CN215415737U

CN215415737U - PCB board test point testing arrangement

Info

Publication number: CN215415737U
Application number: CN202023084015.0U
Authority: CN
Inventors: 赵志刚; 文东升
Original assignee: Suzhou Kelinyuan Electronic Co ltd
Current assignee: Suzhou Kelinyuan Electronic Co ltd
Priority date: 2020-12-18
Filing date: 2020-12-18
Publication date: 2022-01-04
Anticipated expiration: 2030-12-18

Abstract

The utility model discloses a PCB test point testing device, which comprises an upper jig base, an upper jig supporting frame, an upper jig borrowing frame, a lower jig base, a lower jig supporting frame and a lower jig borrowing frame, wherein the upper jig base is provided with a plurality of test points; the upper jig base is provided with upper connecting probes, the upper jig supporting frame is provided with testing needles, the number of the testing needles is greater than that of the upper connecting probes, the upper jig borrowing frame is provided with upper borrowing point probes, each upper connecting probe is electrically connected with the testing needle, and the testing needles which are not electrically connected with the upper connecting probes are electrically connected with the upper borrowing point probes; the lower jig base is provided with a lower connecting probe which is electrically connected with a lower testing probe of the automatic testing machine, the lower jig borrowing frame is provided with a lower borrowing point probe, and the lower borrowing point probe is electrically connected with the lower connecting probe; when the upper fixture is close to the lower fixture, the upper borrow point probe is suitable for being electrically connected with the lower borrow point probe. The PCB test point testing device has higher reliability and occupies less space.

Description

PCB board test point testing arrangement

Technical Field

The utility model relates to the field of PCB testing, in particular to a PCB testing point testing device.

Background

The purpose of arranging test points on the PCB is to test whether the components on the circuit board meet the specification and the solderability, for example, whether the resistance on one PCB is in a problem is checked, and the simplest method is to measure two ends of the PCB by a multimeter. However, in a factory with mass production, there is no way to use a multimeter to measure slowly whether each resistance, capacitance, inductance, or even an IC circuit on each PCB is correct, so in the prior art, a plurality of probes (generally called needle bed tools) are used to contact all the lines of the electronic components to be measured on the PCB at the same time, and then the characteristics of the electronic components are sequentially measured in a sequence-based and auxiliary manner through program control, and generally, it only takes about 1 to 2 minutes to test all the components of one PCB.

If the probes directly contact the electronic parts or the welding pins on the PCB, some electronic parts are possibly crushed, and the other electronic parts are correspondingly damaged, so that the test points are invented, a pair of circular small points are additionally led out from two ends of the parts, no solder mask is arranged on the small points, and the probes for testing can contact the small points without directly contacting the electronic parts to be measured.

When the PCB is tested by using the automatic testing machine, the PCB can be generally matched with a jig for use, and the jig is used for positioning the PCB and electrically connecting the PCB with the automatic testing machine. Generally, an automated test machine has an upper test probe and a lower test probe. When the upper test probe can not meet the test point on the top surface of the PCB, the remaining test points on the top surface of the PCB are connected to the lower test probe by the flat cable in the prior art. In the connection mode, the upper test probe and the lower test probe need to repeatedly perform separation and approaching movement, so the flat cable is very easy to damage, when the test points are too many, the number of the flat cables is also more, the flat cable occupies too much space, and when the flat cable is damaged, the flat cable needs to be detached from the jig, so that the maintenance time is too long, and the production efficiency is reduced.

SUMMERY OF THE UTILITY MODEL

In order to overcome the disadvantages of the prior art, an object of the present invention is to provide a PCB test point testing apparatus, which can solve the above problems in the background art.

The purpose of the utility model is realized by adopting the following technical scheme:

a PCB board test point testing device comprises: an upper jig and a lower jig; the upper jig comprises an upper jig base, an upper jig supporting frame and an upper jig borrowing frame; the upper jig is characterized in that an upper connecting probe electrically connected with an upper testing probe of an automatic testing machine is arranged on the upper jig base, testing needles matched with testing points on a PCB are arranged on an upper jig supporting frame, the number of the testing needles is greater than that of the upper connecting probes, upper borrowing point probes are arranged on the upper jig borrowing point frame, each upper connecting probe is electrically connected with the testing needle, and the testing needles which are not electrically connected with the upper connecting probes are electrically connected with the upper borrowing point probes; the lower jig comprises a lower jig base, a lower jig supporting frame and a lower jig borrowing frame; the lower jig base is provided with a lower connecting probe electrically connected with a lower testing probe of the automatic testing machine, the lower jig supporting frame is used for supporting the PCB, the lower jig borrowing frame is provided with a lower borrowing point probe, and the lower borrowing point probe is electrically connected with the lower connecting probe; when the upper jig and the lower jig are close to each other, the upper borrow point probe is suitable for being electrically connected with the lower borrow point probe.

Furthermore, the upper borrowing point probe comprises a sleeve and a probe, the sleeve is fixedly connected with the upper jig borrowing point frame, a test needle which is not electrically connected with the upper connecting probe is electrically connected with the sleeve, the probe is electrically connected with the sleeve, and the probe is sleeved in the sleeve and is elastically connected with the sleeve.

Further, the probe and the sleeve are connected through a spring.

Furthermore, the lower point-borrowing probe is fixedly connected with the lower jig point-borrowing frame, and the lower point-borrowing probe and the probe are arranged oppositely.

Furthermore, an enlarged head is arranged at one end of the lower borrowing point probe opposite to the probe, and the enlarged head is provided with a contact plane.

Furthermore, one end of the probe, which is opposite to the lower borrowing point probe, is a sawtooth head.

Furthermore, each upper connecting probe is electrically connected with the test needle through a lead respectively.

Further, the test pin which is not electrically connected with the upper connection probe is electrically connected with the upper borrow point probe through a lead.

Further, the lower borrow point probe is electrically connected with the lower connecting probe through a lead.

Compared with the prior art, the utility model has the beneficial effects that: the upper jig is provided with the upper borrowing point probe on the point frame, the lower jig is provided with the lower borrowing point probe on the point frame, and when the upper jig is close to the lower jig, the upper borrowing point probe is electrically connected with the lower borrowing point probe.

Drawings

FIG. 1 is a schematic diagram of a PCB test point testing device of the present invention;

fig. 2 is an enlarged view of a point a in fig. 1.

In the figure: 1. mounting a jig; 11. mounting a jig base; 111. a probe is connected to the upper part; 12. an upper jig supporting frame; 121. a test pin; 13. an upper jig borrowing rack; 131. a borrowing point probe; 1311. a sleeve; 1312. a probe; 2. a lower jig; 21. a lower jig base; 211. a lower ligation probe; 22. a lower jig supporting frame; 23. a lower jig borrowing rack; 231. a lower borrowing point probe; 31. and (4) conducting wires.

Detailed Description

To facilitate an understanding of the utility model, the utility model will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.

It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the utility model herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the utility model. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

As shown in fig. 1-2, a PCB test point testing apparatus provided by an embodiment of the utility model is shown, which at least includes an upper fixture 1 and a lower fixture 2. The upper jig 1 comprises an upper jig base 11, an upper jig support frame 12 and an upper jig borrowing frame 13; the upper jig base 11 is provided with upper connection probes 111 electrically connected with upper test probes of an automatic test machine, the upper jig support frame 12 is provided with test needles 121 for matching with test points on a PCB, the number of the test needles 121 is greater than that of the upper connection probes 111, the upper jig borrowing frame 13 is provided with upper borrowing point probes 131, each upper connection probe 111 is electrically connected with the test needle 121, and the test needles 121 which are not electrically connected with the upper connection probes 111 are electrically connected with the upper borrowing point probes 131. The lower jig 2 comprises a lower jig base 21, a lower jig support frame 22 and a lower jig borrowing frame 23; the lower jig base 21 is provided with a lower connection probe 211 electrically connected with a lower test probe of the automatic test machine, the lower jig support frame 22 is used for supporting the PCB, the lower jig borrowing frame 23 is provided with a lower borrowing point probe 231, and the lower borrowing point probe 231 is electrically connected with the lower connection probe 211; when the upper fixture 1 and the lower fixture 2 are close to each other, the upper borrow point probe 131 is suitable for being electrically connected with the lower borrow point probe 231. Specifically, each of the upper connection probes 111 is electrically connected to the test pin 121 through the wire 31, respectively. The test pins 121, which are not electrically connected to the upper connection probes 111, are electrically connected to the upper borrow point probes 131 through the wires 31. The lower via probe 231 is electrically connected to the lower connection probe 211 through the conductive line 31.

It should be noted that the number of the testing pins 121 disposed on the upper jig supporting frame 12 is generally equal to the number of the PCB testing points, so as to facilitate testing the PCB testing points at one time. When the number of the PCB testing points is greater than the number of the upper connection probes 111 (i.e. the number of the testing pins 121 is greater than the number of the upper connection probes 111), the present invention can electrically connect the upper borrowing point probes 131 arranged on the upper jig borrowing point frame 13 with the lower borrowing point probes 231 arranged on the lower jig borrowing point frame 23, so as to transfer the testing pins 121 on the upper jig 1, which are not electrically connected with the upper connection probes 111, to the lower connection probes 211 of the lower jig 2 for testing, thereby satisfying the testing requirements of the PCB. In practical use, when the automated testing machine is pressed, the upper fixture 1 and the lower fixture 2 approach each other, so that the upper borrowing point probe 131 contacts the lower borrowing point probe 231, thereby achieving electrical connection and completing the borrowing point operation. The point borrowing mode avoids the use of the flat cable, and only when the test point needs to be tested, the upper point borrowing probe 131 and the lower point borrowing probe 231 can be conducted due to the pressing of the automatic test machine, so that the use is more stable and reliable, the failure rate is reduced, and the occupied space is small.

In a preferred embodiment, the upper pin probe 131 includes a sleeve 1311 and a probe 1312, the sleeve 1311 is fixedly connected to the upper jig pin holder 13, the testing pin 121 not electrically connected to the upper connection probe 111 is electrically connected to the sleeve 1311, the probe 1312 is electrically connected to the sleeve 1311, and the probe 1312 is sleeved in the sleeve 1311 and elastically connected to the sleeve 1311. Specifically, the probe 1312 and the sleeve 1311 are connected by a spring, the lower clamp probe 231 is fixedly connected to the lower jig clamp frame 23, and the lower clamp probe 231 and the probe 1312 are disposed opposite to each other. Through the arrangement mode, when the automatic testing machine is pressed, the probes 1312 elastically connected with the sleeve 1311 can play a certain buffering role, so that rigid contact between the upper borrow point probe 131 and the lower borrow point probe 231 is avoided, and the use reliability is further ensured.

Preferably, the lower borrowing point probe 231 is provided with an enlarged head at the end opposite to the probe 1312, and the enlarged head has a contact plane. By such an arrangement, the reliability of the upper borrow point probe 131 and the lower borrow point probe 231 in contact can be ensured.

Preferably, the end of the probe opposite the lower borrowing point probe 231 is a serrated head. Also, by such an arrangement, the upper borrow point probe 131 can be made more reliable in the contact of the lower borrow point probe 231. Meanwhile, the reliability of the PCB test point testing device in use is ensured.

The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes, which are made by using the contents of the present specification and the accompanying drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims

1. A PCB board test point testing device is characterized by comprising: an upper jig and a lower jig; the upper jig comprises an upper jig base, an upper jig supporting frame and an upper jig borrowing frame; the upper jig is characterized in that an upper connecting probe electrically connected with an upper testing probe of an automatic testing machine is arranged on the upper jig base, testing needles matched with testing points on a PCB are arranged on an upper jig supporting frame, the number of the testing needles is greater than that of the upper connecting probes, upper borrowing point probes are arranged on the upper jig borrowing point frame, each upper connecting probe is electrically connected with the testing needle, and the testing needles which are not electrically connected with the upper connecting probes are electrically connected with the upper borrowing point probes; the lower jig comprises a lower jig base, a lower jig supporting frame and a lower jig borrowing frame; the lower jig base is provided with a lower connecting probe electrically connected with a lower testing probe of the automatic testing machine, the lower jig supporting frame is used for supporting the PCB, the lower jig borrowing frame is provided with a lower borrowing point probe, and the lower borrowing point probe is electrically connected with the lower connecting probe; when the upper jig and the lower jig are close to each other, the upper borrow point probe is suitable for being electrically connected with the lower borrow point probe.

2. The PCB board test point testing apparatus of claim 1, wherein: the upper point borrowing probe comprises a sleeve and a probe, the sleeve is fixedly connected with the upper jig point borrowing frame, a test needle which is not electrically connected with the upper connecting probe is electrically connected with the sleeve, the probe is electrically connected with the sleeve, and the probe is sleeved in the sleeve and is elastically connected with the sleeve.

3. The PCB board test point testing apparatus of claim 2, wherein: the probe is connected with the sleeve through a spring.

4. The PCB board test point testing apparatus of claim 2, wherein: the lower borrowing point probe is fixedly connected with the lower jig borrowing point frame, and the lower borrowing point probe and the probe are arranged oppositely.

5. The PCB test point testing apparatus of claim 4, wherein: one end of the lower borrowing point probe, which is opposite to the probe, is provided with an expansion head, and the expansion head is provided with a contact plane.

6. The PCB test point testing apparatus of claim 4, wherein: one end of the probe, which is opposite to the lower borrowing point probe, is a sawtooth head.

7. The PCB board test point testing apparatus of claim 1, wherein: each upper connecting probe is electrically connected with the test needle through a lead.

8. The PCB board test point testing apparatus of claim 1, wherein: the test needle which is not electrically connected with the upper connecting probe is electrically connected with the upper borrowing point probe through a lead.

9. The PCB board test point testing apparatus of claim 1, wherein: the lower borrow point probe is electrically connected with the lower connecting probe through a lead.