CN215069898U - Automatic marking device for inspection based on semiconductor - Google Patents
Automatic marking device for inspection based on semiconductor Download PDFInfo
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- CN215069898U CN215069898U CN202121469407.0U CN202121469407U CN215069898U CN 215069898 U CN215069898 U CN 215069898U CN 202121469407 U CN202121469407 U CN 202121469407U CN 215069898 U CN215069898 U CN 215069898U
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Abstract
The utility model provides an inspection automatic marking device based on semiconductor, include: the device comprises a base in a vertical structure, a steering platform arranged at the crossing center of the upper end of the base, a microscope group arranged on the upper end surface of the base and at the end part, and a pair of marking devices; the steering platform is rotationally connected with the base through a rotating shaft, the marking devices are oppositely distributed on two sides of the steering platform and located at the end parts of two ends of the base, the microscope group is arranged at the end part of the other end of the base, an observation area is arranged at one end, facing the microscope group, of the steering platform, the observation area is located in the observation range of the microscope group, and the steering platform can rotate towards two ends of the base in the horizontal direction through the driving of the rotating shaft; inductive switches are oppositely arranged on two sides of the base. Through the utility model discloses a, realized automatic mark, improved detection efficiency, avoided leaking the phenomenon of mark and taking place.
Description
Technical Field
The utility model relates to a semiconductor detects mark technical field, more specifically relates to an inspection automatic marking device based on semiconductor.
Background
The semiconductor, meaning the material of electric conductivity between conductor and insulator under the normal atmospheric temperature, the semiconductor has been widely used in radio, television and temperature measurement, such as the diode is the device that adopts the semiconductor to make, the semiconductor means the electric conductivity can be controlled, the material that can range from insulator to conductor, no matter from the perspective of science and technology or economic development, the importance of semiconductor is very huge, most electronic products of this day, such as the core unit in the computer, mobile phone or digital recorder and semiconductor have very close relation, in the production process, check whether the semiconductor is qualified, basically the manual inspection and mark, easy to miss mark, for example, in the production of semiconductor at present, need to check whether the wafer body bonding wire is qualified, and mark the wafer body that is unqualified to check, the traditional marking method is to mark the wafer body that is unqualified to check manually with the marking pen, when finding unqualified products, an operator needs to manually move the frame for storing the wafer bodies and mark the wafer bodies, and due to the fact that the number of the wafer bodies distributed on the frame is large, after the operator works for a long time, the operator is easy to miss marks or repeat marks, the detection efficiency is low, and the required labor intensity is high.
In view of the above, there is a need for an improved detection and marking device in the prior art to solve the above problems.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to disclose an inspection automatic marking device based on semiconductor, it has realized automatic mark, has improved detection efficiency, has saved the labour.
In order to achieve the above object, the present invention provides an inspection automatic marking device based on semiconductor, including: the device comprises a base in a vertical structure, a steering platform arranged at the crossing center of the upper end of the base, a microscope group arranged on the upper end surface of the base and at the end part, and a pair of marking devices;
the steering platform is rotationally connected with the base through a rotating shaft, the marking devices are oppositely distributed on two sides of the steering platform and located at the end parts of two ends of the base, the microscope group is arranged at the end part of the other end of the base, an observation area is arranged at one end, facing the microscope group, of the steering platform, the observation area is located in the observation range of the microscope group, the steering platform can rotate towards two ends of the base in the horizontal direction through driving of the rotating shaft, and the rotating angle is 90 degrees;
the marking device comprises an air pump, a lifting rod and a marking pen, wherein the air pump is controlled to work through the inductive switch, the lifting rod is driven by the air pump to vertically lift, and the marking pen is arranged on the lifting rod;
the marking pen can mark the semiconductor in the observation area.
As a further improvement of the utility model, the overlooking projection of the steering platform is in a drop shape.
As a further improvement of the utility model, the marking device is located the upper end surface of the base is close to the marking device is provided with a limiting rod.
As a further improvement of the utility model, the spacing mirror group includes: the rotating seat is fixedly arranged on the surface of the upper end of the base and is arranged at the top end of the rotating seat to form a microscope in rotating connection.
As a further improvement of the present invention, a monitor is provided on the microscope, and the monitor is used for monitoring the position of the observation area.
As a further improvement, the turning platform changes the turning direction through the positive and negative rotation of the motor.
As a further improvement of the present invention, the rotation shaft has a telescopic structure.
As a further improvement of the present invention, two the marking means has different marking modes, and the two marking modes represent qualified and unqualified respectively.
Compared with the prior art, the beneficial effects of the utility model are that:
(1) the utility model provides an inspection automatic marking device based on semiconductor, inspects the semiconductor through microscope group, places the steering platform of semiconductor and moves the semiconductor to the marking device below that corresponds through turning to, marks, and the marking device who turns to the platform both sides is qualified mark and unqualified mark respectively, has improved detection efficiency, has avoided lou examining, has improved the degree of accuracy that detects.
(2) The steering platform is provided with the observation area, the microscope group is provided with the monitor, and the semiconductor is ensured to be completely placed in the observation area by utilizing the induction of the monitor to the observation area, so that the phenomena of missed detection or incomplete detection are avoided, and the detection efficiency is improved.
(3) The steering platform controls the rotating shaft to rotate by 90 degrees through the motor, the inductive switch is triggered in the rotating process, the marking device works, the air pump controls the lifting rod to descend, and when the steering platform rotates to the limiting rod, the marking pen marks the semiconductors in the observation area; the limiting rod limits the rotation of the steering platform on one hand, and can play a role in secondary confirmation and reduce the marking error rate.
(4) The whole structure is integrated, the detection marking efficiency is improved, the production efficiency is improved, and the labor cost is saved.
Drawings
FIG. 1 is a perspective view of a semiconductor-based inspection automarking apparatus;
FIG. 2 is a front view of a semiconductor-based inspection automarking apparatus;
FIG. 3 is a top view of a semiconductor-based inspection automatic marking device.
In the figure: 1. a base; 2. a steering platform; 3. a microscope group; 4. a marking device; 5. an inductive switch; 6. a limiting rod; 7. a monitor; 20. an observation area; 21. a rotating shaft; 41. an air pump; 42. a lifting rod; 43. a marking pen.
Detailed Description
The present invention is described in detail with reference to the embodiments shown in the drawings, but it should be understood that these embodiments are not intended to limit the present invention, and those skilled in the art should understand that the functions, methods, or structural equivalents or substitutions made by these embodiments are within the scope of the present invention.
In order to facilitate understanding of the present invention, the present invention will be described more fully hereinafter with reference to the accompanying drawings. The preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
The utility model provides an inspection automatic marking device based on semiconductor.
Referring to fig. 1 to 3, an embodiment of an automatic semiconductor-based inspection marking device according to the present invention is shown.
Referring to fig. 1 and 2, in the present embodiment, a semiconductor-based inspection automatic marking device 4 includes: the device comprises a base 1 in a vertical structure, a steering platform 2 arranged at the crossing center of the upper end of the base 1, a microscope group 3 arranged on the upper end surface of the base 1 and at the end part, and a pair of marking devices 4; the steering platform 2 is rotationally connected with the base 1 through a rotating shaft 21, the marking devices 4 are oppositely distributed on two sides of the steering platform 2 and are located at two end parts of the base 1, the microscope group 3 is arranged at the other end part of the base 1, an observation area 20 is arranged at one end, facing the microscope group 3, of the steering platform 2, the observation area 20 is located in an observation range of the microscope group 3, the steering platform 2 can rotate towards two ends of the base 1 in the horizontal direction through the driving of the rotating shaft 21, and the rotating angle is 90 degrees; the two sides of the base 1 are oppositely provided with induction switches 5, the marking device 4 comprises an air pump 41 which is controlled to work by the induction switches 5, a lifting rod 42 which is driven by the air pump 41 to vertically lift, and a marking pen 43 which is arranged on the lifting rod 42; the marking pen 43 can mark the semiconductor in the observation area 20, and the turning table 2 has a droplet-shaped plan view. And limiting rods 6 are arranged on the upper end surface of the base 1 and close to the marking device 4. Spacing mirror group includes: the rotating seat is fixedly arranged on the upper end surface of the base 1 and is arranged at the top end of the rotating seat to form a rotatably connected microscope. A monitor 7 is arranged on the microscope, and the monitor 7 is used for monitoring the position of the observation area 20. The steering platform 2 changes the rotation direction through positive and negative rotation of the motor. The rotary shaft 21 has a telescopic structure. The marking modes of the two marking devices 4 are different, and the two marking modes respectively represent pass and fail.
Referring to fig. 3, in the present embodiment, a semiconductor-based automatic inspection marking device 4 inspects a semiconductor through a microscope group 3, a turning platform 2 for placing the semiconductor turns to move the semiconductor to a position below a corresponding marking device 4 for marking, and the marking devices 4 on two sides of the turning platform 2 are respectively qualified marks and unqualified marks, so that the detection efficiency is improved, the omission is avoided, and the detection accuracy is improved. The observation area 20 is arranged on the steering platform 2, the monitor 7 is arranged on the microscope group 3, and the semiconductor is ensured to be completely placed in the observation area 20 by utilizing the induction of the monitor 7 to the observation area 20, so that the phenomena of missing detection or incomplete detection are avoided, and the detection efficiency is improved. The steering platform 2 controls the rotating shaft 21 to rotate by 90 degrees through the motor, the inductive switch 5 is triggered in the rotating process, the marking device 4 works, the air pump 41 controls the lifting rod 42 to descend, and when the steering platform 2 rotates to the limiting rod 6, the marking pen 43 marks the semiconductors in the observation area 20 at the same time; the limiting rod 6 limits the rotation of the steering platform 2 on one hand, and can play a role in secondary confirmation and reduce the marking error rate. The whole structure is integrated, the detection marking efficiency is improved, the production efficiency is improved, and the labor cost is saved.
The working principle is as follows: the semiconductor is placed in an observation area 20 of a steering platform 2, a monitor 7 monitors and sends an instruction, an operator carries out conventional detection through a microscope group 3, and makes a corresponding operation instruction according to a detection result, the steering platform 2 steers, in the steering process, a marking device 4 controls a lifting rod 42 to descend through an air pump 41, a limiting rod 6 can confirm marking for the second time, and when the steering platform 2 touches the limiting rod 6, a marking pen 43 marks the semiconductor.
The above list of details is only for the practical implementation of the present invention, and they are not intended to limit the scope of the present invention, and all equivalent implementations or modifications that do not depart from the technical spirit of the present invention should be included in the scope of the present invention.
Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.
Claims (8)
1. A semiconductor-based test automarking apparatus, comprising: the device comprises a base in a vertical structure, a steering platform arranged at the crossing center of the upper end of the base, a microscope group arranged on the upper end surface of the base and at the end part, and a pair of marking devices;
the steering platform is rotationally connected with the base through a rotating shaft, the marking devices are oppositely distributed on two sides of the steering platform and located at the end parts of two ends of the base, the microscope group is arranged at the end part of the other end of the base, an observation area is arranged at one end, facing the microscope group, of the steering platform, the observation area is located in the observation range of the microscope group, the steering platform can rotate towards two ends of the base in the horizontal direction through driving of the rotating shaft, and the rotating angle is 90 degrees;
the marking device comprises an air pump, a lifting rod and a marking pen, wherein the air pump is controlled to work through the inductive switch, the lifting rod is driven by the air pump to vertically lift, and the marking pen is arranged on the lifting rod;
the marking pen can mark the semiconductor in the observation area.
2. A semiconductor-based inspection automarking apparatus as claimed in claim 1 wherein: the overlooking projection of the steering platform is in a water drop shape.
3. A semiconductor-based inspection automarking apparatus as claimed in claim 1 wherein: and limiting rods are arranged on the upper end surface of the base and close to the marking device.
4. A semiconductor-based inspection automarking apparatus as claimed in claim 1 wherein: the microscope group includes: the rotating seat is fixedly arranged on the surface of the upper end of the base and is arranged at the top end of the rotating seat to form a microscope in rotating connection.
5. A semiconductor-based inspection automarking apparatus as claimed in claim 4 wherein: the microscope is provided with a monitor, and the monitor is used for monitoring the position of the observation area.
6. A semiconductor-based inspection automarking apparatus as claimed in claim 1 wherein: the steering platform changes the rotation direction through positive and negative rotation of the motor.
7. A semiconductor-based inspection automarking apparatus as claimed in claim 1 wherein: the rotating shaft is provided with a telescopic structure.
8. A semiconductor-based inspection automarking apparatus as claimed in claim 1 wherein: the marking modes of the two marking devices are different, and the two marking modes respectively represent pass and fail.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121469407.0U CN215069898U (en) | 2021-06-30 | 2021-06-30 | Automatic marking device for inspection based on semiconductor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121469407.0U CN215069898U (en) | 2021-06-30 | 2021-06-30 | Automatic marking device for inspection based on semiconductor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215069898U true CN215069898U (en) | 2021-12-07 |
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ID=79229739
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121469407.0U Active CN215069898U (en) | 2021-06-30 | 2021-06-30 | Automatic marking device for inspection based on semiconductor |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215069898U (en) |
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2021
- 2021-06-30 CN CN202121469407.0U patent/CN215069898U/en active Active
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