CN114442019B - Test correction method and device of test tool and electronic equipment - Google Patents
Test correction method and device of test tool and electronic equipment Download PDFInfo
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- CN114442019B CN114442019B CN202111683578.8A CN202111683578A CN114442019B CN 114442019 B CN114442019 B CN 114442019B CN 202111683578 A CN202111683578 A CN 202111683578A CN 114442019 B CN114442019 B CN 114442019B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
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Abstract
The invention discloses a test correction method and device of a test tool and electronic equipment, wherein the test correction method and device comprises the following steps: when the connected main board to be tested is required to be duplicated, the detection equipment acquires historical test data from the upper computer, takes a current value corresponding to each pulling load current value acquired from the main board to be tested as a reference current value, and takes a corresponding voltage value acquired from the oscilloscope as a reference voltage value; controlling a test tool loading device to respond to the loading operation of the pulling load current value to the main board to be tested according to the pulling load current value used in the first test; obtaining an actual measurement current value and an actual measurement voltage value corresponding to each pulling load current value from a main board to be tested; respectively comparing the measured current value with a reference current value to obtain a first comparison result, and comparing the measured voltage value with the reference voltage value to obtain a second comparison result; and responding to corresponding correction operation according to the first comparison result and the second comparison result.
Description
Technical Field
The present invention relates to the field of testing technologies, and in particular, to a testing calibration method and apparatus for a testing tool, and an electronic device.
Background
In the test process of the motherboard with small current dynamic response, when the firmware parameters and hardware parameters (inductance, capacitance and the like) of the internal chip of the motherboard are changed, the dynamic response of the motherboard needs to be retested by using a test tool. Taking a test tool as a VRTT (Voltage Regulator Test Tool, a power controller test tool) as an example, even if the same or different VRTTs draw load currents according to the same current span (Isetp) each time, actually the current magnitude of each drawing load will be different, and the small drawing load current difference will cause larger or smaller deviation of the measurement result of the dynamic response of each mainboard; the differential probe can always have an error of a few millivolts with the reference value due to temperature drift and other reasons; especially, in the case that the margin (margin) of the test result of the motherboard is small, the test result of the bias value of the pull load current and the measurement voltage of the test tool before each retest has a great influence on the Pass (Pass) or Fail (Fail) of the test result, so it is necessary to propose a test correction method of the test tool to improve the accuracy of the test result of the load current and the measurement voltage of the VRTT.
Disclosure of Invention
Therefore, the invention provides a test correction method and device of a test tool and electronic equipment so as to improve the accuracy of a test result of loading current and measuring voltage of VRTT.
According to a first aspect, an embodiment of the invention discloses a test correction method of a test tool, which is applied to detection equipment, wherein the detection equipment is respectively connected with an upper computer, test tool loading equipment, an oscilloscope and a main board to be tested, and the oscilloscope is used for collecting a voltage value of the main board to be tested; the method comprises the following steps: when an accessed mainboard to be tested needs to be subjected to the recovery, historical test data are obtained from an upper computer, wherein the historical test data comprise a plurality of pulling load current values which are collected and stored when the mainboard to be tested is subjected to the primary test, a current value corresponding to each pulling load current value is obtained from the mainboard to be tested, a voltage value corresponding to each pulling load current value which is collected from an oscilloscope is obtained from the mainboard to be tested, the current value is used as a reference current value, and the voltage value is used as a reference voltage value; controlling the loading operation of the test tool loading device to the main board to be tested in response to the pulling load current value according to the pulling load current value used in the first test; obtaining an actual measurement current value corresponding to each pulling load current value from the main board to be tested and obtaining an actual measurement voltage value corresponding to the pulling load current value from an oscilloscope; respectively comparing the measured current value with the reference current value to obtain a first comparison result, and comparing the measured voltage value with the reference voltage value to obtain a second comparison result; when the first comparison result does not meet the first preset error range requirement, correcting the test tool loading equipment; and correcting the probe of the oscilloscope when the second comparison result does not meet the second preset error range requirement.
Optionally, before the history test data is obtained from the upper computer when the accessed motherboard to be tested needs to be duplicated, the method further includes: when the connected main board to be tested is started, a pulling load current value in a preset span range, a reference current value and a reference voltage value corresponding to the main board to be tested are obtained from the upper computer; under the condition of no current carrying, powering on the main board to be tested and acquiring a current value corresponding to the current main board to be tested and a voltage value corresponding to the current value; comparing the current value with the reference current value to obtain a third comparison result, and comparing a voltage value corresponding to the current value with the reference voltage value to obtain a fourth comparison result; when the third comparison result meets the first preset error range requirement and the fourth comparison result meets the second preset error range requirement, controlling a GUI interface of the upper computer to display test passing information and prompting to carry out a pulling test; carrying out a first load test by using the load current values in the preset span range and collecting the load current values in the first load test process, and a main board current value to be tested and an oscilloscope collected voltage value corresponding to each load current value; and storing each pulling load current value, the current value of the main board to be tested corresponding to each pulling load current value and the voltage value acquired by the oscilloscope into the upper computer.
Optionally, before storing the current value of each pull-load current value and the current value of the main board to be tested and the voltage value collected by the oscilloscope corresponding to each pull-load current value in the upper computer, the method further includes: loading a reference current value of the main board to be tested to the main board to be tested when the load is pulled for the first time; comparing the pulling load current value acquired from the main board to be tested with the reference current value to obtain a fifth comparison result, and comparing the measured voltage value of the current main board to be tested acquired from the oscilloscope with the reference voltage value to obtain a sixth comparison result; and when the fifth comparison result meets the first preset error range requirement and the sixth comparison result meets the second preset error range requirement, responding to loading of other pulling load current values in the preset span range and saving operation of the pulling load result.
Optionally, when the first comparison result does not meet a first preset error range requirement, correcting the test tool loading device includes: when the first comparison result does not meet the first preset error range requirement, adjusting the pulling load current value loaded by the test tool loading equipment until the first preset error range requirement is met; when the second comparison result does not meet the second preset error range requirement, correcting the probe of the oscilloscope, including: and when the second comparison result does not meet the second preset error range requirement, a correction instruction is sent to the oscilloscope, so that the oscilloscope responds to internal correction operation according to the received correction instruction.
Optionally, after the comparing the measured current value with the reference current value to obtain a first comparison result and the comparing the measured voltage value with the reference voltage value to obtain a second comparison result, the method further includes: and when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, controlling the GUI interface of the upper computer to display test passing information.
Optionally, after the comparing the measured current value with the reference current value to obtain a first comparison result and the comparing the measured voltage value with the reference voltage value to obtain a second comparison result, the method further includes: and when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, responding to retest prompt operation of the mainboard to be tested, which needs retest.
According to a second aspect, the embodiment of the invention also discloses a test correction device of the test tool, which is applied to the detection equipment, wherein the detection equipment is respectively connected with the upper computer, the test tool loading equipment, the oscilloscope and the main board to be tested, and the oscilloscope is used for collecting the voltage value of the main board to be tested; the device comprises: the first acquisition module is used for acquiring historical test data from an upper computer when an accessed mainboard to be tested needs to be duplicated, wherein the historical test data comprises a plurality of pulling load current values acquired and stored when the mainboard to be tested is tested for the first time, a current value corresponding to each pulling load current value and a voltage value corresponding to each pulling load current value acquired from an oscilloscope are acquired from the mainboard to be tested, the current value is used as a reference current value, and the voltage value is used as a reference voltage value; the first loading module is used for controlling the loading operation of the test tool loading device to the main board to be tested in response to the pulling load current value according to the pulling load current value used in the first test; the second acquisition module is used for acquiring an actual measurement current value corresponding to each pulling load current value from the main board to be detected and acquiring an actual measurement voltage value corresponding to the pulling load current value acquired from an oscilloscope; the first comparison module is used for respectively comparing the actually measured current value with the reference current value to obtain a first comparison result and comparing the actually measured voltage value with the reference voltage value to obtain a second comparison result; the first correction module is used for correcting the test tool loading device when the first comparison result does not meet the first preset error range requirement; and the second correction module is used for correcting the probe of the oscilloscope when the second comparison result does not meet the second preset error range requirement.
Optionally, the apparatus further comprises: the third acquisition module is used for acquiring a pulling load current value in a preset span range, a reference current value and a reference voltage value corresponding to the mainboard to be detected, which are preset, from the upper computer when the accessed mainboard to be detected is subjected to initial measurement; the fourth acquisition module is used for powering on the main board to be tested and acquiring a current value corresponding to the current main board to be tested and a voltage value corresponding to the current value under the condition of not carrying current; the second comparison module is used for comparing the current value with the reference current value to obtain a third comparison result, and comparing a voltage value corresponding to the current value with the reference voltage value to obtain a fourth comparison result; the first prompting module is used for controlling the GUI interface of the upper computer to display test passing information and prompting carrying out a pulling test when the third comparison result meets the first preset error range requirement and the fourth comparison result meets the second preset error range requirement; the test module is used for carrying out a first load test by utilizing the load current values in the preset span range and collecting the load current values in the first load test process, and the main board current value to be tested and the voltage value collected by the oscilloscope corresponding to each load current value; and the storage module is used for storing each pulling load current value, the current value of the main board to be tested corresponding to each pulling load current value and the voltage value acquired by the oscilloscope into the upper computer.
According to a third aspect, an embodiment of the present invention further discloses an electronic device, including: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to cause the at least one processor to perform the steps of the test correction method of the test tool of the first aspect or any alternative implementation of the first aspect.
According to a fourth aspect, an embodiment of the present invention also discloses a computer-readable storage medium, on which a computer program is stored, which computer program, when being executed by a processor, implements the steps of the test correction method of the test tool according to the first aspect or any of the alternative embodiments of the first aspect.
The technical scheme of the invention has the following advantages:
the invention provides a test correction method/device of a test tool, which comprises the following steps: when the connected main board to be tested is required to be duplicated, the detection equipment acquires historical test data from the upper computer, takes a current value corresponding to each pulling load current value acquired from the main board to be tested as a reference current value, and takes a corresponding voltage value acquired from the oscilloscope as a reference voltage value; controlling a test tool loading device to respond to the loading operation of the pulling load current value to the main board to be tested according to the pulling load current value used in the first test; obtaining an actual measurement current value and an actual measurement voltage value corresponding to each pulling load current value from a main board to be tested; respectively comparing the measured current value with a reference current value to obtain a first comparison result, and comparing the measured voltage value with the reference voltage value to obtain a second comparison result; and responding to corresponding correction operation according to the first comparison result and the second comparison result. When the mainboard to be tested is tested, the loading current and the measuring voltage of the testing tool are reliably debugged by acquiring the related testing data at the first test as the data of the comparison reference, so that the testing can be performed under the same testing parameter level no matter when the testing tool which is the same as or different from the first test is used, and the retest result of the mainboard to be tested due to the error influence caused by external factors such as the loading tool or an oscilloscope is avoided.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are needed in the description of the embodiments or the prior art will be briefly described, and it is obvious that the drawings in the description below are some embodiments of the present invention, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flowchart of a specific example of a test calibration method of a test tool according to an embodiment of the present invention;
FIG. 2 is a schematic diagram showing a test calibration method of a test tool according to an embodiment of the present invention;
FIG. 3 is a schematic block diagram of a specific example of a test calibration device of a test tool in an embodiment of the invention;
fig. 4 is a diagram illustrating an embodiment of an electronic device according to the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made apparent and fully in view of the accompanying drawings, in which some, but not all embodiments of the invention are shown. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the description of the present invention, it should be noted that the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In addition, the technical features of the different embodiments of the present invention described below may be combined with each other as long as they do not collide with each other.
The embodiment of the invention discloses a test correction method of a test tool, which is applied to a detection device, as shown in fig. 2, the detection device 1 is respectively connected with an upper computer 2, a test tool loading device 3, an oscilloscope 4 and a main board 5 to be tested, wherein the oscilloscope 4 is connected to the detection device 1 through a probe rod and is used for collecting a voltage value of the main board 5 to be tested, an MCU13, a current collecting module 11 and a voltage collecting module 12 are arranged in the detection device, the current collecting module 11 and the voltage collecting module 12 read corresponding current values and voltage values from the main board 5 to be tested through PMBus (Power Management Bus, a power management bus), and the upper computer 2 and the detection device 1 can be connected through USB and realize data transmission. As shown in fig. 1, the method comprises the steps of:
step 101, when the connected main board to be tested needs to be duplicated, historical test data are obtained from an upper computer, wherein the historical test data comprise a plurality of pulling load current values collected and stored when the main board to be tested is tested for the first time, a current value corresponding to each pulling load current value is obtained from the main board to be tested, a voltage value corresponding to each pulling load current value collected from an oscilloscope is obtained from the main board to be tested, the current value is used as a reference current value, and the voltage value is used as a reference voltage value.
The user can input a test instruction through a GUI interface of the upper computer, and when the upper computer receives the test instruction, the upper computer can communicate with the detection device through a USB protocol, and send the test instruction to the detection device, if the detection device receives the retest instruction when the user sends the retest instruction, the detection device determines that retest is currently required to be performed on the accessed motherboard to be tested, and obtains historical test data when the first pull load test is performed on the motherboard to be tested from the upper computer.
Step 102, controlling a test tool loading device to respond to the loading operation of the pulling load current value to the main board to be tested according to the pulling load current value used in the first test; illustratively, the test tool loading device may include a VRTT loading tool. The embodiment of the application does not limit the pulling load current value used in the first pulling load test, and a person skilled in the art can use the current value in a preset span range (Istep) of the upper computer as the pulling load current value for pulling load operation according to actual needs. When loading operation is carried out according to the pulling load current value in the preset span range, the current value in the preset span range has a minimum current value A and a maximum current value B when Istep pulls load current, the minimum current value A and the maximum current value B are pulled load first respectively, and then other Isetp currents in the dynamic preset span range are pulled.
Step 103, obtaining an actual measurement current value corresponding to each pulling load current value from a main board to be tested and obtaining an actual measurement voltage value corresponding to the collected pulling load current value from an oscilloscope;
step 104, respectively comparing the measured current value with the reference current value to obtain a first comparison result, and comparing the measured voltage value with the reference voltage value to obtain a second comparison result;
step 105, correcting the test tool loading device when the first comparison result does not meet the first preset error range requirement; in an exemplary embodiment of the present application, the first preset error range is not limited, and a person skilled in the art may determine that the first preset error range in the embodiment of the present application floats up and down by 0.2% based on the reference current value according to actual needs, when the compared error is within the range, it indicates that the first comparison result meets the first preset error range requirement, and when the compared error is not within the range, it indicates that the first comparison result does not meet the first preset error range requirement.
As an alternative embodiment of the present application, step 105 includes: when the first comparison result does not meet the first preset error range requirement, the pulling load current value loaded by the test tool loading equipment is adjusted until the first preset error range requirement is met; specifically, when the first comparison result does not meet the first preset error range requirement, the pulling load current value loaded by the test tool loading device can be continuously adjusted through the detection device to ensure that the comparison result of the actually measured current value and the reference current value obtained from the main board to be tested meets the requirement.
And 106, correcting the probe of the oscilloscope when the second comparison result does not meet the second preset error range requirement. In an exemplary embodiment of the present application, the second preset error range is not limited, and a person skilled in the art may determine that the second preset error range in the embodiment of the present application floats 0.2% based on the reference voltage value, when the compared error is within the range, it indicates that the second comparison result meets the second preset error range requirement, and when the compared error is not within the range, it indicates that the second comparison result does not meet the second preset error range requirement.
As an alternative embodiment of the present application, step 106 includes: and when the second comparison result does not meet the second preset error range requirement, a correction instruction is sent to the oscilloscope, so that the oscilloscope responds to internal correction operation according to the received correction instruction. Specifically, when the second comparison result does not meet the second preset error range requirement, a correction instruction can be sent to the oscilloscope through the detection equipment, so that the oscilloscope responds to the internal correction operation according to the received correction instruction until the second preset error range requirement is met, and the comparison result of the acquired actual measurement voltage value corresponding to the pulling load current value and the reference voltage value obtained from the oscilloscope is ensured to meet the requirement.
According to the test correction method of the test tool, when the mainboard to be tested is subjected to the test, the related test data is obtained as the data of the comparison reference during the first test, so that the test can be performed under the same test parameter level no matter the test tool which is the same as or different from the first test is used, and the influence of errors caused by external factors such as a loading tool or an oscilloscope on the retested result of the mainboard to be tested is avoided.
As an optional embodiment of the present invention, before step 101, the method further includes:
when the connected main board to be tested is subjected to initial measurement, a pulling load current value in a preset span range, a reference current value and a reference voltage value corresponding to the main board to be tested are obtained from an upper computer;
the method for acquiring the first test instruction of the accessed motherboard to be tested is the same as the method for acquiring the retest instruction, and is not limited herein. For any mainboard to be tested, different reference current values and reference voltage values are corresponding to different types of the mainboard to be tested, and the reference current values and the reference voltage values can be uploaded and interacted by a host computer.
Under the condition of no current carrying, powering on the main board to be tested and acquiring a current value (Imon) corresponding to the main board to be tested and a voltage value corresponding to the current value (Imon); the main board to be tested is powered on, the probe rod of the oscilloscope is connected to the detection equipment, the detection equipment is switched to the main board to be tested to read the voltage value (namely, the Vboost starting voltage value) of the current main board to be tested, and the voltage value can be displayed through the GUI interface of the upper computer.
Comparing the current value with the reference current value to obtain a third comparison result, and comparing the voltage value corresponding to the current value with the reference voltage value to obtain a fourth comparison result; when the third comparison result meets the first preset error range requirement and the fourth comparison result meets the second preset error range requirement, controlling a GUI interface of the upper computer to display test passing information and prompting to carry out a pulling load test; carrying out a first load test by using load current values within a preset span range, and collecting the load current values in the first load test process, and a main board current value to be tested corresponding to each load current value and a voltage value collected by an oscilloscope; and storing each pulling load current value, the current value of the main board to be tested corresponding to each pulling load current value and the voltage value acquired by the oscilloscope into an upper computer for parameter correction in the subsequent debugging process before retesting.
As an optional implementation manner of the invention, before each pulling load current value, the current value of the main board to be tested corresponding to each pulling load current value and the voltage value collected by the oscilloscope are stored in the upper computer, the method further comprises:
loading a reference current value of the main board to be tested to the main board to be tested during primary load pulling; comparing the pulling load current value acquired from the main board to be tested with the reference current value to obtain a fifth comparison result, and comparing the measured voltage value of the current main board to be tested acquired from the oscilloscope with the reference voltage value to obtain a sixth comparison result; when the fifth comparison result meets the first preset error range requirement and the sixth comparison result meets the second preset error range requirement, responding to loading of other pulling load current values in a preset span range and saving operation of the pulling load result.
In the first load test process, the reference current value of the main board to be tested is utilized to carry out load operation, after the load result is compared with the reference current value and the reference voltage value, other load current values are loaded to test after corresponding error range requirements are met, the test operation of other load current values is executed after the fault screening of the main board to be tested is realized, and the problem that all test results are invalid due to the faults of the main board to be tested after all load current values are directly tested is avoided, so that the test efficiency is affected.
As an optional embodiment of the present application, after step 104, the method further comprises: when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, controlling the GUI interface of the upper computer to display test passing information. The embodiment of the application does not limit the display type of the test passing information.
As an optional embodiment of the present application, after step 104, the method further comprises: when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, the retest prompt operation of the mainboard to be tested, which needs retest, is responded, so that the sweep frequency test can be performed on the mainboard to be tested. The embodiment of the application does not limit the prompt mode of retest prompt operation.
When debugging is needed, under the condition that dynamic results are retested for many times or when equipment of different VRTT tools and oscilloscopes is replaced, the test correction method of the test tool provided by the embodiment of the application takes data in the first test as a reference value to carry out subsequent retesting work, so that consistency of test results is ensured; and in retest, when the error of the acquired voltage and current value exceeds 0.2%, the detection equipment controls the VRTT tool or the oscilloscope to adjust until the error requirement is met, and the pulling current value is the minimum current value (such as 0A) and the maximum current value B, and any pulling current value between the minimum current value A and the maximum current value B and the corresponding actually measured current value and actually measured voltage value are acquired and compared, and the retest can be performed only when the error requirement is met, so that the accuracy of the test result is improved.
The embodiment of the invention also discloses a test correction device of the test tool, which is applied to the detection equipment, wherein the detection equipment is respectively connected with the upper computer, the test tool loading equipment, the oscilloscope and the main board to be tested, and the oscilloscope is used for collecting the voltage value of the main board to be tested; as shown in fig. 3, the apparatus includes:
the first obtaining module 201 is configured to obtain, when an accessed main board to be tested needs to be replicated, historical test data from an upper computer, where the historical test data includes a plurality of load current values collected and stored when the main board to be tested is tested for the first time, a current value corresponding to each load current value obtained from the main board to be tested, and a voltage value corresponding to each load current value collected from an oscilloscope, and the current value is used as a reference current value, and the voltage value is used as a reference voltage value; with specific reference to the foregoing embodiments, details are not repeated herein.
A first loading module 202, configured to control a loading operation of the test tool loading device to the motherboard to be tested in response to the pull load current value according to the pull load current value used during the first test; with specific reference to the foregoing embodiments, details are not repeated herein.
The second obtaining module 203 is configured to obtain, from the main board to be tested, an actually measured current value corresponding to each pulling load current value, and obtain, from an oscilloscope, an actually measured voltage value corresponding to the pulling load current value that is collected; with specific reference to the foregoing embodiments, details are not repeated herein.
The first comparison module 204 is configured to compare the measured current value with the reference current value to obtain a first comparison result, and compare the measured voltage value with the reference voltage value to obtain a second comparison result; with specific reference to the foregoing embodiments, details are not repeated herein.
A first correction module 205, configured to correct the test tool loading device when the first comparison result does not meet a first preset error range requirement; with specific reference to the foregoing embodiments, details are not repeated herein.
And a second correction module 206, configured to correct the probe of the oscilloscope when the second comparison result does not meet the second preset error range requirement. With specific reference to the foregoing embodiments, details are not repeated herein.
When the test correction device of the test tool is used for carrying out the test on the main board to be tested, the related test data is obtained as the data for comparison reference to carry out the reliable debugging on the loading current and the measuring voltage of the test tool, so that the test can be carried out under the same test parameter level no matter the test tool which is the same as or different from the first test tool is used, and the influence of errors caused by external factors such as a loading tool or an oscilloscope on the test result of the main board to be tested is avoided.
As an alternative embodiment of the present invention, the apparatus further comprises: the third acquisition module is used for acquiring a pulling load current value in a preset span range, a reference current value and a reference voltage value corresponding to the mainboard to be detected, which are preset, from the upper computer when the accessed mainboard to be detected is subjected to initial measurement; the fourth acquisition module is used for powering on the main board to be tested and acquiring a current value corresponding to the current main board to be tested and a voltage value corresponding to the current value under the condition of not carrying current; the second comparison module is used for comparing the current value with the reference current value to obtain a third comparison result, and comparing a voltage value corresponding to the current value with the reference voltage value to obtain a fourth comparison result; the first prompting module is used for controlling the GUI interface of the upper computer to display test passing information and prompting carrying out a pulling test when the third comparison result meets the first preset error range requirement and the fourth comparison result meets the second preset error range requirement; the test module is used for carrying out a first load test by utilizing the load current values in the preset span range and collecting the load current values in the first load test process, and the main board current value to be tested and the voltage value collected by the oscilloscope corresponding to each load current value; and the storage module is used for storing each pulling load current value, the current value of the main board to be tested corresponding to each pulling load current value and the voltage value acquired by the oscilloscope into the upper computer. With specific reference to the foregoing embodiments, details are not repeated herein.
As an alternative embodiment of the present invention, the apparatus further comprises: the second loading module is used for loading the reference current value of the main board to be tested to the main board to be tested when the load is pulled for the first time; the third comparison module is used for comparing the pulling load current value acquired from the main board to be tested with the reference current value to obtain a fifth comparison result, and comparing the measured voltage value of the current main board to be tested acquired from the oscilloscope with the reference voltage value to obtain a sixth comparison result; and the response module is used for responding to the loading of other pulling load current values in the preset span range and the saving operation of the pulling load result when the fifth comparison result meets the first preset error range requirement and the sixth comparison result meets the second preset error range requirement. With specific reference to the foregoing embodiments, details are not repeated herein.
As an alternative embodiment of the present invention, the first correction module 205 includes: the first correction submodule is used for adjusting the pulling load current value loaded by the test tool loading equipment until the first comparison result does not meet the first preset error range requirement; the second correction module 206 includes: and the second correction submodule is used for sending a correction instruction to the oscilloscope when the second comparison result does not meet the second preset error range requirement, so that the oscilloscope responds to internal correction operation according to the received correction instruction. With specific reference to the foregoing embodiments, details are not repeated herein.
As an alternative embodiment of the present invention, the apparatus further comprises: and when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, controlling the GUI interface of the upper computer to display test passing information. With specific reference to the foregoing embodiments, details are not repeated herein.
As an alternative embodiment of the present invention, the apparatus further comprises: and the second prompting module is used for controlling the GUI interface of the upper computer to display test passing information when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement. With specific reference to the foregoing embodiments, details are not repeated herein.
As an alternative embodiment of the present invention, the apparatus further comprises: and the third prompting module is used for responding to retest prompting operation of the mainboard to be retested when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement. With specific reference to the foregoing embodiments, details are not repeated herein.
The embodiment of the present invention further provides an electronic device, as shown in fig. 4, which may include a processor 401 and a memory 402, where the processor 401 and the memory 402 may be connected by a bus or other means, and in fig. 4, the connection is exemplified by a bus.
The processor 401 may be a central processing unit (Central Processing Unit, CPU). The processor 401 may also be other general purpose processors, digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), field programmable gate arrays (Field-Programmable Gate Array, FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or combinations thereof.
The memory 402 is used as a non-transitory computer readable storage medium for storing non-transitory software programs, non-transitory computer executable programs, and modules, such as program instructions/modules corresponding to the test calibration method of the test tool in the embodiment of the invention. The processor 401 executes various functional applications of the processor and data processing, i.e., implements the test correction method of the test tool in the above-described method embodiments, by running non-transitory software programs, instructions, and modules stored in the memory 402.
Memory 402 may include a storage program area that may store an operating system, at least one application program required for functionality, and a storage data area; the storage data area may store data created by the processor 401, or the like. In addition, memory 402 may include high-speed random access memory, and may also include non-transitory memory, such as at least one magnetic disk storage device, flash memory device, or other non-transitory solid state storage device. In some embodiments, memory 402 may optionally include memory located remotely from processor 401, such remote memory being connectable to processor 401 through a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The one or more modules are stored in the memory 402, which when executed by the processor 401, performs a test correction method of the test tool in the embodiment shown in fig. 1.
The specific details of the electronic device may be understood correspondingly with respect to the corresponding related descriptions and effects in the embodiment shown in fig. 1, which are not repeated herein.
It will be appreciated by those skilled in the art that implementing all or part of the above-described embodiment method may be implemented by a computer program to instruct related hardware, where the program may be stored in a computer readable storage medium, and the program may include the above-described embodiment method when executed. Wherein the storage medium may be a magnetic Disk, an optical Disk, a Read-Only Memory (ROM), a random access Memory (RandomAccessMemory, RAM), a Flash Memory (Flash Memory), a Hard Disk (HDD), a Solid State Drive (SSD), or the like; the storage medium may also comprise a combination of memories of the kind described above.
Although embodiments of the present invention have been described in connection with the accompanying drawings, various modifications and variations may be made by those skilled in the art without departing from the spirit and scope of the invention, and such modifications and variations are within the scope of the invention as defined by the appended claims.
Claims (10)
1. The test correction method of the test tool is characterized by being applied to detection equipment, wherein the detection equipment is respectively connected with an upper computer, test tool loading equipment, an oscilloscope and a main board to be tested, and the oscilloscope is used for collecting the voltage value of the main board to be tested; the method comprises the following steps:
when an accessed mainboard to be tested needs to be subjected to the recovery, historical test data are obtained from an upper computer, wherein the historical test data comprise a plurality of pulling load current values which are collected and stored when the mainboard to be tested is subjected to the primary test, a current value corresponding to each pulling load current value is obtained from the mainboard to be tested, a voltage value corresponding to each pulling load current value which is collected from an oscilloscope is obtained from the mainboard to be tested, the current value is used as a reference current value, and the voltage value is used as a reference voltage value;
controlling the loading operation of the test tool loading device to the main board to be tested in response to the pulling load current value according to the pulling load current value used in the first test;
obtaining an actual measurement current value corresponding to each pulling load current value from the main board to be tested and obtaining an actual measurement voltage value corresponding to the pulling load current value from an oscilloscope;
respectively comparing the measured current value with the reference current value to obtain a first comparison result, and comparing the measured voltage value with the reference voltage value to obtain a second comparison result;
When the first comparison result does not meet the first preset error range requirement, correcting the test tool loading equipment;
and correcting the probe of the oscilloscope when the second comparison result does not meet the second preset error range requirement.
2. The method of claim 1, wherein before the historical test data is obtained from the host computer when the accessed motherboard to be tested needs to be duplicated, the method further comprises:
when the connected main board to be tested is started, a pulling load current value in a preset span range, a reference current value and a reference voltage value corresponding to the main board to be tested are obtained from the upper computer;
under the condition of no current carrying, powering on the main board to be tested and acquiring a current value corresponding to the current main board to be tested and a voltage value corresponding to the current value;
comparing the current value with the reference current value to obtain a third comparison result, and comparing a voltage value corresponding to the current value with the reference voltage value to obtain a fourth comparison result;
when the third comparison result meets the first preset error range requirement and the fourth comparison result meets the second preset error range requirement, controlling a GUI interface of the upper computer to display test passing information and prompting to carry out a pulling test;
Carrying out a first load test by using the load current values in the preset span range and collecting the load current values in the first load test process, and a main board current value to be tested and an oscilloscope collected voltage value corresponding to each load current value;
and storing each pulling load current value, the current value of the main board to be tested corresponding to each pulling load current value and the voltage value acquired by the oscilloscope into the upper computer.
3. The method of claim 2, wherein before storing the current value of each pull-load current value and the current value of the motherboard to be tested and the voltage value collected by the oscilloscope corresponding to each pull-load current value in the upper computer, the method further comprises:
loading a reference current value of the main board to be tested to the main board to be tested when the load is pulled for the first time;
comparing the pulling load current value acquired from the main board to be tested with the reference current value to obtain a fifth comparison result, and comparing the measured voltage value of the current main board to be tested acquired from the oscilloscope with the reference voltage value to obtain a sixth comparison result;
and when the fifth comparison result meets the first preset error range requirement and the sixth comparison result meets the second preset error range requirement, responding to loading of other pulling load current values in the preset span range and saving operation of the pulling load result.
4. The method of claim 1, wherein correcting the test tool loading device when the first comparison result does not meet a first predetermined error range requirement comprises:
when the first comparison result does not meet the first preset error range requirement, the pulling load current value loaded by the test tool loading equipment is adjusted until the first preset error range requirement is met;
when the second comparison result does not meet the second preset error range requirement, correcting the probe of the oscilloscope, including:
and when the second comparison result does not meet the second preset error range requirement, a correction instruction is sent to the oscilloscope, so that the oscilloscope responds to internal correction operation according to the received correction instruction.
5. The method of claim 1, wherein after comparing the measured current value with a reference current value to obtain a first comparison result and comparing the measured voltage value with a reference voltage value to obtain a second comparison result, respectively, the method further comprises:
and when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, controlling the GUI interface of the upper computer to display test passing information.
6. The method of claim 1, wherein after comparing the measured current value with a reference current value to obtain a first comparison result and comparing the measured voltage value with a reference voltage value to obtain a second comparison result, respectively, the method further comprises:
and when the first comparison result meets the first preset error range requirement and the second comparison result meets the second preset error range requirement, responding to retest prompt operation of the mainboard to be tested, which needs retest.
7. The test correction device of the test tool is characterized by being applied to detection equipment, wherein the detection equipment is respectively connected with an upper computer, test tool loading equipment, an oscilloscope and a main board to be tested, and the oscilloscope is used for collecting the voltage value of the main board to be tested; the device comprises:
the first acquisition module is used for acquiring historical test data from an upper computer when an accessed mainboard to be tested needs to be duplicated, wherein the historical test data comprises a plurality of pulling load current values acquired and stored when the mainboard to be tested is tested for the first time, a current value corresponding to each pulling load current value and a voltage value corresponding to each pulling load current value acquired from an oscilloscope are acquired from the mainboard to be tested, the current value is used as a reference current value, and the voltage value is used as a reference voltage value;
The first loading module is used for controlling the loading operation of the test tool loading device to the main board to be tested in response to the pulling load current value according to the pulling load current value used in the first test;
the second acquisition module is used for acquiring an actual measurement current value corresponding to each pulling load current value from the main board to be detected and acquiring an actual measurement voltage value corresponding to the pulling load current value acquired from an oscilloscope;
the first comparison module is used for respectively comparing the actually measured current value with the reference current value to obtain a first comparison result and comparing the actually measured voltage value with the reference voltage value to obtain a second comparison result;
the first correction module is used for correcting the test tool loading device when the first comparison result does not meet the first preset error range requirement;
and the second correction module is used for correcting the probe of the oscilloscope when the second comparison result does not meet the second preset error range requirement.
8. The apparatus of claim 7, wherein the apparatus further comprises:
the third acquisition module is used for acquiring a pulling load current value in a preset span range, a reference current value and a reference voltage value corresponding to the mainboard to be detected, which are preset, from the upper computer when the accessed mainboard to be detected is subjected to initial measurement;
The fourth acquisition module is used for powering on the main board to be tested and acquiring a current value corresponding to the current main board to be tested and a voltage value corresponding to the current value under the condition of not carrying current;
the second comparison module is used for comparing the current value with the reference current value to obtain a third comparison result, and comparing a voltage value corresponding to the current value with the reference voltage value to obtain a fourth comparison result;
the first prompting module is used for controlling the GUI interface of the upper computer to display test passing information and prompting carrying out a pulling test when the third comparison result meets the first preset error range requirement and the fourth comparison result meets the second preset error range requirement;
the test module is used for carrying out a first load test by utilizing the load current values in the preset span range and collecting the load current values in the first load test process, and the main board current value to be tested and the voltage value collected by the oscilloscope corresponding to each load current value;
and the storage module is used for storing each pulling load current value, the current value of the main board to be tested corresponding to each pulling load current value and the voltage value acquired by the oscilloscope into the upper computer.
9. An electronic device, comprising: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to cause the at least one processor to perform the steps of the test correction method of the test tool of any of claims 1-6.
10. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, carries out the steps of the test correction method of a test tool according to any one of claims 1-6.
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