CN116593863B - Locking device of slide rail type probe interface board for chip test - Google Patents
Locking device of slide rail type probe interface board for chip test Download PDFInfo
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- CN116593863B CN116593863B CN202310515871.6A CN202310515871A CN116593863B CN 116593863 B CN116593863 B CN 116593863B CN 202310515871 A CN202310515871 A CN 202310515871A CN 116593863 B CN116593863 B CN 116593863B
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- 239000000523 sample Substances 0.000 title claims abstract description 65
- 238000012360 testing method Methods 0.000 title claims abstract description 43
- 210000001503 joint Anatomy 0.000 claims abstract description 134
- 239000011324 bead Substances 0.000 claims description 38
- 230000000149 penetrating effect Effects 0.000 claims description 20
- 230000000670 limiting effect Effects 0.000 claims description 13
- 238000003032 molecular docking Methods 0.000 claims description 11
- 230000001681 protective effect Effects 0.000 claims description 8
- 238000001514 detection method Methods 0.000 abstract description 8
- 238000010586 diagram Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention provides a locking device of a slide rail type probe interface board for chip test, which comprises: the device comprises a first group of linear guide rails, a second group of linear guide rails, a first butt joint block, a second butt joint block, a connecting rod, an operating block and an operating handle; the first butt joint block and the second butt joint block are respectively provided with a first group of clamping grooves and a second group of sliding grooves, and the first group of clamping grooves and the second group of clamping grooves are respectively in one-to-one correspondence with and are communicated with the first group of sliding grooves and the second group of sliding grooves; the first butt joint block and the second butt joint block are connected to the connecting rod through the first connecting device and the second connecting device; the operation handle is connected with the operation block and is used for pushing the connecting rod to drive the first butt joint block and the second butt joint block to move in a first direction and a second direction respectively, and the first direction and the second direction are opposite directions. According to the locking device for the slide rail type probe interface board for chip testing, provided by the invention, the straight guide rail and the butt joint block are arranged, so that the stroke of pressing down the probe interface board each time is consistent, and each time of detection is accurate and reliable.
Description
Technical Field
The invention relates to the technical field of chip testing, in particular to a locking device of a sliding rail type probe interface board for chip testing.
Background
A probe interface board (Prober Interface Board, abbreviated as PIB) is interposed between the tester probe station and the semiconductor wafer or chip, and PIB is one type of carrier board that is used primarily to establish electrical connection between measurements prior to semiconductor device packaging and automated test equipment (Automatic Test Equipment, abbreviated as ATE).
The existing probe interface board locking structure mainly comprises a straight locking type probe interface board locking structure and an internal pull-down type probe interface board locking structure. The locking structure of the direct locking type probe interface board is directly fixed through the locating pin and the fixing screw, the structure is simple and convenient, but the repeatability of the locking structure of the direct locking type probe interface board is not high, the pressing force of the probe interface board cannot be controlled, the installation is complex, and the detection efficiency is greatly reduced. The locking structure of the internal pull-down type probe interface board is complex, the number of parts is large, the product cost and the die cost are high, the volume space of the assembly is relatively large, and the appearance quality is not easy to control.
Therefore, it is desirable to provide a locking device for a slide rail type probe interface board for chip testing, which is used for solving the above-mentioned problems.
Disclosure of Invention
The invention aims to provide a locking device of a sliding rail type probe interface board for chip testing, which ensures that the stroke of pressing down the probe interface board is consistent each time by arranging two groups of clamping grooves and sliding grooves on a first butt joint block and a second butt joint block respectively, so that each detection is accurate and reliable.
The embodiment of the invention provides a locking device of a slide rail type probe interface board for chip test, which comprises the following components: the device comprises a first group of linear guide rails, a second group of linear guide rails, a first butt joint block, a second butt joint block, a connecting rod, an operating block and an operating handle;
the first butt joint block comprises a first surface, a second surface and a third surface, the second butt joint block comprises a fourth surface, a fifth surface and a sixth surface, and the first group of linear guide rails and the second group of linear guide rails are respectively arranged on the first surface of the first butt joint block and the fourth surface of the second butt joint block;
a first group of clamping grooves and a second group of clamping grooves are respectively formed in the second surface of the first butt joint block and the fifth surface of the second butt joint block, a first group of sliding grooves and a second group of sliding grooves are respectively formed in the third surface of the first butt joint block and the sixth surface of the second butt joint block, the first group of clamping grooves and the first group of sliding grooves are in one-to-one correspondence and are communicated, and the second group of clamping grooves and the second group of sliding grooves are in one-to-one correspondence and are communicated;
the first butt joint block is connected to the first end of the connecting rod through a first connecting device, and the second butt joint block is connected to the second end of the connecting rod through a second connecting device;
the first connecting device comprises a first corner block, a first bearing, a second bearing, a first universal joint and a first stud, wherein the first bearing is used for penetrating through the first corner block and the first universal joint to fix the first corner block on the first universal joint, the first bearing is also used for fixing the first corner block on a table top of the testing machine, the second bearing is used for penetrating through and fixing the first corner block and the first end of the connecting rod to fix the connecting rod on the first corner block, and the first stud is used for connecting the first corner block and the first universal joint;
the second connecting device comprises a second corner block, a third bearing, a fourth bearing, a second universal joint and a second double-head screw column, wherein the third bearing is used for penetrating through the second corner block and the second universal joint to fix the second corner block on the second universal joint, the third bearing is also used for fixing the second corner block on the table top of the testing machine, the fourth bearing is used for penetrating through the second corner block and the second end of the connecting rod to fix the connecting rod on the second corner block, and the second double-head screw column is used for connecting the second corner block and the second universal joint;
the operation handle is connected with the operation block, the operation block is arranged at the center of the connecting rod, the operation block is fixed on the connecting rod through a fifth bearing, the operation handle is used for pushing the connecting rod to drive the first butt joint block and the second butt joint block to move in a first direction and a second direction respectively, and the first direction and the second direction are opposite directions.
Preferably, the method further comprises:
the locking wave bead is fixed on the first butt joint block through the set screw, the locking wave bead is fixed on the positioning block through the set screw, and when the first butt joint block moves towards the first direction, the locking wave bead is clamped on the positioning block to achieve the limiting effect.
Preferably, the positioning block comprises an gradual-in angle and an arc notch, when the first butt joint block moves towards the first direction, the stop wave bead slides into the arc notch after being abutted against the gradual-in angle, and the stop wave bead is clamped at the positioning block to achieve the limiting effect.
Preferably, each of the first set of runners and the second set of runners includes a first plane, a second plane, and a stop, the first plane and the horizontal plane being at a first angle, the second plane and the horizontal plane being parallel, the stop being for stopping movement of the probe interface plate.
Preferably, the first angle is 3 ° to 5 °.
Preferably, the first set of clamping grooves and the first set of sliding grooves are respectively L-shaped, and the second set of clamping grooves and the second set of sliding grooves are respectively L-shaped.
Preferably, the first butt joint block and the second butt joint block are fixed on the first group of linear guide rails and the second linear guide rails respectively through a first group of screws.
Preferably, the connecting rod further comprises a protective cover, and the protective cover is fixed on the connecting rod, the first butt joint block and the second butt joint block through a second set of screws.
Preferably, a first group of cam bearings and a second group of cam bearings are arranged on the probe interface board, and the first group of cam bearings and the second group of cam bearings are respectively clamped into the first group of clamping grooves and the second group of clamping grooves.
Preferably, the operation handle is used for pushing the connecting rod to drive the first butt joint block and the second butt joint block to move in a first direction and a second direction respectively, and the operation handle comprises:
pushing the operation handle downwards to drive the connecting rod to move the first butt joint block and the second butt joint block, so that the first butt joint block and the second butt joint block move towards the first direction and the second direction respectively, the first direction and the second direction are opposite directions, the positions of the corresponding first group of clamping grooves and the corresponding second group of clamping grooves are misplaced, the stop wave beads are clamped on the positioning blocks to limit, and the probe interface board is locked;
and pushing back the operating handle upwards, wherein the stop wave beads are separated from the positioning blocks, the positions of the first group of clamping grooves and the second group of clamping grooves corresponding to the first butt joint blocks and the second butt joint blocks are restored, and the probe interface board is unlocked.
Compared with the prior art, the technical scheme of the embodiment of the invention has at least the following beneficial effects:
according to the locking device for the sliding rail type probe interface board for chip testing, the first group of clamping grooves and the second group of clamping grooves are respectively formed in the second surface of the first butt joint block and the fifth surface of the second butt joint block, the first group of sliding grooves and the second group of sliding grooves are respectively formed in the third surface of the first butt joint block and the sixth surface of the second butt joint block, the first group of clamping grooves and the first group of sliding grooves are in one-to-one correspondence and are communicated, the second group of clamping grooves and the second group of sliding grooves are in one-to-one correspondence and are communicated, and the consistency of pressing strokes of the probe interface board each time is ensured, so that each detection is accurate and reliable;
further, the first connecting device comprises a first corner block, a first bearing, a second bearing, a first universal joint and a first stud, wherein the first bearing is used for penetrating through the first corner block and the first universal joint to fix the first corner block on the first universal joint, the first bearing is also used for fixing the first corner block on the table top of the testing machine, the second bearing is used for penetrating through and fixing the first corner block and the first end of the connecting rod to fix the connecting rod on the first corner block, and the first stud is used for connecting the first corner block and the first universal joint; the second connecting device comprises a second corner block, a third bearing, a fourth bearing, a second universal joint and a second stud, wherein the third bearing is used for penetrating the second corner block and the second universal joint to fix the second corner block on the second universal joint, the third bearing is also used for fixing the second corner block on a table top of the testing machine, the fourth bearing is used for penetrating the second corner block and the second end of the connecting rod to fix the connecting rod on the second corner block, and the second stud is used for connecting the second corner block and the second universal joint, so that the movements of the first butt joint block and the second butt joint block on two sides can be linked;
further, by arranging the stop wave bead, the set screw and the flat head screw, the stop wave bead is fixed on the first butt joint block through the set screw, the stop wave bead is fixed on the positioning block through the flat head screw, and when the first butt joint block moves in the first direction, the stop wave bead is clamped on the positioning block to achieve the limiting effect, so that the first butt joint block and the second butt joint block achieve the limiting effect through the stop wave bead clamp on the positioning block when moving;
further, the novel connecting rod comprises a protective cover, wherein the protective cover is fixed on the connecting rod, the first butt joint block and the second butt joint block through screws, so that the movement of the connecting rod is protected, and meanwhile, the novel connecting rod has an attractive effect;
further, the operation handle is pushed downwards to drive the connecting rod to move the first butt joint block and the second butt joint block, so that the first butt joint block and the second butt joint block respectively move in a first direction and a second direction, the first direction and the second direction are opposite directions, the positions of the corresponding first group of clamping grooves and the second group of clamping grooves are misplaced, the stop wave beads are clamped on the positioning blocks for limiting, and the probe interface board is locked; the operation handle is pushed back upwards, the stop wave beads are separated from the positioning blocks, the positions of the first group of clamping grooves and the second group of clamping grooves corresponding to the first butt joint block and the second butt joint block are restored, the probe interface board is unlocked, and the probe interface board is enabled to be pressed down and limited accurately, so that accurate and reliable detection is guaranteed.
Drawings
FIG. 1 is a schematic diagram of a locking device of a slide rail type probe interface board for chip testing according to an embodiment of the present invention;
FIG. 2 is a schematic view of a locking device of a slide rail type probe interface board for chip testing according to an embodiment of the present invention, wherein the locking device comprises a locking ball and a first butt joint block;
FIG. 3 is another schematic view of a locking device of a slide rail type probe interface board for chip testing according to an embodiment of the present invention, wherein the locking device comprises a locking ball and a first docking block;
FIG. 4 is a schematic diagram of a first set of slots in a locking device of a slide-rail probe interface board for chip testing according to an embodiment of the present invention;
fig. 5 is another schematic structural diagram of a locking device of a slide rail type probe interface board for chip testing according to an embodiment of the present invention.
Reference numerals illustrate:
112. a second set of linear guide rails; 121. a first butt joint block; 122. a second butt joint block;
13. a connecting rod; 131. a first end of the connecting rod; 132. a second end of the connecting rod;
14. an operation block; 15. an operating handle; 1211. a first surface;
1212. a second surface; 1213. a third surface; 1221. a fourth surface;
1222. a fifth surface; 1223. a sixth surface; 1231. a first set of card slots;
1232. a second set of card slots; 1241. a first set of runners; 161. a first corner block;
162. a second corner block; 171. a first bearing; 173. a third bearing;
174. a fourth bearing; 175. a fifth bearing; 181. a first universal joint;
192. a second stud; 21. stopping the wave bead; 22. a set screw;
23. a flat head screw; 24. a positioning block; 241. an angle of approach;
242. arc notch; 12121. a first plane; 12122. a second plane;
12123. a stop portion; 25. a first set of screws; 26. a second set of screws;
27. a protective cover; 281. a first set of cam bearings; 282. a second set of cam bearings;
291. a thin nut; 292. a gasket.
Detailed Description
In order to make the objects, features and advantageous effects of the present invention more comprehensible, embodiments accompanied with figures are described in detail below. It is to be understood that the following detailed description is merely illustrative of the invention, and not restrictive of the invention. Moreover, the use of the same, similar reference numbers in the figures may indicate the same, similar elements in different embodiments, and descriptions of the same, similar elements in different embodiments, as well as descriptions of prior art elements, features, effects, etc. may be omitted.
The invention aims to provide a locking device of a sliding rail type probe interface board for chip testing, which ensures that the stroke of pressing down the probe interface board is consistent each time by respectively arranging two groups of clamping grooves on a first butt joint block and a second butt joint block, so that each detection is accurate and reliable.
FIG. 1 is a schematic diagram of a locking device of a slide rail type probe interface board for chip testing according to an embodiment of the present invention; FIG. 2 is a schematic view of a locking device of a slide rail type probe interface board for chip testing according to an embodiment of the present invention, wherein the locking device comprises a locking ball and a first butt joint block; FIG. 3 is another schematic view of a locking device of a slide rail type probe interface board for chip testing according to an embodiment of the present invention, wherein the locking device comprises a locking ball and a first docking block; FIG. 4 is a schematic diagram of a first set of slots in a locking device of a slide-rail probe interface board for chip testing according to an embodiment of the present invention; fig. 5 is another schematic structural diagram of a locking device of a slide rail type probe interface board for chip testing according to an embodiment of the present invention.
Referring now to fig. 1 to 5, a locking device for a slide rail type probe interface board for chip testing according to an embodiment of the present invention includes:
a first group of linear guides (not shown), a second group of linear guides 112, a first butt block 121, a second butt block 122, a link 13, an operation block 14, and an operation handle 15;
the first butt block 121 includes a first surface 1211, a second surface 1212, and a third surface 1213, the second butt block 122 includes a fourth surface 1221, a fifth surface 1222, and a sixth surface 1223, and the first set of linear guides and the second set of linear guides 112 are disposed on the first surface 1211 of the first butt block 121 and the fourth surface 1221 of the second butt block 122, respectively;
a first set of clamping grooves 1231 and a second set of clamping grooves 1232 are respectively arranged on the second surface 1212 of the first butt joint block 121 and the fifth surface 1222 of the second butt joint block 122, a first set of sliding grooves 1241 and a second set of sliding grooves (not shown in the figure) are respectively arranged on the third surface 1213 of the first butt joint block 121 and the sixth surface 1223 of the second butt joint block 122, the first set of clamping grooves 1231 and the first set of sliding grooves 1241 are in one-to-one correspondence and are communicated, and the second set of clamping grooves 1232 and the second set of sliding grooves are in one-to-one correspondence and are communicated;
the first butt joint block 121 is connected to the first end 131 of the connecting rod 13 through a first connecting device, and the second butt joint block 122 is connected to the second end 132 of the connecting rod 13 through a second connecting device;
the first connecting device comprises a first corner block 161, a first bearing 171, a second bearing (not shown), a first universal joint 181 and a first stud (not shown), wherein the first bearing 171 is used for penetrating the first corner block 161 and the first universal joint 181 to fix the first corner block 161 on the first universal joint 181, the first bearing 171 is also used for fixing the first corner block 161 on a table top of a testing machine, the second bearing is used for penetrating and fixing the first corner block 161 and the first end 131 of the connecting rod 13 to fix the connecting rod 13 on the first corner block 161, and the first stud is used for connecting the first corner block 161 and the first universal joint 181;
the second connecting device comprises a second corner block 162, a third bearing 173, a fourth bearing 174, a second universal joint (not shown in the figure), and a second double-ended screw 192, wherein the third bearing 173 is used for penetrating the second corner block 162 and the second universal joint to fix the second corner block 162 on the second universal joint, the third bearing 173 is also used for fixing the second corner block 162 on the table top of the testing machine, the fourth bearing 174 is used for penetrating the second corner block 162 and the second end 132 of the connecting rod 13 to fix the connecting rod 13 on the second corner block 162, and the second double-ended screw 192 is used for connecting the second corner block 162 and the second universal joint;
the operation handle 15 is connected with the operation block 14, the operation block 14 is disposed at a central position of the connecting rod 13, the operation block 14 is fixed on the connecting rod 13 through a fifth bearing 175, the operation handle 15 is used for pushing the connecting rod 13 to drive the first butt joint block 121 and the second butt joint block 122 to move in a first direction and a second direction respectively, and the first direction and the second direction are opposite directions.
In a specific implementation, the number of the first set of linear guide rails and the second set of linear guide rails 112 is three, and a person skilled in the art may set the number of the linear guide rails according to specific requirements, which is not described herein. The number of the first set of slots 1231 and the second set of slots 1232 is four, and a person skilled in the art may set the number of the first set of slots and the second set of slots according to specific requirements, which will not be described herein. Correspondingly, the number of the first set of sliding grooves 1241 and the second set of sliding grooves corresponds to the number of the first set of clamping grooves 1231 and the second set of clamping grooves 1232 one by one, and four sliding grooves are respectively formed.
The second stud 192 is fixed to the second corner block 162 by a thin nut 291, and further, a washer 292 is provided between the thin nut 291 and the second corner block 162 to achieve a force buffering effect.
In a specific implementation, the method further comprises:
the locking wave bead 21 is fixed on the first butt joint block 121 through the set screw 22, the locking wave bead 21 is fixed on the positioning block 24 through the set screw 23, and when the first butt joint block 121 moves towards the first direction, the locking wave bead 21 is clamped on the positioning block to achieve the limiting effect.
In a specific implementation, the positioning block 24 includes an entering angle 241 and an arc notch 242, when the first butt joint block 121 moves in the first direction, the stop bead 21 and the entering angle 241 abut and then slide into the arc notch 242, and the stop bead 21 is clamped on the positioning block 24 to achieve a limiting effect.
In a specific implementation, each of the first set of runners 1241 and the second set of runners includes a first plane 12121, a second plane 12122, and a stop 12123, the first plane 12121 and the horizontal plane being at a first angle, the second plane 12122 and the horizontal plane being parallel, the stop 12123 being for stopping movement of the probe interface plate.
In a specific implementation, the first angle is 3 ° to 5 °. The first angle may be set by those skilled in the art according to specific requirements, and will not be described herein.
Specifically, the first plane 12121 is provided to allow the cam bearing to slide into the first set of sliding grooves 1241 and the second set of sliding grooves more smoothly, the second plane 12122 is provided to allow the cam bearing to stop in the first set of sliding grooves 1241 and the second set of sliding grooves, and the stop portion 12123 is used to stop the movement of the cam bearing, i.e., the movement of the probe interface plate.
In a specific implementation, the first set of clamping grooves 1231 and the first set of sliding grooves 1241 are respectively L-shaped, and the second set of clamping grooves 1232 and the second set of sliding grooves are respectively L-shaped.
Specifically, the first set of sliding grooves 1241 are disposed on the left side of the first set of clamping grooves 1231, and the second set of sliding grooves are disposed on the right side of the second set of clamping grooves 1232.
In a specific implementation, the first butt joint block 121 and the second butt joint block 122 are fixed on the first set of linear guide rails and the second linear guide rail 112 by the first set of screws 25, respectively.
Specifically, the first set of screws 25 has three sets of 4 screws on the first set of linear guide rails and the second set of linear guide rails 112, respectively, and are distributed in a rectangular shape. The number of the first set of screws 25 can be set by a person skilled in the art according to specific requirements, and will not be described here.
In an implementation, the protection cover 27 is further included, and the protection cover 27 is fixed on the connecting rod 13 and the first and second butt blocks 121 and 122 through a second set of screws 26.
Specifically, the second set of screws 26 are two at each of the first end 131 of the link and the second end 132 of the link. The number of the second set of screws 26 can be set by those skilled in the art according to specific requirements, and will not be described here.
In a specific implementation, the probe interface board is provided with a first set of cam bearings 281 and a second set of cam bearings 282, and the first set of cam bearings 281 and the second set of cam bearings 282 are respectively clamped into the first set of clamping grooves 1231 and the second set of clamping grooves 1232.
In a specific implementation, the operation handle 15 is configured to push the connecting rod 13 to drive the first docking block 121 and the second docking block 122 to move in the first direction and the second direction, respectively, including:
pushing the operating handle 15 downwards to drive the connecting rod 13 to move the first butt joint block 121 and the second butt joint block 122, so that the first butt joint block 121 and the second butt joint block 122 move in the first direction and the second direction respectively, the first direction and the second direction are opposite directions, the corresponding first group of clamping grooves 1231 and the second group of clamping grooves 1232 are misplaced, the stop wave beads 21 are clamped on the positioning blocks 24 to limit, and the probe interface board is locked;
pushing back the operating handle 15, the stop beads 21 are separated from the positioning blocks 24, the positions of the first set of clamping grooves 1231 and the second set of clamping grooves 1232 corresponding to the first butt joint block 121 and the second butt joint block 122 are restored, and the probe interface board is unlocked.
Specifically, referring to fig. 5, after pushing down the handle 15, the connecting rod 13 is driven to move the first butt joint block 121 and the second butt joint block 122, so that the first butt joint block 121 moves to the right, i.e. moves to the first direction, and the second butt joint block 122 moves to the left, i.e. moves to the second direction, so that the positions of the first set of clamping grooves 1231 and the second set of clamping grooves 1232 are misplaced, the stop wave bead 21 is clamped at the positioning block 24 to limit, and the probe interface board is locked. Accordingly, pushing back the handle 15 upward, the stop beads are disengaged from the positioning block 24, the positions of the first set of clamping grooves 1231 and the second set of clamping grooves 1232 corresponding to the first docking block 121 and the second docking block 122 are restored, and the probe interface board is unlocked.
According to the sliding rail type probe interface board locking device for chip testing, the first group of clamping grooves and the second group of clamping grooves are respectively formed in the second surface of the first butt joint block and the fifth surface of the second butt joint block, the first group of sliding grooves and the second group of sliding grooves are respectively formed in the third surface of the first butt joint block and the sixth surface of the second butt joint block, the first group of clamping grooves and the first group of sliding grooves are in one-to-one correspondence and are communicated, the second group of clamping grooves and the second group of sliding grooves are in one-to-one correspondence and are communicated, and the consistency of the pressing stroke of the probe interface board at each time is ensured, so that each detection is accurate and reliable;
further, the first connecting device comprises a first corner block, a first bearing, a second bearing, a first universal joint and a first stud, wherein the first bearing is used for penetrating through the first corner block and the first universal joint to fix the first corner block on the first universal joint, the first bearing is also used for fixing the first corner block on the table top of the testing machine, the second bearing is used for penetrating through and fixing the first corner block and the first end of the connecting rod to fix the connecting rod on the first corner block, and the first stud is used for connecting the first corner block and the first universal joint; the second connecting device comprises a second corner block, a third bearing, a fourth bearing, a second universal joint and a second stud, wherein the third bearing is used for penetrating the second corner block and the second universal joint to fix the second corner block on the second universal joint, the third bearing is also used for fixing the second corner block on a table top of the testing machine, the fourth bearing is used for penetrating the second corner block and the second end of the connecting rod to fix the connecting rod on the second corner block, and the second stud is used for connecting the second corner block and the second universal joint, so that the movements of the first butt joint block and the second butt joint block on two sides can be linked;
further, by arranging the stop wave bead, the set screw and the flat head screw, the stop wave bead is fixed on the first butt joint block through the set screw, the stop wave bead is fixed on the positioning block through the flat head screw, and when the first butt joint block moves in the first direction, the stop wave bead is clamped on the positioning block to achieve the limiting effect, so that the first butt joint block and the second butt joint block achieve the limiting effect through the stop wave bead clamp on the positioning block when moving;
further, the novel connecting rod comprises a protective cover, wherein the protective cover is fixed on the connecting rod, the first butt joint block and the second butt joint block through screws, so that the movement of the connecting rod is protected, and meanwhile, the novel connecting rod has an attractive effect;
further, the operation handle is pushed downwards to drive the connecting rod to move the first butt joint block and the second butt joint block, so that the first butt joint block and the second butt joint block respectively move in a first direction and a second direction, the first direction and the second direction are opposite directions, the positions of the corresponding first group of clamping grooves and the second group of clamping grooves are misplaced, the stop wave beads are clamped on the positioning blocks for limiting, and the probe interface board is locked; the operation handle is pushed back upwards, the stop wave beads are separated from the positioning blocks, the positions of the first group of clamping grooves and the second group of clamping grooves corresponding to the first butt joint block and the second butt joint block are restored, the probe interface board is unlocked, and the probe interface board is enabled to be pressed down and limited accurately, so that accurate and reliable detection is guaranteed.
Although specific embodiments have been described above, these embodiments are not intended to limit the scope of the disclosure, even where only a single embodiment is described with respect to a particular feature. The characteristic examples provided in the present disclosure are intended to be illustrative, not limiting, unless stated differently. In practice, the features of one or more of the dependent claims may be combined with the features of the independent claims where technically possible, according to the actual needs, and the features from the respective independent claims may be combined in any appropriate way, not merely by the specific combinations enumerated in the claims.
Although the present invention is disclosed above, the present invention is not limited thereto. Various changes and modifications may be made by one skilled in the art without departing from the spirit and scope of the invention, and the scope of the invention should be assessed accordingly to that of the appended claims.
Claims (8)
1. A locking device for a slide rail type probe interface board for chip testing, comprising: the device comprises a first group of linear guide rails, a second group of linear guide rails, a first butt joint block, a second butt joint block, a connecting rod, an operating block and an operating handle;
the first butt joint block comprises a first surface, a second surface and a third surface, the second butt joint block comprises a fourth surface, a fifth surface and a sixth surface, the first group of linear guide rails and the second group of linear guide rails are respectively arranged on the first surface of the first butt joint block and the fourth surface of the second butt joint block, and the first surface and the fourth surface are respectively the bottom surfaces of the first butt joint block and the second butt joint block;
a first group of clamping grooves and a second group of clamping grooves are respectively arranged on the second surface of the first butt joint block and the fifth surface of the second butt joint block, a first group of sliding grooves and a second group of sliding grooves are respectively arranged on the third surface of the first butt joint block and the sixth surface of the second butt joint block, the first group of clamping grooves and the first group of sliding grooves are in one-to-one correspondence and are communicated, the second group of clamping grooves and the second group of sliding grooves are in one-to-one correspondence and are communicated, the second surface and the fifth surface are respectively arranged on the first butt joint block and the second butt joint block, and the third surface and the sixth surface are respectively arranged on the side surfaces of the first butt joint block and the second butt joint block;
the first butt joint block is connected to the first end of the connecting rod through a first connecting device, and the second butt joint block is connected to the second end of the connecting rod through a second connecting device;
the first connecting device comprises a first corner block, a first bearing, a second bearing, a first universal joint and a first stud, wherein the first bearing is used for penetrating through the first corner block and the first universal joint to fix the first corner block on the first universal joint, the first bearing is also used for fixing the first corner block on a table top of the testing machine, the second bearing is used for penetrating through and fixing the first corner block and the first end of the connecting rod to fix the connecting rod on the first corner block, and the first stud is used for connecting the first corner block and the first universal joint;
the second connecting device comprises a second corner block, a third bearing, a fourth bearing, a second universal joint and a second double-head screw column, wherein the third bearing is used for penetrating through the second corner block and the second universal joint to fix the second corner block on the second universal joint, the third bearing is also used for fixing the second corner block on the table top of the testing machine, the fourth bearing is used for penetrating through the second corner block and the second end of the connecting rod to fix the connecting rod on the second corner block, and the second double-head screw column is used for connecting the second corner block and the second universal joint;
the operation handle is connected with the operation block, the operation block is arranged at the center of the connecting rod, the operation block is fixed on the connecting rod through a fifth bearing, the operation handle is used for pushing the connecting rod to drive the first butt joint block and the second butt joint block to move in a first direction and a second direction respectively, and the first direction and the second direction are opposite directions;
each of the first set of runners and the second set of runners includes a first plane, a second plane, and a stop, the first plane and the horizontal plane being at a first angle, the second plane and the horizontal plane being parallel, the stop for stopping movement of the probe interface board;
the first group of clamping grooves and the first group of sliding grooves are respectively L-shaped, and the second group of clamping grooves and the second group of sliding grooves are respectively L-shaped.
2. The locking device of a slide rail type probe interface board for chip testing according to claim 1, further comprising:
the locking wave bead is fixed on the first butt joint block through the set screw, the locking wave bead is fixed on the positioning block through the set screw, and when the first butt joint block moves towards the first direction, the locking wave bead is clamped on the positioning block to achieve the limiting effect.
3. The locking device of the slide rail type probe interface board for chip testing according to claim 2, wherein the positioning block comprises an entering angle and an arc notch, when the first butt joint block moves towards the first direction, the stop wave bead and the entering angle abut and then slide into the arc notch, and the stop wave bead is clamped on the positioning block to achieve a limiting effect.
4. The locking device of a slide rail type probe interface board for chip testing according to claim 1, wherein the first angle is 3 ° to 5 °.
5. The locking device of a slide rail type probe interface board for chip testing according to claim 1, wherein the first docking block and the second docking block are fixed to the first set of linear guide rails and the second set of linear guide rails, respectively, by a first set of screws.
6. The locking device of a slide rail type probe interface board for chip testing according to claim 1, further comprising a protective cover fixed on the connecting rod and the first and second docking blocks by a second set of screws.
7. The locking device of a slide rail type probe interface board for chip testing according to claim 1, wherein a first group of cam bearings and a second group of cam bearings are arranged on the probe interface board, and the first group of cam bearings and the second group of cam bearings are respectively clamped into the first group of clamping grooves and the second group of clamping grooves.
8. The locking device of a slide rail type probe interface board for chip testing according to claim 2, wherein the operating handle for pushing the connecting rod to drive the first docking block and the second docking block to move in a first direction and a second direction, respectively, comprises:
pushing the operation handle downwards to drive the connecting rod to move the first butt joint block and the second butt joint block, so that the first butt joint block and the second butt joint block move towards the first direction and the second direction respectively, the first direction and the second direction are opposite directions, the positions of the corresponding first group of clamping grooves and the corresponding second group of clamping grooves are misplaced, the stop wave beads are clamped on the positioning blocks to limit, and the probe interface board is locked;
and pushing back the operating handle upwards, wherein the stop wave beads are separated from the positioning blocks, the positions of the first group of clamping grooves and the second group of clamping grooves corresponding to the first butt joint blocks and the second butt joint blocks are restored, and the probe interface board is unlocked.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310515871.6A CN116593863B (en) | 2023-05-09 | 2023-05-09 | Locking device of slide rail type probe interface board for chip test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310515871.6A CN116593863B (en) | 2023-05-09 | 2023-05-09 | Locking device of slide rail type probe interface board for chip test |
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| CN116593863A CN116593863A (en) | 2023-08-15 |
| CN116593863B true CN116593863B (en) | 2023-12-22 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202310515871.6A Active CN116593863B (en) | 2023-05-09 | 2023-05-09 | Locking device of slide rail type probe interface board for chip test |
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| CN116593863A (en) | 2023-08-15 |
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