CN217085045U - A butt-joint structure that is arranged in probe and testing board of integrated circuit test equipment - Google Patents
A butt-joint structure that is arranged in probe and testing board of integrated circuit test equipment Download PDFInfo
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- CN217085045U CN217085045U CN202220592449.1U CN202220592449U CN217085045U CN 217085045 U CN217085045 U CN 217085045U CN 202220592449 U CN202220592449 U CN 202220592449U CN 217085045 U CN217085045 U CN 217085045U
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Abstract
The utility model relates to the technical field of integrated circuit testing, and discloses a butt joint structure of a probe and a test board for integrated circuit testing equipment, which comprises a testing platform, wherein a probe head mounting seat is arranged on the testing platform, and a plurality of probe heads are arranged on the probe head mounting seat; the probe lifting mechanism is used for driving the probe head mounting seat to perform lifting motion; the test board reinforcing rib is used for mounting a test board card and is detachably and fixedly connected with the test platform; the probe head and the test board card are contacted and separated in the process that the probe head mounting base is driven by the probe lifting mechanism to move up and down; the utility model provides a pair of a butt-joint structural for probe among the integrated circuit test equipment and survey test panel has solved among the prior art problem that the installation test integrated circuit board appears bending even to probe needle point wearing and tearing easily.
Description
Technical Field
The utility model relates to an integrated circuit tests technical field, concretely relates to a butt-joint structural that is arranged in probe and survey test panel of integrated circuit test equipment.
Background
In the existing semiconductor chip test equipment, a probe head is mostly fixed on a test interface board, a spring is arranged in the probe, after a test circuit board is contacted with the probe, a reinforcing rib provided with the test circuit board is pressed down through a labor-saving structure and is finally butted and fixed with the probe head, and the test circuit board presses down a compression amount reaction force generated by the spring in the probe so as to ensure tight butt joint and ensure the butt joint quality.
In the prior art, a traditional probe head is fixed on a test interface board, a probe protrudes out of a test platform, and the risk of mistaken collision exists in the carrying process, so that the probe is damaged. In addition, the probe head is fixed, survey under the test panel and push down the locking mode, survey the test panel and need place earlier in the probe top, survey the whole weight of test panel this moment and support by the inside spring elasticity of probe, survey the artifical in-process of placing of test panel and can not guarantee that whole test panel level is placed, push down the in-process and can aggravate the probe needle point wearing and tearing when having the inclination, bend even.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a butt joint structure that is arranged in probe and survey test panel of integrated circuit test equipment for solve at least one above-mentioned problem that exists among the prior art.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
a butt joint structure of a probe and a test board for integrated circuit test equipment comprises a test platform, wherein a probe head mounting seat is mounted on the test platform, and a plurality of probe heads are mounted on the probe head mounting seat; the probe lifting mechanism is used for driving the probe head mounting seat to perform lifting motion; the test board reinforcing rib is used for mounting a test board card and is detachably and fixedly connected with the test platform; the probe lifting mechanism drives the probe head mounting base to move up and down, and the contact and separation of the probe head and the test board card are realized.
According to the technical scheme, as the probe heads are arranged on the probe head mounting seat, the probe head mounting seat is driven by the probe lifting mechanism to perform lifting movement, so that the overall lifting movement of the probe heads is realized, the test board card is arranged on the test board reinforcing ribs, the test board reinforcing ribs on which the test board card is arranged form the test board card assembly, so that the test board card assembly is conveniently and integrally moved to the test platform and locked for installation, and the probe lifting mechanism can drive the probe head mounting seat to be at the lowest position before the test board card assembly is arranged in the specific using process, the test board card cannot be directly contacted with the probe heads in the test board card assembly arranging process, so that the problem that the test board card needs to be directly arranged above the probe heads in the existing test board card arranging process is solved, the whole weight of the test board card is supported by the elastic force of the spring in the probe, and under the condition that the horizontal placement cannot be guaranteed, the probe tip abrasion and even bending can be aggravated in the process of pressing down the test board card due to the existence of the inclination angle. Because survey test panel strengthening rib and the detachable fixed connection of test platform, also namely after accomplishing the locking installation of test card subassembly, then accessible probe elevating system drive probe head mount pad shifts up, because the position locking of test card subassembly, at the probe head along with the in-process that the probe head mount pad shifted up, the probe head can realize with test card in close contact with to ensure the butt joint quality.
Furthermore, a test area is arranged on the test platform, the test area is an area used for accommodating the probe head mounting seat, an opening area is formed in the test area on the test platform, and the upper end of the probe head does not exceed the opening end of the opening area when the probe head is located at the lowest position.
Because the upper end of the probe does not exceed the open end of the opening area when the probe is located at the lowest position, namely, the probe does not protrude out of the test platform when the test platform is in a non-working state, and the probe is prevented from being damaged by mistaken collision in the process of carrying the equipment.
Further, the probe lifting mechanism comprises a translation component, and the translation component moves horizontally under the action of the driving mechanism; a guide member that guides horizontal movement of the translation member; the probe plug lifting seat is fixedly connected with the probe head mounting seat, and the probe plug lifting seat performs vertical lifting action in the translation process of the translation component; and the guide column is vertically matched with the probe plug lifting seat in a sliding manner.
The guide part gives the guide effect at translation part translation in-process, and probe plug lift seat is owing to with probe head mount pad fixed connection, moves along with the translation part translation in-process at probe plug lift seat, and the guide post can inject the vertical lift of probe plug lift seat, and whole structural design is compact, and the action links up, can change the horizontal migration of translation part into the vertical lift action of probe plug lift seat smoothly. Specifically, the position of the guide column is relatively fixed, and the guide column can be fixed on the test platform.
Further, the translation part includes left side frame and right side frame, the both sides of left side frame and right side frame are equipped with the translation gyro wheel respectively, the translation gyro wheel includes inboard gyro wheel and outside gyro wheel, inboard gyro wheel is located the inboard of left side frame and right side frame, the outside gyro wheel is located the outside of left side frame and right side frame, the guide part sets up the translation spout in the left side frame and the right side frame outside including the symmetry, be equipped with the horizontal bar groove on the translation spout, outside gyro wheel and the horizontal bar groove sliding fit who corresponds, be equipped with the slope spout on the probe plug lift seat, inboard gyro wheel and the slope spout sliding fit that corresponds.
Specifically, the translation part is frame structure, because the translation part includes left side frame and right side frame, in order to guarantee the stability of translation part translation under the actuating mechanism drive and the drive of translation action to probe plug lift seat, consequently be equipped with the translation gyro wheel respectively in the both sides of left side frame and right side frame, when translation part horizontal migration, outside gyro wheel and the horizontal bar groove sliding fit that corresponds, then can inject the horizontal migration of translation part, in addition, because inboard gyro wheel and the slope spout sliding fit that corresponds, combine the perpendicular guide of guide post to probe plug lift seat, the realization is to the lift drive of probe plug lift seat. It should be noted that the position of the guide post is relatively fixed, and may also be fixedly installed with the translation chute.
Furthermore, in order to conveniently realize the locking and installation of the reinforcing ribs of the test board, the test board further comprises a locking structure, the locking structure is used for locking the position of the reinforcing ribs of the test board, the locking structure is arranged between the reinforcing ribs of the test board and the probe lifting mechanism, and the locking linkage operation of the locking structure is realized through the lifting action of the probe lifting mechanism. That is, be convenient for realize the locking to the test panel strengthening rib when shifting up the probe head, make probe elevating system and locking structure simultaneous movement until the contact locking.
Further, in order to turn into the translation action of translation part to the locking installation of surveying test panel strengthening rib, the installation is gone up survey test panel strengthening rib formation test panel card subassembly of test panel card, the locking structure is including surveying the test panel latch segment, survey the test panel latch segment and fix on translation part, survey and be equipped with the locking spout on the test panel latch segment, the up end that the locking spout has opening and locking spout is the inclined plane, the both ends of surveying the test panel strengthening rib are equipped with locking roller, after locking roller got into the locking spout from opening department, under the horizontal migration state of surveying the test panel latch segment, the testing panel card subassembly is pushed down gradually to the locking spout.
Because survey test panel latch segment and fixing on the translation part, survey test panel latch segment and can carry out equidirectional horizontal migration along with the translation part, owing to be equipped with the locking spout on surveying the panel latch segment, the up end that the locking spout has opening and locking spout is the inclined plane, and the locking gyro wheel can get into the locking spout from opening department, later under the guide on inclined plane, the locking spout can realize pushing down continuously of locking gyro wheel to the realization is to the locking that compresses tightly of test board card subassembly. Thereby facilitating intimate contact with the test card during movement of the probe head.
Furthermore, in order to conveniently locate and install the reinforcing ribs of the test board, a locating structure which is convenient to locate and install is arranged on the test platform and between the reinforcing ribs of the test board.
Further, in order to provide a specific positioning and mounting structure, the positioning structure comprises a positioning pin arranged on the test platform and a positioning hole arranged on the reinforced rib of the test board, and the positioning hole is butted with the positioning pin. It should be noted that, the locating holes are relatively arranged on both sides of the reinforcing rib of the test board, and the locating pins are arranged at corresponding positions on the test platform.
Further, in order to provide a simple driving mode and a simple structural design, the driving mechanism comprises a rocker arm and a connecting rod structure, the rocker arm drives the connecting rod structure to act, and the connecting rod structure drives the translation component to move horizontally. It should be noted that the connecting rod structure of the design can drive two translation parts at the same time, so that the lifting driving of the probe heads in two test areas on the test platform is realized at the same time, and further, the more efficient test work is carried out.
Furthermore, in order to realize the complete locking of the locking blocks of the test boards and avoid the relative movement between the locking blocks of the test boards and the locking rollers, the test board locking device also comprises a knob plunger, and a plug hole which is plugged with the knob plunger is arranged on any locking block of the test boards.
The utility model has the advantages that: according to the technical scheme, as the probe heads are arranged on the probe head mounting seat, the probe head mounting seat is driven by the probe lifting mechanism to perform lifting movement, so that the overall lifting movement of the probe heads is realized, the test board card is arranged on the test board reinforcing ribs, the test board reinforcing ribs on which the test board card is arranged form the test board card assembly, so that the test board card assembly is conveniently and integrally moved to the test platform and locked for installation, and the probe lifting mechanism can drive the probe head mounting seat to be at the lowest position before the test board card assembly is arranged in the specific using process, the test board card cannot be directly contacted with the probe heads in the test board card assembly arranging process, so that the problem that the test board card needs to be directly arranged above the probe heads in the existing test board card arranging process is solved, the whole weight of the test board card is supported by the elastic force of the spring in the probe, and under the condition that the horizontal placement cannot be guaranteed, the probe tip abrasion and even bending can be aggravated in the process of pressing down the test board card due to the existence of the inclination angle. Because survey test panel strengthening rib and the detachable fixed connection of test platform, also namely after accomplishing the locking installation of test card subassembly, then accessible probe elevating system drive probe head mount pad shifts up, because the position locking of test card subassembly, at the probe head along with the in-process that the probe head mount pad shifted up, the probe head can realize with test card in close contact with to ensure the butt joint quality.
The design enables the probe head to be conveniently lowered to the position below the test plane in the carrying process of the equipment, so that the probe is protected, and the error touch is prevented. During the test, all put test board card subassembly earlier in on the test plane, test board card lower surface this moment does not contact with the probe top, and during locking, the probe is from upwards stretching out perpendicularly down and test board card lower plane contact, reduces probe wearing and tearing, and thereby can not be because of there being the tilting force probe of buckling.
Drawings
FIG. 1 is a schematic structural view of the utility model in use;
FIG. 2 is a schematic structural view of the present invention;
FIG. 3 is a schematic structural view of the front and back sides of the test board assembly of the present invention;
FIG. 4 is a schematic structural view of the center subassembly of the present invention;
fig. 5 is a schematic structural view of the hidden test board of the present invention;
fig. 6 is a schematic structural diagram of the test platform of the present invention;
fig. 7 is a schematic view of a first partially enlarged structure of the present invention;
fig. 8 is a second partial enlarged structural schematic view of the present invention;
fig. 9 is a schematic bottom view of the present invention;
FIG. 10 is a schematic view of the hidden part of the present invention;
fig. 11 is a schematic structural view of the locking block of the middle test board of the present invention.
In the figure: a test platform 1; a probe head mounting base 2; a probe head 3; testing the plate reinforcing ribs 4; testing the board card 5; a test zone 6; a translation member 7; a probe plug lifting seat 8; a guide post 9; a left side frame 10; a right side frame 11; a translation roller 12; inner rollers 12.1; an outer roller 12.2; a translation chute 13; a horizontal strip-shaped groove 14; an inclined chute 15; a test board locking block 16; a locking chute 17; an opening 17.1; a bevel 17.2; a locking roller 18; a positioning pin 19; a positioning hole 20; a rocker arm 21; a link structure 22; a knob plunger 23; a first mount 24; a second mount 25; a first connecting seat 26; a second connecting seat 27; a first link 28; a second link 29; a third link 30; a fourth link 31; the rotating rod 32; an arc-shaped groove 33; a strip-shaped aperture 34; a leg 35; a guide seat 36; a slide bearing 37.
Detailed Description
Example 1:
as shown in fig. 1 to 11, the present embodiment provides a docking structure of a probe and a test board for use in an integrated circuit test apparatus, which includes a test platform 1, as shown in fig. 2 to 5, a probe head mounting seat 2 is installed on the test platform 1, and a plurality of probe heads 3 are installed on the probe head mounting seat 2; the probe lifting mechanism is used for driving the probe head mounting base 2 to perform lifting movement; the test board reinforcing rib 4 is used for mounting the test board card 5, and the test board reinforcing rib 4 is detachably and fixedly connected with the test platform 1; the probe head 3 is contacted with and separated from the test board card 5 in the process of driving the probe head mounting seat 2 to move up and down by the probe lifting mechanism.
According to the technical scheme, as the probe heads 3 are arranged on the probe head mounting seat 2, the probe head mounting seat 2 is driven by the probe lifting mechanism to move up and down, so that the whole lifting movement of the probe heads 3 is realized, the test board 5 is arranged on the test board reinforcing ribs 4, the test board reinforcing ribs 4 on which the test board 5 is arranged form the test board assembly, the test board assembly is conveniently and integrally moved to the test platform 1 and is locked and installed, the probe lifting mechanism can drive the probe head mounting seat to move up and down, so that the probe head mounting seat 2 can be driven to be at the lowest position by the probe lifting mechanism before the test board assembly is arranged in the specific use process, therefore, the test board 5 can not directly contact with the probe heads 3 in the process of arranging the test board assembly, and the problem that the test board 5 needs to be directly arranged above the probe heads 3 in the existing test board 5 arranging process is solved, the whole weight of the test board card 5 is supported by the elastic force of the spring in the probe, and under the condition that the horizontal placement cannot be guaranteed, the probe tip abrasion and even bending can be aggravated in the process that the test board card 5 is pressed down due to the existence of an inclination angle. Because survey test panel strengthening rib 4 and the detachable fixed connection of test platform 1, also accomplish the locking installation of test card subassembly afterwards, then accessible probe elevating system drive probe mount pad 2 moves up, because the position locking of test card subassembly, at probe 3 along with the in-process that the probe mount pad 2 moved up, probe 3 can realize with 5 in close contact with of test card to ensure the butt joint quality.
Example 2:
this embodiment is optimized based on embodiment 1 described above.
As shown in fig. 6, the testing platform 1 is provided with a testing area 6, the testing area 6 is an area for accommodating the probe head mounting seat 2, the testing area 6 forms an opening area on the testing platform 1, and the upper end of the probe head 3 does not exceed the opening end of the opening area when the probe head 3 is located at the lowest position.
Because the upper end of the probe head 3 does not exceed the open end of the opening area when the probe head 3 is located at the lowest position, namely, the test platform 1 is in a non-working state, the probe head 3 can not protrude out of the test platform 1, and the probe head 3 is prevented from being damaged by mistakenly touching in the process of carrying equipment.
Example 3:
this embodiment is optimized based on embodiment 1 described above.
As shown in fig. 7-9, the probe lifting mechanism comprises a translation part 7, and the translation part 7 moves horizontally under the action of a driving mechanism; a guide member that guides the horizontal movement of the translation member 7; the probe plug lifting seat 8 is fixedly connected with the probe head mounting seat 2, and the probe plug lifting seat 8 performs vertical lifting action in the translation process of the translation component 7; and the guide post 9 is vertically matched with the probe plug lifting seat 8 in a sliding manner, and the guide post 9 is vertically matched with the probe plug lifting seat 8 in a sliding manner.
The guide part gives the guide effect at translation part 7 translation in-process, and probe plug lift seat 8 is owing to with probe head mount pad 2 fixed connection, carries out the lift action at probe plug lift seat 8 along with translation part 7 translation in-process, and the guide post 9 can inject the vertical lift of probe plug lift seat 8, and whole structural design is compact, and the action links up, can change the horizontal migration of translation part 7 into the vertical lift action of probe plug lift seat 8 smoothly. Specifically, the position of the guiding column 9 is relatively fixed, and can be fixed on the testing platform 1.
Example 4:
this embodiment is optimized based on embodiment 3 described above.
As shown in figure 4 of the drawings, in which, 7-9, translation part 7 includes left side frame 10 and right side frame 11, translation gyro wheel 12 is equipped with respectively to the both sides of left side frame 10 and right side frame 11, translation gyro wheel 12 includes inboard gyro wheel 12.1 and outside gyro wheel 12.2, inboard gyro wheel 12.1 is located the inboard of left side frame 10 and right side frame 11, outside gyro wheel 12.2 is located the outside of left side frame 10 and right side frame 11, guide part includes the translation spout 13 that the symmetry set up in the left side frame 10 and the outside of right side frame 11, translation spout 13 is fixed in the below of test platform 1, be equipped with horizontal bar groove 14 on the translation spout 13, outside gyro wheel 12.2 and the horizontal bar groove 14 sliding fit that corresponds, probe plug lift seat 8 has two and the symmetry sets up the inboard at left side frame 10 and right side frame 11, be equipped with slope spout 15 on probe plug lift seat 8, inboard gyro wheel 12.1 and the slope spout 15 sliding fit that corresponds.
Specifically, translation part 7 is frame structure, because translation part 7 includes left side frame 10 and right side frame 11, in order to guarantee the stability of translation part 7 translation under the actuating mechanism drive and the drive of translation action to probe plug lift seat 8, consequently be equipped with translation gyro wheel 12 respectively in the both sides of left side frame 10 and right side frame 11, when translation part 7 horizontal migration, outside gyro wheel 12.2 and the horizontal bar groove 14 sliding fit that corresponds, then can inject the horizontal migration of translation part 7, in addition, because inboard gyro wheel 12.1 and the slope spout 15 sliding fit that corresponds, combine guide post 9 to the perpendicular guide of probe plug lift seat 8, realize the lift drive to probe plug lift seat 8. The position of the guide post 9 is fixed relatively, and may be fixed to the translation chute 13.
Example 5:
this embodiment is optimized based on embodiment 3 described above.
As shown in fig. 10 and 11, in order to facilitate the locking and installation of the test board reinforcing ribs 4, the test board further includes a locking structure, the locking structure is used for locking the positions of the test board reinforcing ribs 4, the locking structure is arranged between the test board reinforcing ribs 4 and the probe lifting mechanism, and the locking linkage operation of the locking structure is realized through the lifting action of the probe lifting mechanism. That is, the probe head 3 is conveniently moved upwards and simultaneously the test board reinforcing ribs 4 are locked, so that the probe lifting mechanism and the locking structure synchronously move until the probe lifting mechanism and the locking structure are in contact locking.
Example 6:
this embodiment is optimized based on embodiment 5 described above.
As shown in fig. 8, fig. 10 and fig. 11, in order to convert the translational motion of the translational component 7 into locking installation of the test board reinforcing rib 4, the test board reinforcing rib 4 on which the test board 5 is installed forms a test board assembly, the locking structure includes a test board locking block 16, the test board locking block 16 is fixed on the translational component 7, a locking sliding groove 17 is formed in the test board locking block 16, the locking sliding groove 17 has an opening 17.1, the upper end surface of the locking sliding groove 17 is an inclined surface 17.2, locking rollers 18 are arranged at two ends of the test board reinforcing rib 4, after the locking rollers 18 enter the locking sliding groove 17 from the opening 17.1, the locking sliding groove 17 gradually presses down the test board assembly in the horizontal moving state of the test board locking block 16. It should be noted that, as shown in fig. 6 and 11, a strip-shaped hole 34 is formed in the testing platform 1, a support leg 35 is arranged at the lower end of the locking chute 17, the support leg 35 and the strip-shaped hole 34 may be multiple, the testing board locking block 16 is located above the testing platform 1, the support leg 35 passes through the corresponding strip-shaped hole 34 and then is fixedly connected to the frame corresponding to the translation member 12, and the translation member 7 moves to drive the support leg 35 to move along the strip-shaped hole 34 and drive the testing board locking block 16 to translate along the testing platform 1.
Because survey test panel latch segment 16 and pass through the stabilizer blade 35 to be fixed on translation part 7, survey test panel latch segment 16 and can carry out equidirectional horizontal migration along with translation part 7, because be equipped with locking chute 17 on surveying test panel latch segment 16, locking chute 17 has opening 17.1 and locking chute 17's up end is inclined plane 17.2, locking roller 18 can get into locking chute 17 from opening 17.1 department, later under the guide of inclined plane 17.2, locking chute 17 can realize keeping down pressing locking roller 18, thereby realize the locking that compresses tightly to the test board card subassembly. Thereby facilitating intimate contact with the test card 5 during movement of the probe head 3.
Example 7:
this embodiment is optimized based on embodiment 1 described above.
As shown in fig. 2 and 4, in order to facilitate the positioning and installation of the test board reinforcing ribs 4, a positioning structure which facilitates the positioning and installation is arranged between the test platform 1 and the test board reinforcing ribs 4.
Example 8:
this embodiment is optimized based on embodiment 1 described above.
As shown in fig. 2 and 4, in order to provide a specific positioning and mounting structure, the positioning structure includes positioning pins 19 disposed on the test platform 1 and positioning holes 20 disposed on the test board reinforcing ribs 4, and the positioning holes 20 are butted against the positioning pins 19. It should be noted that the positioning holes 20 are oppositely disposed on two sides of the test board reinforcing rib 4, and the positioning pins 19 are disposed at corresponding positions on the test platform 1, or of course, the positioning holes may be disposed on the test platform 1, and the positioning pins are disposed on the test board reinforcing rib 4, so as to achieve the same positioning effect.
Example 9:
this embodiment is optimized based on embodiment 3 described above.
As shown in fig. 4, in order to provide a simple driving method and structure design, the driving mechanism includes a rocker arm 21 and a link structure 22, the rocker arm 21 drives the link structure 22 to move, and the link structure 22 drives the translation component 7 to move horizontally. It should be noted that the connecting rod structure 22 of the present design can drive the two translation components 7 at the same time, thereby simultaneously realizing the lifting drive of the probe heads 3 in the two test areas 6 on the test platform 1, and further performing more efficient test work.
As shown in fig. 7-10, it should be noted that a first mounting seat 24 and a second mounting seat 25 are arranged below the testing platform, a first connecting seat 26 and a second connecting seat 27 are respectively arranged on the two translation components 7, the connecting rod structure includes a first connecting rod 28, a second connecting rod 29, a third connecting rod 30, a fourth connecting rod 31 and a rotating rod 32, two ends of the rotating rod 32 are respectively rotatably matched with the first mounting seat 24 and the second mounting seat 25, the rocker arm 21 is fixedly connected with one end of the first connecting rod 28, the other end of the first connecting rod 28 is fixedly connected with one end of the rotating rod 32 extending out of the first mounting seat 24, one end of the second connecting rod 29 is rotatably connected with the rocker arm 21, and the other end of the second connecting rod 29 is rotatably connected with the first connecting seat 26; one end of the rotating rod 32 extending out of the second mounting seat 25 is fixedly connected with the third connecting rod 30, the other end of the third connecting rod 30 is rotatably connected with the fourth connecting rod 31, and the other end of the fourth connecting rod 31 is rotatably connected with the second connecting seat 27.
The driving mechanism is not limited to the design of the rocker arm 21 and the link structure 22 in the present design, and may be an automated driving mechanism, such as a motor, a cylinder, an electric push rod, or the like.
Example 10:
this embodiment is optimized based on embodiment 6 described above.
As shown in fig. 2 and 4, in order to completely lock the locking blocks 16 of the testing board and prevent the locking blocks 16 of the testing board from moving relative to the locking rollers 18, the testing board further comprises a knob plunger 23, the knob plunger 23 is mounted on the testing platform 1, and a plugging hole for plugging the knob plunger 23 is formed in any of the locking blocks 16 of the testing board.
It should be noted that, in order to avoid damaging the probe head during transportation or use, the technical scheme makes the test board 5 not contact with the probe head 3 when the test board assembly is placed in the test use of the test machine by the lifting function of the probe block, and the rocker arm 21 is connected with the test board locking block 16 and the probe plug lifting seat 8 through the connecting rod structure 22. When the rocker arm 21 is rotated, the locking action of the test board card assembly and the lifting action of the probe head are simultaneously driven, so that the test board card assembly and the probe head synchronously move until the test board card assembly and the probe head are contacted and locked.
It should be noted that, as shown in fig. 1, the test platform 1 is installed on a base, an arc groove 33 for limiting the movement direction of the rocker arm 21 is provided on the base, because the rocker arm 21 is connected with the link structure 22, the link structure 22 is driven by rotating in the arc groove 33 to drive the two translation components 7 to move, the translation rollers 12 are installed on the inner side and the outer side of the translation components 7, the translation rollers 12 are four groups, the inner side is two groups, the outer side is two groups, that is, the inner side roller 12.1 and the outer side roller 12.2 are two groups, and the two groups of outer side rollers 12.2 slide by using the translation chutes 13 which are arranged oppositely as supports and limits. This action simultaneously drives the following two actions.
The probe head 3 is lifted: the probe head 3 is installed on the probe head installation seat 2, the probe head installation seat 2 is connected with two probe plug lifting seats 8, when the translation component 7 slides in a translation mode, two groups of inner side rollers 12.1 slide in the inclined sliding grooves 15 of the probe plug lifting seats 8 to drive the probe plug lifting seats 8 to perform lifting action, the probe plug lifting seats 8 are limited in the vertical direction through the guide columns 9, the inner side rollers correspond to the guide columns 9, as shown in fig. 8 and 9, guide seats 36 are arranged below the guide columns 9, the guide seats 36 are fixedly connected with the translation sliding grooves 13, guide holes are formed in the guide seats 36, sliding bearings 37 are arranged between the guide holes and the guide columns 9, and the smoothness of guide can be further improved.
And (3) testing the locking action of the board card assembly: survey test panel latch segment 16 and translation part 7 and be connected, synchronous moving test panel latch segment 16 translation motion during translation part 7 translation motion surveys test panel latch segment 16 inside has locking spout 17, because locating hole 20 on the test panel card subassembly and the spacing of the locating pin 19 on the test platform 1, drive when translation part 7 translation motion and install and survey the locking gyro wheel 18 on survey test panel strengthening rib 4 and carry out the elevating movement to make the whole push down of test panel card subassembly.
Finally, it should be noted that: the above is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A kind of butt-joint structure of probe and testing board used in the integrated circuit test equipment, characterized by that: the test device comprises a test platform, wherein a probe head mounting seat is arranged on the test platform, and a plurality of probe heads are arranged on the probe head mounting seat; the probe lifting mechanism is used for driving the probe head mounting seat to perform lifting motion; the test board reinforcing rib is used for mounting a test board card and is detachably and fixedly connected with the test platform; the probe lifting mechanism drives the probe head mounting base to move up and down, and the contact and separation of the probe head and the test board card are realized.
2. A structure for interfacing a probe card and a test board in an integrated circuit test apparatus according to claim 1, wherein: the test platform is provided with a test area, the test area is an area for accommodating the probe head mounting seat, the test area forms an opening area on the test platform, and the upper end of the probe head does not exceed the opening end of the opening area when the probe head is located at the lowest position.
3. A structure for interfacing a probe card and a test board in an integrated circuit test apparatus according to claim 1, wherein: the probe lifting mechanism comprises a translation component which moves horizontally under the action of a driving mechanism; a guide member that guides horizontal movement of the translation member; the probe plug lifting seat is fixedly connected with the probe head mounting seat, and the probe plug lifting seat performs vertical lifting action in the translation process of the translation component; and the guide column is in vertical sliding fit with the probe plug lifting seat.
4. A structure for interfacing a probe card and a test board in an integrated circuit test apparatus according to claim 3, wherein: the translation part includes left side frame and right side frame, the both sides of left side frame and right side frame are equipped with the translation gyro wheel respectively, the translation gyro wheel includes inboard gyro wheel and outside gyro wheel, inboard gyro wheel is located the inboard of left side frame and right side frame, the outside gyro wheel is located the outside of left side frame and right side frame, the guide part sets up the translation spout in the left side frame and the right side frame outside including the symmetry, be equipped with the horizontal bar groove on the translation spout, outside gyro wheel and the horizontal bar groove sliding fit who corresponds, be equipped with the slope spout on the probe plug lift seat, inboard gyro wheel and the slope spout sliding fit that corresponds.
5. A structure for interfacing a probe card and a test board in an integrated circuit test apparatus according to claim 3, wherein: still include locking structure, locking structure is used for carrying out the locking of position to surveying test panel strengthening rib, locking structure sets up and surveys between test panel strengthening rib and the probe elevating system, and the lift action through probe elevating system realizes the locking linkage operation to locking structure.
6. A structure for interfacing a probe card and a test board in an integrated circuit test apparatus according to claim 5, wherein: the installation is gone up the test panel card and is surveyed test panel card strengthening rib formation test panel card subassembly, the locking structure is including surveying the test panel card locking block, survey the test panel locking block and fix on the translation part, be equipped with the locking spout on surveying the test panel locking block, the up end that the locking spout has opening and locking spout is the inclined plane, survey the both ends of surveying the test panel strengthening rib and be equipped with the locking gyro wheel, after the locking gyro wheel got into the locking spout from opening department, under the horizontal migration state of survey the test panel card locking block, the test panel card subassembly is pushed down gradually to the locking spout.
7. A structure for interfacing a probe card and a test board in an integrated circuit test apparatus according to claim 1, wherein: and a positioning structure which is convenient to position and install is arranged between the test platform and the test plate reinforcing rib.
8. A structure for interfacing a probe card and a test board in an integrated circuit test apparatus according to claim 7, wherein: the positioning structure comprises a positioning pin arranged on the test platform and a positioning hole arranged on the test plate reinforcing rib, and the positioning hole is in butt joint with the positioning pin.
9. A structure for interfacing a probe card and a test board in an integrated circuit test apparatus according to claim 3, wherein: the driving mechanism comprises a rocker and a connecting rod structure, the rocker drives the connecting rod structure to act, and the connecting rod structure drives the translation component to move horizontally.
10. A structure for interfacing a probe card and a test board in an integrated circuit test apparatus according to claim 6, wherein: the test board locking block is provided with a plug hole for plugging the knob plunger.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220592449.1U CN217085045U (en) | 2022-03-17 | 2022-03-17 | A butt-joint structure that is arranged in probe and testing board of integrated circuit test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220592449.1U CN217085045U (en) | 2022-03-17 | 2022-03-17 | A butt-joint structure that is arranged in probe and testing board of integrated circuit test equipment |
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| CN217085045U true CN217085045U (en) | 2022-07-29 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202220592449.1U Active CN217085045U (en) | 2022-03-17 | 2022-03-17 | A butt-joint structure that is arranged in probe and testing board of integrated circuit test equipment |
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| CN (1) | CN217085045U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116593863A (en) * | 2023-05-09 | 2023-08-15 | 上海捷策创电子科技有限公司 | Locking device of slide rail type probe interface board for chip test |
| CN116908500A (en) * | 2023-09-12 | 2023-10-20 | 上海泽丰半导体科技有限公司 | Method for disassembling and assembling probe tower of universal test platform |
-
2022
- 2022-03-17 CN CN202220592449.1U patent/CN217085045U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116593863A (en) * | 2023-05-09 | 2023-08-15 | 上海捷策创电子科技有限公司 | Locking device of slide rail type probe interface board for chip test |
| CN116593863B (en) * | 2023-05-09 | 2023-12-22 | 上海捷策创电子科技有限公司 | Locking device of slide rail type probe interface board for chip test |
| CN116908500A (en) * | 2023-09-12 | 2023-10-20 | 上海泽丰半导体科技有限公司 | Method for disassembling and assembling probe tower of universal test platform |
| CN116908500B (en) * | 2023-09-12 | 2023-12-01 | 上海泽丰半导体科技有限公司 | Method for disassembling and assembling probe tower of universal test platform |
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Address after: 230000 2 / F, east side of building D1, intelligent equipment science and Technology Park, 3963 Susong Road, Hefei Economic and Technological Development Zone, Anhui Province Patentee after: Yuexin Technology Co.,Ltd. Address before: 230000 2 / F, east side of building D1, intelligent equipment science and Technology Park, 3963 Susong Road, Hefei Economic and Technological Development Zone, Anhui Province Patentee before: Hefei Yuexin Semiconductor Technology Co.,Ltd. Address after: 230000 2 / F, east side of building D1, intelligent equipment science and Technology Park, 3963 Susong Road, Hefei Economic and Technological Development Zone, Anhui Province Patentee after: Hefei Yuexin Semiconductor Technology Co.,Ltd. Address before: 230000 2 / F, east side of building D1, intelligent equipment science and Technology Park, 3963 Susong Road, Hefei Economic and Technological Development Zone, Anhui Province Patentee before: Hefei Yuexin Semiconductor Technology Co.,Ltd. |
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