CN117907793B - Fill electric pile control mainboard processing and use mainboard testing arrangement - Google Patents
Fill electric pile control mainboard processing and use mainboard testing arrangement Download PDFInfo
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- CN117907793B CN117907793B CN202311508450.7A CN202311508450A CN117907793B CN 117907793 B CN117907793 B CN 117907793B CN 202311508450 A CN202311508450 A CN 202311508450A CN 117907793 B CN117907793 B CN 117907793B
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- 238000012360 testing method Methods 0.000 title claims abstract description 134
- 238000012545 processing Methods 0.000 title claims abstract description 8
- 230000007246 mechanism Effects 0.000 claims abstract description 30
- 230000009471 action Effects 0.000 claims abstract description 10
- 230000005484 gravity Effects 0.000 claims abstract description 8
- 238000001514 detection method Methods 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 238000003780 insertion Methods 0.000 claims 1
- 230000037431 insertion Effects 0.000 claims 1
- 210000001503 joint Anatomy 0.000 claims 1
- 230000008520 organization Effects 0.000 claims 1
- 230000001105 regulatory effect Effects 0.000 claims 1
- 230000005611 electricity Effects 0.000 abstract description 6
- 238000000034 method Methods 0.000 abstract description 4
- 230000000694 effects Effects 0.000 abstract description 3
- 230000008569 process Effects 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention relates to a main board testing device for processing a charging pile control main board, which comprises a testing machine table, wherein an inner cavity of the testing machine table is respectively provided with a feeding mechanism for feeding the main board and a testing mechanism for testing the main board, and the testing mechanism comprises a fixing frame fixed in the inner cavity of the testing machine table and a lifting frame driven to lift by a driving mechanism. This fill electric pile control mainboard processing and use mainboard testing arrangement need not to plug and can detect, and the electricity even test head is contacted with the mainboard under the effect of gravity and is tested the action, not only can increase area of contact, promotes the test accuracy to foretell in-process, thereby the terminal surface slightly contacts by the test point before the electricity even test head avoids physical collision to damage, and can be convenient according to the model of mainboard to the position of electricity even test head adjusts, the suitability is better.
Description
Technical Field
The invention relates to the technical field of main board processing, in particular to a main board testing device for processing a charging pile control main board.
Background
Motherboard is also called as a machine board, a system board or a motherboard, and is generally divided into two types of commercial motherboard and industrial motherboard. The main board is generally a rectangular circuit board, and when the main board products leave the factory, the main board products can be tested to screen out defective products. The conventional motherboard test equipment uses a hard probe to perform contact test on the motherboard, however, when the probe contacts the motherboard, the motherboard is often damaged, the contact is unsafe, and the contact is poor, which is a major disadvantage of the conventional technology.
According to the motherboard test head described in CN113805047a, multiple positions of the motherboard cannot be accurately detected during use, all points cannot be contacted at one time, and the positions of probes cannot be accurately positioned.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides a mainboard testing device for processing a charging pile control mainboard, which solves the problems.
In order to achieve the above purpose, the invention is realized by the following technical scheme: the utility model provides a fill electric pile control mainboard processingequipment with mainboard, includes the test board, the inner chamber of test board is provided with the feed mechanism that is used for carrying out the material loading to the mainboard and the test mechanism that is used for carrying out the test to the mainboard respectively, and test mechanism is including fixing at the mount of test board inner chamber and the crane that goes up and down through actuating mechanism drive, the inner chamber of crane has a plurality of movable blocks through spout sliding connection, the bottom fixedly connected with connecting rope of movable block, the bottom fixedly connected with guide bar of connecting rope, the bottom of guide bar is provided with the electric test head that links with mainboard surface components and parts;
The inner cavity of the fixing frame is provided with a test head guide frame through an adjusting mechanism, the inner cavity of the test head guide frame is provided with a guide groove which is matched with the guide rod and used for positioning the guide rod, when the test head guide frame is used, the position distribution of the electric connection test head is adjusted according to the position of electronic components on the surface of a main board which is required to be detected, a connecting rope penetrates through the lower part of the guide groove and then is connected below a moving block, then the position of the sliding frame is adjusted, the X-axis position of the electric connection test head is adjusted, after the corresponding number of sliding frames are respectively moved to the corresponding positions, the sliding frame is positioned by rotating the positioning rod, then the test head guide frame is slid into the positioning groove through an embedded groove according to the requirement, after the test head guide frame is moved to the corresponding position, the test head guide frame is propped against the surface of the sliding frame by rotating the limiting rod, the Y-axis position of the sliding frame is positioned, the position of the guide groove can be adjusted at will by matching with the movement of the sliding frame to adjust the position of the electric connection testing head, at the moment, the positions of a plurality of electric connection testing heads, the X axis and the Y axis are overlapped with the tested point positions on the surface of the main board, then the moving block is slid into the sliding groove, the moving block is fixed under the condition that the vertical pull rope is ensured as far as possible, the workpiece clamp is moved to the lower part of the electric connection testing head through the workpiece platform, the driving mechanism drives the lifting frame to descend under the action of gravity, the guide rod slides downwards in the guide groove to drive the electric connection testing head to move downwards to press the surface of the main board for detection, the electric connection testing head can be detected without plugging in, the contact of the electric connection testing head with the main board under the action of gravity can be increased, the contact area is increased, the testing accuracy is improved, and in the process, the front end face of the electric connection testing head slightly contacts with the tested point so as to avoid physical collision damage, and the position of the electric connection testing head can be conveniently adjusted according to the model of the main board, so that the adaptability is better.
As a further scheme of the invention: the utility model discloses a test head is connected to electricity, the spout is provided with a plurality of, and evenly sets up in the bottom of crane, can place a plurality of movable blocks through a plurality of spouts, sets up the position that the electricity even tested the head to the bottom threaded connection of movable block has the jackscrew, can fix the movable block inside the spout through rotatory jackscrew and fix a position.
As a further scheme of the invention: the fixing frame is square hollow frame, and adjustment mechanism includes the carriage that slides at the fixing frame surface and set up, one side fixedly connected with of carriage is located the locating plate of fixing frame side, the surface threaded connection of locating plate has the locating lever with the surface butt of fixing frame for the locating lever at both ends all butt is at the surface of fixing frame through screwing the locating lever, can fix a position the X axle position of carriage.
As a further scheme of the invention: the inner cavity of the sliding frame is provided with a positioning groove matched with the surface of the testing head guide frame, the Y-axis position of the testing head guide frame is positioned through the positioning groove, the surface of the testing head guide frame is fixedly connected with a limiting plate, the surface of the limiting plate is in threaded connection with a limiting rod which is abutted with the surface of the sliding frame, the Y-axis position is adjusted by sliding the position of the test head guide frame in the positioning groove in the sliding frame, then the Y-axis position of the sliding frame is positioned by pushing the Y-axis position on the surface of the sliding frame through rotating the limiting rod, and the position of the guide groove can be adjusted randomly by matching with the movement of the sliding frame so as to adjust the position of the electric coupling test head.
As a further scheme of the invention: the guide slots are formed in a plurality of positions, and are uniformly distributed on the surface of the test head guide frame, so that a plurality of electric connection test heads can be distributed at one time for testing.
As a further scheme of the invention: the embedded groove matched with the positioning groove is formed in one side of the sliding frame, the embedded groove is an opening groove, the positioning groove is an inner groove, the test head guide frame can slide into the positioning groove through the embedded groove, and the number of the test head guide frames in the sliding frame can be conveniently adjusted according to the use requirement.
As a further scheme of the invention: the feeding mechanism comprises a workpiece table which is arranged inside the testing machine table through motor driving rotation, a plurality of workpiece clamps are arranged on the surface of the workpiece table, the workpiece clamps can be sequentially fed through rotation of the workpiece table, workpieces can be sequentially rotated to the lower side of the testing mechanism for testing, and waiting for loading and unloading time is not needed.
As a further scheme of the invention: the surface fixedly connected with balancing weight of guide bar makes the electric connection test head hug closely the surface of mainboard through the setting of balancing weight.
Compared with the prior art, the invention has the following beneficial effects:
1. The invention can detect without plugging, the electric connection testing head contacts with the main board under the action of gravity to test, thus not only increasing the contact area and improving the testing accuracy, but also the front end surface of the electric connection testing head slightly contacts with the tested point in the process to avoid physical collision loss, and the position of the electric connection testing head can be conveniently adjusted according to the model of the main board, with better adaptability.
2. According to the invention, the workpiece clamp can be sequentially fed through the rotation of the workpiece table, and the workpiece is sequentially rotated below the testing mechanism for testing, so that the waiting time for feeding and discharging is not required.
Drawings
FIG. 1 is a schematic diagram of the structure of the present invention;
FIG. 2 is a front elevational view of the structure of the present invention;
FIG. 3 is a front view of the structure of the testing mechanism of the present invention;
FIG. 4 is a top view of the structure of the fixing frame of the present invention;
FIG. 5 is an enlarged view of a portion of the invention at A in FIG. 4;
Fig. 6 is a top view of the structure of the carriage of the present invention.
In the figure: 1. a test machine; 2. a work table; 3. a workpiece holder; 4. a lifting frame; 5. a chute; 6. a moving block; 7. a connecting rope; 8. a guide rod; 9. balancing weight; 10. electrically connecting the test head; 11. a fixing frame; 12. a carriage; 13. a positioning plate; 14. a positioning rod; 15. a positioning groove; 16. an embedding groove; 17. a test head guide; 18. a guide groove; 19. a limiting plate; 20. and a limit rod.
Detailed Description
In order to further describe the technical means and effects adopted by the present invention for achieving the intended purpose, the following detailed description will refer to the specific implementation, structure, characteristics and effects according to the present invention with reference to the accompanying drawings and preferred embodiments.
Referring to fig. 1-6, the present invention provides a technical solution: the utility model provides a fill electric pile control mainboard processingequipment with mainboard, including test board 1, test board 1's inner chamber is provided with respectively and is used for carrying out the feed mechanism that carries out the material loading to the mainboard and is used for carrying out the test to the mainboard, test mechanism is including fixing frame 11 at test board 1 inner chamber and the crane 4 that goes up and down through actuating mechanism drive, the inner chamber of crane 4 has a plurality of movable blocks 6 through spout 5 sliding connection, the bottom fixedly connected with connecting rope 7 of movable block 6, the bottom fixedly connected with guide bar 8 of connecting rope 7, the bottom of guide bar 8 is provided with the electric test head 10 that is connected with mainboard surface components and parts;
The inner cavity of the fixing frame 11 is provided with a test head guide frame 17 through an adjusting mechanism, the inner cavity of the test head guide frame 17 is provided with a guide groove 18 which is matched with the guide rod 8 and used for positioning the guide rod 8, when in use, the position distribution of the electric connection test head 10 is adjusted according to the position of electronic components on the surface of a main board, the connecting rope 7 penetrates from the lower part of the guide groove 18 in advance and then is connected below the moving block 6, then the position of the sliding frame 12 is adjusted, the X-axis position of the electric connection test head 10 is adjusted, after the corresponding number of sliding frames 12 are respectively moved to the corresponding positions, the sliding frame 12 is positioned by rotating the positioning rod 14, then the test head guide frame 17 is slid into the positioning groove 15 through the embedded groove 16 according to the requirement, after the corresponding position is moved, the position is pushed against the surface of the sliding frame 12 through rotating the limiting rod 20, the Y-axis position of the sliding frame 12 is positioned, the position of the guide groove 18 can be adjusted at will by matching with the movement of the sliding frame 12 to adjust the position of the electric joint testing head 10, at the moment, the positions of the electric joint testing heads 10 and the positions of the X-axis and the Y-axis are overlapped with the tested point positions on the surface of the main board, then the moving block 6 is slid into the sliding groove 5, the moving block 6 is fixed under the condition that the vertical pulling rope is ensured as far as possible, the workpiece clamp 3 is moved to the lower part of the electric joint testing head 10 by the workpiece platform 2, the lifting frame 4 is driven by the driving mechanism to descend under the action of gravity to slide downwards in the guide groove 18 to drive the electric joint testing head 10 to move downwards to press the surface of the main board for detection, the electric joint testing head 10 can be detected without plugging in, the action of testing the electric joint testing head 10 under the action of gravity can not only increase the contact area, the test accuracy is improved, and in the process, the front end face of the electric connection test head 10 slightly contacts with the tested point so as to avoid physical collision damage, and the position of the electric connection test head 10 can be conveniently adjusted according to the model of the main board, so that the adaptability is better.
The spout 5 is provided with a plurality ofly, and evenly sets up in the bottom of crane 4, can place a plurality of movable blocks 6 through a plurality of spouts 5, sets up the position that the test head 10 was even to the electricity to the bottom threaded connection of movable block 6 has the jackscrew, can fix movable block 6 inside spout 5 through rotatory jackscrew and fix a position.
The mount 11 is square cavity frame, and adjustment mechanism includes the carriage 12 that slides the setting at mount 11 surface, and one side fixedly connected with of carriage 12 is located the locating plate 13 of mount 11 side, and the surface threaded connection of locating plate 13 has the locating lever 14 with the surface butt of mount 11 for the locating lever 14 at both ends all butt is at the surface of mount 11 through screwing locating lever 14, can fix a position the X axle position of carriage 12.
The inner chamber of carriage 12 has seted up the constant head tank 15 with the surface adaptation of test head leading truck 17, set up through constant head tank 15 and fix a position the Y axle position of test head leading truck 17, the fixed surface of test head leading truck 17 is connected with limiting plate 19, the surface threaded connection of limiting plate 19 has the gag lever post 20 with the surface butt of carriage 12, adjust the position of Y axle through the position of sliding test head leading truck 17 in constant head tank 15 in carriage 12, then through rotating gag lever post 20, make it push up on the surface of carriage 12, fix a position the Y axle position of carriage 12, cooperate the removal of carriage 12, can be random adjust the position of guide way 18, adjust the position of electric power test head 10.
The guide grooves 18 are formed in a plurality of positions, are uniformly distributed on the surface of the test head guide frame 17, and can be used for arranging a plurality of electric connection test heads 10 at one time for testing.
An embedded groove 16 matched with the positioning groove 15 is formed in one side of the sliding frame 12, the embedded groove 16 is an open groove, the positioning groove 15 is an inner groove, the test head guide frame 17 can slide into the positioning groove 15 through the embedded groove 16 by means of the arrangement of the embedded groove 16, and the number of the test head guide frames 17 in the sliding frame 12 can be conveniently adjusted according to use requirements.
The feeding mechanism comprises a workpiece table 2 which is arranged inside a test machine table 1 through motor driving rotation, a plurality of workpiece holders 3 are arranged on the surface of the workpiece table 2, the workpiece holders 3 can be sequentially fed through rotation of the workpiece table 2, workpieces can be sequentially rotated to the lower side of the test mechanism for testing, and the time for loading and unloading is not required.
The surface fixedly connected with balancing weight 9 of guide bar 8 makes the surface that the mainboard can be hugged closely to electric coupling test head 10 through the setting of balancing weight 9.
The present invention is not limited to the above embodiments, but is capable of modification and variation in detail, and other modifications and variations can be made by those skilled in the art without departing from the scope of the present invention.
Claims (1)
1. The utility model provides a fill electric pile control mainboard processings and use mainboard testing arrangement, includes test machine (1), the inner chamber of test machine (1) is provided with respectively and is used for carrying out the feed mechanism of material loading to the mainboard and is used for carrying out the accredited testing organization of test to the mainboard, its characterized in that: the testing mechanism comprises a fixing frame (11) fixed in the inner cavity of the testing machine table (1) and a lifting frame (4) driven to lift by a driving mechanism, wherein the inner cavity of the lifting frame (4) is slidably connected with a plurality of moving blocks (6) through sliding grooves (5), the bottoms of the moving blocks (6) are fixedly connected with connecting ropes (7), the bottom ends of the connecting ropes (7) are fixedly connected with guide rods (8), and the bottom ends of the guide rods (8) are provided with electric connection testing heads (10) connected with components on the surface of a main board;
The inner cavity of the fixing frame (11) is provided with a test head guide frame (17) through an adjusting mechanism, the inner cavity of the test head guide frame (17) is provided with guide grooves (18) which are matched with the guide rods (8) and used for positioning the guide rods (8), the sliding grooves (5) are provided with a plurality of guide grooves, the bottoms of the lifting frames (4) are uniformly arranged, the fixing frame (11) is a square hollow frame, the adjusting mechanism comprises a sliding frame (12) which is arranged on the surface of the fixing frame (11) in a sliding manner, one side of the sliding frame (12) is fixedly connected with a positioning plate (13) positioned on the side edge of the fixing frame (11), the surface of the positioning plate (13) is in threaded connection with a positioning rod (14) which is in butt joint with the surface of the fixing frame (11), The inner cavity of the sliding frame (12) is provided with a positioning groove (15) which is matched with the surface of the test head guide frame (17), the Y-axis position of the test head guide frame (17) is positioned through the positioning groove (15), the surface of the test head guide frame (17) is fixedly connected with a limiting plate (19), the surface of the limiting plate (19) is in threaded connection with a limiting rod (20) which is abutted with the surface of the sliding frame (12), the guide grooves (18) are provided with a plurality of, and the surface of the test head guide frame (17) is uniformly distributed, one side of the sliding frame (12) is provided with embedded grooves (16) which are matched with the positioning groove (15), the embedded groove (16) is an open groove, the positioning groove (15) is an inner groove, the feeding mechanism comprises a workpiece table (2) which is arranged in the test machine table (1) in a rotating way through motor driving, a plurality of workpiece clamps (3) are arranged on the surface of the workpiece table (2), a balancing weight (9) is fixedly connected with the surface of the guide rod (8), the position distribution of the electric connection test head (10) is regulated according to the position of an electronic component on the surface of a main board required to be detected when the electric connection test head is used, a connecting rope (7) penetrates from the lower part of the guide groove (18) in advance and then is connected to the lower part of the moving block (6), then the position of the sliding frame (12) is carried out, The X-axis position of the electrically connected test head (10) is adjusted, after the corresponding number of sliding frames (12) are respectively moved to the corresponding positions, the sliding frames (12) are positioned by rotating the positioning rod (14), then the test head guide frame (17) is slid into the positioning groove (15) through the embedded groove (16) according to the requirements, after the test head guide frame is moved to the corresponding positions, the test head guide frame is propped against the surface of the sliding frames (12) through rotating the limiting rod (20), the Y-axis position of the sliding frames (12) is positioned, the position of the guide groove (18) is adjusted in cooperation with the movement of the sliding frames (12), so as to adjust the position of the electric connection test head (10), The positions of a plurality of electric connection test heads (10) and X axis and Y axis are overlapped with the surface of the main board by the test point, then the movable block (6) is slid into the sliding groove (5), under the condition that the pull rope is vertical, the movable block (6) is fixed, after the workpiece clamp (3) is moved to the lower part of the electric connection test head (10) through the workpiece table (2), the guide rod (8) is driven to slide downwards in the guide groove (18) under the action of gravity through the driving mechanism to drive the lifting frame (4), the electric connection test head (10) is driven to move downwards to press the surface of the main board, the detection is carried out, the insertion can be carried out without the need, and the electric connection test head (10) is contacted with the main board for testing action under the action of gravity.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311508450.7A CN117907793B (en) | 2023-11-14 | 2023-11-14 | Fill electric pile control mainboard processing and use mainboard testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311508450.7A CN117907793B (en) | 2023-11-14 | 2023-11-14 | Fill electric pile control mainboard processing and use mainboard testing arrangement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN117907793A CN117907793A (en) | 2024-04-19 |
| CN117907793B true CN117907793B (en) | 2024-07-05 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202311508450.7A Active CN117907793B (en) | 2023-11-14 | 2023-11-14 | Fill electric pile control mainboard processing and use mainboard testing arrangement |
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| Country | Link |
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| CN (1) | CN117907793B (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4234856A1 (en) * | 1992-10-15 | 1994-06-01 | Ehlermann Eckhard | Method and device for testing needle cards for testing integrated circuits |
| CN110286310A (en) * | 2019-07-30 | 2019-09-27 | 河北普兴电子科技股份有限公司 | Test device based on semiconductor wafer surface |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0785196B2 (en) * | 1987-09-14 | 1995-09-13 | 東京エレクトロン株式会社 | Probe device |
| JP2003215210A (en) * | 2002-01-28 | 2003-07-30 | Fuji Electric Co Ltd | Inspection equipment for printed circuit boards |
| CN105388412A (en) * | 2015-10-23 | 2016-03-09 | 京东方科技集团股份有限公司 | Testing device for PCBA |
| CN114137391B (en) * | 2021-11-29 | 2023-04-11 | 晶瞻科技(苏州)有限公司 | Method, device and system for testing semiconductor chip |
-
2023
- 2023-11-14 CN CN202311508450.7A patent/CN117907793B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4234856A1 (en) * | 1992-10-15 | 1994-06-01 | Ehlermann Eckhard | Method and device for testing needle cards for testing integrated circuits |
| CN110286310A (en) * | 2019-07-30 | 2019-09-27 | 河北普兴电子科技股份有限公司 | Test device based on semiconductor wafer surface |
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| CN117907793A (en) | 2024-04-19 |
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