CN216297178U - Line is selected separately in electronic material intelligent test - Google Patents
Line is selected separately in electronic material intelligent test Download PDFInfo
- Publication number
- CN216297178U CN216297178U CN202122670111.1U CN202122670111U CN216297178U CN 216297178 U CN216297178 U CN 216297178U CN 202122670111 U CN202122670111 U CN 202122670111U CN 216297178 U CN216297178 U CN 216297178U
- Authority
- CN
- China
- Prior art keywords
- testing
- turnover disc
- transfer mechanism
- line
- turnover
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Specific Conveyance Elements (AREA)
Abstract
The utility model relates to an intelligent testing and sorting line for electronic materials, which is characterized by comprising a discharging machine and at least one testing machine, wherein the discharging machine comprises a production line, a first material transfer mechanism, a turnover disc transfer mechanism and a plurality of material disc loading and unloading modules; the turnover disc transfer mechanism of the testing machine transfers the turnover disc of the turnover disc transfer mechanism to the test line integrally to be conveyed to the area to be tested of each test fixture module and the like, so that the turnover disc is used as a carrier transportation center to directly transfer across the testing machine, and the turnover disc can be combined according to the time required by chip testing to form a flexible chip testing line capable of being extended in a building block type.
Description
Technical Field
The utility model relates to the field of automatic testing of electronic materials, in particular to an intelligent testing and sorting line for electronic materials.
Background
For electronic materials, such as chips, the existing electronic material testing and sorting line adopts a scheme that one chip arranging machine corresponds to one testing machine, the testing machine only has 16 jigs at most, and the productivity is low. The scheme that an existing chip arranging machine corresponds to a testing machine is limited by structure, action flow and the like, the number of jigs cannot be freely increased or other testing jigs cannot be replaced according to the time required by electronic material testing, and different testing combinations and flexible electronic material testing lines capable of being extended in a building block type cannot be formed.
Disclosure of Invention
The utility model mainly aims to overcome part of defects in the prior art and provide a flexible electronic material testing sorting line which has the advantages that a plurality of testing machines share one chip arranging machine for loading and unloading and chip arranging, the number of the testing machines and the number of the jigs can be freely increased, the types of the testing jigs can be replaced, and the productivity can be rapidly expanded.
In order to achieve the purpose, the intelligent testing and sorting line for the electronic materials is characterized by comprising a discharging machine and more than two testing machines, wherein the discharging machine comprises a production line, a first material transfer mechanism, a turnover disc transfer mechanism and a plurality of charging and discharging modules for a material disc, and the testing machines comprise a test line, a return line, a turnover disc transfer mechanism, a turnover disc wire changing mechanism and a plurality of testing jig modules; more than one test machine is respectively arranged at two ends of the assembly line of the discharging machine; the material tray feeding and discharging module feeds electronic materials through a material tray, the first material transfer mechanism transfers the electronic materials from a material placing position to a turnover disc on the turnover disc transfer mechanism, and the turnover disc transfer mechanism moves to a turnover disc transfer mechanism of the testing machine along with the production line and rotates by 90 degrees to enable the direction of the turnover disc to be the same as the material taking direction of the turnover disc transfer mechanism; the turnover disc transferring mechanism of the testing machine integrally transfers the turnover disc of the turnover disc transferring mechanism to the test line to be conveyed to a region to be tested of each test fixture module; the turnover disc wire changing mechanism transfers the turnover disc provided with the tested electronic material on the feeding and measuring wire to the return wire to return. Based on this kind of new row of material machine and test machine structure framework like this, realize using week carousel as carrier transportation center, and week carousel not only can be at row material machine, the inside high-efficient circulation of test machine, more can directly cross the machine circulation, material loading has been improved, exchange, efficiency, avoid blockking up and waiting, combine in addition to send the measuring line, the return line, the setting of turnover dish lane wire changing mechanism, the modular setting of unloading module and test fixture module in the charging tray, 1 row of sharing machine, the independent assortment extension of many test machines, it can make up them according to the required time of electronic material test to have realized, form the flexible electronic material test wire that can long-pending wood type extension, make the productivity increase at double. And the requirements on the workshop site are also reduced.
Preferably, the discharging machine further comprises an exchange frame, a plurality of exchange discs are arranged on the exchange frame, the turnover disc transfer mechanism can transfer the turnover discs returned by the return lines to the turnover disc transfer mechanism, and the turnover disc transfer mechanism returns to the discharging machine along with the production line and rotates by 90 degrees to enable the direction of the turnover discs to be the same as the material taking direction of the first material transfer mechanism; the tested electronic materials on the peripheral rotary disc are transferred to the exchange disc through the first material transfer mechanism of the discharging machine, so that the testing machines on the left side and the right side of the discharging machine can perform another test after exchanging the materials.
And the feeding and measuring line, the return line and the return line of more than two testing machines are respectively connected in series on the same side of the production line of the discharging machine.
The material loading conveying and the recovery conveying are communicated among all machines through the turnover disc and the corresponding structure. When the test types of the two ends of the discharging machine are the same, the left end and the right end can form two test sorting lines sharing the discharging machine, and when the test types of the two ends of the discharging machine are different, the left side test machine and the right side test machine can be combined to form a line with different tests so as to meet different test requirements. Because the tester is in butt joint and expansion in a form of one building block, the productivity is further improved.
Preferably, the testing machine or the test fixture module further includes a second material transfer mechanism, and the second material transfer mechanism transfers the electronic materials on the turnover disc in the region to be tested of the test fixture module to the acupuncture points corresponding to the test fixture module, and transfers the electronic materials on the acupuncture points corresponding to the test fixture module to the turnover disc.
Preferably, the testing machine further comprises a rack, at least one group of code scanners is arranged above the rack, and the code scanners can scan the electronic materials in the turnover discs on the conveying and measuring line and the return line to acquire electronic material information.
Preferably, the first material transfer mechanism and the second material transfer mechanism are provided with a CCD camera or a laser height measuring instrument to detect and judge whether electronic materials exist in acupuncture points of the material tray, the turnover disc or the test fixture module and/or position parameters of the electronic materials and/or appearances of the electronic materials.
Preferably, the test fixture module comprises a first test fixture module, the first test fixture module is provided with the second material transfer mechanism, each fixture of the first test fixture module is provided with a plurality of acupuncture points distributed in an array manner, the second material transfer mechanism is provided with material suction plates matched with the number and the distribution of the fixture acupuncture points, and the material suction plates of the second material transfer mechanism can simultaneously suck electronic materials with the same number as the acupuncture points of the fixtures so as to transfer the electronic materials between the circumference disc of the measuring line and the fixtures.
Preferably, the test fixture module further comprises a second test fixture module, the second test fixture module is provided with a plurality of fixtures, each fixture is provided with an acupoint, the second material transfer mechanism absorbs the electronic materials from the turnover disc and puts the electronic materials into the acupoints of each fixture one by one, or absorbs the tested electronic materials from the acupoints of each fixture one by one to put the tested electronic materials into the turnover disc of the feeding and measuring line.
Preferably, the discharging machine is provided with more than two production lines, and each production line is provided with one turnover disc transferring mechanism on the left and right.
Preferably, the tester is provided with two feeding and measuring lines parallel to the return line on two sides of the return line, and a plurality of test fixture modules are arranged along the outer side of each feeding and measuring line.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
FIG. 1 is a schematic diagram of an overall structure of an intelligent testing and sorting line for electronic materials in a preferred embodiment;
FIG. 2 is a schematic diagram of the structure of FIG. 1 with the addition of a tester;
FIG. 3 is a schematic structural diagram of an electronic material intelligent test sorting line in a preferred embodiment;
FIG. 4 is a schematic view of the internal structure of a discharger in a preferred embodiment;
FIG. 5 is a schematic diagram of a tester rack in a preferred embodiment;
FIG. 6 is a schematic diagram of a first test fixture module according to an embodiment;
FIG. 7 is a diagram illustrating a second testing module according to an embodiment;
fig. 8 is a partial structural diagram of fig. 4.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that all the directional indicators (such as … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the movement, etc. in a specific posture (as shown in the figure), and if the specific posture is changed, the directional indicator is changed accordingly.
In addition, when only the structures and the components related to the solution of the technical problems are described in the present invention, the technical features that are known to be necessary, the components and the connection relation, or can be determined by combining the drawings and the common general knowledge are not described below, but are not equal to the technical features that are not present in the technical solutions, and are not necessarily the reason for insufficient disclosure.
Referring to fig. 1 and 2, the intelligent electronic material testing and sorting line comprises a discharging machine 2 and a testing machine 1. Wherein, the discharging machine 2 comprises an assembly line 21, a first material transfer mechanism 22, a turnover disc transfer mechanism 23 and a plurality of charging tray feeding and discharging modules 25. The testing machine 1 comprises a test wire feeding 11, a return wire 12, a turnover disc transfer mechanism 14, a turnover disc wire changing mechanism 13 and a plurality of test fixture modules 15.
For the discharger 2:
the tray loading and unloading module 25 is used for loading and unloading the electronic materials through the tray. The discharging machine 2 can have a plurality of charging tray feeding and discharging module 25 mounting positions, namely the number of the charging tray feeding and discharging module 25 can be designed to be a plurality as required, and the working mode of the charging tray feeding and discharging module 25 can be defined as required, for example, some charging tray feeding and discharging modules 25 are responsible for charging the charging tray of qualified electronic materials, and some charging tray modules 25 are responsible for charging the discharging of unqualified electronic material charging trays. So as to realize free switching of the feeding/receiving modes and non-stop material changing. Preferably, there may be more than two tray loading and unloading modules 25 in the same operating mode to improve the loading and unloading efficiency. The turnover disc transfer mechanism 23 is arranged on the assembly line 21 and can move back and forth along with the assembly line 21 so as to reach the material taking range of the first material transfer mechanism 22 or the turnover disc transfer mechanism 14. The line 21 may be an in-track line, a belt line, or the like. The number of the pipelines 21 can be more than 1, such as two, and the transmission efficiency can be improved.
The first material transfer mechanism 22 is used for transferring the turnover disk 3 and the discharge level of the turnover disk transfer mechanism 14 or for transferring electronic material between the turnover disk 3 of the turnover disk transfer mechanism 14 and the exchange rack 24 (or the exchange disk 241) of the discharger 2. Preferably, the first material transfer mechanism 22 is provided with a plurality of suction heads, such as 8 suction heads, and is further provided with a CCD camera to identify and judge whether electronic materials exist at the corresponding positions of the turnover plate 3 and the material tray, the positions of the electronic materials, and the like before material taking. Similarly, the first material transfer mechanism 22 itself or nearby may be further provided with a lower CCD camera, so as to realize that the electronic material taken is identified and judged by the lower CCD camera after being taken, and then is transferred to the corresponding transfer tray 3 or material tray.
The turnaround disk transfer mechanism 23 is reciprocally movable with the flow line 21 to traverse between the material taking range of the first material transfer mechanism 22 and the material taking range of the turnaround disk transfer mechanism 14. Preferably, since the material taking direction of the first material transfer mechanism 22 is different from the material taking direction of the first material transfer mechanism 22, for example, the material taking direction of the first material transfer mechanism 22 is horizontal and vertical to the material taking direction of the first material transfer mechanism 22, that is, 90 °, the turnover disc transfer mechanism 23 is provided with a rotating structure to rotate the turnover disc 3 thereon by ± 90 ° so that the direction of the turnover disc 3 is respectively corresponding to the same material taking direction as the first material transfer mechanism 22 or the turnover disc transfer mechanism 14.
For test machine 1:
the feeding line 11 is used for conveying the turnover table 3 to a corresponding conveying line of a region to be tested (i.e. a region waiting for being taken) of each test fixture module 15.
The return line 12 is a transport line for transporting the transfer plate 3 with the measured electronic material in the direction of the discharge machine 2.
Preferably, the feed line 11 and the return line 12 are parallel. The feed line 11 and the return line 12 may be track lines, belt lines, or the like. The number of the test lines 11 may be two, that is, two test lines 11 parallel to the reflow line 12 are respectively disposed on two sides of the reflow line 12, and a plurality of test fixture modules 15 are respectively disposed along the outer side of each test line 11.
The testing machine 1 can be provided with a plurality of mounting positions of the test fixture module 15 at the outer side of the test line 11. That is, the number of the test fixture modules 15 can be designed to be plural according to the requirement. Each test fixture module 15 is an independent functional structural unit, and the test fixture module 15 can be integrally separated, detached and replaced relative to the frame of the testing machine 1. Therefore, the number of the test fixture modules 15 can be increased or decreased or the types of the test fixture modules 15 can be replaced according to the test requirements, so as to realize different test types or test capacity requirements.
The turnover disc transfer mechanism 14 is arranged at one end close to the discharging machine 2, in particular at a place where the turnover disc transfer mechanism 23 can take materials from the turnover disc 3 conveniently. The turnover disk transfer mechanism 14 is used for transferring the turnover disk 3 of the turnover disk transfer mechanism 23 to the feeding line 11 as a whole, and transferring the turnover disk 3 with the tested electronic material on the return line 12 to the turnover disk transfer mechanism 23 as a whole. The turnover disk transfer mechanism 14 is provided with a plurality of suction heads or suction plates capable of sucking the turnover disk 3, and a moving structure. Alternatively or additionally, the transfer mechanism 14 may be located at the end of the discharger 2, but should be adjacent to the testing machine 1.
The turnover disk wire changing mechanism 13 is used for transferring the turnover disk 3 provided with the tested electronic material on the feeding and measuring wire 11 to the return wire 12 to convey and return the tested electronic material in the direction of the discharging machine 2. The turnover disc wire changing mechanism 13 is provided with an action structure for transferring the turnover disc 3 provided with the tested electronic material on the feeding and measuring wire 11 to the return wire 12, and the action structure comprises but is not limited to a jacking moving structure or an adsorption moving structure and the like.
In a preferred embodiment, referring to fig. 4 and 8, the discharger 2 is further provided with an exchange rack 24, and the exchange rack 24 is provided with a plurality of exchange discs 241. The specific number of the exchanging disks 241 may be set according to practical settings, such as 5. The function of each exchanging plate 241 on the discharging machine 2 may be defined or configured as required, including but not limited to buffering of the electronic material to be discharged, buffering of the tested electronic material from the rotating disc 3 of the rotating disc transfer mechanism 14 for exchange by the testing machine 1 on the left and right sides of the discharging machine 2, buffering of the tested electronic material to be discharged, etc. Based on the arrangement of the exchange frame 24 and the exchange disc 241, the turnover disc transfer mechanism 14 transfers the turnover disc 3 returned by the return line 12 to the turnover disc transfer mechanism 23, after the turnover disc transfer mechanism 23 returns to the discharging machine 2 along with the production line 21, the first material transfer mechanism 22 of the discharging machine 2 comprises the exchange disc 241 capable of transferring tested electronic materials to the exchange frame 24, and then the tested electronic materials are cached through the exchange disc 241 so as to be exchanged by the testing machines 1 on the left side and the right side of the discharging machine 2 for another test.
Referring to fig. 1 and fig. 6, the testing machine 1 is further provided with a second material transferring mechanism 1513, and the second material transferring mechanism 1513 is configured to transfer the electronic materials on the turnover disc 3 in the region to be tested of the test fixture module 15 to the acupuncture points corresponding to the test fixture module 15, and transfer the electronic materials on the acupuncture points corresponding to the test fixture module 15 to the turnover disc 3. The second material transfer mechanism 1513 is provided with a plurality of suction heads or suction plates capable of sucking electronic materials. The second material transfer mechanism 1513 may be disposed on the test fixture module 15 or on the frame of the testing machine 1. As shown in fig. 6, in order to be disposed on the test fixture module 15, as shown in fig. 1, the testing machine 1 at the right end of the discharging machine 2 is disposed on the rack of the second material transferring mechanism 1513.
The intelligent electronic material testing and sorting line comprises a discharging machine 2 and a testing machine 1, and the specific number of the testing machines 1, the types of the testing jig modules 15 on the testing machine 1 and the like can be set or replaced according to actual conditions. For example, referring to fig. 6, the testing jig module 15 is a first testing jig module 151, the first testing jig module 151 is provided with a second material transfer mechanism 1513, and the testing jig module 15 is provided with a plurality of jigs, each of which is provided with a plurality of acupuncture points distributed in an array manner, such as 16 testing acupuncture points divided into two rows. The second material transfer mechanism 1513 is provided with a material suction plate matched with the number and distribution of the acupuncture points of the jig, and the material suction plate of the second material transfer mechanism 1513 can simultaneously suck the electronic materials with the same number as the acupuncture points of the jig so as to transfer between the transfer plate 3 of the feeding and measuring line 11 and the jig. Referring to fig. 7, the test fixture module is another type of test fixture module, that is, the second test fixture module 152 is not provided with a second material transfer mechanism 1513, the second material transfer mechanism 1513 is disposed on the frame of the testing machine 1 (e.g., the testing machine 1 at the right end of the discharging machine 2 in fig. 1), the second test fixture module 152 is provided with a plurality of fixtures, each fixture is provided with an acupuncture point, the second material transfer mechanism 1513 sucks the electronic material from the turnover plate 3 and places the electronic material into the acupuncture point of each fixture one by one, or sucks the tested electronic material from each acupuncture point of each fixture one by one and places the tested electronic material into the turnover plate 3 of the feeding and measuring line 11. In addition, each acupoint can be provided with a cover opening and closing structure.
The specific number of test machines 1 may be set to 1, 2, or even a combination of a plurality of machines. The method comprises the following steps:
as shown in fig. 1, there are two testing machines 1, and the types of the testing tool modules of the two testing machines 1 are different, wherein the left side of the discharging machine 2 is a first testing tool module 151 corresponding to a first test; the right side of the discharging machine 2 is provided with a second testing tool module 152 corresponding to the second test. Thus, the intelligent electronic material testing and sorting line can simultaneously have two tests, after the transferring disc transfer mechanism 23 returns to the discharging machine 2 along with the production line 21, the first material transfer mechanism 22 of the discharging machine 2 transfers tested electronic materials to the exchange disc 241 on the exchange frame 24, and the testing machines 1 on the left side and the right side of the discharging machine 2 perform another test after performing material exchange through the exchange disc 241. Preferably, two production lines 21 are arranged on the discharging machine 2, and the turnover disc transfer mechanism 23 is arranged on the left side and the right side of each production line 21.
Referring to fig. 2, on the basis of the scheme of fig. 1, the number of the testing machines 1 on each side of the discharging machine 2 can be set to be different according to the time required by testing different electronic materials, so as to improve the testing efficiency. The feeding line 11 and the feeding line 11, and the return line 12 of two or more testing machines 1 on the same side are respectively connected in series, that is, the peripheral turntable 3 on the feeding line 11 of the adjacent testing machine 1 can be conveyed to the feeding line 11 of the other testing machine 1, and the peripheral turntable 3 on the return line 12 of the adjacent testing machine 1 can be conveyed to the return line 12 of the other testing machine 1. Like this through test machine 1 through the flexible test line of cordwood system combination formation, the continuous productivity that increases that can double to combine according to the required time of different electronic material tests, can improve the machine utilization ratio, reduce and wait for, improve operating efficiency. Because a plurality of test equipment share a chip arranging machine, different tests share a chip arranging machine, on the one hand, the production space can be saved, the requirement on the field is reduced, on the other hand, the detachable modular structure is adopted by the charging and discharging module 25 and the test fixture module 15 on the charging tray, the number and the types of the chip arranging machine and the test fixture module can be quickly adjusted or switched, the test work can be enabled to be in better efficiency, and the adjustment or the switching can be realized only by simply increasing and decreasing the number on the aspect of a matched central control system and selecting a corresponding mode without carrying out brand new integral customization development, the difficulty in laying implementation can be obviously reduced, the laying in different automation workshop fields and the implementation efficiency can be obviously improved.
As shown in fig. 3, the testing machines 1 on the left and right sides of the discharging machine 2 are of the same testing type, that is, the testing jig modules 15 of the testing machine 1 are the first testing jig module 151 or the second testing jig module 152. After the test machine 1 on the same side is finished, the test machine flows back to the sheet arranging machine to perform blanking, and the mode is equivalent to that two identical test lines are formed on the left side and the right side of the sheet arranging machine 2 and share one sheet arranging machine.
Referring to fig. 4, 5 and 6, in a preferred embodiment, a laser height measuring instrument or a CCD camera is also disposed on the second material transfer mechanism 1513, so as to identify and determine whether there are electronic materials, positions and appearances of the electronic materials, etc. at positions corresponding to the circumferential turntable 3 and the jig acupuncture points before and after material taking. The testing machine 1 further comprises a rack, at least one group of code scanners 16 are arranged above the rack, and the code scanners 16 can scan the electronic materials in the peripheral rotating discs 3 on the feeding line 11 and the return line 12 to obtain electronic material information.
Based on the intelligent test sorting of the electronic materials, the intelligent test sorting method of the electronic materials can be formed during working, and in summary, the intelligent test sorting method of the electronic materials comprises the following steps:
a feeding step, in which a first material transfer mechanism 22 of a discharging machine 2 transfers the electronic material to be tested to a turnover disc 3 on a turnover disc transfer mechanism 23;
a turnover disc transferring step, in which a turnover disc transferring mechanism 14 of the testing machine 1 transfers the whole turnover disc 3 on a turnover disc transferring mechanism 23 of the discharging machine 2 to a test conveying line 11 of the testing machine 1 and conveys the whole turnover disc to a to-be-tested area of each testing jig module 15;
a material taking test step, in which a second material transfer mechanism 1513 of the test machine 1 transfers the electronic materials on the turnover disc 3 in the region to be tested of the test fixture module 15 to the acupuncture points corresponding to the test fixture module 15 for testing, and transfers the electronic materials of the acupuncture points corresponding to the test fixture module 15 to the turnover disc 3;
a turnover disc wire-changing backflow step, in which a turnover disc wire-changing mechanism 13 of the testing machine 1 transfers the turnover disc 3 with tested electronic materials on the feeding and testing wire 11 to the backflow wire 12 to backflow towards the direction of the discharging machine 2, and the turnover disc transfer mechanism 14 transfers the whole turnover disc 3 which can return by the backflow wire 12 to a turnover disc transferring mechanism 23;
and a blanking or material changing step, wherein the first material transfer mechanism 22 of the discharging machine 2 transfers the tested electronic material on the transferring disc transfer mechanism 23 to a blanking position preset by the discharging machine 2 for blanking, or transfers the tested electronic material to the exchange disc 241 of the exchange frame 24 of the discharging machine 2 for material changing, and then another test is carried out.
Preferably, the method further comprises a rotating disc direction adjusting step, wherein the rotating disc transferring mechanism 23 rotates the rotating disc 3 by +/-90 degrees so that the direction of the rotating disc 3 is respectively the same as the material taking direction of the first material transferring mechanism 22 or the rotating disc transferring mechanism 14.
Specifically, as shown in fig. 1, two testing machines 1 are respectively disposed on two sides of the discharging machine 2, the testing jig module 15 of the testing machine 1 on the left side is the first testing jig module 151, and the testing jig module 15 of the testing machine 1 on the right side is the second testing jig module 152.
The specific flow of the test and sorting of the left testing machine 1 is as follows:
the material tray feeding and discharging module 25 feeds materials through a material tray and transmits the materials to a material discharging position;
the first material transfer mechanism 22 takes the electronic materials in turn by taking pictures of the electronic materials through the CCD thereof;
the electronic materials on the first material transfer mechanism 22 are photographed by a CCD arranged below and then sequentially placed on the turnover disc 3 on the turnover disc transfer mechanism 23;
the turnover disc transferring mechanism 23 rotates by 90 degrees and moves to the turnover disc transferring mechanism 14 of the testing machine 1 along with the production line 21;
the turnover disc transfer mechanism 14 of the testing machine 1 takes the whole turnover disc 3 and places the whole turnover disc 3 to the turnover disc 3 of the feeding and testing line 11;
the code scanner 16 scans each electronic material to acquire electronic material information;
the test line 11 moves the turnover disc 3 to a region to be tested of the test fixture module 15;
the laser height measuring instrument carries out height measurement and rechecking on the electronic material of the turnover disc 3;
the second material transfer mechanism 1513 presses down to take the material, rotates to the position above the acupuncture point of the test fixture module 15 and presses down to discharge the material;
the other end of the second material transfer mechanism 1513 is pressed downwards to continue taking materials and take materials to wait;
after the test is finished, the second material transfer mechanism 1513 takes out the tested electronic material and rotationally puts the tested electronic material into the tested area of the turnover disc 3 of the test wire 11; continuously testing the strip product;
the second material transfer mechanism 1513 rotates the material carrying waiting end to the position above the acupuncture point of the test fixture module 15 and presses down for discharging;
taking out the tested electronic material and putting the tested electronic material into the tested area of the turnover disc 3 of the testing line 11 in a rotating mode; continuously testing the strip product;
the laser height measuring instrument carries out height measurement and re-judgment on the tested electronic material of the placed turnover disc 3;
the turnover disc wire changing mechanism 13 transfers the turnover disc 3 provided with the tested electronic material on the feeding and measuring wire 11 to the return wire 12 and moves to the turnover disc transfer mechanism 14 along with the return wire 12;
the turnover disc transfer mechanism 14 integrally transfers the turnover disc 3 to the turnover disc transfer mechanism 23 of the discharging machine 2;
the turnover disc transferring mechanism 23 rotates the turnover disc 3 by 90 degrees and moves the turnover disc to a discharging area of the discharging machine 2 through the production line 21;
the first material transfer mechanism 22 takes the measured electronic materials from the material suction heads of the material discharge area turnover disc 3 in sequence after taking pictures through the CCD;
the first material transfer mechanism 22 transfers the tested electronic material to the exchange tray 241 of the exchange rack 24 of the discharger 2 according to the test result to perform another test after exchanging the material.
The specific flow of the test and sorting of the testing machine 1 on the right side is as follows:
the material tray feeding and discharging module 25 feeds materials through a material tray and transmits the materials to a material discharging position;
the first material transfer mechanism 22 takes the electronic materials in turn by taking pictures of the electronic materials through the CCD thereof;
the electronic materials on the first material transfer mechanism 22 are photographed by a CCD arranged below and then sequentially placed on the turnover disc 3 on the turnover disc transfer mechanism 23;
the turnover disc transferring mechanism 23 rotates by 90 degrees and moves to the turnover disc transferring mechanism 14 of the testing machine 1 along with the production line 21;
the turnover disc transfer mechanism 14 of the testing machine 1 takes the whole turnover disc 3 and places the whole turnover disc 3 to the turnover disc 3 of the feeding and testing line 11;
the code scanner 16 scans each electronic material to acquire electronic material information;
the test line 11 moves the turnover disc 3 to a region to be tested of the test fixture module 15;
the laser height measuring instrument carries out height measurement and rechecking on the electronic material of the turnover disc 3;
the second material transfer mechanism 1513 sequentially takes the materials, moves to the positions above the acupuncture points of the test fixture module 15 and discharges the materials one by one at the acupuncture points of the test fixture;
after the test is finished, the second material transfer mechanism 1513 takes out the tested electronic material from the acupuncture point of the test fixture and rotationally puts the tested electronic material into the tested area of the turnover disc 3 of the test wire 11;
the laser height measuring instrument carries out height measurement and re-judgment on the tested electronic material of the placed turnover disc 3;
the turnover disc wire changing mechanism 13 transfers the turnover disc 3 provided with the tested electronic material on the feeding and measuring wire 11 to the return wire 12 and moves to the turnover disc transfer mechanism 14 along with the return wire 12;
the turnover disc transfer mechanism 14 integrally transfers the turnover disc 3 to the turnover disc transfer mechanism 23 of the discharging machine 2;
the turnover disc transferring mechanism 23 rotates the turnover disc 3 by 90 degrees and moves the turnover disc to a discharging area of the discharging machine 2 through the production line 21;
the first material transfer mechanism 22 takes the measured electronic materials from the material suction heads of the material discharge area turnover disc 3 in sequence after taking pictures through the CCD;
the first material transfer mechanism 22 transfers the tested electronic material to the exchange tray 241 of the exchange rack 24 of the discharger 2 according to the test result to perform another test after exchanging the material.
Finally, it is worth mentioning that although the subject of the utility model is suitable for testing and sorting of various electronic materials, the overall structure, the action flow and the like of the discharging machine and the testing machine do not need to be changed, and the utility model can be realized by only replacing the material disc, the turnover disc and the jig with the acupuncture points matched with the materials, thereby further improving the universality of the intelligent testing and sorting line.
Claims (10)
1. The intelligent electronic material testing and sorting line is characterized by comprising a discharging machine and more than two testing machines, wherein the discharging machine comprises a production line, a first material transfer mechanism, a turnover disc transfer mechanism and a plurality of material disc feeding and discharging modules; more than one test machine is respectively arranged at two ends of the assembly line of the discharging machine; the material tray feeding and discharging module feeds electronic materials through a material tray, the first material transfer mechanism transfers the electronic materials from a material placing position to a turnover disc on the turnover disc transfer mechanism, and the turnover disc transfer mechanism moves to a turnover disc transfer mechanism of the testing machine along with the production line and rotates by 90 degrees to enable the direction of the turnover disc to be the same as the material taking direction of the turnover disc transfer mechanism; the turnover disc transferring mechanism of the testing machine integrally transfers the turnover disc of the turnover disc transferring mechanism to the test line to be conveyed to a region to be tested of each test fixture module; the turnover disc wire changing mechanism transfers the turnover disc provided with the tested electronic material on the feeding and measuring wire to the return wire to return.
2. The electronic material intelligent test sorting line of claim 1, wherein the discharging machine further comprises an exchange frame, the exchange frame is provided with a plurality of exchange discs, the turnover disc transfer mechanism can transfer the turnover discs returned by the return lines to the turnover disc transfer mechanism, the turnover disc transfer mechanism returns to the discharging machine along with the production line and rotates 90 degrees to enable the direction of the turnover discs to be the same as the material taking direction of the first material transfer mechanism; the tested electronic materials on the peripheral rotary disc are transferred to the exchange disc through the first material transfer mechanism of the discharging machine, so that the testing machines on the left side and the right side of the discharging machine can perform another test after exchanging the materials.
3. The intelligent electronic material testing and sorting line as claimed in claim 2, wherein the feeding and measuring lines, the return lines and the return lines of more than two testing machines are respectively connected in series on the same side of the production line of the discharging machine.
4. The intelligent electronic material testing and sorting line of claim 3, wherein the testing machine or the testing jig module further comprises a second material transferring mechanism, the second material transferring mechanism transfers the electronic materials on the transferring plate in the region to be tested of the testing jig module to the acupuncture points corresponding to the testing jig module, and transfers the electronic materials on the acupuncture points corresponding to the testing jig module to the transferring plate.
5. The intelligent electronic material testing and sorting line of claim 4, wherein the testing machine further comprises a rack, at least one set of code scanners is arranged above the rack, and the code scanners can scan the electronic materials in the turnover discs on the feeding line and the return line to obtain electronic material information.
6. The intelligent electronic material testing and sorting line of claim 5, wherein the first material transferring mechanism and the second material transferring mechanism are provided with CCD cameras or laser height measuring instruments for detecting and judging whether the electronic materials are in the acupuncture points of the material tray, the week rotary table or the testing jig module, and/or the position parameters of the electronic materials, and/or the appearances of the electronic materials.
7. The electronic material intelligent testing and sorting line according to claim 6, wherein the testing jig modules comprise a first testing jig module, the first testing jig module is provided with the second material transferring mechanism, each jig of the first testing jig module is provided with a plurality of acupuncture points distributed in an entire row, the second material transferring mechanism is provided with a material sucking plate matched with the number and distribution of the jig acupuncture points, and the material sucking plate of the second material transferring mechanism can simultaneously suck the electronic materials with the same number as the acupuncture points of the jig so as to transfer between the circumference disc of the sending and testing line and the jig.
8. The intelligent electronic material testing and sorting line according to claim 7, wherein the testing jig modules further comprise a second testing jig module, the second testing jig module is provided with a plurality of jigs, each jig is provided with an acupoint, the second material transferring mechanism sucks the electronic materials from the turnover disc and puts the electronic materials into the acupoints of each jig one by one, or sucks the tested electronic materials from each acupoint of each jig one by one and puts the tested electronic materials into the turnover disc of the feeding and testing line.
9. The electronic material intelligent testing and sorting line according to any one of claims 1 to 8, wherein the discharging machine is provided with more than two flow lines, and each flow line is provided with one turnover disc transfer mechanism on the left and right.
10. The electronic material intelligent testing sorting line according to any one of claims 1 to 8, wherein the testing machine is provided with two testing lines parallel to the return line on both sides of the return line, and a plurality of testing jig modules are provided along the outer side of each testing line.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122670111.1U CN216297178U (en) | 2021-11-03 | 2021-11-03 | Line is selected separately in electronic material intelligent test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122670111.1U CN216297178U (en) | 2021-11-03 | 2021-11-03 | Line is selected separately in electronic material intelligent test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216297178U true CN216297178U (en) | 2022-04-15 |
Family
ID=81117808
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122670111.1U Active CN216297178U (en) | 2021-11-03 | 2021-11-03 | Line is selected separately in electronic material intelligent test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216297178U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116666249A (en) * | 2023-07-28 | 2023-08-29 | 广东长兴半导体科技有限公司 | Wafer testing method |
-
2021
- 2021-11-03 CN CN202122670111.1U patent/CN216297178U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116666249A (en) * | 2023-07-28 | 2023-08-29 | 广东长兴半导体科技有限公司 | Wafer testing method |
| CN116666249B (en) * | 2023-07-28 | 2024-01-26 | 广东长兴半导体科技有限公司 | Wafer testing method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN114029245A (en) | Chip testing and sorting line and method | |
| CN110261398B (en) | Automatic capacitance detector | |
| CN108551513A (en) | A kind of automatic production line of mobile phone screen test | |
| CN210614402U (en) | Multi-station chip testing and sorting machine | |
| CN216297178U (en) | Line is selected separately in electronic material intelligent test | |
| CN202075359U (en) | Final testing and screening plate placing machine for double-suction head quartz crystals | |
| CN213444967U (en) | High-speed feeding and discharging platform for double-head mobile phone camera module | |
| CN101082633B (en) | IC detecting machine capable of simultaneously multiple parallel built-in testing | |
| WO2024087709A1 (en) | Double-half-cell efficiency testing device | |
| CN215613318U (en) | Code sorting device is swept to electricity core | |
| CN104466224B (en) | Battery hot-pressing equipment | |
| CN210293111U (en) | Automatic detection machine for mobile phone accessories | |
| CN219871632U (en) | Detection device | |
| CN217528299U (en) | Test sorting machine | |
| CN110456239A (en) | A kind of chip high voltage and comprehensive electric characteristic detecting apparatus and test method | |
| CN217277778U (en) | Appearance inspection machine suitable for multi-side simultaneous inspection | |
| KR20130042945A (en) | Device inspection apparatus and apparatus for pressing device therefor | |
| CN216014773U (en) | Automatic burning test equipment for display screen | |
| CN216209740U (en) | General type battery short circuit check out test set | |
| CN210376170U (en) | Automatic capacitance detector | |
| CN208190926U (en) | Loudspeaker automatic testing equipment | |
| CN111981987A (en) | Automatic detection equipment for dimension and appearance of welded product and working method thereof | |
| CN117766639B (en) | Laser-induced processing equipment for photovoltaic cell | |
| CN210906978U (en) | Automatic go up annular of unloading and arrange test unit | |
| CN216548478U (en) | Test fixture device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |