CN115356613B

CN115356613B - Anti-interference high-speed backplane connector test system

Info

Publication number: CN115356613B
Application number: CN202211299613.0A
Authority: CN
Inventors: 牛林; 邓瑞林; 唐四明
Original assignee: Shenzhen West Point Precision Technology Co ltd
Current assignee: Shenzhen West Point Precision Technology Co ltd
Priority date: 2022-10-24
Filing date: 2022-10-24
Publication date: 2023-01-10
Anticipated expiration: 2042-10-24
Also published as: CN115356613A

Abstract

The application relates to the technical field of semiconductor device detection, in particular to an anti-interference high-speed backplane connector test system which comprises a rotary base column, wherein an annular test seat is arranged on the outer edge of the rotary base column in a rotating mode, and a test machine for testing a backplane connector is arranged on the annular test seat; the invention limits the position of the backplane connector in the 20866a type test frame through the matching of the side positioner and the abutting limiter, ensures that the performance tester can accurately abut against the 20866b backplane connector in the type test frame, and ensures that the performance tester can test the backplane connector; the back plate connector which is tested can be moved out through the ejector; meanwhile, the performance tester vibrates the backplane connector through the vibrator in the test process to prevent the problem that the performance tester cannot detect the problem due to the fact that the components in the backplane connector are connected with the mainboard in a short time due to insufficient soldering.

Description

Anti-interference high-speed backplane connector test system

Technical Field

The application relates to the technical field of semiconductor device detection, in particular to an anti-interference high-speed backplane connector test system.

Background

The backplane connector is a type of connector commonly used for large-scale communication equipment, ultra-high performance servers and supercomputers, industrial computers and high-end storage equipment, and is mainly used for connecting a single board (daughter card) and a backplane, wherein a 90-degree vertical structure is formed between the single board and the backplane to transmit high-speed differential signals or single-ended signals and transmit large current.

In order to ensure that product performance is not problematic, the backplane connector needs to be tested before leaving the factory, but the existing testing mode mainly includes that the backplane connector is tested manually through an electrical testing machine, the testing efficiency is not high, so that the testing mode needs to be improved, for example, a high-speed backplane connector conduction testing device with the publication number of CN217385795U comprises a base, a probe seat mechanism, a dotting mechanism, a tongue piece mechanism and a pressing mechanism, wherein the base is also provided with an electrical cabinet, the electrical testing machine is arranged on the electrical cabinet, and the electrical testing machine is electrically connected with the probe seat mechanism and the tongue piece mechanism; the pressing mechanism is arranged on the outer side wall of the electric cabinet above the probe seat mechanism; the dotting mechanism and the tongue piece mechanism are respectively arranged on one side of the probe seat. In the prior art, the connector is fixed and clamped by using the probe seat, and meanwhile, the fish eye of the terminal of the connector is connected with the probe; in the prior art, the connector is pressed through the pressing mechanism during testing, so that the stability of the testing is ensured; the prior art described above uses the tongue piece to be inserted into the gold pin of the connector, so that the gold pin contacts all short-circuits, and the prior art described above has few parts and is convenient for wire replacement.

Although the above prior art can replace manual testing of the performance of the side panel connector by an electrical testing machine, there still exist some drawbacks:

1. the prior art only replaces the electric measuring machine, still needs manual work to install and take out the backplane connector, does not fundamentally solve the problem, and does not improve the testing efficiency.

2. Above-mentioned prior art is through the circular telegram test to the backplate connector, whether each unit of mainboard in the detection backplate connector can normal use, but does not consider in the backplate connector each components and parts rosin joint on the mainboard for the backplate connector is only tentatively intact, still has the product quality problem.

Disclosure of Invention

The application provides a pair of anti-interference high-speed backplane connector test system adopts following technical scheme:

an anti-interference high-speed backplane connector test system comprises a rotary base column, wherein an annular test seat is rotatably arranged on the outer edge of the rotary base column, and a test machine for testing a backplane connector is arranged on the annular test seat;

the tester comprises a 20866;, wherein the 20866;, the two sides of the 20866;, are provided with side locators for locating a backplane connector, and the 20866;, one end of the 20866;, which is close to the outer edge of the annular test seat, is provided with a tightening stopper for tightening the backplane connector, and the 20866;, the top of the 20866;, is provided with a performance tester for testing the backplane connector, the 20866is arranged on the annular test seat, and a vibrator is arranged at the position of the 20866;, which is used for vibrating the backplane connector, and the 20866;, one side of the 20866;, which faces the rotary base column, is provided with a spring device for ejecting the backplane connector in the 2086666; the annular test seat is distributed with a feeding area, a test area and a discharging area along the rotation direction of the annular test seat in sequence.

Preferably, the side positioner comprises a structure 20866a type test frame, two positioning parts which are symmetrically distributed are arranged in the type test frame in a sliding mode, the positioning parts face to a structure 20866a positioning rope is connected to one side of the side wall of the type test frame, the positioning rope penetrates through the structure 20866a type test frame and is connected with a sliding strip positioned on the outer side of the structure 20866a positioning spring is connected between the positioning parts and the structure 20866a positioning spring and is used for driving the positioning parts to position a backplane connector, a side frame is arranged on the outer side of the structure 20866a position which is positioned on the same side as the positioning parts, the sliding strip is arranged on a sliding seat arranged in the side frame in a sliding mode, and a positioning control part is arranged on the rotating base column and is used for driving the sliding strip to control the positioning parts to position the structure 20866666666and the backplane connector in the type test frame;

sliding seat back-off 20866one side of the type test frame is rotatably connected with an adjusting screw rod, and the adjusting screw rod penetrates through the side frame and is in threaded connection with the side frame.

Preferably, the positioning control part comprises an annular positioning ring arranged on the outer side wall of the rotary base column, and arc-shaped bulges are arranged on the outer side wall of the annular positioning ring and positioned in the feeding area and the discharging area and used for controlling positioning parts to align 2086666and positioning a backplane connector in the testing frame;

the utility model discloses a test frame is provided with the arc strip with annular position circle and the protruding sliding fit of arc on one side that the type test frame is close to rotatory foundation pillar, the strip that slides runs through side frame and sliding connection on the arc strip towards the one end of rotatory foundation pillar for order about the slip of strip that slides on the seat that slides.

Preferably, the abutting limiter comprises an abutting block, the abutting block is arranged on an annular test seat in a sliding manner along the radius direction of the annular test seat, the abutting block is positioned between two positioning pieces in the 20866;, the bottom of the abutting block is connected with two vertical sections of the U-shaped guide frame, the annular test seat is provided with a guide sliding groove convenient for the two vertical sections of the U-shaped guide frame to slide along the radius direction of the annular test seat, the edge of the annular test seat is provided with a retreat groove convenient for the abutting block to slide up and down and communicated with the guide sliding groove, one end of the abutting block, which is far away from the rotary base column, is provided with an abutting part, and the outer edge of the annular test seat is provided with a limiting part matched with the abutting part and used for controlling the abutting block to abut against a backboard connector in 2086666; and one end of the retreat groove, which is away from the guide sliding groove, is provided with a matching groove which is convenient for the contact part to slide up and down.

A propping control block is arranged at the bottom of the annular test seat in a sliding manner along the radius direction of the annular test seat, two vertical sections of the U-shaped guide frame are arranged on the propping control block in an up-and-down sliding manner, and a first spring is connected between the horizontal section of the U-shaped guide frame and the bottom of the propping control block and is used for controlling the propping block to slide up and down in the retreat groove;

and a second spring is connected between the side wall of the abutting control block and a fixed seat arranged at the bottom of the annular test seat and used for controlling the abutting block to slide along the length direction of the guide sliding groove.

Preferably, the limiting part comprises an arc-shaped limiting block which is rotatably arranged on the outer side wall of the annular testing seat and is positioned in a testing area of the annular testing seat, the arc-shaped limiting block is fixed on a bottom supporting plate arranged at the bottom of the rotary foundation column, and a guide slope matched with the abutting part is formed at the upper end of one side, facing the feeding area, of the arc-shaped limiting block and is used for driving the abutting block to move upwards in the retreat groove;

the upper end of the arc limiting block is provided with an arc abutting plate, the arc abutting plate is positioned at one end of the guide slope, and one end of the arc abutting plate facing the rotating base column is provided with an abutting slope and used for driving the abutting block to face the 2086666and the backboard connector in the type test frame to move;

horizontal plates are rotatably arranged on the outer side wall of the annular test seat and positioned in the feeding area and the discharging area, the upper end surfaces of the horizontal plates are flush with the upper surface of the annular test seat so as to facilitate feeding and discharging of the backboard connector, and the horizontal plates are fixed on the bottom supporting plate;

conflict piece is including a conflict section of thick bamboo, a conflict section of thick bamboo level is fixed on the piece that supports, and a conflict section of thick bamboo deviates from one side threaded connection who supports the piece that supports, support the feeler lever and support tight inboard wall and support tight slope conflict cooperation with the arc, a conflict section of thick bamboo and conflict pole all conflict cooperation with arc stopper up end and guide slope.

Preferably, the performance tester comprises a cover plate arranged at the top of the 20866;, a vertically arranged control plate is slidably arranged on the cover plate and penetrates through the cover plate in a sliding manner, a detachable covering test plate is mounted at the lower end of the cover plate, a contact matched with the backplane connector is arranged at the bottom of the covering test plate and used for testing the backplane connector, and a return spring is connected between the covering test plate and the cover plate and used for driving the contact to move out of the backplane connector;

rotatory foundation pillar top is fixed with cyclic annular T template, cyclic annular T template bottom and the test area department that is located annular test seat are provided with the arc lid plywood, and arc lid plywood bottom and the conflict cooperation in control panel top, the bottom that the arc lid plywood is close to feed area one side is provided with and conflicts the complex lid with the control panel top and closes the slope.

Preferably, the elastic device comprises an elastic plate, the elastic plate is arranged in a placing groove formed in the inner side wall of one end, away from the rotating base column, of the v-21274, one side, facing the rotating base column, of the elastic plate is connected with an elastic rod, and the elastic rod penetrates through the v-20866in a sliding mode;

the annular positioning circles and is located feeding area and test area department and is provided with arc bullet material strip, arc bullet material strip and control lever conflict cooperation, the one end that arc bullet material strip is located the feeding area is connected with the arc that fixes in the arc arch and draws the strip, and the arc draws the strip and contradicts the cooperation with the control lever.

Preferably, the vibrator comprises a vibrating cylinder, the annular test seat is located on 20866;, a plurality of vibrating holes are formed in the type test frame, the vibrating cylinder is located in the vibrating holes, two ends of the vibrating cylinder are rotatably connected with vibrating plates which slide in the vibrating holes, a plurality of limiting teeth are uniformly arranged on one side of the vibrating cylinder in the circumferential direction, a rotating control strip is arranged in the vibrating holes and corresponds to the limiting teeth in a vertical sliding manner, a plurality of grooves are uniformly formed in one side of the rotating control strip, which faces the limiting teeth, from top to bottom, and matching teeth are hinged to the bottom in the grooves and matched with the limiting teeth to drive the vibrating cylinder to rotate;

the bottom of the rotation control bar is connected with a vibrating piece; the utility model discloses a rotary foundation column, including rotatory foundation column lateral wall, feeding area, vibration piece, rotation control strip top and vibration hole, just be located annular test seat below department on the rotatory foundation column lateral wall and be provided with the ARC vibration board that is located the test area, and the ARC vibration board is close to the one end in feeding area and is provided with the complex vibration slope of contradicting bottom the vibration board, evenly set up a plurality ofly on the ARC vibration board and contradict complex triangle sloping block with the vibrating piece, be connected with down spring between rotation control strip top and the vibration hole.

Preferably, the vibration cylinder is of a hollow shell structure, an elastic air bag is arranged in the vibration cylinder, a plurality of circular holes are uniformly formed in the outer side wall of the vibration cylinder, a vibration rod is slidably arranged in the circular holes, and one end, located in the vibration cylinder, of the vibration rod is in abutting fit with the elastic air bag;

the vibrating piece is including fixing the vibrating ring that just is vertical arranging in rotation control strip bottom, vibrating ring bottom threaded connection has the cooperation pole, and the inclined plane conflict cooperation of cooperation pole and triangle sloping block.

Preferably, the vibrating barrels in the middle area of the 20866a type testing frame are uniformly distributed along the radius direction of the annular testing seat and rotate along the radius direction of the annular testing seat to drive the backplane connector to move along the radius direction of the annular testing seat; the vibration barrels in the two side areas of the 20866;) type test frame are distributed along the direction perpendicular to the radius of the annular test seat, rotate along the direction perpendicular to the radius of the annular test seat and are used for driving the backplane connector to move along the direction perpendicular to the radius of the annular test seat.

In summary, the present application includes at least one of the following beneficial technical effects:

1. the performance tester can accurately butt-joint the 20866by limiting the position of the backplane connector in the 20866through the matching of the side positioner and the abutting limiter; the invention can move out the backplane connector which is tested through the ejector so as to ensure that the 20866a type test frame can test the next backplane connector to be tested after rotating to the feeding area; meanwhile, the performance tester vibrates the backplane connector through the vibrator in the test process to prevent the problem that the performance tester cannot detect the problem due to the short connection caused by the insufficient soldering of the components and the mainboard in the backplane connector.

2. The invention can vibrate the backplane connector under test through the vibrator, and is used for detecting whether each component in the backplane connector has a problem of insufficient solder so that a performance tester can not effectively test whether the backplane connector meets the specified requirements; meanwhile, the rotary cylinders can vibrate the backboard connector under different vibration forces, and can drive the backboard connector to move in all directions on the upper surface of the annular test seat, so that the problem of insufficient soldering of the backboard connector can be further tested.

3. The distance between the abutting rod and the abutting cylinder can be adjusted according to the specification and the size of the backplane connector, so that the distance between the abutting block and the backplane connector can be changed, and the abutting block can be limited in a 20866; "type test frame" for backplane connectors of different specifications and sizes.

Drawings

Fig. 1 is a first schematic structural diagram of the present invention.

FIG. 2 is a second schematic structural diagram of the present invention.

FIG. 3 is a first schematic view of the side edge positioning device of the present invention.

Fig. 4 is a partial enlarged view of fig. 3 a of the present invention.

FIG. 5 is a second schematic view of the side edge positioning device of the present invention.

Fig. 6 is a schematic structural view of the holding stopper of the present invention.

FIG. 7 is a schematic diagram of the configuration of the performance tester of the present invention.

FIG. 8 is a schematic view of the structure of the ejector of the present invention.

Fig. 9 is a partial enlarged view of the invention at B of fig. 8.

Fig. 10 is a schematic view of the structure of the vibrator of the present invention.

Fig. 11 is a partial enlarged view of the invention at C of fig. 10.

Fig. 12 is a schematic structural view of the vibration cylinder of the present invention.

Fig. 13 is a schematic view showing the structure among the rotation control bar, the vibration plate and the vibrating member according to the present invention.

Fig. 14 is a schematic structural view between the arc vibration plate and the triangular swash block of the present invention.

Description of reference numerals: 100. a backplane connector; 1. rotating the foundation column; 2. an annular test seat; 21. a feed zone; 22. a test zone; 23. a discharge zone; 3. a testing machine; 4. 20866and test frame; 5. a side locator; 51. a positioning member; 52. positioning the rope; 53. a sliding strip; 54. a positioning spring; 55. a side frame; 56. a sliding seat; 57. positioning a control member; 571. an annular positioning ring; 572. an arc-shaped bulge; 573. an arc-shaped strip; 58. adjusting the screw rod; 6. tightly abutting against the limiter; 61. a propping block; 611. a withdrawal groove; 62. a U-shaped guide frame; 621. a guide chute; 63. a contact member; 631. a touch cylinder; 632. a touch bar; 64. a stopper; 641. an arc-shaped limiting block; 642. a bottom pallet; 643. a guide ramp; 644. an arc-shaped abutting plate; 645. abutting against the slope; 646. a horizontal plate; 65. a mating groove; 66. abutting against the control block; 67. a first spring; 68. a fixed seat; 69. a second spring; 7. a performance tester; 71. a cover plate; 72. a control panel; 73. covering the test board; 74. a contact member; 75. a return spring; 76. an annular T-shaped plate; 77. an arc-shaped cover plate; 78. covering the slope; 8. a vibrator; 81. a vibration cylinder; 811. an elastic air bag; 812. a vibrating rod; 82. a vibrating plate; 83. limiting teeth; 84. rotating the control bar; 841. a groove; 842. mating teeth; 85. a vibrating member; 851. a vibrating ring; 852. a mating rod; 86. an arc-shaped vibrating plate; 861. vibrating the slope; 87. a triangular oblique block; 88. pressing down the spring; 9. a material ejecting device; 91. a material ejecting plate; 92. a charge bar; 93. an auxiliary ring; 94. a control lever; 95. an elastic cord; 96. an arc-shaped elastic strip; 97. an arc-shaped extension strip.

Detailed Description

The present application is described in further detail below in conjunction with figures 1-14.

The first embodiment is as follows:

referring to fig. 1, the embodiment of the application discloses an anti-interference high-speed backplane connector test system, which includes a rotating base column 1, an annular test seat 2 is rotatably arranged on the outer edge of the rotating base column 1, and a tester 3 for testing a backplane connector 100 is arranged on the annular test seat 2; the invention tests the performance of the backplane connector 100 through the tester 3 on the ring-shaped test seat 2 so as to judge whether the backplane connector 100 meets the requirements or not.

Referring to fig. 1-2, a testing machine 3 comprises 20866; 'type testing frame 4, 20866;' type testing frame 4 is evenly distributed along the outer edge of an annular testing seat 2 along the circumferential direction, 20866; 'side edge locators 5, 20866for locating a backplane connector 100 are arranged on both sides of the type testing frame 4;' a resisting stopper 6 for resisting the backplane connector 100 is arranged at one end of the type testing frame 4 close to the outer edge of the annular testing seat 2, 20866; 'a performance tester 7 for testing the backplane connector 100 is arranged at the top of the type testing frame 4, 20866is arranged on the annular testing seat 2, and a vibrator 8 is arranged at the type testing frame 4 for vibrating the backplane connector 100, 20866;' a flicking device 9 is arranged on one side of the type testing frame 4 facing a rotating base column 1 for popping up the backplane connector 100 in the type testing frame 4; the annular test seat 2 is distributed with a feeding area 21, a testing area 22 and a discharging area 23 in sequence along the rotation direction.

In the specific implementation process, the backplane connector 100 to be tested is placed in the 20866in the feeding area 21 of the annular test seat 2, the backplane connector 100 is guided and limited by the side locators 5 in the type test frame 4, and the position of the backplane connector 100 in the 20866is limited by the abutting limiters 6, so that the performance tester 7 can be accurately abutted to the 20866, and the backplane connector 100 in the type test frame 4 is ensured, so that the performance tester 7 can test the backplane connector 100; after the test is finished, the backplane connector 100 is moved out in the discharging area 23 through the ejector 9, so that the 20866; "the type test frame 4 rotates to the feeding area 21, and then the next backplane connector 100 to be tested can be tested; meanwhile, in the invention, the performance tester 7 vibrates the backplane connector 100 through the vibrator 8 in the test process, so that the problem that the transient connection is caused by the insufficient soldering of the components and the mainboard in the backplane connector 100 is solved, and the performance tester 7 cannot detect the problem.

After the backplane connector 100 is moved to the 20866of the displacement feeding area 21, the profile test frame 4 needs to be positioned by the side positioner 5, specifically, referring to fig. 3-4, the side positioner 5 comprises the 20866, two positioning members 51 symmetrically distributed are slidably arranged in the profile test frame 4, the positioning members 51 face the 20866, one side of the side wall of the profile test frame 4 is connected with a positioning rope 52, the positioning rope 52 penetrates through the 20866, the positioning rope 52 is connected with a sliding strip 53 positioned outside the 20866, positioning springs 54 are connected between the positioning pieces 51 and 20866and between the type test frames 4 and used for driving the positioning pieces 51 to position the backplane connectors 100 and 20866, side frames 55 are arranged on the outer sides of the type test frames 4 and on the same side with the positioning pieces 51, the sliding strips 53 are arranged on sliding seats 56 arranged in the side frames 55 in a sliding manner, and positioning control pieces 57 are arranged on the rotary foundation columns 1 and used for driving the sliding strips 53 to control the positioning pieces 51 to be positioned 20866and the backplane connectors 100 in the type test frames 4;

in a specific implementation process, after the backplane connector 100 is placed at 20866and the type test frame 4 is rotated along with the rotation of the annular test seat 2, the 20866and the type test frame 4 are rotated to the test area 22, and in the rotation process, the positioning control piece 57 on the rotating base column 1 drives the sliding strip 53 to move towards one side of the rotating base column 1, so that the sliding strip 53 releases the pulling on the positioning rope 52, and the positioning piece 51 is driven by the positioning spring 54 to move towards the backplane connector 100 until the positioning limitation on the backplane connector 100 is completed; after the backplane connector 100 is tested and moved out of the test area 22, the positioning control member 57 controls the sliding strip 53 to move in a direction away from the rotating base post 1, so that the sliding strip 53 pulls the positioning rope 52 to move the positioning member 51 towards 20866and the side of the type test frame 4, and then the positioning of the backplane connector 100 is released, and then the subsequent ejector 9 moves the backplane connector 100 out of 20866and the type test frame 4.

The sliding seat 56 deviates from the 20866, one side of the type test frame 4 is rotatably connected with an adjusting screw rod 58, and the adjusting screw rod 58 penetrates through the side frame 55 and is in threaded connection with the side frame 55; the invention changes the position of the sliding seat 56 by adjusting the screw rod 58, so that the sliding strip 53 changes the position of the positioning piece 51 in the 20866type test frame 4 by the positioning rope 52, so that the side positioner 5 of the invention can perform side positioning for backplane connectors 100 with different specifications and sizes.

Further, the positioning control member 57 comprises an annular positioning ring 571 arranged on the outer side wall of the rotary base column 1, and arc-shaped protrusions 572 are arranged on the outer side wall of the annular positioning ring 571 and positioned at the feeding area 21 and the discharging area 23 and used for controlling the positioning member 51 to align the 20866and positioning the backplane connector 100 in the testing frame 4;

20866one side of the testing frame 4 close to the rotating base column 1 is provided with an arc-shaped strip 573 in sliding fit with the annular positioning ring 571 and the arc-shaped protrusion 572, and one end of the sliding strip 53 facing the rotating base column 1 penetrates through the side frame 55 and is connected to the arc-shaped strip 573 in a sliding manner, so as to drive the sliding strip 53 to slide on the sliding seat 56.

In a specific implementation, when the 20866a backplane connector 100 in the type test frame 4 is tested, as the ring-shaped test socket 2 rotates, the arc-shaped strip 573 rotates from the position along the ring-shaped positioning ring 571 to the position along which the arc-shaped strip 573 starts to abut against the arc-shaped protrusion 572 and rotates along the arc-shaped protrusion 572, so that the sliding strip 53 is driven to move in a direction away from the rotating base post 1, so that the positioning member 51 releases the positioning of the 20866a backplane connector 100 in the type test frame 4, after the ejector 9 ejects the backplane connector 100, the ring-shaped test socket 2 drives the 20866a, the type test frame 4 rotates to the feeding area 21, so that the next backplane connector 100 to be tested moves to the 20866a next backplane connector 100 in the type test frame 4, when the arc-shaped strip 573 moves from the arc-shaped protrusion 572 to the ring-shaped positioning ring 571, the arc-shaped protrusion 572 no longer abuts against the arc-shaped strip 573, so that the positioning member 51 can clamp and position the backplane connector 100 in the 20866a type test frame 4 under the action of the positioning spring 54.

After the backplane connector 100 is positioned by the side positioner 5, the backplane connector 100 needs to be limited along the radial direction of the annular test seat 2 by the abutting limiter 6, wherein, referring to fig. 4-5, the abutting limiter 6 comprises an abutting block 61, the abutting block 61 is arranged on the annular test seat 2 in a sliding manner along the radial direction of the annular test seat 2, the abutting block 61 is positioned on 20866;, between two positioning pieces 51 in the annular test frame 4, the bottom of the abutting block 61 is connected with two vertical sections of the U-shaped guide frame 62, the annular test seat 2 is provided with a guide chute 621 facilitating the sliding of two vertical sections of the U-shaped guide frame 62 along the radial direction thereof, the edge of the annular test seat 2 is provided with a back-off slot 611 facilitating the up-down sliding of the abutting block 61 and communicating with the guide chute 621, one end of the abutting block 61 departing from the rotary base column 1 is provided with an abutting piece 63, the outer edge of the annular test seat 2 is provided with a limiting piece 64 cooperating with the abutting piece 63 for controlling the abutting block 61 to abut against 66100 in the 208664 of the annular test frame 4; one end of the retreat groove 611 facing away from the guide chute 621 is provided with a matching groove 65 facilitating the contact member 63 to slide up and down.

In the specific implementation process, as the annular test socket 2 rotates, the abutting piece 63 cooperates with the limiting piece 64 to drive the abutting block 61 to move towards the backplane connector 100 until the backplane connector 100 abuts against the inner side wall of the 20866; "type test frame 4, thereby ensuring that the performance tester 7 can accurately abut against the backplane connector 100.

After the test is finished, in order to facilitate the movement of the backplane connector 100 to be tested, 20866is convenient, the type test frame 4 and the subsequent backplane connector 100 to be tested are moved to 20866, and in the type test frame 4, the abutting block 61 needs to be moved into the retreat groove 611 along the guide sliding groove 621 and moved downwards along the retreat groove 611 until the abutting block 61 is completely moved out of the upper surface of the annular test seat 2; therefore, the bottom of the annular test seat 2 is provided with the abutting control block 66 in a sliding manner along the radius direction, two vertical sections of the U-shaped guide frame 62 are arranged on the abutting control block 66 in a sliding manner up and down, and a first spring 67 is connected between the horizontal section of the U-shaped guide frame 62 and the bottom of the abutting control block 66 and is used for controlling the abutting block 61 to slide up and down in the retreat groove 611; a second spring 69 is connected between the sidewall of the abutting control block 66 and a fixing seat 68 arranged at the bottom of the annular test seat 2, and is used for controlling the abutting block 61 to slide along the length direction of the guide sliding groove 621.

In a specific implementation process, when the abutting member 63 is no longer engaged with the limiting member 64, the abutting block 61 is moved toward the receding slot 611 under the action of the second spring 69, and after the abutting block moves into the receding slot 611, the first spring 67 drives the U-shaped guide frame 62 to control the abutting block 61 to move downward, so that the abutting block 61 does not affect the moving-out or moving-in of the backplane connector 100.

Referring to fig. 6, the limiting member 64 includes an arc-shaped limiting block 641 rotatably disposed on the outer sidewall of the annular testing seat 2, the arc-shaped limiting block 641 is located in the testing area 22 of the annular testing seat 2, the arc-shaped limiting block 641 is fixed on a bottom supporting plate 642 disposed at the bottom of the rotating base column 1, and a guiding slope 643 cooperating with the abutting member 63 is formed at the upper end of one side of the arc-shaped limiting block 641 facing the feeding area 21, for driving the abutting block 61 to move up in the retreat groove 611; the upper end of the arc-shaped limiting block 641 is provided with an arc-shaped abutting plate 644, the arc-shaped abutting plate 644 is positioned at one end of the guide slope 643 and is provided with an abutting slope 645 towards one end of the rotating base column 1, and the arc-shaped abutting plate 644 is used for driving the abutting block 61 to move towards the 20866; "the backboard connector 100 in the type test frame 4;

in the specific implementation process, after the backplane connector 100 is moved to the 20866; 'type test frame 4, after the side positioner 5 positions the backplane connector, the abutting piece 63 starts to be in interference fit with the guiding slope 643 on the arc-shaped limiting block 641 along with the rotation of the annular test seat 2, the abutting piece 63 is driven to drive the abutting block 61 to move upwards along the retreat groove 611 until the abutting block 61 completely moves the retreat groove 611, and then the abutting piece 63 starts to be in interference fit with the abutting slope 645 of the arc-shaped abutting plate 644 to drive the abutting block 61 to move towards the backplane connector 100 until the backplane connector 100 is limited in the 20866;' type test frame 4.

A horizontal plate 646 is rotatably arranged on the outer side wall of the annular test seat 2 and positioned at the feeding area 21 and the discharging area 23, the upper end surface of the horizontal plate 646 is flush with the upper surface of the annular test seat 2 so as to facilitate feeding and discharging of the backplane connector 100, and the horizontal plate 646 is fixed on the bottom support plate 642; note that the lower end of the horizontal plate 646 does not affect the movement of the contact member 63 located in the fitting groove 65.

Further, referring back to fig. 4, the abutting member 63 includes an abutting cylinder 631, the abutting cylinder 631 is horizontally fixed on the abutting block 61, and one side of the abutting cylinder 631, which is away from the abutting block 61, is in threaded connection with an abutting rod 632, the abutting rod 632 is in abutting fit with an inner side wall of the arc abutting plate 644 and an abutting slope 645, and both the abutting cylinder 631 and the abutting rod 632 are in abutting fit with an upper end surface of the arc limiting block 641 and a guiding slope 643;

the invention can change the distance between the abutting rod 632 and the abutting cylinder 631 according to the specification and the size of the backplane connector 100, so as to ensure that the abutting block 61 can be limited in the 20866for the backplane connector 100 with different specifications and sizes, and the type test frame 4 needs to be explained that the abutting rod 632 can always be in abutting fit with the abutting slope 645 no matter how the distance between the abutting rod 632 and the abutting cylinder 631 is changed.

After the backplane connector 100 is limited by the side locator 5 and the abutting limiter 6, the backplane connector 100 needs to be tested by the performance tester 7, specifically, referring back to fig. 4, the performance tester 7 includes a cover plate 71 arranged at the top of the 20866;, a vertically arranged control plate 72 is slidably arranged on the cover plate 71, the control plate 72 slidably penetrates through the cover plate 71, a detachable cover test plate 73 is mounted at the lower end of the cover plate 71, a contact element 74 matched with the backplane connector 100 is arranged at the bottom of the cover test plate 73 and used for testing the backplane connector 100, and a return spring 75 is connected between the cover test plate 73 and the cover plate 71 and used for driving the contact element 74 to move out of the backplane connector 100;

referring to fig. 7, an annular T-shaped plate 76 is fixed at the top of the rotary base column 1, an arc-shaped cover plate 77 is arranged at the bottom of the annular T-shaped plate 76 and at the testing area 22 of the annular testing base 2, the bottom of the arc-shaped cover plate 77 is in interference fit with the top of the control plate 72, and a cover slope 78 in interference fit with the top of the control plate 72 is arranged at the bottom of one side of the arc-shaped cover plate 77 close to the feeding area 21.

In a specific implementation process, with the rotation of the annular test socket 2, the control board 72 starts to be in interference fit with the covering slope 78 of the arc-shaped covering board 77, so as to drive the control board 72 to drive the covering test board 73 to move downwards until the contact 74 on the covering test board 73 starts to contact with a component on the backplane connector 100, so that the backplane connector 100 can be tested, and whether the backplane connector 100 meets the specified requirements or not and whether the product is qualified or not can be ensured; after the test is completed, the control board 72 does not abut against the arc-shaped cover plate 77 along with the rotation of the annular test socket 2, and the cover test board 73 drives the contact 74 to move out of the backplane connector 100 upward under the action of the return spring 75.

After the test is finished, the backboard connector 100 is rotated to the discharging area 23 along with the rotation of the annular test seat 2, so that the side positioner 5 and the abutting limiter 6 are reset, and the elastic device 9 can move the backboard connector 100 out of 20866and the type test frame 4, concretely, referring to fig. 8-9, the elastic device 9 comprises an elastic plate 91, the elastic plate 91 is arranged in a placing groove formed in the inner side wall of one end of the 21274type test seat, which is far away from the rotary base column 1, one side of the elastic plate 91, which is towards the rotary base column 1, is connected with an elastic rod 92, the elastic rod 92 slides and penetrates through the 20866type test frame 4, 20866, an auxiliary ring 93, which facilitates the sliding of the elastic rod 92, is arranged on the outer side of the type test frame 4, a vertically arranged control rod 94 and 208666666is arranged at one end of the elastic rod 92, which is far away from the elastic rod 91, and an elastic rope 95 is arranged on the side wall of the type test frame 4 and above the auxiliary ring 93, and the elastic rope 95 penetrates through the control rod 94;

an arc-shaped elastic strip 96 is arranged on the annular positioning ring 571 and located at the feeding area 21 and the testing area 22, the arc-shaped elastic strip 96 is in interference fit with the control rod 94, one end of the arc-shaped elastic strip 96 located at the feeding area 21 is connected with an arc-shaped extension strip 97 fixed on the arc-shaped protrusion 572, and the arc-shaped extension strip 97 is in interference fit with the control rod 94.

In the specific implementation process, after the control rod 94 is separated from the limit of the arc-shaped material ejecting strip 96, the control rod 94 pushes the material ejecting plate 91 to push 20866by pushing the material ejecting rod 92 under the action of the elastic force of the elastic rope 95, and the backboard connector 100 in the testing frame 4 is moved out; after the completion of the removal of the backplane connector 100, along with the rotation of the annular test socket 2, the control rod 94 begins to be in interference fit with the arc-shaped extension strip 97, so that the elastic plate 91 is controlled to return to the placing groove by pulling the elastic rod 92 until the control rod 94 is matched with the arc-shaped elastic strip 96.

Example two:

on the basis of the first embodiment, when the backplane connector 100 is tested by the performance tester 7, but since each component on the motherboard in the backplane connector 100 is fixed on the motherboard by welding, and the welding has a cold solder joint, which is easily damaged, the performance tester 7 effectively tests the cold solder joint, the backplane connector 100 in the testing process is vibrated by the vibrator 8, and if the cold solder joint exists, the cold solder joint can be separated from the motherboard by vibration, so that the performance tester 7 cannot detect, and further, whether the backplane connector 100 meets the requirement or not is conveniently judged.

Specifically, referring to fig. 10-13, the vibrator 8 includes a vibration cylinder 81, the annular test seat 2 is located on 20866;, a plurality of vibration holes are formed in the test frame 4, the vibration cylinder 81 is located in the vibration holes, two ends of the vibration cylinder 81 are rotatably connected to a vibration plate 82 sliding in the vibration holes, a plurality of limiting teeth 83 are uniformly circumferentially arranged on one side of the vibration cylinder 81, a rotation control bar 84 is vertically and slidably arranged in the vibration holes and corresponding to the limiting teeth 83, a plurality of grooves 841 are uniformly formed in one side of the rotation control bar 84 facing the limiting teeth 83 from top to bottom, a mating tooth 842 is hinged to the bottom of the groove 841, and the mating tooth 842 is matched with the limiting teeth 83 to drive the vibration cylinder 81 to rotate;

in the specific implementation process, after the backplane connector 100 is placed in the 20866;, the rotating barrel rotates by the up-and-down reciprocating movement of the rotating control strip 84, so that the backplane connector 100 is driven to have a moving trend on the annular test seat 2, and the backplane connector 100 is driven to have a moving trend from different directions; specifically, when the rotation control bar 84 moves upward, the vibration cylinder 81 is driven to rotate by the matching teeth 842 matching with the limiting teeth 83 on the outer side wall of the vibration cylinder 81, and when the rotation control bar 84 moves downward, the matching teeth 842 are hinged in the groove 841, so that the matching teeth 842 rotate into the groove 841 under the interference of the limiting teeth 83, so that the rotation control bar 84 moves downward smoothly.

Referring to fig. 12-14, the bottom of the rotation control bar 84 is connected to a vibrator 85; the arc vibration plate 86 located in the test area 22 is arranged on the outer side wall of the rotary base column 1 and located below the annular test seat 2, a vibration slope 861 matched with the bottom of the vibration plate 82 in an abutting mode is arranged at one end, close to the feeding area 21, of the arc vibration plate 86, a plurality of triangular inclined blocks 87 matched with the vibration piece 85 in an abutting mode are evenly arranged on the arc vibration plate 86, and a pressing spring 88 (shown in fig. 11) is connected between the top of the rotation control strip 84 and the vibration hole.

In a specific implementation process, firstly, when the vibration plate 82 abuts against the vibration slope 861 on the arc-shaped vibration plate 86, the vibration plate 82 is driven to drive the rotation cylinder to move upwards, so that the rotation cylinder can be in contact with the backplane connector 100, and the backplane connector 100 is vibrated by the vibration cylinder 81; then, the vibrating member 85 is in abutting fit with a plurality of triangular oblique blocks 87 uniformly distributed on the arc-shaped vibrating plate 86, so that the vibrating member 85 drives the rotating control bar 84 to move upwards, then the rotating control bar 84 drives the vibrating member 85 to move downwards under the action of the pressing spring 88, and then the vertical reciprocating movement of the rotating control bar 84 is realized, so that the rotating cylinder can vibrate the backplane connector 100 all the time.

In order to improve the vibration effect, referring to fig. 12, the vibration cylinder 81 of the present invention is a hollow shell structure, an elastic air bag 811 is disposed in the vibration cylinder 81, a plurality of circular holes are uniformly formed in the outer side wall of the vibration cylinder 81, a vibration rod 812 is slidably disposed in the circular holes, and one end of the vibration rod 812 located in the vibration cylinder 81 is in interference fit with the elastic air bag 811; when the rotary cylinder rotates, the vibrating rod 812 may strike the backplane connector 100 first, and then the vibrating rod 812 may also provide the backplane connector 100 with a moving trend, so as to vibrate or horizontally move and misplace each component in the backplane connector 100, test whether the welding between the component and the motherboard is firm, and if not, the cold joint, or vice versa.

The vibrating piece 85 comprises a vibrating ring 851 which is fixed at the bottom of the rotation control bar 84 and is vertically arranged, a matching rod 852 is connected with the bottom of the vibrating ring 851 through threads, and the matching rod 852 is in interference fit with the inclined surface of the triangular oblique block 87; the present invention may vary the vibrational force of the rotating barrel to backplane connector 100 by varying the spacing of the bottom of the engagement rod 852 to the arcuate vibrating plate 86.

Referring to fig. 11, a plurality of vibration barrels 81 located in the middle area of 20866a type test frame 4 are uniformly distributed along the radius direction of the annular test socket 2 and rotate along the radius direction of the annular test socket 2 to drive the backplane connector 100 to move along the radius direction of the annular test socket 2; the vibrating drums 81 located in the two side areas of the 20866; "type test frame 4 are distributed along the direction perpendicular to the radius of the annular test socket 2, and rotate along the direction perpendicular to the radius of the annular test socket 2, so as to drive the backplane connector 100 to move along the direction perpendicular to the radius of the annular test socket 2.

It should be noted that when the vibrating element 85 is in interference fit with the triangular oblique blocks 87, the backboard connector 100 can only be driven to move along one direction, so as to avoid the problem that forces in multiple directions drive the backboard connector 100 to move in different directions.

The implementation principle of the invention is as follows:

(1): with the rotation of the annular test seat 2, when the 20866;, type test frame 4 on the annular test seat 2 moves to the feeding area 21, the backplane connector 100 to be tested moves to the 20866;, type test frame 4;

(2): then, the two ends of the backplane connector 100 are positioned by the side positioner 5, and the backplane connector 100 is tightly pressed in the 20866; "type test frame 4" by the pressing limiter 6 after the positioning is finished;

(3): then, the backplane connector 100 is rotated to the test area 22 along with the rotation of the annular test socket 2, the performance tester 7 is firstly butted with the backplane connector 100 and tested, and meanwhile, the backplane connector 100 is vibrated by the vibrator 8 in the test process to detect whether the welding between each component in the backplane connector 100 and the mainboard is firm, so that the problem that the performance tester 7 cannot detect the backplane connector 100 due to insufficient welding is prevented;

(4): finally, after the test is completed, the backboard connector 100 is rotated to the discharging area 23 along with the rotation of the annular test seat 2, and after the side positioner 5 and the abutting limiter 6 are reset, the springing device 9 moves the backboard connector 100 out of the 20866;. Type test frame 4.

The embodiments of the present invention are preferred embodiments of the present invention, and the scope of the present invention is not limited by these embodiments, so: all equivalent changes made according to the structure, shape and principle of the invention are covered by the protection scope of the invention.

Claims

1. An anti-interference high-speed backplane connector test system, includes rotatory foundation pillar (1), its characterized in that: an annular test seat (2) is rotatably arranged on the outer edge of the rotary base column (1), and a test machine (3) for testing the backplane connector (100) is arranged on the annular test seat (2);

the tester (3) comprises a 20866; 'type test frame (4);' 20866; 'type test frame (4) is uniformly distributed along the outer circumference of an annular test seat (2), and the 20866;' type test frame (4) is provided with side locators (5) for locating a backplane connector (100) on both sides, the 20866; 'type test frame (4) is provided with a pressing limiter (6) for pressing against the backplane connector (100) at one end close to the outer edge of the annular test seat (2), the 20866;' type test frame (4) is provided with a performance tester (7) for testing the backplane connector (100) on the top, the annular test seat (2) is provided with a vibrator (8) for vibrating the backplane connector (100), the 20866; 'type test frame (4) is provided with a spring device (9) for popping up the backplane connector (100) in the 20866;' 20866; the annular testing seat (2) is sequentially distributed with a feeding area (21), a testing area (22) and a discharging area (23) along the rotation direction;

the side positioner (5) comprises a 20866a type test frame (4) which is internally provided with two positioning parts (51) which are symmetrically distributed in a sliding manner, wherein the positioning parts (51) face to a 20866, one side of the side wall of the type test frame (4) is connected with a positioning rope (52), the positioning rope (52) penetrates through the 20866a type test frame (4) and is connected with a sliding strip (53) positioned on the outer side of the type test frame (4), the positioning parts (51) and the 20866, a positioning spring (54) is connected between the type test frame (4) and is used for driving the positioning parts (51) to position the backboard connector (100), a side frame (55) is arranged on the outer side of the type test frame (4) and is positioned at the positioning part (51), the sliding strip (53) is arranged on the sliding seat (56) arranged in the side frame (55) in a sliding manner, and a positioning control part (57) is arranged on the rotating base column (1) and is used for driving the sliding strip (53) to control the positioning parts (51) to position the positioning parts (2086666100) in the type test frame (4);

the sliding seat (56) deviates from 20866, one side of the type test frame (4) is rotatably connected with an adjusting screw rod (58), and the adjusting screw rod (58) penetrates through the side frame (55) and is connected to the side frame (55) through threads.

2. The system of claim 1, wherein the system further comprises: the positioning control piece (57) comprises an annular positioning ring (571) arranged on the outer side wall of the rotating base column (1), and arc-shaped protrusions (572) are arranged on the outer side wall of the annular positioning ring (571) and positioned at the feeding area (21) and the discharging area (23) and used for controlling positioning pieces (51) to be aligned with 20866and positioning a backplane connector (100) in the type test frame (4);

20866and one side, close to the rotating base column (1), of the type test frame (4) is provided with an arc-shaped strip (573) in sliding fit with the annular positioning ring (571) and the arc-shaped protrusion (572), and one end, facing the rotating base column (1), of the sliding strip (53) penetrates through the side frame (55) and is connected to the arc-shaped strip (573) in a sliding mode and used for driving the sliding strip (53) to slide on the sliding seat (56).

3. The system of claim 2, wherein the system further comprises: the abutting limiter (6) comprises an abutting block (61), the abutting block (61) is arranged on an annular test seat (2) in a sliding mode along the radius direction of the annular test seat (2), the abutting block (61) is located between two positioning pieces (51) in a 20866;. Type test frame (4), the bottom of the abutting block (61) is connected with two vertical sections of a U-shaped guide frame (62), the annular test seat (2) is provided with a guide sliding chute (621) convenient for the sliding of the two vertical sections of the U-shaped guide frame (62) along the radius direction of the annular test seat, the edge of the annular test seat (2) is provided with a return groove (611) convenient for the upward and downward sliding of the abutting block (61) and communicated with the guide sliding chute (621), one end, deviating from the rotating base column (1), of the abutting block (61) is provided with an abutting piece (63), and the outer edge of the annular test seat (2) is provided with a limiting piece (64) matched with the abutting piece (63) for controlling the abutting block (61) to abut against a back connector (66100) in the testing frame (2084); one end of the retreat groove (611) departing from the guide sliding groove (621) is provided with a matching groove (65) which is convenient for the contact piece (63) to slide up and down;

a propping control block (66) is arranged at the bottom of the annular test seat (2) in a sliding manner along the radius direction of the annular test seat, two vertical sections of the U-shaped guide frame (62) are arranged on the propping control block (66) in a vertically sliding manner, and a first spring (67) is connected between the horizontal section of the U-shaped guide frame (62) and the bottom of the propping control block (66) and used for controlling the propping block (61) to slide vertically in the retreat groove (611);

and a second spring (69) is connected between the side wall of the abutting control block (66) and a fixed seat (68) arranged at the bottom of the annular test seat (2) and used for controlling the abutting block (61) to slide along the length direction of the guide sliding groove (621).

4. The system of claim 3, wherein the system further comprises: the limiting piece (64) comprises an arc limiting piece (641) rotatably arranged on the outer side wall of the annular testing base (2), the arc limiting piece (641) is located in a testing area (22) of the annular testing base (2), the arc limiting piece (641) is fixed on a bottom supporting plate (642) arranged at the bottom of the rotary foundation column (1), and a guide slope (643) matched with the abutting piece (63) is formed at the upper end of one side, facing the feeding area (21), of the arc limiting piece (641) and used for driving the abutting piece (61) to move upwards in the retreat groove (611);

the upper end of the arc-shaped limiting block (641) is provided with an arc-shaped abutting plate (644), the arc-shaped abutting plate (644) is located at one end of the guide slope (643) and is provided with an abutting slope (645) facing one end of the rotating base column (1), and the arc-shaped abutting plate is used for driving the abutting block (61) to move towards a 20866; "backboard connector (100) in the test frame (4);

a horizontal plate (646) is rotatably arranged on the outer side wall of the annular test seat (2) and positioned in the feeding area (21) and the discharging area (23), the upper end surface of the horizontal plate (646) is flush with the upper surface of the annular test seat (2) so as to facilitate feeding and discharging of the backplane connector (100), and the horizontal plate (646) is fixed on the bottom supporting plate (642);

the abutting part (63) comprises an abutting cylinder (631), the abutting cylinder (631) is horizontally fixed on the abutting block (61), one side, away from the abutting block (61), of the abutting cylinder (631) is in threaded connection with an abutting rod (632), the abutting rod (632) is in abutting fit with the inner side wall of the arc abutting plate (644) and the abutting slope (645), and the abutting cylinder (631) and the abutting rod (632) are in abutting fit with the upper end face of the arc limiting block (641) and the guiding slope (643).

5. The system of claim 1, wherein the system further comprises: the performance tester (7) comprises a cover plate (71) arranged at the top of a 20866type test frame (4), a control plate (72) which is vertically arranged is arranged on the cover plate (71) in a sliding mode, the control plate (72) penetrates through the cover plate (71) in a sliding mode, a detachable covering test plate (73) is installed at the lower end of the cover plate (71), a contact piece (74) matched with the backplane connector (100) is arranged at the bottom of the covering test plate (73) and used for testing the backplane connector (100), and a reset spring (75) is connected between the covering test plate (73) and the cover plate (71) and used for driving the contact piece (74) to move out of the backplane connector (100);

rotatory foundation pillar (1) top is fixed with cyclic annular T template (76), test area (22) department that cyclic annular T template (76) bottom just is located annular test seat (2) is provided with arc lid board (77), and arc lid board (77) bottom and control panel (72) top conflict cooperation, arc lid board (77) are close to the bottom of feeding area (21) one side and are provided with and contradict complex lid with control panel (72) top and close slope (78).

6. The system of claim 2, wherein the system further comprises: the testing device comprises a material ejecting device (9) and is characterized in that the material ejecting device (9) comprises a material ejecting plate (91), the material ejecting plate (91) is arranged in a placing groove formed in the inner side wall of one end, facing away from a rotating base column (1), of a lifting 21274, one side, facing towards the rotating base column (1), of the material ejecting plate (91) is connected with a material ejecting rod (92), the material ejecting rod (92) penetrates through a lifting 2086620866a testing frame (4) in a sliding mode, an auxiliary ring (93) convenient for the material ejecting rod (92) to slide is arranged on the outer side of the lifting 20866660, one end, facing away from the material ejecting plate (91), of the material ejecting rod (92) is provided with a vertically arranged control rod (94), 2086620895 is arranged on the side wall of the lifting testing frame (4) and located above the auxiliary ring (93), and the elastic rope (95) penetrates through the control rod (94);

an arc-shaped elastic strip (96) is arranged on the annular positioning ring (571) and located in the feeding area (21) and the testing area (22), the arc-shaped elastic strip (96) is in interference fit with the control rod (94), one end, located in the feeding area (21), of the arc-shaped elastic strip (96) is connected with an arc-shaped extension strip (97) fixed on the arc-shaped protrusion (572), and the arc-shaped extension strip (97) is in interference fit with the control rod (94).

7. The system of claim 1, wherein the system further comprises: the vibrator (8) comprises a vibration barrel (81), the annular test seat (2) is located at 20866;, a plurality of vibration holes are formed in the type test frame (4), the vibration barrel (81) is located in the vibration holes, two ends of the vibration barrel (81) are rotatably connected to a vibration plate (82) which slides in the vibration holes, a plurality of limiting teeth (83) are uniformly arranged in the circumferential direction of one side of the vibration barrel (81), a rotation control strip (84) is arranged in the vibration holes and corresponds to the limiting teeth (83) in a vertically sliding manner, a plurality of grooves (841) are uniformly formed in the rotation control strip (84) from top to bottom towards one side of the limiting teeth (83), the inner bottom of each groove (841) is hinged with a matching tooth (842), and the matching teeth (842) are matched with the limiting teeth (83) and used for driving the vibration barrel (81) to rotate;

the bottom of the rotating control bar (84) is connected with a vibrating piece (85); rotatory foundation pillar (1) lateral wall is gone up and is located annular test seat (2) below department and be provided with arc vibration board (86) that are located test area (22), and arc vibration board (86) are close to the one end of feed area (21) and are provided with and vibrate board (82) bottom conflict complex vibration slope (861), evenly seted up on arc vibration board (86) a plurality ofly and vibrate piece (85) conflict complex triangle sloping block (87), be connected with down between rotation control strip (84) top and the vibration hole and press spring (88).

8. The system of claim 7, wherein the system further comprises: the vibration cylinder (81) is of a hollow shell structure, an elastic air bag (811) is arranged in the vibration cylinder (81), a plurality of round holes are uniformly formed in the outer side wall of the vibration cylinder (81), a vibration rod (812) is arranged in the round holes in a sliding manner, and one end, located in the vibration cylinder (81), of the vibration rod (812) is in interference fit with the elastic air bag (811);

the vibration piece (85) comprises a vibration ring (851) which is fixed at the bottom of the rotation control bar (84) and is vertically arranged, the bottom of the vibration ring (851) is in threaded connection with a matching rod (852), and the matching rod (852) is in interference fit with the inclined plane of the triangular oblique block (87).

9. The system of claim 7, wherein the system further comprises: the vibration barrels (81) in the middle area of the 20866;, are uniformly distributed along the radius direction of the annular test seat (2), rotate along the radius direction of the annular test seat (2), and are used for driving the backplane connector (100) to move along the radius direction of the annular test seat (2); the vibration cylinders (81) located in the two side areas of the 20866;) type test frame (4) are distributed along the direction perpendicular to the radius of the annular test seat (2) and rotate along the direction perpendicular to the radius of the annular test seat (2) to drive the backplane connector (100) to move along the direction perpendicular to the radius of the annular test seat (2).