CN219302611U

CN219302611U - Chip testing device

Info

Publication number: CN219302611U
Application number: CN202320714088.8U
Authority: CN
Inventors: 张娜娜
Original assignee: Shanghai Falab Test Technology Co ltd
Current assignee: Shanghai Falab Test Technology Co ltd
Priority date: 2023-03-31
Filing date: 2023-03-31
Publication date: 2023-07-04
Anticipated expiration: 2033-03-31

Abstract

The utility model relates to the field of chip testing and discloses a chip testing device which comprises a base, wherein the upper surface of the base is provided with a mounting groove, a mounting frame for placing a chip is arranged in the mounting groove, and a jacking mechanism for jacking the mounting frame out of the mounting groove is arranged in the mounting groove. When the chip testing device is used, after the gland is opened, the mounting frame is ejected out of the mounting groove under the action of the ejection mechanism, and at the moment, the chip to be tested is conveniently placed on the mounting frame; after the chip to be tested is placed on the mounting frame, the mounting frame is pressed downwards, and then the gland is covered, so that the chip to be tested can be contacted with the probe seat in the base, and the chip to be tested can be tested at the moment; after the test operation is finished, the gland is opened, the mounting frame can be jacked up from the mounting groove under the action of the jacking mechanism, and at the moment, the chip is convenient to take off from the mounting frame; the utility model has the advantages of simple and convenient test operation and the like.

Description

Chip testing device

Technical Field

The utility model relates to the field of chip testing, in particular to a chip testing device.

Background

With the rapid development of semiconductors, semiconductor integrated circuits are widely used in various fields, and the complexity of chips is increasing. In order to ensure the quality of the delivered chips, the working environment of the chips needs to be simulated by a testing device for burn-in testing.

At present, a chip test seat commonly used in the market tests a chip, and the chip test seat is a static connector between the chip and the PCB, so that the replacement test of the chip is more convenient, the chip is not required to be always welded and taken down, the chip and the PCB are not damaged, and the quick and efficient test is achieved.

At present, when the chip test seat is used, as the chip to be tested is placed in the groove in the chip test seat, auxiliary tools such as tweezers are needed to be used for taking and placing the chip to be tested, and the defect of poor convenience exists in the process of taking and placing the chip.

Disclosure of Invention

The utility model aims to provide a chip testing device which solves the problem that the conventional chip testing device has poor convenience when taking and placing chips.

In order to achieve the aim of the utility model, the utility model adopts the following technical scheme: the utility model provides a chip testing device, includes the base, the base upper surface is equipped with the mounting groove, be equipped with the installing frame that is used for placing the chip in the mounting groove, be equipped with in the mounting groove and be used for ejecting the jacking mechanism outside the mounting groove with the installing frame.

Preferably, the jack-up mechanism is including setting up many guide bars in the installing frame below, the bottom mounting of guide bar is in the mounting groove, be equipped with the guiding hole corresponding with the guide bar on the installing frame, the guide bar top is inserted and is established in the guiding hole that corresponds, the cover is equipped with first spring on the guide bar, the both ends of first spring are connected respectively on the lower surface of installing frame and the bottom of mounting groove.

Preferably, notches for taking and placing chips are arranged on two sides of the mounting frame.

Preferably, a limiting mechanism for limiting the chip from sliding in the mounting frame is arranged on the mounting frame, the limiting mechanism comprises a cavity arranged in the mounting frame, a first hole communicated with the cavity is formed in the upper surface of the mounting frame, and a second hole communicated with the cavity is formed in the inner side wall of the mounting frame;

the limiting mechanism further comprises a T-shaped deflector rod, the head part of the deflector rod is positioned in the cavity, and the rod part of the deflector rod penetrates through the first hole; the limiting plate is inserted in the second hole, a waist-shaped hole is formed in the limiting plate, a limiting column is arranged in the second hole and penetrates through the second hole, one end of the limiting plate extends into the inner cavity and is hinged to one end of the head of the deflector rod, and a second spring is further arranged in the inner cavity at the other end of the head of the deflector rod.

Preferably, the bottom of the mounting groove is provided with a probe seat, and the probe seat is provided with a plurality of probes.

Preferably, the novel multifunctional pressure cooker further comprises a pressure cover, wherein one side edge of the pressure cover is hinged to the edge of the upper surface of the base, a connecting plate is hinged to the outer wall of the opening side of the pressure cover, a torsion spring is arranged on a hinge shaft of the connecting plate and the pressure cover, one end of the connecting plate is provided with a hooking part, and a hooking groove corresponding to the hooking part is formed in the side wall of the base.

Preferably, a pressing block is arranged on the inner side surface of the pressing cover.

The beneficial effects of the utility model are concentrated in that:

when the chip testing device is used, after the gland is opened, the mounting frame is ejected out of the mounting groove under the action of the ejection mechanism, and at the moment, the chip to be tested is conveniently placed on the mounting frame; after the chip to be tested is placed on the mounting frame, the mounting frame is pressed downwards, and then the gland is covered, so that the chip to be tested can be contacted with the probe seat in the base, and the chip to be tested can be tested at the moment; after the test operation is finished, the gland is opened, the mounting frame can be jacked up from the mounting groove under the action of the jacking mechanism, and at the moment, the chip is convenient to take off from the mounting frame; the utility model has the advantages of simple and convenient test operation and the like.

Drawings

FIG. 1 is a schematic diagram of the overall structure of a chip testing apparatus according to the present utility model;

FIG. 2 is a top view of the base of the present utility model;

FIG. 3 is a cross-sectional view of the base of the present utility model;

FIG. 4 is a schematic view of the assembled structure of the mounting frame and the limiting mechanism of the present utility model;

FIG. 5 is an enlarged view of portion A of the structure of FIG. 4;

legend description: 1. a base; 2. a mounting groove; 3. a gland; 4. a connecting plate; 5. a torsion spring; 6. a hooking part; 7. a hooking groove; 8. briquetting; 9. a probe seat; 10. a probe; 11. a mounting frame; 12. a guide rod; 13. a guide hole; 14. a first spring; 15. a notch; 16. a cavity; 17. a first aperture; 18. a second hole; 19. a deflector rod; 20. a limiting plate; 21. a waist-shaped hole; 22. a limit column; 23. and a second spring.

Detailed Description

In order to make the technical solution of the present utility model better understood by those skilled in the art, the present utility model will be further described in detail with reference to the accompanying drawings and specific embodiments.

As shown in fig. 1, the chip testing device comprises a base 1 and a gland 3, wherein one side edge of the gland 3 is hinged to the edge of the upper surface of the base 1, a connecting plate 4 is hinged to the outer wall of the opening side of the gland 3, a torsion spring 5 is arranged on the hinge shaft of the connecting plate 4 and the gland 3, one end of the connecting plate 4 is provided with a hook part 6, and a hook groove 7 corresponding to the hook part is arranged on the side wall of the base 1; when in use, the connecting plate 4 is pressed to separate the hooking part 6 of the connecting plate 4 from the hooking groove 7, and the gland 3 can be opened at the moment; after closing the upper gland 3, the hooking part 6 of the connecting plate 4 can be firmly hooked in the hooking groove under the action of the torsion spring 5.

The upper surface of the base 1 is provided with a mounting groove 2, the bottom of the mounting groove 2 is provided with a probe seat 9, the probe seat 9 is provided with a plurality of probes 10, under normal conditions, a chip to be tested can be directly placed in the mounting groove 2, then the upper gland 3 is closed, and as the inner side surface of the gland 3 is provided with a pressing block 8, the pressing block 8 can tightly support the chip to be tested on the probe seat 9, and at the moment, the defects of aging and the like of the chip to be tested are detected. Because the mounting groove 2 has a certain depth, the chip to be tested needs to be completed by an auxiliary tool when being taken and placed, and the defect of poor convenience exists.

In this embodiment, in order to improve the convenience of taking and placing the chip to be tested, as shown in fig. 2, a mounting frame 11 for placing the chip is disposed in the mounting groove 2, and a jacking mechanism for jacking the mounting frame 11 out of the mounting groove 2 is disposed in the mounting groove 2.

When the chip testing device is used, after the gland 3 is opened, the mounting frame 11 is ejected out of the mounting groove 2 under the action of the ejection mechanism, and at the moment, a chip to be tested is conveniently placed on the mounting frame 11; after the chip to be tested is placed on the mounting frame 11, the mounting frame 11 is pressed downwards, and then the gland 3 is covered, so that the chip to be tested can be contacted with the probe seat 9 in the base 1, and the chip to be tested can be tested at the moment; after the test operation is finished, the gland 3 is opened, the mounting frame 11 can be jacked up from the mounting groove 2 under the action of the jacking mechanism, and at the moment, the chip is convenient to take off from the mounting frame 11; the utility model has the advantages of simple and convenient test operation and the like.

Specifically, as shown in fig. 3, the jacking mechanism includes a plurality of guide rods 12 disposed below the mounting frame 11, in this embodiment, the guide rods 12 are preferably disposed in four positions near four corners of the mounting groove 2, the bottom ends of the guide rods 12 are fixed in the mounting groove 2, guide holes 13 corresponding to the guide rods 12 are disposed on the mounting frame 11, the top ends of the guide rods 12 are inserted into the corresponding guide holes 13, a first spring 14 is sleeved on the guide rods 12, and two ends of the first spring 14 are respectively connected to the lower surface of the mounting frame 11 and the bottom of the mounting groove 2.

Therefore, when in use, after the chip to be tested is placed on the mounting frame 11, the gland 3 is closed, the mounting frame 11 can be pressed down until the chip to be tested is contacted with the probe seat 9, and the first spring 14 is in a compressed state; when the gland 3 is opened, the mounting frame 11 is automatically reset under the action of the first spring 14.

As a further optimization of this embodiment, the two sides of the mounting frame 11 are provided with notches 15 for taking and placing chips, and the chips are more conveniently mounted or taken out through the notches 15.

As a further optimization of the embodiment, since the mounting frame 11 is easy to slide off the mounting frame 11 in the process of resetting and bouncing, the chip is easy to be damaged after the chip slides off, so as to avoid the occurrence of the above situation; as shown in fig. 4-5, a limiting mechanism for limiting the chip from sliding from the mounting frame 11 is arranged on the mounting frame 11, the limiting mechanism comprises a cavity 16 arranged in the mounting frame 11, a first hole 17 communicated with the cavity 16 is arranged on the upper surface of the mounting frame 11, and a second hole 18 communicated with the cavity 16 is arranged on the inner side wall of the mounting frame 11;

the limiting mechanism further comprises a T-shaped deflector rod 19, the head of the deflector rod 19 is positioned in the cavity 16, and the rod part of the deflector rod 19 penetrates through the first hole 17; the limiting plate 20 is inserted into the second hole 18, a waist-shaped hole 21 is formed in the limiting plate 20, a limiting column 22 is arranged in the second hole, the limiting column 22 is arranged in the second hole 18 in a penetrating mode, one end of the limiting plate 20 extends into the inner cavity and is hinged to one end of the head of the deflector rod 19, and a second spring 23 is further arranged in the inner cavity at the other end of the head of the deflector rod 19.

When in use, under the action of the elastic force of the second spring 23, the deflector 19 is positioned at the left side of the first hole 17 in fig. 5, and the limiting plate 20 extends out of the second hole 18 at this time, so that the chip can be limited in the mounting frame 11; when the chip is to be removed or mounted, the deflector 19 is moved to the right, the limiting plate 20 can rotate around the limiting post 22 and is received in the second hole 18, and at this time, the chip can be freely taken out from the mounting frame 11; after the chip is taken out or mounted, the deflector rod 19 is loosened, the deflector rod 19 automatically moves leftwards under the action of the elasticity of the second spring 23, and the limiting plate 20 is ejected out of the second hole 18.

It should be noted that, for simplicity of description, the foregoing method embodiments are all expressed as a series of action combinations, but it should be understood by those skilled in the art that the present application is not limited by the described order of action, as some steps may take other order or be performed simultaneously according to the present application. Further, those skilled in the art will also appreciate that the embodiments described in the specification are all preferred embodiments and that the acts and elements referred to are not necessarily required in the present application.

Claims

1. The utility model provides a chip testing device, includes base (1), base (1) upper surface is equipped with mounting groove (2), its characterized in that: the mounting groove (2) is internally provided with a mounting frame (11) for placing chips, and the mounting groove (2) is internally provided with a jacking mechanism for jacking the mounting frame (11) out of the mounting groove (2).

2. The chip testing apparatus according to claim 1, wherein: the jacking mechanism comprises a plurality of guide rods (12) arranged below a mounting frame (11), the bottom ends of the guide rods (12) are fixed in a mounting groove (2), guide holes (13) corresponding to the guide rods (12) are formed in the mounting frame (11), the top ends of the guide rods (12) are inserted into the corresponding guide holes (13), first springs (14) are sleeved on the guide rods (12), and two ends of each first spring (14) are respectively connected to the lower surface of the mounting frame (11) and the bottom of the mounting groove (2).

3. The chip testing apparatus according to claim 1, wherein: two sides of the mounting frame (11) are provided with notches (15) for taking and placing chips.

4. A chip testing apparatus according to claim 3, wherein: the chip mounting device is characterized in that a limiting mechanism for limiting the chip to slide from the mounting frame (11) is arranged on the mounting frame (11), the limiting mechanism comprises a cavity (16) arranged in the mounting frame (11), a first hole (17) communicated with the cavity (16) is formed in the upper surface of the mounting frame (11), and a second hole (18) communicated with the cavity (16) is formed in the inner side wall of the mounting frame (11);

the limiting mechanism further comprises a T-shaped deflector rod (19), the head part of the deflector rod (19) is positioned in the cavity (16), and the rod part of the deflector rod (19) penetrates through the first hole (17); the limiting plate (20) is inserted in the second hole (18), the waist-shaped hole (21) is formed in the limiting plate (20), the limiting column (22) is arranged in the second hole (18) in a penetrating mode, one end of the limiting plate (20) extends into the inner cavity and is hinged to one end of the head of the deflector rod (19), and the second spring (23) is arranged in the inner cavity at the other end of the head of the deflector rod (19).

5. The chip testing apparatus according to claim 1, wherein: the bottom of the mounting groove (2) is provided with a probe seat (9), and the probe seat (9) is provided with a plurality of probes (10).

6. The chip testing apparatus according to claim 1, wherein: still include gland (3), one side border of gland (3) articulates on the border of base (1) upper surface, articulated on the outer wall of the side of opening and shutting of gland (3) have connecting plate (4), be equipped with torsional spring (5) on the articulated shaft of connecting plate (4) and gland (3), the one end of connecting plate (4) is equipped with hook portion (6), be equipped with on the lateral wall of base (1) with the corresponding hook groove (7) of hook portion.

7. The chip testing apparatus according to claim 6, wherein: the pressing block (8) is arranged on the inner side surface of the pressing cover (3).