CN2177291Y - 一种x射线图形掩模 - Google Patents

一种x射线图形掩模 Download PDF

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Publication number
CN2177291Y
CN2177291Y CN 93244852 CN93244852U CN2177291Y CN 2177291 Y CN2177291 Y CN 2177291Y CN 93244852 CN93244852 CN 93244852 CN 93244852 U CN93244852 U CN 93244852U CN 2177291 Y CN2177291 Y CN 2177291Y
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China
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mask
ray
metal wire
substrate
tack coat
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Expired - Lifetime
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CN 93244852
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刘训春
陈梦真
叶甜春
钱鹤
王润梅
王玉玲
孙宝银
曹振亚
欧文
张学
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Institute of Microelectronics of CAS
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Institute of Microelectronics of CAS
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Abstract

本实用新型公开了一种用于半导体器件与集成 电路工艺的X射线图形掩模,它在掩模线条的侧边 设有能够透过X射线的属侧向支撑体,基片可为氮 化硅片,金属图形可以是金属线条形成的图形。这样 的结构能够提高掩模的合格率、可靠性以及使用寿 命。

Description

本实用新型涉及一种用于半导体器件与集成电路光刻工艺的X射线图形掩模的结构。
现有用于半导体器件与集成电路光刻工艺的X射线掩模,均为在透X射线的基片上粘附能够掩蔽X射线的金属图形,它要求金属图形具有足够的掩蔽厚度(例如用金作金属图形时一般要求金线条的厚度在1微米以上)。但X射线曝光在半导体光刻工艺中应用的主要特色是在于它具有高分辨率的超精细图形形成功能,所用掩模也必然均系精细图形的掩模,其金属线条的宽度一般小于1微米,甚至有时要比1微米小得多,由此形成具有较大厚宽比的金属线条极易引起弯曲、倒伏以及脱落,它严重影响掩模制造的合格率及其在使用中的可靠与耐用程度。
本实用新型的目的是为克服上述现有技术缺陷,提出一种具有高产品合格率、高可靠性以及长使用寿命的X射线掩模图形的结构。
为实现本实用新型目的所采取的技术措施是,在X射线图形掩模的金属线条侧边设置能够透过X射线并与掩模基片以及金属线条侧壁粘附的侧向支撑体。
侧向支撑体对金属线条的直立起支撑作用,使之不易弯曲、倒伏以及脱落,从而提高掩模的合格率、可靠性与耐用性。由于侧向支撑体能够透过X射线,它对X射线掩模特有的精细图形掩蔽功能没有不良影响。
下面结合附图与实施例对本实用新型X射线图形掩模作进一步具体说明。
图1为本实用新型X射线图形掩模一项实施例的局部示意俯视图。
图2为图1中A-A’断面处的示意剖视图。
图中1为氮化硅基片,2为金线条图形,3为薄层钛粘结层,4为侧向支撑体,5为二氧化硅支撑主体,6为薄层钛粘结层。
在本实用新型一项实施例中,用氮化硅作X射线掩模的基片(1),用金线条作掩模图形(2),在金线条掩模图形(2)与氮化硅基片之间用薄层钛作粘结层(3)。该项实施例的侧向支撑体(4)是由支撑主体(5)以及处于支撑主体(5)和金属线条(2)侧壁之间的粘结层(6)组成,并选用二氧化硅作支撑主体(5),选用薄层钛(6)作支撑主体(5)和金属线条(2)侧壁之间的粘结层。

Claims (4)

1、一种在基片上粘附金属图形的X射线图形掩模,其特征在于,它在掩模图形的金属线条侧边设置能够透过X射线并与掩模基片以及金属线条侧壁粘附的侧向支撑体。
2、按照权利要求1所述的X射线图形掩模,其特征为,所述基片为氮化硅片,所述金属图形是用金线条形成的图形,在所述基片与所述金属图形之间并有薄层钛作粘结层。
3、按照权利要求1所述的X射线图形掩模,其特征为,所述侧向支撑体是由支撑主体与粘结层组成,该粘结层处于该支撑主体与所述金属线条侧壁之间。
4、按照权利要求2和3所述的X射线掩模,其特征为,所述侧向支撑体是用二氧化硅作所述支撑主体,用薄层钛作所述支撑主体与所述金属线条侧壁之间的所述粘结层。
CN 93244852 1993-11-22 1993-11-22 一种x射线图形掩模 Expired - Lifetime CN2177291Y (zh)

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CN 93244852 CN2177291Y (zh) 1993-11-22 1993-11-22 一种x射线图形掩模

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Application Number Priority Date Filing Date Title
CN 93244852 CN2177291Y (zh) 1993-11-22 1993-11-22 一种x射线图形掩模

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CN2177291Y true CN2177291Y (zh) 1994-09-14

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1041974C (zh) * 1994-10-12 1999-02-03 现代电子产业株式会社 相移掩模及其制造方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1041974C (zh) * 1994-10-12 1999-02-03 现代电子产业株式会社 相移掩模及其制造方法

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