CN217879243U - Sample analyzer - Google Patents

Abstract

The application provides a sample analyzer, relates to medical instrument technical field. The sample feeding mechanism is used for placing samples, the equipment main body is used for sampling and detecting the samples, and the equipment main body comprises a first detection module and a second detection module which are used for detecting the samples; the display device is provided on the device body. In the sample conveying mechanism, a shell is provided with a sample loading area, a sample unloading area and a sampling area which is communicated with the sample loading area and the sample unloading area, and a sample in the sample loading area is conveyed to the sample unloading area after passing through the sampling area; the sample unloading conveying assembly is arranged corresponding to the sample unloading area and used for dragging and collecting samples in the sample unloading area. The casing in this application sets up three district, is sample loading district, sample unloading district and sampling area respectively, and the sample can be followed sample loading district and passed through the sampling area and reach sample unloading district. Under the effect of the lower sample conveying assembly which is correspondingly arranged with the lower sample area, the sample can be dragged and collected in the lower sample area, so that the automatic sample discharging of the sample is completed, and the detection efficiency is improved.

Description

Sample analyzer

Technical Field

The application relates to the technical field of medical equipment, in particular to a sample analyzer.

Background

With the wide application of sample analyzers, in the prior art, when providing samples for the sample analyzer, because the sample design of getting off is reasonable inadequately or directly the manual work gets off, and then leads to sample detection inefficiency.

SUMMERY OF THE UTILITY MODEL

An aspect of an embodiment of the present application provides a sample analyzer, including:

send a kind mechanism for place the sample, send a kind mechanism to include:

the sample processing device comprises a shell, a sample loading area, a sample unloading area and a sampling area, wherein the sampling area is communicated with the sample loading area and the sample unloading area;

the sample unloading conveying assembly is arranged corresponding to the sample unloading area and used for dragging and collecting the samples in the sampling area in the sample unloading area;

the device comprises a device body, a sampling area and a detection area, wherein the device body is used for sampling samples in the sampling area and detecting the samples, and comprises a first detection module and a second detection module, the first detection module is used for carrying out first purpose detection on the samples, and the second detection module is used for carrying out second purpose detection on the samples; and

a display device disposed on the device body.

An aspect of an embodiment of the present application provides a sample analyzer, including:

the sample processing device comprises a shell, a sample loading area, a sample unloading area and a sampling area, wherein the sampling area is communicated with the sample loading area and the sample unloading area;

the sample unloading conveying assembly is arranged corresponding to the sample unloading area and used for dragging and collecting the samples in the sampling area in the sample unloading area;

the sample unloading in-place detection part is arranged corresponding to the sample unloading area, the sample unloading in-place detection part is provided with a detection range for detecting a sample, the sample unloading conveying assembly is used for dragging the sample to one side of the sample unloading in-place detection part so as to collect the sample to the detection range, the sample unloading conveying assembly resets in response to the sample being located in the detection range, and the sample unloading in-place detection part pushes the sample to the outside of the detection range in response to the sample unloading conveying assembly resetting; and

the device comprises a device body, a sampling area and a detection area, wherein the device body is used for sampling samples in the sampling area and detecting the samples, and comprises a first detection module and a second detection module, the first detection module is used for carrying out first purpose detection on the samples, and the second detection module is used for carrying out second purpose detection on the samples; and

a display device disposed on the device body.

An aspect of an embodiment of the present application provides a sample analyzer, including:

send a kind mechanism for place the sample, send a kind mechanism to include:

the sample processing device comprises a shell, a sample loading area, a sample unloading area and a sampling area, wherein the sampling area is communicated with the sample loading area and the sample unloading area;

the sample unloading conveying assembly is arranged corresponding to the sample unloading area and comprises a sample unloading conveyor belt which is used for dragging and collecting samples in the sampling area;

the device comprises a device body and a sampling area, wherein the device body is used for sampling a sample in the sampling area and detecting the sample and comprises a first detection module and a second detection module, the first detection module is used for carrying out first purpose detection on the sample, and the second detection module is used for carrying out second purpose detection on the sample; and

a display device disposed on the device body.

The casing in this application sets up three district, is sample loading district, sample unloading district and sampling area respectively, and the sample can be followed sample loading district and passed through the sampling area and reach sample unloading district. Under the effect of the sample unloading conveying assembly correspondingly arranged with the sample unloading area, the sample can be dragged and collected in the sample unloading area, so that automatic sample unloading of the sample is completed, and the detection efficiency is improved.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

FIG. 1 is a schematic diagram of a sample analyzer according to an embodiment of the present application;

FIG. 2 is a schematic diagram of a sample storage structure according to an embodiment of the present application;

FIG. 3 is an exploded view of the sample presentation mechanism of the embodiment of the present application shown in FIG. 1;

FIG. 4 is a schematic structural diagram of the load bearing housing of the embodiment of FIG. 3 of the present application;

FIG. 5 is a schematic structural view of the lower sample-in-place detecting member in the embodiment shown in FIG. 4;

FIG. 6 is a schematic view of the sample loading transport assembly of the embodiment of FIG. 3;

FIG. 7 is a cross-sectional view of the sample loading transport assembly on line VII-VII in the embodiment of FIG. 6,

FIG. 8 is a schematic view of the embodiment of FIG. 3 showing the engagement of the delivery device and the carrier housing;

FIG. 9 is a schematic view of the matched structure of the sample loading and conveying assembly, the sample unloading and conveying assembly and the bearing shell in the embodiment shown in FIG. 8;

FIG. 10 is a schematic view of the sample transport assembly of the embodiment of FIG. 3;

FIG. 11 is a schematic view of a portion of the sample transport assembly of the embodiment of FIG. 10;

FIG. 12 is a schematic view of the sample loading transport assembly of the embodiment of FIG. 3;

FIG. 13 is a cross-sectional view of the sample collection transport assembly on line XI-XI in the embodiment of FIG. 12.

Detailed Description

The present application will be described in further detail with reference to the following drawings and examples. It is to be noted that the following examples are only illustrative of the present application, and do not limit the scope of the present application. Likewise, the following examples are only some examples and not all examples of the present application, and all other examples obtained by a person of ordinary skill in the art without any inventive work are within the scope of the present application.

Reference in the specification to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the specification. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.

The present application describes a sample analyzer. The sample analyzer can be used for data analysis of biological samples such as blood, urine and the like. Referring to fig. 1, fig. 1 is a schematic structural diagram of a sample analyzer according to an embodiment of the present application. The sample analyzer 100 may include an apparatus body 200 for detecting a sample, a display apparatus 300 mounted on the apparatus body 200, and a sample presentation mechanism 400 for placing a sample. The sample feeding mechanism 400 may be used to place a sample collected by a user, or may be used to place a sample after detection. The sample presentation mechanism 400 may be mounted on the apparatus body 200 to deliver the sample to the sampling position so that the apparatus body 200 performs sampling inspection at the sampling position. The apparatus body 200 may sample at a sampling position, and then perform detection and data analysis on the sample through a reaction detection assembly, an optical detection assembly, and the like to generate a detection result. The display device 300 is used for inputting a control command to the device main body 200, controlling various processes of the device main body 200, such as a sampling process, a reaction process, a detection process, a result display process, and the like, and may also be used for displaying operation data and a detection result of the device main body 200, and even may also be used for controlling the sample feeding mechanism 400 to complete a sample loading operation.

It should be understood that the main body 200 is provided with a processor for controlling the processes of the main body 200, such as the sampling process, the reaction process, the detection process, and the result display process, to be smoothly performed, and for receiving the control command input from the display device 300 and controlling the processes of the main body 200 according to the control command, and the processor may control the sample loading operation, the sample transferring operation, and the sample unloading operation of the sample feeding mechanism 400, and may be performed under the control command input from the display device 300.

In addition, in the description of the present application, it should be noted that unless otherwise explicitly stated or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; the connection can be mechanical connection, electrical connection, pipeline connection, liquid path connection and the like; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms herein can be understood in a specific context to one of ordinary skill in the art.

1 or more detection modules may be provided in the apparatus body 200 so as to detect the samples based on their respective purposes. For example, in some scenarios, a detection module, such as a first detection module, may be used to detect a sample for a first purpose of routine blood detection. In some scenarios, the second detection module is used to detect the sample for a second purpose that is the detection of the specific protein. In some scenarios, a detection module, such as a third detection module, is used for detection for purposes of blood cell detection. In some scenarios, a detection module, such as a fourth detection module, is used for detection for glucose detection purposes. Of course, the detection module may also include a detection module for other purposes (e.g., for detecting glycated hemoglobin, for detecting blood sedimentation (erythrocyte sedimentation rate of blood sample), etc.), which will not be described in detail.

Referring to fig. 1, the sample feeding mechanism 400 may be provided with a sample loading area 101 for placing an undetected sample. The loading area 101 can perform loading operation.

The sample feeding mechanism 400 can set the sampling area 102 so that the apparatus body 200 performs sampling at the sampling area 102. The sampling area 102 may be provided with a sampling position for the apparatus body 200 to sample at the sampling position. I.e. a sample shift operation is performed in the sampling area 102.

The sample feeding mechanism 400 is provided with a sample dropping area 103 for storing the sampled sample for subsequent processing. The sample-down area 103 may perform a sample-down operation.

The upper sample area 101 and the lower sample area 103 may be symmetrically disposed. The sampling area 102 may be disposed between the sample loading area 101 and the sample unloading area 103 to communicate the sample loading area 101 and the sample unloading area 103. In some embodiments, the sample loading zone 101 and the sample unloading zone 103 are arranged axisymmetrically with respect to the sample loading zone 102. The sample is loaded into the sample loading area 101, and the sample feeding mechanism 400 is controlled by a processor or manually, and the sample is transported to the sample loading area 102, then transported to the sample unloading area 103, and finally waits for manual removal.

Referring to fig. 1 and 2, fig. 2 is a schematic structural diagram of a sample storage according to an embodiment of the present application. Many biological samples such as blood and urine are stored in the test tube 1. The test tubes 1 may be arranged in rows on a test tube rack 2. The test tube racks 2 are arranged in a row and placed at the sample feeding mechanism 400 such as the sample loading zone 101. The sample feeding mechanism 400 may be controlled by a processor or manually, each test tube rack 2 together with the test tubes 1 is sequentially transported from the loading area 101 to the sampling area 102, and then transported from the sampling area 102 to the unloading area 103, and each test tube rack 2 is arranged in a row and placed at the sample feeding mechanism 400, such as the unloading area 103, to wait for manual removal.

Referring to fig. 3, fig. 3 is an exploded view of the sample presentation mechanism 400 according to the embodiment of fig. 1. The sample feeding mechanism 400 may include a housing 10 provided with a sample loading area 101, a sample sampling area 102, and a sample unloading area 103, and a transport device 20 installed in the housing 10. The cabinet 10 is provided with an installation space 401. The transfer device 20 may be installed in the installation space 401. The transport device 20 is used to move the test tube rack 2 loaded with test tubes 1, so that the test tube rack 2 is transported with the test tubes 1 from the loading area 101 to the sampling area 102, and/or from the sampling area 102 to the unloading area 103.

Referring to fig. 3, the housing 10 may include a first housing 30 and a second housing 40 fastened to the first housing 30. The first housing 30 and the second housing 40 are fastened to form an installation space 401. The second housing 40 can be provided with the sample loading area 101, the sample loading area 102 and the sample unloading area 103 in the above embodiments.

It should be noted that the terms "first", "second" \8230; etc. are used herein, and both above and below, for descriptive purposes only and not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, features defined as "first," "second" \8230; \8230, etc. may explicitly or implicitly include one or more of the described features.

It is understood that the terms "first housing", "second housing", "enclosure", and "housing" may be used interchangeably, for example, in some embodiments, the "first housing" may be referred to as the "second housing" and the "second housing" may be referred to as the "first housing".

Referring to fig. 3, the first housing 30 may include a substrate 31 and a supporting wall 32 disposed on the substrate 31.

The substrate 31 may be made of a rigid material, and the whole may have a plate structure or a rack structure. In one embodiment, the substrate 31 may be omitted.

The support wall 32 may be made of a rigid material. The supporting wall 32 may be disposed on a side of the substrate 31 close to the second casing 40 for connecting and fixing with the second casing 40.

In one embodiment, the support wall 32 may be disposed at an edge of the substrate 31. In one embodiment, the supporting wall 32 may extend from an edge of the substrate 31 to one side of the second housing 40. Of course, the support wall 32 may not be provided at the edge position. The support wall 32 may be fixed to the base plate 31 by means of adhesion, welding, screwing, clipping, insertion, or the like. In one embodiment, the support wall 32 may also be omitted. In one embodiment, the support wall 32 is a unitary structure with the substrate 31.

It will be appreciated that the first housing 30 may be omitted where the second housing 40 is capable of carrying the delivery device 20.

Referring to fig. 3, the second housing 40 may include a carrying case 50 mounted on the first housing 30, such as the supporting wall 32, and a decorative case 60 disposed at the periphery of the carrying case 50. The carrying shell 50 can be used to arrange the sample loading area 101, the sample loading area 102 and the sample unloading area 103 in the above-mentioned embodiment. The decorative shell 60 may be used to enhance the appearance of the sample presentation mechanism 400.

Referring to fig. 3 and 4, fig. 4 is a schematic structural diagram of the load-bearing shell 50 in the embodiment shown in fig. 3. The bearing housing 50 may include a carrier plate 51 mounted on the first housing 30, e.g., the support wall 32, a baffle plate 52 disposed on a side of the carrier plate 51 away from the first housing 30, e.g., the substrate 31, and a position detecting assembly 53 disposed on the carrier plate 51. The carrier plate 51 is used for carrying the transport device 20 and the sample. The carrier plate 51 and the surrounding plate 52 are configured to enclose a sample loading area 101, a sample loading area 102 and a sample unloading area 103. Position detection subassembly 53 is used for fixing a position the dress at the test-tube rack 2 that has test tube 1 for the sample can be accurate in the area of upper sample 101, sample area 102 and lower appearance district 103 carried, and makes test tube 1 accurate removal to the sampling position, and then is taken a sample by equipment main body 200.

The supporting board 51 can be made of a rigid material, and can be a plate structure, a frame structure, a net structure, or the like. The carrier plate 51 may be disposed symmetrically with the first housing 30, such as the substrate 31, so as to form a mounting space 401 between the carrier plate 51 and the first housing 30, such as the substrate 31. The carrier plate 51 can be fixed to the first housing 30, such as the support wall 32, by welding, clipping, screwing, inserting, etc.

The carrier 51 has a hole 511 corresponding to the sample loading area 101, the sample loading area 102 and the sample unloading area 103 for providing a way for the transportation device 20.

Specifically, the loading plate 51 is provided with an avoiding hole 511, such as a first avoiding hole 5111, at a position corresponding to the sample loading region 101. The first concession hole 5111 may have a bar shape as a whole, but may be formed in other shapes. In an embodiment, the first concession hole 5111 may extend in the first direction. In one embodiment, the first direction may form an angle with the direction from the sample loading region 101 to the sample unloading region 103, and the angle may be 0-90 °. In one embodiment, the first direction may form an angle with the direction from the sample loading region 101 to the sample unloading region 103, and the angle is 90 °.

The loading board 51 has a hole 511, such as a second hole 5112, corresponding to the sampling area 102. The second concessional hole 5112 may have a bar shape as a whole, but may be formed in other shapes. In an embodiment, the second concession hole 5112 may be extended in the second direction. In one embodiment, the second direction may be at an angle with respect to the first direction, and the angle may range from 0 to 90 degrees. In one embodiment, the first direction may be at an angle of 90 ° with respect to the second direction.

The carrier plate 51 has a third yielding hole 5113 corresponding to the lower sample region 103. The third concessional hole 5113 may have a bar shape as a whole, but may be formed in other shapes. In an embodiment, the third concessional hole 5113 may be extended in a third direction. In one embodiment, the third direction may be at an angle with respect to the second direction, and the angle may range from 0 to 90 degrees. In one embodiment, the third direction may form an angle with the second direction, and the angle is 90 °. In an embodiment, the third direction may be the same as the first direction.

It is to be understood that the terms "first yielding hole", "second yielding hole", "third yielding hole", and "yielding hole" may be used interchangeably, for example, in some embodiments, the "first yielding hole" may be referred to as "second yielding hole", and the "second yielding hole" may be referred to as "first yielding hole".

For example, in some embodiments, the "first direction" may be referred to as the "second direction" and the "second direction" may be referred to as the "first direction".

Referring to FIG. 4, the enclosure plate 52 may be made of a rigid material or the same material as the carrier plate 51. The coaming 52 may surround the abdicating hole 511, such as the first abdicating hole 5111, the second abdicating hole 5112, and the third abdicating hole 5113. The surrounding plate 52 and the carrier plate 51 may be fixed on the carrier plate 51 by means of inserting, welding, clipping, bonding, screwing, etc. to form the sample loading area 101 around the yielding hole 511, such as the first yielding hole 5111, the sample sampling area 102 around the yielding hole 511, such as the second yielding hole 5112, and the sample unloading area 103 around the yielding hole 511, such as the third yielding hole 5113.

The surrounding plates 52 may include a first surrounding plate 521 and a second surrounding plate 522 which are arranged oppositely, a third surrounding plate 523 which is connected to the first surrounding plate 521 and the second surrounding plate 522 respectively, a fourth surrounding plate 524 which is connected to the first surrounding plate 521 and the second surrounding plate 522 respectively and is arranged oppositely to the third surrounding plate 523, and a partition 525 which is arranged between the first surrounding plate 521 and the second surrounding plate 522. Specifically, a first enclosing plate 521, a third enclosing plate 523, a second enclosing plate 522 and a fourth enclosing plate 524 are connected end to enclose the operating area 501. Accordingly, the sample loading area 101, the sample sampling area 102, and the sample unloading area 103 are disposed within the operation area 501. The partition 525 is used to divide the operation region 501 into the sample loading region 101, the sample loading region 102, and the sample unloading region 103.

It should be understood that the first enclosing plate 521, the third enclosing plate 523, the second enclosing plate 522 and the fourth enclosing plate 524 may not be connected to each other, but only end portions thereof may abut against each other or end portions thereof may be spaced apart from each other.

It is understood that the terms "first enclosure", "second enclosure", "third enclosure", "fourth enclosure", and "enclosure" may be used interchangeably, for example, in some embodiments, the "first enclosure" may be referred to as the "second enclosure" and the "second enclosure" may be referred to as the "first enclosure".

In an embodiment, the first enclosing plate 521 and the second enclosing plate 522 may be extended and disposed in the second direction. In an embodiment, the third surrounding plate 523 may extend in the first direction. In an embodiment, the fourth surrounding plate 524 may extend in the third direction.

Partition 525 is disposed within operating region 501. Partition 525 may include first and second partitions 5251, 5252 disposed opposite third shroud 523 and third partition 5253 disposed opposite first shroud 521. The first partition 5251 and the second partition 5252 are disposed opposite to each other and are disposed opposite to the fourth enclosing plate 524. The first partition 5251 is connected to the third partition 5253 and the second shroud 522, respectively. The second partition 5252 is connected to the third partition 5253 and the second shroud 522, respectively.

The first enclosing plate 521, the second enclosing plate 522, the third enclosing plate 523 and the first partition 5251 enclose the sample loading area 101. The first closure plate 521 and the third closure plate 5253 enclose the sampling area 102. The first surrounding plate 521, the fourth surrounding plate 524, the third partition plate 5253 and the first partition plate 5251 surround to form the sample loading area 101.

In one embodiment, one end of the first partition 5251 is abutted or spaced apart from the second enclosing plate 522 or connected thereto, the other end of the first partition 5251 is abutted or spaced apart from one end of the third partition 5253 or connected thereto, the other end of the third partition 5253 is abutted or spaced apart from one end of the second partition 5252 or connected thereto, and the other end of the second partition 5252 is abutted or spaced apart from the second enclosing plate 522 or connected thereto.

In one embodiment, the first barrier 5251 may be extended in the first direction. In an embodiment, the second barrier 5252 can be extended in the second direction. In an embodiment, the third barrier 5253 may be extended in a third direction.

It can be understood that the second enclosing plate 522, the first partition 5251, the second partition 5252 and the third partition 5253 are arranged to enclose a free space, and further, the second enclosing plate 522 can be broken at a position corresponding to the free space to form the first sub-enclosing plate 5221 and the second sub-enclosing plate 5222, such that one end of the first sub-enclosing plate 5221 is abutted or spaced apart from one end of the first partition 5251 or connected thereto, and one end of the second sub-enclosing plate 5222 is abutted or spaced apart from one end of the second partition 5252 or connected thereto. That is, the first enclosing plate 521, the third enclosing plate 523, the first sub-enclosing plate 5221, the first partition plate 5251, the third partition plate 5253, the second partition plate 5252 and the fourth enclosing plate 524 are connected end to end or abutted against or arranged adjacent to one another.

Referring to fig. 4, the position detecting assembly 53 may include a sample detecting member 531 disposed corresponding to the sample loading area 101, a sample detecting mechanism 532 disposed corresponding to the sample loading area 102, and a sample unloading detecting mechanism 533 disposed corresponding to the sample unloading area 103. The sample detection member 531 is used to detect the test tube rack 2 in the sample loading area 101, so as to determine whether the test tube rack 2 is placed in the sample loading area 101, and to perform the operation of conveying the test tube rack 2 to the sampling area 102. Sampling test mechanism 532 is arranged in detecting the position of test-tube rack 2 in the sampling area 102, and accurate the carrying to the sampling position is convenient for equipment subject 200 to the test-tube rack 2 on the sample in each test tube 1 carry out the accuracy and adopt to promote and detect the precision. The sample unloading detection mechanism 533 is configured to detect the test tube rack 2 in the sample unloading zone 103, so as to prompt a user to take out the test tube rack 2 in the sample unloading zone 103 when the test tube rack is fully loaded, and to give way for the test tube rack 2 conveyed from the sampling zone 102.

Referring to fig. 4, the sample detector 531 may be a proximity sensor, a hall sensor, an infrared sensor, an optical coupler sensor, a pressure sensor, a point-contact switch-type sensor, or the like. The sample detecting member 531 may receive a detection signal when being approached or touched by the test tube rack 2. That is, the sample detector 531 has a detection range, and when the test tube rack 2 is in the detection range, the sample detector 531 is triggered. In one embodiment, the sample detecting member 531 is disposed on the carrier plate 51 and can be disposed adjacent to the first enclosing plate 521. Of course, the sample-detecting member 531 may be provided directly on the first closing plate 521, or may even be provided directly on the third closing plate 523 or the first partition 5251. In one embodiment, the enclosure 52 may be perforated to give way for the sample detection member 531, so that the sample detection member 531 can better detect the test tube rack 2, for example, by directly contacting the test tube rack 2.

Referring to fig. 4, the sampling detection mechanism 532 may include an initial position detector 5321 and an end position detector 5322. The initial position detector 5321 is provided on the side of the last position detector 5322 close to the third surrounding plate 523. That is, the end position detector 5322 is provided on the side of the initial position detector 5321 close to the fourth surrounding plate 524.

The initial position detecting member 5321 may be a proximity sensor, a hall sensor, an infrared sensor, an optical coupling sensor, a pressure sensor, a point-contact switch type sensor, or the like. When the sample detecting member 531 is approached or touched by the test tube rack 2, a detection signal can be received so as to determine the initial position of the test tube rack 2, and then determine that the test tubes 1 on the test tube rack 2 are accurately conveyed to a specific position, so as to realize accurate sampling of the apparatus main body 200. That is, the initial position detector 5321 has a detection range, and when the test tube rack 2 is within the detection range, the initial position detector 5321 is triggered.

In one embodiment, the initial position detecting member 5321 is disposed on the carrier plate 51 and can be disposed adjacent to the first enclosing plate 521. Of course, the sample-detecting member 531 may be provided directly on the first closure plate 521, or may even be provided directly on the first barrier 5251 or the third barrier 5253. In one embodiment, the surrounding plate 52 may be provided with a through hole to give way for the initial position detecting member 5321, so as to facilitate the better detection of the test tube rack 2 by the initial position detecting member 5321, for example, the detection is realized by direct contact with the test tube rack 2.

The end position detection member 5322 may be a proximity sensor, a hall sensor, an infrared sensor, an optical coupler sensor, a pressure sensor, a point-contact switch type sensor, or the like. The last position detection piece 5322 can receive a detection signal when being approached or touched by the test tube rack 2, so as to determine the last position of the test tube rack 2, and then determine whether the test tube 1 on the test tube rack 2 is accurately and completely sampled by the apparatus main body 200, and then be convenient for accurately conveying the test tube rack 2 to the operation in the sampling area 103. That is, the end position detector 5322 has a detection range, and when the test tube rack 2 is within the detection range, the end position detector 5322 is triggered.

In one embodiment, the end position detector 5322 is disposed on the carrier plate 51 and can be disposed adjacent to the first enclosing plate 521. Of course, the sample-detecting member 531 may be provided directly on the first closure plate 521, or may even be provided directly on the first barrier 5251 or the third barrier 5253. In one embodiment, the enclosure 52 may be perforated to give way for the end position detection member 5322, so as to facilitate the end position detection member 5322 to better detect the test tube rack 2, for example, to directly contact the test tube rack 2 for detection.

In one embodiment, the end position detector 5322 may be omitted.

Referring to fig. 4, the lower sample detecting mechanism 533 may include a lower sample full detecting member 5331 and a lower sample position detecting member 5332. The lower sample full load detector 5331 is disposed adjacent to the first enclosing plate 521. The lower-run-position detecting member 5332 is provided adjacent to the second apron 522. The lower sample full load detection part 5331 and the lower sample in-place detection part 5332 cooperate to detect whether the test tube rack 2 is full in the lower sample area 103, so as to remind a user to take away the detected test tube rack 2.

Referring to fig. 4, the lower sample full load detector 5331 may be a proximity sensor, a hall sensor, an infrared sensor, an optical coupler sensor, a pressure sensor, a point-contact switch type sensor, or the like. When the sample detecting member 531 is approached or touched by the test tube rack 2, a detection signal can be received to determine whether or not the test tube rack 2 exists near the sample loading detecting member 5331. That is, the lower sample full state detector 5331 has a detection range, and when the test tube rack 2 is within the detection range, the lower sample full state detector 5331 is triggered.

In one embodiment, the sample loading detector 5331 is disposed on the carrier plate 51 and can be disposed adjacent to the fourth surrounding plate 524. Of course, the sample-detecting member 531 may be provided directly on the first closure plate 521, and may even be provided directly on the second barrier 5252 or the third barrier 5253. In one embodiment, the surrounding plate 52 may be provided with a through hole to give way for the lower sample full loading detection member 5331, so as to facilitate the better detection of the test tube rack 2 by the lower sample full loading detection member 5331, for example, by directly contacting the test tube rack 2 for detection.

Referring to fig. 4, the sample run-in-place detector 5332 may be a proximity sensor, a hall sensor, an infrared sensor, an optical coupler sensor, a pressure sensor, a point-contact switch type sensor, or the like. When the sample detecting member 531 is approached or touched by the test tube rack 2, a detection signal may be received, so as to determine whether the test tube rack 2 exists near the sample loading position detecting member 5332. That is, the sample-run-in-position detector 5332 has a detection range, and when the test tube rack 2 is within the detection range, the sample-run-in-position detector 5332 is triggered.

In one embodiment, the punch-down position detecting member 5332 is disposed on the carrier plate 51 and may be disposed adjacent to the second surrounding plate 522, e.g., the second sub-surrounding plate 5222. Of course, the sample-detecting member 531 may be directly disposed on the fourth surrounding plate 524, and may even be directly disposed on the second barrier 5252. In one embodiment, the shroud 52 may be perforated to give way for the run-in-place detection member 5332, which facilitates better detection of the test tube rack 2 by the run-in-place detection member 5332, e.g., by direct contact with the test tube rack 2.

It is understood that when the full-run-sample detector 5331 detects a signal and the in-run-sample detector 5332 detects a signal, it can be determined that the sufficient test tube rack 2 is stored in the run-sample area 103 and the user is required to remove the test tube rack 2. In order to avoid detection errors, whether the detection time for the full-load sampling detection part 5331 to detect the signal and the in-place sampling detection part 5332 to detect the signal is greater than or equal to the target time or not can be detected, if the detection time is greater than the target time, it can be determined that the sufficient test tube rack 2 is stored in the sampling area 103, and if the detection time is less than the target time, it can be determined that the test tube rack 2 is in the moving and conveying process, and the full-load sampling detection part 5331 or the in-place sampling detection part 5332 is triggered by mistake, or a user takes away a part of the test tube rack 2. Of course, the full-load detection of the test tube rack 2 can be realized only by the lower sample full-load detection member 5331, for example, it can be detected whether the detection time of the signal detected by the lower sample full-load detection member 5331 is greater than or equal to the target time, if the detection time is greater than the target time, it can be determined that the sufficient test tube rack 2 is stored in the lower sample area 103, and if the detection time is less than the target time, it can be determined that the test tube rack 2 is in the moving and conveying process, and the lower sample full-load detection member 5331 is triggered by mistake, or a user takes away a part of the test tube rack 2.

In addition, when the sample loading detector 5331 is omitted, the tail position detector 5322 may be used instead of the sample loading detector 5331 to function as the sample loading detector 5331.

In an embodiment, please refer to fig. 5, fig. 5 is a schematic structural diagram of the sample-in-place detecting element 5332 in the embodiment shown in fig. 4. The sample run-in position detector 5332 may include a sample run-in sensor 5333 and an elastic stopper 5334 disposed adjacent to the sample run-in sensor 5333. The lower sample sensor 5333 detects the test tube rack 2 near the lower sample sensor 5333. The elastic limiting member 5334 is used for limiting the position of the test tube rack 2, and the test tube rack 2 is prevented from triggering the sample unloading sensor 5333 for a long time.

The down sample sensor 5333 may be a proximity sensor, a hall sensor, an infrared sensor, an opto-coupler sensor, a pressure sensor, a point-contact switch type sensor, or the like. That is, the lower pattern sensor 5333 has a detection range, and when the test tube rack 2 is within the detection range, the lower pattern sensor 5333 is triggered.

The elastic limiting member 5334 may include an abutting plate 5335 rotatably connected to the carrier plate 51 and an elastic member 5336 mounted on the carrier plate 51. When the contact plate 5335 is pressed by the test tube rack 2, it can rotate, and the elastic member 5336 is elastically deformed. When the abutting plate 5335 is not pressed by the test tube rack 2, the elastic member 5336 rotates and returns due to the restoring force generated by the elastic deformation. That is, the elastic stoppers 5334 can push the test tube rack 2 out of the detection range of the sample unloading sensor 5333. In one embodiment, the elastic member 5336 can be a torsion spring or a tension spring, but can be other types of structures having elastic deformation.

In an embodiment, the elastic limiting member 5334 can be omitted, and the sampling sensor 5333 can be used to complete the detection, for example, it can be detected whether the detection time of the signal detected by the sampling sensor 5333 is greater than or equal to the target time, and if the detection time is greater than the target time, it can be determined that the sampling sensor 5333 completes the detection, for example, the sample is detected.

Referring to fig. 3, the decoration shell 60 can be made of a hard material, or can be made of the same material as the carrier plate 51. The decorative shell 60 may include a decorative plate 61 disposed on a side of the carrying shell 50 away from the first shell 30, such as the substrate 31, and a decorative wall 62 disposed on a side of the decorative plate 61 close to the first shell 30, such as the substrate 31, and may be looped around the carrying shell 50.

The decoration plate 61 is provided with openings 611 at portions corresponding to the sample application area 101, the sample application area 102, and the sample application area 103 to expose the sample application area 101, the sample application area 102, and the sample application area 103. In one embodiment, the decorative plate 61 is abutted against the surrounding plate 52 such as the first surrounding plate 521, the first enclosing sub-plate 5221, the second enclosing sub-plate 5222, the second surrounding plate 522, the third surrounding plate 523, the fourth surrounding plate 524 and the partition plate 525 around the opening 611, or may be connected and fixed together by screwing, bonding, welding, inserting, clamping and the like. In one embodiment, the edge of the decorative panel 61 at the opening 611 abuts against or is fixedly connected to the enclosing panel 52, such as the first enclosing panel 521, the first enclosing sub-panel 5221, the second enclosing sub-panel 5222, the second enclosing panel 522, the third enclosing panel 523, the fourth enclosing panel 524, and the partition 525. In one embodiment, the decorative panel 61 may be omitted.

The decorative wall 62 may be extended from an edge of the decorative plate 61 toward the first housing 30 side. The decorative wall 62 is looped around the load bearing shell 50. In one embodiment, the decorative wall 62 may be looped around the first housing 30, such as the support wall 32. In one embodiment, the decorative wall 62 may be disposed inside the first housing 30, such as the support wall 32. In one embodiment, the decorative wall 62 may be fixedly connected to the first housing 30, such as the substrate 31. In one embodiment, the decorative wall 62 can be fixedly connected to the carrying shell 50. In one embodiment, the decorative wall 62 may be omitted.

It is understood that the decorative shell 60 can be an integral structure with the carrying shell 50, and the sample loading area 101, the sample loading area 102 and the sample unloading area 103 can be recesses on the side of the second shell 40 away from the first shell 30. In one embodiment, the first housing 30 may be a unitary structure with the second housing 40.

In addition, the decoration case 60 is provided to cover the position detecting unit 53. For example, the sample detection member 531, the sampling detection mechanism 532, and the sample dropping detection mechanism 533 may be interposed between the decorative plate 61 and the carrier case 50 to improve the appearance of the sample feeding mechanism 400.

Referring to fig. 3, the conveying device 20 is installed in the installation space 401 to pass through the abdicating holes 511, such as the first abdicating hole 5111, the second abdicating hole 5112, and the third abdicating hole 5113, and to contact the test tube rack 2 carrying the test tubes 1, so as to drive the test tube rack 2 to move. The transport device 20 may include a sample loading transport assembly 21 disposed corresponding to the sample loading zone 101, a sample removing transport assembly 22 disposed corresponding to the sample loading zone 102, and a sample unloading transport assembly 23 disposed corresponding to the sample unloading zone 103. Specifically, the loading transport assembly 21 may move the test tube rack 2 in the loading zone 101 to a first predetermined position (the position of the trigger position detecting assembly 53, e.g., the sample detecting member 531) into the loading zone 101. The sample transfer and conveying assembly 22 is used for conveying the test tube rack 2 at a first predetermined position in the sample loading area 101 to the sampling area 102, so as to be accurately positioned by the sample detection mechanism 532, such as the initial position detection member 5321, and enabling the apparatus main body 200 to perform sample detection on the sample in each test tube 1 on the test tube rack 2, and conveying the sample to a second predetermined position (the position of the sample detection mechanism 532, such as the end position detection member 5322, is triggered) in the sample unloading area 103. The lower sample transport assembly 23 is used to remove and collect the test tube rack 2 at a second predetermined position in the lower sample zone 103.

Referring to fig. 6, 7 and 8, fig. 6 is a schematic structural view of the sample loading and conveying assembly 21 in the embodiment shown in fig. 3. FIG. 7 is a cross-sectional view taken along line VII-VII of sample application transport assembly 21 in the embodiment of FIG. 6, and FIG. 8 is a schematic view of the configuration of the mating transport device 20 and load bearing shell 50 in the embodiment of FIG. 3. The sample loading and conveying assembly 21 may include a sample loading substrate 211 fixed on a side of the loading shell 50, such as the loading plate 51, close to the first housing 30, a sample loading driving module 212 installed on the sample loading substrate 211, a sample loading member 213 slidably connected to the sample loading substrate 211, and a sample loading position limiting module 214 installed between the sample loading substrate 211 and the sample loading member 213. The loading substrate 211 is used for carrying a loading driving module 212, a loading member 213 and a loading limiting module 214. The loading driving module 212 is used for driving the loading member 213 to slide the loading member 213 relative to the loading substrate 211. The sample loading member 213 abuts against the test tube rack 2 in the sample loading zone 101 through the relief hole 511, for example, the first relief hole 5111, to drive the test tube rack 2 to slide in the sample loading zone 101.

The sample loading substrate 211 may be made of a hard material, or may be made of the same material as the casing 10. The loading substrate 211 may be mounted on a side of the second housing 40, such as the carrying case 50, near the first housing 30. The side of the loading substrate 211 facing the second housing 40, e.g., the carrying case 50, may be provided with a loading slide 2111 for mounting the loading member 213. The sample application slide 2111 extends in the first direction. That is, the extension direction of the loading slide 2111 may coincide with the extension direction of the relief hole 511, for example, the first relief hole 5111.

It is understood that the sample loading rack 2111 can also be mounted on the side of the sample loading substrate 211 away from the second housing 40, e.g., the loading housing 50. In some embodiments, sample application sled 2111 may also be mounted directly on second housing 40, such as load bearing housing 50. In one embodiment, the sample application track 2111 may be an offset hole 511, such as a first offset hole 5111. In some embodiments, the loading substrate 211 may be omitted.

The sample loading driving module 212 is mounted on the sample loading substrate 211. The sample loading driving module 212 may include a sample loading driving member 2121 mounted on the sample loading substrate 211 and a sample loading guiding assembly 2122 drivingly connected to the sample loading driving member 2121 and connected to the sample loading member 213. The sample drive 2121 can generate power. And transmits power to the loading guide assembly 2122. The loading guide assembly 2122 is used to transmit power to the loading member 213 so that the loading member 213 slides on the loading slide 2111.

The sample loading driving element 2121 may be a motor, such as a stepping motor, or may be a power source, such as a hydraulic cylinder or a cylinder, which is not described in detail. It will be appreciated that the sample loading drive 2121 could also be secured to the second housing 40, such as the load bearing housing 50.

The loading guide assembly 2122 may include a loading roller 2123 fixed to the loading substrate 211 and a loading belt 2124 sleeved on the loading roller 2123 and the loading driving member 2121. The loading roller 2123 and the loading driving member 2121 support the loading belt 2124, so that the loading driving member 2121 drives the loading roller 2123 to rotate. The sample loading conveyor belt 2124 can be fixed with the sample loading element 213 through bonding, welding, screwing, clamping, inserting and the like. To slide the upper sample piece 213.

It will be appreciated that the loading roller 2123 may be secured directly to the second housing 40, such as the load bearing housing 50.

The loading guide assembly 2122 is not limited to the combination of the loading roller 2123 and the loading belt 2124, and the loading guide assembly 2122 may have another structure. For example, a screw threaded with the loading guide assembly 2122 and connected with the loading drive 2121 to push the loading member 213 to slide in the axial direction of the screw. For example, a slide bar fixed to the loading guide assembly 2122, to push the loading member 213 to slide in the axial direction of the slide bar.

The sample loading member 213 may include a sample loading body 2131 mounted on the sample loading rail 2111 and sample loading claws 2132, 2133 provided to the sample loading body 2131. The sample- loading claws 2132 and 2133 can pass through the abdicating hole 511, such as the first abdicating hole 5111, so as to reach the side of the loading plate 51 far away from the first housing 30, and abut against the test tube rack 2, so as to drag the test tube rack 2 to slide. The loading claws 2132 and 2133 can slide in the first direction toward the first shroud plate 521, and can be kept in an extended state, and further abut against the test tube rack 2 to pull the test tube rack 2 to slide. The sampling claws 2132 and 2133 can be pressed by the test tube rack 2 to retract into the abdicating hole 511, such as the first abdicating hole 5111, when sliding to one side of the second enclosing plate 522 in the first direction, so that the test tube rack 2 cannot be dragged to slide.

The sample claw hooks 2132 and 2133 may include a movable sample claw hook 2134 rotatably connected to the sample body 2131 and a sample elastic member 2135 attached to the sample body 2131. The movable claw 2134 for loading can pass through the offset hole 511, for example, the first offset hole 5111, to reach the loading area 101 to engage with the rack 2. The movable loading claw 2134 is opposite to the loading body 2131 to extend and retract in the abdicating hole 511, such as the first abdicating hole 5111. The movable sample loading claw 2134 is configured to abut against the sample loading body 2131 and to be restrained when sliding in the first direction toward the first side plate 521, so that the movable sample loading claw 2134 is in an extended state. The movable claw 2134 is pressed by the test tube rack 2 when sliding toward the second side plate 522 in the first direction, rotates relative to the sample loading body 2131, and retracts into the abdicating hole 511, for example, the first abdicating hole 5111. One end of the loading elastic member 2135 is connected to the loading body 2131, and the other end is connected to the loading elastic member 2135. The sample loading elastic element 2135 is elastically deformed in the process that the sample loading movable claw 2134 retracts into the yielding hole 511, for example, the first yielding hole 5111, and when the sample loading movable claw 2134 is not pressed by the test tube rack 2, the sample loading movable claw 2134 is rotated and restored to the extended state by the restoring force of the sample loading elastic element 2135 due to the elastic deformation. In one embodiment, the loading elastic element 2135 can be a torsion spring or a tension spring, but can be other types of structures with elastic deformation.

The sample loading limiting module 214 may include a sample loading sensor 2141 mounted on the second housing 40, such as the carrying housing 50, and a sample loading limiting member 2142 mounted on the sample loading main body 2131 and used for triggering the sample loading sensor 2141. The sample loading stopper 2142 slides together with the sample loading main body 2131, and then slides to one side close to the sample loading sensor 2141, and when the sample loading stopper 2142 approaches the sample loading sensor 2141, the sample loading sensor 2141 can be triggered, and the sample loading driving module 212 stops working, so that the effects of limiting and positioning are achieved. In one embodiment, the sample stop 2142 may be omitted, such that the sample sensor 2141 is triggered by the sample body 2131. In one embodiment, the sample loading sensor 2141 may be a proximity sensor, a hall sensor, an infrared sensor, a photo coupler sensor, a pressure sensor, a point-contact switch type sensor, or the like.

Referring to fig. 9, fig. 9 is a schematic structural view illustrating the sample loading and conveying assembly 21, the sample unloading and conveying assembly 23, and the carrying shell 50 in the embodiment shown in fig. 8. The loading member 213 and the loading limiting module 214 can be omitted. In the loading conveyor assembly 21, the loading conveyor belt 2124 is disposed facing the first concession hole 5111. So as to extend into the loading zone 101 to contact the test tube rack 2. The loading conveyor 2124 performs the conveyance of the test tube rack 2 by the loading drive unit 2121. In some embodiments, a loading driving shaft 2125 may be disposed on the loading base plate 211 to cooperate with the loading roller 2123 to support the loading conveyor 2124, and an output shaft of the loading driving member 2121 may be in driving connection with the loading driving shaft 2125 through a belt, a gear, or the like, so as to achieve the function of dragging and collecting the test tube rack 2 by the loading conveyor 2124.

Referring to fig. 8, 10 and 11, fig. 10 is a schematic structural view of the sample transfer and conveying assembly 22 in the embodiment shown in fig. 3. Fig. 11 is a partial structural schematic diagram of the sample transfer and conveying assembly 22 in the embodiment shown in fig. 10. The sample transferring and conveying assembly 22 may include a sample transferring substrate 221 fixed on the side of the carrying shell 50, such as the carrying plate 51, close to the first housing 30, a sample transferring driving module 222 installed on the sample transferring substrate 221, a sample transferring member 223 slidably connected with the sample transferring substrate 221, and a sample transferring limiting module 224 installed between the sample transferring substrate 221 and the sample transferring member 223. The sample moving substrate 221 is used for carrying the sample moving driving module 222, the sample moving member 223 and the sample moving limiting module 224. The sample-transferring driving module 222 is used for driving the sample-transferring member 223 so as to make the sample-transferring member 223 slide relative to the sample-transferring substrate 221. The sample transfer member 223 abuts against the test tube rack 2 in the sampling area 102 through the relief hole 511, for example, the second relief hole 5112, to drive the test tube rack 2 to slide in the sampling area 102.

The transfer substrate 221 may be made of a rigid material, or may be made of the same material as the housing 10. The sample substrate 221 can be mounted on a side of the second housing 40, such as the carrying housing 50, near the first housing 30. The sample transferring base plate 221 is provided with a sample transferring slide 2211 for mounting the sample transferring member 223. The sample-removing slide 2211 extends in the second direction. That is, the extending direction of the sample-moving slide 2211 may be consistent with the extending direction of the yielding hole 511, for example, the second yielding hole 5112.

It will be appreciated that the sample removing slide 2211 may also be mounted directly to the second housing 40, such as the carrying case 50. In one embodiment, the sample-moving slide 2211 can be a relief hole 511, such as a second relief hole 5112. In some embodiments, the sample-removing substrate 221 may be omitted.

The sample transfer driving module 222 is mounted on the sample transfer substrate 221. The sample shift driving module 222 may include a sample shift driving member 2221 mounted on the sample shift substrate 221 and a sample shift guiding assembly 2222 drivingly connected to the sample shift driving member 2221 and connected to the sample shift member 223. The sample driver 2221 can generate power. And transmits power to the shift guide assembly 2222. The sample moving guide 2222 is used for transmitting power to the sample moving member 223, so that the sample moving member 223 slides on the sample moving slide 2211.

The sample moving driving member 2221 may be a motor such as a stepping motor, and may also be a power source such as a hydraulic cylinder or an air cylinder, which will not be described in detail. It will be appreciated that the sample removing drive 2221 may also be secured to the second housing 40, such as the carrier housing 50.

The sample shift guide 2222 may comprise a sample shift roller 2223 fixed on the sample shift substrate 221, and a sample shift conveyor 2224 sleeved on the sample shift roller 2223 and the sample shift driving member 2221. The sample removing roller 2223 and the sample removing driving member 2221 support the sample removing conveyor belt 2224, so that the sample removing driving member 2221 drives the sample removing roller 2223 to rotate. The sample moving conveyor belt 2224 may be fixed to the sample moving member 223 in the form of adhesion, welding, screwing, clamping, insertion, and the like, so as to drive the sample moving member 223 to slide.

It is understood that the sample-removing roller 2223 may be directly fixed to the second housing 40, for example, the bearing shell 50.

In addition, the sample shift guide 2222 is not limited to the combination of the sample shift roller 2223 and the sample shift conveyor 2224, and the sample shift guide 2222 may have other structures. For example, a screw threaded with the sample shift guide 2222 and coupled with the sample shift drive 2221 to push the sample shift 223 to slide in the axial direction of the screw. For example, a slide bar fixed to the sample shift guide 2222, to push the sample shift 223 to slide in the axial direction of the slide bar.

The sample transfer member 223 may include a sample transfer body 2231 mounted on the sample transfer slide rail 2211, and sample transfer claw hooks 2232, 2233 provided on the sample transfer body 2231. The sample-moving claws 2232, 2233 can pass through the offset holes 511, for example, the second offset hole 5112, so as to reach the side of the carrier plate 51 away from the first housing 30, and abut against the test-tube rack 2, thereby dragging the test-tube rack 2 to slide. The sample transfer claws 2232 and 2233 are configured to be able to slide in the second direction toward the fourth wall 524 while being kept in an extended state, and to abut against the test tube rack 2 to pull the test tube rack 2 to slide. The sample-moving claws 2232, 2233 can be pressed by the test tube rack 2 to retract into the abdicating hole 511, such as the second abdicating hole 5112, when sliding to the third surrounding plate 523 in the second direction, and thus the test tube rack 2 cannot be dragged to slide.

The sample-removing hooks 2232, 2233 may include a sample-removing movable hook 2234 rotatably connected to the sample-removing body 2231, and a sample-removing elastic member 2235 mounted on the sample-removing body 2231. The movable claw 2234 can pass through the offset hole 511, for example, the second offset hole 5112, to reach the sampling area 102 to engage with the rack 2. The sample-removing movable claw 2234 is configured to extend and retract in the concession hole 511, e.g., the second concession hole 5112, relative to the sample-removing body 2231. When sliding in the second direction toward the fourth circumferential plate 524, the movable claw 2234 abuts against the sample removing body 2231 to be limited, so that the movable claw 2234 is in an extended state. When the movable claw 2234 slides to the third surrounding plate 523 in the second direction, it is pressed by the test tube rack 2 and rotates relative to the sample moving body 2231, retracting into the abdicating hole 511, e.g., the second abdicating hole 5112. The sample-removing elastic member 2235 has one end connected to the sample-removing body 2231 and the other end connected to the sample-removing elastic member 2235. The specimen-moving elastic member 2235 is elastically deformed in the process that the specimen-moving movable claw 2234 retracts into the abdicating hole 511, for example, the second abdicating hole 5112, and further, when the specimen-moving movable claw 2234 is not pressed by the test tube rack 2, the specimen-moving movable claw 2234 is rotated and restored to the extended state by the restoring force of the specimen-moving elastic member 2235 due to the elastic deformation. In one embodiment, the sample-moving elastic member 2235 can be a torsion spring or a tension spring, but can be other types of structures having elastic deformation.

The sample shift limiting module 224 may include a sample shift sensor 2241 mounted on the second housing 40, such as the carrying housing 50, and a sample shift limiting member 2242 mounted on the sample shift body 2231 and used for triggering the sample shift sensor 2241. Move a kind locating part 2242 and move a kind main part 2231 and slide together, and then slide to the one side that is close to and move a kind sensor 2241, can trigger when moving a kind locating part 2242 and be close to and move a kind sensor 2241, and then arouse to move a kind drive module 222 stop work, reach spacing, the effect of location. In one embodiment, the sample stop 2242 may be omitted, so as to trigger the sample sensor 2241 through the sample body 2231. In one embodiment, the sample shift sensor 2241 may be a proximity sensor, a hall sensor, an infrared sensor, an optical coupling sensor, a pressure sensor, a point-contact switch type sensor, or the like.

Referring to fig. 8, 12 and 13, fig. 12 is a schematic structural view of the sample loading and conveying assembly 23 in the embodiment shown in fig. 3. Fig. 13 is a cross-sectional view of the lower sample transport assembly 23 at line vii-vii in the embodiment of fig. 12. The lower sample transport assembly 23 may include a lower sample substrate 231 fixed on the side of the loading housing 50, such as the loading plate 51, close to the first housing 30, a lower sample driving module 232 mounted on the lower sample substrate 231, a lower sample 233 slidably connected to the lower sample substrate 231, and a lower sample limit module 234 mounted between the lower sample substrate 231 and the lower sample 233. The lower sample substrate 231 is used for carrying a lower sample driving module 232, a lower sample member 233 and a lower sample limiting module 234. The lower sample driving module 232 is used for driving the lower sample 233 so that the lower sample 233 slides relative to the lower sample substrate 231. The lower sample 233 abuts against the test tube rack 2 in the lower sample zone 103 through the relief hole 511, for example, the third relief hole 5113, to drive the test tube rack 2 to slide in the lower sample zone 103.

The lower sample substrate 231 may be made of a hard material, or may be made of the same material as the housing 10. The lower sample substrate 231 may be mounted on a side of the second housing 40, such as the carrying case 50, near the first housing 30. The lower sample substrate 231 may be provided with a lower sample slide 2311 facing the second housing 40, such as the carrying housing 50, for mounting the lower sample 233. The lower sample slide 2311 extends in the third direction. That is, the extending direction of the sample-removing slide 2311 may be the same as the extending direction of the relief hole 511, for example, the third relief hole 5113.

It is understood that the sample slide 2311 may also be mounted on a side of the sample substrate 231 remote from the second housing 40, such as the load bearing housing 50. In some embodiments, the sample slide 2311 may also be mounted directly on the second housing 40, such as the load bearing housing 50. In one embodiment, the sample slide 2311 may be a relief hole 511, such as a third relief hole 5113. In some embodiments, the dummy substrate 231 may be omitted.

The lower sample driving module 232 is mounted on the lower sample substrate 231. The sample loading driving module 232 may include a sample loading driving member 2321 mounted on the sample loading substrate 231 and a sample loading guiding assembly 2322 drivingly connected to the sample loading driving member 2321 and connected to the sample loading member 233. The lower sample drive 2321 may generate power. And transmits power to lower sample guide assembly 2322. The lower sample guide 2322 is used to transmit power to the lower sample 233 so that the lower sample 233 slides on the lower sample slide 2311.

The lower driving member 2321 may be a motor, such as a stepping motor, and may also be a hydraulic cylinder, a cylinder, or other power sources, which are not described in detail. It is understood that the lower driving member 2321 may also be fixed to the second housing 40, for example, the bearing housing 50.

The lower sample guide 2322 may include a lower sample roller 2323 fixed on the lower sample substrate 231 and a lower sample conveyor 2324 sleeved on the lower sample roller 2323 and the lower sample driving member 2321. The lower sample roller 2323 and the lower sample driving member 2321 support the lower sample conveyor 2324, so that the lower sample driving member 2321 drives the lower sample roller 2323 to rotate. The lower sample conveyor 2324 may be fixed to the lower sample 233 by means of bonding, welding, screwing, clamping, plugging, or the like. To slide the lower sample 233.

It is understood that the lower sample roller 2323 may be directly fixed to the second housing 40, for example, the bearing housing 50.

In addition, the sample loading guide 2322 is not limited to the combination of the sample loading roller 2323 and the sample loading belt 2324, and the sample loading guide 2322 may have another structure. For example, a screw threaded with the lower sample guide 2322 and connected with the lower sample driving member 2321 to push the lower sample member 233 to slide in the axial direction of the screw. For example, a slide bar fixed to the lower sample guide 2322, to push the lower sample member 233 to slide in an axial direction of the slide bar.

The lower sample 233 may include a lower sample body 2331 mounted on the lower sample slide 2311 and lower sample claws 2332, 2333 provided to the lower sample body 2331. The lower claw hooks 2332, 2333 may pass through the offset hole 511, such as the third offset hole 5113, so as to reach the side of the carrier plate 51 away from the first housing 30, and abut against the test tube rack 2, thereby dragging the test tube rack 2 to slide. The lower claw hooks 2332 and 2333 are configured to be always kept in an extended state when they slide toward the second fence 522 in the third direction, and to be brought into contact with the test tube rack 2 to pull the test tube rack 2 to slide. The lower claw hooks 2332, 2333 can be pressed by the test tube rack 2 to retract into the receding hole 511, such as the third receding hole 5113, when sliding to the side of the first coaming 521 in the third direction, so that the test tube rack 2 cannot be dragged to slide.

The lower sample claw 2332, 2333 can include a lower movable claw 2334 rotatably connected to the lower sample body 2331 and a lower elastic member 2335 mounted to the lower sample body 2331. The lower movable claw 2334 may pass through an abdicating hole 511, such as the third abdicating hole 5113, to the lower sample area 103 to engage with the test tube rack 2. The lower sample movable claw 2334 is extended and retracted relative to the lower sample body 2331 at an abdicating hole 511, e.g., a third abdicating hole 5113. The movable lower claw 2334 can abut against the lower body 2331 to be restricted when it is slid toward the second shroud plate 522 in the third direction, so that the movable lower claw 2334 is in an extended state. The lower sample movable claw 2334 is pressed by the test tube rack 2 when sliding in the third direction toward the first side plate 521, and rotates relative to the lower sample body 2331 to retract into the offset hole 511, for example, the third offset hole 5113. The lower elastic member 2335 has one end connected to the lower sample body 2331 and the other end connected to the lower elastic member 2335. The lower sample elastic member 2335 is elastically deformed when the lower sample movable claw 2334 retracts into the offset hole 511, for example, the third offset hole 5113, and when the lower sample movable claw 2334 is not pressed by the test tube rack 2, the lower sample movable claw 2334 is rotated and restored to the extended state by the restoring force of the lower sample elastic member 2335 due to the elastic deformation. In one embodiment, the lower spring 2335 can be a torsion spring or a tension spring, but can be other types of structures having elastic deformation.

The lower sample limit module 234 may include a lower sample sensor 2341 mounted on the second housing 40, such as the carrying housing 50, and a lower sample limit piece 2342 mounted on the lower sample body 2331 and used for triggering the lower sample sensor 2341. Lower sample locating part 2342 slides with lower sample body 2331 together, and then slides to one side that is close to lower sample sensor 2341, can trigger lower sample sensor 2341 when lower sample locating part 2342 is close to lower sample sensor 2341, and then causes lower sample drive module 232 stop work, reaches spacing, the effect of location. In one embodiment, the bottom sample limit 2342 may be omitted, such that the bottom sample sensor 2341 is triggered through the bottom sample body 2331. In one embodiment, the down sample sensor 2341 may be a proximity sensor, a hall sensor, an infrared sensor, a photo coupler sensor, a pressure sensor, a point-contact switch type sensor, or the like.

Referring to fig. 9, the lower sample 233 and the lower sample limit module 234 can be omitted. In the lower sample transport assembly 23, the lower sample conveyor 2324 is disposed opposite to the third concession hole 5113. So as to extend into the sample application zone 103 into contact with the test tube rack 2. The lower sample conveyor 2324 performs the conveyance of the test tube rack 2 by the drive of the lower sample drive 2321. In some embodiments, a lower sample transmission shaft 2325 may be disposed on the lower sample substrate 231 to support the lower sample conveying belt 2324 in cooperation with the lower sample roller 2323, and the output shaft of the lower sample driving member 2321 may be in transmission connection with the lower sample transmission shaft 2325 through a transmission belt, a gear, and the like, so as to achieve the effects of dragging the lower sample conveying belt 2324 and collecting the test tube rack 2.

It will be appreciated that the sample loading transport assembly 21 may be identical in construction to the sample unloading transport assembly 23.

In the sample feeding mechanism 400 of the present application, when the test tube rack 2 carrying the test tube 1 is placed in the sample loading area 101, the sample loading driving module 212, for example, the sample loading driving member 2121, moves, so that the sample loading member 213 slides in the first direction toward the second enclosing plate 522 side. The sample application transport unit 21, for example, the sample application movable claw 2134 abuts against the test tube rack 2 and retracts into the offset hole 511, for example, the first offset hole 5111 or the installation space 401, and the sample application elastic member 2135 is elastically deformed.

Until the sample feeding assembly 21, such as the sample movable claw 2134, slides to the side of the test tube rack 2 close to the second enclosing plate 522 without abutting against the test tube rack 2, or until the sample limit stopper 2142 triggers the sample sensor 2141, the sample driving module 212, such as the sample driving member 2121, stops rotating. Under the restoring force generated by the elastic deformation of the sample application member 2135, the sample application transport unit 21, for example, the movable sample application claw 2134, protrudes from the abdicating hole 511, for example, the first abdicating hole 5111, and is in a stretched state. The sample application driving module 212, for example, the sample application driving member 2121, moves so that the sample application member 213 slides toward the first enclosing plate 521 side in the first direction.

The sample loading transport assembly 21, for example, the sample loading movable claw 2134 abuts against the test tube rack 2, the sample loading movable claw 2134 abuts against the sample loading main body 2131 for limiting, and does not retract into the abdicating hole 511, for example, the first abdicating hole 5111, and the sample loading transport assembly 21, for example, the sample loading movable claw 2134, drags the test tube rack 2 to the side of the first enclosing plate 521, so as to collect the test tube rack 2.

The rack 2 can trigger the sample detector 531, so that the loading driving module 212, such as the loading driving member 2121, stops moving. In some embodiments, the sample testing member 531 can be part of the sample loading conveyor assembly 21. In some embodiments, the loading conveyer assembly 21 may include a sample detector 531 installed between the loading substrate 211 and the loading member 213 to limit the loading movable claw 2134.

The sample transferring driving module 222, for example, the sample transferring driving member 2221, moves so that the sample transferring member 223 slides toward the third surrounding plate 523 in the second direction. The sample transfer member 223, for example, the sample transfer movable claw 2234 abuts against the test tube rack 2 and retracts into the offset hole 511, for example, the second offset hole 5112 or the mounting space 401, and the sample transfer elastic member 2235 is elastically deformed.

Until the sample moving limiting member 2242 triggers the sample moving sensor 2241, the sample moving driving module 222, for example, the sample moving driving member 2221, stops rotating. Under the restoring force of the specimen-removing elastic member 2235 due to the elastic deformation, the specimen-removing member 223, e.g., the specimen-removing movable claw 2234, protrudes from the concession hole 511, e.g., the second concession hole 5112, and is in a stretched state.

The sample shift driving module 222, for example, the sample shift driving member 2221, moves, so that the sample shift member 223 slides toward the side of the fourth surrounding plate 524 in the second direction. The sample transfer member 223, for example, the sample transfer movable claw 2234 abuts against the test tube rack 2, the sample transfer movable claw 2234 abuts against the sample transfer main body 2231 and is limited, and does not retract into the abdicating hole 511, for example, the second abdicating hole 5112, and further, the sample transfer member 223, for example, the sample transfer movable claw 2234 drags the test tube rack 2 to move toward the side of the fourth surrounding plate 524. Meanwhile, the test tube rack 2 may trigger a sampling detection mechanism 532 such as an initial position detection member 5321, thereby precisely controlling the movement of the test tube rack 2 so that each test tube passes through a sampling position and is sampled by the apparatus main body 200.

When the test tube rack 2 triggers the sampling detection mechanism 532 such as the end position detection piece 5322, it is clear that sampling of the apparatus main body 200 is completed. In some embodiments, the sampling detection mechanism 532 may be part of the sample loading conveyor assembly 21, and thus the sample shift limiting module 224 may be omitted. In some embodiments, the sample loading transport assembly 21 may include a sample detection mechanism 532 disposed between the sample transfer base 221 and the sample transfer member 223 to limit the position of the sample transfer movable claw 2234.

When the sample moving limiting part 2242 triggers the sample moving sensor 2241, it can be known that the test tube rack 2 can be dragged into the sample unloading area 103. Further, the sample shift driving module 222, for example, the sample shift driving element 2221, is stopped.

At the same time, the lower sample driving module 232, for example, the lower sample driving member 2321, moves, so that the lower sample member 233 slides toward the first enclosing plate 521 side in the third direction. The lower sample transport unit 23, for example, the lower sample movable claw 2334 abuts against the tube rack 2 and retracts into the offset hole 511, for example, the third offset hole 5113 or the installation space 401, and the lower sample elastic member 2335 is elastically deformed.

Until the lower sample transport assembly 23, for example, the lower sample movable claw 2334, slides to be located on the side of the test tube rack 2 close to the first enclosing plate 521 without abutting against the test tube rack 2, or until the lower sample limiting member 2342 triggers the lower sample sensor 2341, the lower sample driving module 232, for example, the lower sample driving member 2321, stops rotating.

Under the restoring force of the lower sample elastic member 2335 due to the elastic deformation, the lower sample transport assembly 23, e.g., the lower sample movable claw 2334, protrudes from the abdicating hole 511, e.g., the third abdicating hole 5113, and is in a stretched state. The lower sample driving module 232, for example, the lower sample driving member 2321, moves so that the lower sample member 233 slides toward the second enclosing plate 522 side in the third direction. The lower sample transport assembly 23, such as the lower sample movable claw 2334, abuts against the test tube rack 2, the lower sample movable claw 2334 abuts against the lower sample body 2331 to limit the position without retracting to the abdicating hole 511, such as the third abdicating hole 5113, and the lower sample transport assembly 23, such as the lower sample movable claw 2334, drags the test tube rack 2 to move towards the side of the second enclosing plate 522 to collect the test tube rack 2.

The rack 2 may trigger the lower sample detection mechanism 533, which may stop the movement of the lower sample transport assembly 23, such as the lower movable claw 2334. In some embodiments, the sample run detection mechanism 533 may be part of the sample run transport assembly 23. In some embodiments, the lower sample transport assembly 23 can include a lower sample detection mechanism 533 mounted between the sample transfer substrate 221 and the sample transfer member 223 to position the lower sample movable claw 2334.

The test tube racks 2 can be stored in the sample unloading area 103 through the process, when the sample unloading full load detection piece 5331 and the sample unloading in-place detection piece 5332 are triggered simultaneously or the triggering time exceeds the target time, the judgment can be made that the test tube racks 2 are already stored in the sample unloading area 103, and the test tube racks 2 need to be taken away manually.

The sample feeding mechanism 400 in the present application can continuously provide enough test tubes 1 with samples for the apparatus main body 200, and can improve the detection efficiency.

In the several embodiments provided in the present application, it should be understood that the disclosed method and apparatus may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, a division of modules or units is merely a logical division, and an actual implementation may have another division, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed.

Units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiment.

In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each of the units may exist alone physically, or two or more units may be integrated into one unit. The integrated unit may be implemented in the form of hardware, or may also be implemented in the form of a software functional unit.

The above description is only an example of the present application and is not intended to limit the scope of the present application, and all modifications of equivalent structures and equivalent processes, which are made by the contents of the specification and the drawings, or which are directly or indirectly applied to other related technical fields, are intended to be included within the scope of the present application.

Claims (14)

1. A sample analyzer, comprising:

send a kind mechanism for place the sample, send a kind mechanism to include:

the device comprises a shell, a sample loading area, a sample unloading area and a sampling area, wherein the sampling area is communicated with the sample loading area and the sample unloading area;

the sample unloading conveying assembly is arranged corresponding to the sample unloading area and used for dragging and collecting the samples in the sampling area in the sample unloading area;

the device comprises a device body and a sampling area, wherein the device body is used for sampling a sample in the sampling area and detecting the sample and comprises a first detection module and a second detection module, the first detection module is used for carrying out first purpose detection on the sample, and the second detection module is used for carrying out second purpose detection on the sample; and

a display device disposed on the device body.

2. The sample analyzer of claim 1, wherein the lower sample transport assembly comprises:

the sample unloading sliding rail is arranged on the shell;

the sample unloading piece is connected with the sample unloading sliding rail in a sliding manner, can slide on the sample unloading sliding rail and is used for dragging and collecting the samples in the sampling area; and

and the lower sample driving module is arranged on the shell and used for driving the lower sample piece to slide on the lower sample sliding rail.

3. The sample analyzer as claimed in claim 2, wherein the sample transport assembly further comprises:

and the sample dropping sensor is arranged on the sample dropping piece or the shell and used for limiting the sample dropping piece.

4. The sample analyzer of claim 2, wherein the sample piece comprises:

the sample unloading main body is connected with the sample unloading slide rail in a sliding manner so as to be capable of sliding on the sample unloading slide rail;

the sample unloading claw hook is arranged on the sample unloading body, responds to the sample unloading body sliding to one side on the sample unloading slide rail and is in contact with the sample in the sample unloading area so as to drag and collect the sample in the sample unloading area, and responds to the sample unloading body sliding to the other side on the sample unloading slide rail and exits from the sample unloading area.

5. The sample analyzer as claimed in claim 1, wherein the lower sample transport assembly comprises:

the sample unloading driving part is arranged on the shell;

the lower sample conveyor belt is correspondingly arranged in the lower sample area and is in transmission connection with the lower sample driving piece, so that samples in the sampling area are dragged and collected under the driving of the lower sample driving piece.

6. The sample analyzer of claim 1, wherein the sample presentation mechanism further comprises:

and the sample loading conveying assembly is arranged corresponding to the sample loading area and used for dragging and collecting the sample in the sample loading area to a first preset position in the sample loading area so as to convey the sample to the sample loading area.

7. The sample analyzer of claim 6 wherein the upper sample transport assembly is identical in construction to the lower sample transport assembly.

8. The sample analyzer of claim 1, wherein the sample loading zone, the sample unloading zone, and the sample sampling zone are grooves disposed on a surface of the housing.

9. The sample analyzer of claim 1, wherein the first detection module is configured to detect the sample for a first purpose of routine blood detection.

10. The sample analyzer of claim 1, wherein the second testing module is configured to test the sample for a second purpose selected from the group consisting of a specific protein test, a blood sedimentation test, and a glycated hemoglobin test.

11. A sample analyzer, comprising:

the sample processing device comprises a shell, a sample loading area, a sample unloading area and a sampling area, wherein the sampling area is communicated with the sample loading area and the sample unloading area;

the sample unloading conveying assembly is arranged corresponding to the sample unloading area and used for dragging and collecting the samples in the sampling area in the sample unloading area;

the sample unloading in-place detection part is arranged corresponding to the sample unloading area, the sample unloading in-place detection part is provided with a detection range for detecting a sample, the sample unloading conveying assembly is used for dragging the sample to one side of the sample unloading in-place detection part so as to collect the sample to the detection range, the sample unloading conveying assembly resets in response to the sample being positioned in the detection range, and the sample unloading in-place detection part pushes the sample to the outside of the detection range in response to the sample unloading conveying assembly resetting; and

the device comprises a device body, a sampling area and a detection area, wherein the device body is used for sampling samples in the sampling area and detecting the samples, and comprises a first detection module and a second detection module, the first detection module is used for carrying out first purpose detection on the samples, and the second detection module is used for carrying out second purpose detection on the samples; and

a display device disposed on the device body.

12. The sample analyzer as claimed in claim 11, wherein the lower position detecting member comprises:

a lower sample sensor having the detection range, an

And the elastic limiting part is in response to the fact that the sample is located in the detection range and is elastically deformed, and the elastic limiting part is in response to the fact that the lower sample conveying assembly resets and pushes the sample out of the detection range through restoring force generated by elastic deformation.

13. The sample analyzer of claim 11, wherein the lower sample transport assembly comprises:

and the sample dropping claw hook is arranged corresponding to the sample dropping area, can be configured to move towards one side to be contacted with the sample in the sample dropping area so as to drag and collect the sample in the sampling area, and can be configured to move towards the other side to exit the sample dropping area.

14. A sample analyzer, comprising:

send a kind mechanism for place the sample, send a kind mechanism to include:

the sample processing device comprises a shell, a sample loading area, a sample unloading area and a sampling area, wherein the sampling area is communicated with the sample loading area and the sample unloading area;

the sample unloading conveying assembly is arranged corresponding to the sample unloading area and comprises a sample unloading conveyor belt which is used for dragging and collecting samples in the sampling area;

the device comprises a device body, a sampling area and a detection area, wherein the device body is used for sampling samples in the sampling area and detecting the samples, and comprises a first detection module and a second detection module, the first detection module is used for carrying out first purpose detection on the samples, and the second detection module is used for carrying out second purpose detection on the samples; and

a display device disposed on the device body.

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