CN212160034U - Test fixture for testing internal electrical parameters of power supply - Google Patents

Test fixture for testing internal electrical parameters of power supply Download PDF

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Publication number
CN212160034U
CN212160034U CN202020466700.0U CN202020466700U CN212160034U CN 212160034 U CN212160034 U CN 212160034U CN 202020466700 U CN202020466700 U CN 202020466700U CN 212160034 U CN212160034 U CN 212160034U
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China
Prior art keywords
test
pcb
probe
power supply
layer board
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Active
Application number
CN202020466700.0U
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Chinese (zh)
Inventor
廖光裕
朱兴成
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Hangzhou Zhongxinli Intelligent Equipment Co.,Ltd.
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Hangzhou Zhongxinli Technology Co ltd
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Priority to CN202020466700.0U priority Critical patent/CN212160034U/en
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Abstract

The utility model discloses a test fixture for testing internal electrical parameters of a power supply, which comprises a pressing plate, a pressing plate column, a supporting plate, a spring column, a probe, a test device and a base, wherein the pressing plate and the pressing plate column are of an integrated structure, the pressing plate material adopts an acrylic plate, the pressing plate is connected with a pull rod, the pressing plate and the pressing plate column can vertically move up and down through the pull rod, the supporting plate is provided with a PCB (printed circuit board) and a PCB element, the PCB element part is placed on the supporting plate upwards, the PCB locates the test fixture for testing the internal electrical parameters of the power supply through a locating hole and the supporting plate, and the internal electrical test of the; the test is convenient nimble, because the probe is arranged independently, so can realize multi-functionally, the test of piecemeal, greatly reduced product defective rate reduces the loss.

Description

Test fixture for testing internal electrical parameters of power supply
Technical Field
The utility model relates to a LED drive power supply technical field specifically is a test fixture of test power supply inside electrical parameter.
Background
The power-on test of power supply production many manufacturers adopt to directly start up after connecting input and output lines, observe input and output voltage, current, power and the like to determine whether the power supply is normal, test whether a resistor capacitor on a circuit board has a short circuit or not through an ICT online tester, open the circuit, screen out defective products and reduce the defective rate of the next step of starting up. Meanwhile, after the power-on test, a function test is carried out to verify various functions of the power supply.
This production process has many disadvantages, especially for power supplies with complex circuitry. Because the method only testing the input and the output cannot ensure that all indexes of the power supply are normal, some power supply faults cannot be directly seen at the input end and the output end, and the faults can occur after the method is used for a period of time; for example, the peak of a power tube in a power supply is too high, which may cause the risk of damage to the power tube, but the peak is too high to be measured on input and output; the ICT test cannot test the inductance of the inductor and the like, and various power devices, chips and the like cannot be measured;
the traditional method can not test various functions and electrical indexes inside the power supply, and easily causes that defective products leave a factory after being verified to be qualified, or causes that the power supply is directly damaged during starting up test, thereby causing loss. Therefore, a test tool for testing internal electrical parameters of the power supply is provided.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a test fixture of the inside electrical parameter of test power supply to solve the problem that proposes among the above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme: including clamp plate, clamp plate post, layer board, spring post, probe, test equipment and base, clamp plate and clamp plate post structure as an organic whole, the clamp plate material adopts the ya keli board, the pull rod is connected to the clamp plate, can reciprocate clamp plate and clamp plate post through the pull rod perpendicularly, be equipped with PCB and PCB component on the layer board, PCB component part is placed up on the layer board, and PCB passes through the locating hole and fixes a position with the layer board.
Preferably, the layer board has four spring posts, and the spring post is connected to layer board and base respectively from top to bottom, through pressing the layer board, can make the spring post shrink, realizes that the layer board reciprocates.
Preferably, the probe is fixed on the base, a through hole is reserved on the position of the probe of the supporting plate, the position of the probe is an electrical function point to be tested on the PCB, and a test point in contact with the probe is reserved on the PCB in advance.
Preferably, the pull rod is pulled down, and the PCB positioned on the supporting plate is pressed down, so that the test point of the PCB is contacted with the probe, the probe is connected to the test equipment outside through a line, the test equipment can read the electrical parameters of the function point, and after the test is completed, the pull rod is pulled up, and the PCB is separated from the probe.
Compared with the prior art, the beneficial effects of the utility model are that:
1. the utility model can electrically test the inside of the power supply; the test is convenient nimble, because the probe is arranged independently, so can realize multi-functionally, the test of piecemeal, greatly reduced product defective rate reduces the loss.
Drawings
Fig. 1 is a schematic view of the overall structure of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1, the present invention provides a technical solution: the utility model provides a test fixture of inside electrical parameter of test power supply, includes clamp plate, clamp plate post, layer board, spring post, probe, test equipment and base, its characterized in that: the PCB component part is placed on the supporting plate upwards, and the PCB is positioned with the supporting plate through the positioning hole.
Preferably, the layer board has four spring posts, and the spring post is connected to layer board and base respectively from top to bottom, through pressing the layer board, can make the spring post shrink, realizes that the layer board reciprocates.
Preferably, the probe is fixed on the base, a through hole is reserved on the position of the probe of the supporting plate, the position of the probe is an electrical function point to be tested on the PCB, and a test point in contact with the probe is reserved on the PCB in advance.
Preferably, the pull rod is pulled down, and the PCB positioned on the supporting plate is pressed down, so that the test point of the PCB is contacted with the probe, the probe is connected to the test equipment outside through a line, the test equipment can read the electrical parameters of the functional point, and after the test is completed, the pull rod is pulled up, and the PCB is separated from the probe.
1. The test tool consists of a pressure plate, a pressure plate column, a supporting plate, a spring column, a probe, test equipment and a base.
2. Reserved test point for electrical function point to be tested on PCB
3. Placing the PCB with the front side facing upwards and the surface mounted part facing downwards on a supporting plate, and positioning the PCB and the supporting plate by using a positioning hole;
4. the pull rod is pulled downwards, the pressing plate and the pressing plate column can move downwards vertically, the pressing plate column presses the front surface of the PCB, and the PCB and the supporting plate with the spring column are driven to move downwards together;
5. after the PCB test point is moved to the probe position, the PCB test point is contacted with the probe, the probe is in a spring type, the probe can be propped against the test point and keeps a certain pressure, and each probe can be ensured to be contacted with the test point.
6. At this time, each electrical function point on the PCB is directly led to the external test equipment through the connecting wire.
7. The test equipment can flexibly test the test points, and can test the test points in a block mode or in an analog mode, so that the test equipment is very flexible.
8. After the test is finished, the pull rod is pulled upwards, the spring column of the supporting plate is jacked up, and the test point is separated from the probe.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the term "includes
"comprises," "comprising," or any other variation thereof, is intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (5)

1. The utility model provides a test fixture of inside electrical parameter of test power supply which characterized in that: including clamp plate, clamp plate post, layer board, spring post, probe, test equipment and base, clamp plate and clamp plate post structure as an organic whole, the pull rod is connected to the clamp plate, can reciprocate clamp plate and clamp plate post perpendicularly through the pull rod, be equipped with PCB and PCB component on the layer board, PCB component part is placed up on the layer board, and PCB passes through the locating hole and fixes a position with the layer board.
2. The test tool for testing the internal electrical parameters of the power supply according to claim 1, wherein: four spring posts are installed to the layer board bottom, and these four spring post upper ends are connected with the layer board, and four spring post lower extremes are connected with the base, through pressing the layer board, can make the spring post shrink, realize that the layer board reciprocates.
3. The test tool for testing the internal electrical parameters of the power supply according to claim 1, wherein: the probe is fixed on the base, a through hole is reserved on the position of the probe of the supporting plate, the position of the probe is an electrical function point to be tested on the PCB, and a test point in contact with the probe is reserved on the PCB in advance.
4. The test tool for testing the internal electrical parameters of the power supply according to claim 1, wherein: the pull rod is pulled down, the PCB positioned on the supporting plate is pressed down, the test point of the PCB can be contacted with the probe, the probe is connected to test equipment outside through an electric wire, the test equipment can read the electrical parameters of the functional point, and after the test is completed, the pull rod is reset and pulled up, so that the separation between the PCB and the probe is realized.
5. The test tool for testing the internal electrical parameters of the power supply according to claim 1, wherein: the pressing plate is made of an acrylic plate.
CN202020466700.0U 2020-04-02 2020-04-02 Test fixture for testing internal electrical parameters of power supply Active CN212160034U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202020466700.0U CN212160034U (en) 2020-04-02 2020-04-02 Test fixture for testing internal electrical parameters of power supply

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202020466700.0U CN212160034U (en) 2020-04-02 2020-04-02 Test fixture for testing internal electrical parameters of power supply

Publications (1)

Publication Number Publication Date
CN212160034U true CN212160034U (en) 2020-12-15

Family

ID=73725669

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202020466700.0U Active CN212160034U (en) 2020-04-02 2020-04-02 Test fixture for testing internal electrical parameters of power supply

Country Status (1)

Country Link
CN (1) CN212160034U (en)

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Address after: 311199, 7th Floor, Building 1, No. 587 Kangxin Road, Linping Street, Linping District, Hangzhou City, Zhejiang Province

Patentee after: Hangzhou Zhongxinli Intelligent Equipment Co.,Ltd.

Address before: 5 / F, building 2, 650 WangMei Road, Linping street, Yuhang District, Hangzhou City, Zhejiang Province 311100

Patentee before: HANGZHOU ZHONGXINLI TECHNOLOGY CO.,LTD.