CN114442591B - Method, system and medium for testing channel precision of I/O card - Google Patents
Method, system and medium for testing channel precision of I/O card Download PDFInfo
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
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- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Abstract
The application provides a method, a system and a medium for testing the channel precision of an I/O card, wherein the method comprises the following steps: connecting an input/output (I/O) card to be tested to preset test equipment, wherein the I/O card is provided with M channels, and M is a positive integer; applying 2n corresponding test data to each channel through test equipment, and obtaining a test result corresponding to each test data, wherein n is a positive integer, and the (n+1) th to (2) th test data are return data which are mirror symmetry with the (1) th to (n) th test data; calculating the maximum return difference and the accuracy of each channel in sequence according to all the test results of each channel; and comparing the maximum return difference and the precision with a preset standard maximum return difference and standard precision, and judging whether the performance of each channel is qualified or not. The method realizes the automatic test of the channel precision of the I/O card, improves the efficiency and the accuracy of the channel precision test, and reduces the test cost.
Description
Technical Field
The present disclosure relates to the field of signal testing technologies, and in particular, to a method, a system, and a medium for testing channel accuracy of an I/O card.
Background
At present, input/Output (I/O) cards are often used in distributed control systems (Distributed Control System, DCS). The I/O cards are modules that can receive analog and digital signals from a production site and then convert to digital signals that can be received by a controller of the decentralized control system. For example, the most commonly used Analog I/O cards in a production site are Analog Input (AI) cards and Analog Output (AO) cards with a measurement range of 4mA to 20 mA. In order to ensure the normal operation of the I/O card, the channel accuracy of the I/O card needs to be tested.
In the related art, a manual testing method is generally adopted when the accuracy of the I/O card channel is tested. Specifically, when the accuracy of the AI fastener channel is tested, a current signal is manually applied to the AI fastener channel to be tested in sequence, and the display value of the channel is read in a distributed control system. When the accuracy of the AO clamping piece channel is tested, the numerical value of the channel to be tested is modified in the distributed control system, and then the current of the clamping piece end is measured by using a testing instrument.
However, the applicant found that, since the I/O card generally has a plurality of channels, the manner of testing by the above-mentioned manual operation test apparatus and recording data and calculating test results consumes much time and effort, at least two workers are required to cooperate to complete the test work, and errors are easily made during the operation and recording of data during the manual test, and the accuracy of the measurement results is low.
Disclosure of Invention
The present application aims to solve, at least to some extent, one of the technical problems in the related art.
Therefore, a first object of the present application is to provide a method for testing the channel accuracy of an I/O card, which can automatically test the channel accuracy of the I/O card on line, and can test the channel accuracy and output the result with high efficiency, thereby improving the efficiency and accuracy of channel accuracy testing and reducing the testing cost.
The second purpose of the application is to provide a test system for the channel precision of the I/O card;
a third object of the present application is to propose a non-transitory computer readable storage medium.
In order to achieve the above object, an embodiment of a first aspect of the present application provides a method for testing the channel accuracy of an I/O card, the method comprising the following steps:
connecting an input/output (I/O) card to be tested to preset test equipment, wherein the I/O card is provided with M channels, and M is a positive integer;
applying 2n corresponding test data to each channel through the test equipment, and obtaining a test result corresponding to each test data, wherein n is a positive integer, and the (n+1) th to (2) th test data are return data which are mirror symmetry with the (1) th to (n) th test data;
Calculating the maximum return difference and the maximum precision of each channel in sequence according to all the test results of each channel;
and comparing the maximum return difference and the precision with a preset standard maximum return difference and standard precision, and judging whether the performance of each channel is qualified or not.
Optionally, in one embodiment of the present application, the test apparatus includes: analog quantity output AO signal detection interface terminal, current signal detection unit, analog quantity input AI signal output interface terminal, current signal generation unit, AI fastener interface unit, AO fastener interface unit, decentralized processing unit DPU, centralized processor, memory, man-machine interface unit, power and communication bus, to wait to test input/output I/O fastener to preset test equipment, include: when the I/O clamping piece to be tested is an AI clamping piece, the AI clamping piece is inserted into the AI clamping piece interface unit, and a wiring terminal of the AI clamping piece is connected with the analog input AI signal output interface terminal; when the I/O card to be tested is an AO card, the AO card is inserted into the AO card interface unit, and the connection terminal of the AO card is connected with the analog output AO signal detection interface terminal.
Optionally, in one embodiment of the present application, an analog input AI signal output interface terminal is connected to the current signal generating unit, and the testing device applies 2n pieces of corresponding test data to each channel respectively and obtains a test result corresponding to each piece of test data, where the step S10 includes determining that a first channel of the AI card is a current channel when the I/O card to be tested is an AI card; s11, controlling the current signal generation unit to output first test data corresponding to the current channel, wherein the first test data comprise test current signals with 2n preset current values, and the preset current values are determined based on the measuring range of the current channel; s12, applying the first test data to the current channel through the analog input AI signal output interface terminal, sequentially obtaining a test result corresponding to each test current signal output by the current channel, and storing the first test data and the test result into the memory after all 2n test current signals are tested; and S13, judging whether the current channel is the last channel of the AI clamping member, if not, switching to the next channel of the current channel, and repeatedly executing S11 and S12 until all channels of the AI clamping member are tested.
Optionally, in one embodiment of the present application, an analog output AO signal detection interface terminal is connected to the current signal detection unit, where the test device applies 2n pieces of corresponding test data to each channel, and obtains a test result corresponding to each piece of test data, and the method further includes determining, when the I/O card to be tested is an AO card, that a first channel of the AO card is a current channel; s21, adjusting second test data output by a distributed control system DCS to the current channel, wherein the second test data comprise test current signals with 2n preset current values, and the preset current values are determined based on the measuring range of the current channel; s22, applying the second test data to the current channel through the DPU, transmitting an output signal corresponding to each test current signal output by the current channel through the analog output AO signal detection interface terminal, measuring the value of the output signal through the current signal detection unit to obtain a test result corresponding to each test current signal, and storing the second test data and the test result into the memory after all 2n test current signals are tested; s23, judging whether the current channel is the last channel of the AO card, if not, switching to the next channel of the current channel, and repeatedly executing S21 and S22 until all channels of the AO card are tested.
Optionally, in one embodiment of the present application, calculating the maximum return difference and the accuracy of each channel sequentially according to all the test results of each channel includes, for each channel, calculating the difference between the test results of the 1 st to nth test data and the test results of the corresponding backhaul data, and taking the absolute value of the difference as the return difference; selecting the return difference with the largest numerical value from all the return differences as the maximum return difference; calculating an error between each test data and a corresponding test result, wherein the error is an absolute value of a difference value between each test data and the corresponding test result; selecting the error with the largest numerical value from all errors, and calculating the precision by the following formula:
R j ＝{(max△y)/(x n -x 1 )}*100％
where j is the current channel, max Δy is the error with the largest value, x n -x 1 The value of (2) is the span of the current channel.
Optionally, in one embodiment of the present application, after the corresponding 1 st to nth test data is applied to each of the channels by the test apparatus, the method further includes: overrun test data is applied to each of the channels, the overrun test being performed prior to the backhaul test.
Optionally, in an embodiment of the present application, before the testing device applies the corresponding 2n pieces of test data to each channel, the method further includes performing communication failure detection on the I/O card to be tested, and determining whether the communication of the I/O card to be tested is normal.
In order to achieve the above objective, an embodiment of a second aspect of the present application further provides a system for testing the channel accuracy of an I/O card, including:
the connecting module is used for connecting an input/output (I/O) card to be tested to preset testing equipment, wherein the I/O card is provided with M channels, and M is a positive integer;
the test module is used for respectively applying 2n corresponding test data to each channel through the test equipment and obtaining a test result corresponding to each test data, wherein n is a positive integer, and the (n+1) th to (2) th test data are return data which are mirror symmetry with the (1) th to (n) th test data;
the calculation module is used for sequentially calculating the maximum return difference and the maximum precision of each channel according to all the test results of each channel;
and the judging module is used for comparing the maximum return difference and the precision with a preset standard maximum return difference and standard precision and judging whether the performance of each channel is qualified or not.
Optionally, in one embodiment of the present application, the test apparatus includes: analog quantity output AO signal detection interface terminal, current signal detecting element, analog quantity input AI signal output interface terminal, current signal generation unit, AI fastener interface unit, AO fastener interface unit, decentralized processing unit DPU, centralized processor, memory, man-machine interface unit, power and communication bus, connection module specifically is used for: when the I/O clamping piece to be tested is an AI clamping piece, the AI clamping piece is inserted into the AI clamping piece interface unit, and a wiring terminal of the AI clamping piece is connected with the analog input AI signal output interface terminal; when the I/O card to be tested is an AO card, the AO card is inserted into the AO card interface unit, and the connection terminal of the AO card is connected with the analog output AO signal detection interface terminal.
The technical scheme provided by the embodiment of the application at least brings the following beneficial effects: the method comprises the steps of connecting an input/output (I/O) card to be tested to preset test equipment, respectively applying corresponding 2n test data to each channel through the test equipment, obtaining test results corresponding to each test data, sequentially calculating the maximum return difference and the accuracy of each channel according to all the test results of each channel, and finally comparing the maximum return difference and the accuracy with preset standard maximum return difference and standard accuracy to judge whether the performance of each channel is qualified. The scheme can realize the automatic control of the testing process, the data recording process, the data calculating process and the result judging process of the channel precision of the I/O card, automatically test the channel precision of the I/O card on line, realize the accurate and real-time rapid testing of the channel precision of the I/O card, and can test the channel precision and output the result with high efficiency. Therefore, the efficiency and the accuracy of the accuracy test of the I/O card channel are improved, the complexity of the test is reduced, and the test cost is reduced.
In order to implement the above embodiment, an embodiment of a third aspect of the present application further provides a non-transitory computer readable storage medium having a computer program stored thereon, where the computer program when executed by a processor implements the method for testing the accuracy of the I/O card channel in the above embodiment.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The foregoing and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings, in which:
FIG. 1 is a flow chart of a method for testing the channel accuracy of an I/O card according to an embodiment of the present application;
fig. 2 is a schematic hardware structure of a specific test device according to an embodiment of the present application;
FIG. 3 is a flowchart of a method for performing channel accuracy testing on an AI card member according to an embodiment of the disclosure;
FIG. 4 is a flowchart of a method for performing channel accuracy testing on an AO card according to an embodiment of the present application;
FIG. 5 is a schematic flow chart of a method for testing the channel accuracy of an I/O card according to an embodiment of the present application;
fig. 6 is a schematic structural diagram of a test system for channel accuracy of an I/O card according to an embodiment of the present application.
Detailed Description
Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative and intended to explain the present invention and should not be construed as limiting the invention.
When testing the accuracy of the I/O card channel, the manual testing method is complicated in testing process, and occupies more manpower resources and time resources. For example, in the thermal power generation industry, when the accuracy of the I/O card channel is tested according to the requirements of the related regulations, the test signals are usually selected to be 0%, 25%, 50%, 75% and 100% of the range of the channel to be tested, and the return signals need to be measured, so that each channel to be tested is tested once, and at least 11 times of manual repeated operations are required. Each clamping piece is provided with a plurality of channels, and according to different manufacturers and models, the clamping pieces are provided with 8 channels, 16 channels and other types, so that the complexity of the test is further increased. In addition, in the data testing process, errors are likely to occur in the operation steps of manually operating a test instrument, manually recording the numerical value of each channel and recording the numerical value into a computer, and the like, so that the testing accuracy is low.
Therefore, the method for testing the channel precision of the I/O clamping piece can conveniently and accurately automatically test parameters such as the precision of the channel of the I/O clamping piece and judge whether the channel of the I/O clamping piece meets the actual requirement.
The following describes a method and a system for testing the channel accuracy of an I/O card according to the embodiment of the invention with reference to the accompanying drawings.
Fig. 1 is a flowchart of a method for testing the channel accuracy of an I/O card according to an embodiment of the present application, as shown in fig. 1, where the method includes the following steps:
step S101, connecting an input/output (I/O) card to be tested to a preset test device, wherein the I/O card has M channels, and M is a positive integer.
The I/O card to be tested can be various types of analog I/O cards, including AI card or AO card, and the I/O card to be tested can be various types of I/O card with different channel numbers and corresponding different channel measuring ranges. The I/O card has M channels, M can be any positive integer, namely M is the number of channels actually possessed by the I/O card to be tested currently.
The test equipment is preset equipment capable of automatically testing the connected I/O card, collecting test data, processing the data after the data collection is completed and outputting test results, and comprises hardware for executing various functions and a pre-stored test software program.
In one embodiment of the present application, as shown in fig. 2, the test apparatus 100 may include an analog output AO signal detection interface terminal 101, a current signal detection unit 102, an analog input AI signal output interface terminal 103, a current signal generation unit 104, an AI card interface unit 105, an AO card interface unit 106, a decentralized processing unit DPU107, a centralized processor 108, a memory 109, a human interface unit 110, a power supply 111, and a communication bus 112.
In this example, the analog output AO signal detection interface terminal 101 is a terminal array, and may be provided as 18 pairs of terminals, each pair of terminals being connected correspondingly to the pair of output terminals of the AO clamp.
The current signal detection unit 102 is connected to the AO signal detection interface terminal, and is configured to detect a current value of the AO card channel output signal, and transmit the current value to the memory 109.
Analog input AI signal output interface terminals 103 are an array of terminals, which may be provided as 18 pairs of terminals, each pair of terminals being correspondingly connected to a pair of input terminals of an AI card.
The current signal generating unit 104 is connected to the analog input AI signal output interface terminal 103 for generating a current signal applied to the AI fastener channel and transmitting a current value of the current signal to the memory.
AI card interface unit 105 includes a plurality of types of AI card slots for connecting AI cards. The AO card interface unit 106 includes a plurality of types of AO card slots for connecting AO cards.
The decentralized processing unit (Distributed Processing Unit, abbreviated as DPU) 107 is configured to execute a control policy, implement functions of continuously adjusting a card channel and transmitting data, and implement data acquisition, alarm limit check, and the like.
The centralized processor 108 is configured to obtain software programs corresponding to different test phases from the memory 109 and execute the read programs, so as to implement data collection, data processing, and other tasks.
The memory 109 is used for storing a preset test software program, an operating system and data related to the test.
The man-machine interface unit 110 is configured to connect with a man-machine interaction device such as a display screen and a mouse, so that a worker can interact with the test device conveniently, for example, to display a test result to the worker, or to receive test data set by the worker.
A power supply 111 for supplying power to the test device. A communication bus 112 for transmitting data between the above-mentioned hardware devices.
The connection manner of each component in the test device is as shown in fig. 2, the analog input AI signal output interface terminal 103 is connected to the current signal generating unit 104, and the analog output AO signal detection interface terminal 101 is connected to the current signal detecting unit 102.
In the implementation, according to the type of the I/O card to be tested, the I/O card is connected with a corresponding interface in the testing equipment, so that the testing equipment can call a corresponding testing program to perform channel precision testing according to the accessed I/O card.
As a possible implementation, with continued reference to the example shown in fig. 2, when the I/O card to be tested is an AI card, the AI card is plugged onto the AI card interface unit 105 and the connection terminals of the AI card are connected to the analog input AI signal output interface terminal 103. When the I/O card to be tested is an AO card, the AO card is inserted into the AO card interface unit 106, and the connection terminal of the AO card is connected with the analog output AO signal detection interface terminal 101. Thereby completing the connection between the test equipment and the I/O card and facilitating the subsequent test.
It should be noted that, in the testing process, the I/O card may need to perform communication, for example, the I/O card transmits the data output by the channel to the testing device, so in order to ensure the execution of the channel test, it is necessary to determine that the communication function of the I/O card to be tested is normal. In one embodiment of the present application, after the I/O card to be tested is connected to the preset test device, before the test is performed, the communication failure of the I/O card to be tested is further detected, whether the communication of the I/O card to be tested is normal is determined, and after it is determined that the I/O card has no communication failure, a subsequent test step is performed. When the I/O card is determined to have communication faults, a user can be reminded of eliminating the communication faults by means of giving an alarm and the like.
Step 102, applying 2n corresponding test data to each channel through the test equipment, and obtaining a test result corresponding to each test data, wherein n is a positive integer, and the (n+1) th to (2) th test data are return data which are mirror symmetry with the (1) th to (n) th test data.
Specifically, for M channels of the I/O card to be tested, 2n data are measured for each channel, where n is a positive integer, the n+1st through 2nth test data are backhaul data that are mirror symmetry with the 1 st through nth test data, i.e., the first bit of the test data applied to the I/O card is equal to the last bit, the second bit is equal to the penultimate bit, and so on. The value of each test data can be determined according to the current measuring range of the channel to be tested of the I/O card.
For example, when the I/O card to be tested is an 8-channel AI card, if the current range of the channel to be tested is 4 to 20mA, the preset measurement points may be 0%, 25%, 50%, 75%, and 100% of the range, that is, the determined first test data is a current signal of 4mA, the second test data is 8mA, the third test data is 12mA, the fourth test data is 16mA, the fifth test data is 20mA, and the set of preset test data is {4,8,12,16,20, 20,16,12,8,4} can be obtained by combining the return data.
Further, the first channel of the clamping piece is selected as an initial channel for testing, after one test data is applied to the current test channel from the first test data corresponding to the first test channel, the numerical value output by the channel is obtained, namely, the test result corresponding to the current test data is obtained, and the test results corresponding to all 2n test data are obtained. Further, after the first channel of the clamping piece is tested, the second channel of the clamping piece is switched to be tested until all M channels of the clamping piece are tested.
In implementation, corresponding test data can be applied to the channel of the I/O card through related components in the test equipment, and a test result is obtained. In order to more clearly illustrate the specific implementation process of applying 2n corresponding test data to a channel through test equipment and acquiring a test result corresponding to each test data, two embodiments for performing channel precision test on an AI card and an AO card are described below,
in one embodiment of the present application, when the AI fastener is tested for channel accuracy, as shown in fig. 3, the test method may include the following steps:
And S10, when the I/O card to be tested is an AI card, determining the first channel of the AI card as the current channel.
Specifically, when the I/O card to be tested is an AI card, the current AI card is connected to the test device according to the connection manner of the AI card and the test device in the foregoing embodiment, which is not described herein again. And initializing the channel to be tested and the test data of the AI card, and taking the first channel of the AI card as the initial channel for testing at first.
And S11, controlling the current signal generating unit to output first test data corresponding to the current channel, wherein the first test data comprise 2n test current signals with preset current values, and the preset current values are determined based on the measuring range of the current channel.
Specifically, initializing test data of a current test channel, determining first test data corresponding to the current channel according to the range of the current channel, wherein the first test data comprises 2n test current signals with preset current values, the current values of the test current signals are determined according to the range of the channel, so that an array of the test current signals of the current channel is obtained, and the first test current signal in the array is used as initial test data which is firstly input into the test channel. Then, the control current signal generation unit 104 outputs a test current signal.
And S12, applying the first test data to the current channel through an analog quantity input AI signal output interface terminal, sequentially obtaining a test result corresponding to each test current signal output by the current channel, and storing the first test data and the test result into a memory after all 2n test current signals are tested.
Specifically, since the analog input AI signal output interface terminal 103 is connected to the current signal generating unit 104, the test current signal output by the current signal generating unit 104 is applied to the current channel of the AI module through the wiring of 103. And, the test current signal input to the channel is sent from 104 to the DPU107, and sent to the centralized processor 108 and the memory 109 via the DPU107, so that the subsequent centralized processor 108 can perform test calculation, and the memory 109 stores test data.
Further, based on the detection function of the AI clamping member, the numerical value of an output signal corresponding to the test current signal output by the current channel is detected, so that a test result is obtained. And starting from the initial test data, acquiring a test result corresponding to the test data output by the current channel, and inputting the next test data in the array to the current channel until the test results corresponding to 2n test current signals are acquired, so as to generate a test result array. The array of test results is then stored in memory 109.
And S13, judging whether the current channel is the last channel of the AI clamping member, if not, switching to the next channel of the current channel, and repeatedly executing S11 and S12 until all channels of the AI clamping member are tested.
Specifically, after the initial channel test is completed, the next channel is switched to, and the step S11 and the step S12 are repeatedly executed to perform the test until all the channels of the current AI fastener are completely tested.
In another embodiment of the present application, when the channel accuracy test is performed on the AO card, as shown in fig. 4, the method includes the following steps:
and S20, when the I/O card to be tested is an AO card, determining the first channel of the AO card as the current channel.
Specifically, when the I/O card to be tested is an AO card, the current AO card is connected to the test device according to the connection manner of the AO card and the test device in the above embodiment, which is not described herein. And initializing a channel to be tested and test data of the AO card, and taking the first channel of the AO card as the initial channel for testing at first.
And S21, adjusting second test data output by the distributed control system DCS to the current channel, wherein the second test data comprise 2n test current signals with preset current values, and the preset current values are determined based on the measuring range of the current channel.
Specifically, in the distributed control system applied to the AO card, the numerical value of the test data outputted by the system to the channel to be tested is modified, namely, when the test data of the current test channel of the AO card is initialized, second test data corresponding to the current channel is determined according to the measuring range of the current channel, the second test data comprises 2n test current signals with preset current values, the current values of the test current signals are determined according to the measuring range of the channel, so that an array of the test current signals of the current channel is obtained, and the first test current signal in the array is used as initial test data which is firstly input to the test channel. And then, according to the obtained array of the test current signals, modifying the output value of the DCS system to the current channel, so that the output test data of the system to the current channel is consistent with the array of the test current signals. And also sends an array of test current signals to memory 109 for storage.
S22, applying second test data to the current channel through the DPU, transmitting output signals corresponding to each test current signal output by the current channel through the analog output AO signal detection interface terminal, measuring the numerical value of the output signals through the current signal detection unit to obtain test results corresponding to each test current signal, and storing the second test data and the test results into a memory after all 2n test current signals are tested.
Specifically, the second test data is applied to the current channel through the DPU, and the current channel outputs an output signal corresponding to each test data to the analog output AO signal detection interface terminal 101, and the current signal detection unit 102 measures the value actually output by the channel through 101 to obtain the test result. And starting from the initial test data, acquiring a test result corresponding to the test data output by the current channel, and inputting the next test data in the array to the current channel until the test results corresponding to 2n test current signals are acquired, so as to generate a test result array. The array of test results is then stored in memory 109.
S23, judging whether the current channel is the last channel of the AO card, if not, switching to the next channel of the current channel, and repeatedly executing S21 and S22 until all channels of the AO card are tested.
Specifically, after the initial channel test is completed, the channel is switched to the next channel, and the step S21 and the step S22 are repeatedly executed to perform the test until all the channels of the current AO card are completely tested.
Therefore, 2n pieces of test data corresponding to the channels are respectively applied to each channel through the test equipment, the test result corresponding to each piece of test data is obtained, the test results of all channels of the clamping piece are further obtained, and the accuracy of each channel is conveniently calculated according to the measured test results.
In order to obtain the test data of the channel more fully, the operation condition of the channel in the state exceeding the range limit is known, and the overrun test can be performed on the current channel before the return test is performed. In one embodiment of the present application, after the corresponding 1 st to nth test data is applied to each channel by the test device, the method further includes applying overrun test data to each channel, and performing overrun test before performing backhaul test.
For example, with continued reference to the above example, when the array of the preset test data is {4,8,12,16,20, 20,16,12,8,4}, the current may be applied to an overrun value, such as 21mA, before outputting the 2 nd 20mA signal to the test channel, and then the backhaul test is performed after the overrun test.
And 103, sequentially calculating the maximum return difference and the accuracy of each channel according to all the test results of each channel.
Specifically, after testing all channels of the I/O card to be tested is completed, calculating the maximum return difference and accuracy of the channel according to the test results corresponding to 2n test data of the first channel, and sequentially calculating the maximum return difference and accuracy of all channels.
In specific implementation, as a possible implementation manner, the difference between the test results of the 1 st to nth test data and the test results of the corresponding backhaul data may be calculated for each channel, the absolute value of the difference is taken as the return difference, and then the return difference with the largest value is selected from all the return differences as the maximum return difference, so that the maximum return difference of the channel is calculated.
Further, calculating an error between each test data and the corresponding test result, wherein the error is an absolute value of a difference between each test data and the corresponding test result, then selecting an error with the largest numerical value from all errors, and calculating the precision of the channel by the following formula:
R j ＝{(max△y)/(x n -x 1 )}*100％
where j is the current channel, max Δy is the error with the largest value, x n -x 1 The value of (2) is the span of the current channel.
Therefore, the maximum return difference, the precision and other parameters of each channel are calculated, and the channel precision is measured.
And 104, comparing the maximum return difference and the maximum return difference with the preset standard maximum return difference and standard precision, and judging whether the performance of each channel is qualified or not.
Specifically, the standard maximum return difference and the standard precision are factors such as the combination of actual application requirements and relevant specifications of the I/O card, and the minimum threshold value which is preset and used for determining that the performance of the I/O card reaches the qualified standard. In the embodiment of the application, the calculated maximum return difference and precision of each channel are respectively compared with the preset standard maximum return difference and standard precision, and if the maximum return difference of the channel is larger than the standard maximum return difference and the precision is larger than the standard precision, the channel is judged to be qualified.
In summary, according to the method for testing the channel accuracy of the I/O card in the embodiment of the present application, the I/O card to be tested is first connected to a preset test device, then 2n pieces of corresponding test data are applied to each channel through the test device, a test result corresponding to each piece of test data is obtained, then the maximum return difference and the accuracy of each channel are sequentially calculated according to all the test results of each channel, and finally the maximum return difference and the accuracy are compared with a preset standard maximum return difference and standard accuracy, so as to determine whether the performance of each channel is qualified. The method can realize the automatic control of the testing process, the data recording process, the data calculating process and the result judging process of the channel precision of the I/O card, automatically test the channel precision of the I/O card on line, realize the accurate and real-time rapid testing of the channel precision of the I/O card, and can efficiently test the channel precision and output the result. Therefore, the efficiency and the accuracy of the accuracy test of the I/O card channel are improved, the complexity of the test is reduced, and the test cost is reduced.
In order to more clearly describe the method for testing the accuracy of the I/O card channel according to the embodiments of the present application, a specific embodiment of the flow for testing the accuracy of the I/O card channel is described in detail below.
Fig. 5 is a flow chart of a specific method for testing the channel accuracy of an I/O card according to an embodiment of the present application.
As shown in fig. 5, the method comprises the steps of:
s501: and judging whether the communication of the I/O card fails, if not, executing S502, and if so, executing S512.
S502: initializing test channels and test data of the I/O card, setting i=1 and j=1, and selecting j channels as current channels.
S503: and starting the data acquisition work of the jth channel.
S504: inputting the ith analog quantity x into the channel i 。
S505: measuring the test result y corresponding to the ith analog quantity i 。
S506: and judging whether the data acquisition of the channel is completed, if so, executing S508, and if not, executing S507.
In this step, the order of the analog quantity currently received is detected, and when the current test data is determined to be the 2n-th test data, i.e., i=2n, the data acquisition of the channel is determined to be completed, and when i < 2n, the data acquisition of the channel is determined to be incomplete.
S507: the i=i+1 analog quantity is taken as the current analog quantity, and the process returns to step S504.
In this step, the analog quantity of the input channel is replaced with the next analog quantity, i.e. i=i+1,determining that the current analog quantity input to the channel is x i+1 。
S508: store the data of the j-th channel into data group Y j {Y i |i∈(1,2…2n)}。
In this step, the data of the jth channel refers to the test results corresponding to all analog quantities, i.e. all test results y including the jth channel are generated i Data set Y of (2) j And Y is taken j Stored in a memory.
S509: whether the data collection of the I/O card is completed is determined, if yes, S511 is executed, and if no, S510 is executed.
In the step, whether each channel of the I/O card completes data acquisition is detected, whether j is equal to m is judged, namely if the channel j which completes data acquisition currently is the last channel m of the card, the data acquisition of the I/O card is determined to be completed, and when j is smaller than m, the data acquisition of the I/O card is determined to be incomplete.
S510: the j=j+1 th channel is taken as the current channel, and the process returns to step S503.
In this step, the next channel is switched to perform the test, and the test on the next channel is completed by repeatedly executing S503 to S508, for example, when j=1, after the data acquisition on the first channel is completed, the data acquisition is performed by switching to the second channel according to j=j+1. Therefore, data acquisition can be realized for each channel of the I/O card.
S511: and initializing data calculation.
In this step, another j=1, i.e. the calculation is performed starting from the first channel.
S512: and calculating the return difference, the maximum return difference, the error and the precision of the j-th channel.
In this step, the test results of the 1 st to nth analog quantities of the jth channel are calculated, and the difference between the test results of the corresponding return data is taken as the return difference A j I.e. A j ＝|y t -y t ’ I, wherein y t Is the test result of any first n analog quantities, y t ’ Is a return stroke corresponding to the analog quantityThe test result of the data is that the maximum return difference maxA is selected from all the return differences j . Then, according to Δy= |y i -x i Calculation error Δy, where x is i Is the analog quantity, y i Is the result of the measurement of the analog quantity after passing through the channel. Finally, according to R j ＝{(max△y)/(x n -x 1 ) 100% calculation of the precision R of the jth channel j 。
After detecting the communication failure of the I/O card in S501, when executing S512, the parameter calculation may be performed according to the above calculation method by obtaining the preset historical test data and other methods.
S513: whether the data calculation of the I/O card is completed is judged, if yes, S515 is executed, and if not, S514 is executed.
In the step, whether each channel of the I/O card completes data calculation is detected, whether j is equal to m is judged, namely if the channel j which completes data calculation currently is the last channel m of the card, the data calculation of the I/O card is determined to be completed, and when j is smaller than m, the data calculation of the I/O card is determined to be incomplete.
S514: the j=j+1 th channel is taken as the current channel, and the process returns to step S512.
In this step, the next channel is switched to perform data calculation, and the test on the next channel is completed by repeatedly executing S512 until the data calculation is performed on each channel of the I/O card.
S515: and outputting the test form.
In the step, a form summarizing the test result of each channel of the I/O card can be displayed to a user through man-machine interaction equipment.
In order to more clearly describe the method for testing the channel accuracy of the AI card and the AO card in the embodiments of the present application, a detailed description will be given below of an embodiment in which the AI card and the AO card must change the channel accuracy in practical application.
In this embodiment, using the test apparatus shown in fig. 2 as an example, the AI card is inserted into the 105 card slot, and the AI module connection terminal is connected to 103. After the test is started, the module is confirmedThe communication is normal, the control 104 outputs a test current signal according to a curve or a sampling point preset in a program, and the preset standard current value is x i There is an array X j { } the current signal is applied via connection 103 to the channel to be tested of the AI module, the channel input signal is fed via DPU to 109 and 108, the measured value is y i There is an array Y j {}. Repeating the steps until all channels of the card to be tested are tested. And calculating the data, judging whether the channel is qualified or not according to the set maximum return difference and maximum precision standard, and outputting a test form.
In the test of the AO module, the AO card is inserted into the 106 card slot, and the connection terminal of the AO module is connected with 101. After the start of the test, confirming that the module communication is normal, and modifying the output value of the channel to be tested of the AO module in the system according to a preset curve or sampling point in the program, wherein the value is x i There is an array X j { } the value is sent to the corresponding channel to be tested via DPU and output to 101, 102 via 101 to measure the value y actually output by the channel i There is an array Y j {}. Repeating the steps until all channels of the card to be tested are tested. And calculating the data, judging whether the channel is qualified or not according to the set maximum return difference and maximum precision standard, and outputting a test form.
In order to implement the above embodiment, the present application further provides a system for testing the channel accuracy of an I/O card, and fig. 6 is a schematic structural diagram of an energy efficiency diagnosis system of a distributed photovoltaic power generation device according to the embodiment of the present application, as shown in fig. 6, where the diagnosis system includes a connection module 100, a test module 200, a calculation module 300, and a judgment module 400.
The connection module 100 is configured to connect an input/output I/O card to be tested to a preset test device, where the I/O card has M channels, where M is a positive integer.
The test module 200 is configured to apply 2n corresponding test data to each channel through a test device, and obtain a test result corresponding to each test data, where n is a positive integer, and the (n+1) th to (2) th test data are return data that are mirror symmetry with the (1) th to (n) th test data.
The calculating module 300 is configured to sequentially calculate the maximum return difference and the accuracy of each channel according to all the test results of each channel.
And the judging module 400 is used for comparing the maximum return difference and the precision with the preset standard maximum return difference and standard precision and judging whether the performance of each channel is qualified or not.
Optionally, in one embodiment of the present application, the test apparatus includes: analog output AO signal detection interface terminal, current signal detection unit, analog input AI signal output interface terminal, current signal generation unit, AI fastener interface unit, AO fastener interface unit, decentralized processing unit DPU, centralized processor, memory, man-machine interface unit, power and communication bus, connection module 100 is specifically used for: when the I/O clamping piece to be tested is an AI clamping piece, the AI clamping piece is inserted into an AI clamping piece interface unit, and a wiring terminal of the AI clamping piece is connected with an analog input AI signal output interface terminal; when the I/O card to be tested is an AO card, the AO card is inserted into the AO card interface unit, and the connection terminal of the AO card is connected with the analog output AO signal detection interface terminal.
Optionally, in an embodiment of the present application, the analog input AI signal output interface terminal is connected to the current signal generating unit, and the test module 200 further includes: the first determining unit is used for determining that a first channel of the AI card member is a current channel when the I/O card member to be tested is the AI card member; the first output unit is used for controlling the current signal generation unit to output first test data corresponding to the current channel, the first test data comprise test current signals with 2n preset current values, and the preset current values are determined based on the measuring range of the current channel; the first acquisition unit is used for applying first test data to the current channel through the analog quantity input AI signal output interface terminal, sequentially acquiring test results corresponding to each test current signal output by the current channel, and storing the first test data and the test results into the memory after all 2n test current signals are tested; the first judging unit is used for judging whether the current channel is the last channel of the AI clamping member, if not, switching to the next channel of the current channel, and controlling the first output unit and the first acquisition unit to repeatedly execute the functions of the first output unit and the first acquisition unit until all channels of the AI clamping member are tested.
Optionally, in an embodiment of the present application, the analog output AO signal detection interface terminal is connected to the current signal detection unit, and the test module 200 further includes: the second determining unit is used for determining that the first channel of the AO card is the current channel when the I/O card to be tested is the AO card; the second output unit is used for adjusting second test data output by the distributed control system DCS to the current channel, the second test data comprises 2n test current signals with preset current values, and the preset current values are determined based on the measuring range of the current channel; the second acquisition unit is used for applying second test data to the current channel through the DPU, transmitting an output signal corresponding to each test current signal output by the current channel through the analog quantity output AO signal detection interface terminal, measuring the value of the output signal through the current signal detection unit so as to acquire a test result corresponding to each test current signal, and storing the second test data and the test result into the memory after all 2n test current signals are tested; and the second judging unit is used for judging whether the current channel is the last channel of the AO card, if not, switching to the next channel of the current channel, and controlling the second output unit and the second acquisition unit to repeatedly execute the functions of the second output unit and the second acquisition unit until all channels of the AO card are tested.
Optionally, in one embodiment of the present application, the computing module 300 is specifically configured to: for each channel, respectively calculating the difference value between the test results of the 1 st to nth test data and the test results of the corresponding return data, and taking the absolute value of the difference value as the return difference; selecting the return difference with the largest numerical value from all the return differences as the largest return difference; calculating the error of each test data and the corresponding test result, wherein the error is the absolute value of the difference value between each test data and the corresponding test result; selecting the error with the largest numerical value from all errors, and calculating the precision by the following formula:
R j ＝{(max△y)/(x n -x 1 )}*100％
where j is the current channel, max Δy is the error with the largest value, x n -x 1 The value of (2) is the span of the current channel.
Optionally, in one embodiment of the present application, the test module 200 is further configured to apply overrun test data to each channel, and perform the overrun test prior to performing the backhaul test.
Optionally, in an embodiment of the present application, the test module 200 is further configured to perform communication failure detection on the I/O card to be tested, and determine whether the communication of the I/O card to be tested is normal.
It should be noted that the explanation of the embodiment of the method for testing the channel accuracy of the I/O card is also applicable to the system of this embodiment, and will not be repeated here
In summary, the system for testing the channel precision of the I/O card according to the embodiment of the present application may implement automatic control of the testing process, the data recording process, the data calculating process, and the result judging process of the channel precision of the I/O card, automatically test the channel precision of the I/O card online, implement accurate and real-time rapid testing of the channel precision of the I/O module, and perform testing of the channel precision and output the result with high efficiency. Therefore, the efficiency and the accuracy of the accuracy test of the I/O card channel are improved, the complexity of the test is reduced, and the test cost is reduced.
In order to implement the above embodiments, the present application further proposes a non-transitory computer readable storage medium having a computer program stored thereon, which when executed by a processor implements a method for testing the accuracy of an I/O card channel as in any of the above embodiments.
In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, the different embodiments or examples described in this specification and the features of the different embodiments or examples may be combined and combined by those skilled in the art without contradiction.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present application, the meaning of "plurality" is at least two, such as two, three, etc., unless explicitly defined otherwise.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and additional implementations are included within the scope of the preferred embodiment of the present application in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the embodiments of the present application.
Logic and/or steps represented in the flowcharts or otherwise described herein, e.g., a ordered listing of executable instructions for implementing logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or more wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). In addition, the computer readable medium may even be paper or other suitable medium on which the program is printed, as the program may be electronically captured, via, for instance, optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner, if necessary, and then stored in a computer memory.
It is to be understood that portions of the present application may be implemented in hardware, software, firmware, or a combination thereof. In the above-described embodiments, the various steps or methods may be implemented in software or firmware stored in a memory and executed by a suitable instruction execution system. As with the other embodiments, if implemented in hardware, may be implemented using any one or combination of the following techniques, as is well known in the art: discrete logic circuits having logic gates for implementing logic functions on data signals, application specific integrated circuits having suitable combinational logic gates, programmable Gate Arrays (PGAs), field Programmable Gate Arrays (FPGAs), and the like.
Those of ordinary skill in the art will appreciate that all or a portion of the steps carried out in the method of the above-described embodiments may be implemented by a program to instruct related hardware, where the program may be stored in a computer readable storage medium, and where the program, when executed, includes one or a combination of the steps of the method embodiments.
In addition, each functional unit in each embodiment of the present application may be integrated in one processing module, or each unit may exist alone physically, or two or more units may be integrated in one module. The integrated modules may be implemented in hardware or in software functional modules. The integrated modules may also be stored in a computer readable storage medium if implemented in the form of software functional modules and sold or used as a stand-alone product.
The above-mentioned storage medium may be a read-only memory, a magnetic disk or an optical disk, or the like. Although embodiments of the present application have been shown and described above, it will be understood that the above embodiments are illustrative and not to be construed as limiting the application, and that variations, modifications, alternatives, and variations may be made to the above embodiments by one of ordinary skill in the art within the scope of the application.
Claims (9)
1. The method for testing the channel precision of the I/O card is characterized by comprising the following steps of:
connecting an input/output (I/O) card to be tested to preset test equipment, wherein the I/O card is provided with M channels, and M is a positive integer;
applying 2n corresponding test data to each channel through the test equipment, and obtaining a test result corresponding to each test data, wherein n is a positive integer, and the (n+1) th to (2) th test data are return data which are mirror symmetry with the (1) th to (n) th test data;
calculating the maximum return difference and the maximum precision of each channel in sequence according to all the test results of each channel;
comparing the maximum return difference and the precision with a preset standard maximum return difference and standard precision, and judging whether the performance of each channel is qualified or not;
And calculating the maximum return difference and the maximum precision of each channel in turn according to all the test results of each channel, wherein the method comprises the following steps:
for each channel, respectively calculating the difference value between the test result of the 1 st to nth test data and the test result of the corresponding return data, and taking the absolute value of the difference value as the return difference;
selecting the return difference with the largest numerical value from all the return differences as the maximum return difference;
calculating an error between each test data and a corresponding test result, wherein the error is an absolute value of a difference value between each test data and the corresponding test result;
selecting the error with the largest numerical value from all errors, and calculating the precision by the following formula:
R j ＝{(max△y)/(x n -x 1 )}*100％
where j is the current channel, max Δy is the error with the largest value, x n -x 1 The value of (2) is the span of the current channel.
2. The test method according to claim 1, wherein the test apparatus comprises: analog quantity output AO signal detection interface terminal, current signal detection unit, analog quantity input AI signal output interface terminal, current signal generation unit, AI fastener interface unit, AO fastener interface unit, decentralized processing unit DPU, centralized processor, memory, man-machine interface unit, power and communication bus, to wait to test input/output I/O fastener to preset test equipment, include:
When the I/O clamping piece to be tested is an AI clamping piece, the AI clamping piece is inserted into the AI clamping piece interface unit, and a wiring terminal of the AI clamping piece is connected with the analog input AI signal output interface terminal;
when the I/O card to be tested is an AO card, the AO card is inserted into the AO card interface unit, and the connection terminal of the AO card is connected with the analog output AO signal detection interface terminal.
3. The test method according to claim 2, wherein the analog input AI signal output interface terminal is connected to the current signal generating unit, the applying, by the test device, the corresponding 2n test data to each of the channels, respectively, and obtaining the test result corresponding to each of the test data, includes:
s10, when the I/O clamping piece to be tested is an AI clamping piece, determining a first channel of the AI clamping piece as a current channel;
s11, controlling the current signal generation unit to output first test data corresponding to the current channel, wherein the first test data comprise test current signals with 2n preset current values, and the preset current values are determined based on the measuring range of the current channel;
S12, applying the first test data to the current channel through the analog input AI signal output interface terminal, sequentially obtaining a test result corresponding to each test current signal output by the current channel, and storing the first test data and the test result into the memory after all 2n test current signals are tested;
and S13, judging whether the current channel is the last channel of the AI clamping member, if not, switching to the next channel of the current channel, and repeatedly executing S11 and S12 until all channels of the AI clamping member are tested.
4. The test method according to claim 2, wherein the analog output AO signal detection interface terminal is connected to the current signal detection unit, and the applying, by the test device, the corresponding 2n test data to each of the channels and obtaining the test result corresponding to each of the test data, further comprises:
s20, when the I/O card to be tested is an AO card, determining a first channel of the AO card as a current channel;
s21, adjusting second test data output by a distributed control system DCS to the current channel, wherein the second test data comprise test current signals with 2n preset current values, and the preset current values are determined based on the measuring range of the current channel;
S22, applying the second test data to the current channel through the DPU, transmitting an output signal corresponding to each test current signal output by the current channel through the analog output AO signal detection interface terminal, measuring the value of the output signal through the current signal detection unit to obtain a test result corresponding to each test current signal, and storing the second test data and the test result into the memory after all 2n test current signals are tested;
s23, judging whether the current channel is the last channel of the AO card, if not, switching to the next channel of the current channel, and repeatedly executing S21 and S22 until all channels of the AO card are tested.
5. The test method of claim 1, further comprising, after applying corresponding 1 st to nth test data to each of the channels, respectively, by the test apparatus:
overrun test data is applied to each of the channels, the overrun test being performed prior to the backhaul test.
6. The method of any one of claims 1-5, further comprising, prior to said applying, by said test device, a corresponding 2n number of test data to each of said channels, respectively:
And detecting communication faults of the I/O card to be tested, and judging whether the communication of the I/O card to be tested is normal or not.
7. A system for testing the accuracy of an I/O card channel, comprising:
the connecting module is used for connecting an input/output (I/O) card to be tested to preset testing equipment, wherein the I/O card is provided with M channels, and M is a positive integer;
the test module is used for respectively applying 2n corresponding test data to each channel through the test equipment and obtaining a test result corresponding to each test data, wherein n is a positive integer, and the (n+1) th to (2) th test data are return data which are mirror symmetry with the (1) th to (n) th test data;
the calculation module is used for sequentially calculating the maximum return difference and the maximum precision of each channel according to all the test results of each channel;
the judging module is used for comparing the maximum return difference and the precision with a preset standard maximum return difference and standard precision and judging whether the performance of each channel is qualified or not;
the calculation module is further configured to calculate, for each channel, a difference between the test results of the 1 st to nth test data and the test results of the corresponding backhaul data, and take an absolute value of the difference as a return difference;
Selecting the return difference with the largest numerical value from all the return differences as the maximum return difference;
calculating an error between each test data and a corresponding test result, wherein the error is an absolute value of a difference value between each test data and the corresponding test result;
selecting the error with the largest numerical value from all errors, and calculating the precision by the following formula:
R j ＝{(max△y)/(x n -x 1 )}*100％
where j is the current channel, max Δy is the error with the largest value, x n -x 1 The value of (2) is the span of the current channel.
8. The test system of claim 7, wherein the test device comprises: analog quantity output AO signal detection interface terminal, current signal detecting element, analog quantity input AI signal output interface terminal, current signal generation unit, AI fastener interface unit, AO fastener interface unit, decentralized processing unit DPU, centralized processor, memory, man-machine interface unit, power and communication bus, connection module specifically is used for:
when the I/O clamping piece to be tested is an AI clamping piece, the AI clamping piece is inserted into the AI clamping piece interface unit, and a wiring terminal of the AI clamping piece is connected with the analog input AI signal output interface terminal;
when the I/O card to be tested is an AO card, the AO card is inserted into the AO card interface unit, and the connection terminal of the AO card is connected with the analog output AO signal detection interface terminal.
9. A non-transitory computer readable storage medium having stored thereon a computer program, wherein the computer program when executed by a processor implements a method of testing the accuracy of an I/O card channel as claimed in any of claims 1-6.
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