CN220120840U - Contactor for semiconductor device - Google Patents

Abstract

The utility model discloses a contactor for a semiconductor device, which comprises a main body, wherein an accommodating space is formed in the main body; the test module is arranged in the accommodating space and comprises a test seat, a POGO PIN and a special-shaped sheet module are embedded in the test seat, the special-shaped sheet module is composed of a plurality of special-shaped sheet assemblies, each special-shaped sheet assembly comprises a first special-shaped sheet and a second special-shaped sheet, and the second special-shaped sheet wraps the first special-shaped sheet; the test chip is limited above the test module through the limiting cover plate; the PCB bottom plate is arranged at the bottom of the main body and is provided with pin contacts; the POGO PIN, the first special-shaped piece and the needle tip of the second special-shaped piece are contacted with the test chip, and the stitch sequentially passes through the test seat and the main body and then is contacted with the stitch contact.

Description

Contactor for semiconductor device

Technical Field

The utility model belongs to the technical field of semiconductor testing, and particularly relates to a contactor for a semiconductor device.

Background

Various performance tests are required in the large-scale research and development and production processes of semiconductor test chips, test chip test sockets are key parts in a sealing and testing link, the test socket functions to achieve a test effect through electronic signal current transmission between circuit boards after the test chips are positioned, the quality and matching degree of the test sockets directly influence the test judgment accuracy, but at any time, the development of product technology still has the following problems to be solved:

1. along with the smaller and smaller size of the test chip, the existing contactor socket cannot meet the requirement on contact precision, and the precision is higher, and meanwhile, the contact is more accurate.

2. Pogo pins have gradually failed to meet test requirements for some test currents exceeding 3 a.

The pogo pin is low in general service life and easy to wear, needs frequent maintenance and replacement, and directly affects production efficiency and cost control.

Disclosure of Invention

The utility model aims to overcome the defects of the prior art and provide the contactor for the semiconductor device, which is formed by the miniaturized first special-shaped piece, the miniaturized second special-shaped piece and the pogo pin, so that the contact precision of the test module and the test chip is high, the detection is accurate, and the maintenance and the replacement are convenient.

In order to achieve the above purpose, the utility model adopts the following technical scheme: a contactor for a semiconductor device, comprising:

a main body having an accommodating space therein;

the test module is arranged in the accommodating space and comprises a test seat, a plurality of POGO PIN and a plurality of special-shaped sheet modules are embedded in the test seat, each special-shaped sheet module is composed of a plurality of special-shaped sheet assemblies, each special-shaped sheet assembly comprises a first special-shaped sheet and a second special-shaped sheet, and the second special-shaped sheet wraps the first special-shaped sheet in the test seat;

the test chip is limited above the test module through a limiting cover plate, wherein the limiting cover plate is arranged on the upper surface of the test module;

the PCB bottom plate is arranged at the bottom of the main body and is provided with PIN contacts connected with PINs of the first special-shaped piece, the second special-shaped piece and the POGO PIN;

the POGO PIN, the first special-shaped piece and the needle tip of the second special-shaped piece are contacted with the test chip after penetrating out from the top of the test seat, and PINs of the POGO PIN, the first special-shaped piece and the second special-shaped piece sequentially penetrate through the test seat and the main body and then are contacted with the PIN contacts.

Further, the limiting cover plate limits the test chip through four sides.

Further, the number of the special-shaped sheet modules is four, and the four special-shaped sheet modules are arranged on four sides of the test seat.

Further, the first special-shaped sheet comprises a first body, two ends of the first body extend to the same side to form a first upper force arm and a first lower force arm, the first upper force arm upwards forms a first needle point, the first lower force arm downwards extends to form a first stitch, and a first limit clamping block positioned on the first body is arranged between the first upper force arm and the first lower force arm;

the second special-shaped sheet comprises a second body, two ends of the second body extend to the same side to form a second upper force arm and a second lower force arm, and the first special-shaped sheet is arranged in an area surrounded by the second force arm and the second lower force arm; the second upper force arm upwards forms a second needle point, and the second lower force arm downwards extends to form a second stitch; and a second limiting clamping block positioned at one side of the first body is arranged between the second upper force arm and the second lower force arm.

Further, the test socket includes:

the POGO PIN positioning device comprises a base, wherein a first positioning hole for positioning the POGO PIN is formed in the center of the base;

the first positioning seat is arranged on four sides of the base, a plurality of first limiting clamping grooves which are arranged in parallel are formed in the first positioning seat, first clamping strips are arranged in the first limiting clamping grooves, and first bayonets are arranged at one ends of the first clamping strips;

the cover plate is arranged on the upper surface of the first positioning seat;

the first special-shaped piece is arranged in the first limiting clamping groove, the first upper force arm and the first lower force arm are respectively arranged above and below the first clamping strip in parallel, the first limiting clamping block is clamped in the first bayonet, the needle tip of the first special-shaped piece extends upwards and then is limited through the cover plate, and the stitch is limited through the limiting hole in the main body;

the second positioning seat is connected with the first positioning seat, a plurality of second limiting clamping grooves which are arranged in parallel are formed in the second positioning seat, second clamping strips which are horizontally arranged with the first clamping strips are arranged in the second limiting clamping grooves, and a second bayonet is formed at one end of each second clamping strip; the second special-shaped piece is arranged in the second limiting clamping groove, the second upper force arm and the second lower force arm penetrate through the upper portion and the lower portion of the second clamping strip and then extend into the upper portion and the lower portion of the first clamping strip, the second limiting clamping block is clamped in the second bayonet, the needle tip of the second special-shaped piece extends upwards and then is limited through the cover plate, and the stitch passes through the limiting hole in the main body and is limited.

Due to the application of the technical scheme, compared with the prior art, the utility model has the following advantages:

1. utilize a plurality of first dysmorphism pieces and second dysmorphism piece that come out through high accuracy processing to assist the POGO PIN and improve the precision when testing the chip test to the both ends of every dysmorphism piece communicate test chip and PCB bottom plate respectively, holistic uniformity is good, has further promoted the test accuracy.

2. The first special-shaped piece and the second special-shaped piece are made of alloy material through cutting, the service life is long, high current can be adaptively tested, meanwhile, the first special-shaped piece is wrapped inside the second special-shaped piece, the POGO PIN is arranged between the first special-shaped piece and the second special-shaped piece, and the test accuracy can be maintained while the structure of the whole test module is miniaturized.

Drawings

The technical scheme of the utility model is further described below with reference to the accompanying drawings:

FIG. 1 is a schematic diagram of an embodiment of the present utility model;

fig. 2 is an enlarged view of a portion a in fig. 1;

FIG. 3 is a schematic view of a structure of a first special-shaped sheet and a second special-shaped sheet when the first special-shaped sheet and the second special-shaped sheet are matched in an embodiment of the utility model;

FIG. 4 is a schematic perspective view of a first profile sheet and a second profile sheet according to an embodiment of the present utility model;

FIG. 5 is an exploded view of a body and a test module according to an embodiment of the utility model;

FIG. 6 is an enlarged view of portion B of FIG. 5;

FIG. 7 is a schematic diagram of a perspective structure of a test module with a cover omitted and a chip connected according to an embodiment of the utility model;

FIG. 8 is a top view of FIG. 7;

FIG. 9 is a cross-sectional view of B-B of FIG. 8;

FIG. 10 is a schematic diagram showing a three-dimensional structure of a test module connected to a chip according to an embodiment of the utility model;

FIG. 11 is a cross-sectional view of A-A of FIG. 10;

FIG. 12 is a schematic diagram showing a perspective structure of a main body, a test module and a test chip when assembled according to an embodiment of the present utility model;

wherein: the test module comprises a main body 1, a test module 2, a test chip 3, a limiting cover plate 4, a PCB bottom plate 5, an accommodating space 10, a limiting hole 11, a test seat 20, a POGO PIN21, a special-shaped sheet module 22, a first special-shaped sheet 220, a second special-shaped sheet 221, PIN contacts 50, a first body 220a, a first upper arm 221a, a first lower arm 222a, a first needle point 223a, a first limit clamping block 225a, a second body 221b, a second upper arm 222b, a second lower arm 223b, a second needle point 224b, a second needle point 225b, a second limit clamping block 226b, a base 200, a first positioning hole 200a, a first positioning seat 201, a first limit clamping groove 201a, a first clamping strip 202a, a first bayonet 203a, a cover plate 202, a second positioning seat 203, a second limit clamping groove 204, a second clamping strip 205 and a second bayonet 206.

Detailed Description

The utility model will be described in further detail with reference to the accompanying drawings and specific examples.

Referring to fig. 1-2, a contactor for a semiconductor device according to an embodiment of the present utility model includes a main body 1, a test module 2, a test chip 3 and a PCB substrate 5, wherein an accommodating space 10 is provided in the main body 1, the test module 2 is embedded in the accommodating space 10, then the test chip 3 is limited above the test module 2 by a limiting cover 4, the limiting cover 4 is provided on an upper surface of the test module 3, the PCB substrate 5 is provided at a bottom of the main body 1, and the PCB substrate 5 is provided with a plurality of PIN contacts 50 connected with PINs of a first profile 220, a second profile 221 and a POGO PIN21 in the test module 3.

Referring to fig. 5-7, the test module 2 includes a test seat 20, a plurality of POGO PINs 21 and a plurality of profiled sheet modules 22 are embedded in the test seat 20, the profiled sheet modules 22 are formed by a plurality of profiled sheet assemblies, each profiled sheet assembly includes a first profiled sheet 220 and a second profiled sheet 221, and the second profiled sheet 220 is wrapped inside by the first profiled sheet 221.

The number of the special-shaped sheet modules 22 in the present embodiment is four, and the special-shaped sheet modules are respectively disposed on four sides of the test seat 20.

Referring to fig. 3 to 4, the first special-shaped sheet 220 includes a first body 220a, a first upper arm 221a and a first lower arm 222a are formed after the upper end and the lower end of the first body 220 extend to the right side at the same time, then the first upper arm extends upward to form a first needle tip 223a, the first lower arm extends downward to form a first stitch 224a, thereby forming a first U-shaped special-shaped sheet 220, and meanwhile, a first limiting clamping block 225a located on the right side of the first body 220a is arranged between the first upper arm and the first lower arm, and the first limiting clamping block 225a is used for limiting the first special-shaped sheet 220.

The second special-shaped sheet 221 includes a second body 221b, the upper and lower ends of the second body 221b simultaneously extend to the right to form a second upper force arm 222b and a second lower force arm 223b, the first special-shaped sheet 220 is arranged in an area surrounded by the second force arm and the second lower force arm, the second upper force arm extends upwards to form a second needle point 224b, the second lower force arm extends downwards to form a second stitch 225b, a second limiting clamping block 226b positioned at one side of the second body 221b is arranged between the second upper force arm and the second lower force arm, and the second limiting clamping block 226b has a limiting function on the second special-shaped sheet 221 when the second limiting clamping block 226b has the same function.

Referring to fig. 8-12, the test socket 20 includes a base 200, a first positioning socket 201, a cover 202, and a second positioning socket 203; a first positioning hole 200a for positioning the POGO PIN21 is arranged at the center of the base 200; the four first positioning seats 201 are respectively arranged on four sides of the base 200, a plurality of first limiting clamping grooves 201a which are arranged in parallel are formed in the first positioning seats 201, first clamping strips 202a are arranged in the middle of the first limiting clamping grooves 201a, first clamping openings 203a are formed in one ends of the first clamping strips 202, and the first clamping openings 203a are used for corresponding to the first limiting clamping blocks 225a; the cover plate 202 is disposed on the upper surface of the first positioning seat 201 to cover the first positioning seat 201.

In the present embodiment, a group of two first positioning seats 201 are respectively and oppositely arranged on four door surfaces of the base 200; wherein, the two oppositely arranged first positioning seats 201 comprise seven first special-shaped sheets 220 which are arranged in parallel, and the other two oppositely arranged first positioning seats 201 comprise five first special-shaped sheets 220 which are arranged in parallel; during installation, the first special-shaped sheet 220 is clamped into the first limiting clamping groove 201a, at this time, the first upper force arm and the first lower force arm are respectively aligned above and below the first clamping strip 202a, and the first limiting clamping block 225a is clamped in the first bayonet 203a, so that the first special-shaped sheet 200 is positioned in the first positioning seat 201, meanwhile, the needle tip of the first special-shaped sheet 200 extends upwards and then is limited through the cover plate 202, and the stitch passes through the limiting hole 11 on the main body 1 to be limited.

One end of each first positioning seat 201 is provided with a second positioning seat 203 connected with the first positioning seat, second positioning seats 203 are internally provided with second limiting clamping grooves 204 which are arranged in parallel and have the same number as the first limiting clamping grooves in the corresponding first positioning seats 201, second clamping strips 205 which are horizontally arranged with the first clamping strips 202a are arranged in the second limiting clamping grooves 204, and one end of each second clamping strip 205 is provided with a second bayonet 206.

During installation, the second special-shaped piece 221 is clamped into the second limiting clamping groove 204, meanwhile, the second upper force arm and the second lower force arm respectively extend into the upper part and the lower part of the first clamping strip 202a after passing through the upper part and the lower part of the second clamping strip 205, the second limiting clamping block is clamped in the second bayonet, the needle tip of the second special-shaped piece extends upwards and then is limited through the cover plate, and the stitch is limited by passing through the limiting hole 11 in the main body 1.

The POGO PIN21 is arranged at the center of the base through the first positioning hole 200a, so that a test module for testing the chip is formed by the first special-shaped piece, the second special-shaped piece and the POGO PIN, the POGO PIN mainly plays an auxiliary role, the second special-shaped piece is embedded in the first special-shaped piece, the POGO PIN is positioned in the middle of the first special-shaped piece and the second special-shaped piece, the occupied space of the whole test module is small, and meanwhile, the first special-shaped piece and the second special-shaped piece are arranged in the base in a pluggable mode, so that the installation and replacement are convenient.

In addition, each first special-shaped piece and each second special-shaped piece can accurately and rapidly and effectively connect the test chip with the PCB, and two ends of each special-shaped piece are respectively and accurately connected with the PCB and the test chip, so that the overall consistency is good, the yield and the accuracy are integrally improved, and the contact reliability is improved; meanwhile, the first special-shaped piece and the second special-shaped piece adopt high-wear-resistance superconducting alloy materials and mechanical principle structures, and precision and electrical property are guaranteed by adopting slow wire cutting, so that service life and use precision of the special-shaped piece are prolonged.

During integral installation, the needle points of the POGO PIN21, the first special-shaped piece and the second special-shaped piece penetrate out of the top of the test seat 20 and then are in contact with the test chip 3, and the PINs of the POGO PIN21, the first special-shaped piece and the second special-shaped piece sequentially penetrate through the test seat and the main body and then are in contact with the PIN contacts 50.

As a further preferred embodiment of the utility model, the limiting cover plate limits the test chip through four sides.

The contactor for the semiconductor device has compact overall structure, is formed by inserting a plurality of first special-shaped sheets, a plurality of second special-shaped sheets and a plurality of Pogo pins into a base, has compact structure and small occupied space, then tests the test chip by using the test module, has high service life and test precision, good test consistency and convenient maintenance and replacement, can meet the current which cannot be met by the Pogo pins, has wide application range and meets the actual test requirement.

The foregoing is merely a specific application example of the present utility model, and the protection scope of the present utility model is not limited in any way. All technical schemes formed by equivalent transformation or equivalent substitution fall within the protection scope of the utility model.

Claims (5)

1. A contactor for a semiconductor device, comprising:

a main body having an accommodating space therein;

the test module is arranged in the accommodating space and comprises a test seat, a plurality of POGO PIN and a plurality of special-shaped sheet modules are embedded in the test seat, each special-shaped sheet module is composed of a plurality of special-shaped sheet assemblies, each special-shaped sheet assembly comprises a first special-shaped sheet and a second special-shaped sheet, and the second special-shaped sheet wraps the first special-shaped sheet in the test seat;

the test chip is limited above the test module through a limiting cover plate, wherein the limiting cover plate is arranged on the upper surface of the test module;

the PCB bottom plate is arranged at the bottom of the main body and is provided with PIN contacts connected with PINs of the first special-shaped piece, the second special-shaped piece and the POGO PIN;

the POGO PIN, the first special-shaped piece and the needle tip of the second special-shaped piece are contacted with the test chip after penetrating out from the top of the test seat, and PINs of the POGO PIN, the first special-shaped piece and the second special-shaped piece sequentially penetrate through the test seat and the main body and then are contacted with the PIN contacts.

2. The contactor for a semiconductor device according to claim 1, wherein: the limiting cover plate limits the test chip through four sides.

3. The contactor for a semiconductor device according to claim 1, wherein: the number of the special-shaped sheet modules is four, and the four special-shaped sheet modules are arranged on four sides of the test seat.

4. A contactor for a semiconductor device according to claim 3, wherein: the first special-shaped sheet comprises a first body, wherein two ends of the first body extend towards the same side to form a first upper force arm and a first lower force arm, the first upper force arm upwards forms a first needle point, the first lower force arm downwards extends to form a first stitch, and a first limit clamping block positioned on the first body is arranged between the first upper force arm and the first lower force arm;

the second special-shaped sheet comprises a second body, two ends of the second body extend to the same side to form a second upper force arm and a second lower force arm, and the first special-shaped sheet is arranged in an area surrounded by the second upper force arm and the second lower force arm; the second upper force arm upwards forms a second needle point, and the second lower force arm downwards extends to form a second stitch; and a second limiting clamping block positioned at one side of the first body is arranged between the second upper force arm and the second lower force arm.

5. The contactor for a semiconductor device according to claim 4, wherein the test socket comprises:

the POGO PIN positioning device comprises a base, wherein a first positioning hole for positioning the POGO PIN is formed in the center of the base;

the first positioning seat is arranged on four sides of the base, a plurality of first limiting clamping grooves which are arranged in parallel are formed in the first positioning seat, first clamping strips are arranged in the first limiting clamping grooves, and first bayonets are arranged at one ends of the first clamping strips;

the cover plate is arranged on the upper surface of the first positioning seat;

the first special-shaped piece is arranged in the first limiting clamping groove, the first upper force arm and the first lower force arm are respectively arranged above and below the first clamping strip in parallel, the first limiting clamping block is clamped in the first bayonet, the needle tip of the first special-shaped piece extends upwards and then is limited through the cover plate, and the stitch is limited through the limiting hole in the main body;

the second positioning seat is connected with the first positioning seat, a plurality of second limiting clamping grooves which are arranged in parallel are formed in the second positioning seat, second clamping strips which are horizontally arranged with the first clamping strips are arranged in the second limiting clamping grooves, and a second bayonet is formed at one end of each second clamping strip; the second special-shaped piece is arranged in the second limiting clamping groove, the second upper force arm and the second lower force arm penetrate through the upper portion and the lower portion of the second clamping strip and then extend into the upper portion and the lower portion of the first clamping strip, the second limiting clamping block is clamped in the second bayonet, the needle tip of the second special-shaped piece extends upwards and then is limited through the cover plate, and the stitch passes through the limiting hole in the main body and is limited.