CN219163372U - Wafer edge exposure device - Google Patents

Wafer edge exposure device Download PDF

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CN219163372U
CN219163372U CN202222636255.XU CN202222636255U CN219163372U CN 219163372 U CN219163372 U CN 219163372U CN 202222636255 U CN202222636255 U CN 202222636255U CN 219163372 U CN219163372 U CN 219163372U
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lifting
exposure device
seat
wafer
frame
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程泽西
王利
周瑜
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Jimsi Semiconductor Technology Wuxi Co ltd
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GMC Semitech Co Ltd
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Abstract

本实用新型涉及一种晶圆曝光装置,尤其是一种晶圆边缘曝光装置,包括吸盘、曝光器和线性CCD,还包括:机架,曝光器和线性CCD均安装在机架上,且线性CCD位于曝光器的一侧;直线模组安装在机架上;移动座安装在直线模组的滑台上;旋转电机安装在移动座上,吸盘安装在旋转电机上,吸盘的轴线、直线模组的轴线和曝光器的轴线均在同一平面内,曝光器和线性CCD均与吸盘相对设置,线性CCD用于检测晶圆与吸盘的偏心距,直线模组用于移动以及补偿晶圆的偏心距。本实用新型提供的一种晶圆边缘曝光装置采用一个直线模组配合线性CCD实现晶圆移动的控制,减小了体积,并且降低了控制要求,实现的位置精度更高,结构更加紧凑。

Figure 202222636255

The utility model relates to a wafer exposure device, especially a wafer edge exposure device. The CCD is located on one side of the exposure device; the linear module is installed on the frame; the moving seat is installed on the slide table of the linear module; the rotating motor is installed on the moving seat, and the suction cup is installed on the rotating motor. The axis of the group and the axis of the exposure device are in the same plane. Both the exposure device and the linear CCD are set opposite to the suction cup. The linear CCD is used to detect the eccentricity between the wafer and the suction cup, and the linear module is used to move and compensate the eccentricity of the wafer. distance. The wafer edge exposure device provided by the utility model adopts a linear module and a linear CCD to control the movement of the wafer, which reduces the volume and control requirements, and achieves higher position accuracy and a more compact structure.

Figure 202222636255

Description

一种晶圆边缘曝光装置A wafer edge exposure device

技术领域technical field

本实用新型涉及一种晶圆曝光装置,尤其是一种晶圆边缘曝光装置。The utility model relates to a wafer exposure device, in particular to a wafer edge exposure device.

背景技术Background technique

晶圆的边缘需要通过紫外线曝光,通常形成环形的曝光。由于晶圆放置到吸盘上时,晶圆的中心与吸盘的中心不能重合,因此晶圆转动时需要根据晶圆当前的状态移动晶圆的位置,从而使曝光形成一个均匀的环形,保证曝光的尺寸。目前吸盘主要安装在十字形的直线模组上,实现X轴和Y轴的双向调节,进而保证晶圆的边缘与曝气器之间始终处于固定的位置,形成均匀的环形。十字形的直线模组厚度较大,导致整体体积较大,占用较多的空间,并且对控制要求较高,而由于累计误差两个直线模组降低了位置精度。The edge of the wafer needs to be exposed by UV light, usually forming a ring exposure. When the wafer is placed on the chuck, the center of the wafer cannot coincide with the center of the chuck. Therefore, when the wafer is rotated, the position of the wafer needs to be moved according to the current state of the wafer, so that the exposure forms a uniform ring and ensures the accuracy of the exposure. size. At present, the suction cup is mainly installed on the cross-shaped linear module to realize the two-way adjustment of the X-axis and the Y-axis, thereby ensuring that the edge of the wafer and the aerator are always in a fixed position, forming a uniform ring. The thickness of the cross-shaped linear module is relatively large, which leads to a larger overall volume, takes up more space, and has higher requirements for control, and the two linear modules reduce the position accuracy due to the accumulated error.

实用新型内容Utility model content

为解决上述问题,本实用新型提供一种采用当个直线模组,减小了体积、精度高的一种晶圆边缘曝光装置,具体技术方案为:In order to solve the above problems, the utility model provides a wafer edge exposure device with a reduced volume and high precision using a linear module. The specific technical solution is:

一种晶圆边缘曝光装置,包括吸盘、曝光器和线性CCD,还包括:机架,所述曝光器和所述线性CCD均安装在所述机架上,且所述线性CCD位于所述曝光器的一侧;直线模组,所述直线模组安装在所述机架上;移动座,所述移动座安装在所述直线模组的滑台上;旋转电机,所述旋转电机安装在所述移动座上,所述吸盘安装在所述旋转电机上,所述吸盘的轴线、所述直线模组的轴线和所述曝光器的轴线均在同一平面内,所述曝光器和所述线性CCD均与所述吸盘相对设置,所述线性CCD用于检测晶圆与吸盘的偏心距,所述直线模组用于移动以及补偿晶圆的偏心距。A wafer edge exposure device, including a suction cup, an exposure device and a linear CCD, and also includes: a frame, the exposure device and the linear CCD are installed on the frame, and the linear CCD is located on the exposure One side of the device; a linear module, the linear module is installed on the frame; a moving seat, the moving seat is installed on the slide table of the linear module; a rotating motor, the rotating motor is installed on the On the moving base, the suction cup is installed on the rotating motor, the axis of the suction cup, the axis of the linear module and the axis of the exposure device are all in the same plane, the exposure device and the The linear CCDs are arranged opposite to the suction cups, the linear CCDs are used to detect the eccentricity between the wafer and the suction cups, and the linear modules are used to move and compensate the eccentricity of the wafers.

优选的,还包括基板,所述基板安装在所述机架上,所述直线模组安装在所述基板的底部,所述移动座活动插在所述基板的移动槽内,所述旋转电机位于所述基板的顶部。Preferably, it also includes a base plate, the base plate is installed on the frame, the linear module is installed on the bottom of the base plate, the moving seat is movably inserted in the moving slot of the base plate, and the rotating motor located on top of the substrate.

优选的,还包括高度调节装置,所述高度调节装置包括:曝光座,所述曝光座固定在所述机架上;升降座,所述升降座滑动安装在所述曝光座上,所述曝光器安装在所述升降座上;微分头,所述微分头安装在所述曝光座上,且活动抵在所述升降座上,用于调整所述升降座的高度。Preferably, a height adjustment device is also included, and the height adjustment device includes: an exposure seat, the exposure seat is fixed on the frame; a lifting seat, the lifting seat is slidably installed on the exposure seat, and the exposure The differential head is installed on the exposure seat and moves against the lifting seat for adjusting the height of the lifting seat.

进一步的,还包括:连接座,所述连接座固定在所述升降座上;及耐磨杆,所述耐磨杆固定在所述连接座上,且抵在所述微分头上。Further, it also includes: a connection seat, the connection seat is fixed on the lifting seat; and a wear-resistant rod, the wear-resistant rod is fixed on the connection seat and abuts against the differential head.

优选的,还包括托举装置,所述托举装置包括:托举气缸,所述托举气缸安装在所述机架上;托举板,所述托举板安装在所述托举气缸上,所述托举板上设有托举槽,所述吸盘位于托举槽内;及托举杆,所述托举杆固定在所述托举板上,且沿所述托举槽设置,所述托举杆不少于三个,用于托举晶圆。Preferably, it also includes a lifting device, and the lifting device includes: a lifting cylinder, the lifting cylinder is installed on the frame; a lifting plate, the lifting plate is installed on the lifting cylinder , the lifting plate is provided with a lifting groove, the suction cup is located in the lifting groove; and a lifting rod, the lifting rod is fixed on the lifting plate and arranged along the lifting groove, There are no less than three lifting rods for lifting the wafer.

其中,还包括托举头,所述托举头安装在所述托举杆上,用于与晶圆接触。Wherein, a lifting head is also included, and the lifting head is installed on the lifting rod for contacting with the wafer.

进一步的,还包括托举传感器,所述托举传感器安装在所述托举板上,且与晶圆相对设置。Further, a lifting sensor is also included, and the lifting sensor is installed on the lifting plate and arranged opposite to the wafer.

优选的,还包括:前挡板,所述前挡板固定在所述机架的一端,所述前挡板上设有与所述吸盘相对设置的送料槽;后挡板,所述后挡板高度在所述机架的另一端,且与所述前挡板相对设置;侧挡板,所述侧挡板固定在所述机架的两侧;及顶挡板,所述顶挡板固定在所述机架的顶部。Preferably, it also includes: a front baffle, the front baffle is fixed at one end of the frame, and a feeding chute opposite to the suction cup is arranged on the front baffle; a rear baffle, the rear baffle the plate height is at the other end of the frame, and is arranged opposite to the front baffle; side baffles, the side baffles are fixed on both sides of the frame; and top baffles, the top baffles fixed to the top of the rack.

与现有技术相比本实用新型具有以下有益效果:Compared with the prior art, the utility model has the following beneficial effects:

本实用新型提供的一种晶圆边缘曝光装置采用一个直线模组配合线性CCD实现晶圆移动的控制,减小了体积,并且降低了控制要求,实现的位置精度更高,结构更加紧凑。The wafer edge exposure device provided by the utility model adopts a linear module and a linear CCD to control the movement of the wafer, which reduces the volume and control requirements, and achieves higher position accuracy and a more compact structure.

附图说明Description of drawings

图1是一种晶圆边缘曝光装置的结构示意图;Fig. 1 is a structural schematic diagram of a wafer edge exposure device;

图2是一种晶圆边缘曝光装置装有晶圆的结构示意图;Fig. 2 is a schematic structural view of a wafer edge exposure device equipped with a wafer;

图3是一种晶圆边缘曝光装置装有挡板的结构示意图;3 is a schematic structural view of a wafer edge exposure device equipped with a baffle;

图4是一种晶圆边缘曝光装置隐藏机架后的结构示意图;Fig. 4 is a schematic structural diagram of a wafer edge exposure device with a hidden rack;

图5是图4的正视图;Fig. 5 is the front view of Fig. 4;

图6是图4的俯视图;Fig. 6 is the plan view of Fig. 4;

图7是托举装置的结构示意图。Fig. 7 is a schematic structural view of the lifting device.

具体实施方式Detailed ways

现结合附图对本实用新型作进一步说明。Now in conjunction with accompanying drawing, the utility model is further described.

实施例一Embodiment one

如图1至图7所示,一种晶圆边缘曝光装置,包括吸盘3、曝光器6、线性CCD5、机架10、直线模组2、移动座22、旋转电机4和基板11。As shown in FIGS. 1 to 7 , a wafer edge exposure device includes a chuck 3 , an exposure device 6 , a linear CCD 5 , a frame 10 , a linear module 2 , a moving seat 22 , a rotary motor 4 and a substrate 11 .

机架10为矩形框架,基板11固定在机架10的内部,机架10的四周和顶部分别装有前挡板12、后挡板13、侧挡板14和顶挡板15,其中前挡板12上设有送料槽121。The frame 10 is a rectangular frame, and the base plate 11 is fixed inside the frame 10. Front baffles 12, rear baffles 13, side baffles 14 and top baffles 15 are respectively installed around and on the top of the frame 10, wherein the front baffles The plate 12 is provided with a feeding groove 121 .

直线模组2安装在基板11上,且位于基板11的底部,基板11上设有与直线模组2平行的移动槽111,且移动槽111对称位于直线模组2的两侧。移动座22固定在直线模组2的滑台21上,且穿过两个移动槽111。直线模组2位于基板11的下方,从而减少基板11上方的零件,工作区域更加整洁,便于清理,减少对晶圆的影响。The linear module 2 is installed on the base plate 11 and is located at the bottom of the base plate 11 . The base plate 11 is provided with moving grooves 111 parallel to the linear module 2 , and the moving grooves 111 are symmetrically located on both sides of the linear module 2 . The moving base 22 is fixed on the slide table 21 of the linear module 2 and passes through the two moving slots 111 . The linear module 2 is located below the substrate 11, thereby reducing the parts above the substrate 11, making the working area more tidy, easy to clean, and reducing the impact on the wafer.

旋转电机4安装在移动座22的顶部,旋转电机4的电机轴为空心轴,吸盘3固定在空心轴上,空心轴的底部与旋转接头41连接,旋转接头41与真空发生器连接,真空发生器用于产生真空,使吸盘3吸住晶圆。吸盘3还与送料槽121相对设置。The rotary motor 4 is installed on the top of the moving base 22, the motor shaft of the rotary motor 4 is a hollow shaft, the suction cup 3 is fixed on the hollow shaft, the bottom of the hollow shaft is connected with the rotary joint 41, and the rotary joint 41 is connected with the vacuum generator, and the vacuum is generated The device is used to generate vacuum to make the suction cup 3 suck the wafer. The suction cup 3 is also arranged opposite to the feeding chute 121 .

线性CCD5均安装在基板11的顶部,曝光器6安装在机架10或顶挡板15上,线性CCD5位于曝光器6的一侧。曝光器6的UV挡片通过挡片座安装在机架10上,且与曝光器6相对设置。The linear CCDs 5 are all mounted on the top of the substrate 11 , the exposure device 6 is mounted on the frame 10 or the top baffle 15 , and the linear CCDs 5 are located at one side of the exposure device 6 . The UV block of the exposure device 6 is installed on the frame 10 through the block seat, and is arranged opposite to the exposure device 6 .

吸盘3的轴线、直线模组2的轴线和曝光器6的轴线均在同一平面内,吸盘3的轴线与曝光器6的轴线相互平行,吸盘3的轴线和曝光器6的轴线还均与直线模组2的轴线垂直。曝光器6和线性CCD5均与吸盘3相对设置,线性CCD5用于检测晶圆与吸盘3的偏心距,直线模组2用于移动以及补偿晶圆的偏心距。The axis of the suction cup 3, the axis of the linear module 2 and the axis of the exposure device 6 are all in the same plane, the axis of the suction cup 3 and the axis of the exposure device 6 are parallel to each other, and the axis of the suction cup 3 and the axis of the exposure device 6 are also aligned with the straight line The axis of module 2 is vertical. Both the exposure device 6 and the linear CCD 5 are arranged opposite to the chuck 3 , the linear CCD 5 is used to detect the eccentricity between the wafer and the chuck 3 , and the linear module 2 is used to move and compensate the eccentricity of the wafer.

工作时,机械手先将晶圆放置到吸盘3上,吸盘3吸住晶圆,然后直线模组2带动吸盘3和晶圆向线性CCD5移动,移动到检测原点后旋转电机4带动晶圆转动一周,线性CCD5采集晶圆的边缘数据,同时系统记录吸盘3的转动角度,然后根据晶圆的定位缺口将晶圆的边缘数据与吸盘3的转动角度一一对应,根据得到的数据计算晶圆的偏心距,然后根据吸盘3角度对应的偏心距调整直线模组2,从而使晶圆转动时,晶圆的中心与曝光器6之间的距离保持一致,最终得到的曝光环的轴线与晶圆同轴线重合。由于只采用一个直线模组2,方便控制,提高了控制的精度,并且结构更加紧凑,减小了体积,还降低了成本。When working, the manipulator first places the wafer on the suction cup 3, the suction cup 3 holds the wafer, and then the linear module 2 drives the suction cup 3 and the wafer to move to the linear CCD5, and after moving to the detection origin, the rotary motor 4 drives the wafer to rotate for a circle , the linear CCD5 collects the edge data of the wafer, and the system records the rotation angle of the chuck 3 at the same time. eccentricity, and then adjust the linear module 2 according to the eccentricity corresponding to the angle of the chuck 3, so that when the wafer rotates, the distance between the center of the wafer and the exposure device 6 is kept consistent, and the axis of the final exposure ring is consistent with the wafer The coaxial lines coincide. Since only one linear module 2 is used, the control is convenient, the control precision is improved, the structure is more compact, the volume is reduced, and the cost is also reduced.

实施例二Embodiment two

如图1至图7所示,在上述实施例一的基础上,还包括高度调节装置,高度调节装置包括曝光座61、升降座63、微分头64、连接座65和耐磨杆66。曝光座61固定在机架10上;升降座63通过直线导轨副滑动安装在曝光座61上,曝光器6安装在升降座63上;微分头64安装在曝光座61上,连接座65固定在升降座63上,耐磨杆66固定在连接座65上,且抵在微分头64上,微分头64与耐磨杆66一起用于调整升降座63的高度,进而实现曝光器6的高度调节。微分头64的调节精度高。As shown in FIGS. 1 to 7 , on the basis of the first embodiment above, a height adjustment device is also included. The height adjustment device includes an exposure seat 61 , an elevating seat 63 , a differential head 64 , a connecting seat 65 and a wear-resistant rod 66 . The exposure seat 61 is fixed on the frame 10; the lifting seat 63 is slidably installed on the exposure seat 61 through the linear guide rail pair, and the exposure device 6 is installed on the lifting seat 63; the differential head 64 is installed on the exposure seat 61, and the connecting seat 65 is fixed on On the lifting seat 63, the wear-resistant rod 66 is fixed on the connecting seat 65, and is against the differential head 64. The differential head 64 and the wear-resistant rod 66 are used to adjust the height of the lifting seat 63, thereby realizing the height adjustment of the exposure device 6 . The adjustment precision of the differential head 64 is high.

实施例三Embodiment three

如图1至图7所示,在上述任一项实施例的基础上,还包括托举装置,托举装置包括托举气缸71、托举板72、托举头74和托举传感器75。托举气缸71为双轴气缸,结构简单,托举气缸71安装在基板11的顶部,且位于直线模组2的一端。托举板72安装在托举气缸71的活塞杆上,托举板72上设有U形的托举槽721,吸盘3活动位于托举槽721内。托举杆73环形阵列设有三个,且均通过螺纹固定在托举板72上,并且沿托举槽721设置,托举头74固定在托举杆73上,采用PEEK材料制成,能够保护晶圆,而托举板72可以调整托举头74的高度。托举传感器75安装在托举板72上,且与晶圆相对设置。托举装置用于机械手抓取晶圆,可以实现同时上料和下料,提高效率。As shown in FIGS. 1 to 7 , on the basis of any one of the above embodiments, a lifting device is also included, and the lifting device includes a lifting cylinder 71 , a lifting plate 72 , a lifting head 74 and a lifting sensor 75 . The lifting cylinder 71 is a biaxial cylinder with a simple structure. The lifting cylinder 71 is installed on the top of the base plate 11 and located at one end of the linear module 2 . The lifting plate 72 is installed on the piston rod of the lifting cylinder 71, the lifting plate 72 is provided with a U-shaped lifting groove 721, and the suction cup 3 is movable in the lifting groove 721. There are three lifting rods 73 in an annular array, all of which are screwed on the lifting plate 72 and arranged along the lifting groove 721. The lifting head 74 is fixed on the lifting rod 73 and is made of PEEK material, which can protect the wafer, and the lifting plate 72 can adjust the height of the lifting head 74 . The lifting sensor 75 is installed on the lifting plate 72 and is set opposite to the wafer. The lifting device is used for the robot to grab the wafer, which can realize simultaneous loading and unloading and improve efficiency.

以上结合具体实施例描述了本实用新型的技术原理。这些描述只是为了解释本实用新型的原理,而不能以任何方式解释为对本实用新型保护范围的限制。基于此处的解释,本领域的技术人员不需要付出创造性的劳动即可联想到本实用新型的其它具体实施方式,这些方式都将落入本实用新型权利要求的保护范围之内。The technical principles of the present utility model have been described above in conjunction with specific embodiments. These descriptions are only for explaining the principle of the utility model, and cannot be construed as limiting the protection scope of the utility model in any way. Based on the explanations here, those skilled in the art can think of other specific implementations of the utility model without creative work, and these modes will all fall within the protection scope of the claims of the utility model.

Claims (8)

1.一种晶圆边缘曝光装置,包括吸盘(3)、曝光器(6)和线性CCD(5),其特征在于,还包括:1. A wafer edge exposure device, comprising a suction cup (3), an exposure device (6) and a linear CCD (5), is characterized in that, also includes: 机架(10),所述曝光器(6)和所述线性CCD(5)均安装在所述机架(10)上,且所述线性CCD(5)位于所述曝光器(6)的一侧;Frame (10), the exposure device (6) and the linear CCD (5) are installed on the frame (10), and the linear CCD (5) is located at the exposure device (6) side; 直线模组(2),所述直线模组(2)安装在所述机架(10)上;A linear module (2), the linear module (2) is installed on the frame (10); 移动座(22),所述移动座(22)安装在所述直线模组(2)的滑台(21)上;及a moving seat (22), the moving seat (22) is installed on the slide table (21) of the linear module (2); and 旋转电机(4),所述旋转电机(4)安装在所述移动座(22)上,所述吸盘(3)安装在所述旋转电机(4)上,所述吸盘(3)的轴线、所述直线模组(2)的轴线和所述曝光器(6)的轴线均在同一平面内,所述曝光器(6)和所述线性CCD(5)均与所述吸盘(3)相对设置,所述线性CCD(5)用于检测晶圆与吸盘(3)的偏心距,所述直线模组(2)用于移动以及补偿晶圆的偏心距。Rotating motor (4), described rotating motor (4) is installed on the described moving seat (22), and described sucker (3) is installed on the described rotating motor (4), and the axis of described sucker (3), The axis of the linear module (2) and the axis of the exposure device (6) are all in the same plane, and the exposure device (6) and the linear CCD (5) are both opposite to the suction cup (3) The linear CCD (5) is used to detect the eccentricity between the wafer and the chuck (3), and the linear module (2) is used to move and compensate the eccentricity of the wafer. 2.根据权利要求1所述的一种晶圆边缘曝光装置,其特征在于,还包括基板(11),所述基板(11)安装在所述机架(10)上,所述直线模组(2)安装在所述基板(11)的底部,所述移动座(22)活动插在所述基板(11)的移动槽(111)内,所述旋转电机(4)位于所述基板(11)的顶部。2. A wafer edge exposure device according to claim 1, further comprising a substrate (11), the substrate (11) being installed on the frame (10), and the linear module (2) installed on the bottom of the base plate (11), the moving seat (22) is movably inserted in the moving groove (111) of the base plate (11), and the rotating motor (4) is located on the base plate ( 11) Top. 3.根据权利要求1所述的一种晶圆边缘曝光装置,其特征在于,还包括高度调节装置,所述高度调节装置包括:3. a kind of wafer edge exposure device according to claim 1, is characterized in that, also comprises height adjustment device, and described height adjustment device comprises: 曝光座(61),所述曝光座(61)固定在所述机架(10)上;an exposure seat (61), the exposure seat (61) is fixed on the frame (10); 升降座(63),所述升降座(63)滑动安装在所述曝光座(61)上,所述曝光器(6)安装在所述升降座(63)上;Lifting seat (63), the lifting seat (63) is slidably installed on the exposure seat (61), and the exposure device (6) is installed on the lifting seat (63); 微分头(64),所述微分头(64)安装在所述曝光座(61)上,且活动抵在所述升降座(63)上,用于调整所述升降座(63)的高度。A differential head (64), the differential head (64) is installed on the exposure seat (61), and moves against the lifting seat (63), for adjusting the height of the lifting seat (63). 4.根据权利要求3所述的一种晶圆边缘曝光装置,其特征在于,还包括:4. A kind of wafer edge exposure device according to claim 3, is characterized in that, also comprises: 连接座(65),所述连接座(65)固定在所述升降座(63)上;及A connecting seat (65), the connecting seat (65) is fixed on the lifting seat (63); and 耐磨杆(66),所述耐磨杆(66)固定在所述连接座(65)上,且抵在所述微分头(64)上。A wear-resistant rod (66), the wear-resistant rod (66) is fixed on the connecting seat (65) and abuts against the differential head (64). 5.根据权利要求1至4任一项所述的一种晶圆边缘曝光装置,其特征在于,还包括托举装置,所述托举装置包括:5. A wafer edge exposure device according to any one of claims 1 to 4, further comprising a lifting device, the lifting device comprising: 托举气缸(71),所述托举气缸(71)安装在所述机架(10)上;Lifting the cylinder (71), the lifting cylinder (71) is installed on the frame (10); 托举板(72),所述托举板(72)安装在所述托举气缸(71)上,所述托举板(72)上设有托举槽(721),所述吸盘(3)位于托举槽(721)内;及Lifting plate (72), described lifting plate (72) is installed on the described lifting cylinder (71), and described lifting plate (72) is provided with lifting groove (721), and described suction cup (3 ) is located in the lifting channel (721); and 托举杆(73),所述托举杆(73)固定在所述托举板(72)上,且沿所述托举槽(721)设置,所述托举杆(73)不少于三个,用于托举晶圆。Lifting rod (73), the lifting rod (73) is fixed on the lifting plate (72), and arranged along the lifting groove (721), the lifting rod (73) is not less than Three, used to lift the wafer. 6.根据权利要求5所述的一种晶圆边缘曝光装置,其特征在于,还包括托举头(74),所述托举头(74)安装在所述托举杆(73)上,用于与晶圆接触。6. A wafer edge exposure device according to claim 5, further comprising a lifting head (74), the lifting head (74) being installed on the lifting rod (73), Used to make contact with the wafer. 7.根据权利要求5所述的一种晶圆边缘曝光装置,其特征在于,还包括托举传感器(75),所述托举传感器(75)安装在所述托举板(72)上,且与晶圆相对设置。7. A wafer edge exposure device according to claim 5, further comprising a lifting sensor (75), the lifting sensor (75) being installed on the lifting plate (72), And set opposite to the wafer. 8.根据权利要求1至4任一项所述的一种晶圆边缘曝光装置,其特征在于,还包括:8. A wafer edge exposure device according to any one of claims 1 to 4, further comprising: 前挡板(12),所述前挡板(12)固定在所述机架(10)的一端,所述前挡板(12)上设有与所述吸盘(3)相对设置的送料槽(121);A front baffle (12), the front baffle (12) is fixed on one end of the frame (10), and the front baffle (12) is provided with a feeding chute opposite to the suction cup (3) (121); 后挡板(13),所述后挡板(13)高度在所述机架(10)的另一端,且与所述前挡板(12)相对设置;a rear baffle (13), the height of the rear baffle (13) is at the other end of the frame (10), and is arranged opposite to the front baffle (12); 侧挡板(14),所述侧挡板(14)固定在所述机架(10)的两侧;及side baffles (14), the side baffles (14) are fixed on both sides of the frame (10); and 顶挡板(15),所述顶挡板(15)固定在所述机架(10)的顶部。A top baffle (15), the top baffle (15) is fixed on the top of the frame (10).
CN202222636255.XU 2022-10-08 2022-10-08 Wafer edge exposure device Active CN219163372U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118588534A (en) * 2024-08-06 2024-09-03 宁波润华全芯微电子设备有限公司 Wafer edge exposure device and control method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118588534A (en) * 2024-08-06 2024-09-03 宁波润华全芯微电子设备有限公司 Wafer edge exposure device and control method thereof

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