CN115356613A

CN115356613A - Novel anti-interference high-speed backplane connector test system

Info

Publication number: CN115356613A
Application number: CN202211299613.0A
Authority: CN
Inventors: 牛林; 邓瑞林; 唐四明
Original assignee: Shenzhen West Point Precision Technology Co ltd
Current assignee: Shenzhen West Point Precision Technology Co ltd
Priority date: 2022-10-24
Filing date: 2022-10-24
Publication date: 2022-11-18
Anticipated expiration: 2042-10-24
Also published as: CN115356613B

Abstract

The application relates to the technical field of semiconductor device detection, in particular to a novel anti-interference high-speed backplane connector test system which comprises a rotary base column, wherein an annular test seat is rotationally arranged on the outer edge of the rotary base column, and a test machine for testing a backplane connector is arranged on the annular test seat; the position of the backplane connector in the v-21274type test frame is limited through the matching of the side positioner and the abutting limiter, so that the performance tester can be ensured to be accurately butted with the backplane connector in the v-21274type test frame, and the performance tester can test the backplane connector; the invention can move out the backplane connector which is tested through the ejector; meanwhile, the performance tester vibrates the backplane connector through the vibrator in the test process to prevent the problem that the performance tester cannot detect the problem due to the fact that the components in the backplane connector are connected with the mainboard in a short time due to insufficient soldering.

Description

Novel anti-interference high-speed backplane connector test system

Technical Field

The application relates to the technical field of semiconductor device detection, in particular to a novel anti-interference high-speed backplane connector test system.

Background

The backplane connector is a type of connector commonly used for large-scale communication equipment, ultrahigh-performance servers, supercomputers, industrial computers and high-end storage equipment, and is mainly used for connecting a single board (daughter card) and a backplane, wherein a 90-degree vertical structure is formed between the single board and the backplane to transmit high-speed differential signals or single-ended signals and transmit large current.

In order to ensure that product performance is not problematic, the backplane connector needs to be tested before leaving the factory, but the existing testing mode mainly includes that the backplane connector is tested manually through an electrical testing machine, the testing efficiency is not high, so that the testing mode needs to be improved, for example, a high-speed backplane connector conduction testing device with the publication number of CN217385795U comprises a base, a probe seat mechanism, a dotting mechanism, a tongue piece mechanism and a pressing mechanism, wherein the base is also provided with an electrical cabinet, the electrical testing machine is arranged on the electrical cabinet, and the electrical testing machine is electrically connected with the probe seat mechanism and the tongue piece mechanism; the pressing mechanism is arranged on the outer side wall of the electric cabinet above the probe seat mechanism; the dotting mechanism and the tongue piece mechanism are respectively arranged on one side of the probe seat. In the prior art, the connector is fixed and clamped by using the probe seat, and meanwhile, the fish eye of the terminal of the connector is connected with the probe; in the prior art, the connector is pressed by the pressing mechanism during testing, so that the stability of the test is ensured; the prior art described above uses the tongue piece to be inserted into the gold pin of the connector, so that the gold pin contacts all short-circuits, and the prior art described above has few parts and is convenient for wire replacement.

Although the prior art can replace manual testing of the performance of the side plate connector through an electric testing machine, some defects still exist:

1. the prior art only replaces the electric measuring machine, still needs manual work to install and take out the backplane connector, does not fundamentally solve the problem, and does not improve the testing efficiency.

2. Above-mentioned prior art is through the circular telegram test to the backplane connector, whether each unit of mainboard in the detection backplane connector can normal use, but does not consider in the backplane connector each components and parts rosin joint on the mainboard for the backplane connector is only temporarily intact, still has the product quality problem.

Disclosure of Invention

The application provides a novel anti-interference high-speed backplane connector test system adopts following technical scheme:

a novel anti-interference high-speed backplane connector test system comprises a rotary base column, wherein an annular test seat is rotatably arranged on the outer edge of the rotary base column, and a test machine for testing a backplane connector is arranged on the annular test seat;

the tester comprises a v-21274type test frame, wherein the v-21274type test frame is uniformly distributed along the outer edge of an annular test seat in the circumferential direction, side edge positioners for positioning a backboard connector are arranged at two sides of the v-21274type test frame, a tightening stopper for tightening the backboard connector is arranged at one end of the v-21274type test frame, which is close to the outer edge of the annular test seat, a performance tester for testing the backboard connector is arranged at the top of the v-21274type test frame, a vibrator is arranged on the annular test seat and at the v-21274type test frame for vibrating the backboard connector, and a material ejector is arranged at one side of the v-21274type test frame, which faces a rotating base column, and is used for ejecting the backboard connector in the v-21274type test frame; the annular test seat is distributed with a feeding area, a test area and a discharging area along the rotation direction of the annular test seat in sequence.

Preferably, the side edge positioner comprises a v-21274type test frame, wherein two symmetrically distributed positioning pieces are arranged in the v-21274type test frame in a sliding manner, one side of each positioning piece, which faces to the side wall of the v-21274type test frame, is connected with a positioning rope, the positioning rope penetrates through the v-21274type test frame and is connected with a sliding strip positioned on the outer side of the v-21274type test frame, a positioning spring is connected between the positioning piece and the v-21274type test frame and is used for driving the positioning piece to position a backboard connector, a side frame is arranged on the outer side of the v-21274type test frame and is positioned on the same side with the positioning piece, the sliding strip is arranged on a sliding seat arranged in the side frame in a sliding manner, and a positioning control piece is arranged on the rotating base column and is used for driving the sliding strip to control the backboard connector in the v-21274type test frame;

one side of the sliding seat, which is far away from the v-21274type test frame, is rotatably connected with an adjusting screw rod, and the adjusting screw rod penetrates through the side frame and is in threaded connection with the side frame.

Preferably, the positioning control part comprises an annular positioning ring arranged on the outer side wall of the rotary base column, and arc-shaped bulges are arranged on the outer side wall of the annular positioning ring and positioned at the feeding area and the discharging area and used for controlling the positioning part to position the backboard connector in the 21274type test frame;

an arc-shaped strip which is in sliding fit with the annular positioning ring and the arc-shaped bulge is arranged on one side, close to the rotary base column, of the v-shaped 21274.

Preferably, the abutting limiter comprises an abutting block, the abutting block is arranged on an annular test seat in a sliding manner along the radius direction of the annular test seat, the abutting block is positioned between two positioning pieces in the v 21274type test frame, the bottom of the abutting block is connected with two vertical sections of the U-shaped guide frame, a guide sliding chute convenient for the sliding of the two vertical sections of the U-shaped guide frame is arranged on the annular test seat along the radius direction of the annular test seat, a retreat groove convenient for the up-and-down sliding of the abutting block and communicated with the guide sliding chute is arranged on the edge of the annular test seat, one end of the abutting block, which is far away from the rotary base column, is provided with an abutting part, and a limiting part matched with the abutting part is arranged on the outer edge of the annular test seat and is used for controlling the abutting block to abut against a backplane connector in the v 21274; and one end of the retreat groove, which is away from the guide sliding groove, is provided with a matching groove which is convenient for the contact part to slide up and down.

A propping control block is arranged at the bottom of the annular test seat in a sliding manner along the radius direction of the annular test seat, two vertical sections of the U-shaped guide frame are arranged on the propping control block in a vertically sliding manner, and a first spring is connected between the horizontal section of the U-shaped guide frame and the bottom of the propping control block and used for controlling the propping block to slide vertically in the retreat slot;

and a second spring is connected between the side wall of the abutting control block and a fixed seat arranged at the bottom of the annular test seat and used for controlling the abutting block to slide along the length direction of the guide sliding groove.

Preferably, the limiting part comprises an arc-shaped limiting block which is rotatably arranged on the outer side wall of the annular testing seat and is positioned in a testing area of the annular testing seat, the arc-shaped limiting block is fixed on a bottom supporting plate arranged at the bottom of the rotary foundation column, and a guide slope matched with the abutting part is formed at the upper end of one side, facing the feeding area, of the arc-shaped limiting block and is used for driving the abutting block to move upwards in the retreat groove;

the upper end of the arc limiting block is provided with an arc abutting plate, the arc abutting plate is positioned at one end of the guide slope, and one end of the arc abutting plate facing the rotating base column is provided with an abutting slope, so that the abutting block is driven to move towards the backboard connector in the 21274;

horizontal plates are rotatably arranged on the outer side wall of the annular test seat and positioned in the feeding area and the discharging area, the upper end surfaces of the horizontal plates are flush with the upper surface of the annular test seat so as to facilitate feeding and discharging of a backboard connector, and the horizontal plates are fixed on the bottom support plate;

the conflict piece is including a conflict section of thick bamboo, a conflict section of thick bamboo level is fixed on supporting tight piece, and a conflict section of thick bamboo deviates from one side threaded connection who supports tight piece and has the conflict pole, support the conflict pole and support tight inboard wall and support tight slope conflict cooperation with the arc, a conflict section of thick bamboo and conflict pole all contradict the cooperation with arc stopper up end and guide slope.

Preferably, the performance tester comprises a cover plate arranged at the top of the v-21274type test frame, a control plate which is vertically arranged is arranged on the cover plate in a sliding manner, the control plate penetrates through the cover plate in a sliding manner, a detachable covering test plate is installed at the lower end of the cover plate, a contact element matched with the backplane connector is arranged at the bottom of the covering test plate and used for testing the backplane connector, and a return spring is connected between the covering test plate and the cover plate and used for driving the contact element to move out of the backplane connector;

rotatory foundation pillar top is fixed with cyclic annular T template, cyclic annular T template bottom and the test area department that is located annular test seat are provided with the arc lid plywood, and arc lid plywood bottom and the conflict cooperation in control panel top, the bottom that the arc lid plywood is close to feed area one side is provided with and conflicts the complex lid with the control panel top and closes the slope.

Preferably, the elastic device comprises an elastic plate, the elastic plate is arranged in a placing groove formed in the inner side wall of one end of the v-type test seat, which is far away from the rotating base column, one side of the elastic plate, which is far towards the rotating base column, is connected with an elastic rod, the elastic rod slides and penetrates through a v-type test frame, an auxiliary ring which is convenient for the elastic rod to slide is arranged outside the v-type test frame, one end of the elastic rod, which is far away from the elastic plate, is provided with a vertically arranged control rod, and an elastic rope is arranged on the side wall of the v-type test frame and above the auxiliary ring and penetrates through the control rod;

the annular positioning ring is provided with arc-shaped elastic strips at the feeding area and the testing area, the arc-shaped elastic strips are in conflict fit with the control rod, one end of each arc-shaped elastic strip at the feeding area is connected with an arc-shaped extension strip fixed on the arc-shaped protrusion, and the arc-shaped extension strips are in conflict fit with the control rod.

Preferably, the vibrator comprises a vibrating cylinder, a plurality of vibrating holes are formed in the annular testing seat and located in the 21274type testing frame, the vibrating cylinder is located in the vibrating holes, two ends of the vibrating cylinder are rotatably connected with a vibrating plate which slides in the vibrating holes, a plurality of limiting teeth are uniformly arranged on one side of the vibrating cylinder in the circumferential direction, a rotating control strip is arranged in the vibrating holes and corresponds to the limiting teeth in a vertical sliding manner, a plurality of grooves are uniformly formed in one side of the rotating control strip, which faces the limiting teeth, from top to bottom, and matching teeth are hinged to the bottom in the grooves and matched with the limiting teeth to drive the vibrating cylinder to rotate;

the bottom of the rotation control bar is connected with a vibrating piece; the utility model discloses a rotary foundation column, including rotatory foundation column lateral wall, feeding area, vibration piece, rotation control strip top and vibration hole, just be located annular test seat below department on the rotatory foundation column lateral wall and be provided with the ARC vibration board that is located the test area, and the ARC vibration board is close to the one end in feeding area and is provided with the complex vibration slope of contradicting bottom the vibration board, evenly set up a plurality ofly on the ARC vibration board and contradict complex triangle sloping block with the vibrating piece, be connected with down spring between rotation control strip top and the vibration hole.

Preferably, the vibration cylinder is of a hollow shell structure, an elastic air bag is arranged in the vibration cylinder, a plurality of circular holes are uniformly formed in the outer side wall of the vibration cylinder, a vibration rod is slidably arranged in the circular holes, and one end, located in the vibration cylinder, of the vibration rod is in abutting fit with the elastic air bag;

the vibrating piece is including fixing the vibrating ring that just is vertical arranging in rotation control strip bottom, vibrating ring bottom threaded connection has the cooperation pole, and the inclined plane conflict cooperation of cooperation pole and triangle sloping block.

Preferably, a plurality of vibration cylinders located in the middle area of the v-21274type test frame are uniformly distributed along the radius direction of the annular test seat, rotate along the radius direction of the annular test seat and are used for driving the backplane connector to move along the radius direction of the annular test seat; the vibration cylinders are distributed in the direction perpendicular to the radius direction of the annular test seat and rotate in the direction perpendicular to the radius direction of the annular test seat, so that the backboard connector is driven to move in the direction perpendicular to the radius direction of the annular test seat.

In summary, the present application includes at least one of the following beneficial technical effects:

1. the invention limits the position of the backplane connector in the v-21274type test frame through the matching of the side positioner and the abutting limiter, and ensures that the performance tester can be accurately butted with the backplane connector in the v-21274type test frame, so that the performance tester can test the backplane connector; the rear panel connector which is tested can be moved out through the ejector, so that the 21274type test frame can be tested on the next rear panel connector to be tested after rotating to the feeding area; meanwhile, the performance tester vibrates the backplane connector through the vibrator in the test process to prevent the problem that the performance tester cannot detect the problem due to the short connection caused by the insufficient soldering of the components and the mainboard in the backplane connector.

2. The invention can vibrate the backplane connector under test through the vibrator, and is used for detecting whether each component in the backplane connector has a cold joint problem or not, so that the performance tester can not effectively test whether the backplane connector meets the specified requirements or not; meanwhile, the plurality of rotating cylinders can vibrate the backboard connector under different vibration forces, and can drive the backboard connector to move in all directions on the upper surface of the annular test seat, so that the problem of insufficient soldering of the backboard connector can be further tested.

3. The distance between the abutting rod and the abutting cylinder can be adjusted according to the specification and the size of the backplane connector, so that the distance between the abutting block and the backplane connector can be changed, and the abutting block can be limited in a 21274type test frame aiming at the backplane connectors with different specifications and sizes.

Drawings

Fig. 1 is a first schematic structural diagram of the present invention.

FIG. 2 is a second structural diagram of the present invention.

FIG. 3 is a first schematic view of the side edge positioning device of the present invention.

Fig. 4 is a partial enlarged view of fig. 3 a according to the present invention.

FIG. 5 is a second schematic structural view of the side locator of the present invention.

Fig. 6 is a schematic structural view of the holding limiter of the present invention.

FIG. 7 is a schematic diagram of a performance tester according to the present invention.

FIG. 8 is a schematic view of the structure of the ejector of the present invention.

Fig. 9 is a partial enlarged view of the invention at B of fig. 8.

Fig. 10 is a schematic view of the structure of the vibrator of the present invention.

Fig. 11 is an enlarged view of a portion of the invention at C of fig. 10.

Fig. 12 is a schematic structural view of the vibration cylinder of the present invention.

Fig. 13 is a schematic view showing the structure among the rotation control bar, the vibration plate and the vibrating member according to the present invention.

Fig. 14 is a schematic view showing a structure between an arc vibration plate and a triangular swash block according to the present invention.

Description of the reference numerals: 100. a backplane connector; 1. rotating the foundation column; 2. an annular test seat; 21. a feed zone; 22. a test zone; 23. a discharge zone; 3. a testing machine; 4. a type v 21274; 5. a side locator; 51. a positioning member; 52. positioning the rope; 53. a sliding strip; 54. a positioning spring; 55. a side frame; 56. a sliding seat; 57. positioning a control member; 571. an annular positioning ring; 572. an arc-shaped bulge; 573. an arc-shaped strip; 58. adjusting the screw rod; 6. tightly abutting against the limiter; 61. a tightening block; 611. a withdrawal groove; 62. a U-shaped guide frame; 621. a guide chute; 63. a contact member; 631. a collision cylinder; 632. a touch bar; 64. a limiting member; 641. an arc-shaped limiting block; 642. a bottom pallet; 643. a guide ramp; 644. an arc-shaped abutting plate; 645. abutting against the slope; 646. a horizontal plate; 65. a mating groove; 66. abutting against the control block; 67. a first spring; 68. a fixed seat; 69. a second spring; 7. a performance tester; 71. a cover plate; 72. a control panel; 73. covering the test board; 74. a contact member; 75. a return spring; 76. an annular T-shaped plate; 77. an arc-shaped cover plate; 78. covering the slope; 8. a vibrator; 81. a vibration cylinder; 811. an elastic air bag; 812. a vibrating rod; 82. a vibrating plate; 83. limiting teeth; 84. rotating the control bar; 841. a groove; 842. mating teeth; 85. a vibrating member; 851. a vibration ring; 852. a mating rod; 86. an arc-shaped vibrating plate; 861. vibrating the slope; 87. a triangular oblique block; 88. pressing down the spring; 9. a material ejecting device; 91. a material ejecting plate; 92. a charge bar; 93. an auxiliary ring; 94. a control lever; 95. an elastic cord; 96. an arc-shaped elastic strip; 97. an arc-shaped extension strip.

Detailed Description

The present application is described in further detail below with reference to figures 1-14.

The first embodiment is as follows:

referring to fig. 1, the embodiment of the application discloses a new anti-interference high-speed backplane connector test system, which includes a rotary base pillar 1, an annular test seat 2 is rotatably arranged on the outer edge of the rotary base pillar 1, and a tester 3 for testing a backplane connector 100 is arranged on the annular test seat 2; the invention tests the performance of the backplane connector 100 through the tester 3 on the ring-shaped test seat 2 so as to judge whether the backplane connector 100 meets the requirements or not.

Referring to fig. 1-2, a testing machine 3 comprises a v-21274type testing frame 4, v-21274type testing frames 4 are uniformly distributed along the outer edge of an annular testing seat 2, side edge locators 5 for locating a backplane connector 100 are arranged on both sides of the v-21274type testing frame 4, a performance tester 7 for testing the backplane connector 100 is arranged at one end of the v-21274type testing frame 4 close to the outer edge of the annular testing seat 2, a vibrator 8 is arranged on the annular testing seat 2 and at the v-74type testing frame 4 for vibrating the backplane connector 100, and a ejecter 9 is arranged on one side of the v-21274type testing frame 4 facing a rotating base column 1 for ejecting the backplane connector 100 in the v-21274type testing frame 4; the annular test seat 2 is distributed with a feeding area 21, a testing area 22 and a discharging area 23 in sequence along the rotation direction.

In a specific implementation process, the backplane connector 100 to be tested is placed in the v-type test frame 4 in the feeding area 21 of the annular test seat 2, the backplane connector 100 is guided and limited by the side edge positioner 5, and the position of the backplane connector 100 in the v-type test frame 4 is limited by the abutting limiter 6, so that the performance tester 7 can accurately abut against the backplane connector 100 in the v-type test frame 4, and the performance tester 7 can test the backplane connector 100; after the test is completed, the backplane connector 100 is moved out of the discharging area 23 by the ejector 9, so that the 212744 can be tested on the next backplane connector 100 to be tested after the testing frame is rotated to the feeding area 21; meanwhile, in the invention, the performance tester 7 vibrates the backplane connector 100 through the vibrator 8 in the test process, so that the problem that the transient connection is caused by the insufficient soldering of the components and the mainboard in the backplane connector 100 is solved, and the performance tester 7 cannot detect the problem.

After the backplane connector 100 moves to the v-21274type test frame 4 of the displacement feeding area 21, the backplane connector needs to be positioned by a side positioner 5, specifically, referring to fig. 3-4, the side positioner 5 comprises two positioning members 51 which are symmetrically distributed and arranged in the v-21274type test frame 4 in a sliding manner, one side of the positioning member 51 facing the side wall of the v-212744 is connected with a positioning rope 52, the positioning rope 52 penetrates through the v-21274type test frame 4 and is connected with a sliding strip 53 positioned on the outer side of the v-212744, a positioning spring 54 is connected between the positioning members 51 and the v-212744 and is used for driving the positioning members 51 to position the backplane connector 100, and the sliding strip 53 is arranged on a sliding seat 56 arranged in the side frame 55 and positioned on the same side as the positioning member 51;

in a specific implementation process, after the backplane connector 100 is placed on the v-212744 type test frame, the v-212744 type test frame is rotated to the test area 22 along with the rotation of the annular test seat 2, and the sliding strip 53 is driven to move towards one side of the rotating base column 1 by the positioning control member 57 on the rotating base column 1 in the rotating process, so that the sliding strip 53 releases the pulling on the positioning rope 52, and the positioning piece 51 is driven to move towards the backplane connector 100 by the positioning spring 54 until the positioning limitation on the backplane connector 100 is completed; after the backplane connector 100 is tested and moved out of the test area 22, the positioning control member 57 controls the sliding bar 53 to move away from the rotating base column 1, so that the sliding bar 53 moves the positioning member 51 towards the side of the v 21274type test frame 4 by pulling the positioning rope 52, and the positioning of the backplane connector 100 is released, and then the subsequent ejector 9 moves the backplane connector 100 out of the v 21274type test frame 4.

One side of the sliding seat 56, which is far away from the v-212744 type test frame, is rotatably connected with an adjusting screw rod 58, and the adjusting screw rod 58 penetrates through the side frame 55 and is in threaded connection with the side frame 55; the position of the sliding seat 56 is changed by adjusting the screw rod 58, so that the sliding strip 53 changes the position of the positioning piece 51 in the 212744 type test frame through the positioning rope 52, and the side positioner 5 can perform side positioning for backplane connectors 100 of different specifications and sizes.

Further, the positioning control member 57 includes an annular positioning ring 571 arranged on the outer side wall of the rotating base column 1, and arc-shaped protrusions 572 are arranged on the outer side wall of the annular positioning ring 571 and located at the feeding area 21 and the discharging area 23, and are used for controlling the positioning member 51 to position the backplane connector 100 in the v 21274type test frame 4;

the side, close to the rotating base column 1, of the type V # 212744 is provided with an arc-shaped strip 573 in sliding fit with the annular positioning ring 571 and the arc-shaped protrusion 572, and one end, facing the rotating base column 1, of the sliding strip 53 penetrates through the side frame 55 and is connected to the arc-shaped strip 573 in a sliding manner, so as to drive the sliding strip 53 to slide on the sliding seat 56.

In a specific implementation, when the backplane connector 100 in the v 21274type test frame 4 is tested, the circular test socket 2 rotates to make the arc-shaped strip 573 start to abut against the arc-shaped protrusion 572 from the position along the circular positioning ring 571 and rotate along the arc-shaped protrusion 572, so as to drive the sliding strip 53 to move in a direction away from the rotating base column 1, so that the positioning member 51 releases the positioning of the backplane connector 100 in the v 21274type test frame 4, after the ejector 9 ejects the backplane connector 100, the circular test socket 2 drives the v 21274type test frame 4 to rotate to the feeding area 21, so that the next backplane connector 100 to be tested moves into the v 21274type test frame 4, and when the arc-shaped strip 573 moves from the arc-shaped protrusion 572 to the circular positioning ring 571, the arc-shaped protrusion 572 no longer abuts against the arc-shaped strip 573, so that the positioning member 51 can clamp and position the backplane connector 100 in the v 212744 under the action of the positioning spring 54.

After the backplane connector 100 is positioned by the side positioner 5, the backplane connector 100 needs to be limited along the radial direction of the annular test seat 2 by the abutting limiter 6, wherein, referring to fig. 4-5, the abutting limiter 6 includes an abutting block 61, the abutting block 61 is arranged on the annular test seat 2 in a sliding manner along the radial direction of the annular test seat 2, the abutting block 61 is positioned between two positioning members 51 in the 212744 type test frame, the bottom of the abutting block 61 is connected with two vertical sections of the U-shaped guide frame 62, the annular test seat 2 is provided with a guide chute 621 facilitating the sliding of two vertical sections of the U-shaped guide frame 62 along the radial direction thereof, and the edge of the annular test seat 2 is provided with a back-off slot 611 facilitating the up-and-down sliding of the abutting block 61 and communicating with the guide chute 621, one end of the abutting block 61 departing from the rotary base column 1 is provided with an abutting member 63, and the outer edge of the annular test seat 2 is provided with a limiting member 64 cooperating with the abutting member 63 for controlling the abutting block 61 to abut against the backplane connector 100 in the 742124; one end of the retreat groove 611 facing away from the guide chute 621 is provided with a matching groove 65 facilitating the contact member 63 to slide up and down.

In the specific implementation process, with the rotation of the annular test socket 2, the abutting piece 63 is matched with the limiting piece 64 to drive the abutting block 61 to move towards the backplane connector 100 until the backplane connector 100 abuts against the inner side wall of the v-212744 test frame, thereby ensuring that the performance tester 7 can accurately abut against the backplane connector 100.

However, after the test is completed, in order to facilitate the movement of the backplane connector 100 out of the v-212744 type test frame and the movement of the subsequent backplane connector 100 to be tested into the v-212744 type test frame, the abutting block 61 needs to move into the retreat groove 611 along the guide sliding groove 621 and move downward along the retreat groove 611 until the abutting block 61 completely moves out of the upper surface of the annular test seat 2; therefore, the bottom of the annular test seat 2 is provided with the abutting control block 66 in a sliding manner along the radius direction, two vertical sections of the U-shaped guide frame 62 are arranged on the abutting control block 66 in a sliding manner up and down, and a first spring 67 is connected between the horizontal section of the U-shaped guide frame 62 and the bottom of the abutting control block 66 and is used for controlling the abutting block 61 to slide up and down in the retreat groove 611; a second spring 69 is connected between the sidewall of the abutting control block 66 and a fixing seat 68 arranged on the bottom of the annular testing seat 2, and is used for controlling the abutting block 61 to slide along the length direction of the guide chute 621.

In a specific implementation process, when the abutting member 63 is no longer engaged with the limiting member 64, the abutting block 61 is moved toward the receding slot 611 under the action of the second spring 69, and after the abutting block moves into the receding slot 611, the first spring 67 drives the U-shaped guide frame 62 to control the abutting block 61 to move downward, so that the abutting block 61 does not affect the moving-out or moving-in of the backplane connector 100.

Referring to fig. 6, the limiting member 64 includes an arc-shaped limiting block 641 rotatably disposed on the outer sidewall of the annular testing seat 2, the arc-shaped limiting block 641 is located in the testing area 22 of the annular testing seat 2, the arc-shaped limiting block 641 is fixed on a bottom supporting plate 642 disposed at the bottom of the rotary base column 1, and a guiding slope 643 cooperating with the abutting member 63 is formed at the upper end of one side of the arc-shaped limiting block 641 facing the feeding area 21, and is used for driving the abutting block 61 to move upward in the retreat groove 611; an arc-shaped abutting plate 644 is arranged at the upper end of the arc-shaped limiting block 641, and the arc-shaped abutting plate 644 is located at one end of the guiding slope 643 and is provided with an abutting slope 645 towards one end of the rotating base column 1, so as to drive the abutting block 61 to move towards the backplane connector 100 in the v-212744 type test frame;

in a specific implementation process, after the backplane connector 100 is moved into the v-21274type test frame 4, after the backplane connector is positioned by the side positioner 5, the abutting piece 63 starts to be in interference fit with the guiding slope 643 on the arc-shaped limiting block 641 along with the rotation of the annular test seat 2, the abutting piece 63 is driven to drive the abutting block 61 to move upwards along the retreat groove 611 until the abutting block 61 completely moves the retreat groove 611, and then the abutting piece 63 starts to be in interference fit with the abutment slope 645 of the arc-shaped abutting plate 644 to drive the abutting block 61 to move towards the backplane connector 100 until the backplane connector 100 is limited in the v-21274.

A horizontal plate 646 is rotatably arranged on the outer side wall of the annular test seat 2 and positioned in the feeding area 21 and the discharging area 23, the upper end surface of the horizontal plate 646 is flush with the upper surface of the annular test seat 2 so as to facilitate feeding and discharging of the backplane connector 100, and the horizontal plate 646 is fixed on the bottom supporting plate 642; note that the lower end of the horizontal plate 646 does not affect the movement of the contact member 63 located in the fitting groove 65.

Further, referring back to fig. 4, the abutting member 63 includes an abutting cylinder 631, the abutting cylinder 631 is horizontally fixed on the abutting block 61, and a side of the abutting cylinder 631 facing away from the abutting block 61 is threadedly connected with an abutting rod 632, the abutting rod 632 is in abutting fit with an inner side wall of the arc abutting plate 644 and the abutting slope 645, and both the abutting cylinder 631 and the abutting rod 632 are in abutting fit with an upper end surface of the arc limiting block 641 and the guiding slope 643;

according to the specification and size of the backplane connector 100, the distance from the abutting rod 632 to the abutting cylinder 631 can be adjusted, so that the distance from the abutting block 61 to move towards the backplane connector 100 is changed, and the abutting block 61 can be limited in the 21274type test frame 4 for the backplane connectors 100 with different specification and size, and it should be noted that the abutting rod 632 can always be in abutting fit with the abutting slope 645 no matter how the distance from the abutting rod 632 to the abutting cylinder 631 is changed.

After the backplane connector 100 is limited by the side locator 5 and the abutting limiter 6, the backplane connector 100 needs to be tested by the performance tester 7, specifically, referring back to fig. 4, the performance tester 7 includes a cover plate 71 disposed on the top of the v 212744 test frame 4, a vertically disposed control board 72 is slidably disposed on the cover plate 71, the control board 72 slidably penetrates through the cover plate 71, a detachable cover test board 73 is mounted at the lower end of the cover plate 71, a contact 74 matched with the backplane connector 100 is disposed at the bottom of the cover test board 73 for testing the backplane connector 100, and a return spring 75 is connected between the cover test board 73 and the cover plate 71 for driving the contact 74 to move out of the backplane connector 100;

referring to fig. 7, an annular T-shaped plate 76 is fixed at the top of the rotary base column 1, an arc-shaped cover plate 77 is arranged at the bottom of the annular T-shaped plate 76 and at the testing area 22 of the annular testing base 2, the bottom of the arc-shaped cover plate 77 is in interference fit with the top of the control plate 72, and a cover slope 78 in interference fit with the top of the control plate 72 is arranged at the bottom of one side of the arc-shaped cover plate 77 close to the feeding area 21.

In the specific implementation process, along with the rotation of the annular test seat 2, the control board 72 starts to be in interference fit with the covering slope 78 of the arc-shaped covering board 77, so as to drive the control board 72 to drive the covering test board 73 to move downwards until the contact element 74 on the covering test board 73 starts to be in contact with the component on the backplane connector 100, so that the backplane connector 100 can be tested to ensure whether the backplane connector 100 meets the specified requirements and whether the product is qualified; after the test is completed, the control board 72 is no longer abutted against the arc-shaped cover plate 77 along with the rotation of the annular test socket 2, and the cover test plate 73 drives the contact 74 to move out of the backplane connector 100 upwards under the action of the return spring 75.

After the test is completed, the backplane connector 100 is rotated to the discharge area 23 along with the rotation of the annular test seat 2, so that the side edge locator 5 and the abutting limiter 6 are reset, and the backplane connector 100 can be moved out of the 21274type test frame 4 by the ejector 9, specifically, referring to fig. 8-9, the ejector 9 comprises an ejector plate 91, the ejector plate 91 is arranged in a placing groove formed in the inner side wall of one end of the 21274type test seat, which is far away from the rotary base column 1, one side of the ejector plate 91, which faces the rotary base column 1, is connected with an ejector rod 92, the ejector rod 92 is slidably penetrated through the 21274type test frame 4, an auxiliary ring 93 which is convenient for the ejection rod 92 to slide is arranged outside the Material board 212744, one end of the ejector rod 92, which is far away from the ejector 91, is provided with a vertically arranged control rod 94, 212744 side wall and positioned above the auxiliary ring 93, and the elastic rope 95 penetrates through the control rod 94;

an arc-shaped elastic strip 96 is arranged on the annular positioning ring 571 and located at the feeding area 21 and the testing area 22, the arc-shaped elastic strip 96 is in interference fit with the control rod 94, one end of the arc-shaped elastic strip 96 located at the feeding area 21 is connected with an arc-shaped extension strip 97 fixed on the arc-shaped protrusion 572, and the arc-shaped extension strip 97 is in interference fit with the control rod 94.

In a specific implementation process, after the control rod 94 is separated from the limit of the arc-shaped elastic strip 96, the control rod 94 pushes the elastic rod 92 to enable the elastic plate 91 to push the backplane connector 100 in the v-21274type test frame 4 to move out under the elastic force action of the elastic rope 95; after the completion of the removal of the backplane connector 100, the control rod 94 is brought into abutting engagement with the arc-shaped extension strip 97 along with the rotation of the ring-shaped test socket 2, so that the elastic rod 92 is pulled to control the elastic plate 91 to return to the placement slot until the control rod 94 engages with the arc-shaped elastic strip 96.

The second embodiment:

on the basis of the first embodiment, when the backplane connector 100 is tested by the performance tester 7, but because each component on the motherboard in the backplane connector 100 is fixed on the motherboard in a welding manner, and the welding has a cold joint which is easy to damage, the performance tester 7 effectively tests the cold joint problem, the backplane connector 100 in the testing process is vibrated by the vibrator 8, and if the cold joint problem exists, the cold joint component can be separated from the motherboard by vibration, so that the performance tester 7 cannot detect, and further, whether the backplane connector 100 meets the requirements or not is conveniently judged.

Specifically, referring to fig. 10-13, the vibrator 8 includes a vibration cylinder 81, a plurality of vibration holes are formed in the annular test seat 2 and located in the 212744 type test frame, the vibration cylinder 81 is located in the vibration holes, two ends of the vibration cylinder 81 are rotatably connected to a vibration plate 82 sliding in the vibration holes, a plurality of limiting teeth 83 are uniformly arranged on one side of the vibration cylinder 81 in the circumferential direction, a rotation control bar 84 is vertically and slidably arranged in the vibration holes and corresponding to the limiting teeth 83, a plurality of grooves 841 are uniformly formed in one side of the rotation control bar 84 facing the limiting teeth 83 from top to bottom, a mating tooth 842 is hinged to the bottom of each groove 841, and the mating tooth 842 is matched with the limiting teeth 83 to drive the vibration cylinder 81 to rotate;

in a specific implementation process, after the backplane connector 100 is placed in the v-21274type test frame 4, the rotating barrel is rotated by the up-and-down reciprocating movement of the rotating control bar 84, so that the backplane connector 100 is driven to have a moving trend on the annular test socket 2, and the backplane connector 100 is driven to have a moving trend from different directions; specifically, when the rotation control bar 84 moves upward, the vibration cylinder 81 is driven to rotate by the matching teeth 842 matching with the limiting teeth 83 on the outer side wall of the vibration cylinder 81, and when the rotation control bar 84 moves downward, the matching teeth 842 are hinged in the groove 841, so that the matching teeth 842 rotate into the groove 841 under the interference of the limiting teeth 83, so that the rotation control bar 84 moves downward smoothly.

Referring to fig. 12-14, the bottom of the rotation control bar 84 is connected to a vibrating member 85; the arc vibration plate 86 located in the test area 22 is arranged on the outer side wall of the rotary base column 1 and located below the annular test seat 2, a vibration slope 861 matched with the bottom of the vibration plate 82 in an abutting mode is arranged at one end, close to the feeding area 21, of the arc vibration plate 86, a plurality of triangular inclined blocks 87 matched with the vibration piece 85 in an abutting mode are evenly arranged on the arc vibration plate 86, and a pressing spring 88 (shown in fig. 11) is connected between the top of the rotation control strip 84 and the vibration hole.

In a specific implementation process, firstly, when the vibration plate 82 abuts against the vibration slope 861 on the arc-shaped vibration plate 86, the vibration plate 82 is driven to drive the rotation cylinder to move upwards, so that the rotation cylinder can be in contact with the backplane connector 100, and the backplane connector 100 is vibrated by the vibration cylinder 81; then, the vibrating member 85 is in abutting fit with a plurality of triangular oblique blocks 87 uniformly distributed on the arc-shaped vibrating plate 86, so that the vibrating member 85 drives the rotating control bar 84 to move upwards, then the rotating control bar 84 drives the vibrating member 85 to move downwards under the action of the pressing spring 88, and then the vertical reciprocating movement of the rotating control bar 84 is realized, so that the rotating cylinder can vibrate the backplane connector 100 all the time.

In order to improve the vibration effect, referring to fig. 12, the vibration cylinder 81 of the present invention is a hollow shell structure, an elastic air bag 811 is disposed in the vibration cylinder 81, a plurality of circular holes are uniformly formed in the outer side wall of the vibration cylinder 81, a vibration rod 812 is slidably disposed in the circular holes, and one end of the vibration rod 812 located in the vibration cylinder 81 is in interference fit with the elastic air bag 811; when the rotary cylinder rotates, the vibrating rod 812 may strike the backplane connector 100 first, and then the vibrating rod 812 may also provide the backplane connector 100 with a moving trend, so as to vibrate or horizontally move and misplace each component in the backplane connector 100, test whether the welding between the component and the motherboard is firm, and if not, the cold joint, or vice versa.

The vibrating piece 85 comprises a vibrating ring 851 which is fixed at the bottom of the rotation control bar 84 and is vertically arranged, a matching rod 852 is connected with the bottom of the vibrating ring 851 through threads, and the matching rod 852 is in interference fit with the inclined surface of the triangular oblique block 87; the present invention can vary the vibrational force of the rotating barrel to backplane connector 100 by varying the spacing of the bottom of the engagement rod 852 to the arcuate vibration plate 86.

Referring to fig. 11, a plurality of vibration cylinders 81 located in the middle region of the v 21274type test frame 4 are uniformly distributed along the radial direction of the annular test socket 2, and rotate along the radial direction of the annular test socket 2 to drive the backplane connector 100 to move along the radial direction of the annular test socket 2; the vibrating cylinders 81 located at the two side areas of the v-21274.

It should be noted that when the vibrating element 85 is in interference fit with the triangular inclined block 87, the backboard connector 100 can only be driven to move along one direction, so as to avoid the problem that forces in multiple directions drive the backboard connector 100 to move in different directions.

The implementation principle of the invention is as follows:

(1): moving the backplane connector 100 to be tested into the v-21274type test frame 4 when the v-21274type test frame 4 on the annular test seat 2 moves to the feeding area 21 along with the rotation of the annular test seat 2;

(2): then, positioning two ends of the backplane connector 100 by the side positioner 5, and then tightly pressing the backplane connector 100 in the 212744 test frame by the pressing limiter 6;

(3): then, the backplane connector 100 is rotated to the test area 22 along with the rotation of the annular test seat 2, the performance tester 7 is firstly butted with the backplane connector 100 and tested, and meanwhile, the backplane connector 100 is vibrated by the vibrator 8 in the test process to detect whether the welding between each component in the backplane connector 100 and the mainboard is firm or not, so that the problem that the performance tester 7 cannot detect the backplane connector 100 due to insufficient welding is solved;

(4): finally, after the test is completed, the backplane connector 100 is rotated to the discharging area 23 along with the rotation of the annular test seat 2, and after the side positioner 5 and the abutting limiter 6 are reset, the ejector 9 moves the backplane connector 100 out of the 212744 test frame.

The embodiments of the present invention are all preferred embodiments of the present invention, and the scope of the present invention is not limited thereby, so: all equivalent changes made according to the structure, shape and principle of the invention are covered by the protection scope of the invention.

Claims

1. The utility model provides a new anti-interference high-speed backplane connector test system, includes rotatory base (1), its characterized in that: an annular test seat (2) is rotatably arranged on the outer edge of the rotary base column (1), and a test machine (3) for testing the backplane connector (100) is arranged on the annular test seat (2);

the testing machine (3) comprises a v-21274type testing frame (4), wherein the v-21274type testing frame (4) is uniformly distributed along the outer edge of an annular testing seat (2) along the circumferential direction, side locators (5) for locating a backboard connector (100) are arranged on two sides of the v-21274type testing frame (4), one end, close to the outer edge of the annular testing seat (2), of the v-21274type testing frame (4) is provided with a pressing stopper (6) for pressing the backboard connector (100), the top of the v-21274type testing frame (4) is provided with a performance tester (7) for testing the backboard connector (100), a vibrator (8) is arranged on the annular testing seat (2) and positioned at the v-21274type testing frame (4) and used for vibrating the backboard connector (100), and a material ejector (9) is arranged on one side, facing the rotary base column (1), and used for ejecting the v-21274type testing frame (4); the annular test seat (2) is sequentially distributed with a feeding area (21), a test area (22) and a discharging area (23) along the rotation direction.

2. The system of claim 1, wherein the system further comprises: the side edge positioner (5) comprises a v-21274type test frame (4) which is internally provided with two symmetrically distributed positioning members (51) in a sliding manner, wherein one side of each positioning member (51) facing the side wall of the v-21274 (4) is connected with a positioning rope (52), the positioning rope (52) penetrates through the v-21274type test frame (4) and is connected with a sliding strip (53) positioned on the outer side of the v-21274 (4), a positioning spring (54) is connected between each positioning member (51) and the v-21274type test frame (4) and is used for driving the positioning members (51) to position the backboard connector (100), a side frame (55) is arranged on the outer side of the v-21274type test frame (4) and is positioned at the position of the positioning member (51), the sliding strip (53) is arranged on the sliding seat (56) arranged in the side frame (55) in a sliding manner, and a positioning control member (57) is arranged on the same side of the rotating base column (1) and is used for driving the sliding strip (53) to control the positioning member (51) to position the back backboard connector (100) in the v-747421274;

one side of the sliding seat (56) departing from the v-21274type test frame (4) is rotatably connected with an adjusting screw rod (58), and the adjusting screw rod (58) penetrates through the side frame (55) and is in threaded connection with the side frame (55).

3. The system of claim 2, wherein the system further comprises: the positioning control piece (57) comprises an annular positioning ring (571) arranged on the outer side wall of the rotating base column (1), and arc-shaped protrusions (572) are arranged on the outer side wall of the annular positioning ring (571) and positioned at the feeding area (21) and the discharging area (23) and are used for controlling the positioning of the positioning piece (51) to the backplane connector (100) in the 21274type test frame (4);

an arc-shaped strip (573) which is in sliding fit with the annular positioning ring (571) and the arc-shaped protrusion (572) is arranged on one side, close to the rotating base column (1), of the v-21274type test frame (4), and one end, facing the rotating base column (1), of the sliding strip (53) penetrates through the side frame (55) and is connected to the arc-shaped strip (573) in a sliding mode and used for driving the sliding strip (53) to slide on the sliding seat (56).

4. The system of claim 3, wherein the system further comprises: the abutting limiter (6) comprises an abutting block (61), the abutting block (61) is arranged on an annular test seat (2) in a sliding manner along the radius direction of the annular test seat (2), the abutting block (61) is positioned between two positioning pieces (51) in a v-212744 type test frame (4), the bottom of the abutting block (61) is connected with two vertical sections of a U-shaped guide frame (62), the annular test seat (2) is provided with a guide chute (621) which is convenient for the sliding of the two vertical sections of the U-shaped guide frame (62) along the radius direction of the annular test seat, the edge of the annular test seat (2) is provided with a back position groove (611) which is convenient for the abutting block (61) to slide up and down and is communicated with the guide chute (621), one end of the abutting block (61) departing from the rotary base column (1) is provided with an abutting piece (63), and the outer edge of the annular test seat (2) is provided with a limiting piece (64) matched with the abutting piece (63) for controlling the abutting block (61) to abut against a back plate connector (100) in the test frame (744); one end of the retreat groove (611) departing from the guide sliding groove (621) is provided with a matching groove (65) which is convenient for the contact piece (63) to slide up and down;

a propping control block (66) is arranged at the bottom of the annular test seat (2) in a sliding manner along the radius direction of the annular test seat, two vertical sections of the U-shaped guide frame (62) are arranged on the propping control block (66) in an up-and-down sliding manner, and a first spring (67) is connected between the horizontal section of the U-shaped guide frame (62) and the bottom of the propping control block (66) and used for controlling the propping block (61) to slide up and down in the retreating groove (611);

and a second spring (69) is connected between the side wall of the abutting control block (66) and a fixed seat (68) arranged at the bottom of the annular test seat (2) and used for controlling the abutting block (61) to slide along the length direction of the guide sliding groove (621).

5. The system of claim 4, wherein the system further comprises: the limiting piece (64) comprises an arc limiting piece (641) rotatably arranged on the outer side wall of the annular testing base (2), the arc limiting piece (641) is located in a testing area (22) of the annular testing base (2), the arc limiting piece (641) is fixed on a bottom supporting plate (642) arranged at the bottom of the rotary foundation column (1), and a guide slope (643) matched with the abutting piece (63) is formed at the upper end of one side, facing the feeding area (21), of the arc limiting piece (641) and used for driving the abutting piece (61) to move upwards in the retreat groove (611);

an arc-shaped abutting plate (644) is arranged at the upper end of the arc-shaped limiting block (641), and the abutting plate (644) is positioned at one end of the guide slope (643) and is provided with an abutting slope (645) towards one end of the rotating base column (1) and is used for driving the abutting block (61) to move towards the backboard connector (100) in the test frame (4);

a horizontal plate (646) is rotatably arranged on the outer side wall of the annular test seat (2) and positioned in the feeding area (21) and the discharging area (23), the upper end surface of the horizontal plate (646) is flush with the upper surface of the annular test seat (2) so as to facilitate feeding and discharging of the backplane connector (100), and the horizontal plate (646) is fixed on the bottom supporting plate (642);

the abutting part (63) comprises an abutting cylinder (631), the abutting cylinder (631) is horizontally fixed on the abutting block (61), one side of the abutting cylinder (631) departing from the abutting block (61) is in threaded connection with an abutting rod (632), the abutting rod (632) is in abutting fit with the inner side wall of the arc abutting plate (644) and the abutting slope (645), and the abutting cylinder (631) and the abutting rod (632) are in abutting fit with the upper end face of the arc limiting block (641) and the guide slope (643).

6. The system of claim 2, wherein the system further comprises: the performance tester (7) comprises a cover plate (71) arranged at the top of the v-21274type test frame (4), a control plate (72) which is vertically arranged is arranged on the cover plate (71) in a sliding manner, the control plate (72) penetrates through the cover plate (71) in a sliding manner, a detachable covering test plate (73) is arranged at the lower end of the cover plate (71), a contact element (74) which is matched with the backplane connector (100) is arranged at the bottom of the covering test plate (73) and used for testing the backplane connector (100), and a reset spring (75) is connected between the covering test plate (73) and the cover plate (71) and used for driving the contact element (74) to move out of the backplane connector (100);

rotatory foundation column (1) top is fixed with cyclic annular T template (76), test section (22) department that cyclic annular T template (76) bottom just is located annular test seat (2) is provided with arc lid plywood (77), and arc lid plywood (77) bottom and control panel (72) top conflict cooperation, arc lid plywood (77) are provided with and close slope (78) with control panel (72) top conflict complex lid near the bottom of feeding area (21) one side.

7. The system of claim 3, wherein the system further comprises: the device comprises an ejector plate (91), the ejector plate (91) is arranged in a placing groove formed in the inner side wall of one end, away from the rotary base column (1), of a v-21274type test seat, an ejector rod (92) is connected to one side, facing the rotary base column (1), of the ejector plate (91), the ejector rod (92) penetrates through a v-21274type test frame (4) in a sliding mode, an auxiliary ring (93) convenient for the ejector rod (92) to slide is arranged on the outer side of the v-21274type test frame (4), one end, away from the ejector plate (91), of the ejector rod (92) is provided with a vertically arranged control rod (94), an elastic rope (95) is arranged on the side wall of the v-21274type test frame (4) and above the auxiliary ring (93), and the elastic rope (95) penetrates through the control rod (94);

an arc-shaped elastic strip (96) is arranged on the annular positioning ring (571) and located in the feeding area (21) and the testing area (22), the arc-shaped elastic strip (96) is in interference fit with the control rod (94), one end, located in the feeding area (21), of the arc-shaped elastic strip (96) is connected with an arc-shaped extension strip (97) fixed on the arc-shaped protrusion (572), and the arc-shaped extension strip (97) is in interference fit with the control rod (94).

8. The system of claim 1, wherein the system further comprises: the vibrator (8) comprises a vibration cylinder (81), a plurality of vibration holes are formed in the annular test seat (2) and located in the 212744 type test frame (4), the vibration cylinder (81) is located in the vibration holes, two ends of the vibration cylinder (81) are rotatably connected with a vibration plate (82) which slides in the vibration holes, a plurality of limiting teeth (83) are uniformly arranged on one side of the vibration cylinder (81) in the circumferential direction, a rotation control strip (84) is arranged in the vibration holes and corresponds to the limiting teeth (83) in a vertically sliding manner, a plurality of grooves (841) are uniformly formed in one side, facing the limiting teeth (83), of the rotation control strip (84) from top to bottom, the inner bottom of each groove (841) is hinged with a matching tooth (842), and the matching teeth (842) are matched with the limiting teeth (83) and are used for driving the vibration cylinder (81) to rotate;

the bottom of the rotating control bar (84) is connected with a vibrating piece (85); the utility model discloses a test device for the test of vibration of a motor vehicle, including rotatory pillar (1) lateral wall and be located annular test seat (2) below department and be provided with arc vibration board (86) that are located test area (22), and arc vibration board (86) are close to the one end of feed area (21) and are provided with and vibrate board (82) bottom conflict complex vibration slope (861), evenly seted up a plurality of triangle sloping blocks (87) of contradicting complex with vibrating piece (85) on arc vibration board (86), be connected with down between rotation control strip (84) top and the vibration hole and press spring (88).

9. The system of claim 8, wherein the system further comprises: the vibration cylinder (81) is of a hollow shell structure, an elastic air bag (811) is arranged in the vibration cylinder (81), a plurality of round holes are uniformly formed in the outer side wall of the vibration cylinder (81), a vibration rod (812) is arranged in the round holes in a sliding mode, and one end, located in the vibration cylinder (81), of the vibration rod (812) is in interference fit with the elastic air bag (811);

the vibration piece (85) comprises a vibration ring (851) which is fixed at the bottom of the rotation control bar (84) and is vertically arranged, the bottom of the vibration ring (851) is in threaded connection with a matching rod (852), and the matching rod (852) is in interference fit with the inclined plane of the triangular oblique block (87).

10. The system of claim 8, wherein the system further comprises: the vibration cylinders (81) in the middle area of the v-21274type test frame (4) are uniformly distributed along the radius direction of the annular test seat (2), rotate along the radius direction of the annular test seat (2) and are used for driving the backplane connector (100) to move along the radius direction of the annular test seat (2); the vibrating cylinders (81) positioned at two side areas of the v-21274type test frame (4) are distributed along the direction vertical to the radius direction of the annular test seat (2) and rotate along the direction vertical to the radius direction of the annular test seat (2) so as to drive the backplane connector (100) to move along the direction vertical to the radius direction of the annular test seat (2).