CN105182142A - Probe testing device - Google Patents
Probe testing device Download PDFInfo
- Publication number
- CN105182142A CN105182142A CN201510670002.6A CN201510670002A CN105182142A CN 105182142 A CN105182142 A CN 105182142A CN 201510670002 A CN201510670002 A CN 201510670002A CN 105182142 A CN105182142 A CN 105182142A
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- China
- Prior art keywords
- probe
- support plate
- plate
- needle plate
- product
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The invention discloses a probe testing device, and the device comprises a testing line connected with a probe. The device is characterized in that the device also comprises a probe plate and a carrier plate located above the probe plate; the probe plate is provided with a probe module group; the carrier plate is provided with a product storage groove; and the probe module group passes through the carrier plate to be located in the product storage groove. The device can achieve the positioning testing of a small-size product through the organic combination of the probe plate, the carrier plate and the testing line. The device is simple and compact in structure, is convenient for testing, and is suitable for the testing of various types of small-size electronic products.
Description
Technical field
The present invention relates to automatic test field, carry out the field tests of testing especially by probe.
Background technology
Along with electronic product is day by day to miniaturization, the connector used in electronic product is also more and smaller and more exquisite, and it is more difficult how to position product in testing process, and product is a shift position a little, and test will be caused inaccurate.Therefore how the product little to volume carries out performance test is then more scabrous problem.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of probe tester, and it conveniently can position detection to product.
For solving the problems of the technologies described above, technical scheme provided by the invention is a kind of probe tester, and it comprises the p-wire be connected with probe, characterized by further comprising needle plate and is positioned at the support plate above described needle plate, described needle plate is provided with probe module; On described support plate, offer product containing groove, described probe module is arranged in described product containing groove through described support plate.
In described support plate, offer vacuum chamber, in described product containing groove, offer the some vacuum sucking holes be communicated with described vacuum chamber.
Described support plate is screwed on described needle plate, and the screw between described support plate and described needle plate is arranged with spring respectively.
Also comprise mounting base, described mounting base is provided with p-wire card extender, described needle plate is arranged on described p-wire card extender; The lower end of described probe module is to downward-extension and contacting with the contact point that described p-wire connects above described p-wire card extender.
Probe tester of the present invention, by being placed in the product containing groove of support plate by product, all around locates it, then holds product by vacuum sucking holes and locate up and down further, makes product and probe keep testing and contact.Between support plate and needle plate, be provided with spring, the distance that probe stretches out in product containing groove can be regulated, convenient test, protection probe.The present invention is simple and compact for structure, and location is convenient, is particularly suitable for the performance test work of miniaturized products.
Accompanying drawing explanation
Fig. 1, structural representation of the present invention.
Fig. 2, structural blast schematic diagram of the present invention.
Embodiment
For technique scheme, now lift a preferred embodiment and be specifically described in conjunction with diagram.Probe tester of the present invention, mainly comprises p-wire card extender, pin, support plate, referring to Fig. 1 to Fig. 2, wherein.
P-wire 1, is connected on p-wire card extender 2.P-wire card extender is arranged on mounting base 3.Needle plate 4 is installed on p-wire card extender.The contact point that p-wire connects is provided with on p-wire card extender.Needle plate 4 is provided with several small probe module vertically.In the present embodiment, probe module is tested for the connector of stitch below 0.35 millimeter.Certainly, can according to actual needs, change the size of probe module, to be suitable for different connectors or other products that need test are tested.The test point position of probe module composition is identical with the test point position of product.Needle plate offers the screw that same screw passes.The lower end of probe module is stretched out downwards below needle plate to p-wire card extender, and with contacting with the contact point that p-wire connects on p-wire card extender, the detecting information of probe test can be transferred to testing apparatus through p-wire by structure like this.
Support plate 5, is fixedly mounted on above needle plate by contour screw 51.Contour screw between support plate and needle plate is arranged with spring 52 respectively.On support plate, offering product containing groove 53, for placing product, and product all around being located.In product containing groove, offer the open-work passed for probe, the upper end of probe is arranged in product containing groove through this open-work.In support plate, offer vacuum chamber, vacuum chamber is by vacuum adapter 54 and external vacuum equipment connection.Product containing groove offers the vacuum sucking holes be communicated with vacuum chamber.When product is placed in product containing groove, vacuum sucking holes holds product, carries out upper-lower position location to it, makes product test point keep contacting with probe pin upper ends, realizes the test to product.Owing to being provided with spring between needle plate and support plate, regulating spring compressive state can be carried out by tightening contour screw or unscrewing contour screw, regulate the distance that probe pin upper ends protrudes in product containing groove, namely ensure that probe stretches out enough distances and contacts with product, also to ensure that probe can not stretch out too much, in order to avoid cause damage to test products.
The principle of work of probe tester of the present invention: product is placed in product containing groove, vacuumizes, vacuum sucking holes sucks product makes itself and probe module upper end test point keep in touch; Probe module sends detecting information to p-wire by probe, and detecting information is transferred to testing apparatus by p-wire again, testing apparatus read test data, to judge performance quality.
Probe test assembly of the present invention, by the organic assembling of needle plate and support plate, p-wire, can realize positioning test to miniaturized products.It is simple and compact for structure, convenient test, is applicable to the test job of all kinds of miniaturized electronic product.
Claims (4)
1. a probe tester, it comprises the p-wire be connected with probe, characterized by further comprising needle plate and is positioned at the support plate above described needle plate, described needle plate is provided with probe module; On described support plate, offer product containing groove, described probe module is arranged in described product containing groove through described support plate.
2. probe tester according to claim 1, is characterized in that offering vacuum chamber in described support plate, offers the some vacuum sucking holes be communicated with described vacuum chamber in described product containing groove.
3. probe tester according to claim 1, is characterized in that described support plate is screwed on described needle plate, the screw between described support plate and described needle plate is arranged with spring respectively.
4. probe tester according to claim 1, characterized by further comprising mounting base, and described mounting base is provided with p-wire card extender, and described needle plate is arranged on described p-wire card extender; The lower end of described probe module is to downward-extension and contacting with the contact point that described p-wire connects above described p-wire card extender.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510670002.6A CN105182142A (en) | 2015-10-16 | 2015-10-16 | Probe testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510670002.6A CN105182142A (en) | 2015-10-16 | 2015-10-16 | Probe testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105182142A true CN105182142A (en) | 2015-12-23 |
Family
ID=54904357
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510670002.6A Pending CN105182142A (en) | 2015-10-16 | 2015-10-16 | Probe testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105182142A (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105824675A (en) * | 2016-03-24 | 2016-08-03 | 深圳市科美集成电路有限公司 | Circuit board burning tool, system and method |
| CN105842608A (en) * | 2016-03-24 | 2016-08-10 | 深圳市科美集成电路有限公司 | Circuit board testing jig and circuit board testing system |
| CN107607812A (en) * | 2017-09-08 | 2018-01-19 | 广东昭信智能装备有限公司 | A kind of test system for chip multilayer ceramic capacitor |
| CN107677927A (en) * | 2017-10-17 | 2018-02-09 | 电子科技大学中山学院 | Connector needle die testing arrangement |
| CN108008208A (en) * | 2016-10-31 | 2018-05-08 | 中车大同电力机车有限公司 | A kind of electric locomotive connector production quality detecting system |
| CN109283365A (en) * | 2018-09-30 | 2019-01-29 | 珠海博杰电子股份有限公司 | Conducting resinl tests mould group |
| CN109696601A (en) * | 2019-01-31 | 2019-04-30 | 大族激光科技产业集团股份有限公司 | Needle bed aging and detection device |
| CN110211911A (en) * | 2019-06-28 | 2019-09-06 | 珠海市运泰利自动化设备有限公司 | Incorporate the high-precision support plate device of needle plate structure |
| CN112014600A (en) * | 2019-05-31 | 2020-12-01 | 三赢科技（深圳）有限公司 | Test fixture and test machine |
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| CN2879196Y (en) * | 2006-02-22 | 2007-03-14 | 威盛电子股份有限公司 | chip testing modular |
| US20120055037A1 (en) * | 2010-09-03 | 2012-03-08 | Mitutoyo Corporation | Measurement device |
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| CN204439777U (en) * | 2015-03-02 | 2015-07-01 | 深圳市立德通讯器材有限公司 | Lightning plug proving installation |
| CN205067627U (en) * | 2015-10-16 | 2016-03-02 | 苏州赛腾精密电子股份有限公司 | Probe testing apparatus |
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2015
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| CN2879196Y (en) * | 2006-02-22 | 2007-03-14 | 威盛电子股份有限公司 | chip testing modular |
| US20120055037A1 (en) * | 2010-09-03 | 2012-03-08 | Mitutoyo Corporation | Measurement device |
| CN103487607A (en) * | 2012-06-07 | 2014-01-01 | 矽品精密工业股份有限公司 | Test device and test method |
| CN202994926U (en) * | 2012-11-27 | 2013-06-12 | 吴江市博众精工科技有限公司 | Computer mainboard test module |
| CN104155486A (en) * | 2014-08-19 | 2014-11-19 | 昆山瑞鸿诚自动化设备科技有限公司 | Adapter plate needle die mechanism |
| CN204439777U (en) * | 2015-03-02 | 2015-07-01 | 深圳市立德通讯器材有限公司 | Lightning plug proving installation |
| CN205067627U (en) * | 2015-10-16 | 2016-03-02 | 苏州赛腾精密电子股份有限公司 | Probe testing apparatus |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105842608A (en) * | 2016-03-24 | 2016-08-10 | 深圳市科美集成电路有限公司 | Circuit board testing jig and circuit board testing system |
| CN105824675A (en) * | 2016-03-24 | 2016-08-03 | 深圳市科美集成电路有限公司 | Circuit board burning tool, system and method |
| CN108008208B (en) * | 2016-10-31 | 2020-11-27 | 中车大同电力机车有限公司 | Electric locomotive connector manufacturing quality detection system |
| CN108008208A (en) * | 2016-10-31 | 2018-05-08 | 中车大同电力机车有限公司 | A kind of electric locomotive connector production quality detecting system |
| CN107607812A (en) * | 2017-09-08 | 2018-01-19 | 广东昭信智能装备有限公司 | A kind of test system for chip multilayer ceramic capacitor |
| CN107677927A (en) * | 2017-10-17 | 2018-02-09 | 电子科技大学中山学院 | Connector needle die testing arrangement |
| CN107677927B (en) * | 2017-10-17 | 2023-10-10 | 益阳天硕电子有限公司 | Connector needle mould testing arrangement |
| CN109283365A (en) * | 2018-09-30 | 2019-01-29 | 珠海博杰电子股份有限公司 | Conducting resinl tests mould group |
| CN109696601A (en) * | 2019-01-31 | 2019-04-30 | 大族激光科技产业集团股份有限公司 | Needle bed aging and detection device |
| CN109696601B (en) * | 2019-01-31 | 2021-06-18 | 深圳麦逊电子有限公司 | Needle bed aging and detecting device |
| CN112014600A (en) * | 2019-05-31 | 2020-12-01 | 三赢科技（深圳）有限公司 | Test fixture and test machine |
| CN112014600B (en) * | 2019-05-31 | 2023-11-24 | 三赢科技（深圳）有限公司 | Test fixture and test machine |
| CN110211911A (en) * | 2019-06-28 | 2019-09-06 | 珠海市运泰利自动化设备有限公司 | Incorporate the high-precision support plate device of needle plate structure |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20151223 |