CN2664799Y - Grading machine testing gripper mechanism - Google Patents
Grading machine testing gripper mechanism Download PDFInfo
- Publication number
- CN2664799Y CN2664799Y CN 200320107978 CN200320107978U CN2664799Y CN 2664799 Y CN2664799 Y CN 2664799Y CN 200320107978 CN200320107978 CN 200320107978 CN 200320107978 U CN200320107978 U CN 200320107978U CN 2664799 Y CN2664799 Y CN 2664799Y
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- CN
- China
- Prior art keywords
- test
- cylinder
- test spring
- spring plate
- briquetting
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model relates to a sorting machine used in semi-conductor processing, in particular to a test clamping mechanism of sorting machine which is composed of a spring plate mechanism and a forced-contract mechanism, the spring plate mechanism comprises a test spring plate retaining rack, and left and right test spring plates arranged on the test spring plate retaining rack, the forced-contract mechanism comprises a cylinder and press blocks driven by the cylinder, the press block is respectively arranged at two sides of the left and right test spring plates. Compared with the left and right double-cylinder driving mechanism, The structure that the single cylinder drives the press block more facilitates the press blocks to keep the same speed and force and keep consistent travel relative to the integrated circuit, besides materials are saved.
Description
Technical field:
The utility model relates to the separator in the semiconducter process, particularly a kind of separator test clamp system.
Background technology:
Separator is in the semiconducter process, at last integrated circuit (IC) products is carried out attribute test, by different qualities, and the plant equipment of categorised collection finished product.The test clamp system is the Core Feature mechanism of separator.
Existing separator test clamp system, its structure is that principle of work sees also Fig. 1.As shown in the figure: with the both sides cylinder is power source, promotes left and right test spring by briquetting A, the B of this air cylinder driven and draws close toward the centre, and the upper end of test spring is contacted with the pin of the integrated circuit that is positioned the centre position; Tester just detects the quality of integrated circuit to the integrated circuit energising by test spring.The defective of this mechanism is: a left side, two cylinders of right both sides drive a left side respectively, right briquetting A, B, a because left side, it is consistent that the drive actions of right cylinder is difficult to reach, therefore, drive briquetting A, speed during B, strength is all different, stroke with respect to integrated circuit also can be inconsistent, thereby cause a left side, right test spring contacts not simultaneously with integrated circuit pin, contact force is inconsistent, the bending deformation quantity of reed is inconsistent, and then cause that test is inaccurate, the false failure rate height, speed is slow, the test spring life-span is short, and integrated circuit pin is curved etc., directly image the quality of product.
The utility model content:
The utility model will provide a kind of separator test clamp system, solves the existing existing above-mentioned technological deficiency of the left and right two side air cylinder driven modes of mechanism.
For solving the problems of the technologies described above, the utility model is achieved in that
A kind of separator test clamp system, by reed mechanism with press mechanism and form, this reed mechanism comprises a test spring retainer and the left and right test spring that is positioned on the test spring retainer, it is characterized in that: this presses mechanism and comprises that a cylinder reaches the briquetting by this air cylinder driven, and this driving briquetting lays respectively at left and right test spring both sides.
Said cylinder is positioned at the vertical top of reed mechanism.
The mat said structure the utility model has the advantages that:
1. the mechanism of pressing of the present utility model comprises that a cylinder reaches the briquetting by this air cylinder driven, and this driving briquetting lays respectively at left and right test spring both sides.The two air cylinder driven mechanisms of the texture ratio left and right side of this list air cylinder driven briquetting work are more conducive to briquetting and keep identical speed, strength, the stroke that is consistent with respect to integrated circuit, and saved material.
2. cylinder of the present utility model can vertically be arranged at reed mechanism top, helps reducing the area occupied of entire mechanism.
Description of drawings:
Fig. 1 is a structural representation of commonly using separator test clamp system.
Fig. 2 is a structural representation of the present utility model.
Among the figure:
1-reed mechanism;
11-test spring retainer; 12,13-test spring;
2-presses mechanism;
The 21-cylinder; 22,23-briquetting;
The 3-integrated circuit.
Embodiment:
See also Fig. 2, it is the structural representation of the utility model separator test clamp system.As shown in the figure: it is by reed mechanism 1 and press mechanism 2 and form, this reed mechanism 1 comprises a test spring retainer 11 and the left and right test spring 12,13 that is positioned on the test spring retainer 11, this presses the briquetting 22,23 that mechanism 2 comprises that a cylinder 21 reaches by this air cylinder driven, and this driving briquetting 22,23 lays respectively at left and right test spring 12,13 both sides.
Cylinder 21 is positioned at the vertical top of reed mechanism 1.
During use, be power source, draw close toward centres, the upper end of test spring 12,13 is contacted with the pin of the integrated circuit 3 that is positioned the centre position by the left and right test spring 12,13 of briquetting 22,23 promotions that this cylinder 21 drives with cylinder 21; Tester just detects the quality of integrated circuit to the integrated circuit energising by test spring 12,13.
Claims (2)
1, a kind of separator test clamp system, by reed mechanism with press mechanism and form, this reed mechanism comprises a test spring retainer and the left and right test spring that is positioned on the test spring retainer, it is characterized in that: this presses mechanism and comprises that a cylinder reaches the briquetting by this air cylinder driven, and this driving briquetting lays respectively at left and right test spring both sides.
2, separator test clamp system according to claim 1, it is characterized in that: cylinder is positioned at the vertical top of reed mechanism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200320107978 CN2664799Y (en) | 2003-11-12 | 2003-11-12 | Grading machine testing gripper mechanism |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200320107978 CN2664799Y (en) | 2003-11-12 | 2003-11-12 | Grading machine testing gripper mechanism |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2664799Y true CN2664799Y (en) | 2004-12-22 |
Family
ID=34342448
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200320107978 Expired - Fee Related CN2664799Y (en) | 2003-11-12 | 2003-11-12 | Grading machine testing gripper mechanism |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2664799Y (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101758031A (en) * | 2010-03-02 | 2010-06-30 | 王晓军 | Novel integrated circuit testing and sorting method and device thereof |
| CN101085441B (en) * | 2006-06-06 | 2010-12-08 | 黑龙江大学 | Bearing channel automatic sorting system |
| CN101099966B (en) * | 2006-07-05 | 2012-04-04 | 黑龙江大学 | Bearing channel automatic sorting straight transfer mechanism |
| CN102501580A (en) * | 2011-11-18 | 2012-06-20 | 东莞市良展有机硅科技有限公司 | Positioning device for full-automatic silica gel printing machine and method for positioning same |
| CN101342531B (en) * | 2007-07-13 | 2012-09-05 | 鸿劲科技股份有限公司 | Memory body IC detecting and sorting machine |
| CN101322971B (en) * | 2007-06-14 | 2014-05-28 | 鸿劲科技股份有限公司 | Memory body IC testing and sorting machine |
| CN108311419A (en) * | 2018-01-30 | 2018-07-24 | 谢银泉 | A kind of integrated circuit test sorting machine |
| CN114405839A (en) * | 2021-12-22 | 2022-04-29 | 徐州盛科半导体科技有限公司 | Intelligent defect detection equipment for packaged chip |
-
2003
- 2003-11-12 CN CN 200320107978 patent/CN2664799Y/en not_active Expired - Fee Related
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101085441B (en) * | 2006-06-06 | 2010-12-08 | 黑龙江大学 | Bearing channel automatic sorting system |
| CN101099966B (en) * | 2006-07-05 | 2012-04-04 | 黑龙江大学 | Bearing channel automatic sorting straight transfer mechanism |
| CN101322971B (en) * | 2007-06-14 | 2014-05-28 | 鸿劲科技股份有限公司 | Memory body IC testing and sorting machine |
| CN101342531B (en) * | 2007-07-13 | 2012-09-05 | 鸿劲科技股份有限公司 | Memory body IC detecting and sorting machine |
| CN101758031A (en) * | 2010-03-02 | 2010-06-30 | 王晓军 | Novel integrated circuit testing and sorting method and device thereof |
| CN101758031B (en) * | 2010-03-02 | 2014-03-05 | 王晓军 | Integrated circuit testing and sorting method and device thereof |
| CN102501580A (en) * | 2011-11-18 | 2012-06-20 | 东莞市良展有机硅科技有限公司 | Positioning device for full-automatic silica gel printing machine and method for positioning same |
| CN108311419A (en) * | 2018-01-30 | 2018-07-24 | 谢银泉 | A kind of integrated circuit test sorting machine |
| CN114405839A (en) * | 2021-12-22 | 2022-04-29 | 徐州盛科半导体科技有限公司 | Intelligent defect detection equipment for packaged chip |
| CN114405839B (en) * | 2021-12-22 | 2023-12-19 | 徐州盛科半导体科技有限公司 | Intelligent defect detection equipment for packaged chip |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |