
It should be noted that, based on the content of the test control table, the specific process of step S2 can be detailed as follows:
after the automatic test system constructs the test control table, the movement of the mechanical arm is controlled based on the test point coordinates of the test signals in the test control table, and then the movement of the mechanical arm is controlled, so that the probe of the oscilloscope arranged on the mechanical arm can be accurately positioned to the test point on the circuit to be tested, and the probe of the oscilloscope is in contact with the test point; after the oscilloscope probe is contacted with the test point, the mechanical arm keeps still and applies certain pressure to the oscilloscope so as to ensure that the oscilloscope probe is well contacted with the test piece.
Referring to fig. 3, a specific process of "controlling the oscilloscope to perform a test on the test signal to the test point based on the test control table to obtain test data" in step S3 includes the following steps:
s31, sending a trigger condition containing a test signal and a control instruction of a test index to an oscilloscope so that the oscilloscope tests the test signal of the test point according to the control instruction;
s32: and receiving the test data fed back by the oscilloscope.
Namely: when the oscilloscope probe is in a contact state with the test point of the circuit to be tested, the automatic test system sends the trigger condition and the test index of the test signal in the test control table to the oscilloscope; the oscilloscope controls the probe to test the relevant test signal for the test point according to the trigger condition and the test index of the test signal, and captures test data such as waveform and the like; and the oscilloscope feeds back the obtained test data to the automatic test system. Further, the test data may be saved in the automated test system by executing step S4, and whether the test data is valid or invalid may be determined by the decision rule of the test signal in the test control table.
It should be noted that there are a plurality of test signals when testing the test points of the circuit to be tested, and the test control table constructed by the automated test system should include a plurality of test signals, and test point coordinates, test conditions, and other contents corresponding to each test signal. Based on this, after the test process of one test signal is completed for the test point, whether the test control table has the test signal which is not tested or not needs to be judged; if yes, the process of the steps S2-S5 is repeatedly executed to test the untested signal to be tested; if the untested test signal does not exist, it indicates that the tests of the test signals to be performed on the test point are all completed, and the test data and the determination result of each test signal need to be written into the total test result table to generate the total test result table.
Based on the method for automatically testing a hardware circuit provided in this embodiment, correspondingly, this embodiment further provides an automatic test system for a hardware circuit, and with reference to fig. 4, the automatic test system includes:
the acquisition and construction module is used for acquiring all test signals and constructing a test control table;
the first control module is used for controlling the oscilloscope probe arranged on the mechanical arm to move to a test point according to the test control table so as to enable the oscilloscope probe to be in contact with the test point of the circuit to be tested;
the second control module is used for controlling the oscilloscope to test the test signal of the test point according to the test control table so as to acquire test data;
the storage judging module is used for storing the test data and judging the test data to obtain a judging result;
the judging module is used for judging whether the untested test signal exists in the test control table or not based on the test points;
the repeated execution module is used for repeatedly executing the first control module, the second control module, the storage judging module and the judging module so as to test the untested test signals;
and the table generating module is used for generating a total test result table according to the test data and the judgment result of each test signal and finishing the test.
Referring to fig. 5, the acquisition building block includes:
the structure making module is used for making a test control table structure containing test signals, test conditions, test indexes and judgment rules;
the acquisition module is used for acquiring the test signal, and the test point coordinate, the test condition, the test index and the judgment rule of the test signal;
and the construction module is used for writing the test signal, the test point coordinate, the test condition, the test index and the judgment rule into the test control table to construct and obtain the test control table.
It should be noted that the test conditions involved in the automated test system include: and testing the trigger condition, amplitude, frequency, period, duty ratio, establishment holding time and ripple noise of the signal.
Referring to fig. 6, the second control module includes:
the instruction sending module is used for sending a trigger condition containing a test signal and a control instruction of a test index to the oscilloscope so that the oscilloscope tests the test signal of the test point according to the control instruction;
and the data receiving module is used for receiving the test data fed back by the oscilloscope.
Based on the method and system for automatically testing a hardware circuit provided in this embodiment, correspondingly, this embodiment further provides an automatic testing apparatus for a hardware circuit, and with reference to fig. 7, the automatic testing apparatus includes:
an automatic test terminal 100 (for example, a computer equipped with the automatic test system provided in this embodiment) of an automatic test system including the hardware circuit provided in this embodiment, an oscilloscope 200, a microcontroller 300, a robot 400, and a fixing table 800 for placing a circuit to be tested; the automatic test terminal 100 is connected to an oscilloscope 200; the automatic test terminal 100 is connected to the microcontroller 300; the microcontroller 300 is connected to the robot arm 400; the probe 600 of the oscilloscope is mounted on the robot arm 400.
It should be noted that a guide rail 700 is installed on the fixed table 800, and the robot arm 400 is installed on the guide rail 700; the guide rails 700 on the fixing base 800 include at least three, and are installed on the fixing base in an i-shape. When the movement of the mechanical arm needs to be controlled to drive the oscilloscope probe to move to the test point, the automatic test terminal can control the mechanical arm to move back and forth, left and right on the guide rail through the microcontroller to accurately position the test point.
It should be noted that the connection between the automatic test terminal of the present embodiment and the oscilloscope or the microcontroller is realized by a serial port line; the connection between the microcontroller and the mechanical arm is realized through a control line.
The method, the system and the device for automatically testing the hardware circuit can automatically control the oscilloscope to test the test signal of the test point of the circuit to be tested, automatically generate the test result table, do not need to manually arrange test data, and save labor cost.
In addition, according to the automatic testing method, system and device provided by the embodiment, the probe of the oscilloscope is arranged on the mechanical arm, and then the movement of the mechanical arm is controlled through the coordinate of the test point, so that the oscilloscope can move to the test point accurately, the defects of inconvenience in manual operation, long test time and the like caused by more test signals and small test points can be overcome, the human capital can be effectively saved, the test efficiency is improved, and the automatic testing method, system and device have better practicability.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (10)
1. An automated test method for a hardware circuit, the automated test method comprising:
s1: acquiring all test signals and constructing a test control table;
s2: controlling an oscilloscope probe arranged on the mechanical arm to move to a test point according to the test control table so as to enable the oscilloscope probe to be in contact with the test point of the circuit to be tested;
s3: controlling the oscilloscope to test the test signal of the test point based on the test control table to obtain test data;
s4: storing the test data, and judging the test data to obtain a judgment result;
s5: judging whether the untested test signal exists in the test control table or not based on the test point; if yes, repeating the steps S2-S5 to test the untested test signal; if not, go to step S6;
s6: and generating a total test result table according to the test data and the judgment result of each test signal, and ending the test.
2. The method for automatically testing a hardware circuit according to claim 1, wherein the step S1 comprises:
s11: making a test control table structure containing test signals, test conditions, test indexes and decision rules;
s12: acquiring the test signal, and acquiring the test point coordinate, the test condition, the test index and the judgment rule of the test signal;
s13: and writing the test signal, the test point coordinate, the test condition, the test index and the judgment rule into the test control table to construct the test control table.
3. The method of claim 2, wherein the test conditions comprise trigger conditions, amplitude, frequency, period, duty cycle, setup hold time, and ripple noise of the test signal.
4. The method for automatically testing a hardware circuit according to claim 3, wherein the step S3 comprises:
s31, sending a control instruction containing a trigger condition and a test index of the test signal to an oscilloscope so that the oscilloscope tests the test signal of the test point according to the control instruction;
s32: and receiving test data fed back by the oscilloscope.
5. An automated test system for hardware circuits, the automated test system comprising:
the acquisition and construction module is used for acquiring all test signals and constructing a test control table;
the first control module is used for controlling the oscilloscope probe arranged on the mechanical arm to move to the test point according to the test control table so as to enable the oscilloscope probe to be in contact with the test point of the circuit to be tested;
the second control module is used for controlling the oscilloscope to test the test signal of the test point according to the test control table so as to acquire test data;
the storage judging module is used for storing the test data and judging the test data to obtain a judging result;
the judging module is used for judging whether the untested test signal exists in the test control table or not aiming at the test point;
the repeated execution module is used for repeatedly executing the first control module, the second control module, the storage judging module and the judging module so as to test the untested test signals;
and the table generating module is used for generating a total test result table according to the test data and the judgment result of each test signal and finishing the test.
6. The automated hardware circuit testing system of claim 5, wherein the acquisition build module comprises:
the structure making module is used for making a test control table structure containing test signals, test conditions, test indexes and judgment rules;
the acquisition module is used for acquiring the test signal, and the test point coordinate, the test condition, the test index and the judgment rule of the test signal;
and the construction module is used for writing the test signal, the test point coordinate, the test condition, the test index and the judgment rule into the test control table to construct and obtain the test control table.
7. An automated test system for hardware circuits according to claim 6, wherein said test conditions include: and testing the trigger condition, amplitude, frequency, period, duty ratio, establishment holding time and ripple noise of the signal.
8. The automated hardware circuit testing system of claim 7, wherein the second control module comprises:
the instruction sending module is used for sending a control instruction containing a trigger condition and a test index of a test signal to the oscilloscope so that the oscilloscope tests the test signal on the test point according to the control instruction;
and the data receiving module is used for receiving the test data fed back by the oscilloscope.
9. An automated test apparatus for hardware circuits, the automated test apparatus comprising: an automated test terminal comprising the automated test system of any one of claims 5-8, an oscilloscope, a microcontroller, a robotic arm, and a mounting station for placing a circuit under test; the automatic test terminal is connected with the oscilloscope; the automatic test terminal is connected with the microcontroller; the microcontroller is connected with the mechanical arm; the probe of the oscilloscope is arranged on the mechanical arm.
10. The automated hardware circuit testing apparatus of claim 9, wherein the mounting station is provided with a guide rail; the mechanical arm is arranged above the guide rail.
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| CN201810816332.5A CN110749812A (en) | 2018-07-24 | 2018-07-24 | Automatic testing method, system and device for hardware circuit |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113791373A (en) * | 2021-08-06 | 2021-12-14 | 深圳市科陆电子科技股份有限公司 | Ammeter testing method and system, electronic equipment and storage medium |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113791373A (en) * | 2021-08-06 | 2021-12-14 | 深圳市科陆电子科技股份有限公司 | Ammeter testing method and system, electronic equipment and storage medium |
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