CN114442019B - A test correction method, device and electronic equipment for a test tool - Google Patents

Abstract

The invention discloses a test and correction method, device and electronic equipment for a test tool, which include: when it is necessary to retest the connected mainboard to be tested, the detection equipment obtains historical test data from a host computer and retrieves the data from the mainboard to be tested. Obtain the current value corresponding to each load current value as the reference current value, and use the corresponding voltage value collected from the oscilloscope as the reference voltage value; control the test tool to load the device to the motherboard under test based on the load current value used in the first test Respond to the loading operation of the load current value; obtain the measured current value and the measured voltage value corresponding to each load current value from the motherboard to be tested; compare the measured current value with the reference current value respectively to obtain the first comparison result, Compare the measured voltage value with the reference voltage value to obtain a second comparison result; respond to a corresponding correction operation according to the first comparison result and the second comparison result.

Description

A test correction method, device and electronic equipment for a test tool

Technical field

The invention relates to the field of testing technology, and in particular to a test correction method, device and electronic equipment for a test tool.

Background technique

During the testing of motherboards with low current dynamic response, when the internal chip firmware parameters and hardware parameters (inductors, capacitors, etc.) of the motherboard are changed, the test tool needs to be used to retest the dynamic response of the motherboard. For example, taking the test tool VRTT (Voltage Regulator Test Tool, power controller test tool) as an example, even if the same or different VRTT pulls the load current according to the same current span (Isetp) each time, in fact, each time it pulls the load There will also be differences in the size of the current. The small difference in load current will cause a large or small deviation in the measurement results of the dynamic response of the motherboard each time; and the differential probe will often always deviate from the reference due to temperature drift and other reasons. The value has an error of several millivolts; especially for the case where the margin of the test result of the motherboard is very small, the debugging results of the deviation value of the load current and the measured voltage of the test tool before each retest will have a negative impact on the test. The result of passing (Pass) or failing (Fail) has a great impact. Therefore, it is urgent to propose a test correction method for the test tool to improve the accuracy of the debugging results of the VRTT's loading current and measurement voltage.

Contents of the invention

Therefore, the present invention provides a test tool test correction method, device and electronic equipment to improve the accuracy of the debugging results of the VRTT's loading current and measurement voltage.

According to a first aspect, an embodiment of the present invention discloses a test correction method for a test tool, which is applied to a detection device. The detection device is connected to a host computer, a test tool loading device, an oscilloscope and a motherboard to be tested. The oscilloscope is For collecting the voltage value of the motherboard to be tested; the method includes: when it is necessary to retest the connected motherboard to be tested, obtaining historical test data from the host computer, wherein the historical test data includes measuring the motherboard to be tested. The multiple load current values collected and stored during the first test, the current value corresponding to each load current value obtained from the motherboard to be tested, and the voltage value corresponding to each load current value collected from the oscilloscope are combined into The current value is used as a reference current value, and the voltage value is used as a reference voltage value; according to the load current value used in the first test, the test tool loading device is controlled to respond to the load current value to the motherboard under test. Loading operation; obtain the measured current value corresponding to each load current value from the motherboard to be tested and obtain the measured voltage value corresponding to the collected load current value from the oscilloscope; respectively compare the measured current value with The reference current value is compared to obtain a first comparison result and the actual measured voltage value is compared with the reference voltage value to obtain a second comparison result; when the first comparison result does not meet the first predetermined Assuming the error range requirement, the test tool loading device is calibrated; when the second comparison result does not meet the second preset error range requirement, the probe of the oscilloscope is calibrated.

Optionally, when the connected motherboard under test needs to be retested, before obtaining historical test data from the host computer, the method further includes: when the connected motherboard under test is first tested. , obtain the preconfigured load current value within the preset span range and the reference current value and reference voltage value corresponding to the motherboard to be tested from the host computer; in the case of no load current, the load current value is Power on the test motherboard and obtain the current value corresponding to the current motherboard to be tested and the voltage value corresponding to the current value; compare the current value with the reference current value to obtain a third comparison result and compare the current value The corresponding voltage value is compared with the reference voltage value to obtain a fourth comparison result; when the third comparison result meets the first preset error range requirement and the fourth comparison result meets the first 2. Preset error range requirements, control the GUI interface of the host computer to display the test passing information and prompt to perform the load test; use the load current value within the preset span range to conduct the first load test and collect the first load test The load current value in the process, the current value of the motherboard under test corresponding to each load current value, and the voltage value collected by the oscilloscope; compare each load current value and the current of the motherboard under test corresponding to each load current value. The value and the voltage value collected by the oscilloscope are saved to the host computer.

Optionally, before saving each load current value and the motherboard current value to be measured corresponding to each load current value and the voltage value collected by the oscilloscope to the host computer, the method further includes: When loading, load the base current value of the mainboard to be tested to the mainboard to be tested; compare the load current value collected from the mainboard to be tested with the base current value to obtain a fifth comparison result , compare the measured voltage value of the current motherboard under test collected from the oscilloscope with the reference voltage value to obtain the sixth comparison result; when the fifth comparison result meets the first preset error range requirement and the required The sixth comparison result satisfies the second preset error range requirement in response to the loading of other loading current values within the preset span range and the saving operation of the loading result.

Optionally, when the first comparison result does not meet the first preset error range requirement, correcting the test tool loading device includes: when the first comparison result does not meet the first preset error range requirement The error range requirement is to adjust the load current value loaded by the test tool loading device until it meets the first preset error range requirement; when the second comparison result does not meet the second preset error Range requirements, calibrating the probe of the oscilloscope, including: when the second comparison result does not meet the second preset error range requirement, sending a correction instruction to the oscilloscope, so that the oscilloscope can adjust according to the received correction The command responds to internal correction operations.

Optionally, after respectively comparing the measured current value with the reference current value to obtain the first comparison result and comparing the measured voltage value with the reference voltage value to obtain the second comparison result, the method further The method includes: when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, controlling the GUI interface of the host computer to display test pass information.

Optionally, after respectively comparing the measured current value with the reference current value to obtain the first comparison result and comparing the measured voltage value with the reference voltage value to obtain the second comparison result, the method further Including: when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, respond to a retest prompt operation for the motherboard to be tested that needs to be retested .

According to a second aspect, an embodiment of the present invention also discloses a test correction device for a test tool, which is applied to a detection device. The detection device is connected to a host computer, a test tool loading device, an oscilloscope and a motherboard to be tested. The oscilloscope is Used to collect the voltage value of the motherboard to be tested; the device includes: a first acquisition module, used to obtain historical test data from the host computer when the connected motherboard to be tested needs to be retested, wherein the historical test The data includes multiple load current values collected and stored during the first test of the motherboard under test, current values corresponding to each load current value obtained from the motherboard under test, and each load current collected from the oscilloscope. The voltage value corresponding to the value, the current value as the reference current value, the voltage value as the reference voltage value; the first loading module is used to control the test tool according to the load current value used in the first test. The loading device responds to the loading operation of the load current value to the motherboard to be tested; the second acquisition module is used to obtain the measured current value corresponding to each load current value from the motherboard to be tested and obtain the collection from the oscilloscope The actual measured voltage value corresponding to the load current value is obtained; a first comparison module is used to compare the actual measured current value with the reference current value to obtain a first comparison result and to obtain the first comparison result and to obtain the actual measured voltage value. The second comparison result is obtained by comparing the value with the reference voltage value; the first correction module is used to perform a test on the test tool loading device when the first comparison result does not meet the first preset error range requirement. Correction; a second correction module, used to correct the probe of the oscilloscope when the second comparison result does not meet the second preset error range requirement.

Optionally, the device further includes: a third acquisition module, configured to acquire the load within a preconfigured span range from the host computer when performing the first test on the connected motherboard to be tested. The current value and the reference current value and reference voltage value corresponding to the motherboard under test; the fourth acquisition module is used to power on the motherboard under test and obtain the current value corresponding to the motherboard under test without pulling current. The current value and the voltage value corresponding to the current value; a second comparison module, used to compare the current value and the reference current value to obtain a third comparison result and the voltage value corresponding to the current value. Compare with the reference voltage value to obtain a fourth comparison result; a first prompt module for when the third comparison result meets the first preset error range requirement and the fourth comparison result satisfies The second preset error range requires that the GUI interface of the host computer be controlled to display the test passing information and prompt the load test; the test module is used to use the load current value within the preset span range to perform the first load test. Load test and collect the load current value during the first load test process, as well as the current value of the motherboard to be tested corresponding to each load current value and the voltage value collected by the oscilloscope; the save module is used to save each load current value And the current value of the motherboard to be measured corresponding to each load current value and the voltage value collected by the oscilloscope are saved in the host computer.

According to a third aspect, an embodiment of the present invention further discloses an electronic device, including: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores information that can be used by the at least one processor. Instructions executed by the processor. The instructions are executed by the at least one processor to cause the at least one processor to execute the test correction method of the test tool as described in the first aspect or any optional implementation of the first aspect. A step of.

According to a fourth aspect, an embodiment of the present invention also discloses a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the computer program implements the first aspect or any optional implementation of the first aspect. The steps of the test calibration method of the test tool are described in the manner.

The technical solution of the present invention has the following advantages:

The test and correction method/device of the test tool provided by the present invention includes: when the connected mainboard to be tested needs to be retested, the detection equipment obtains historical test data from the host computer, and obtains the corresponding pull data from the mainboard to be tested. The current value corresponding to the load current value is used as the reference current value, and the corresponding voltage value collected from the oscilloscope is used as the reference voltage value; according to the load current value used in the first test, the test tool loading device is controlled to respond to the load current value to the motherboard under test loading operation; obtain the measured current value and measured voltage value corresponding to each load current value from the motherboard to be tested; compare the measured current value with the reference current value respectively to obtain the first comparison result, compare the measured voltage value with The reference voltage values are compared to obtain a second comparison result; corresponding correction operations are responded to according to the first comparison result and the second comparison result. When retesting the motherboard under test, the loading current and measurement voltage of the test tool can be reliably debugged by obtaining the relevant test data from the first test as a comparison reference, so that whether the same or the same test tool is used as in the first test is used. Different test tools can be tested at the same test parameter level, which avoids errors caused by external factors such as loading tools or oscilloscopes from affecting the retest results of the motherboard under test.

Description of the drawings

In order to more clearly explain the specific embodiments of the present invention or the technical solutions in the prior art, the accompanying drawings that need to be used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings in the following description The drawings illustrate some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without exerting any creative effort.

Figure 1 is a flow chart of a specific example of a test correction method of a test tool in an embodiment of the present invention;

Figure 2 is a schematic structural diagram of a specific example of the test correction method of the test tool in the embodiment of the present invention;

Figure 3 is a functional block diagram of a specific example of the test correction device of the test tool in the embodiment of the present invention;

FIG. 4 is a specific example diagram of an electronic device in an embodiment of the present invention.

Detailed ways

The technical solution of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts fall within the scope of protection of the present invention.

In the description of the present invention, it should be noted that the terms "first", "second" and "third" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance.

In addition, the technical features involved in different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

The embodiment of the present invention discloses a test correction method for test tools, which is applied to detection equipment. As shown in Figure 2, the detection equipment 1 is connected to a host computer 2, a test tool loading device 3, an oscilloscope 4 and a motherboard to be tested 5 respectively. , in which the oscilloscope 4 is connected to the detection device 1 through a probe to collect the voltage value of the motherboard 5 to be tested. The detection device is equipped with an MCU 13, a current acquisition module 11 and a voltage acquisition module 12. The current acquisition module 11 and the voltage acquisition module 12 are installed inside the detection device. The corresponding current value and voltage value are read from the motherboard 5 under test through PMBus (Power Management Bus), and the host computer 2 and the detection device 1 can be connected through USB to realize data transmission. As shown in Figure 1, the method includes the following steps:

Step 101: When the connected motherboard under test needs to be retested, historical test data is obtained from the host computer. The historical test data includes multiple load current values collected and stored during the first test of the motherboard under test, and the load current values from the host computer under test. Test the mainboard to obtain the current value corresponding to each load current value and the voltage value corresponding to each load current value collected from the oscilloscope, using the current value as the reference current value and the voltage value as the reference voltage value.

For example, the user can input test instructions through the GUI interface of the host computer. When the host computer receives the test instructions, it can communicate with the detection device through the USB protocol and send the test instructions to the detection device. For example, when the user sends a retest on the host computer When the test equipment receives the retest instruction, it determines that the connected mainboard to be tested currently needs to be retested, and obtains the historical test data from the host computer when the first load test was performed on the mainboard to be tested.

Step 102: Control the test tool loading device to respond to the loading operation of the load current value to the motherboard to be tested according to the load current value used in the first test; for example, the test tool loading device may include a VRTT loading tool. The embodiment of the present application does not limit the load current value used in the first load test. Those skilled in the art can set a current value within a preset span range (Istep) in the host computer as the load operation according to actual needs. load current value. When performing a loading operation based on the load current value within the preset span range, when Istep loads the load current, the current values within the preset span range include the minimum current value A and the maximum current value B. The minimum current value A and the maximum current value are loaded first, respectively. Current value B, and then pull other Isetp currents within the dynamic preset span range.

Step 103: Obtain the measured current value corresponding to each load current value from the motherboard to be tested and obtain the measured voltage value corresponding to the collected load current value from the oscilloscope;

Step 104: Compare the measured current value with the reference current value to obtain a first comparison result, and compare the measured voltage value with the reference voltage value to obtain a second comparison result;

Step 105: When the first comparison result does not meet the first preset error range requirements, calibrate the test tool loading device; for example, the embodiment of the present application does not limit the first preset error range. Those skilled in the art It can be determined according to actual needs. In the embodiment of the present application, the first preset error range fluctuates by 0.2% based on the reference current value. When the error after comparison is within this range, it means that the first comparison result satisfies the first There is a preset error range requirement. When the error after comparison is not within the range, it means that the first comparison result does not meet the first preset error range requirement.

As an optional implementation of the present invention, step 105 includes: when the first comparison result does not meet the first preset error range requirement, adjusting the load current value loaded by the testing tool loading device until it meets the first preset error range. Error range requirements; specifically, when the first comparison result does not meet the first preset error range requirements, the testing equipment can be used to continuously adjust the load current value loaded by the testing tool loading device to ensure the actual measured current obtained from the motherboard under test The comparison result between the value and the reference current value meets the requirements.

Step 106: When the second comparison result does not meet the second preset error range requirement, calibrate the probe of the oscilloscope. Illustratively, the embodiment of the present application does not limit the second preset error range. Those skilled in the art can determine according to actual needs. In the embodiment of the present application, the second preset error range is based on the reference voltage value. Floating 0.2%. When the error after comparison is within this range, it means that the second comparison result meets the requirements of the second preset error range. When the error after comparison is not within this range, it means that the second comparison result does not meet the requirements of the second preset error range. meet the second preset error range requirement.

As an optional implementation of the present invention, step 106 includes: when the second comparison result does not meet the second preset error range requirement, sending a correction instruction to the oscilloscope, so that the oscilloscope responds to the internal correction operation according to the received correction instruction. Specifically, when the second comparison result does not meet the second preset error range requirement, a correction instruction can be sent to the oscilloscope through the detection device, so that the oscilloscope responds to the internal correction operation according to the received correction instruction until the preset second preset error is met. Range requirements to ensure that the comparison results between the measured voltage value and the reference voltage value corresponding to the collected load current value obtained from the oscilloscope meet the requirements.

The test correction method of the test tool provided by the present invention reliably debugs the loading current and measurement voltage of the test tool by obtaining relevant test data from the first test as a comparison reference when retesting the motherboard to be tested. , so that whether the same or different test tools are used for the first test, the test can be carried out at the same test parameter level, avoiding errors caused by external factors such as loading tools or oscilloscopes from affecting the retest results of the motherboard under test.

As an optional implementation of the present invention, before step 101, the method further includes:

When the connected motherboard to be tested is tested for the first time, the preconfigured load current value within the preset span range and the corresponding reference current value and reference voltage value of the motherboard to be tested are obtained from the host computer;

Illustratively, the method of obtaining the first test instructions of the connected motherboard under test is the same as the method of obtaining the above-mentioned retest instructions, and is no longer limited here. For any motherboard to be tested that needs to be tested, there are different reference current values and reference voltage values corresponding to different types. Similarly, the reference current value and reference voltage value can be uploaded to the host computer and obtained interactively.

Without pulling current, power on the motherboard under test and obtain the current value (Imon) corresponding to the current motherboard under test and the voltage value corresponding to the current value (Imon); for example, power on the motherboard under test and use the oscilloscope The probe is connected to the testing equipment, and the testing equipment is transferred to the motherboard to be tested to read the voltage value of the current motherboard to be tested (i.e., the Vboot starting voltage value), and the voltage value can be displayed through the GUI interface of the host computer.

Compare the current value and the reference current value to obtain a third comparison result; compare the voltage value corresponding to the current value and the reference voltage value to obtain a fourth comparison result; when the third comparison result meets the first preset error range requirements and the fourth comparison result meets the second preset error range requirements, the GUI interface of the control host computer displays the test passing information and prompts to perform the load test; use the load current value within the preset span range to conduct the first load test And collect the load current value during the first load test process, the current value of the motherboard under test corresponding to each load current value, and the voltage value collected by the oscilloscope; The current value of the motherboard under test and the voltage value collected by the oscilloscope are saved to the host computer for parameter correction in the subsequent debugging process before retesting.

As an optional implementation of the present invention, before saving each load current value and the motherboard current value to be measured corresponding to each load current value and the voltage value collected by the oscilloscope to the host computer, the method also includes:

When loading for the first time, load the base current value of the motherboard under test to the motherboard under test; compare the load current value collected from the motherboard under test with the base current value to obtain the fifth comparison result, which will be obtained from the oscilloscope. The collected measured voltage value of the current motherboard under test is compared with the reference voltage value to obtain the sixth comparison result; when the fifth comparison result meets the first preset error range requirement and the sixth comparison result meets the second preset Assume that the error range requires responding to the loading of other load current values within the preset span range and the saving operation of the load results.

For example, during the first load test, the base current value of the motherboard to be tested is first used to perform the load operation. After the load result is compared with the base current value and the base voltage value, the corresponding error range requirements are met. Then load other load current values for testing, which realizes the fault screening of the motherboard to be tested itself and then performs the test operation of other load current values, avoiding the direct testing of all load current values due to the main board under test itself. Failure causes all test results to be invalid, thereby affecting test efficiency.

As an optional implementation of the present invention, after step 104, the method further includes: when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, control the host computer The GUI interface displays test passing information. The embodiment of the present application does not limit the display type of the test passing information.

As an optional implementation of the present invention, after step 104, the method further includes: when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, respond to the need The retest prompt operation of the motherboard to be tested enables the frequency sweep test of the motherboard to be tested. The embodiment of the present application does not limit the prompting method of the retest prompting operation.

When the dynamic results need to be retested multiple times during debugging or when different VRTT tools and oscilloscope equipment are changed, the test correction method of the test tool provided by the embodiment of the present application uses the data from the first test as a reference. value to carry out subsequent retest work to ensure the consistency of the test results; and during the retest, when the error of the collected voltage and current values exceeds 0.2%, the detection equipment will control the VRTT tool or oscilloscope to adjust until the error is met. requirements, and the load current value is the minimum current value (such as 0A), the maximum current value B, and any load current value between the minimum current value A and the maximum current value B and its corresponding measured current value and measured voltage value are both Retesting can be carried out only after the data has been collected and compared and must meet the error requirements, which improves the accuracy of the test results.

The embodiment of the present invention also discloses a test correction device for a test tool, which is applied to detection equipment. The detection equipment is connected to a host computer, a test tool loading device, an oscilloscope and a mainboard to be tested. The oscilloscope is used to collect data to be tested. The voltage value of the main board; as shown in Figure 3, the device includes:

The first acquisition module 201 is used to obtain historical test data from the host computer when the connected motherboard to be tested needs to be retested, where the historical test data includes the data collected and stored during the first test of the motherboard to be tested. Multiple load current values, the current value corresponding to each load current value is obtained from the motherboard to be tested, and the voltage value corresponding to each load current value collected from the oscilloscope, and the current value is used as the reference current value, and the voltage value is used as the reference voltage value; for details, please refer to the above embodiment, which will not be described again here.

The first loading module 202 is configured to control the loading operation of the test tool loading device to respond to the load current value of the motherboard under test according to the load current value used in the first test; specifically refer to the above embodiment, I won’t go into details here.

The second acquisition module 203 is used to obtain the measured current value corresponding to each load current value from the motherboard to be tested and the measured voltage value corresponding to the collected load current value from the oscilloscope; for details, please refer to the above implementation. For example, I won’t go into details here.

The first comparison module 204 is configured to compare the actual measured current value with the reference current value to obtain a first comparison result and to compare the actual measured voltage value with the reference voltage value to obtain a second comparison result. Comparison results; please refer to the above embodiments for details and will not be described again here.

The first correction module 205 is used to correct the test tool loading device when the first comparison result does not meet the first preset error range requirement; for details, please refer to the above embodiment, which will not be described again here.

The second correction module 206 is used to correct the probe of the oscilloscope when the second comparison result does not meet the second preset error range requirement. Please refer to the above embodiments for details, which will not be described again here.

The test correction device of the test tool provided by the present invention reliably debugs the loading current and measurement voltage of the test tool by obtaining relevant test data from the first test as a comparison reference when retesting the motherboard to be tested. , so that whether the same or different test tools are used for the first test, the test can be carried out at the same test parameter level, avoiding errors caused by external factors such as loading tools or oscilloscopes from affecting the retest results of the motherboard under test.

As an optional implementation manner of the present invention, the device further includes: a third acquisition module, configured to acquire a preconfigured preset span from the host computer when performing the first test on the connected motherboard to be tested. The load current value within the range and the reference current value and reference voltage value corresponding to the motherboard to be tested; the fourth acquisition module is used to power on the motherboard to be tested and obtain the current value without pulling the load current. The current value corresponding to the motherboard to be tested and the voltage value corresponding to the current value; a second comparison module, used to compare the current value and the reference current value to obtain a third comparison result and to compare the current The voltage value corresponding to the value is compared with the reference voltage value to obtain a fourth comparison result; a first prompt module is used to when the third comparison result meets the first preset error range requirement and the third The four comparison results meet the requirements of the second preset error range, and the GUI interface of the host computer is controlled to display test passing information and prompt to perform a load test; a test module is used to utilize the load within the preset span range The current value is used for the first load test and the load current value during the first load test is collected, as well as the current value of the motherboard to be tested corresponding to each load current value and the voltage value collected by the oscilloscope; the saving module is used to save each load current value. A load current value, the current value of the motherboard to be measured corresponding to each load current value, and the voltage value collected by the oscilloscope are saved in the host computer. Please refer to the above embodiments for details, which will not be described again here.

As an optional embodiment of the present invention, the device also includes: a second loading module, used to load the base current value of the mainboard to be tested to the mainboard to be tested during the initial load; a third comparison module, Used to compare the load current value collected from the mainboard to be tested and the reference current value to obtain a fifth comparison result, and to obtain the measured voltage value of the current mainboard to be tested and the reference voltage collected from the oscilloscope. Compare the values to obtain a sixth comparison result; a response module, configured to perform a comparison when the fifth comparison result meets the first preset error range requirement and the sixth comparison result meets the second preset error The range requirement responds to the loading of other load current values within the preset span range and the saving operation of the load result. Please refer to the above embodiments for details, which will not be described again here.

As an optional implementation of the present invention, the first correction module 205 includes: a first correction sub-module, used to load equipment on the test tool when the first comparison result does not meet the first preset error range requirement. The loaded loading current value is adjusted until it meets the preset first preset error range requirement; the second correction module 206 includes: a second syndrome sub-module, used when the second comparison result does not meet the second The preset error range requires that a correction instruction be sent to the oscilloscope, so that the oscilloscope responds to an internal correction operation according to the received correction instruction. Please refer to the above embodiments for details, which will not be described again here.

As an optional embodiment of the present invention, the device further includes: when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, control the The GUI interface of the host computer displays test passing information. Please refer to the above embodiments for details, which will not be described again here.

As an optional embodiment of the present invention, the device further includes: a second prompt module for when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement. The error range requires that the GUI interface of the host computer be controlled to display test passing information. Please refer to the above embodiments for details, which will not be described again here.

As an optional embodiment of the present invention, the device further includes: a third prompt module, configured to detect when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement. Error range requirements, in response to the retest prompt operation for the motherboard under test that needs to be retested. Please refer to the above embodiments for details, which will not be described again here.

An embodiment of the present invention also provides an electronic device. As shown in Figure 4, the electronic device may include a processor 401 and a memory 402. The processor 401 and the memory 402 may be connected through a bus or other means. In Figure 4, Take bus connection as an example.

The processor 401 may be a central processing unit (Central Processing Unit, CPU). The processor 401 can also be other general-purpose processors, digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), field programmable gate arrays (Field-Programmable Gate Array, FPGA) or Other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components and other chips, or combinations of the above types of chips.

As a non-transitory computer-readable storage medium, the memory 402 can be used to store non-transitory software programs, non-transitory computer executable programs and modules, such as program instructions corresponding to the test correction method of the test tool in the embodiment of the present invention. /module. The processor 401 executes various functional applications and data processing of the processor by running non-transient software programs, instructions and modules stored in the memory 402, that is, implementing the test correction method of the test tool in the above method embodiment.

The memory 402 may include a program storage area and a data storage area, where the program storage area may store an operating system and an application program required for at least one function; the storage data area may store data created by the processor 401 and the like. In addition, memory 402 may include high-speed random access memory and may also include non-transitory memory, such as at least one magnetic disk storage device, flash memory device, or other non-transitory solid-state storage device. In some embodiments, the memory 402 optionally includes memory located remotely relative to the processor 401, and these remote memories may be connected to the processor 401 through a network. Examples of the above-mentioned networks include but are not limited to the Internet, intranets, local area networks, mobile communication networks and combinations thereof.

The one or more modules are stored in the memory 402, and when executed by the processor 401, perform the test correction method of the test tool in the embodiment shown in Figure 1.

The specific details of the above electronic device can be understood by referring to the corresponding descriptions and effects in the embodiment shown in FIG. 1 , and will not be described again here.

Those skilled in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The program can be stored in a computer-readable storage medium. The program can be stored in a computer-readable storage medium. During execution, the process may include the processes of the embodiments of each of the above methods. Wherein, the storage medium can be a magnetic disk, an optical disk, a read-only memory (Read-Only Memory, ROM), a random access memory (Random Access Memory, RAM), a flash memory (Flash Memory), a hard disk (Hard Disk Drive). , abbreviation: HDD) or solid-state drive (Solid-State Drive, SSD), etc.; the storage medium may also include a combination of the above types of memories.

Although the embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the invention. Such modifications and variations are covered by the appended claims. within the limited scope.

Claims (10)

1. A test correction method for test tools, characterized in that it is applied to detection equipment, and the detection equipment is respectively connected to a host computer, a test tool loading device, an oscilloscope and the motherboard to be tested, and the oscilloscope is used to collect the motherboard to be tested. voltage value; the method includes: When the connected motherboard under test needs to be retested, historical test data is obtained from the host computer, where the historical test data includes multiple load current values collected and stored during the first test of the motherboard under test, Obtain the current value corresponding to each load current value from the motherboard to be tested and the voltage value corresponding to each load current value collected from the oscilloscope, use the current value as the reference current value, and use the voltage value as Reference voltage value; Control the loading operation of the test tool loading device to respond to the load current value of the motherboard under test according to the load current value used in the first test; Obtain the measured current value corresponding to each load current value from the motherboard to be tested and obtain the measured voltage value corresponding to the collected load current value from the oscilloscope; Comparing the measured current value with the reference current value to obtain a first comparison result, and comparing the measured voltage value with the reference voltage value to obtain a second comparison result; When the first comparison result does not meet the first preset error range requirement, correct the testing tool loading device; When the second comparison result does not meet the second preset error range requirement, the probe of the oscilloscope is calibrated. 2. The method according to claim 1, characterized in that when the accessed mainboard to be tested needs to be retested, before historical test data is obtained from the host computer, the method further includes: When performing the first test on the connected mainboard to be tested, the preconfigured load current value within the preset span range and the corresponding reference current value and reference voltage value of the mainboard to be tested are obtained from the host computer. ; Without pulling current, power on the motherboard to be tested and obtain the current value corresponding to the motherboard under test and the voltage value corresponding to the current value; Compare the current value with the reference current value to obtain a third comparison result, and compare the voltage value corresponding to the current value with the reference voltage value to obtain a fourth comparison result; When the third comparison result meets the first preset error range requirement and the fourth comparison result meets the second preset error range requirement, the GUI interface of the host computer is controlled to display test pass information and Prompt to perform load test; Use the load current value within the preset span range to conduct the first load test and collect the load current value during the first load test, as well as the current value of the motherboard to be tested corresponding to each load current value and the voltage collected by the oscilloscope. value; Each loading current value, the current value of the motherboard to be measured corresponding to each loading current value, and the voltage value collected by the oscilloscope are saved in the host computer. 3. The method according to claim 2, characterized in that each load current value and the motherboard current value to be measured corresponding to each load current value and the voltage value collected by the oscilloscope are saved to the host computer. Before, the method also includes: When loading for the first time, load the base current value of the mainboard to be tested to the mainboard to be tested; Comparing the load current value collected from the motherboard under test with the reference current value to obtain a fifth comparison result, and comparing the measured voltage value of the current motherboard under test collected with the oscilloscope with the reference voltage value. The sixth comparison result is obtained through comparison; When the fifth comparison result meets the first preset error range requirement and the sixth comparison result meets the second preset error range requirement, the response is to other load currents within the preset span range. Loading of values and saving of the loading results. 4. The method according to claim 1, characterized in that when the first comparison result does not meet the first preset error range requirement, correcting the test tool loading device includes: When the first comparison result does not meet the first preset error range requirement, adjust the load current value loaded by the test tool loading device until the first preset error range requirement is met; When the second comparison result does not meet the second preset error range requirement, correcting the probe of the oscilloscope includes: When the second comparison result does not meet the second preset error range requirement, a correction instruction is sent to the oscilloscope, so that the oscilloscope responds to an internal correction operation according to the received correction instruction. 5. The method according to claim 1, characterized in that the first comparison result is obtained by comparing the measured current value with the reference current value and the first comparison result is obtained by comparing the measured voltage value with the reference voltage value. After the second comparison result, the method further includes: When the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, the GUI interface of the host computer is controlled to display test pass information. 6. The method according to claim 1, characterized in that the first comparison result is obtained by comparing the measured current value with the reference current value and the first comparison result is obtained by comparing the measured voltage value with the reference voltage value. After the second comparison result, the method further includes: When the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, respond to the retest prompt operation for the motherboard under test that needs to be retested. 7. A test correction device for test tools, characterized in that it is applied to detection equipment, and the detection equipment is connected to a host computer, a test tool loading device, an oscilloscope and the main board to be tested, and the oscilloscope is used to collect the main board to be tested. voltage value; the device includes: The first acquisition module is used to obtain historical test data from the host computer when the connected motherboard under test needs to be retested, where the historical test data includes the data collected and stored during the first test of the motherboard under test. Multiple load current values, the current value corresponding to each load current value is obtained from the motherboard to be tested, and the voltage value corresponding to each load current value collected from the oscilloscope, and the current value is used as the reference current value , using the voltage value as the reference voltage value; A first loading module, configured to control the loading operation of the test tool loading device in response to the load current value of the motherboard under test according to the load current value used in the first test; The second acquisition module is used to obtain the measured current value corresponding to each load current value from the motherboard to be tested and the measured voltage value corresponding to the collected load current value from the oscilloscope; A first comparison module, configured to compare the measured current value with the reference current value to obtain a first comparison result and to compare the measured voltage value with the reference voltage value to obtain a second comparison result. to the results; A first correction module, configured to correct the test tool loading device when the first comparison result does not meet the first preset error range requirement; The second correction module is used to correct the probe of the oscilloscope when the second comparison result does not meet the second preset error range requirement. 8. The device according to claim 7, characterized in that the device further comprises: The third acquisition module is used to obtain the preconfigured load current value within the preset span range and the load current value corresponding to the mainboard to be tested from the host computer when the connected mainboard to be tested is tested for the first time. Reference current value and reference voltage value; The fourth acquisition module is used to power on the mainboard to be tested and obtain the current value corresponding to the mainboard to be tested and the voltage value corresponding to the current value without pulling current; The second comparison module is used to compare the current value with the reference current value to obtain a third comparison result, and to compare the voltage value corresponding to the current value with the reference voltage value to obtain a fourth comparison result. result; A first prompt module, configured to control the upper computer when the third comparison result meets the first preset error range requirement and the fourth comparison result meets the second preset error range requirement. The GUI interface displays test passing information and prompts for load testing; A test module for performing the first load test using the load current value within the preset span range and collecting the load current value during the first load test and the current value of the motherboard to be tested corresponding to each load current value. and the voltage value collected by the oscilloscope; The saving module is used to save each load current value, the current value of the motherboard to be measured corresponding to each load current value, and the voltage value collected by the oscilloscope to the host computer. 9. An electronic device, characterized in that it includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions that can be executed by the at least one processor, The instructions are executed by the at least one processor, so that the at least one processor executes the steps of the test correction method of the test tool according to any one of claims 1-6. 10. A computer-readable storage medium with a computer program stored thereon, characterized in that when the computer program is executed by a processor, the test correction method of the test tool according to any one of claims 1-6 is implemented. A step of.