CN218824020U

CN218824020U - Novel multipurpose scanning electron microscope sample stage

Info

Publication number: CN218824020U
Application number: CN202222212704.8U
Authority: CN
Inventors: 张亚梦; 陈汝钊; 张敏; 习位; 董姗姗; 郭瑞琪
Original assignee: Tianjin University of Technology
Current assignee: Tianjin University of Technology
Priority date: 2022-08-22
Filing date: 2022-08-22
Publication date: 2023-04-07
Anticipated expiration: 2032-08-22

Abstract

The utility model relates to a novel detecting instrument technical field especially relates to a novel multipurpose scanning electron microscope sample platform, include: the sample stage matching base is provided with a multifunctional sample groove and is fixedly connected with a scanning electron microscope original sample stage; the miniature sample stage consists of small sample stages with different heights and sizes, and the miniature sample stage can be embedded into a groove of a matching base of the sample stage; inserting holes of the sample table; the outer wall of the sample platform jack is provided with a thread matched with the sample platform matching base. The utility model discloses aim at solving when facing block material, especially magnetism contains magnetic block material, need not the conducting resin regulation, can directly pass through the bolt direct fastening through the outer wall jack of sample platform, reaches the centre gripping and saves the purpose of conducting resin, reduces environmental pollution. Furthermore, the utility model discloses can also adjust the lifting screw and reach the best height of research sample, promote work efficiency.

Description

Novel multipurpose scanning electron microscope sample stage

Technical Field

The utility model relates to a novel detecting instrument technical field specifically is a novel multipurpose scanning electron microscope sample platform.

Background

Scanning electron microscopy is an important link to the understanding of the micro-world of materials from the micro-to the nano-scale. Scanning electron microscopes are now widely used in materials, chemical engineering, construction, medical and biological applications. And different analysis type additional equipment is arranged, so that the purpose of analyzing the microscopic morphology of the material and the composition of the substance micro-area can be simultaneously realized.

Multipurpose scanning electron microscope sample platform among the prior art has the problem: in the aspect of block materials, particularly magnetic block materials, the existing scanning electron microscope sample stage has great use defects, for example, the sample stage needs to be fixed by a conductive adhesive tape, the used adhesive tape cannot be reused, and environmental pollution is caused after the sample stage is discarded; secondly, the sample is fixed by using the conductive adhesive, so that the sample is inconvenient to disassemble; when a plurality of samples are different in height, the samples are injected simultaneously, the optimal working distance of the samples cannot be uniformly fixed, and the picture shooting quality is influenced; when facing to the magnetic block material, the conductive adhesive can not be fixed firmly, and the pole shoe of the electron microscope faces risks; the traditional sample table has single function, and when a section test and a plurality of block or powder samples are required, a special section sample table needs to be replaced, the simultaneous sample injection test cannot be performed, and separate sample injection is required, so that the cost of test time is increased and energy is wasted.

Many novel detecting instrument exist certain problem at present, and traditional sample platform is smaller simultaneously, and the sample quantity that can load is less, frequently gets the lofting, causes the energy and the waste in time. Therefore, a novel multipurpose scanning electron microscope sample stage is provided for solving the problems.

The utility model has the following contents:

in order to overcome the defects of the prior art, the utility model aims to provide a novel multipurpose scanning electron microscope sample stage, which aims to solve the problems of the prior art that the function of the traditional sample stage is single, the special cross-section sample stage is needed to be replaced when the cross-section test and a plurality of block or powder samples are needed, the sample cannot be introduced simultaneously, the sample needs to be introduced respectively, and the cost of the test time is increased and the energy is wasted.

In order to solve the above problem, the utility model discloses the technical scheme who adopts as follows: a novel multipurpose scanning electron microscope sample stage comprises: the sample stage is matched with the base, a multifunctional sample groove is formed in the sample stage matching base, and the sample stage matching base is fixedly connected with an original sample stage of a scanning electron microscope. The miniature sample platform, miniature sample platform comprises the small sample platform of co-altitude not and not unidimensional, just miniature sample platform embeddable connection be in the recess of sample platform matching base. The sample platform jack, the outer wall of sample platform jack is equipped with and matches the screw thread of base assorted with the sample platform.

Therefore, the utility model discloses possess following beneficial effect:

the further scheme is that the connecting parts of the small sample platforms are provided with second thread structures of the first thread structures, and the purpose of adjusting the sample platforms to ascend and descend can be achieved by adjusting the liftable screws.

Therefore, the miniature sample stage is matched with the sample stage jack for use, the miniature sample stage is fixed without conductive adhesive facing block materials with different heights and block materials containing magnetism, and meanwhile, the miniature sample stage can be used as a section stage, and the purpose of quickly disassembling and installing the block materials and the section samples can be achieved.

In a further scheme, the sample platform jacks are arranged at intervals.

Therefore, the positions of the samples can be accurately adjusted by arranging the sample platform jacks at intervals.

The sample platform is characterized in that the sample platform matching base is provided with a fixing groove for fixing the sample fastening baffle, the sample fastening baffle is detachably arranged in the fixing groove, and the fastening baffle is embedded in the fixing groove and connected with the fixing groove.

Therefore, the fastening baffle can be used as a cross-section sample table, and secondly, under the condition that a block sample is small, the length of the fastening bolt can be shortened by adding the baffle, so that the sample is ensured to be positioned at the center of the sample table, and the sample table is attractive.

According to a further scheme, a plurality of fixing holes with threads are formed in the periphery of the side face of the sample platform matching base respectively, and screws are matched in the plurality of fixing holes.

Therefore, the periphery of the side face of the matching base is respectively provided with a plurality of fixing holes with threads, so that samples can be fixed from different angles.

According to a further scheme, the sample platform matching base is a cylindrical base, and a plurality of through holes penetrating through the bottom are formed in the bottom of the sample platform matching base.

Therefore, the height of the sample platform can be adjusted more flexibly by matching the sample platform with the through hole at the bottom of the base.

According to a further scheme, the miniature sample stage is detachably mounted, and the miniature sample stage can be hidden in a fixing hole in the multifunctional sample groove.

Therefore, the micro sample stage is detachably mounted in the internal fixing hole of the multifunctional sample groove, can be conveniently taken out when in use, and can be matched with sample stages of relevant specifications at will, so that the purpose of wide compatibility is achieved.

Still further, the micro-scale sample is made of a high strength aluminum alloy.

It can be seen that the micro-scale sample is made of a high strength aluminum alloy, which has the advantage of being less susceptible to damage when used multiple times.

Drawings

Fig. 1 is the structural schematic diagram of a novel multipurpose scanning electron microscope sample stage of the utility model.

Fig. 2 is the side structure schematic diagram of a novel multipurpose scanning electron microscope sample stage of the utility model.

The reference numbers illustrate: a sample stage matching base 100; a lateral sample holding hole 200; a sample stage receptacle 300; a sample securing baffle 400; a micro sample stage 500; a multifunctional sample cell 600; the sample well perimeter edge 700; a fixing hole 800; the screw 900 may be raised and lowered.

Detailed Description

The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, rather than all embodiments, and all other embodiments obtained on the premise that creative work is not made by those skilled in the art based on the embodiments of the present invention belong to the protection scope of the present invention.

Referring to fig. 1-2, the present invention provides a technical solution:

as shown in fig. 1, the utility model discloses preferred embodiment's a novel multipurpose scanning electron microscope sample platform, it includes, the sample platform matches base 100, and the sample platform matches and is equipped with multi-functional sample cell 600 and sample platform jack 300 on the base 100, and multi-functional sample cell 600 is a cuboid recess, and multi-functional sample cell 600 passes through thread tightening, can reach the purpose of adjusting the sample platform through liftable screw 900 and go up and down.

Therefore, the utility model provides a multipurpose scanning electron microscope sample platform can be through the mode of embedding to miniature sample platform 500 install sample platform jack 300, sample fastening baffle 400 can take out and install sample platform matching base 100 from multi-functional sample groove 600, sample platform jack 300, its jack unanimous with former electron microscope sample platform size specification, the function is unanimous with the sample platform, through using with multi-functional sample groove 600 cooperation, the sample quantity that can load is more, reduce the number of times of getting the put sample, promote work efficiency.

Further, the connecting portion of little sample platform be equipped with first helicitic texture's second helicitic texture, can reach the purpose of adjusting sample platform lift through rotatory liftable screw 900, miniature sample platform 500 can match the use with fastening baffle 400, block material and the block material that contains magnetism that is different in the face of height need not the conducting resin fixed, fastening baffle 400 can use as the cross-section platform simultaneously, under the less condition in the face of the block sample, add the baffle and can shorten fastening bolt's length, can guarantee that the sample is in sample platform central point and put.

Further, a plurality of sample stage insertion holes 300 are arranged at intervals, so that the sample position can be adjusted from more angles.

Further, the sample platform matches and is equipped with the fixed slot of fixed mounting sample fastening baffle 400 on the base 100, and sample fastening baffle 400 demountable installation can be in the fixed slot, can make fastening baffle 400 accomodate like this, and it is more convenient to use scanning electron microscope sample platform.

Furthermore, the peripheral edges of the surface of the sample stage matching base 100 are respectively provided with a threaded transverse sample fixing hole 800, so that a sample can be fixed.

Further, a plurality of fixing holes 800 with threads are respectively formed in the periphery of the side face of the sample stage matching base 100, and screws are matched in the plurality of fixing holes 800.

Further, the shape of the sample stage matching base 100 is a cylindrical base, and the bottom of the sample stage matching base 100 is provided with a plurality of through holes penetrating through the bottom.

Further, miniature sample platform 500 is demountable installation, and miniature sample platform 500 can hide the fixed orifices of installing in the inside of multi-functional sample groove 600, and the hidden installation of miniature sample platform 500 can make multipurpose scanning electron microscope sample platform use more convenient.

Further, the detachable sample-fastening flap 400 is made of a high-strength aluminum alloy, which makes the fastening flap 400 more durable.

Specifically, the multipurpose scanning electron microscope sample stage of the thermal printer of this embodiment includes: sample stage matching base 100, micro sample stage 500 and sample stage receptacle 300. The thin column at the lower part of the disc of the micro sample table 500 is provided with a thread 900, and the micro sample table 500 and the sample table matching base 100 can be in threaded connection. The liftable micro sample stage 500 is composed of small sample stages of different heights and sizes. As shown in fig. 2, the down-set micro sample stage 500 is hidden in 6 fixing holes. The multifunctional sample tank 600 is a cuboid groove, and the sample fastening baffle 400 is a detachable baffle of a cuboid shape made of high-strength aluminum alloy. In the multifunctional sample groove 600, through the matched fastening bolt, a conductive adhesive tape is not needed, the block sample with smaller volume can be directly fastened, and a plurality of samples can be loaded simultaneously according to the actual conditions of the size of the sample, so that the purposes of saving time and energy are achieved. The utility model has a certain popularization value.

The utility model discloses work flow: miniature sample platform 500 and sample platform jack 300 screwed connection, sample platform matching base 100 can design according to the specification of different sample platforms during the use, can not influence the original function of whole multi-functional sample groove 600, and is nimble changeable, and sample platform matching base 100 can match base 100 according to the scanning electron microscope design of different models to reach the mesh of matching the polytypic electron microscope.

The detachable sample fastening baffle is then removed from the multifunctional sample tank 600, the magnetic material sample with the smaller volume of the block sample is placed on the fastening baffle 400, and the sample is fixed by the matched fastening bolt. For samples with different sizes, the liftable screws 900 can be adjusted to enable the samples to achieve the purpose of uniform working distance. The invention can make the multipurpose scanning electron microscope sample stage more convenient to use and has certain popularization value. Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

It should be noted that, in the description of the present invention, if the orientation or the positional relationship indicated by the orientation description, such as up, down, front, back, left, right, etc., is referred to the orientation or the positional relationship shown in the drawings, it is only for the convenience of description of the present invention and simplification of description, but not for the purpose of indicating or implying that the indicated device or element must have a specific orientation, be constructed or operated in a specific orientation, and should not be interpreted as limiting the present invention.

In the description of the present invention, a plurality of means are one or more, a plurality of means are two or more, and the terms greater than, less than, exceeding, etc. are understood as not including the present number, and the terms greater than, less than, within, etc. are understood as including the present number. The description to first or second etc. is for the purpose of distinguishing between technical features and is not to be construed as indicating or implying a relative importance or implying a number of indicated technical features or implying a precedence relationship between indicated technical features.

In the description of the present invention, unless there is an explicit limitation, the words such as setting, installation, connection, etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in combination with the specific contents of the technical solution.

The above embodiments are only preferred embodiments of the present invention, and the protection scope of the present invention cannot be limited thereby, and any insubstantial changes and substitutions made by those skilled in the art on the basis of the present invention are all within the protection scope of the present invention.

Claims

1. The utility model provides a novel multipurpose scanning electron microscope sample platform which characterized in that includes:

the sample platform matching base is provided with a plurality of multifunctional sample grooves for fixedly connecting the miniature sample platform, and each multifunctional sample groove is provided with a sample platform jack;

miniature sample platform includes a plurality of small sample platforms, and is a plurality of small sample platform has a connecting portion, the inner wall of sample platform jack be equipped with the first helicitic texture of connecting portion assorted of small sample platform, it is a plurality of small sample platform is in through its connecting portion threaded connection the sample platform matches the base.

2. The novel multipurpose scanning electron microscope sample stage according to claim 1, characterized in that:

a plurality of the connecting portion of little sample platform be equipped with first helicitic texture's second helicitic texture can reach the purpose of adjusting sample platform and go up and down through adjusting liftable screw.

3. The novel multipurpose scanning electron microscope sample stage according to claim 1, characterized in that:

the sample platform jacks are arranged at intervals.

4. The novel multipurpose scanning electron microscope sample stage according to claim 1, characterized in that: still include a sample fastening baffle, be equipped with fixed mounting on the sample platform matches the base the fixed slot of sample fastening baffle, sample fastening baffle demountable installation is in the fixed slot, just fastening baffle is connected with the fixed slot embedding.

5. The novel multipurpose scanning electron microscope sample stage according to claim 1, characterized in that:

the periphery of the surface of the sample table matching base is provided with transverse sample fixing holes with threads respectively.

6. The novel multipurpose scanning electron microscope sample stage according to any one of claims 1 to 5, wherein: sample platform matches base side and is equipped with a plurality of screwed fixed orificess all around respectively, and the cooperation has the screw in a plurality of fixed orificess.

7. The novel multipurpose scanning electron microscope sample stage according to any one of claims 1 to 5, wherein: the sample platform matching base is cylindrical, and a plurality of through holes penetrating through the bottom are formed in the bottom of the sample platform matching base.

8. A novel multi-purpose scanning electron microscope sample stage as claimed in any one of claims 1 to 5, characterized in that: the miniature sample platform is demountable installation, just the miniature sample platform can hide the fixed orifices of installing in the inside of multi-functional sample groove.

9. The novel multipurpose scanning electron microscope sample stage of claim 8, wherein: the miniature sample stage is made of high-strength aluminum alloy.