CN2371564Y

CN2371564Y - Testing device set for electronic substrate

Info

Publication number: CN2371564Y
Application number: CN 99207990
Authority: CN
Inventors: 王仙萍
Original assignee: Individual
Current assignee: Individual
Priority date: 1999-04-19
Filing date: 1999-04-19
Publication date: 2000-03-29
Anticipated expiration: 2009-04-19

Abstract

The utility model relates to a testing managing device set for an electronic base plate, which is composed of a testing needle dial (10), a universal needle holder (20) and a connecting terminal seat (30), wherein, the testing needle dial (10) is provided with a probe (11); the universal needle holder (20) is provided with a telescopic needle (21); the connecting terminal seat (30) is provided with a plurality of needle cylinders (32) and connection terminals (31). After assembled and when used for testing a host machine, the managing device set is used for detecting whether electronic parts are normal or not and whether circuits have short circuit or broken circuits or not, via the connecting terminals (31), the telescopic needle (21) and the probe (11) connected with the circuits on the electronic base plate (40) or contacts of the electronic parts. The managing device has the advantages of low cost and fast and easy use.

Description

A kind of electric substrate measurement jig group

The utility model relates to instrument class, particularly a kind of electric substrate measurement jig group.

As everyone knows; electric substrate is for after laying electronic component; with each electronic component with suitable circuit serial or parallel connection; to reach a certain specific effect; electronic circuit on the electric substrate; regular meeting is because of carrying improper or other reason causes short circuit or opens circuit; cause the electric substrate can't normal operation; in addition; because often tens of or hundreds of of the electronic component quantity on the electric substrate; be laid on the electric substrate at electronic component; can cause electronic component to break down occasionally; the situation that each circuit forms short circuit or opens circuit on the substrate; and the due effect of forfeiture electric substrate; therefore; electric substrate dispatch from the factory preceding or mounting electronic part before; must test one by one at each circuit on the electric substrate and each part; because circuit complexity and electronic component quantity on the electric substrate are too many; therefore; test at electronic component often needs to rely on the measurement jig group; cooperate Test Host to finish the test job of electronic component; traditional electric substrate tool group is to be equipped with the protruding pedestal top end face that is exposed to of probe with a base interior according to each circuit of electric substrate or the connecting point position of electronic component; the probe bottom links Test Host with circuit; need be equipped with stretching structure between probe and the pedestal; so that make this probe have a flexible ability; and can be in the contact process of probe and electric substrate and electronic component; contact on the contact with more suitable pressure; its relative position of design one by one; therefore; a kind of electric substrate measurement jig group cost often will need hundreds thousand of units; even units up to a million, organize these high costs, cause the waste fund of electric substrate in test job.

It is hundreds thousand of that the purpose of this utility model is exactly that cost at above-mentioned traditional electric substrate tool group needs, even unit up to a million, and this high cost is not meet Industrial economic benefit, at this shortcoming, provides a kind of electric substrate measurement jig group.

Technical conceive of the present utility model:

According to the purpose of this utility model, a kind of electric substrate measurement jig group is provided, its structure is made of a test dials, general-purpose needle stand, link stroma, wherein, on the test dials, be provided with many probes of being laid according to the electric substrate contact, then be laid with flexible pin at the general-purpose needle stand, on the link stroma, be provided with many splicing ears, be used for and the Test Host line with minimum density; After this tool group assembling, Test Host must be by each circuit on splicing ear, flexible pin and probe and the electric substrate or the contact line of each electronic component, whether normal with the performance of detecting each electronic component, this kind electric substrate measurement jig group, will be according to various electric substrates, select suitable and low test dials and the indirect line of Test Host of cost for use, reach the purpose of its test, be used for improving the high shortcoming of conditional electronic tester substrate tool group cost.

Accompanying drawings structure of the present utility model and embodiment:

Fig. 1 is a plane of the present utility model decomposing schematic representation.

Fig. 2 is a combination synoptic diagram in plane of the present utility model.

Fig. 3 is the density synoptic diagram of general-purpose needle stand of the present utility model.

(10) be that probe, (20) are contact for syringe, (40) for electric substrate, (41) for splicing ear, (32) for link stroma, (31) for sleeve, (30) for spring, (23) for flexible pin, (22) for general-purpose needle stand, (21) for test needle stand, (11).

As shown in Figure 1, the utility model is made of a test dials (10), general-purpose needle stand (20), link stroma (30), wherein, in test dials (10), be provided with many according to electric substrate (40) in the probe (11) laid of the contact (41) of electronic component, if the two-phase abutment points (41) on the electric substrate (40) is too close, probe (11) can be an appropriate tilt degree; General-purpose needle stand (20) then is laid with flexible pin (21) with minimum density, and this flexible pin (21) utilizes spring (22) to cooperate sleeve (23) to produce a telescopic elastic force; Link stroma (30) is provided with many syringes (32) and is used for and the Test Host line with splicing ear (31).

In conjunction with the accompanying drawings 2 and accompanying drawing 3 explanation embodiment of the present utility model:

Shown in accompanying drawing 2 and accompanying drawing 3, the utility model will be tested dials (10), after general-purpose needle stand (20) and link stroma (30) assembling are finished, the contact (41) that this splicing ear (31) is gone up each electronic component by probe (11) on flexible pin (21) on the general-purpose needle stand (20) and the test dials (10) and electric substrate (40) links, can carry out each electronic component on the electric substrate (40) and circuit are carried out test procedure, in case electric substrate to be measured is changed to some extent, only need to change test dials (10) and the link stroma (30) that is suitable for, can carry out test job at the electric substrate (40) of other one group of different layout, very easy in the operation; Because test dials (10) is simple and easy with the structure of link stroma (30) inside, and do not need high precision, therefore, no matter on the cost of design or manufacturing, all quite cheap, and the structure of its inside of general-purpose needle stand (20) is complicated, and need be than high precision, so cost is comparatively high, but because the general-purpose needle stand, no matter be that the electric substrate of which kind of specification is all applicable, so in the face of the electric substrate of different size or layout, the utility model does not need to change general-purpose needle stand (20), only needs to select for use suitable test dials or link stroma to get final product according to the specification and the layout thereof of electric substrate; The density of the flexible pin (21) on the general-purpose needle stand (20) should be looked the thickness of probe (11) and the density of tested point, and is arranged to the highest density.

The utility model is simple in structure, easy to use, the comparatively high structure of cost in the electric substrate test, is designed to standardization, and is all applicable for various electric substrates, thereby reduces manufacturing cost greatly, increase economic efficiency.

Claims

1, a kind of electric substrate measurement jig group, it is made of test dials (10), general-purpose needle stand (20), link stroma (30), it is characterized in that on testing dials (10), being provided with many according to electric substrate (40) in the probe (11) laid of the contact (41) of electronic component; Then be laid with flexible pin (21) with minimum density on general-purpose needle stand (20), flexible pin (21) can utilize spring (22) to cooperate sleeve (23) to produce a telescopic elastic force; Being provided with many syringes (32) in the last position according to probe of link stroma (30) is used for and the Test Host line with splicing ear (31).

2, according to the described a kind of electric substrate measurement jig group of claim 1, it is characterized in that on the said electric substrate (40) adjacent contact (41) too near the time, probe (11) can be a suitable degree of tilt.

3, according to the described a kind of electric substrate measurement jig group of claim 1, it is characterized in that the density of the flexible pin (21) on the said general-purpose needle stand, should look the thickness of probe (11) and the density of tested point, and be arranged to the highest density.