CN217314604U - Test equipment capable of realizing automatic classification after chip test - Google Patents
Test equipment capable of realizing automatic classification after chip test Download PDFInfo
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- CN217314604U CN217314604U CN202122835225.7U CN202122835225U CN217314604U CN 217314604 U CN217314604 U CN 217314604U CN 202122835225 U CN202122835225 U CN 202122835225U CN 217314604 U CN217314604 U CN 217314604U
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- 238000012360 testing method Methods 0.000 title claims abstract description 57
- 230000007246 mechanism Effects 0.000 claims abstract description 21
- 238000010438 heat treatment Methods 0.000 claims description 19
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 239000010937 tungsten Substances 0.000 claims description 4
- 238000001514 detection method Methods 0.000 abstract description 5
- 238000000034 method Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- FGRBYDKOBBBPOI-UHFFFAOYSA-N 10,10-dioxo-2-[4-(N-phenylanilino)phenyl]thioxanthen-9-one Chemical compound O=C1c2ccccc2S(=O)(=O)c2ccc(cc12)-c1ccc(cc1)N(c1ccccc1)c1ccccc1 FGRBYDKOBBBPOI-UHFFFAOYSA-N 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/30—Nuclear fission reactors
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Abstract
The utility model discloses a can realize automatic classification's after chip test equipment relates to mechanical equipment technical field. The utility model provides a can realize automatic classification's after chip test equipment, includes the testboard, testboard one side is provided with moving mechanism, and moving mechanism includes the slider, slider top fixedly connected with automatic classification anchor clamps, and automatic classification anchor clamps include the diaphragm, diaphragm one end bottom fixedly connected with thermocouple, and wherein, thermocouple bottom swing joint has the fixed plate, fixed plate one end top fixedly connected with brake lever, fixed plate one end bottom fixedly connected with nested piece, fixed plate top fixedly connected with quarter butt. The utility model discloses the device passes through the setting of testboard, automatic classification anchor clamps etc for the device can be comparatively simple and convenient carry out the high temperature test of chip, and realize that automatic chip is categorised, and the structure is compared comparatively simply in current chip detection device, and the cost is lower relatively.
Description
Technical Field
The utility model relates to a mechanical equipment technical field specifically is a can realize automatic classification's after chip test equipment.
Background
The chip test process is an important process in the semiconductor integrated circuit manufacturing process, and is to place the packaged chip in various environments to test the electrical performance, such as response time, power consumption, accuracy and noise, operation speed, voltage withstand voltage, and the like. Typically, the subsequent testing of a product will pass hundreds or thousands of test entries, and failure of any one entry will result in a failure of the chip. Some of the electrical parameters may drift or change to some extent with respect to the change of temperature, so that in order to ensure the reliability of the chip in later application, many products need to be tested at high temperature, low temperature and room temperature, which is called three-temperature test for short, especially for some automobile-grade and industrial-grade products.
In traditional chip high temperature test process, test platform's mechanism is complicated, and the cost is with high costs to still can cause categorised difficulty because the mechanism is complicated, still few carry out the modified scheme to this kind of condition on the market now, for this, the utility model provides a neotype solution.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a can realize automatic classification's after the chip test equipment to solve the problem of proposing among the above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a can realize automatic classification's after chip test equipment, including the testboard, testboard one side is provided with moving mechanism, moving mechanism includes the slider, slider top fixedly connected with automatic classification anchor clamps, automatic classification anchor clamps include the diaphragm, diaphragm one end bottom fixedly connected with thermocouple, wherein, thermocouple bottom swing joint has the fixed plate, fixed plate one end top fixedly connected with brake lever, fixed plate one end bottom fixedly connected with nested piece, fixed plate top fixedly connected with quarter butt, quarter butt top fixedly connected with stopper, stopper one end swing joint is on the thermocouple surface, the diaphragm top is provided with arrestment mechanism.
Preferably, the braking mechanism comprises a fixed rod, the top of the fixed rod is fixedly connected with an acting plate, the center of the top of the acting plate is fixedly connected with a first motor, the output end of the first motor is fixedly connected with a second threaded rod, the bottom of the second threaded rod is movably connected to the top of the transverse plate, a lifting plate is fixedly connected to the top of the brake rod, and one end of the lifting plate is movably connected to the surface of the second threaded rod.
Preferably, a return spring is arranged between the limiting block and the bottom of one end of the transverse plate, and the return spring is sleeved on the surface of the thermocouple.
Preferably, moving mechanism includes two curb plates, two curb plates fixed connection respectively are in testboard one side both ends, be provided with first threaded rod and gag lever post between two curb plates respectively, wherein, first threaded rod both ends difference swing joint is in two curb plates one side, gag lever post both ends fixed connection is between two curb plates, first threaded rod and gag lever post surface swing joint have the slider, slider top fixedly connected with electric telescopic handle, electric telescopic handle top fixed connection is in diaphragm one end bottom, one of them curb plate one side fixedly connected with second motor, second motor output end fixed connection is in first threaded rod one end.
Preferably, a heating groove is formed in the middle of the test board, and heating tungsten wires are arranged on two sides of the heating groove.
Preferably, a first placing groove and a second placing groove are respectively formed at two ends of the test board, wherein a chip placing table is arranged between the second placing groove and the heating groove, and the chip placing table is arranged at the top of the test board.
Compared with the prior art, the beneficial effects of the utility model are that:
(1) this can realize automatic classification's after chip testing test equipment, the device is through the setting of test and automatic classification anchor clamps etc for the device can be comparatively simple and convenient carry out the high temperature test of chip, and realize automatic chip classification, the structure is comparatively simple compared in current chip detection device, and the cost is lower relatively.
(2) According to the test equipment capable of realizing automatic classification after chip test, the device almost does not need manual operation in the test process through the arrangement of the test board, the moving mechanism and the like, the mechanism is clear and visible, and the maintenance and replacement costs are relatively low.
Drawings
Fig. 1 is a schematic diagram of the main structure of the present invention;
FIG. 2 is a schematic structural view of the automatic classification jig of the present invention;
FIG. 3 is a schematic view of the position enlarging structure of the sleeve block of the present invention;
fig. 4 is the left shaft side overlooking view structure schematic diagram of the utility model.
In the figure: 1. a test bench; 2. a heating tank; 3. heating a tungsten filament; 4. a first placing groove; 5. a second placing groove; 6. automatically classifying the clamps; 7. a chip placing table; 8. a limiting rod; 9. a first threaded rod; 10. a slider; 11. an electric telescopic rod; 12. a transverse plate; 13. a first motor; 14. fixing the rod; 15. a second threaded rod; 16. a return spring; 17. a thermocouple; 18. a fixing plate; 19. sleeving a block; 20. a limiting block; 21. a brake lever; 22. a lifting plate; 23. a second motor.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
It should be noted that, in the description of the present invention, the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, which is only for the convenience of description and simplification of the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.
Further, it will be appreciated that the dimensions of the various elements shown in the figures are not drawn to scale, for ease of description, and that the thickness or width of some layers may be exaggerated relative to other layers, for example.
It should be noted that like reference numerals and letters refer to like items in the following figures, and thus, once an item is defined or illustrated in one of the figures, it will not need to be further discussed or illustrated in detail in the description of the figures that follows.
As shown in fig. 1-4, the utility model provides a technical solution: a test device capable of realizing automatic classification after chip test comprises a test board 1, a moving mechanism is arranged on one side of the test board 1 and comprises a slide block 10, an automatic classification clamp 6 is fixedly connected to the top of the slide block 10 and comprises a transverse plate 12, a thermocouple 17 is fixedly connected to the bottom of one end of the transverse plate 12 and is a temperature measuring element commonly used in a temperature measuring instrument, the thermocouple 17 directly measures temperature and converts the temperature signal into a thermal electromotive force signal which is converted into the temperature of a measured medium through an electric instrument, wherein a fixing plate 18 is movably connected to the bottom of the thermocouple 17, a brake rod 21 is fixedly connected to the top of one end of the fixing plate 18, a sleeve block 19 is fixedly connected to the bottom of one end of the fixing plate 18, the bottom of the sleeve block 19 is made of a magnet material and used for adsorbing a chip, the height of the sleeve block 19 is not less than 30 cm, so that the sleeve block 19 can be immersed in a heating tank 2, and the thermocouple 17 is positioned above the heating groove 2 as much as possible, so as to ensure that the chip is heated and the thermocouple 17 is heated far less than the chip, and avoid the detection precision of the thermocouple 17 from being interfered, the top of the fixing plate 18 is fixedly connected with a short rod, the top of the short rod is fixedly connected with a limiting block 20, one end of the limiting block 20 is movably connected with the surface of the thermocouple 17, the thermocouple 17 passes through the fixing plate 18, and the bottom of the fixing plate 18 is exposed out of a contact rod of the thermocouple 17, the top of the transverse plate 12 is provided with a braking mechanism, the braking mechanism comprises a fixing rod 14, the top of the fixing rod 14 is fixedly connected with an acting plate, the center of the top of the acting plate is fixedly connected with a first motor 13, the first motor 13 is a stepping motor, the stepping motor has excellent start-stop and reversal response, and has no electric brush, so that the cost can be effectively controlled, and the use of the stepping motor not only has excellent control performance, but also can control the cost, the output end of the first motor 13 is fixedly connected with a second threaded rod 15, the bottom of the second threaded rod 15 is movably connected with the top of the transverse plate 12, wherein the top of the brake rod 21 is fixedly connected with a lifting plate 22, one end of the lifting plate 22 is movably connected with the surface of the second threaded rod 15, one end of the lifting plate 22 is provided with a threaded hole and is matched with the second threaded rod 15, a return spring 16 is arranged between the limiting block 20 and the bottom of one end of the transverse plate 12, the return spring 16 is sleeved on the surface of a thermocouple 17, the second threaded rod 15 can be acted on the lifting plate 22 by braking through the first motor 13, the lifting plate 22 is limited by the brake rod 21, the brake rod 21 is driven to lift under the action of the second threaded rod 15, when the brake rod 21 moves upwards, the fixing plate 18 and the sleeve block 19 can be driven to move upwards, the brake rod 21 can move for two-end distances under the action of the first motor 13, the second threaded rod 15 and the like, when the first section moves for a distance just short of the distance between the chip and the contact rod of the thermocouple 17, the thermocouple 17 can detect the temperature of the chip, and when the brake rod 21 moves upwards continuously, the negative distance is reserved between the chip and the thermocouple 17, and the chip can fall off under the jacking action of the thermocouple 17.
For guaranteeing the smooth implementation of this scheme, it is to understand, moving mechanism includes two curb plates, two curb plates are fixed connection respectively in 1 one side both ends of testboard, be provided with first threaded rod 9 and gag lever post 8 between two curb plates respectively, wherein, first threaded rod 9 both ends difference swing joint is in two curb plates one side, 8 both ends fixed connection of gag lever post are between two curb plates, first threaded rod 9 and 8 surperficial swing joint of gag lever post have slider 10, slider 10 top fixedly connected with electric telescopic handle 11, 11 top fixedly connected in diaphragm 12 one end bottoms of electric telescopic handle, one of them curb plate one side fixedly connected with second motor 23, second motor 23 output end fixed connection is in 9 one end of first threaded rod.
In order to ensure that the scheme is the best preferred scheme, it needs to be understood that a heating groove 2 is formed in the middle of a test board 1, heating tungsten wires 3 are arranged on two sides of the heating groove 2, the heating groove 2 is heated by the device, so that a chip receives a temperature test, a first placing groove 4 and a second placing groove 5 are formed in two ends of the test board 1 respectively, a chip placing table 7 is arranged between the second placing groove 5 and the heating groove 2, and the chip placing table 7 is arranged at the top of the test board 1.
When the device is used, a chip to be tested is placed on the chip placing table 7, the automatic classification clamp 6 is suspended right above the chip placing table 7 through the moving mechanism, the height of the automatic classification clamp 6 is controlled through the electric telescopic rod 11, the chip is sucked up, the chip is moved into the heating groove 2 to be subjected to high-temperature testing, the chip is moved out of the heating groove 2 after the testing is completed, temperature detection is carried out through the thermocouple 17 on the automatic classification clamp 6, whether the chip is qualified in the temperature detection is judged, the chip is moved to the first placing groove 4 or the second placing groove 5 through the automatic classification clamp 6 and is ejected out, classification is completed, and the first placing groove 4 and the second placing groove 5 are used for placing the qualified or unqualified chip.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. The utility model provides a can realize automatic classification's after chip test equipment, includes testboard (1), its characterized in that: testboard (1) one side is provided with moving mechanism, moving mechanism includes slider (10), slider (10) top fixedly connected with automatic classification anchor clamps (6), automatic classification anchor clamps (6) are including diaphragm (12), diaphragm (12) one end bottom fixedly connected with thermocouple (17), wherein, thermocouple (17) bottom swing joint has fixed plate (18), fixed plate (18) one end top fixedly connected with brake lever (21), fixed plate (18) one end bottom fixedly connected with nested piece (19), fixed plate (18) top fixedly connected with quarter butt, quarter butt top fixedly connected with stopper (20), stopper (20) one end swing joint is on thermocouple (17) surface, diaphragm (12) top is provided with arrestment mechanism.
2. The testing device of claim 1, wherein the testing device is capable of automatically classifying chips after testing, and comprises: the brake mechanism comprises a fixing rod (14), the top of the fixing rod (14) is fixedly connected with an acting plate, the center of the top of the acting plate is fixedly connected with a first motor (13), the output end of the first motor (13) is fixedly connected with a second threaded rod (15), the bottom of the second threaded rod (15) is movably connected to the top of a transverse plate (12), a lifting plate (22) is fixedly connected to the top of a brake rod (21), and one end of the lifting plate (22) is movably connected to the surface of the second threaded rod (15).
3. The testing device of claim 1, wherein the device is capable of automatically sorting chips after testing, and comprises: and a return spring (16) is arranged between the limiting block (20) and the bottom of one end of the transverse plate (12), and the return spring (16) is sleeved on the surface of the thermocouple (17).
4. The testing device of claim 1, wherein the testing device is capable of automatically classifying chips after testing, and comprises: moving mechanism includes two curb plates, two curb plates fixed connection respectively in testboard (1) one side both ends, be provided with first threaded rod (9) and gag lever post (8) between two curb plates respectively, wherein, first threaded rod (9) both ends difference swing joint in two curb plates one side, gag lever post (8) both ends fixed connection is between two curb plates, first threaded rod (9) and gag lever post (8) surface swing joint have slider (10), slider (10) top fixedly connected with electric telescopic handle (11), electric telescopic handle (11) top fixed connection is in diaphragm (12) one end bottom, one of them curb plate one side fixedly connected with second motor (23), second motor (23) output end fixed connection is in first threaded rod (9) one end.
5. The testing device of claim 1, wherein the testing device is capable of automatically classifying chips after testing, and comprises: a heating groove (2) is formed in the middle of the test board (1), and heating tungsten wires (3) are arranged on two sides of the heating groove (2).
6. The testing device of claim 1, wherein the testing device is capable of automatically classifying chips after testing, and comprises: a first placing groove (4) and a second placing groove (5) are formed in the two ends of the test bench (1) respectively, a chip placing table (7) is arranged between the second placing groove (5) and the heating groove (2), and the chip placing table (7) is arranged at the top of the test bench (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122835225.7U CN217314604U (en) | 2021-11-18 | 2021-11-18 | Test equipment capable of realizing automatic classification after chip test |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122835225.7U CN217314604U (en) | 2021-11-18 | 2021-11-18 | Test equipment capable of realizing automatic classification after chip test |
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| CN217314604U true CN217314604U (en) | 2022-08-30 |
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| CN202122835225.7U Active CN217314604U (en) | 2021-11-18 | 2021-11-18 | Test equipment capable of realizing automatic classification after chip test |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116213304A (en) * | 2023-03-22 | 2023-06-06 | 深圳市立能威微电子有限公司 | Sorting method and system for power supply chips |
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2021
- 2021-11-18 CN CN202122835225.7U patent/CN217314604U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116213304A (en) * | 2023-03-22 | 2023-06-06 | 深圳市立能威微电子有限公司 | Sorting method and system for power supply chips |
| CN116213304B (en) * | 2023-03-22 | 2024-04-23 | 深圳市立能威微电子有限公司 | Sorting method and system for power supply chips |
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| Date | Code | Title | Description |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20240116 Address after: 300400 No.58 Shuangjiang Road, Shuangjie Town, Beichen District, Tianjin Patentee after: Tianjin Guoxin Zhichuang Technology Co.,Ltd. Address before: 121000, No. 6-33 Nanguang Road, Taihe District, Jinzhou City, Liaoning Province Patentee before: Zhang Wei Effective date of registration: 20240116 Address after: 121000, No. 6-33 Nanguang Road, Taihe District, Jinzhou City, Liaoning Province Patentee after: Zhang Wei Address before: Plant No. 1, No. 4, Xinghong 2nd Street, Pinger Village, Shibi Street, Panyu District, Guangzhou City, Guangdong Province, 510000 Patentee before: Luo Yan |
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| TR01 | Transfer of patent right |